A configuration command lookup method, measuring instrument, testing system, and program product.

Abstract

A configuration command lookup method, measuring instrument, test system, and program product are disclosed, relating to the field of electronic test and measurement instrument technology. The configuration command lookup method, applied to a measuring instrument, includes: acquiring pre-stored function association mapping information, which includes multiple parameter status items of the measuring instrument and their corresponding parameter identifiers; responding to a configuration operation performed by a user; acquiring parameter status items that have changed during the configuration operation, and determining the parameter identifier corresponding to the changed parameter status item based on the function association mapping information; acquiring a pre-stored parameter mapping table, which includes each parameter definition item in the measuring instrument, its corresponding configuration command, and parameter identifier, wherein the parameter identifier corresponding to the parameter definition item corresponds one-to-one with the parameter identifier of the parameter status item; searching for the parameter identifier of the changed parameter status item in the parameter mapping table, and determining the configuration command for the changed parameter status item based on the parameter identifier.

Description

Technical Field

[0001] This invention relates to the field of electronic test and measurement instrument technology, specifically to a configuration command lookup method, a measuring instrument, a test system, and a program product. Background Technology

[0002] With the continuous development of test and measurement technology and automation technology, various electronic test instruments are widely used in scientific research experiments, product development, manufacturing and quality inspection. To meet the needs of automated test systems and remote control, test instruments typically support control through standardized programmable instrument commands (SCPI), thereby enabling operations such as setting instrument parameters, switching functions, and querying status.

[0003] In existing technologies, instrument manufacturers typically provide corresponding SCPI programming manuals for their equipment, explaining the command formats and parameter meanings corresponding to various function configurations. However, due to the increasing complexity of instrument functions, the large number of configurable parameters, and the intricate command structure, users who wish to convert a specific configuration action on the instrument into a corresponding SCPI command usually need to consult numerous SCPI command documents to ultimately confirm the correspondence between the configuration action and the SCPI command.

[0004] This method, which relies on manually reviewing documents and performing verification, is cumbersome and inefficient, requiring a high level of expertise and experience from users. Especially in scenarios with complex and changing parameter configurations or the need to quickly build automated test scripts, users must repeatedly go through the above search process, which not only consumes a lot of time and energy but is also prone to errors due to misunderstandings or operational mistakes, affecting the accuracy of test results and the stability of system operation. Summary of the Invention

[0005] The main technical problem solved by this invention is to provide a simple and convenient method for finding configuration commands and a measuring instrument equipped with this method.

[0006] According to a first aspect, one embodiment provides a configuration command lookup method, the configuration command lookup method being applied to a measuring instrument, comprising:

[0007] Obtain pre-stored function association mapping information, which includes multiple parameter status items of the measuring instrument and parameter identifiers corresponding to each parameter status item;

[0008] Responding to configuration operations performed by the user;

[0009] Obtain the parameter status items that have changed during the configuration operation, and determine the parameter identifier corresponding to the changed parameter status items based on the function association mapping information;

[0010] Obtain a pre-stored parameter mapping table, which includes each parameter definition item in the measuring instrument, the configuration command corresponding to each parameter definition item, and the parameter identifier corresponding to each parameter definition item. The parameter identifier corresponding to each parameter definition item corresponds one-to-one with the parameter identifier of the parameter status item.

[0011] The parameter identifier of the changed parameter status item is searched in the parameter mapping table, and the configuration command of the changed parameter status item is determined based on the parameter identifier of the changed parameter status item.

[0012] In one embodiment, in response to a configuration operation performed by a user, the following steps are included:

[0013] In response to a configuration operation performed by the user, the configuration operation is used to trigger the execution of the function to be searched in the measuring instrument, so as to change the parameter status item corresponding to the function to be searched.

[0014] In one embodiment, in response to a configuration operation performed by a user, the following are included:

[0015] In response to a configuration operation performed by the user, the configuration operation is used to trigger the execution of parameter configuration in the measuring instrument, so as to change the corresponding parameter status item in the parameter configuration.

[0016] In one embodiment, obtaining the parameter status items that have changed during the configuration operation includes:

[0017] Read and save the first parameter table of the initial state of the measuring instrument;

[0018] Read and save the second parameter table generated after the parameter status item changes;

[0019] The first parameter table and the second parameter table are compared to determine the parameter status items that have changed during the configuration operation.

[0020] In one embodiment, the configuration command lookup method further includes:

[0021] Receive the start command to read and save the first parameter table;

[0022] In response to the configuration operation performed by the user, an end command is received to read and save the second parameter table.

[0023] In one embodiment, the configuration operation in response to a user includes:

[0024] The configuration operation is performed by a hardware interaction component that responds to user input of the measuring instrument.

[0025] In one embodiment, it further includes:

[0026] The configuration command saves and displays the changed parameter status items.

[0027] According to a second aspect, one embodiment provides a measuring instrument, characterized in that it comprises:

[0028] The processing module executes the configuration command lookup method as described in any of the above embodiments.

[0029] The display module is connected to the processing module to display the configuration commands for the changed parameter status items.

[0030] According to a third aspect, one embodiment provides a testing system, comprising:

[0031] The measuring instrument is the measuring instrument described in the above embodiments;

[0032] A host computer is connected to the measuring instrument and tests the measuring instrument according to the configuration instructions displayed or saved by the measuring instrument.

[0033] According to a fourth aspect, one embodiment provides a computer program product including a computer program and / or instructions, which, when executed by a processor, implement the method described in any of the above embodiments.

[0034] According to the configuration command lookup method, measuring instrument, testing system, and computer program product described in the above embodiments, the configuration command lookup method is applied to a measuring instrument. The method obtains pre-stored function association mapping information, which includes multiple parameter status items of the measuring instrument and parameter identifiers corresponding to each parameter status item. In response to a configuration operation performed by the user, it obtains the parameter status items that have changed during the configuration operation and determines the parameter identifiers corresponding to the changed parameter status items based on the function association mapping information. It further obtains a pre-stored parameter mapping table, which includes each parameter definition item in the measuring instrument, the configuration command corresponding to each parameter definition item, and the parameter identifier corresponding to each parameter definition item, with a one-to-one correspondence between the parameter identifiers of the parameter definition items and the parameter identifiers of the parameter status items. Then, it searches and determines the corresponding configuration command in the parameter mapping table based on the parameter identifier of the changed parameter status item.

[0035] Through the above technical solution, this application can automatically establish the correspondence between changed parameter status items and configuration commands during the user's configuration operation of measuring instruments. The configuration command corresponding to the configuration operation can be quickly obtained without manual searching of command documents. This not only significantly improves the efficiency and accuracy of configuration command search, but also makes the association between changed parameter status items and configuration commands clearer and more stable through the one-to-one correspondence based on parameter identifiers, avoiding matching errors caused by interface adjustments or parameter name changes. Attached Figure Description

[0036] Figure 1 A schematic diagram of the measuring instrument in one embodiment. Figure 1 ;

[0037] Figure 2 A schematic diagram of the measuring instrument in one embodiment. Figure 2 ;

[0038] Figure 3 Here is a flowchart of the overall method for configuring the command lookup method in another embodiment;

[0039] Figure 4 This is a method flow diagram of step S130 in the configuration command lookup method in one embodiment. Figure 1 ;

[0040] Figure 5 This is a method flow diagram of step S130 in the configuration command lookup method in one embodiment. Figure 2 ;

[0041] Figure 6 This is a schematic diagram of the test system in another embodiment. Detailed Implementation

[0042] The present invention will now be described in further detail with reference to specific embodiments and accompanying drawings. Similar elements in different embodiments are referred to by associated similar element reference numerals. In the following embodiments, many details are described to facilitate a better understanding of this application. However, those skilled in the art will readily recognize that some features may be omitted in different situations, or may be replaced by other elements, materials, or methods. In some cases, certain operations related to this application are not shown or described in the specification. This is to avoid obscuring the core parts of this application with excessive description. For those skilled in the art, detailed description of these related operations is not necessary; they can fully understand the related operations based on the description in the specification and general technical knowledge in the art.

[0043] Furthermore, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments. At the same time, the steps or actions in the method description can be rearranged or adjusted in a manner obvious to those skilled in the art. Therefore, the various orders in the specification and drawings are only for the clear description of a particular embodiment and do not imply a necessary order, unless otherwise stated that a particular order must be followed.

[0044] The serial numbers assigned to components in this document, such as "first" and "second," are used only to distinguish the objects being described and have no sequential or technical meaning. Unless otherwise specified, the terms "connection" and "linkage" used in this application include both direct and indirect connections (linkages).

[0045] Please refer to Figure 1 In one embodiment, this application provides a measuring instrument 21, which can be an oscilloscope, signal generator, spectrum analyzer, or other measuring instrument 21 with parameter configuration and remote control capabilities. The measuring instrument 21 supports configuration through a local human-machine interface or a remote interface, and the measuring instrument 21 includes at least a processing module 211 and a display module 212.

[0046] In one embodiment, the processing module 211 may consist of a processor and its associated software or hardware, used to perform functions such as configuration management, parameter change detection, command generation and recording of the measuring instrument 21. Specifically, the processing module 211 is configured to execute a configuration command lookup method, which can automatically locate the configuration command corresponding to the changed parameter (e.g., an SCPI command) after detecting a change in certain parameter status items, and record or export the configuration command.

[0047] In one embodiment, the display module 212 is connected to the processing module 211 and is used to display the configuration command corresponding to the changed parameter status item. The display module 212 can be a display device such as LCD, OLED or touch screen, and the displayed content may include the name of the changed parameter status item, the value before and after the change, and the corresponding configuration command.

[0048] Please refer to Figure 2 Optionally, the measuring instrument 21 also includes a storage module 213, an input module 214, and a communication module 215. The storage module 213 stores the configuration, parameter identifiers, function association mapping information, parameter mapping tables, and exported configuration command files of the measuring instrument 21. The input module 214 receives control commands from local user input (e.g., buttons, knobs, and touch controls) or remote input. The communication module 215 communicates with the host computer 22 via interfaces such as USB / LAN / WiFi / serial port, thereby supporting remote control.

[0049] Please refer to Figure 3 In another embodiment, this application also provides a configuration command lookup method, applied to the above-mentioned measuring instrument 21. This configuration command lookup method is the same as the configuration command lookup method executed by the processing module 211 in the above-mentioned measuring instrument 21 embodiment, and specifically includes the following steps.

[0050] Step S110: Obtain pre-stored function association mapping information.

[0051] In one embodiment, the functional association mapping information includes at least a plurality of parameter status items that the measuring instrument 21 supports configuration, and parameter identifiers corresponding to each parameter status item. The parameter status items include, but are not limited to, any functional parameters that can be configured through user operation or remote commands, such as frequency, amplitude, period, triggering mode, bandwidth, and voltage range. The parameter identifier is identification information used to uniquely identify the corresponding parameter status item, and can be an integer number, an enumerated value, or other identification form that can uniquely represent the parameter status item.

[0052] In one embodiment, the function association mapping information is pre-set by the measuring instrument 21 within itself. This can be achieved by adding parameter identifiers to the function execution programs within the measuring instrument 21. For example, in the system parameter configuration, parameter identifier fields are added for frequency parameters, amplitude parameters, etc., and each parameter status item is bound to the parameter identifier. When a parameter status item changes, the parameter identifier corresponding to that parameter status item can be directly obtained from the corresponding function execution program.

[0053] It should be noted that the parameter identifier can also be indirectly determined by the parameter path, index number, offset address, etc. As long as the parameter identifier corresponding to different parameter status items can be unique, it can be used as the implementation method of this application.

[0054] Step S120: In response to a configuration operation performed by the user.

[0055] In one embodiment, when executing the configuration command lookup method, it can respond to the configuration operation performed by the user and output the configuration command corresponding to the changed parameter status item based on the change in parameter status item caused by the configuration operation. The configuration operation is the configuration operation performed by the user operating the hardware interaction component of the measuring instrument 21, such as a button, knob, touch, and menu selection hardware interaction component.

[0056] In one embodiment, the user may perform a configuration operation with a specific purpose, namely, to find the configuration command corresponding to a certain function. The user selects and executes a configuration operation on the measuring instrument 21 that triggers the execution of the function, thereby changing at least one parameter status item corresponding to the function. For example, if the user wants to determine the configuration command corresponding to a function such as trigger mode switching, a measurement function on / off, or bandwidth limit on, the user enters the function item in the instrument menu and performs the setting action. After detecting the change in the parameter status item caused by the execution of the function, the configuration command is determined based on the parameter identifier of the parameter status item, thereby achieving rapid command search for the target function.

[0057] In one embodiment, the user may perform configuration operations not to find a specific function command, but to perform normal debugging and settings of the measuring instrument 21, such as waveform adjustment, range adjustment, time base adjustment, trigger level adjustment, etc. These operations may cause changes to one or more parameter status items in the measuring instrument 21. In response to such configuration operations, the user does not need to pre-specify the function to be searched. Instead, the changed parameter status items are obtained by comparing the parameter configuration before and after the configuration operation, and the corresponding configuration command is determined based on the parameter identifier for each changed parameter status item. In this way, the user can also incidentally obtain the configuration command corresponding to the parameter status item changed by the current operation during normal use without a specific search purpose.

[0058] Step S130: Obtain the parameter status items that have changed during the configuration operation, and determine the parameter identifier corresponding to the changed parameter status items based on the function association mapping information.

[0059] Please refer to Figure 4 In one embodiment, when performing step S130 to obtain the parameter status items that have changed during the configuration operation and to determine the parameter identifier corresponding to the changed parameter status items based on the function association mapping information, this can be achieved by comparing parameter tables, specifically including the following steps.

[0060] Step S131: Read and save the first parameter table of the initial state of the measuring instrument.

[0061] In one embodiment, at a set time before the user performs a configuration operation or before the configuration operation is triggered, the current parameter status of the measuring instrument 21 is read, and a first parameter table is generated and saved. The first parameter table includes at least the parameter status item name, the current parameter value corresponding to the parameter status item, and the parameter identifier corresponding to the parameter status item.

[0062] Step S133: Read and save the second parameter table generated after the parameter status item changes.

[0063] In one embodiment, when the user's configuration operation is triggered and at least one parameter status item changes, the current parameter status of the measuring instrument 21 is read again, and a second parameter table is generated and saved. The data structure of the second parameter table is consistent with that of the first parameter table to facilitate subsequent comparison.

[0064] Step S135: Compare the first parameter table and the second parameter table to determine the parameter status items that have changed during the configuration operation.

[0065] In one embodiment, a first parameter table and a second parameter table are compared to determine parameter status items that have changed during the configuration operation. The comparison method includes, but is not limited to, item-by-item comparison or hash comparison. For example, each parameter status item in the first parameter table is traversed to locate the corresponding parameter status item in the second parameter table; it is then determined whether the parameter value of the parameter status item is consistent in the first and second parameter tables; if they are inconsistent, the parameter status item is determined to be a parameter status item that has changed.

[0066] In one embodiment, after identifying the changed parameter status items, the parameter identifier corresponding to each changed parameter status item is determined based on the function association mapping information. For example, the parameter name of the changed parameter status item can be used as the reference to find the corresponding parameter identifier in the function association mapping information, or the corresponding parameter identifier can be directly output when the corresponding program for each parameter status item is executed. This allows for the unique identification of each changed parameter status item, facilitating the lookup of subsequent configuration commands.

[0067] It should be noted that, in addition to the above-mentioned parameter table comparison method, the changed parameter status items can also be obtained in other ways. For example, when the user adjusts the parameters in the input module 214 or triggers the execution of a certain function, the software system of the measuring instrument 21 can generate a parameter change event. The processing module 211 responds to the parameter change event and directly obtains the changed parameter status items.

[0068] Please refer to Figure 5 In one embodiment, when performing step S130 to obtain the parameter status items that have changed during the configuration operation and to determine the parameter identifier corresponding to the changed parameter status items based on the function association mapping information, the following steps are also included.

[0069] Step S132: Receive the start command to read and save the first parameter table.

[0070] In one embodiment, the start command is used to instruct the measuring instrument 21 to enter the configuration command search state and trigger the reading and saving of the current parameter state of the measuring instrument 21 to generate a first parameter table.

[0071] Step S134: In response to the configuration operation performed by the user, receive the end command to read and save the second parameter table.

[0072] In one embodiment, the end command is used to instruct the measuring instrument 21 to end the current configuration command search process, and to read and save the current parameter status after the user completes the configuration operation, so as to generate a second parameter table.

[0073] It should be noted that by performing configuration operations between the start and end commands, the time window for changing parameter status items can be accurately defined. This allows parameter change analysis and configuration command output to be performed only on the configuration operations that the user cares about, avoiding interference from irrelevant operations.

[0074] In one embodiment, the start and stop commands can be triggered through the human-machine interface of the measuring instrument 21, for example, by triggering the start / stop recording command option in the display module 212, or by being manually triggered by the user through touch buttons, shortcut keys, function keys, etc. The start and stop commands can also be issued through a remote control interface, for example, by the host computer 22 sending specific control commands or instructions to the measuring instrument 21 through a communication interface to start or stop the configuration command search process.

[0075] Step S140: Obtain the pre-stored parameter mapping table.

[0076] In one embodiment, a parameter mapping table describes the correspondence between parameter definitions and configuration commands in the measuring instrument 21. As shown in Table 1, the parameter mapping table includes at least each parameter definition in the measuring instrument 21, the configuration command corresponding to each parameter definition, and the parameter identifier corresponding to each parameter definition. The parameter definition describes the functional definition of the configurable parameters in the measuring instrument 21 and may correspond to specific functional parameters, such as frequency, amplitude, period, time base, trigger mode, and channel switch status. The configuration command may be an SCPI command keyword or command template used to control the corresponding parameter. The parameter identifier is used to uniquely identify the corresponding parameter definition.

[0077] Table 1 Parameter Mapping Table

[0078]

[0079] In one embodiment, the parameter identifier corresponding to each parameter definition item in the parameter mapping table corresponds one-to-one with the parameter identifier of the aforementioned parameter status item. That is, each parameter definition item has a unique parameter identifier in the parameter mapping table, and this parameter identifier is also used to identify the parameter status item corresponding to the parameter definition item during the operation of the measuring instrument 21.

[0080] Step S150: Find the parameter identifier of the parameter status item that has changed in the parameter mapping table, and determine the configuration command of the parameter status item that has changed based on the parameter identifier of the parameter status item.

[0081] In one embodiment, by leveraging the one-to-one correspondence between parameter identifiers of parameter definition items and parameter identifiers of parameter status items in the parameter mapping table, after detecting a change in a parameter status item, the corresponding parameter definition item and its configuration command can be directly located in the parameter mapping table based on the parameter identifier corresponding to that parameter status item, and the configuration command of the changed parameter status item is saved to the storage module 213 of the measuring instrument 21. Specifically, each configuration command is saved as an independent entry, which may include the configuration command, parameter identifier, current parameter value of the parameter status item, generation time, or sequence number. If multiple parameter status items change within a time window defined by a configuration operation or a start and end command, the corresponding multiple configuration commands can be sequentially grouped into a command sequence and saved as a set of records. The configuration commands can also be saved as text files, log files, or script files, and the file format can be TXT, CSV, or other parsable formats, so that users can export them and directly call them in the host computer 22 or automated testing environment.

[0082] Please refer to Figure 6 Another embodiment also provides a test system 2, including a measuring instrument 21 and a host computer 22.

[0083] In one embodiment, the measuring instrument 21 includes the processing module 211, display module 212, and optional storage module 213, input module 214, and communication module 215 described in the above embodiments. The measuring instrument 21 can automatically acquire changed parameter status items, determine the corresponding configuration command, and display and / or save the configuration command in response to a configuration operation performed by the user. Since the measuring instrument 21 has been clearly described in the above embodiments, it will not be repeated here.

[0084] In one embodiment, a host computer 22 is communicatively connected to the measuring instrument 21 for data interaction and to test the measuring instrument 21 based on the configuration commands displayed or saved by the measuring instrument 21. The host computer 22 can be a personal computer, industrial control computer, server, or other device with data processing and communication capabilities. The host computer 22 can acquire the configuration commands displayed or saved by the measuring instrument 21 in various ways, including but not limited to: the user manually reading the configuration commands displayed on the display module 212 of the measuring instrument 21 and inputting them into the host computer 22; directly reading the saved configuration commands from the storage module 213 of the measuring instrument 21 through the communication interface; or the measuring instrument 21 actively sending configuration command data to the host computer 22. After acquiring the configuration commands, the host computer 22 can use them as part of a test script or control instructions to perform automated testing or repeated configuration of the measuring instrument 21. For example, the host computer 22 can issue corresponding control instructions to the measuring instrument 21 according to the acquired configuration commands to reproduce the user's configuration process on the measuring instrument 21, thereby achieving rapid setup and consistency verification of the test environment.

[0085] Those skilled in the art will understand that all or part of the functions of the various methods in the above embodiments can be implemented by hardware or by computer programs. When all or part of the functions in the above embodiments are implemented by computer programs, the program can be stored in a computer-readable storage medium, which may include: read-only memory, random access memory, disk, optical disk, hard disk, etc., and the program is executed by a computer to achieve the above functions. For example, the program can be stored in the memory of a device, and when the program in the memory is executed by the processor, all or part of the above functions can be achieved. In addition, when all or part of the functions in the above embodiments are implemented by computer programs, the program can also be stored in a server, another computer, disk, optical disk, flash drive, or external hard drive, etc., and can be downloaded or copied to the memory of a local device, or the system of the local device can be updated. When the program in the memory is executed by the processor, all or part of the functions in the above embodiments can be achieved.

[0086] The above examples illustrate the present invention only to aid in understanding it and are not intended to limit the scope of the invention. Those skilled in the art can make various simple deductions, modifications, or substitutions based on the principles of this invention.

Claims

1. A method for finding configuration commands, characterized in that, The configuration command lookup method is applied to measuring instruments and includes: Obtain pre-stored function association mapping information, which includes multiple parameter status items of the measuring instrument and parameter identifiers corresponding to each parameter status item; Responding to configuration operations performed by the user; Obtain the parameter status items that have changed during the configuration operation, and determine the parameter identifier corresponding to the changed parameter status items based on the function association mapping information; Obtain a pre-stored parameter mapping table, which includes each parameter definition item in the measuring instrument, the configuration command corresponding to each parameter definition item, and the parameter identifier corresponding to each parameter definition item. The parameter identifier corresponding to each parameter definition item corresponds one-to-one with the parameter identifier of the parameter status item. The parameter identifier of the changed parameter status item is searched in the parameter mapping table, and the configuration command of the changed parameter status item is determined based on the parameter identifier of the changed parameter status item.

2. The configuration command lookup method as described in claim 1, characterized in that, In response to configuration actions performed by the user, including: In response to a configuration operation performed by the user, the configuration operation is used to trigger the execution of the function to be searched in the measuring instrument, so as to change the parameter status item corresponding to the function to be searched.

3. The configuration command lookup method as described in claim 1, characterized in that, In response to configuration actions performed by the user, including: In response to a configuration operation performed by the user, the configuration operation is used to trigger the execution of parameter configuration in the measuring instrument, so as to change the corresponding parameter status item in the parameter configuration.

4. The configuration command lookup method as described in claim 1, characterized in that, The step of obtaining the parameter status items that have changed during the configuration operation includes: Read and save the first parameter table of the initial state of the measuring instrument; Read and save the second parameter table generated after the parameter status item changes; The first parameter table and the second parameter table are compared to determine the parameter status items that have changed during the configuration operation.

5. The configuration command lookup method as described in claim 4, characterized in that, The configuration command lookup method also includes: Receive the start command to read and save the first parameter table; In response to the configuration operation performed by the user, an end command is received to read and save the second parameter table.

6. The configuration command lookup method as described in claim 5, characterized in that, The configuration operation in response to the user includes: The configuration operation is performed by a hardware interaction component that responds to user input of the measuring instrument.

7. The configuration command lookup method as described in claim 1, characterized in that, Also includes: The configuration command saves and displays the changed parameter status items.

8. A measuring instrument, characterized in that, include: The processing module executes the configuration command lookup method as described in any one of claims 1-7; The display module is connected to the processing module to display the configuration commands for the changed parameter status items.

9. A testing system, characterized in that, include: The measuring instrument is the measuring instrument as described in claim 8; A host computer is connected to the measuring instrument and tests the measuring instrument according to the configuration instructions displayed or saved by the measuring instrument.

10. A computer program product comprising a computer program and / or instructions, characterized in that, When the computer program and / or instructions are executed by the processor, they implement the method of any one of claims 1-7.

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