Method for improving light source uniformity based on optical film material

Abstract

The invention discloses a method for improving the uniformity of a light source based on an optical film material. The method comprises the following steps: arranging an optical regulation and control layer capable of being digitally processed in a light path between the light source and a light emitting surface; measuring the brightness distribution of the light emitting surface to obtain brightness non-uniform data; according to the brightness non-uniform data, a regulation and control film processing pattern used for compensating the brightness difference is generated; performing micromachining on the optical regulation and control layer according to the machining pattern, and adjusting the light transmittance or reflectivity of a local area of the optical regulation and control layer; placing the processed optical regulation and control layer into a light path, and compensating the light emitting uniformity; the small difference of hardware production is made up through digital calibration software, the production efficiency and flexibility are greatly improved, product performance fluctuation caused by component and assembly difference is solved, and the product yield and stability no longer depend on component and assembly consistency.

Description

Technical Field

[0001] This invention relates to the field of light source uniformity optimization technology, and specifically to a method for improving light source uniformity based on optical film materials. Background Technology

[0002] In existing light source manufacturing, to achieve uniformity of the light-emitting surface, diffuser plates, light guide plates combined with dot matrix design, and multilayer optical films are commonly used. These methods are usually fixed in the design and manufacturing stages. Once assembled, if local bright spots or dark areas appear, the adjustment methods are very limited and costly. It often requires replacing the light guide plate or the entire optical module or other expensive optical components, which is inefficient, costly, and difficult to achieve optimal uniformity.

[0003] Therefore, there is an urgent need for a solution that can perform high-precision, low-cost, quantifiable, and repeatable iterative adjustments to uniformity after product assembly, in order to address the impact of brightness dispersion of the light source itself, structural assembly tolerances, and batch differences in materials. Summary of the Invention

[0004] The purpose of this invention is to propose a method for improving the uniformity of light sources based on optical film materials to solve the problems mentioned in the background art.

[0005] To achieve the aforementioned objectives, the first technical solution adopted by this invention is: a method for improving the uniformity of a light source based on an optical film material, comprising: A digitally processable optical control layer is set in the optical path between the light source and the light-emitting surface; The light-emitting surface is divided into multiple acquisition units at set intervals. Illuminance data is collected at the center of each acquisition unit using a photometer to obtain multiple illuminance data. The initial uniformity of the light surface is calculated based on the collected illuminance data, and it is determined whether the initial uniformity reaches the target uniformity. If the desired result is not achieved, a control film processing pattern is generated to compensate for the brightness difference. The optical control layer is then micro-processed according to the processing pattern to adjust the transmittance or reflectance of a local area of ​​the optical control layer. The processed optical control layer is placed in the optical path to compensate for the uniformity of the light-emitting surface.

[0006] Furthermore, the light source is a side-lit light source, the optical control layer is a reflective film, and a light guide plate is provided above the optical control layer; a light-absorbing layer is provided below the reflective film; and light-transmitting holes are processed at the corresponding positions of the bright areas of the reflective film based on the processing parameters.

[0007] Furthermore, the processing parameters include the diameter, density, or arrangement of the light-transmitting holes.

[0008] Furthermore, the light source is a side-lit light source, the optical control layer is a light-transmitting film or a filter, and a light guide plate is disposed below the optical control layer; holes or microstructures are processed on the light-transmitting film or filter to adjust the local light transmittance and perform brightness compensation.

[0009] Furthermore, the microstructure processing includes at least one of laser drilling, mechanical microneedle drilling, laser engraving, hot pressing, or chemical etching.

[0010] Furthermore, the light source is a direct-lit light source, and the optical control layer is a transparent film or a filter.

[0011] Furthermore, a control layer support platform is provided at the bottom of the optical control layer, a hollow cavity is provided at the bottom of the control layer support platform, and a lamp plate is provided at the bottom of the hollow cavity.

[0012] Due to the application of the above technical solution, the present invention has the following advantages compared with the prior art: The core cost of uniformity optimization shifts from the upfront costs of high-precision, high-consistency manufacturing and design solidification to the later, lower-cost costs of digital calibration. This allows for the use of more tolerant, lower-cost general-purpose optical or structural components, whose individual variations can be compensated for through post-calibration, significantly reducing the overall system manufacturing cost.

[0013] Digital calibration software compensates for minor differences in hardware production, greatly improving production efficiency and flexibility, because hardware no longer needs to sacrifice production speed in pursuit of ultimate consistency; it also solves product performance fluctuations caused by differences in components and assembly, so that product yield and stability no longer depend on the consistency of components and assembly. Attached Figure Description

[0014] Figure 1 This diagram illustrates a stacked structure of a method for improving light source uniformity based on optical film materials, according to an embodiment of the present invention. Figure 2 This diagram shows a two-layer implementation architecture of the method for improving light source uniformity based on optical film materials provided in an embodiment of the present invention. Figure 3 This diagram shows a three-layer stacked structure of the method for improving light source uniformity based on optical film materials provided in an embodiment of the present invention. Figure 4 The image shows illuminance distribution data collected using the unprocessed raw control layer in an embodiment of the present invention. Figure 5 The image shows illuminance distribution data collected using a control layer after a single processing step, according to an embodiment of the present invention. Figure 6 The image shows illuminance distribution data collected using a secondary-processed control layer, as shown in an embodiment of the present invention. Detailed Implementation

[0015] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0016] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate for the embodiments of this application described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or system that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or systems.

[0017] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0018] Example 1 like Figure 1 As shown, this embodiment of the invention provides a method for improving the uniformity of a light source based on an optical film material, comprising: A digitally processable optical control layer is set in the optical path between the light source and the light-emitting surface; The light-emitting surface is divided into multiple acquisition units at set intervals. Illuminance data is collected at the center of each acquisition unit using a photometer to obtain multiple illuminance data. The initial uniformity of the light surface is calculated based on the collected illuminance data, and it is determined whether the initial uniformity reaches the target uniformity. If the desired result is not achieved, a control film processing pattern is generated to compensate for the brightness difference. The optical control layer is then micro-processed according to the processing pattern to adjust the transmittance or reflectance of a local area of ​​the optical control layer. The processed optical control layer is placed in the optical path to compensate for the uniformity of the light-emitting surface.

[0019] According to an embodiment of the present invention, the light source is a side-lit light source, the optical control layer is a reflective film, and a light guide plate is disposed above the optical control layer; a light-absorbing layer is disposed below the reflective film; and light-transmitting holes are processed at the corresponding positions of the bright areas of the reflective film based on processing parameters.

[0020] According to embodiments of the present invention, the processing parameters include the diameter, density, or arrangement of the light-transmitting holes.

[0021] It should be noted that a physical film layer with programmable optical properties is introduced between the light source and the light-emitting surface as a control medium. The illuminance distribution of the light source is obtained through high-precision measurement. Based on the measurement results, digital processing instructions for the control film are generated. The micro-machining technology of the processing equipment is used to change the reflectivity or transmittance of the local area of ​​the film layer. A closed-loop iterative method of "measurement-analysis-processing-verification" is adopted to gradually optimize the spatial modulation pattern of the control film, thereby achieving precise, active, and customized correction of the uniformity of the light-emitting surface.

[0022] The structural stack (from bottom to top) consists of the following components: Light panel: Located on the side of the system, with LEDs emitting light inwards.

[0023] Light-absorbing layer: This layer is laid at the bottom and is usually made of black light-absorbing material.

[0024] Control layer (reflective film): Located above the light-absorbing layer, it is a high-reflectivity thin film. Its surface can be processed with an array of light-transmitting holes according to the adjustment instructions.

[0025] Light guide plate: Located above the reflective film. Its bottom surface (the side closest to the reflective film) has a dense micro-scattering structure (such as micro-dimples, dots, and V-grooves).

[0026] Other membrane materials (such as anti-reflective film, high-reflective film, or none): are attached to the top surface of the light guide plate to improve uniformity.

[0027] Diffuser plate: Located at the top layer, it performs the final uniform diffusion of light to form a uniform surface light source.

[0028] Control principle: Light enters the light guide plate from the side and is directed upwards by the microstructure on the bottom surface. Some light travels downwards to the reflective film. On the reflective film, unperforated areas reflect light back to the light guide plate, enhancing light output in those areas; perforated areas allow light to pass through the holes and be absorbed by the light-absorbing layer below, thus reducing light output in those areas. By controlling the size and density of the holes, the "effective reflectivity" of local areas can be finely adjusted, thereby compensating for initial unevenness.

[0029] Specifically, in this example, the light-emitting surface of the light source system has a size of 156mm × 156mm. The illuminance acquisition rule is as follows: the light-emitting surface is divided into 26 × 26 6mm × 6mm acquisition units at 6mm intervals, and illuminance data is acquired at the center of each acquisition unit, resulting in a total of 26 × 26 illuminance data points. The control layer (reflective film) has a size of 156mm × 156mm. The goal of this invention is to achieve a light emission uniformity of over 98% for the light source.

[0030] like Figure 4 As shown, the light source system is assembled using an unprocessed raw control layer (reflective film), and the illuminance data of the light surface is collected using a photometer according to the above illuminance collection rules.

[0031] The collected illuminance distribution data showed a uniformity of 95.3263%; the maximum illuminance value was 138316.8, the minimum was 132096, and the average was 133101.6. The uniformity calculation formula is: Uniformity = 1 - (maximum value - minimum value) / average value.

[0032] The control layer was designed for perforation based on the obtained illuminance data. The control layer was divided into 26×26 processing units (6mm×6mm), with holes drilled at the center of each unit, for a total of 26×26 holes. The hole diameter range was set to 0–4mm, and a direct linear mapping was established between the hole diameter and the illuminance data (132096–138316.8). At a location with an illuminance of 132096, the aperture is 0mm. At a location with an illuminance of 138316.8, the aperture is 4mm; The aperture at other locations is calculated using the formula: Aperture = (Current illuminance data - 132096) × (5 / 7776); The accuracy of the aperture is determined by the drilling equipment. The control layer (reflective film) is drilled for the first time according to the determined aperture data.

[0033] like Figure 5 As shown, the original control layer (reflective film) in the light source system is replaced by the control layer (reflective film) after one processing, and the illuminance of the light surface is tested and the uniformity is calculated again using a photometer according to the same acquisition rules.

[0034] The test yielded illuminance distribution data, with a calculated uniformity of 97.7966%; the maximum illuminance value was 134323.2, the minimum was 131404.8, and the average was 132447.1.

[0035] A secondary compensation correction is performed based on the obtained illuminance data: using the average value of 132447.1 as a benchmark, the aperture is adjusted proportionally for areas that are higher or lower than the average value; the standard is set as follows: for every 1000 change in illuminance relative to the average value, the aperture is adjusted by 5% accordingly; aperture change rate = {(current position illuminance data - 132447.1) / 1000} × 5%, where a positive number represents aperture enlargement and a negative number represents aperture shrinkage. A new unprocessed control layer (reflective film) is taken and processed according to the corrected aperture parameters.

[0036] like Figure 6 As shown, the secondary processed control layer (reflective film) is installed into the light source system, and the illuminance is tested and the uniformity is calculated again according to the same rules.

[0037] The test yielded illuminance distribution data, with a calculated uniformity of 98.4921692%. The maximum illuminance value was 133171.2, the minimum was 131174.4, and the average was 132428.6485. At this point, the uniformity meets the design requirement of over 98%, and the calibration is complete. If the target uniformity is not achieved, the iterative correction process is repeated until the requirement is met.

[0038] Example 2 like Figure 2 As shown in the embodiment of the present invention, the light source is a side-lit light source, the optical control layer is a light-transmitting film or a filter, and a light guide plate is disposed below the optical control layer; holes or microstructures are processed on the light-transmitting film or filter to adjust the local light transmittance and perform brightness compensation.

[0039] According to embodiments of the present invention, microstructure processing includes at least one of laser drilling, mechanical microneedle drilling, laser engraving, hot pressing, or chemical etching.

[0040] It should be noted that the structural stack (from bottom to top) includes the following components: Light panel: Located on the side of the system, with LEDs emitting light inwards.

[0041] Reflective layer: laid at the bottom, it is a high-reflectivity film.

[0042] Light guide plate: Located above the reflective film. Its bottom surface (the side closest to the reflective film) has a dense micro-scattering structure (such as micro-dimples, dots, and V-grooves).

[0043] Control layer (transparent film, filter, etc.): Located above the light guide plate, it is a transparent or semi-transparent optical film or a processable filter, etc. Its surface can be processed with holes or microstructures of specific patterns according to the adjustment instructions.

[0044] Other membrane materials (such as antireflective membranes, high-reflective membranes, or none): are attached to the control layer to improve uniformity.

[0045] Diffuser plate: Located at the top layer, it performs the final uniform diffusion of light to form a uniform surface light source.

[0046] Control principle: Light is emitted through a light guide plate and directly illuminates the control layer. The control layer itself possesses basic optical properties. It can be used to create holes and adjust local microstructures. Processing holes: In areas where light needs to be enhanced, increase the hole density or enlarge the hole diameter. In areas where light needs to be reduced, decrease the hole density or decrease the hole diameter.

[0047] Adjusting the microstructure: In areas where enhanced light is needed, the control layer can be locally thinned through processing, thereby increasing the forward transmittance.

[0048] Example 3 like Figure 3 As shown in the embodiment of the present invention, the light source is a direct-lit light source, and the optical control layer is a light-transmitting film or a filter.

[0049] According to an embodiment of the present invention, a control layer support platform is provided at the bottom of the optical control layer, a hollow cavity is provided at the bottom of the control layer support platform, and a lamp plate is provided at the bottom of the hollow cavity.

[0050] According to an embodiment of the present invention, a diffuser plate is provided on the light-emitting surface.

[0051] It should be noted that the structural stack (from bottom to top) includes the following components: Light panel: Located at the bottom of the system, the array of LED beads emits light upwards.

[0052] Hollow cavity: effectively eliminates the graininess, hot spots, and bright and dark stripes of LED beads, and can also be used as a light mixing space.

[0053] Control layer support stage: Located above the hollow cavity, it is generally made of high-transmittance optical material and serves as a support.

[0054] Control layer (transparent film, filter, etc.): Located on the control layer support platform, it is a transparent or semi-transparent optical film or a processable filter, etc. Its surface can be processed with holes or microstructures of specific patterns according to the adjustment instructions.

[0055] Other membrane materials (such as antireflective membranes, high-reflective membranes, or none): are attached to the control layer to improve uniformity.

[0056] Diffuser plate: Located at the top layer, it performs the final mixing and diffusion of light to form a uniform surface light source.

[0057] Control principle: Light is emitted from the bottom light panel and directly illuminates the controllable layer. The controllable layer itself possesses basic optical properties. It can be used to create holes and adjust local microstructures.

[0058] Processing holes: In areas where light needs to be enhanced, increase the hole density or enlarge the hole diameter. In areas where light needs to be reduced, decrease the hole density or decrease the hole diameter.

[0059] Adjusting the microstructure: In areas where enhanced light is needed, the control layer can be locally thinned through processing, thereby increasing the forward transmittance.

[0060] In summary, the present invention has the following advantages compared with the prior art: The core cost of uniformity optimization shifts from the upfront costs of high-precision, high-consistency manufacturing and design solidification to the later, lower-cost costs of digital calibration. This allows for the use of more tolerant, lower-cost general-purpose optical or structural components, whose individual variations can be compensated for through post-calibration, significantly reducing the overall system manufacturing cost.

[0061] Digital calibration software compensates for minor differences in hardware production, greatly improving production efficiency and flexibility, because hardware no longer needs to sacrifice production speed in pursuit of ultimate consistency; it also solves product performance fluctuations caused by differences in components and assembly, so that product yield and stability no longer depend on the consistency of components and assembly.

[0062] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0063] The above description of the disclosed embodiments enables those skilled in the art to make or use the invention. Various modifications to the above embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

[0064] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A method for improving the uniformity of a light source based on optical film materials, characterized in that, include: A digitally processable optical control layer is set in the optical path between the light source and the light-emitting surface; The light-emitting surface is divided into multiple acquisition units at set intervals. Illuminance data is collected at the center of each acquisition unit using a photometer to obtain multiple illuminance data. The initial uniformity of the light surface is calculated based on the collected illuminance data, and it is determined whether the initial uniformity reaches the target uniformity. If the desired result is not achieved, a control film processing pattern is generated to compensate for the brightness difference. The optical control layer is then micro-processed according to the processing pattern to adjust the transmittance or reflectance of a local area of ​​the optical control layer. The processed optical control layer is placed in the optical path to compensate for the uniformity of the light-emitting surface.

2. The method for improving light source uniformity based on optical film material as described in claim 1, characterized in that, The light source is a side-lit light source, the optical control layer is a reflective film, and a light guide plate is provided above the optical control layer; a light-absorbing layer is provided below the reflective film; and light-transmitting holes are processed at the corresponding positions of the bright areas of the reflective film based on the processing parameters.

3. The method for improving light source uniformity based on optical film material as described in claim 2, characterized in that, The processing parameters include the diameter, density, or arrangement of the light-transmitting holes.

4. The method for improving light source uniformity based on optical film material as described in claim 1, characterized in that, The light source is a side-lit light source, the optical control layer is a light-transmitting film or a filter, and a light guide plate is provided below the optical control layer; holes or microstructures are processed on the light-transmitting film or filter to adjust the local light transmittance and perform brightness compensation.

5. The method for improving light source uniformity based on optical film materials as described in claim 4, characterized in that, The microstructure processing includes at least one of laser drilling, mechanical micro-needle drilling, laser engraving, hot pressing, or chemical etching.

6. The method for improving light source uniformity based on optical film material as described in claim 1, characterized in that, The light source is a direct-lit light source, and the optical control layer is a transparent film or a filter.

7. The method for improving light source uniformity based on optical film material as described in claim 6, characterized in that, The bottom of the optical control layer is provided with a control layer support platform, the bottom of the control layer support platform is provided with a hollow cavity, and the bottom of the hollow cavity is provided with a lamp plate.

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