Single-layer Compton camera system and imaging method
By introducing a local occlusion structure into a single-plane pixel-type gamma-ray detector and using the local count missing feature to determine the incident side, the problem of mirror artifacts in omnidirectional imaging of planar detectors is solved, and omnidirectional imaging and high-reliability positioning with a simplified structure are achieved.
Patent Information
- Application Number
- CN202610061250.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-16
- Publication Date
- 2026-05-08
AI Technical Summary
Existing Compton imaging systems using planar detectors lack effective solutions to address the uncertainty of the incident direction when imaging in all space, resulting in image artifacts that severely affect the accuracy of the imaging results.
A single-plane pixel-type gamma-ray detector combined with a local occlusion structure is used to determine the gamma-ray incident side by using the local count missing features formed by the occlusion structure, and Compton imaging reconstruction is performed within the corresponding hemispherical field of view to avoid mirror artifacts.
It achieves partitioned omnidirectional imaging without the need for depth information, simplifies the structure and facilitates miniaturization, effectively suppresses image artifacts, and improves the reliability of radiation source localization.