Continuous sampling device and method for high-temperature and high-pressure gas containing water vapor

Abstract

The invention discloses a continuous sampling device and method for high-temperature and high-pressure gas containing water vapor, and belongs to the field of pipeline engineering. The device comprises a collection pipeline, a sampling bottle array, a heat tracing and heat preservation device and a cleaning device, the collection pipeline comprises a main pipeline connected to a sampling gas source and sampling branches connected to sampling bottles, and the heat tracing and heat preservation device wraps the surfaces of the collection pipeline and the sampling bottle array and heats the collection pipeline and the sampling bottle array; the cleaning device is communicated to the collecting pipeline and is used for cleaning the collecting pipeline. The device can prevent component deviation caused by water vapor condensation in the high-temperature and high-pressure gas sampling process, and the sampling accuracy is effectively improved.

Description

Technical Field

[0001] This invention belongs to the field of pipeline engineering, and specifically relates to a continuous sampling device and method for high-temperature and high-pressure gases containing water vapor. Background Technology

[0002] In nuclear engineering, petroleum engineering, and chemical engineering, it is often necessary to sample and analyze gases within containers or pipelines under high temperature and pressure conditions. Taking nuclear power facilities as an example, the sampled gases contain high-temperature, high-pressure water vapor and various non-condensable gases, such as hydrogen and nitrogen. Accurately measuring the composition of the gas mixture is crucial for assessing condensation heat transfer efficiency, system resistance characteristics, hydrogen distribution behavior, and reactor safety margins. Currently, conventional sampling techniques typically draw upon environmental continuous emission monitoring systems or industrial process gas sampling systems. These systems are usually designed for atmospheric or low-pressure flue gas environments and analyze gas composition through online detection. During sampling, the decrease in gas pressure and temperature easily leads to condensation of water vapor, causing problems such as detection errors, pipeline blockage, and sample contamination due to residual gas or liquid remaining in the sampling pipeline. Furthermore, these systems are highly dependent on manual operation, limiting safety. Therefore, providing a continuous sampling device for high-temperature, high-pressure gases containing water vapor is of significant importance for improving the accuracy of gas composition detection. Summary of the Invention

[0003] The purpose of this invention is to provide a continuous sampling device and method for high-temperature and high-pressure gases containing water vapor, thereby improving the accuracy of high-temperature and high-pressure gas component detection. This invention also provides a continuous sampling method for high-temperature and high-pressure gases containing water vapor.

[0004] According to one aspect of the present invention, a continuous high-temperature and high-pressure gas sampling device containing water vapor is provided. The device includes a sampling pipeline, a sampling bottle array, a heat tracing and insulation device, and a cleaning device. The sampling pipeline includes a main pipeline and multiple sampling branches. One end of the main pipeline is connected to a sampling gas source, and the other end is configured as an exhaust end. The sampling bottle array includes multiple sampling bottles, and each sampling branch is connected to one of the sampling bottles. The heat tracing and insulation device covers the surfaces of the sampling pipeline and the sampling bottle array and heats them. The cleaning device is connected to the sampling pipeline and is used to clean the sampling pipeline.

[0005] This device uses a heat tracing and insulation system to ensure a stable temperature of the sample gas during sampling, preventing water vapor liquefaction due to temperature drop before the sample gas enters the sampling bottle, which could cause compositional deviations and improve sampling accuracy. The cleaning device effectively removes residual contaminants from the pipeline, ensuring sampling precision.

[0006] Furthermore, in some embodiments, each of the sampling branches is equipped with a sampling valve.

[0007] Furthermore, in some embodiments, the device also includes a sampling controller that controls the opening and closing of each of the sampling valves and performs sampling in a preset order.

[0008] Furthermore, in some embodiments, the heat tracing and insulation device includes a heating belt and an insulation layer, the heating belt being wound around the collection pipeline and the surface of the sampling bottle, and the insulation layer covering the surface of the sampling bottle.

[0009] Furthermore, in some embodiments, the heating tape wrapped around the collection tube is a first heating tape, and the heating tape wrapped around the sampling bottle is a second heating tape, wherein the second heating tape is detachably connected to the first heating tape.

[0010] Furthermore, in some embodiments, the cleaning device includes a purging device and an air pump, wherein the purging device is connected upstream of the sampling branch on the main pipeline, and the air pump is connected downstream of the purging device on the main pipeline.

[0011] Furthermore, in some embodiments, the device also includes a containment structure configured as a pressure-bearing structure that encloses the connection point between the main pipeline and the sampling gas source.

[0012] According to another aspect of the present invention, a method for continuous sampling of high-temperature and high-pressure gas containing water vapor is provided. This method employs the high-temperature and high-pressure gas continuous sampling device containing water vapor provided in any of the foregoing embodiments and includes the following steps:

[0013] Step a): Connect the collection pipeline to the sampling gas source, which is a high-temperature and high-pressure pipeline or gas cylinder. Start the heat tracing and insulation device to heat the collection pipeline and the sampling bottle to the same temperature as the sampling gas source.

[0014] Step b): Allow the gas to be sampled to flow into the collection pipeline and be discharged from the exhaust end until the temperature and pressure of the collection pipeline stabilize.

[0015] Step c): Input the gas to be sampled into the sampling bottle in a preset order and seal the sampling bottle.

[0016] Furthermore, in some embodiments, each of the sampling branches is provided with a sampling valve, and in step c), the sampling is completed by controlling the opening and closing of each sampling valve in a preset timing sequence.

[0017] Furthermore, in some embodiments, step d) is included after step c): cleaning the collection pipeline using the cleaning device. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of a high-temperature, high-pressure gas continuous sampling device containing water vapor in one embodiment.

[0019] Meaning of the reference numerals in the attached figures:

[0020] 1-Containment vessel; 2-Heating belt; 3-Purge device; 4-Air pump; 5-Sampling bottle; 6-Main valve; 7-First valve; 8-Second valve; 9-Sampling valve; 10-Exhaust valve; 11-Collection pipeline.

[0021] The purpose of the above-described drawings is to provide a detailed description of the present invention so that those skilled in the art can understand the technical concept of the invention, and is not intended to limit the invention. For the sake of brevity, the above-described drawings only schematically depict the structures related to the technical features of the present invention, and do not depict the complete structure and all details strictly according to actual scale. Detailed Implementation

[0022] The present invention will now be described in further detail with reference to specific embodiments and accompanying drawings.

[0023] The term "embodiment" as used herein means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment herein. The phrase appearing in various places in the specification does not necessarily refer to the same embodiment, nor is it limited to mutually exclusive, independent, or alternative embodiments. Those skilled in the art will understand that the embodiments herein can be combined with other embodiments without causing structural conflicts.

[0024] In this description, unless otherwise explicitly specified and limited, the technical terms "installation," "connection," "joining," etc., should be interpreted broadly, for example, referring to movable connections, fixed connections, or integration. Those skilled in the art can understand the specific meaning of the above terms in the embodiments of this application based on the specific circumstances.

[0025] In this description, terms such as "upper," "lower," "left," "right," "lateral," "longitudinal," "height," "length," and "width," which indicate orientation or positional relationships, are intended to accurately describe the embodiments and simplify the description, rather than limiting the parts or structures involved to have a specific orientation, or to be installed or operated in a specific orientation, and should not be construed as limiting the embodiments in this document.

[0026] In this description, terms such as "first" and "second" are used only to distinguish different objects and should not be construed as indicating relative importance or limiting the number, specific order, or primary / secondary relationship of the described technical features. In this description, "multiple" means at least two.

[0027] Currently, sampling devices for mixed gases containing water vapor and non-condensable gases generally draw on environmental continuous emission monitoring systems or industrial process gas sampling systems. Typically, their temperature resistance does not exceed 180℃ and their pressure resistance is less than 0.5MPa. When using these sampling devices to sample high-temperature and high-pressure gases, changes in gas temperature and pressure in the pipeline can easily cause water vapor condensation. Water vapor condensation may further lead to the dissolution of soluble gases, resulting in serious deviations in the sampled composition and affecting the accuracy of component analysis.

[0028] To overcome the above-mentioned shortcomings of the prior art, one embodiment of the present invention provides a continuous sampling device for high-temperature and high-pressure gas containing water vapor, which effectively improves the sampling accuracy of high-temperature and high-pressure gas containing water vapor and improves the automation level of gas sampling.

[0029] In a preferred embodiment, the device is structured as follows: Figure 1 As shown, it includes a collection pipeline 11 and a sampling bottle array ( Figure 1 Only one sampling bottle 5 is shown, along with a heating and insulation device and a cleaning device. The sampling pipeline 11 includes a main pipeline and multiple sampling branches, each branch connected to a sampling bottle 5 in the sampling bottle array. One end of the main pipeline is connected to a sampling gas source via a buffer corrugated pipe. Figure 1 (Not shown) The other end is set as an exhaust end, and the exhaust end is equipped with an exhaust valve 10. During sampling, the high-temperature and high-pressure gas in the sampling gas source flows into the main pipeline and is discharged through the exhaust valve 10. In a preferred embodiment, to ensure safety during the sampling process, the device also includes a containment vessel 1. The connection between the main pipeline and the sampling gas source is located inside the containment vessel 1. The containment vessel 1 is configured as a pressure-bearing structure, which can provide a constant temperature and pressure environment inside, maintaining a stable gas sample temperature while preventing leakage. In other embodiments, the containment vessel 1 can also completely enclose the sampling pipeline 11 and the sampling bottle 5 inside, further reducing heat loss.

[0030] The heat tracing and insulation device includes an insulation layer and a heating band 2. The heating band 2 covers the surface of the collection tubing and the sampling bottle to heat the collection tubing and the sampling bottle, ensuring the temperature stability of the gas sample during sampling. An insulation layer (not shown) is further wrapped around the heating band 2, which further improves the temperature stability of the gas sample during sampling. In a preferred embodiment, the heating band 2 includes a first heating band wound around the collection tubing 11 and a second heating band wound around the sampling bottle. The second heating band and the first heating band are detachably connected, so that the second heating band does not need to be removed when removing the sampling bottle 5, and the second heating band and the sampling bottle 5 can be transferred together to the component analysis equipment.

[0031] In a preferred embodiment, each sampling branch is equipped with a sampling valve 9, and the opening degree of each sampling valve 9 is independently controlled to input gas samples into different sampling bottles. In a further preferred embodiment, each sampling valve 9 is uniformly controlled by a sampling controller, which can control each sampling valve 9 sequentially according to a preset order to complete continuous sampling.

[0032] The cleaning device includes a purging device 3 and a vacuum pump 4. The purging device 3 is connected upstream of the sampling branch on the main pipeline via a first valve 7. The purging device 3 can introduce dry inert gas, such as nitrogen or helium, into the main pipeline at a purging pressure of 0.5 MPa-1.0 MPa to remove impurities or residual gas samples from the collection pipeline 11. The vacuum pump 4 is connected downstream of the purging device 3 on the main pipeline via a second valve 8. The vacuum pump 4 can evacuate the collection pipeline 11 to prevent residual gas from affecting sampling accuracy.

[0033] According to another aspect of the present invention, a method for continuous sampling of high-temperature and high-pressure gases containing water vapor is provided. This method employs the high-temperature and high-pressure gas continuous sampling device containing water vapor provided in the foregoing embodiments. Specifically, the method includes the following steps:

[0034] Step a): Connect the sampling tubing 11 to the sampling gas source, and use the containment vessel 1 to seal the connection between the sampling tubing 11 and the sampling gas source. Activate the heating belt 2 to heat the sampling tubing 11 and the sampling bottle 5 to the same temperature as the sampling gas source. The sampling bottle 5 is a 50ml double-ended stainless steel sampling bottle, connected via a VCR or double-ferrule connector.

[0035] Step b): Open the second valve 8 and the sampling valve 9, and start the vacuum pump 4 to pump the pressure in the collection pipeline 11 to below 50 Pa. Close the sampling valve 9. Open the main valve 6 and the exhaust valve 10 to allow the gas to be sampled to flow into and fill the collection pipeline 11 until the temperature and pressure in the collection pipeline 11 reach a stable state, thereby displacing the dead volume and ensuring that there is no condensation in the collection pipeline 11. Both the main valve 6 and the exhaust valve 10 are high-temperature resistant solenoid valves.

[0036] Step c): Close the exhaust valve 10, and the pressure of the sampling pipeline 11 is balanced with the sampling gas source. The sampling controller controls the opening and closing of each sampling valve 9 in sequence according to the preset timing to complete the sampling of each sampling bottle 5. After each sampling bottle 5 is sampled, the corresponding sampling valve 9 is closed.

[0037] In a preferred embodiment, after step c) sampling is completed, step d) is further included: opening the exhaust valve 10 to reduce the pressure in the collection pipeline 11 to atmospheric pressure, opening the first valve 7 to introduce dry inert gas to purge and clean the collection pipeline 11, removing residual gas samples or condensate; then closing the first valve 7 and the exhaust valve 10, opening the second valve 8 to perform vacuum treatment on the collection pipeline 11 again, thereby resetting the device. The above process is repeated until all samples are collected, the heating power is turned off, and after cooling, the sample bottle 5 is disassembled for component analysis.

[0038] In one specific embodiment, the sampling process using a high-temperature, high-pressure gas continuous sampling device containing water vapor is as follows:

[0039] First, connect the sampling pipeline 11 to the sampling gas source. The sampling pipeline 11 is made of 316L stainless steel seamless pipe. The maximum pressure of the sampling gas source is 3MPa, and the maximum temperature is 230℃. The sampling bottle array includes 6 sampling bottles 5, each containing 50ml of double-ended stainless steel. The sampling bottles 5 are connected in parallel on the sampling pipeline 11 via VCR or double-ferrule connectors and mounted on the mounting bracket at the bottom of the containment vessel 1. The nozzles of the sampling bottles 5 are turned upwards or placed horizontally to prevent condensate buildup. Close the main valve 6, exhaust valve 10, and first valve 7. Open the second valve 8 and all sampling valves 9. Activate the heating belt 2 to evacuate all sampling bottles 5 and complete preheating.

[0040] Open the main valve 6 and the exhaust valve 10 to allow the high-temperature and high-pressure mixed gas to flow out from the sampling gas source and be discharged through the exhaust valve 10, ensuring that the dead volume in the sampling pipeline 11 is completely replaced and the pipeline is fully heated without condensation.

[0041] Close the exhaust valve 10 to raise the pipeline pressure to 3MPa, open a sampling valve 9 to allow the gas sample to be filled into the sampling bottle 5; then close the main valve 6 and the corresponding sampling valve 9 in sequence to complete the sampling and isolation.

[0042] Open the exhaust valve 10 to release pressure to normal pressure, open the first valve 7 to introduce dry inert gas to purge the gas residue; close the first valve 7 and the exhaust valve 10, open the second valve 8 to evacuate again and remove the purging gas.

[0043] Repeat the above process until all six sampling bottles 5 are filled. Finally, turn off the heating power, and after the containment vessel 1 has cooled to below 60°C, open it and remove all sampling bottles 5, transferring them to the analytical equipment for component analysis.

[0044] The high-temperature, high-pressure gas continuous sampling device containing water vapor provided in the above embodiments solves the problems of existing technologies, such as difficulty in ensuring gas fidelity under harsh operating conditions, susceptibility to condensation and residue, and low operational safety and efficiency. Simultaneously, by constructing a fully covered heat-tracing and insulation environment, introducing a dual cleaning mechanism of vacuum pre-evacuation and gas purging, and designing a multi-channel parallel automated valve array, it overcomes the shortcomings of traditional sampling methods, such as condensation distortion and "memory effect," and avoids background gas interference and cross-contamination between samples. While achieving fidelity sampling of mixed gases (no condensation, no residue), it significantly improves operational safety and efficiency, thereby enhancing the accuracy and reliability of experimental data.

[0045] This device is suitable for sampling and analyzing gaseous components inside high-temperature and high-pressure containers or pipelines during the research and operation of nuclear engineering, petrochemical and thermal power systems.

[0046] The purpose of the above embodiments is to provide a further detailed description of the present invention in conjunction with the accompanying drawings, so that those skilled in the art can understand the technical concept of the present invention. Within the scope of the present invention, optimization or equivalent substitution of the technical features involved, as well as combination of implementation methods in different embodiments without causing structural and principle conflicts, all fall within the protection scope of the present invention.

Claims

1. A continuous sampling device for high-temperature and high-pressure gases containing water vapor, characterized in that, include The system includes sampling pipelines, sampling bottle arrays, heat tracing and insulation devices, and cleaning devices; among which, The collection pipeline includes a main pipeline and multiple sampling branches. One end of the main pipeline is connected to a sampling gas source, and the other end is set as an exhaust end. The sampling bottle array includes multiple sampling bottles, and each of the sampling branches is connected to one of the sampling bottles. The heat tracing and insulation device covers the surface of the collection pipeline and the sampling bottle array and heats the collection pipeline and the sampling bottle array; The cleaning device is connected to the collection pipeline and is used to clean the collection pipeline.

2. The continuous sampling device for high-temperature and high-pressure gas containing water vapor according to claim 1, characterized in that, Each of the aforementioned sampling branches is equipped with a sampling valve.

3. The high-temperature, high-pressure gas continuous sampling device containing water vapor according to claim 2, characterized in that, It also includes a sampling controller, which controls the opening and closing of each of the sampling valves and performs sampling in a preset order.

4. The continuous sampling device for high-temperature and high-pressure gas containing water vapor according to claim 1, 2, or 3, characterized in that, The heat tracing and insulation device includes a heating belt and an insulation layer. The heating belt is wrapped around the sampling pipeline and the surface of the sampling bottle, and the insulation layer covers the surface of the sampling bottle.

5. The high-temperature, high-pressure gas continuous sampling device containing water vapor according to claim 4, characterized in that, The heating tape wrapped around the collection tube is a first heating tape, and the heating tape wrapped around the sampling bottle is a second heating tape, which is detachably connected to the first heating tape.

6. The continuous sampling device for high-temperature and high-pressure gas containing water vapor according to claim 1, 2, or 3, characterized in that, The cleaning device includes a purging device and an air pump, wherein the purging device is connected upstream of the sampling branch on the main pipeline, and the air pump is connected downstream of the purging device on the main pipeline.

7. The continuous sampling device for high-temperature and high-pressure gas containing water vapor according to claim 1, 2, or 3, characterized in that, It also includes a containment structure configured as a pressure-bearing structure, which encloses the connection between the main pipeline and the sampling gas source.

8. A method for continuous sampling of high-temperature, high-pressure gases containing water vapor, characterized in that, A continuous sampling device for high-temperature, high-pressure gases containing water vapor as described in any one of claims 1 to 7, comprising the following steps: Step a): Connect the collection pipeline to the sampling gas source, which is a high-temperature and high-pressure pipeline or gas cylinder. Start the heat tracing and insulation device to heat the collection pipeline and the sampling bottle to the same temperature as the sampling gas source. Step b): Allow the gas to be sampled to flow into the collection pipeline and be discharged from the exhaust end until the temperature and pressure of the collection pipeline stabilize. Step c): Input the gas to be sampled into the sampling bottle in a preset order and seal the sampling bottle.

9. The method for continuous sampling of high-temperature and high-pressure gases containing water vapor according to claim 8, characterized in that, Each of the sampling branches is equipped with a sampling valve. In step c), the sampling is completed by controlling the opening and closing of each sampling valve in a preset timing sequence.

10. The method for continuous sampling of high-temperature, high-pressure gas containing water vapor according to claim 8 or 9, characterized in that, The process includes step d) after step c): cleaning the collection pipeline using the cleaning device.

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