Large-current test tool for inductor

Abstract

The invention relates to the technical field of electrical performance testing, in particular to a large-current testing tool for an inductor, which comprises an operation platform, a mounting seat is mounted on the operation platform, and a support frame is mounted on the mounting seat; an indexing rotating assembly is installed on the operation platform and close to the supporting frame, and a plurality of clamp assemblies which are evenly distributed in an annular mode are arranged on the indexing rotating assembly. A cooling assembly is installed in the installation base, a lifting assembly is installed on the supporting frame, a detection assembly is fixedly installed at the telescopic end of the lifting assembly corresponding to one clamp assembly, the cooling assembly is in sealed connection with the clamp assembly corresponding to the detection assembly, and a clamping assembly is fixedly installed on the supporting frame corresponding to the other clamp assembly. The indexing rotating assembly drives the clamp assembly to rotate from the detection assembly to the clamping assembly, and a classified storage assembly is fixedly installed on the portion, corresponding to the clamping assembly, of the installation base. According to the invention, the problem of high-temperature interference in the testing process is solved, and the efficiency and precision of inductor large-current testing are improved.

Description

Technical Field

[0001] This invention relates to the field of electrical performance testing technology, and more specifically to a high-current testing fixture for inductors. Background Technology

[0002] As a commonly used passive component in electronic circuits, the electrical properties of inductors, such as DC resistance, inductance, and temperature rise characteristics under high current conditions, directly affect the stability of the entire equipment. Therefore, high current testing is a key step in the production and testing of inductors.

[0003] Currently, traditional testing relies on manual operation, which is not only inefficient, but also prone to errors that can lead to misalignment and affect the consistency of test data. Furthermore, inductors generate a large amount of heat rapidly during high-current testing, and existing cooling methods are mostly natural heat dissipation, which is inefficient and uneven. This causes the inductor's performance to fluctuate after the temperature rises, thus affecting the test accuracy and, in severe cases, damaging the device.

[0004] Therefore, improving the efficiency and accuracy of high-current testing of inductors and solving the problem of high-temperature interference are urgent issues that need to be addressed by those skilled in the art. Summary of the Invention

[0005] To address the technical problems of poor testing efficiency, low accuracy, and high-temperature interference in existing high-current testing processes for inductors, this application provides a high-current testing fixture for inductors.

[0006] The high-current testing fixture for inductors provided in this application adopts the following technical solution: A high-current testing fixture for inductors includes an operating platform with a mounting base fixedly mounted on it, and a support frame fixedly mounted on the mounting base. An indexing rotation assembly is fixedly mounted on the operating platform near the support frame, and several clamping assemblies evenly distributed in a ring are fixed on the indexing rotation assembly. A cooling assembly is installed inside the mounting base. A lifting assembly is fixedly mounted on the support frame, and a detection assembly is fixedly mounted on the telescopic end of the lifting assembly corresponding to one of the clamping assemblies. The cooling assembly is sealed to the clamping assembly corresponding to the detection assembly. A gripping assembly is fixedly mounted on the support frame corresponding to another clamping assembly. The indexing rotation assembly drives the clamping assembly to rotate from the detection assembly towards the gripping assembly. A sorting and storage assembly is fixedly mounted on the mounting base corresponding to the gripping assembly.

[0007] Furthermore, the indexing rotation assembly includes a power box fixedly mounted on the operating platform, a drive motor fixedly mounted on the power box, a worm shaft being driven to one end of the output shaft of the drive motor that extends into the power box, the worm shaft being rotatably connected inside the power box, a drive shaft being rotatably connected inside the power box, a worm wheel being fixedly connected to the drive shaft that meshes with the worm shaft, a drive disk being fixedly connected to one end of the drive shaft that extends outside the power box, an indexing disk being fixedly connected to the drive disk, and the clamping assembly being fixedly mounted on the indexing disk.

[0008] Furthermore, the clamping assembly includes a clamping base, the clamping base having a positioning groove inside that matches the shape of the clamping assembly when holding the inductor under test. A heat sink box is fixedly and sealed to the outside of the clamping base, and a heat dissipation cavity is formed between the inner wall of the heat sink box and the outer wall of the clamping base. The heat sink box is fixedly mounted on the indexing rotation assembly. An air inlet pipe and an air outlet pipe communicating with the heat dissipation cavity are fixedly and sealed to the side wall of the heat sink box. The indexing rotation assembly has air duct mounting holes corresponding to the air inlet pipe and the air outlet pipe. The air inlet pipe and the air outlet pipe are correspondingly and sealed in the air duct mounting holes, and the air duct mounting holes can be sealed to the cooling assembly.

[0009] Furthermore, the cooling assembly includes a thermoelectric cooler, with a first heat exchange fin fixedly and thermally connected to the cooling end of the thermoelectric cooler, and a second heat exchange fin fixedly and thermally connected to the heating end of the thermoelectric cooler. An air inlet shroud is fixedly installed on the outside of the first heat exchange fin, and an air outlet shroud is fixedly installed on the outside of the second heat exchange fin. The air inlet shroud and the air outlet shroud are fixedly and sealed to the inside of the mounting base. A blower pipe is fixedly and sealed to the air inlet shroud, and a return air pipe is fixedly and sealed to the air outlet shroud. An adapter is connected to one end of the blower pipe and the return air pipe that penetrates the side wall of the mounting base. An air inlet channel and an air outlet channel are provided on the adapter corresponding to the clamp assembly. The air inlet channel is fixedly and sealed to the blower pipe, and the air outlet channel is fixedly and sealed to the return air pipe. A fan is fixedly installed on the end of the air inlet shroud away from the blower pipe.

[0010] Furthermore, the lifting assembly includes a first telescopic member, which is fixedly installed on the top of the support frame. A fixed sleeve is fixedly installed on one end of the telescopic rod of the first telescopic member that passes through the support frame. A connecting frame is fixedly connected to the fixed sleeve, and the detection assembly is fixedly installed on the bottom surface of the connecting frame.

[0011] Furthermore, the detection component includes a base, which is fixedly mounted on the lifting component. A first mounting cavity is centrally located at the bottom of the base. At least two second mounting cavities are located on the outer side of the first mounting cavity corresponding to the pins of the inductor under test. A temperature sensor connected to an external detection device is fixedly mounted inside the first mounting cavity corresponding to the housing of the inductor under test. An elastic element is abutting between the temperature sensor and the inner top surface of the first mounting cavity. A set of probe arrays connected to an external detection device is fixedly mounted inside each of the second mounting cavities, and each set of probe arrays corresponds to one pin of the inductor under test.

[0012] Furthermore, the probe array includes an adapter post, which integrates a four-wire Kelvin test circuit. Several parallel-connected elastic conductive probes are conductively connected to the end of the adapter post. The four-wire Kelvin test circuit includes a current transmission branch and a voltage detection branch, which are connected to external testing equipment.

[0013] Furthermore, the gripping assembly includes a horizontally arranged slide rail, which is fixedly installed on the bottom surface of the top of the support frame. A sliding frame is slidably connected to the slide rail. A second telescopic member is fixedly installed on the bottom surface of the top of the support frame, corresponding to the sliding frame, along the length direction of the slide rail. The telescopic end of the second telescopic member is fixedly connected to the sliding frame. A vertically arranged third telescopic member is fixedly installed on the sliding frame, and a pneumatic finger is fixedly installed on the telescopic end of the third telescopic member.

[0014] Furthermore, the sorting and storage component includes a collection rack fixedly installed on the operating platform. The middle of the collection rack is provided with a first collection port and a second collection port corresponding to the clamping component. The two ends of the collection rack are respectively equipped with a detachable first collection frame and a second collection frame corresponding to the first collection port and the second collection port. The first collection port is connected to the first collection frame, and the second collection port is connected to the second collection frame.

[0015] Furthermore, it also includes a controller, which is electrically connected to the indexing rotation assembly, the cooling assembly, the lifting assembly, the clamping assembly, and external detection equipment.

[0016] Beneficial effects achieved: This application uses an indexing rotation component to drive a ring-shaped, evenly distributed clamping component to complete continuous station switching. With the orderly linkage of the lifting component, detection component, clamping component, and classification and storage component, a closed-loop process of feeding, precise positioning, high-current detection, synchronous cooling, automatic unloading, and classification and storage is constructed, which reduces manual intervention, improves testing efficiency, and can meet the testing needs of mass production.

[0017] This application eliminates electrode docking deviations caused by manual operation by using a standardized positioning structure for the fixture components and an automatic alignment design for the detection components. This effectively reduces the repeatability error of key parameters such as DC resistance and inductance, and significantly improves the consistency and accuracy of test data.

[0018] This application achieves all-round contact between the cooling medium and the inductor through a sealed bonding design of the cooling component and the clamping component, forming a uniform heat dissipation channel. This enables stable and reliable control of the device temperature rise during the test, avoiding inductor performance drift or permanent damage caused by high temperature, and eliminating the interference of temperature fluctuations on the test results, further ensuring the reliability of the test data and the safety of the device. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the overall structure of one embodiment of this application.

[0020] Figure 2 This is a structural exploded view of one embodiment of this application.

[0021] Figure 3 This is a schematic diagram of the internal structure of one embodiment of this application.

[0022] Figure 4 yes Figure 3 Schematic diagram of the cross-section along the AA direction.

[0023] Figure 5 This is an exploded view of the indexing rotation component in one embodiment of this application.

[0024] Figure 6 This is an exploded view of the fixture assembly in one embodiment of this application.

[0025] Figure 7 This is an exploded view of the cooling component in one embodiment of this application.

[0026] Figure 8 This is an exploded view of the detection component in one embodiment of this application.

[0027] Figure 9 This is an exploded view of the lifting component in one embodiment of this application.

[0028] Figure 10 This is a schematic diagram of the overall structure of the probe array in one embodiment of this application.

[0029] Figure 11 This is an exploded view of the structure of the clamping component in one embodiment of this application.

[0030] Explanation of reference numerals in the attached drawings: 100, operating platform; 101, mounting base; 102, support frame; 200, indexing rotary assembly; 201, power box; 202, drive motor; 203, worm shaft; 204, drive shaft; 205, worm wheel; 206, drive plate; 207, indexing plate; 300, clamp assembly; 301, clamp base; 302, positioning slot; 303, heat dissipation box; 304, air inlet. 305. Air outlet duct; 306. Air duct mounting hole; 400. Cooling assembly; 401. Semiconductor cooling chip; 402. First heat exchange fin; 403. Second heat exchange fin; 404. Air inlet hood; 405. Air outlet hood; 406. Blower duct; 407. Return air duct; 408. Adapter; 409. Air inlet channel; 410. Air outlet channel; 411. Fan; 412. Protective net; 500 501. Lifting assembly; 502. First telescopic component; 503. Fixing sleeve; 504. Connecting frame; 505. Guide rod; 506. Guide sleeve; 600. Detection assembly; 601. Base; 602. First mounting cavity; 603. Second mounting cavity; 604. Temperature sensor; 605. Elastic component; 606. Probe array; 6061. Adapter post; 6062. Elastic conductive probe; 6063. Current transmission branch; 6064. Voltage detection branch; 700. Clamping assembly; 701. Slide rail; 702. Sliding frame; 703. Second telescopic component; 704. Third telescopic component; 705. Connecting seat; 706. Pneumatic finger; 800. Classification and storage assembly; 801. Collection rack; 802. First collection port; 803. Second collection port; 804. First collection frame; 805. Second collection frame. Detailed Implementation

[0031] The following is in conjunction with the appendix Figure 1-11 This application will be described in further detail.

[0032] In the description of this application, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0033] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection between two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0034] This application discloses a high-current testing fixture for inductors.

[0035] Please refer to the above as well. Figures 1 to 11 In one embodiment of this application, a high-current testing fixture for inductors includes an operating platform 100, a mounting base 101 fixedly mounted on the operating platform 100, and a support frame 102 fixedly mounted on the mounting base 101; an indexing rotation assembly 200 fixedly mounted on the operating platform 100 near the support frame 102, and a plurality of clamp assemblies 300 evenly distributed in a ring on the indexing rotation assembly 200; a cooling assembly 400 installed inside the mounting base 101; and vertically arranged clamps fixedly mounted on the support frame 102. The lifting assembly 500 has a detection assembly 600 fixedly installed on its telescopic end corresponding to a clamp assembly 300. The cooling assembly 400 is sealed to the clamp assembly 300 corresponding to the detection assembly 600. The support frame 102 has a clamping assembly 700 fixedly installed on another clamp assembly 300. The indexing rotation assembly 200 drives the clamp assembly 300 to rotate from the detection assembly 600 to the clamping assembly 700. The mounting base 101 has a classification storage assembly 800 fixedly installed on the clamping assembly 700.

[0036] During operation, the fixture automates the high-current testing process for inductors through multi-component collaboration. First, the inductor to be tested is mounted onto the clamp assembly 300 on the indexing rotation assembly 200. Several clamp assemblies 300 are evenly distributed in a ring, capable of simultaneously supporting multiple test pieces. Then, the indexing rotation assembly 200 is activated, rotating the clamp assembly 300 containing the inductor to directly beneath the detection assembly 600, achieving precise positioning of the testing station. Next, the lifting assembly 500 drives the detection assembly 600 downwards, aligning it with the inductor on the clamp assembly 300 to perform high-current testing. Simultaneously, the cooling assembly 400 inside the mounting base 101 is sealed to the clamp assembly 300, cooling the inductor during testing and preventing high temperatures from affecting test accuracy or damaging the device. After the test is completed, the indexing rotation component 200 continues to drive the clamping component 300 to rotate to the corresponding position of the clamping component 700. The clamping component 700 takes the tested inductor out of the clamping component 300 and puts it into the classification storage component 800 on the mounting base 101, so as to realize the classification and storage of the test piece.

[0037] The cooling component 400 is sealed to the clamping component 300, which can precisely cool the inductor during testing, preventing high temperatures caused by high current from affecting device performance or causing damage, and ensuring the accuracy and consistency of test data. The lifting component 500, detection component 600, clamping component 700 and indexing rotation component 200 work together to reduce manual intervention, which helps to reduce operational errors and reduce the labor intensity of operators.

[0038] This application uses a ring-shaped, evenly distributed clamping assembly 300 in conjunction with an indexing and rotating assembly 200 to achieve parallel operations of loading, testing, and unloading. The next set of tests can be started without waiting for a single process to complete, which greatly improves the speed of batch testing.

[0039] Please refer to the above as well. Figures 1 to 11 In one specific embodiment of this application, the indexing rotation assembly 200 includes a power box 201 fixedly installed on the operating platform 100. A drive motor 202 is fixedly installed on the power box 201. One end of the output shaft of the drive motor 202, which passes through the inside of the power box 201, is connected to a worm shaft 203. The worm shaft 203 is rotatably connected inside the power box 201. A drive shaft 204 is rotatably connected inside the power box 201. A worm wheel 205, which meshes with the worm shaft 203, is fixedly connected to the drive shaft 204. One end of the drive shaft 204, which passes through the outside of the power box 201, is fixedly connected to a drive disk 206. An indexing disk 207 is fixedly connected to the drive disk 206. A clamp assembly 300 is fixedly installed on the indexing disk 207.

[0040] During operation, the indexing rotation assembly 200 achieves precise indexing rotation through worm gear transmission. When the drive motor 202 starts, its output shaft transmits power to the worm shaft 203, which runs through the power box 201. The worm shaft 203 meshes with the worm wheel 205 on the drive shaft 204, transmitting power to the drive shaft 204 while simultaneously reducing the rotational speed and amplifying the torque. The drive shaft 204 then transmits power to the drive disc 206, which runs through the power box 201, causing the drive disc 206 to rotate synchronously. This, in turn, drives the indexing disc 207, which is fixedly connected to the drive disc 206, to rotate. As the indexing disc 207 rotates, the clamp assembly 300 fixed on it performs a circular indexing motion, enabling precise switching of the inductor under test between different positions.

[0041] The meshing transmission between the worm shaft 203 and the worm wheel 205 features reverse self-locking and a high transmission ratio, effectively preventing the indexing plate 207 from rotating and ensuring the positioning accuracy of the fixture assembly 300 at each station. Furthermore, the drive motor 202 transmits power through the worm gear mechanism, resulting in significant torque amplification and smooth rotation of the indexing plate 207 and multiple fixture assemblies 300, preventing operational vibration. The power box 201 provides protection for internal transmission components such as the worm shaft 203 and drive shaft 204, reducing the impact of external dust and vibration on the transmission. Simultaneously, its compact overall structure saves space on the operating platform 100. The indexing plate 207 can stably support multiple evenly distributed ring-shaped fixture assemblies 300. Combined with the controllable rotation of the drive motor 202, it enables continuous and orderly station switching, adapting to the batch testing requirements of the tooling.

[0042] Please refer to the above as well. Figures 1 to 11 In one specific embodiment of this application, the drive motor 202 is configured as a stepper motor, such as the 57BYGH56-2804 stepper motor, which can achieve precise power output through pulse signal control. The stepper motor has a fixed step angle with small error, and combined with the high transmission precision of the worm gear, it can achieve micro-step-level rotation control of the indexing plate 207, making the station positioning error of the fixture assembly 300 smaller. Simultaneously, the rotation speed of the stepper motor is determined by the pulse frequency, and the rotation angle is determined by the number of pulses, allowing for flexible adjustment of the rotation speed and start / stop timing of the indexing plate 207 according to the testing rhythm. The stepper motor not only easily interfaces with the tooling control system, but also allows for the coordinated linkage of the indexing rotation assembly 200 with the lifting assembly 500, detection assembly 600, etc., through preset rotation parameters, improving the automation integration of the tooling. Furthermore, its rapid start / stop response and lack of cumulative error prevent station offset caused by power output fluctuations during continuous station switching in batch testing, ensuring a continuous testing process.

[0043] Please refer to the above as well. Figures 1 to 11 In one specific embodiment of this application, the clamp assembly 300 includes a clamp base 301, which is made of a thermally conductive material. The clamp base 301 has an internal positioning groove 302 that matches the shape of the clamping assembly 700 when holding the inductor under test. A heat sink 303 is fixedly and sealed to the outside of the clamp base 301. A heat dissipation cavity is formed between the inner wall of the heat sink 303 and the outer wall of the clamp base 301. The heat sink 303 is correspondingly and fixedly mounted on the indexing rotation... On the indexing plate 207 of the component 200, an air inlet pipe 304 and an air outlet pipe 305 communicating with the heat dissipation cavity are fixedly and sealed to the side wall of the heat dissipation box 303. The indexing plate 207 of the indexing rotation component 200 has air duct mounting holes 306 corresponding to the air inlet pipe 304 and the air outlet pipe 305. The air inlet pipe 304 and the air outlet pipe 305 are sealed and installed in the air duct mounting holes 306, and the air duct mounting holes 306 can be sealed and connected to the cooling component 400.

[0044] During operation, the fixture assembly 300 achieves stable clamping and efficient cooling of the inductor under test through a combination of positioning and heat dissipation design. The inductor under test is placed in the positioning groove 302 of the fixture base 301. The shape of the positioning groove 302 matches the shape of the clamping assembly 700 when holding the inductor, ensuring that the inductor is fixed in position after installation and can be reliably removed by the clamping assembly 700. When the indexing plate 207 rotates the fixture assembly 300 to the test station, the air duct mounting hole 306 on the indexing plate 207 will seal and connect with the cooling assembly 400, so that the air inlet pipe 304, the air outlet pipe 305 and the cooling assembly 400 form a closed cooling medium channel.

[0045] The fixture base 301 is made of thermally conductive material. During testing, the heat generated by the inductor is quickly transferred to the fixture base 301 body and then diffused into the heat dissipation cavity between the heat sink 303 and the fixture base 301. The cooling air delivered by the cooling assembly 400 can enter the heat dissipation cavity through the air inlet duct 304, fully absorb the heat, and then flow back to the cooling assembly 400 through the air outlet duct 305, forming a continuous cooling loop.

[0046] Please refer to the above as well. Figures 1 to 11 In one specific embodiment of this application, the cooling assembly 400 includes a semiconductor refrigeration chip 401. The cooling end of the semiconductor refrigeration chip 401 is fixedly and thermally connected to a first heat exchange fin 402, and the heating end of the semiconductor refrigeration chip 401 is fixedly and thermally connected to a second heat exchange fin 403. An air inlet shroud 404 is fixedly mounted on the outside of the first heat exchange fin 402, and an air outlet shroud 405 is fixedly mounted on the outside of the second heat exchange fin 403. The air inlet shroud 404 and the air outlet shroud 405 are fixedly mounted inside the mounting base 101. A blower pipe 406 is fixedly and sealed to the air inlet shroud 404, and a sealed air outlet pipe 406 is fixedly and sealed to the air outlet shroud 405. A return air duct 407 is sealed and connected to a blower duct 406. One end of the return air duct 407, which passes through the side wall of the mounting base 101, is connected to an adapter 408. The adapter 408 has an air inlet channel 409 and an air outlet channel 410 corresponding to the air inlet duct 304 and the air outlet duct 305 in the clamp assembly 300. The air inlet channel 409 is fixedly and sealed to the blower duct 406, and the air outlet channel 410 is fixedly and sealed to the return air duct 407. A fan 411 is fixedly installed on the end of the air inlet hood 404 away from the blower duct 406. A protective net 412 is fixedly installed on the mounting base 101 corresponding to the air inlet hood 404 and the air outlet hood 405.

[0047] During operation, the cooling assembly 400 provides continuous and stable cooling to the inductor under test through a combination of semiconductor refrigeration and airflow circulation. When the semiconductor refrigeration chip 401 is running, its cooling end rapidly cools down and transfers the cold energy to the first heat exchange fin 402, while the heat generated at the heating end is transferred to the second heat exchange fin 403. The fan 411 then draws air into the air inlet shroud 404, where the airflow is cooled as it passes over the first heat exchange fin 402, forming a low-temperature cooling airflow. This low-temperature cooling airflow is delivered to the adapter 408 through the blower duct 406 on the air inlet shroud 404, and after passing through the air inlet channel 409 of the adapter 408, it connects with the air inlet duct 304 of the fixture assembly 300 and enters the heat dissipation cavity. After absorbing the heat from the inductor in the heat dissipation cavity, the cooling air flows back from the outlet duct 305 of the clamp assembly 300 to the outlet channel 410 of the adapter 408, and then enters the outlet shroud 405 through the return air duct 407. When it flows through the second heat exchange fins 403, it releases heat.

[0048] The thermoelectric cooler 401 features a rapid cooling response. Combined with the expanded heat exchange area of ​​the first heat exchange fin 402, it quickly generates low-temperature cooling air, allowing for precise temperature control and meeting the heat dissipation requirements of high-current testing. The second heat exchange fin 403 specifically diverts heat from the heating end of the thermoelectric cooler 401, preventing heat backflow from affecting the cooling effect and ensuring stable cooling air temperature. The blower duct 406, return duct 407, adapter 408, inlet shroud 404, and outlet shroud 405 are all fixedly sealed. The adapter 408 precisely connects to the inlet duct 304 and outlet duct 305 of the clamp assembly 300 to prevent cooling air leakage and ensure cooling efficiency. The protective mesh 412 effectively blocks dust and debris from entering the assembly, protecting core components such as the thermoelectric cooler 401 and fan 411, extending their service life. The entire assembly is integrated inside the mounting base 101, with a compact layout that does not interfere with the operation of other components.

[0049] This application provides continuous cooling air through a closed-loop airflow circulation design. Combined with the station switching of the indexing rotary component 200, it can quickly connect and cool each fixture component 300 entering the test station, supporting batch continuous testing of tooling.

[0050] Please refer to the above as well. Figures 1 to 11 In one specific embodiment of this application, the lifting assembly 500 includes a first telescopic member 501, which is fixedly installed on the top of the support frame 102. A fixed sleeve 502 is fixedly installed at one end of the telescopic rod of the first telescopic member 501 that passes through the support frame 102. A connecting frame 503 is fixedly connected to the fixed sleeve 502. A detection assembly 600 is fixedly installed on the bottom surface of the connecting frame 503. Two symmetrically arranged guide rods 504 are fixedly connected to the top of the connecting frame 503 near its two ends. A guide sleeve 505 is fixedly installed on the support frame 102 corresponding to the guide rods 504. The guide rods 504 are slidably connected to the guide sleeves 505.

[0051] During operation, the lifting assembly 500 achieves smooth and precise lifting of the detection assembly 600 through a combination of power drive and guide limit. When the first telescopic component 501 is activated, its telescopic rod performs a linear telescopic movement, which drives the fixed sleeve 502 fixedly connected at the bottom to move up and down synchronously. The fixed sleeve 502 drives the connecting frame 503 fixedly connected to it to move up and down, and the detection assembly 600 on the bottom surface of the connecting frame 503 rises and falls together, completing the docking or separation with the clamp assembly 300 below. When the connecting frame 503 is raised and lowered, its two symmetrical guide rods 504 at the top slide along the guide sleeves 505 on the support frame 102, limiting the lateral displacement of the connecting frame 503 and ensuring that the direction of movement is always vertical.

[0052] The sliding fit between the guide rod 504 and the guide sleeve 505 forms a double guiding constraint, preventing the connecting frame 503 from tilting or shifting during lifting and ensuring precise docking between the detection component 600 and the clamping component 300. Simultaneously, the two symmetrically arranged guide rods 504 evenly distribute the force on the connecting frame 503, reducing the off-center load pressure on the telescopic rod of the first telescopic component 501, minimizing operational vibration, and extending the component's service life. The fixed sleeve 502 is rigidly connected to the connecting frame 503, ensuring direct and lossless power transmission, preventing loosening or displacement during lifting and ensuring timely response of the detection component 600. Furthermore, the entire component is integrated into the support frame 102, and the compact fit between the guide rod 504 and the guide sleeve 505 does not occupy additional space or interfere with the operation of other components such as the indexing rotation component 200 and the cooling component 400.

[0053] Please refer to the above as well. Figures 1 to 11 In one specific embodiment of this application, the detection component 600 includes a base 601, which is fixedly mounted on the connecting frame 503 in the lifting component 500. A first mounting cavity 602 is centrally located at the bottom of the base 601. At least two second mounting cavities 603 are opened on the outer side of the first mounting cavity 602 corresponding to the pin of the inductor under test. A temperature sensor 604 connected to an external detection device is fixedly mounted inside the first mounting cavity 602 corresponding to the housing of the inductor under test. An elastic element 605 is abutting between the temperature sensor 604 and the inner top surface of the first mounting cavity 602. A set of probe arrays 606 connected to an external detection device is fixedly mounted inside each of the second mounting cavities 603. Each set of probe arrays 606 corresponds to a pin of the inductor under test.

[0054] During operation, the detection component 600, through precise alignment and multi-parameter synchronous detection, achieves simultaneous acquisition of inductor temperature and electrical performance. When the detection component 600 descends with the connecting frame 503 of the lifting component 500, the first mounting cavity 602 at the bottom of the base 601 aligns with the housing of the inductor under test, and the second mounting cavity 603 aligns with the inductor's pins. Under the elastic force of the elastic element 605, the temperature sensor 604 is tightly fitted to the inductor housing, acquiring temperature data in real time and transmitting it to external testing equipment. The probe array 606 within the second mounting cavity 603 makes precise contact with the inductor's pins, forming a conductive circuit and transmitting the inductor's current, voltage, and other electrical parameters to the external testing equipment, completing the high-current test.

[0055] The temperature sensor 604 and probe array 606 respectively detect temperature and electrical performance, eliminating the need for step-by-step testing, thus improving detection efficiency. They also simultaneously acquire electrical parameters at high temperatures, providing more comprehensive data. The elastic element 605 ensures a tight fit between the temperature sensor 604 and the inductor housing, reducing temperature measurement errors. The probe array 606 makes multi-point contact with the pins, ensuring stable conductivity and preventing test data deviations caused by poor contact.

[0056] Please refer to the above as well. Figures 1 to 11 In some specific embodiments of this application, the elastic element 605 can be configured as a spring or an elastic rubber column or other part with elastic deformation to ensure that the temperature sensor 604 fits tightly with the inductor housing and reduce temperature measurement error.

[0057] Please refer to the above as well. Figures 1 to 11 In one specific embodiment of this application, the probe array 606 includes an adapter post 6061, which integrates a four-wire Kelvin test circuit. The end of the adapter post 6061 is conductively connected to a plurality of parallel-connected elastic conductive probes 6062. The four-wire Kelvin test circuit includes a current transmission branch 6063 and a voltage detection branch 6064, which are connected to external testing equipment.

[0058] During operation, the probe array 606, through a design combining elastic contact and dual-wire separation testing, enables high-precision acquisition of inductor electrical parameters. As the probe array 606 descends with the detection component 600, several parallel elastic conductive probes 6062 at the end of the adapter post 6061 elastically contact the pins of the inductor under test under pressure, forming a stable conductive contact. External testing equipment delivers the large current required for testing to the inductor pins through the current transmission branch 6063 in the four-wire Kelvin test circuit, meeting the power supply requirements for high-current testing. Simultaneously, the voltage detection branch 6064 of the four-wire Kelvin test circuit independently acquires the voltage signal across the inductor pins, avoiding voltage drop interference from the current transmission branch 6063. Based on the current data from the current transmission branch 6063 and the voltage data from the voltage detection branch 6064, the external testing equipment accurately calculates the inductor's core electrical parameters, such as resistance and inductance.

[0059] The four-wire Kelvin test circuit separates the current transmission and voltage detection branches, completely eliminating measurement errors caused by the contact resistance between the flexible conductive probe 6062 and the pins, meeting high-precision testing requirements. Multiple parallel flexible conductive probes 6062 increase the contact area, and their flexible design can adapt to minute pin deformations, avoiding signal interruptions caused by single-point contact and ensuring stable high-current transmission. The flexible contact method of the flexible conductive probe 6062 also buffers the impact force during connection, preventing hard contact damage to inductor pins and reducing device losses during testing.

[0060] Please refer to the above as well. Figures 1 to 11 In one specific embodiment of this application, the gripping assembly 700 includes a horizontally arranged slide rail 701, which is fixedly installed on the bottom surface of the top of the support frame 102. A sliding frame 702 is slidably connected to the slide rail 701. A second telescopic member 703, which is arranged along the length direction of the slide rail 701, is fixedly installed on the bottom surface of the top of the support frame 102 corresponding to the sliding frame 702. The telescopic end of the second telescopic member 703 is fixedly connected to the sliding frame 702. A vertically arranged third telescopic member 704 is fixedly installed on the sliding frame 702. A connecting seat 705 is fixedly installed on the telescopic end of the third telescopic member 704. A pneumatic finger 706 for gripping the inductor under test is fixedly installed on the connecting seat 705.

[0061] During operation, the gripping assembly 700 achieves automated pick-and-place of the inductor under test through a combination of three-dimensional movements: horizontal movement, vertical lifting, and precise gripping. When the second telescopic component 703 is activated, its telescopic end pushes and pulls the sliding frame 702 horizontally along the slide rail 701, causing the third telescopic component 704, connecting seat 705, and pneumatic finger 706 on the sliding frame 702 to move synchronously until the pneumatic finger 706 aligns with the target gripper assembly 300 on the indexing plate 207. Then, the third telescopic component 704 drives the connecting seat 705 and pneumatic finger 706 to extend downwards, allowing the pneumatic finger 706 to reach the gripping height matching the inductor. The pneumatic finger 706 opens to wrap around the inductor and then closes to clamp it. The third telescopic component 704 retracts, causing the inductor to rise, and the second telescopic component 703 reverses its movement, pushing the sliding frame 702 above the sorting and storage assembly 800. The pneumatic finger 706 then opens to release the inductor, completing the pick-and-place transfer.

[0062] The sliding engagement between the slide rail 701 and the sliding frame 702 ensures smooth horizontal movement without deviation. The third telescopic component 704 precisely controls the vertical lifting stroke, allowing the pneumatic fingers 706 to accurately align with the inductor and prevent misalignment. The gripping force of the pneumatic fingers 706 is controllable, adaptable to inductors of different sizes, ensuring a secure grip without slippage while avoiding damage from excessive force. The overall movement is driven by the telescopic components, providing stable power and eliminating the errors associated with manual operation. The independent design of horizontal movement and vertical lifting allows for flexible adjustment of the pick-and-place position, accommodating the positional differences between the clamping assembly 300 and the classification storage assembly 800, and supporting various workstation layouts.

[0063] Please refer to the above as well. Figures 1 to 11 In one specific embodiment of this application, the classification and storage component 800 includes a collection rack 801 fixedly installed on the operating platform 100. The middle part of the collection rack 801 is provided with a first collection port 802 and a second collection port 803 corresponding to the horizontal movement direction of the pneumatic finger 706 in the clamping component 700. The two ends of the collection rack 801 are respectively equipped with a detachable first collection frame 804 and a second collection frame 805 corresponding to the first collection port 802 and the second collection port 803. The first collection port 802 is connected to the first collection frame 804, and the second collection port 803 is connected to the second collection frame 805.

[0064] During operation, the classification and storage component 800, through its directional docking and zoned collection design, enables automated classification and storage of inductors after testing. The collection rack 801 is fixed to the operating platform 100, with its first collection port 802 and second collection port 803 positioned along the horizontal movement direction of the pneumatic fingers 706 in the gripping component 700, ensuring that the pneumatic fingers 706 can accurately move to either collection port. During placement, based on the test results from the external testing equipment, the gripping component 700 is controlled to move the inductor to the corresponding collection port: qualified inductors correspond to the first collection port 802, and unqualified inductors to the second collection port 803. The pneumatic fingers 706 then open to release the inductor. The inductor falls directly into the first collection frame 804 or the second collection frame 805 at either end of the collection rack 801 through either the first collection port 802 or the second collection port 803, completing the classification and storage of qualified and unqualified inductors.

[0065] The first collection port 802 and the second collection port 803 are partitioned, corresponding to two sets of collection frames, which can directly classify the samples as qualified or unqualified, adapting to the basic classification requirements of the testing process. The first collection port 802 and the second collection port 803 are arranged along the horizontal movement direction of the pneumatic finger 706, eliminating the need for additional adjustments to the motion trajectory of the gripping component 700, reducing positioning errors, and ensuring accurate placement. The first collection frame 804 and the second collection frame 805 adopt a detachable design, which can be directly removed and transported after being filled, without additional transfer steps, improving subsequent sorting efficiency. The collection rack 801 is integrated and fixed, with the collection port and the collection frame directly connected, without a complex transmission structure, making it less prone to jamming.

[0066] Please refer to the above as well. Figures 1 to 11 In one specific embodiment of this application, the first telescopic member 501, the second telescopic member 703, and the third telescopic member 704 are all configured as pneumatic telescopic cylinders, sharing a compressed air source with the pneumatic finger 706. Electrically controlled valves are provided between the first telescopic member 501, the second telescopic member 703, the third telescopic member 704, and the pneumatic finger 706 and the compressed air source. The telescopic extension and retraction of the first telescopic member 501, the second telescopic member 703, and the third telescopic member 704, as well as the opening and closing of the pneumatic finger 706, are controlled by switching the electrically controlled valves.

[0067] During operation, this setup achieves precise motion control of each pneumatic component through a coordinated mode of centralized air supply and electronically controlled valve switching. The compressed air source simultaneously provides stable air pressure to the first telescopic component 501, the second telescopic component 703, the third telescopic component 704, and the pneumatic finger 706. By controlling the on / off state and reversal of the electronically controlled valves, the air path connection between the compressed air source and the corresponding pneumatic component is controlled, enabling command transmission and valve regulation. When compressed gas enters the corresponding chamber of the first telescopic component 501, the second telescopic component 703, or the third telescopic component 704, it pushes the piston rod to extend or retract, thereby achieving the lifting and lowering of the detection component 600 and the horizontal or vertical movement of the gripping component 700, respectively. When the electronically controlled valve corresponding to the pneumatic finger 706 is activated, the compressed gas drives the gripper to open and close, completing the gripping or releasing action of the inductor.

[0068] It is understood that in other embodiments of this application, the first telescopic member 501, the second telescopic member 703, and the third telescopic member 704 may also be replaced by devices or structures such as electric telescopic rods and hydraulic cylinders that can achieve linear reciprocating movement, and the pneumatic finger 706 may also be replaced by devices such as electric grippers and hydraulic grippers that can grasp inductors.

[0069] Please refer to the above as well. Figures 1 to 11 In one specific embodiment of this application, a controller is also included. The controller is electrically connected to the drive motor 202 in the indexing rotation assembly 200, the semiconductor cooling chip 401 and fan 411 in the cooling assembly 400, the first telescopic member 501 in the lifting assembly 500, the second telescopic member 703 and the third telescopic member 704 in the clamping assembly 700, the pneumatic finger 706, and external detection equipment.

[0070] During operation, the controller, as the core control hub of the tooling, enables fully automated collaborative operation through electrical signal interaction. The controller can receive test start signals, temperature, electrical parameters, and other test data from external testing equipment in real time, as well as feedback on the operating status of each component, and process them uniformly. By sending pulse commands to the drive motor 202, the controller can precisely control the rotation angle and start / stop timing of the indexing plate 207, achieving orderly switching of the fixture assembly 300 between the testing station and the unloading station. When the fixture assembly 300 arrives at the testing station, the controller activates the first telescopic component 501 to drive the testing assembly 600 to descend and dock; simultaneously, the semiconductor cooling chip 401 and fan 411 are activated to start the cooling cycle, ensuring simultaneous cooling during the testing process.

[0071] After receiving the test results from the external testing equipment, the controller sequentially sends action commands to the second telescopic component 703, the third telescopic component 704, and the pneumatic finger 706, controlling the gripping component 700 to accurately grasp the tested inductor and place it into the corresponding first collection frame 804 or second collection frame 805. After completing a set of tests, the controller triggers the next round of station switching to achieve continuous cyclic operation; at the same time, it monitors the operating status of each component, and if abnormalities such as insufficient cooling or docking deviation occur, it immediately sends a stop command to ensure the safety of the tooling.

[0072] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A high-current testing fixture for inductors, characterized in that, The system includes an operating platform (100), on which a mounting base (101) is fixedly installed, and on which a support frame (102) is fixedly installed; an indexing rotation assembly (200) is fixedly installed on the operating platform (100) near the support frame (102), and several clamp assemblies (300) evenly distributed in a ring are fixed on the indexing rotation assembly (200); a cooling assembly (400) is installed inside the mounting base (101), and a lifting assembly (500) is fixedly installed on the support frame (102), the telescopic end of the lifting assembly (500) corresponding to a... A detection component (600) is fixedly installed on one of the clamping components (300). The cooling component (400) is sealed to the clamping component (300) corresponding to the detection component (600). A gripping component (700) is fixedly installed on the support frame (102) corresponding to another clamping component (300). The indexing rotation component (200) drives the clamping component (300) to rotate from the detection component (600) to the gripping component (700). A classification storage component (800) is fixedly installed on the mounting base (101) corresponding to the gripping component (700).

2. The high-current testing fixture for inductors according to claim 1, characterized in that: The indexing rotation assembly (200) includes a power box (201) fixedly mounted on the operating platform (100). A drive motor (202) is fixedly mounted on the power box (201). The output shaft of the drive motor (202) passes through the inside of the power box (201) and is connected to a worm shaft (203). The worm shaft (203) is rotatably connected inside the power box (201). A drive shaft (204) is rotatably connected inside the power box (201). A worm wheel (205) that meshes with the worm shaft (203) is fixedly connected to the drive shaft (204). A drive disk (206) is fixedly connected to the end of the drive shaft (204) that passes through the outside of the power box (201). An indexing disk (207) is fixedly connected to the drive disk (206). The clamp assembly (300) is fixedly mounted on the indexing disk (207).

3. The high-current testing fixture for inductors according to claim 1, characterized in that: The clamp assembly (300) includes a clamp base (301). The clamp base (301) has an internal positioning groove (302) that matches the shape of the clamping assembly (700) when holding the inductor under test. A heat sink (303) is fixedly and sealed to the outside of the clamp base (301). A heat dissipation cavity is formed between the inner wall of the heat sink (303) and the outer wall of the clamp base (301). The heat sink (303) is fixedly mounted on the indexing rotation assembly (200). The side wall of (303) is fixedly and sealed with an air inlet pipe (304) and an air outlet pipe (305) that communicate with the heat dissipation cavity. The indexing rotation assembly (200) is provided with air duct mounting holes (306) corresponding to the air inlet pipe (304) and the air outlet pipe (305). The air inlet pipe (304) and the air outlet pipe (305) are sealed and installed in the air duct mounting holes (306). The air duct mounting holes (306) can be sealed and connected to the cooling assembly (400).

4. The high-current testing fixture for inductors according to claim 1, characterized in that: The cooling assembly (400) includes a thermoelectric cooler (401), with a first heat exchange fin (402) fixedly and thermally connected to the cooling end of the thermoelectric cooler (401), and a second heat exchange fin (403) fixedly and thermally connected to the heating end of the thermoelectric cooler (401). An air inlet shroud (404) is fixedly installed on the outside of the first heat exchange fin (402), and an air outlet shroud (405) is fixedly installed on the outside of the second heat exchange fin (403). The air inlet shroud (404) and the air outlet shroud (405) are fixedly installed inside the mounting base (101), and a blower pipe (406) is fixedly and sealed to the air inlet shroud (404). A return air pipe (407) is fixedly and sealed to the air outlet hood (405). The blower pipe (406) and the return air pipe (407) are connected to an adapter (408) at one end of the side wall of the mounting base (101). An air inlet channel (409) and an air outlet channel (410) are provided on the adapter (408) corresponding to the clamp assembly (300). The air inlet channel (409) is fixedly and sealed to the blower pipe (406), and the air outlet channel (410) is fixedly and sealed to the return air pipe (407). A fan (411) is fixedly installed on the end of the air inlet hood (404) away from the blower pipe (406).

5. The high-current testing fixture for inductors according to claim 1, characterized in that: The lifting assembly (500) includes a first telescopic member (501), which is fixedly installed on the top of the support frame (102). A fixed sleeve (502) is fixedly installed on one end of the telescopic rod of the first telescopic member (501) that passes through the support frame (102). A connecting frame (503) is fixedly connected to the fixed sleeve (502). The detection assembly (600) is fixedly installed on the bottom surface of the connecting frame (503).

6. The high-current testing fixture for inductors according to claim 1, characterized in that: The detection component (600) includes a base (601), which is fixedly mounted on the lifting component (500). A first mounting cavity (602) is centrally located at the bottom of the base (601). At least two second mounting cavities (603) are opened on the outer side of the first mounting cavity (602) corresponding to the pin of the inductor under test. A temperature sensor (604) connected to an external detection device is fixedly mounted inside the first mounting cavity (602) corresponding to the housing of the inductor under test. An elastic element (605) is abutting between the temperature sensor (604) and the inner top surface of the first mounting cavity (602). A set of probe arrays (606) connected to an external detection device is fixedly mounted inside each of the second mounting cavities (603). Each set of probe arrays (606) corresponds to one pin of the inductor under test.

7. A high-current testing fixture for inductors according to claim 6, characterized in that: The probe array (606) includes an adapter post (6061), which integrates a four-wire Kelvin test circuit. The end of the adapter post (6061) is conductively connected to a plurality of parallel-connected elastic conductive probes (6062). The four-wire Kelvin test circuit includes a current transmission branch (6063) and a voltage detection branch (6064), which are connected to external testing equipment.

8. The high-current testing fixture for inductors according to claim 1, characterized in that: The gripping assembly (700) includes a horizontally arranged slide rail (701), which is fixedly installed on the bottom surface of the top of the support frame (102). A sliding frame (702) is slidably connected to the slide rail (701). A second telescopic member (703) is fixedly installed on the bottom surface of the top of the support frame (102) corresponding to the sliding frame (702) along the length direction of the slide rail (701). The telescopic end of the second telescopic member (703) is fixedly connected to the sliding frame (702). A vertically arranged third telescopic member (704) is fixedly installed on the sliding frame (702). A pneumatic finger (706) is fixedly installed on the telescopic end of the third telescopic member (704).

9. A high-current testing fixture for inductors according to claim 1, characterized in that: The sorting and storage component (800) includes a collection rack (801) fixedly installed on the operating platform (100). The middle part of the collection rack (801) is provided with a first collection port (802) and a second collection port (803) corresponding to the clamping component (700). The two ends of the collection rack (801) are respectively provided with a detachable first collection frame (804) and a second collection frame (805) corresponding to the first collection port (802) and the second collection port (803). The first collection port (802) is connected to the first collection frame (804), and the second collection port (803) is connected to the second collection frame (805).

10. A high-current testing fixture for inductors according to any one of claims 1-9, characterized in that: It also includes a controller that is electrically connected to the indexing rotation assembly (200), the cooling assembly (400), the lifting assembly (500), the clamping assembly (700), and external detection equipment.

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