Angle resolution multi-electron coincidence measurement system and method based on event type delay line detector

By using a multi-electron coincidence measurement system based on an event-type delay line detector, the problems of parallel readout and time difference calibration of multi-electron events in existing ARPES technology are solved. This system enables efficient multi-electron measurement under angle-resolved conditions, is applicable to various light source conditions, and improves the accuracy and efficiency of the measurement.

CN121994849AActive Publication Date: 2026-05-08SOUTHERN UNIVERSITY OF SCIENCE AND TECHNOLOGY
3 Cites 4 Cited by

Patent Information

Application Number
CN202610443598.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-04-07
Publication Date
2026-05-08
Estimated Expiration
2046-04-07

AI Technical Summary

Technical Problem

Existing ARPES measurement technology struggles to maintain energy and momentum resolution in multi-electron scenarios, while simultaneously achieving parallel readout of multi-electron events and multi-channel time difference calibration, leading to signal superposition, event accumulation, and loss of time information.

Method used

An angle-resolved multi-electron coincidence measurement system based on an event-type delay line detector is adopted. By dividing the detection surface into independent regions to receive photoelectron signals in parallel, and using an external triggering and synchronization module to generate a unified triggering period signal, combined with a time digitization readout module and a data acquisition and processing module to generate timestamps and determine correlations, accurate coincidence measurement of multi-electron events is achieved.

Benefits of technology

It achieves parallel, low dead-time readout of multiple electron events under angle-resolved conditions, eliminates the inherent delay differences between detection channels, improves event acquisition efficiency and measurement signal-to-noise ratio, is applicable to different light source conditions, and has good engineering implementation value and flexibility.

✦ Generated by Eureka AI based on patent content.
Patent Text Reader

Abstract

The invention relates to the technical field of angle-resolved photoelectron spectroscopy experimental instruments, and discloses an angle-resolved multi-electron coincidence measurement system and method based on an event-type delay line detector, and the system comprises an angle-resolved energy analyzer; a detection surface of the event type delay line detector is divided into at least two independent areas, and the event type delay line detector is used for receiving photoelectrons in parallel and independently outputting event signals; the external trigger and synchronization module is used for generating a unified trigger period to establish a global time reference; the time digital reading module is used for receiving the event signal and generating a timestamp; and the data acquisition and processing module is used for carrying out association judgment and selection based on the timestamps in the same triggering period. The dead time is reduced through multi-region parallel reading, unified time base calibration is achieved through time base line calibration and delay compensation, multi-electron coincidence measurement can be achieved under the condition that the angular resolution capability is kept, and the method is suitable for pulse or continuous light sources.
Need to check novelty before this filing date? Find Prior Art