Method and system for calibrating a detector in a detector array

Abstract

A calibration method for a measuring instrument is described. The method includes positioning n samples having a known basis weight between a source and an array of detectors, the array of detectors consisting of m detectors oriented linearly in a first direction. The n samples are scanned by (a) irradiating each of the n samples with X-rays from the source, (b) stepping each of the n samples in the first direction at a step size less than the spatial resolution of the detector, and (c) irradiating each of the n samples with X-rays from the source. A set of signals corresponding to each of the detectors is generated. A calibration curve is established for each detector by fitting the known base weight of each of the n samples to the set of m signals, where n is a positive integer greater than 0 and m is a positive integer greater than 1.

Description

Methods and systems for calibrating detectors in a detector array

[0001] Cross-references to related applications

[0002] This application claims the benefit of U.S. Provisional Application No. 63 / 578,407, filed August 24, 2023, pursuant to 35 USC § 119(e). The entire contents of the aforementioned application are incorporated herein by reference. Technical Field

[0003] This invention relates to detector arrays. More specifically, to methods and systems for calibrating detectors in a detector array for measuring instruments. Background Technology

[0004] In measurement systems, such as X-ray or IR systems, or X-ray screening systems (e.g., for packages, cargo, or mail), detector arrays can be arranged beneath the screening area or space, and beams from the source can be guided through the screening area to the detectors in the array. This allows for quantitative or qualitative measurements by detecting the reduction in transmission of objects passing through the screening area. Especially in the case of quantitative measurements, appropriate calibration curves are used. Because each detector in the array responds slightly differently to X-ray radiation, each detector is individually calibrated to ensure accuracy and precision.

[0005] A challenge with such systems is ensuring that each detector in the detector array is properly calibrated. Detectors in the array may detect defects, such as regions in a sample that are thicker than average, and adjacent detectors in the array may not be able to locate these defects to "see" them. Such defects can lead to inaccurate calibration data and increase errors in calibration-dependent measurements.

[0006] Therefore, the need for highly accurate calibration of the detectors in the detector array has not been met. Summary of the Invention

[0007] This document describes systems, methods, and products for meeting the above and other requirements, and elaborates on them with illustrative and non-limiting embodiments. Various alternatives, modifications, and equivalents are possible.

[0008] According to a first aspect, a calibration method for a measuring instrument is described. The method includes positioning n samples, each having a known basic weight, one at a time at a first location, the first location being between a source and a detector array consisting of m detectors linearly oriented along a first direction. The n samples are scanned by: (a) irradiating each of the n samples with X-rays from the source, (b) stepping each of the n samples along the first direction with a step size smaller than the spatial resolution of the detectors, and (c) irradiating each of the n samples with X-rays from the source. m sets of signals are generated, each set corresponding to one of the m detectors 108, and each signal is proportional to the amount of X-rays transmitted through each of the n samples and striking one of the m detectors during the scan. A calibration curve is established for each detector by fitting the known basic weight of each of the n samples to the sets of m signals, where n is a positive integer greater than 0 and m is a positive integer greater than 1.

[0009] According to a second aspect, a system for calibrating a measuring instrument is described. The system includes: an X-ray source; a detector array consisting of m detectors linearly oriented along a first direction; a space between the source and the detector array; a sample holder; and a computing device storing executable code thereon. The executable code is configured to send instructions for one or more method steps in the method steps described according to the first aspect.

[0010] According to a third aspect, one or more non-transitory computer-readable media having instructions thereon are described. When executed by one or more processing devices of a measuring instrument support apparatus, these instructions cause the measuring instrument support apparatus to perform the method described according to the first aspect.

[0011] These methods, systems, and non-transient media address the unmet need for calibrating detectors in detector arrays. Attached Figure Description

[0012] The following detailed description of illustrative embodiments, taken in conjunction with the accompanying drawings, will facilitate a more complete understanding of the foregoing and other features and advantages of embodiments of the present invention.

[0013] Figures 1A and 1B illustrate measurement or screening instruments according to some embodiments.

[0014] Figures 1C and 1D illustrate the measuring instruments of Figures 1A and 1B according to some embodiments, the measuring instruments having an enclosed sample holder.

[0015] Figure 2 illustrates a method for calibrating a measuring instrument according to some embodiments.

[0016] Figure 3 illustrates a scanning procedure according to some implementation methods.

[0017] Figure 4 is a flowchart illustrating the steps shown in Figures 2 and 3.

[0018] Figure 5 is a block diagram of a computing device that can perform some or all of the method steps described herein, according to some embodiments.

[0019] Figure 6 is a block diagram of an example scientific instrument support system in which some or all of the methods disclosed herein can be performed according to various embodiments.

[0020] Figure 7 is a block diagram of a system for checking measurement responses according to some embodiments.

[0021] The accompanying drawings mentioned above are not drawn to scale and should be understood as illustrative representations of specific embodiments. They are essentially intended to demonstrate relevant principles and have only conceptual significance. In the drawings, the same reference numerals are used to denote similar or identical components and features in various alternative embodiments. Detailed Implementation

[0022] In the description of the invention herein, it should be understood that, unless otherwise implicitly or explicitly understood or stated, words appearing in the singular form encompass their plural counterparts, and words appearing in the plural form encompass their singular counterparts. Furthermore, it should be understood that, for any given component or embodiment described herein, any possible candidates or alternatives listed for that component may generally be used alone or in combination with each other, unless otherwise implicitly or explicitly understood or stated. Furthermore, it should be understood that the drawings shown herein are not necessarily drawn to scale, and only some elements may be drawn for clarity of the invention. Also, corresponding or similar elements may be indicated in the various drawings by repeating reference numerals. Additionally, it should be understood that, unless otherwise implicitly or explicitly understood or stated, any list of such candidates or alternatives is merely illustrative and not restrictive. Furthermore, unless otherwise indicated, reference numerals indicating amounts of ingredients, components, reaction conditions, etc., as used in this specification and claims should be understood to be modified by the term "about".

[0023] Therefore, unless otherwise indicated, the numerical parameters set forth in this specification and the appended claims are approximations that may vary depending on the desired properties sought to be obtained through the subject matter presented herein. At a minimum, and without attempting to limit the application of the equivalence principle to the scope of the claims, each numerical parameter should be interpreted at least according to the number of significant figures reported and by applying ordinary rounding techniques. Although the numerical ranges and parameters that set forth the broad scope of the subject matter presented herein are approximations, the values ​​set forth in the specific examples are reported as precisely as possible. However, any numerical value inherently contains certain errors that are necessarily caused by its corresponding test measurements.

[0024] Figures 1A and 1B illustrate a measuring or screening instrument 100 according to some embodiments. The measuring instrument 100 includes a radiation source 102, a sheet 104, and a detector array 106. Figure 1A shows a front view, and Figure 1B shows a side view. The detector array 106 includes m detectors 108, where m is a positive integer greater than 1. The detectors 108 are linearly oriented along a first direction 110, which corresponds to the transverse direction (CD). The sheet 104 travels along a second direction 112 corresponding to the longitudinal direction (MD) and can be supported by a translation element 114. The radiation source 102 is depicted as a point source, providing radiation 116 as a fan-shaped beam that is projected onto the detector array 106 after passing through the sheet 104. Sheet 104 itself can be the object under study, such as a film or laminate, or article 105 can be placed on sheet 104 (e.g., a conveyor belt), where article 105 passes through space 107 between radiation source 102 and array.

[0025] Figures 1C and 1D illustrate a measuring instrument 100 with a sample holder 109, which may be included in some embodiments. Figure 1C is a front view, and Figure 1D is a side view. The sample holder 109 is movable along a first direction 110 to move within radiation 116 in space 107. In some embodiments, the sample holder 109 may also be movable along a second direction 112, such that the sample holder 109 acts as an "xy" stage. The sample holder 109 may be connected to a track 113 via an arm 111 to move the sample holder 109 along the first direction 110. The track 113 may be longer than the detector array 106 in the first direction 110 to allow the sample holder 109 to be moved out of radiation 116. The sample holder 109 may also include other or alternative elements, such as tracks, actuators and screws, and motors, to move the sample holder 109 along the second direction 112. In some embodiments, the sample holder 109 further includes an element for moving the holder along a third direction perpendicular to the first direction 110 and the second direction 112.

[0026] In some embodiments, the sample holder 109 can hold more than one sample 101 at a time. For example, the sample holder 109 can hold multiple samples 101 adjacent to each other, such that each sample can be positioned between the radiation 116 and the detector 108, wherein the samples 101 do not overlap. In some other embodiments, the samples 109 can be stacked (overlapped), such that the radiation 116 passes through the stacked samples 109 before reaching the detector 108.

[0027] The n samples can be positioned anywhere between the detector array 106 and the source 102. Positioning sample 101 closer to the source 102 provides imaging magnification, with the sample being positioned closer to the source. For example, in a fan-shaped beam with a 90-degree angle, placing the sample at ¼ of the distance from the source to the detector array provides 3x magnification. However, blurring also occurs as the sample moves further away from the detector 108. Furthermore, X-rays attenuate after passing through sample 101 due to the air between the detector 108 and sample 101, which can cause beam distortion / hardening. In some embodiments, the n samples are positioned near the linear array of the detector and away from the source. For example, sample 101 is positioned at ¼ or less of the distance from the detector 108 to the source. In some embodiments, sample 101 is placed less than 5 mm from the detector array.

[0028] It should be understood that a scanning beam along the CD direction can also be used, or multiple fan-shaped beams spanning the detector array 106 can be used. Furthermore, more than one row of detectors 108 can be used as the detector array 106, such as two or more adjacent arrays oriented along the MD direction. In some embodiments, the radiation source 102 is an X-ray source.

[0029] Figure 2 illustrates a method for calibrating a measuring instrument 100 according to some embodiments. Using the measuring instrument 100, a sample 101 is positioned at a first location 204 between a source 102 and a detector array 106 comprising m detectors 108 linearly oriented along a first direction 110. The sample 101 has a known basic weight or thickness. The sample 101 casts a shadow on a subset of the detectors 108 below the first location 204 because it blocks some of the radiation 116, preventing it from reaching the detectors 108 below the first location 204. In some embodiments, the sample 101 may be placed in a sample holder 109 (Figures 1C and 1D).

[0030] The sample 101 is scanned by stepping along a first direction 110 with a step size smaller than the spatial resolution of the detector 108 and stopping after each step, and by irradiating the sample 101 with X-rays from the source 102. In some embodiments, the sample 101 is continuously irradiated, even when the sample 101 is moved during the stepping. This scan generates m sets of signals, each set of signals being proportional to the amount of X-rays 116 that penetrate the sample 101 and strike one of the m detectors 108 during each step. A calibration curve is established for each of the detectors 108 by fitting the known basic weight of the sample 101 to the corresponding signal of each of the m detectors 108.

[0031] Detector 108 includes or is connected to circuitry 205 to receive initial signals generated from the interaction of radiation 116 with detector 108 as input. These initial signals are amplified and digitized by circuitry 205 and output as sample signals, which are used to construct a calibration curve for detector 108. In some embodiments, the sample signals are sent / input to computing device 500 (described in more detail below with reference to FIG. 5).

[0032] One or more samples 101 can be scanned. For example, n samples 101 can be used, where n is a positive integer greater than zero. Samples 101 can have different known basic weights or thicknesses. Therefore, each calibration curve will include at least n data points and may also include dark (no X-ray transmission) and bright (maximum X-ray transmission) data used to construct the calibration curve. In other words, each calibration curve corresponds to one set of signals from m sets of signals, where each set of signals in the m sets of signals can have at least n signals if n samples are used. Any number of samples 101 can be used depending on the desired accuracy of the calibration curve. In some embodiments, two or three samples 101 are used. In some embodiments, up to 25 samples 101 are used.

[0033] Figure 3 illustrates a scanning step or procedure according to some embodiments. Sample 101 is shown in a transparent view above detector array 106. The position of sample 101 in each scanning step 0 to 4 is shown from top to bottom in the figure, where scanning step 0 positions sample 101 at a first position. When sample 101 is in the first position, sample 101 is irradiated, and X-rays passing through sample 101 are projected onto the leftmost detector 108-1 in detector array 108, thereby generating a signal. The sample is then moved from the first position 204 in the first step along a first direction 110, and detectors 108-1 and 108-2 generate signals by X-rays passing through sample 101. The sample is then moved in a second step, where sample 101 covers detectors 108-1, 108-2, and 108-3. Steps 3, 4, etc., can be performed until all detectors 108 in detector array 106 have collected signals corresponding to the X-rays passing through sample 101. Thus, each detector generates a set of signals associated with sample 101. The second and third samples can then be scanned in a similar manner, providing new signals corresponding to the second and third samples, and grouped by detectors 108. In some embodiments, sample 101 can be positioned at a second location 304, which is offset along a second direction 112. Any distance along the second direction 112 can be used to position sample 101 at the second location. In some embodiments, additional starting locations, such as a third, fourth, or fifth location, can be used, each additional starting location offset relative to the previous location along the second direction 112. In this way, the entire area of ​​sample 101 can be scanned, where the resolution depends in part on the step size and the starting location. In some embodiments, sample 101 can be translated from the second location 304 and any subsequent starting location along a first direction 110. It should also be noted that the scanning steps do not need to be in the order shown, i.e., steps 0 to 4, where sample 101 is moved from the leftmost detector 108-1 to the rightmost detector 108-m. In some embodiments, the starting position can be any position where sample 101 is placed above the array, such that sample 101 is between at least one detector 108 and source 102. For example, the first position can be the position shown to the left of step 2 in Figure 3, and sample 101 can be moved to other positions in a random order, such as the positions shown in steps 0, 4, m, etc., until all steps are completed.

[0034] Table 1 shows the data collected using the method shown in Figure 3, associated with a detector array 106 containing n samples 101 and m detectors 108. Groups 1 through m are column headers, with columns 1-n being subheadings for each group. Starting positions are shown as row headers (e.g., first position 204 and second position 304), with steps 1 through m shown as subheadings for each starting position. Each group corresponds to a detector 108 and includes the signal from each of the n samples 101 (denoted by x in the table). It should also be noted that each sample 101 will contribute a number of signals, depending on the step size and the size of the shadow cast by the sample 101 on the detector 108. Using the step size and sample 101 shown in Figure 3, each sample 101 yields 3 signals. The smaller the step size, the more signal each sample 101 provides, and the larger the step size, the less signal each sample 101 provides.

[0035] To further clarify this implementation, the progress of Sample 1 is summarized. After step 0, Sample 1 is supplied with X-rays only to detector 1 (which generates the signal x shown in Table 1), which is in group 1, while detector 2 (in group 2), detector 3 (in group 3), and up to detector m (group m) do not receive X-rays passing through Sample 1. Then, the sample is moved in step 1, after which Sample 1 is supplied with X-rays to detector 1 (group 1) and detector 2 (group 2) (which generate the signal x shown under the group 1-Sample 1 and group 2-Sample 1 entries in Table 1), while detector 3 (group 3), and up to detector m (group m) do not receive X-rays passing through Sample 1. Then, in step 2, the sample is moved, after which sample 1 is supplied with X-rays to detector 1 (group 1), detector 2 (group 2), and detector 3 (group 3) (generating the signal x shown under the items Group 1 - Sample 1, Group 2 - Sample 1, and Group 3 - Sample 1 in Table 1), while the remaining detectors up to detector m do not receive X-rays passing through sample 1. This operation is repeated up to step m. In the penultimate step m-2, detector m-2 (group m-2), detector m-1 (group m-1), and detector m (group m) receive X-rays passing through sample 1, while the remaining detectors 1 through m-2 do not receive X-rays passing through sample 1. In the penultimate step m-1, detector m-1 (group m-1) and detector m (group m) receive X-rays passing through sample 1, while all detectors from detector 1 to detector m-2 do not receive X-rays passing through sample 1. In the final step m shown in the table, only the m-th detector (group m) receives X-rays passing through sample 1. It should be understood that all detectors receive X-rays and provide signals during this procedure, but the signal represented by x corresponds only to the X-rays passing through the sample (such as sample 1).

[0036] The step size should not exceed the spacing of detector 108 in order to collect at least one signal from each sample. As used herein, the spacing is the width of detector 108 in the first direction 110. Smaller step sizes can provide more signals, but the data collection time will increase if the amount of time to collect data is the same for each step. In an extreme case, the step size can be infinitely small, where the scan is a continuous movement. In some embodiments, the step size is less than or equal to half the spatial resolution of detector 108. Spatial resolution is the spacing of the detectors. In some embodiments, the step size is less than or equal to 5 mm (e.g., less than or equal to 2 mm, less than or equal to 1 mm).

[0037] In some implementations, the sample is irradiated for the same amount of time after each step (and before subsequent steps) and when the sample 101 is at the initial first position 204 and the initial second position 304. For example, the sample is irradiated for a selected fixed time after each step, with the irradiation time between 1 millisecond and 5 seconds (e.g., 10 milliseconds to 100 milliseconds), before proceeding to the subsequent step. In some implementations, X-rays are continuously generated from source 102 (FIG. 2) while data is being collected, and radiation 116 is continuously projected onto detector array 106, but only the signal collected during the fixed time period is processed and used to generate calibration. In some other implementations, radiation 116 is not continuously projected onto detector array 106 during data collection, such as when source 102 is blocked by a shield during steps and during the time between fixed times (e.g., during stepping). The fixed time may also include a settling time. For example, stepping and movement may cause slight vibrations to sample 101, which can increase noise in the signal. Such vibrations can be mitigated by allowing some time after each step for the sample to stabilize in its new position.

[0038] In some implementations, each of the n samples 101 is positioned at a second location 304, which is offset along a second direction 112. This increases the signal quantity for each sample 101.

[0039] Table 1

[0040] Figure 4 is a flowchart of the steps of a calibration method for measuring instrument 100 according to some embodiments. In step 252, n samples 101 are positioned one at a time at a first position 204 between source 102 and detector array 106 of m detectors. In the following step 254, the n samples 101 are scanned individually by: 254a irradiating each sample 101 with X-rays from source 102 (Figure 2); 254b stepping each sample 101 along a first direction 110 with a step size smaller than the spatial resolution of detector 108; and 254c irradiating each sample 101 with X-rays from source 102. Step 254b and irradiation step 254c can be repeated. In step 256, a group of m signals is generated, wherein each signal is proportional to the X-rays transmitted through each of the n samples 101 and striking one of the m detectors 108 during each step. In step 258, a calibration curve is established for each detector in detector 108.

[0041] In some implementations, for example, before establishing the calibration curve, n samples (or a subset of these samples) are positioned at a second position 304 (FIG. 3) in step 260. The second position 304 is offset from the first position 204 along a second direction 112 perpendicular to the first direction 110. The second position 304 positions the n samples one at a time between the source and the detector array, with the distance between sample 101 and the source being the same as at the first position. Steps 254a, 254b, and 254c are then repeated. In step 256, a set of m' signals (instead of m signals) is generated. Each set of m' signals is proportional to the X-rays transmitted through each of the n samples 101 along the first direction starting from the second position during each step. The set of m' signals can then be used to update the calibration curve established in step 258, or the sets of m' and m signals can be combined, and then the calibration curve can be established using the m and m' signals.

[0042] In some embodiments, sample 101 is flat and has a uniform profile. For example, in some embodiments, sample 101 has a total thickness variation (TTV) of less than 10 micrometers (e.g., less than 5 micrometers, less than 3 micrometers, or less than 1 micrometer). In some embodiments, the variation of sample 101 with its average thickness is less than 5%.

[0043] In some embodiments, sample 101 also has a homogeneous composition. For example, sample 101 may have a layered structure in which each layer has the same composition, or sample 101 may be entirely substantially homogeneous. "Substantially homogeneous" here means that the bulk of sample 101 has a homogeneous composition, and recognizes that the outer surface may have thin layers (e.g., 1 nm to 100 nm) of different materials (such as oxides). In some embodiments, sample 101 has less than about 100 ppm of impurities (e.g., less than 10 ppm, less than 1 ppm, less than 100 ppb, less than 10 ppb of impurities). Sample 101 may include any element or combination of elements that can form a stable structure. As used herein, "stable" means that sample 101 retains its form and composition during treatment and irradiation using measuring instrument 100 (i.e., it does not undergo mechanical or chemical changes or degradation). In some embodiments, sample 101 includes a metal or alloy. In some embodiments, sample 101 includes a plastic, such as polypropylene, polyethylene, polycarbonate, or polyurethane. In some embodiments, sample 101 comprises main group elements such as carbon, silicon, germanium, oxygen, nitrogen, and phosphorus. In some embodiments, sample 101 is a metal or a main group oxide. The sample may even comprise a fluid within a container. In some embodiments, the sample has a composition within 5% of the target or intended composition.

[0044] In some embodiments, sample 101 is a semiconductor wafer or a portion thereof, such as a test wafer or diced piece taken from a semiconductor wafer. In some embodiments, the semiconductor wafer includes group IV elements (e.g., carbon, silicon, germanium), group II-V elements (e.g., aluminum, gallium, indium, arsenic, nitrogen, phosphorus), and metals (e.g., copper, tungsten, titanium). For example, the semiconductor wafer may be a silicon wafer, a silicon nitride wafer, a silicon carbide wafer, a germanium wafer, a gallium arsenide wafer, a titanium nitride wafer, a tungsten wafer, a copper wafer, or a layered combination formed from these wafers (e.g., a silicon nitride layer, a titanium nitride layer, a copper layer, or a tungsten layer deposited or grown on a silicon substrate). In some embodiments, the semiconductor wafer is a silicon wafer. In some embodiments, the semiconductor wafer is a germanium wafer. In some embodiments, the sample is a single crystal, such as a single crystal grown by the Czerklaussky process. In some embodiments, the wafer is a crystalline silicon wafer, and in some other embodiments, the wafer is a crystalline germanium wafer.

[0045] In some embodiments, sample 101 comprises battery electrode materials, such as aluminum and copper sheets or foils. In some embodiments, sample 101 comprises battery active materials, such as metal oxides and metal phosphates. In some embodiments, sample 101 comprises cathode active materials. In some embodiments, sample 101 is a test piece or cut piece taken from battery materials (such as cathodes). In some embodiments, sample 101 comprises pure metals or metal alloys. In some embodiments, sample 101 comprises plastics or ceramics.

[0046] In some embodiments, samples 101 with different base weights or thicknesses are used. In some embodiments, samples 101 have different compositions. In some embodiments, samples 101 have the same composition but different base weights and thicknesses. The thickness of sample 101 can be measured by any suitable profilometer or as per the manufacturer's instructions. The base weight can be determined by measuring the area of ​​the sample exposed to radiation 116 (e.g., the top portion of the sample generally facing the radiation source 102) and weighing the sample (e.g., using an analytical balance); the base weight is then calculated as weight per unit area. In some embodiments, the area of ​​the sample facing the source is greater than about 10 cm². 2 Such as greater than 50cm 2 Or from 10 to approximately 200 cm 2 Within a range, such as 100 cm 2 In some embodiments, the known basic weight of sample 101 is determined with an accuracy of about 1%, 0.5%, or 0.1%. In some embodiments, the mass of sample 101 is at least 5 mg (e.g., the sample has a mass between about 5 mg and 1000 g).

[0047] Any number of detectors 108 can be used in detector array 106. For example, in some embodiments, the number of detectors 108 in detector array 106 is between about 1 and 2000 (e.g., 10 to 2000).

[0048] Any suitable detector 108 can be used. For example, a photodiode sensitive to radiation 116 can be used. The size of the diode can also be selected based on the desired resolution. In some embodiments, the diode spacing can be in the range of about 0.5 mm to about 1 cm, such as about 1 mm to 1.6 mm.

[0049] In some implementations, the calibration curve is a polynomial least-squares fit of the signal, or a value derived from the signal, to the corresponding fundamental weight or thickness of sample 101. Dark or bright data may also be included in the polynomial fit. The polynomial power is chosen to be no greater than approximately n / 2+1 to avoid overfitting. Thus, the calibration curve provides a relationship, i.e., a polynomial equation, relating the signal to the fundamental weight or thickness of each detector in detector 108.

[0050] Figure 5 is a block diagram of a computing device 500 capable of performing some or all of the method steps described herein. In some embodiments, the method is implemented using a single computing device 500 or through multiple computing devices 500. Furthermore, as discussed below, the computing device 500 (or multiple computing devices 500) implementing the method may be part of one or more of the following: a scientific instrument 610, a user local computing device 620, a service local computing device 630, or a remote computing device 640, as described below with reference to Figure 6.

[0051] The computing device 500 of Figure 5 is shown as having multiple components, but any or more of these components may be omitted or repeated based on application and setup requirements. In some embodiments, some or all of the components included in the computing device 500 may be attached to one or more motherboards and enclosed in a housing (e.g., including plastic, metal, and / or other materials). In some embodiments, some of these components may be fabricated onto a single system-on-a-chip (SoC) (e.g., the SoC may include one or more processing devices 502 and one or more storage devices 504). Additionally, in various embodiments, the computing device 500 may not include one or more of the components shown in Figure 5, but may include an interface circuitry (not shown) for coupling to the one or more components using any suitable interface (e.g., a Universal Serial Bus (USB) interface, a High Definition Multimedia Interface (HDMI) interface, a Controller Area Network (CAN) interface, a Serial Peripheral Interface (SPI) interface, an Ethernet interface, a wireless interface, or any other suitable interface). For example, computing device 500 may not include display device 510, but may include display device interface circuitry (e.g., connectors and driver circuitry) to which display device 510 may be coupled.

[0052] Computing device 500 may include processing device 502 (e.g., one or more processing devices). Herein, the term "processing device" can refer to any device or part of a device that processes electronic data from registers and / or memory to convert said electronic data into other electronic data that can be stored in registers and / or memory. Processing device 502 may include one or more digital signal processors (DSPs), application-specific integrated circuits (ASICs), central processing units (CPUs), graphics processing units (GPUs), cryptographic processors (dedicated processors that execute cryptographic algorithms within hardware), server processors, or any other suitable processing device.

[0053] Computing device 500 may include storage device 504 (e.g., one or more storage devices). Storage device 504 may include one or more memory devices, such as random access memory (RAM) (e.g., static RAM (SRAM) devices, magnetic RAM (MRAM) devices, dynamic RAM (DRAM) devices, resistive RAM (RRAM) devices, or conductive bridged RAM (CBRAM) devices), hard disk drive-based memory devices, solid-state memory devices, network drives, cloud drives, or any combination of memory devices. In some embodiments, storage device 504 may include memory sharing a die with processing device 502. In such embodiments, the memory may be used as cache memory and may include, for example, embedded dynamic random access memory (eDRAM) or spin-transfer torque magnetic random access memory (STT-MRAM). In some embodiments, storage device 504 may include a non-transitory computer-readable medium having instructions thereon that, when executed by one or more processing devices (e.g., processing device 502), cause computing device 500 to perform any suitable method or portion thereof of the methods disclosed herein. The storage device 504 may also store calibration curves and signals for each detector in the detector 108, which are generated by irradiating the sample 101 or object with radiation from the radiation source 102 and detecting the radiation transmitted through the sample 101 or object and reaching the detector 108.

[0054] Computing device 500 may include interface device 506 (e.g., one or more interface devices 506). Interface device 506 may include one or more communication chips, connectors, and / or other hardware and software to manage communication between computing device 500 and other computing devices. For example, interface device 506 may include circuitry for managing wireless communication used to transmit data with computing device 500. The term "wireless" and its derivatives can be used to describe circuits, devices, systems, methods, techniques, communication channels, etc., that can transmit data through a non-solid medium using modulated electromagnetic radiation. This term does not imply that the associated device does not contain any wires, although in some embodiments it may not contain any wires. The circuitry included in interface device 506 for managing wireless communications may implement any of a number of wireless standards or protocols, including but not limited to Institute of Electrical and Electronics Engineers (IEEE) standards, including Wi-Fi (IEEE 802.11 series), IEEE 802.16 standards (e.g., IEEE 802.16-2005 amendments), Long Term Evolution (LTE) projects, and any amendments, updates, and / or revisions (e.g., Advanced LTE projects, Ultra Mobile Broadband (UMB) projects (also known as “3GPP2”), etc.). In some implementations, the circuitry included in interface device 706 for managing wireless communications may operate according to Global System for Mobile Telecommunications (GSM), General Packet Radio Service (GPRS), Universal Mobile Telecommunications System (UMTS), High Speed ​​Packet Access (HSPA), Evolved HSPA (E-HSPA), or LTE networks. In some embodiments, the circuitry included in interface device 506 for managing wireless communications may operate according to enhanced data for GSM Evolution (EDGE), GSM EDGE Radio Access Network (GERAN), Universal Terrestrial Radio Access Network (UTRAN), or Evolved UTRAN (E-UTRAN). In some embodiments, the circuitry included in interface device 506 for managing wireless communications may operate according to Code Division Multiple Access (CDMA), Time Division Multiple Access (TDMA), Digital Enhanced Cordless Telecommunications (DECT), Evolved Data Optimization (EV-DO) and its derivatives, and any other wireless protocol designated as 3G, 4G, 5G, or higher. In some embodiments, interface device 506 may include one or more antennas (e.g., one or more antenna arrays) for receiving and / or transmitting wireless communications.

[0055] In some embodiments, interface device 506 may include circuitry for managing wired communications such as electrical, optical, or any other suitable communication protocol. For example, interface device 506 may include circuitry supporting communications based on Ethernet technology. In some embodiments, interface device 506 may support both wireless and wired communications, and / or may support multiple wired communication protocols and / or multiple wireless communication protocols. For example, a first set of circuitry for interface device 506 may be dedicated to short-range wireless communications such as Wi-Fi or Bluetooth, while a second set of circuitry for interface device 506 may be dedicated to long-range wireless communications such as Global Positioning System (GPS), EDGE, GPRS, CDMA, WiMAX, LTE, EV-DO, etc. In some embodiments, a first set of circuitry for interface device 506 may be dedicated to wireless communications, and a second set of circuitry for interface device 506 may be dedicated to wired communications.

[0056] In some implementations, the interface device can input signals into a calibration curve or model to generate a calibration curve for each detector in detector 108, such as signals from circuit 205.

[0057] The computing device 500 may include a battery / power circuit 508. The battery / power circuit system 508 may include one or more energy storage devices (e.g., batteries or capacitors) and / or a circuit system for coupling components of the computing device 500 to a power source (e.g., AC line power) that is separate from the computing device 500.

[0058] Computing device 500 may include display device 510 (e.g., multiple display devices). Display device 510 may include any visual indicator, such as a head-up display, computer monitor, projector, touchscreen display, liquid crystal display (LCD), light-emitting diode display, or flat panel display. In some embodiments, the display device may display real-time processing information, such as the thickness or basic weight of sheet 104, or the calibration curves (when they are established) for each detector in detector 108.

[0059] Computing device 500 may include other input / output (I / O) devices 512. Other I / O devices 512 may include, for example, one or more audio output devices (e.g., speakers, headphones, earphones, alarm clocks, etc.), one or more audio input devices (e.g., microphones or microphone arrays), positioning devices (e.g., GPS devices that communicate with satellite-based systems to receive the location of computing device 500, as known in the art), audio codecs, video codecs, printers, sensors (e.g., thermocouples or other temperature sensors, humidity sensors, pressure sensors, vibration sensors, accelerometers, gyroscopes, etc.), image capture devices (such as cameras), keyboards, cursor control devices (such as mice, styluses, trackballs, or touchpads), barcode readers, quick-response (QR) code readers, or radio frequency identification (RFID) readers.

[0060] The computing device 500 can have any form factor suitable for its application and scenario, such as handheld or mobile computing devices (e.g., mobile phones, smartphones, mobile internet devices, tablets, laptops, netbooks, ultrabooks, personal digital assistants (PDAs), ultra-mobile personal computers, etc.), desktop computing devices, server computing devices, or other networked computing components.

[0061] One or more computing devices 500 implementing any of the methods described herein may be part of a scientific instrument support system. Figure 6 is a block diagram of an example scientific instrument support system 600 according to various embodiments in which some or all of the methods disclosed herein may be performed. The methods disclosed herein (e.g., the methods described with reference to Figures 2, 3, and 5) may be implemented by one or more of the scientific instruments 610 (e.g., measurement or screening instrument 100), user local computing devices 620, service local computing devices 630, or remote computing devices 640 of the scientific instrument support system 600.

[0062] Any of the scientific instrument 610, the user local computing device 620, the service local computing device 630, or the remote computing device 640 may include any of the embodiments of the computing device 500 discussed herein with respect to FIG. 5, and any of the scientific instrument 610, the user local computing device 620, the service local computing device 630, or the remote computing device 640 may take the form of any suitable embodiment of the computing device 500 discussed herein with respect to FIG. 5.

[0063] Scientific instrument 610, user local computing device 620, service local computing device 630, or remote computing device 640 may each include a processing device 602, a storage device 604, and an interface device 606. The processing device 602 may take any suitable form, including any of the processing devices 502 discussed herein with reference to FIG. 5, and the processing devices 602 included in different devices of scientific instrument 610, user local computing device 620, service local computing device 630, or remote computing device 640 may take the same or different forms. The storage device 604 may take any suitable form, including any of the storage devices 504 discussed herein with reference to FIG. 5, and the storage devices 604 included in different devices of scientific instrument 610, user local computing device 620, service local computing device 630, or remote computing device 640 may take the same or different forms. Interface device 606 may take any suitable form, including any of the interface devices 506 discussed herein with reference to FIG5, and the interface devices 606 included in different devices such as scientific instrument 610, user local computing device 620, service local computing device 630, or remote computing device 640 may take the same or different forms.

[0064] Scientific instrument 610, user local computing device 620, service local computing device 630, and remote computing device 640 can communicate with other elements of scientific instrument support system 600 via communication path 608. As shown, communication path 608 can communicatively couple interface devices 606 of different elements in scientific instrument support system 600 and can be a wired or wireless communication path (e.g., any communication technology discussed herein according to interface device 506 of computing device 500 shown with reference to FIG. 5). The particular scientific instrument support system 600 depicted in FIG. 6 includes communication paths between each pair of scientific instrument 610, user local computing device 620, service local computing device 630, and remote computing device 640; however, this “fully connected” implementation is merely illustrative, and various communication paths in communication path 608 may not exist in various implementations. For example, in some embodiments, the serving local computing device 630 may not have a direct communication path 608 between its interface device 606 and the interface device 606 of the scientific instrument 610. Instead, it may communicate with the scientific instrument 610 via a communication path 608 between the serving local computing device 630 and the user local computing device 620 and a communication path 608 between the user local computing device 620 and the scientific instrument 610.

[0065] Scientific instrument 610 may include any suitable scientific instrument, such as measuring or X-ray screening instrument 100.

[0066] User local computing device 620 may be a computing device that is local to the user of scientific instrument 610 (e.g., any of the embodiments of computing device 500 discussed herein). In some embodiments, user local computing device 620 may also be located locally to scientific instrument 610, but this is not always the case; for example, user local computing device 620 located in a user's home or office may be remote from scientific instrument 610 but communicate with it, allowing the user to use user local computing device 620 to control and / or access data from scientific instrument 610. In some embodiments, user local computing device 620 may be a laptop computer, smartphone, or tablet device. In some embodiments, user local computing device 620 may be a portable computing device.

[0067] The servicing local computing device 630 may be a computing device local to the entity serving the scientific instrument 610 (e.g., any of the embodiments of the computing device 500 discussed herein). For example, the servicing local computing device 630 may be a local device of the manufacturer of the scientific instrument 610, a local user of the scientific instrument 610, or a third-party service company. In some embodiments, the servicing local computing device 630 may communicate with the scientific instrument 610, the user's local computing device 620, and / or the remote computing device 640 (e.g., via direct communication path 608 or via multiple "indirect" communication paths 608, as discussed above) to receive data regarding the operation of the scientific instrument 610, the user's local computing device 620, and / or the remote computing device 640 (e.g., self-test results of the scientific instrument 610, calibration coefficients used by the scientific instrument 610, measurement results of sensors (such as detectors) associated with the scientific instrument 610, etc.). In some implementations, the service local computing device 630 may communicate with the scientific instrument 610, the user local computing device 620, and / or the remote computing device 640 (e.g., via direct communication path 608 or via multiple "indirect" communication paths 608, as discussed above) to transmit data to the scientific instrument 610, the user local computing device 620, and / or the remote computing device 640 (e.g., to update programming instructions, such as firmware, initiating the execution of test or calibration sequences in the scientific instrument 610, or updating programming instructions, such as software, in the user local computing device 620 or the remote computing device 640). A user of the scientific instrument 610 may use the scientific instrument 610 or the user local computing device 620 to communicate with the service local computing device 630 to report problems with the scientific instrument 610 or the user local computing device 620, request on-site technician visits to improve the operation of the scientific instrument 610, order consumables or replacement parts associated with the scientific instrument 610, or for other purposes.

[0068] Remote computing device 640 may be a computing device located remotely from scientific instrument 610 and / or user local computing device 620 (e.g., any of the embodiments of computing device 500 discussed herein). In some embodiments, remote computing device 640 may be included in a data center or other large server environment. In some embodiments, remote computing device 640 may include network-attached storage (e.g., as part of storage device 604). Remote computing device 640 may store data generated by scientific instrument 610, perform analysis on data generated by scientific instrument 610 (e.g., according to programming instructions), facilitate communication between user local computing device 620 and scientific instrument 610, and / or facilitate communication between service local computing device 630 and scientific instrument 610.

[0069] In some embodiments, one or more of the elements of the scientific instrument support system 600 shown in FIG. 6 may be absent. Additionally, in some embodiments, multiple elements of the various elements of the scientific instrument support system 600 of FIG. 6 may be present. For example, the scientific instrument support system 600 may include multiple user local computing devices 620 (e.g., different user local computing devices 620 associated with different users or located in different locations). In another example, the scientific instrument support system 600 may include multiple scientific instruments 610, all of which communicate with a serving local computing device 630 and / or a remote computing device 640; in such embodiments, the serving local computing device 630 may monitor multiple scientific instruments 610, and the serving local computing device 630 may cause updates, or other information may be simultaneously “broadcast” to multiple scientific instruments 610. Different scientific instruments among the scientific instruments 610 in the scientific instrument support system 600 may be close to each other (e.g., in the same room) or far from each other (e.g., on different floors of a building, in different buildings, in different cities, etc.). In some implementations, scientific instrument 610 may be connected to an Internet of Things (IoT) stack that allows command and control of scientific instrument 610 via web-based applications, virtual or augmented reality applications, mobile applications, and / or desktop applications. Any of these applications may be accessible to a user operating a user-local computing device 620 that communicates with scientific instrument 610 via an intermediate remote computing device 640. In some implementations, the manufacturer may sell scientific instrument 610, along with one or more associated user-local computing devices 620, as part of a local scientific instrument computing unit 612.

[0070] Figure 7 is a block diagram of a system 700 for checking a measurement response according to some embodiments. The system includes previously described elements: a radiation source 102, a detector array 106 linearly arranged or oriented along a first direction 110, a sample holder 109, a computing device 500, and a space 107 between the source 102 and the detector array 106. The system also includes a power supply 702, such as a mains power supply or a battery. The power supply 702 may be the same as the battery / power supply 508 that powers the computing device 500, or the power supply 702 may be a different power source. In some embodiments, the system 700 also includes a translation element 114, such as a roller, to translate a sheet 104 through the space 107.

[0071] In some embodiments, the system also includes one or more housings and supports 704. One or more supports hold or support the various components to enable them to function. For example, a support frame can hold the source 102 in the correct orientation above the detector array 106 (FIG. 2). Supports can also secure mechanical elements, such as motors connected to the sample holder 109 or translation element 114. Housings can be implemented for safety reasons. For example, radiation shielding can be included as part of the housing. Housings can also be used to separate various components of the system, such as measuring instrument 100 and computing device 500.

[0072] Measuring instrument 100 can be an instrument used for screening or measuring objects. The object can be, but is not limited to, a continuous film, or various objects on a conveyor belt or similar transport system, such as packages, goods, mail, and minerals. In some embodiments, the object is food or medicine. In some embodiments, the object is a living organism, such as a plant or mammal. In some embodiments, the object is a vehicle, such as a car, train, or truck. In some embodiments, the object is the cathode or anode of a lithium-ion battery, or a precursor thereof. In some embodiments, the object is the separator of a lithium-ion battery.

[0073] Paragraphs 1-15 below provide various examples of the embodiments disclosed herein.

[0074] Paragraph 1. A calibration method for a measuring instrument (100) includes: positioning n samples (101), each having a known basic weight, one at a time at a first position (204), the first position (204) being between a source (102) and a detector array (106) consisting of m detectors (108) linearly oriented along a first direction (110); scanning the n samples (101) by: (a) irradiating each of the n samples (101) with X-rays from the source (102), (b) stepping each of the n samples (101) along the first direction (110) with a step size smaller than the spatial resolution of the detectors (108), and (c) irradiating each of the n samples (101) with X-rays from the source (102); generating m sets of signals, each set corresponding to one of the m detectors 108, and each signal being transmitted through each of the n samples (101) and striking the m detectors during the scan. X-rays on one of the detectors (108) are scaled; and a calibration curve is established for each detector (108) by fitting the known basic weight of each of the n samples (101) to a group of m signals, where n is a positive integer greater than 0 and m is a positive integer greater than 1.

[0075] Paragraph 2. According to the method described in Paragraph 1, the method further includes repeating the (b) step and (c) irradiation steps once or multiple times.

[0076] Paragraph 3. The method described in Paragraph 1 or Paragraph 2, wherein the sample (101) is flat.

[0077] Paragraph 4. The method described in any one of paragraphs 1 through 3, wherein each sample (101) has a homogeneous composition independently.

[0078] Paragraph 5. The method described in any one of paragraphs 1 through 4, wherein the sample (101) comprises a cathode active material, a pure metal, a metal alloy, a plastic, a ceramic, or a semiconductor material.

[0079] Paragraph 6. The method described in any of paragraphs 1 through 5, wherein the known basic weight is accurate to 1%.

[0080] Paragraph 7. The method described in any one of paragraphs 1 through 6, wherein the area of ​​the sample (101) facing the source is greater than 10 cm². 2 .

[0081] Paragraph 8. The method described in any one of paragraphs 1 through 7, wherein the mass of the sample (101) is at least 5 mg.

[0082] Paragraph 9. The method described in any one of paragraphs 1 through 8, wherein the number of n samples (101) is greater than 1.

[0083] Paragraph 10. The method described in any of paragraphs 1 through 9, wherein the number of detectors (108) in array m is between 1 and 20,000.

[0084] Paragraph 11. According to the method described in any one of paragraphs 1 through 10, wherein before establishing the calibration curve: n samples between the source (102) and the detector array (106) are positioned one at a time at a second position (304), wherein the second position (304) is offset along a second direction (112) perpendicular to the first direction (110), and the second position (304) places the n samples (101) at the same distance from the source (102) as at the first position (204); the n samples (101) are scanned by repeating steps (a), (b), and (c); a group of m' signals is generated, each signal being proportional to the X-rays transmitted through each of the n samples (101) during each step and striking one of the m detectors (108) during each step; and the group of m signals is updated to include the group of m' signals before establishing the calibration curve for each detector (108).

[0085] Paragraph 12. The method described in any of paragraphs 1 through 11, wherein the step size is less than or equal to half the spatial resolution of the n detectors.

[0086] Paragraph 13. The method described in any one of paragraphs 1 through 12, wherein the step size is less than or equal to 5 mm.

[0087] Paragraph 14. According to the method described in any of paragraphs 1 through 13, the method further includes stopping for the same amount of time after each step.

[0088] Paragraph 15. The method described in any of paragraphs 1 through 14, wherein X-rays from the source (102) form a fan-shaped beam that is emitted from the source (102) and extends toward the detector array (106).

[0089] Paragraph 16. The method described in any one of paragraphs 1 through 15, wherein n samples (101) are located near the detector array (106) and away from the source (102).

[0090] Paragraph 17. A system for calibrating a measuring instrument (100) comprising: an X-ray source (102); a detector array (106) consisting of m detectors (108) linearly oriented along a first direction (110); a space (107) between the source (102) and the detector array (106); a sample holder (109); and a computing device (500) thereon storing executable code, wherein the executable code is configured to send instructions for one or more of the following: positioning n samples (101), each having a known basic weight, one at a time at a first position (204), the first position (204) being between the source (102) and the detector array (106), the detector array consisting of m detectors (108) linearly oriented along a first direction (110); scanning the n samples (101) by: (a) using X-rays from the source (102) (a) Irradiating each of the n samples (101) with X-rays, (b) stepping each of the n samples (101) along a first direction (110) with a step size smaller than the spatial resolution of the detector (108), and (c) irradiating each of the n samples (101) with X-rays from a source (102); generating m sets of signals, each set corresponding to one of the m detectors 108, and each signal being proportional to the amount of X-rays transmitted through each of the n samples (101) and striking one of the m detectors (108) during the scan; and establishing a calibration curve for each detector (108) by fitting the known basic weight of each of the n samples (101) to the set of m signals, where n is a positive integer greater than 0 and m is a positive integer greater than 1.

[0091] Paragraph 18. According to the system described in paragraph 17, the sample holder (109) is capable of holding more than one sample (101) at a time.

[0092] Paragraph 19. The system according to paragraph 17 or 18, wherein the step size is less than the spatial resolution of n detectors (108).

[0093] Paragraph 20. The system according to any one of paragraphs 17 through 19, wherein the sample holder (109) is an xy stage capable of moving the sample (101) along a second direction (112) perpendicular to the first direction while maintaining the same distance between the sample (101) and the source (102). Paragraph 21. The system according to paragraph 20, further comprising: a translation element configured to translate the object through space or in space along a second direction different from the first direction.

[0094] Paragraph 22. One or more non-transitory computer-readable media having instructions thereon that, when executed by one or more processing devices of a measuring instrument support apparatus, cause the measuring instrument support apparatus to perform the method described in any one of paragraphs 1 through 16.

[0095] Using the knowledge gained from this disclosure, those skilled in the art will recognize that various changes can be made to the disclosed apparatus and methods in order to obtain these and other advantages without departing from the scope of this disclosure. Thus, it should be understood that the features described herein are readily modified, altered, changed, or substituted. For example, all combinations of those elements and / or steps that are explicitly contemplated to perform substantially the same function in substantially the same manner to achieve the same result are within the scope of the embodiments described herein. It is perfectly intentional and conceivable to substitute an element in one described embodiment for an element in another embodiment. The specific embodiments illustrated and described herein are for illustrative purposes only and are not intended to limit the embodiments set forth in the appended claims. Other embodiments will be apparent to those skilled in the art. It should be understood that the foregoing description is for clarity only and is exemplary only. The spirit and scope of this disclosure are not limited to the foregoing embodiments and descriptions, but are covered by the following claims. All disclosures and patent applications cited above are incorporated herein by reference in their entirety to the same extent for all purposes, as if each individual disclosure or patent application were specifically and individually designated to be incorporated by such reference.

Claims

1. A calibration method for a measuring instrument (100), the method comprising: n samples (101) each having a known basic weight are positioned one at a time at a first position (204), the first position (204) being between a source (102) and a detector array (106) consisting of m detectors (108) linearly oriented along a first direction (110); The n samples (101) are scanned by: (a) irradiating each of the n samples (101) with X-rays from the source (102), (b) stepping each of the n samples (101) along the first direction (110) with a step size smaller than the spatial resolution of the detector (108), and (c) irradiating each of the n samples (101) with X-rays from the source (102). m sets of signals are generated, each set corresponding to one of the m detectors 108, and each signal is proportional to the X-rays transmitted through each of the n samples (101) and striking one of the m detectors (108) during the scan; And by fitting the known basic weight of each of the n samples (101) to a group of m signals, a calibration curve is established for each detector (108), where n is a positive integer greater than 0 and m is a positive integer greater than 1.

2. The method according to claim 1, the method further comprising repeating the (b) stepping and (c) irradiation steps once or multiple times.

3. The method according to claim 1, wherein the sample (101) is flat.

4. The method according to claim 1, wherein each of the samples (101) has a homogeneous composition independently.

5. The method according to claim 1, wherein the sample (101) comprises a cathode active material, a pure metal, a metal alloy, a plastic, a ceramic, or a semiconductor material.

6. The method of claim 1, wherein the known basic weight is accurate to 1%.

7. The method according to claim 1, wherein the area of ​​the sample (101) facing the source is greater than 10 cm². 2 .

8. The method according to claim 1, wherein the mass of the sample (101) is at least 5 mg.

9. The method according to claim 1, wherein the number of n samples (101) is greater than 1.

10. The method of claim 1, wherein the number of detectors (108) in the array m is between 1 and 20,000.

11. The method of claim 1, wherein, prior to establishing the calibration curve: the n samples between the source (102) and the detector array (106) are positioned one at a time at a second position (304), wherein the second position (304) is offset along a second direction (112) perpendicular to the first direction (110), and the second position (304) places the n samples (101) at the same distance from the source (102) as at the first position (204); the n samples (101) are scanned by repeating steps (a), (b), and (c); a group of m' signals is generated, each signal being proportional to the X-rays transmitted through each of the n samples (101) during each step and striking one of the m detectors (108) during each step; and the group of m signals is updated to include the group of m' signals prior to establishing the calibration curve for each detector (108).

12. The method of claim 1, wherein the step size is less than or equal to half the spatial resolution of the n detectors.

13. The method of claim 1, wherein the step size is less than or equal to 5 mm.

14. The method of claim 1, further comprising stopping for the same amount of time after each step.

15. The method of claim 1, wherein the X-rays from the source (102) form a fan-shaped beam emanating from the source (102) and extending toward the detector array (106).

16. The method of claim 1, wherein the n samples (101) are located near the detector array (106) and away from the source (102).

17. A system for calibrating a measuring instrument (100), the system comprising: An X-ray source (102); a detector array (106) consisting of m detectors (108) linearly oriented along a first direction (110); a space (107) between the source (102) and the detector array (106); a sample holder (109); and a computing device (500) thereon storing executable code, wherein the executable code is configured to send instructions for one or more of the following: positioning n samples (101), each having a known basic weight, one at a time at a first position (204), the first position (204) being between the source (102) and the detector array (106); scanning the n samples (101) by: (a) irradiating the n samples (101) with X-rays from the source (102). (b) each of the n samples (101) is stepped along the first direction (110) with a step size smaller than the spatial resolution of the detector (108), and (c) each of the n samples (101) is irradiated with X-rays from the source (102). m sets of signals are generated, each set corresponding to one of the m detectors 108, and each signal is proportional to the X-rays transmitted through each of the n samples (101) and striking one of the m detectors (108) during the scan; And by fitting the known basic weight of each of the n samples (101) to a group of m signals, a calibration curve is established for each detector (108), where n is a positive integer greater than 0 and m is a positive integer greater than 1.

18. The system of claim 17, wherein the sample holder (109) is capable of holding more than one sample (101) at a time.

19. The system of claim 17, wherein the step size is less than the spatial resolution of the n detectors (108).

20. The system of claim 17, wherein the sample holder (109) is an xy stage, the sample holder being capable of moving the sample (101) along a second direction (112) perpendicular to the first direction while maintaining the same distance between the sample (101) and the source (102).

21. The system of claim 17, further comprising a translation element (114) configured to translate the sheet (104) through the space (107).

22. One or more non-transitory computer-readable media having instructions thereon that, when executed by one or more processing devices of a measurement instrument support device, cause the measurement support device to perform the method according to claim 1.

Images