Channel open circuit test circuit, system and method

Abstract

The invention relates to the technical field of equipment testing, and particularly discloses a channel open-circuit testing circuit, system and method. The channel open circuit test circuit comprises an MOS driving module, an open circuit detection module and a fault diagnosis module. The MOS driving module comprises a plurality of output ports and feedback ports, wherein the number of the feedback ports is smaller than that of output channels. The MOS driving module and a corresponding external load form an output channel through each output port, the output end of the open circuit detection module is connected with the output channel, and each feedback port of the MOS driving module is connected with the fault diagnosis module; the open circuit detection module generates an open circuit detection signal and transmits the open circuit detection signal to the MOS driving module through a to-be-detected output channel; the MOS driving module generates a diagnosis feedback signal according to the open circuit detection signal and transmits the diagnosis feedback signal to the fault diagnosis module through a corresponding feedback port; the fault diagnosis module judges whether the output channel to be detected is in an open circuit state according to the level state of the diagnosis feedback signal, and independent detection of the output channel is achieved.

Description

Technical Field

[0001] This invention relates to the field of equipment testing technology, and in particular to a channel open-circuit test circuit, system, and method. Background Technology

[0002] With the trend of vehicle electrification and intelligentization, multi-channel MOS chips (such as intelligent high-side switch chips) are widely used in multi-load drive scenarios of vehicles due to their high integration and strong driving capability. The industry-leading 24V intelligent high-side switch chip BTS724G realizes 4-channel high-side drive through four pins, meeting the synchronous control requirements of multiple loads in automobiles.

[0003] In multi-load automotive scenarios, the number of diagnostic feedback ports is far less than the number of output channels, and multiple output channels share feedback ports, making it impossible to accurately locate specific faulty channels and resulting in low maintenance efficiency. Existing technologies mostly focus on open-circuit diagnostics for single loads, failing to design solutions for mixed-drive scenarios with multiple channels and types of loads in automobiles, and neglecting the high reliability and interference immunity requirements (such as those of the in-vehicle electromagnetic environment). This makes it difficult to integrate with intelligent diagnostic systems for vehicle controllers or body controllers, and thus cannot meet the intelligent requirements for vehicle fault early warning, location, and remote reporting.

[0004] The above content is only used to help understand the technical solution of the present invention and does not represent an admission that the above content is prior art. Summary of the Invention

[0005] The main objective of this invention is to provide a channel open-circuit test circuit, system, and method, which aims to solve the technical problem of being unable to locate specific faulty channels under multi-load driving in the prior art.

[0006] To achieve the above objectives, the present invention provides a channel open-circuit test circuit, which includes: a MOS driving module, an open-circuit detection module, and a fault diagnosis module. The MOS driving module includes multiple output ports and a number of feedback ports less than the number of output channels. The MOS driving module forms an output channel with the corresponding external load through each of the output ports. The output terminal of the open circuit detection module is connected to the output channel, and each of the feedback ports of the MOS driving module is connected to the fault diagnosis module. The open circuit detection module is used to generate an open circuit detection signal and transmit the open circuit detection signal to the MOS drive module through the output channel to be detected; The MOS driving module is used to generate a diagnostic feedback signal based on the open circuit detection signal, and transmit the diagnostic feedback signal to the fault diagnosis module through the corresponding feedback port; The fault diagnosis module is used to determine whether the output channel to be tested is open-circuited based on the level of the diagnostic feedback signal transmitted through the feedback port.

[0007] In one embodiment, the open-circuit detection module includes: a first resistor corresponding to the number of output channels; The first end of each of the first resistors is connected to an external power supply, and the second end of each of the first resistors is connected to the corresponding output channel.

[0008] In one embodiment, the number of output channels to be detected is two, and the number of feedback ports is two; The open circuit detection module is used to generate an open circuit detection signal and transmit the open circuit detection signal to the MOS drive module through the two output channels to be detected. The MOS driving module generates two diagnostic feedback signals based on the open-circuit detection signals transmitted by the two output channels to be detected, and transmits the two diagnostic feedback signals to the fault diagnosis module through the two feedback ports respectively. The fault diagnosis module is used to determine whether the two output channels to be tested are open-circuited based on the level states of the two diagnostic feedback signals.

[0009] In one embodiment, the fault diagnosis module includes: a main controller; The sampling terminal of the main controller is connected to each of the feedback ports of the MOS drive module, and the control terminal of the main controller is connected to the input terminal of the open circuit detection module. The main controller is used to generate timing control signals and transmit the timing control signals to the open circuit detection module; The open-circuit detection module is also used to transmit the open-circuit detection signal to the MOS drive module sequentially through the output channel to be detected according to the timing control signal.

[0010] In one embodiment, the open-circuit detection module includes: a single-channel detection unit corresponding to the number of output channels; Each of the single-channel detection units is connected to the corresponding output channel; Each of the single-channel detection units is used to generate an open-circuit detection signal and transmit the open-circuit detection signal to the MOS drive module through the corresponding output channel.

[0011] In one embodiment, each of the single-channel detection units includes: a second to a fifth resistor, a first switching transistor, and a second switching transistor; The first end of the second resistor is connected to the first end of the first switch transistor. The second end of the first switch transistor is connected to the first end of the third resistor and the external power supply terminal. The second end of the third resistor is connected to the third end of the first switch transistor and the first end of the fourth resistor. The second end of the fourth resistor is connected to the first end of the second switch transistor. The second end of the second switch transistor is connected to the first end of the fifth resistor. The second end of the fifth resistor is connected to the control terminal of the main controller. The third end of the second switch transistor is grounded.

[0012] In one embodiment, the number of output channels to be detected is four, and the number of feedback ports is two; The open-circuit detection module is used to transmit the open-circuit detection signal sequentially to the MOS drive module through the four output channels to be detected according to the timing control signal. The MOS driving module generates a diagnostic feedback signal based on the open-circuit detection signals transmitted sequentially from the four output channels to be detected, and transmits the diagnostic feedback signal to the fault diagnosis module through the two feedback ports respectively. The fault diagnosis module is used to determine whether the four output channels to be tested are open-circuited based on the level status of the two diagnostic feedback signals and the timing control signal.

[0013] In one embodiment, the fault diagnosis module is used to determine that the output channel to be tested is in an open circuit state when the diagnostic feedback signal transmitted at the feedback port is in a low level state. The fault diagnosis module is also used to determine that the output channel to be tested is not open-circuited when the diagnostic feedback signal transmitted at the feedback port is in a high-level state.

[0014] In addition, to achieve the above objectives, the present invention also proposes a channel open-circuit test system, which includes the channel open-circuit test circuit described above.

[0015] Furthermore, to achieve the above objectives, the present invention also proposes a channel open-circuit test method, which is applied to the channel open-circuit test system described above, and the channel open-circuit test method includes: An open circuit detection signal is generated using an open circuit detection module, and the open circuit detection signal is transmitted to the MOS drive module through the output channel to be detected. The MOS driving module generates a diagnostic feedback signal based on the open-circuit detection signal, and transmits the diagnostic feedback signal to the fault diagnosis module through the corresponding feedback port; the fault diagnosis module determines whether the output channel to be tested is open-circuited based on the level of the diagnostic feedback signal transmitted through the feedback port.

[0016] This invention provides a channel open-circuit test circuit, system, and method. The channel open-circuit test circuit includes a MOS driving module, an open-circuit detection module, and a fault diagnosis module. The MOS driving module includes multiple output ports and a number of feedback ports fewer than the number of output channels. Each output port of the MOS driving module forms an output channel with a corresponding external load. The output terminal of the open-circuit detection module is connected to the output channel, and each feedback port of the MOS driving module is connected to the fault diagnosis module. The open-circuit detection module generates an open-circuit detection signal and transmits it to the MOS driving module through the output channel to be tested. The MOS driving module generates a diagnostic feedback signal based on the open-circuit detection signal and transmits it to the fault diagnosis module through the corresponding feedback port. The fault diagnosis module determines whether the output channel to be tested is open-circuited based on the level of the diagnostic feedback signal transmitted through the feedback port. Through the collaborative design of the open-circuit detection module and the fault diagnosis module, fault channel status detection is achieved, identifying the specific open-circuit output channel and improving the efficiency of automotive load fault repair. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the first embodiment of the channel open-circuit test circuit proposed in this invention; Figure 2 This is a circuit connection diagram of the second embodiment of the open-circuit test circuit of this application; Figure 3 This is a schematic diagram of the module of the third embodiment of the open-circuit test circuit of this application; Figure 4 This is a circuit connection diagram of the third embodiment of the open-circuit test circuit of this application; Figure 5 This is a flowchart illustrating the first embodiment of the open-circuit test method proposed in this invention.

[0018] Explanation of reference numerals in the attached figures: 10. MOS driver module; 20. Open circuit detection module; 30. Fault diagnosis module; 301. Main controller; 201. Single-channel detection unit; R1. First resistor; R2. Second resistor; R3. Third resistor; R4. Fourth resistor; R5. Fifth resistor; Q1. First switching transistor; Q2. Second switching transistor.

[0019] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0020] It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

[0021] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present invention.

[0022] It should be noted that all directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of the present invention are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indication will also change accordingly.

[0023] Furthermore, the use of terms such as "first" and "second" in this invention is for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. Additionally, the technical solutions of the various embodiments can be combined with each other, but only on the basis of being achievable by those skilled in the art. When the combination of technical solutions is contradictory or impossible to implement, such a combination of technical solutions should be considered non-existent and not within the scope of protection claimed by this invention.

[0024] Reference Figure 1 , Figure 1 This is a schematic diagram of the first embodiment of the channel open-circuit test circuit proposed in this invention. Based on Figure 1 The first embodiment of the channel open circuit test circuit of the present invention is presented.

[0025] In this embodiment, the channel open-circuit test circuit includes: a MOS driving module 10, an open-circuit detection module 20, and a fault diagnosis module 30. The MOS driving module 10 includes multiple output ports (OUT) and a number of feedback ports (ST) fewer than the number of output channels. The MOS driving module 10 forms an output channel with a corresponding external load (LOAD) through each of the output ports. The output terminal of the open-circuit detection module 20 is connected to the output channel, and each of the feedback ports of the MOS driving module 10 is connected to the fault diagnosis module 30.

[0026] It should be noted that the open-circuit detection module 20 can be used to generate an open-circuit detection signal and transmit the open-circuit detection signal to the MOS driving module 10 through the output channel to be detected; the MOS driving module 10 can be used to generate a diagnostic feedback signal based on the open-circuit detection signal and transmit the diagnostic feedback signal to the fault diagnosis module 30 through the corresponding feedback port; the fault diagnosis module 30 can be used to determine whether the output channel to be detected is open-circuited based on the level state of the diagnostic feedback signal transmitted through the feedback port.

[0027] Understandably, the MOS driver module 10 can employ a smart high-side switching chip, such as the BTS724G chip, capable of receiving control signals and driving external loads in the vehicle. These external loads can be various electrical devices used in automotive electrification scenarios, including lighting (low beam headlights and position lights, etc.), motors, and high-voltage components. The output port can be the physical interface on the MOS driver module 10 used to establish an electrical connection with the external load, and the feedback port can be the physical interface on the MOS driver module 10 used to output diagnostic feedback signals. The output channel can be the current transmission path for load driving and open-circuit detection. The open-circuit detection module 20 can provide an open-circuit detection signal for the output channel under test. The fault diagnosis module 30 can employ a functional device with signal processing capabilities, such as an Electronic Control Unit (ECU), capable of analyzing whether an open-circuit fault exists in the output channel under test based on a pre-set logic program (level state judgment rules). For example, it can confirm the existence of an open-circuit fault when a low-level diagnostic feedback signal is received, and confirm that no open-circuit fault has occurred when a high-level diagnostic feedback signal is received.

[0028] It should be understood that the open circuit detection signal can be an electrical signal generated by the open circuit detection module 20 based on the vehicle power supply (such as 12V / 24V) and equipped with a diagnostic feedback mechanism that triggers the MOS drive module 10. The diagnostic feedback signal can be an electrical signal generated by the MOS drive module 10 based on the output channel status after receiving the open circuit detection signal.

[0029] In one possible implementation, there are four output ports, two feedback ports, and two output channels to be tested. The two feedback ports respectively feed back diagnostic feedback signals from the two output channels to be tested, and the two channels are tested individually to determine the open-circuit fault channel.

[0030] In another possible implementation, there are four output ports, two feedback ports, and four output channels under test. The two feedback ports each provide diagnostic feedback signals for one of the four output channels under test. Each feedback port corresponds to two output channels under test. In this case, single-channel detection can only identify the channel with an open-circuit fault, but cannot pinpoint which specific output channel has the open-circuit fault. A time-division multiplexing approach can be used, where the two output channels under test corresponding to one feedback port are connected to the feedback sequentially at different times. The output channel with the open-circuit fault can be identified based on the timing sequence. Time-division multiplexing can be achieved by using PWM signals to control the on / off state of transistors of different polarities to allow the two output channels of the same feedback port to be tested separately, or it can be achieved by software program control of the test timing of each output port sequentially.

[0031] It should be understood that the number of output ports and feedback ports is not specifically limited in this embodiment. When the number of feedback ports is less than the number of output channels to be tested, multiple output ports corresponding to the output channels to be tested can share a single feedback port to generate diagnostic feedback signals.

[0032] In this embodiment, the channel open-circuit test circuit includes a MOS driving module, an open-circuit detection module, and a fault diagnosis module. The MOS driving module includes multiple output ports and a number of feedback ports fewer than the number of output channels. The MOS driving module forms an output channel with a corresponding external load through each of its output ports. The output terminal of the open-circuit detection module is connected to the output channel, and each of the feedback ports of the MOS driving module is connected to the fault diagnosis module. The open-circuit detection module generates an open-circuit detection signal and transmits it to the MOS driving module through the output channel to be tested. The MOS driving module generates a diagnostic feedback signal based on the open-circuit detection signal and transmits it to the fault diagnosis module through the corresponding feedback port. The fault diagnosis module determines whether the output channel to be tested is open-circuited based on the level of the diagnostic feedback signal transmitted through the feedback port. Through the collaborative design of the open-circuit detection module and the fault diagnosis module, fault channel status detection is achieved, the specific open-circuit output channel is identified, and the efficiency of automotive load fault repair is improved.

[0033] Based on the first embodiment of this application, in the second embodiment of this application, the content that is the same as or similar to that in Embodiment 1 above can be referred to the above description, and will not be repeated hereafter. Based on this, please refer to... Figure 2 , Figure 2 This is a circuit connection diagram of the second embodiment of the open-circuit test circuit of this application.

[0034] In this embodiment, the open circuit detection module 20 includes: a first resistor R1 corresponding to the number of output channels; the first end of each first resistor R1 is connected to the external power supply terminal VCC, and the second end of each first resistor R1 is connected to the corresponding output channel.

[0035] It should be noted that, according to the diagnostic requirements of the vehicle load, if the number of feedback ports equals the number of output channels to be tested, for example, if there are two output channels to be tested and two feedback ports, then the open-circuit detection module 20 can generate an open-circuit detection signal and transmit the open-circuit detection signal to the MOS driver module 10 through the two output channels to be tested respectively. The MOS driver module 10 generates two diagnostic feedback signals based on the open-circuit detection signals transmitted from the two output channels to be tested respectively, and transmits the two diagnostic feedback signals to the fault diagnosis module 30 through the two feedback ports respectively. The fault diagnosis module 30 can be used to determine whether an open circuit has occurred in the two output channels to be tested based on the level states of the two diagnostic feedback signals.

[0036] Understandably, single-channel priority detection is suitable for individual diagnosis of critical automotive loads, such as daytime running lights and driver's side window motors. Only 1 to 2 critical loads in the MOS output channel need to be tested for open circuit. Pull-up resistors and pull-up power supplies are configured for the output channel to be tested. When the MOS chip is not outputting or is outputting normally, the fault diagnosis module detects the diagnostic feedback signals of the two feedback ports. If the diagnostic feedback signal of either feedback port is low, it is determined that the output channel corresponding to that feedback port has an open circuit fault.

[0037] In this embodiment, there are two output channels to be detected and two feedback ports. The open-circuit detection module generates an open-circuit detection signal and transmits it to the MOS driver module through the two output channels to be detected. The MOS driver module generates two diagnostic feedback signals based on the open-circuit detection signals transmitted from the two output channels to be detected and transmits them to the fault diagnosis module through the two feedback ports. The fault diagnosis module determines whether an open circuit has occurred in the two output channels to be detected based on the level of the two diagnostic feedback signals. No additional control logic is required; open-circuit detection of the output channels can be achieved simply by configuring pull-ups as needed, reducing the number of components and lowering the cost of automotive electronics.

[0038] Based on the above embodiments of this application, in the third embodiment of this application, the same or similar content as the above embodiments can be referred to the above description, and will not be repeated hereafter. Based on this, please refer to... Figure 3 , Figure 3 This is a schematic diagram of the module of the third embodiment of the open-circuit test circuit of this application.

[0039] The fault diagnosis module 30 includes a main controller 301; the sampling terminal of the main controller 301 is connected to each of the feedback ports of the MOS drive module 10, and the control terminal of the main controller 301 is connected to the input terminal of the open circuit detection module 20.

[0040] It should be noted that the main controller 301 can be used to generate timing control signals and transmit the timing control signals to the open circuit detection module 20; the open circuit detection module 20 can also be used to transmit the open circuit detection signals to the MOS drive module 10 through the output channel to be detected in sequence according to the timing control signals.

[0041] It is understood that the main controller can integrate a sampling port, a memory, and a processor. The memory stores software algorithms, and the processor uses these algorithms to process the signals collected by the sampling port to achieve fault logic judgment. The sampling end of the main controller can be a physical interface for collecting feedback signals from the MOS drive module. The sampling end must have anti-interference capabilities (e.g., using filter capacitors) to ensure the accuracy of signal acquisition in the vehicle's electromagnetic environment. The control end of the main controller can transmit timing control signals to the open-circuit detection module to control its on / off state. Each control end corresponds to one open-circuit detection unit, and the working state of a single detection unit can be independently controlled by high and low level signals. The timing control signal can be a periodic electrical signal to avoid simultaneous conduction of adjacent channel switching elements, controlling each single detection unit in the open-circuit detection module to conduct sequentially and work in turn, solving the problem of difficulty in locating open-circuit fault channels when multiple channels share a feedback port.

[0042] Furthermore, the open-circuit detection module 20 includes: a single-channel detection unit 201 corresponding to the number of output channels; each single-channel detection unit 201 is connected to the corresponding output channel.

[0043] It should be noted that each of the single-channel detection units 201 is used to generate an open-circuit detection signal and transmit the open-circuit detection signal to the MOS drive module 10 through the corresponding output channel.

[0044] Understandably, when each output channel needs to be tested for open circuit, since the number of feedback ports is less than the number of output ports, it is necessary to test each output channel separately to ensure that the output channel with the open circuit fault can be located.

[0045] Reference Figure 4 , Figure 4 This is a circuit connection diagram for a third embodiment of the open-circuit test circuit of this application. Each of the single-channel detection units includes: a second to a fifth resistor, a first switch Q1, and a second switch Q2.

[0046] Wherein, the first end of the second resistor R2 is connected to the first end of the first switch Q1, the second end of the first switch Q1 is connected to the first end of the third resistor R3 and the external power supply, the second end of the third resistor R3 is connected to the third end of the first switch Q1 and the first end of the fourth resistor R4, the second end of the fourth resistor R4 is connected to the first end of the second switch Q2, the second end of the second switch Q2 is connected to the first end of the fifth resistor R5, the second end of the fifth resistor R5 is connected to the control terminal (TC) of the main controller 301, and the third end of the second switch Q2 is grounded.

[0047] It should be noted that the number of output channels to be tested is four, and the number of feedback ports is two. The open-circuit detection module can be used to sequentially transmit the open-circuit detection signal to the MOS driver module through the four output channels to be tested according to the timing control signal. The MOS driver module generates a diagnostic feedback signal based on the open-circuit detection signal transmitted sequentially by the four output channels to be tested, and transmits the diagnostic feedback signal to the fault diagnosis module through the two feedback ports. The fault diagnosis module is used to determine whether the four output channels to be tested are open-circuited according to the level state of the two diagnostic feedback signals and the timing control signal.

[0048] Understandably, when the number of output channels to be tested exceeds the number of feedback ports, full-channel coverage testing is required (applicable to simultaneous diagnosis of multiple loads in automobiles, such as four-door window motors and four sets of taillights). The timing control signal generated by the main controller controls the on / off state of the second switch, thereby controlling the conduction and cutoff of the first switch to achieve open-circuit detection. Controlling the on / off state of the four channels enables the logic of sequentially activating the single-channel pull-up power supply. The open-circuit fault channel is determined by combining the diagnostic feedback signal with the timing control logic. For example, setting the complete cycle of the timing control signal to 10ms and the on-time of each channel to 2.5ms, the corresponding switch of the output channel under test is sequentially activated. When one switch is activated, the others are deactivated. If the diagnostic feedback signal of the corresponding feedback port is low when a switch is activated, the output channel is determined to be open-circuit. The timing is then used to determine that the output channel with the activated switch is in an open-circuit fault state. If no low-level detection occurs within the timing cycle, all output channels are considered normal.

[0049] In this embodiment, there are four output channels to be detected and two feedback ports. The open-circuit detection module is used to sequentially transmit the open-circuit detection signal to the MOS driver module through the four output channels to be detected according to the timing control signal. The MOS driver module generates a diagnostic feedback signal based on the open-circuit detection signal transmitted sequentially by the four output channels to be detected, and transmits the diagnostic feedback signal to the fault diagnosis module through the two feedback ports. The fault diagnosis module is used to determine whether an open circuit has occurred in the four output channels to be detected based on the level of the two diagnostic feedback signals and the timing control signal. Without the need for additional diagnostic chips, the feedback ports are multiplexed by switching transistor timing control, enabling rapid location of open-circuit faults in high-voltage power distribution systems and avoiding high-voltage safety risks to the entire vehicle caused by load power interruption.

[0050] In addition, to achieve the above objectives, the present invention also proposes a channel open-circuit test system, which includes the channel open-circuit test circuit described above.

[0051] Since the open-circuit test system adopts all the technical solutions of all the above embodiments, it has at least all the beneficial effects brought about by the technical solutions of the above embodiments, which will not be repeated here.

[0052] Furthermore, this invention also proposes a method for testing open-circuit channels. (Refer to...) Figure 5 , Figure 5 This is a flowchart illustrating the first embodiment of the open-circuit test method proposed in this invention. The open-circuit test method is applied to the open-circuit test circuit described above, and the method includes: Step S10: Use the open circuit detection module to generate an open circuit detection signal, and transmit the open circuit detection signal to the MOS drive module through the output channel to be detected.

[0053] Step S20: Use the MOS drive module to generate a diagnostic feedback signal based on the open circuit detection signal, and transmit the diagnostic feedback signal to the fault diagnosis module through the corresponding feedback port.

[0054] Step S30: Use the fault diagnosis module to determine whether the output channel to be tested is open-circuited based on the level of the diagnostic feedback signal transmitted by the feedback port.

[0055] Since the open-circuit test method adopts all the technical solutions of all the above embodiments, it has at least all the beneficial effects brought about by the technical solutions of the above embodiments, which will not be repeated here.

[0056] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or system. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or system that includes that element.

[0057] The above are merely preferred embodiments of the present invention and do not limit the scope of the patent. Any equivalent structural or procedural transformations made based on the description and drawings of the present invention, or direct or indirect applications in other related technical fields, are similarly included within the scope of patent protection of the present invention.

Claims

1. A channel open-circuit test circuit, characterized in that, The channel open circuit test circuit includes: a MOS driving module, an open circuit detection module, and a fault diagnosis module. The MOS driving module includes multiple output ports and a number of feedback ports less than the number of output channels. The MOS driving module forms an output channel with the corresponding external load through each of the output ports. The output terminal of the open circuit detection module is connected to the output channel, and each of the feedback ports of the MOS driving module is connected to the fault diagnosis module. The open circuit detection module is used to generate an open circuit detection signal and transmit the open circuit detection signal to the MOS drive module through the output channel to be detected; The MOS driving module is used to generate a diagnostic feedback signal based on the open circuit detection signal, and transmit the diagnostic feedback signal to the fault diagnosis module through the corresponding feedback port; The fault diagnosis module is used to determine whether the output channel to be tested is open-circuited based on the level of the diagnostic feedback signal transmitted through the feedback port.

2. The channel open-circuit test circuit as described in claim 1, characterized in that, The open-circuit detection module includes: a first resistor corresponding to the number of output channels; The first end of each of the first resistors is connected to an external power supply, and the second end of each of the first resistors is connected to the corresponding output channel.

3. The channel open-circuit test circuit as described in claim 2, characterized in that, The number of output channels to be tested is two, and the number of feedback ports is two; The open circuit detection module is used to generate an open circuit detection signal and transmit the open circuit detection signal to the MOS drive module through the two output channels to be detected. The MOS driving module generates two diagnostic feedback signals based on the open-circuit detection signals transmitted by the two output channels to be detected, and transmits the two diagnostic feedback signals to the fault diagnosis module through the two feedback ports respectively. The fault diagnosis module is used to determine whether the two output channels to be tested are open-circuited based on the level states of the two diagnostic feedback signals.

4. The channel open-circuit test circuit as described in claim 1, characterized in that, The fault diagnosis module includes: a main controller; The sampling terminal of the main controller is connected to each of the feedback ports of the MOS drive module, and the control terminal of the main controller is connected to the input terminal of the open circuit detection module. The main controller is used to generate timing control signals and transmit the timing control signals to the open circuit detection module; The open-circuit detection module is also used to transmit the open-circuit detection signal to the MOS drive module sequentially through the output channel to be detected according to the timing control signal.

5. The channel open-circuit test circuit as described in claim 4, characterized in that, The open-circuit detection module includes: a single-channel detection unit corresponding to the number of output channels; Each of the single-channel detection units is connected to the corresponding output channel; Each of the single-channel detection units is used to generate an open-circuit detection signal and transmit the open-circuit detection signal to the MOS drive module through the corresponding output channel.

6. The channel open-circuit test circuit as described in claim 5, characterized in that, Each of the aforementioned single-channel detection units includes: a second to a fifth resistor, a first switching transistor, and a second switching transistor; The first end of the second resistor is connected to the first end of the first switch transistor. The second end of the first switch transistor is connected to the first end of the third resistor and the external power supply terminal. The second end of the third resistor is connected to the third end of the first switch transistor and the first end of the fourth resistor. The second end of the fourth resistor is connected to the first end of the second switch transistor. The second end of the second switch transistor is connected to the first end of the fifth resistor. The second end of the fifth resistor is connected to the control terminal of the main controller. The third end of the second switch transistor is grounded.

7. The channel open-circuit test circuit as described in claim 6, characterized in that, The number of output channels to be tested is four, and the number of feedback ports is two; The open-circuit detection module is used to transmit the open-circuit detection signal sequentially to the MOS drive module through the four output channels to be detected according to the timing control signal. The MOS driving module generates a diagnostic feedback signal based on the open-circuit detection signals transmitted sequentially from the four output channels to be detected, and transmits the diagnostic feedback signal to the fault diagnosis module through the two feedback ports respectively. The fault diagnosis module is used to determine whether the four output channels to be tested are open-circuited based on the level status of the two diagnostic feedback signals and the timing control signal.

8. The channel open-circuit test circuit as described in any one of claims 1-7, characterized in that, The fault diagnosis module is used to determine that the output channel to be tested is open-circuited when the diagnostic feedback signal transmitted at the feedback port is in a low-level state. The fault diagnosis module is also used to determine that the output channel to be tested is not open-circuited when the diagnostic feedback signal transmitted at the feedback port is in a high-level state.

9. A channel open-circuit test system, characterized in that, The open-circuit test system includes the open-circuit test circuit as described in any one of claims 1 to 8.

10. A method for testing an open circuit in a channel, characterized in that, The open-circuit testing method is applied to the open-circuit detection system as described in claim 9, and the steps of the open-circuit testing method include: An open circuit detection signal is generated using an open circuit detection module, and the open circuit detection signal is transmitted to the MOS drive module through the output channel to be detected. The MOS driving module generates a diagnostic feedback signal based on the open circuit detection signal, and transmits the diagnostic feedback signal to the fault diagnosis module through the corresponding feedback port. The fault diagnosis module uses the level of the diagnostic feedback signal transmitted through the feedback port to determine whether the output channel to be tested is open-circuited.

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