Conductive position processing method, device and equipment based on parameterization and medium

Abstract

The invention relates to a parameterization-based conductive position processing method, device and equipment and a medium, and the method comprises the steps: constructing a CAD graphic model of a to-be-processed conductive position, and setting the geometric features of the conductive position as a plurality of adjustable parametric variables in the CAD graphic model; acquiring a plurality of geometrical characteristic data of the conductive position of the processed sample, and establishing a mapping matching relationship between the plurality of geometrical characteristic data and the plurality of parameter variables; calculating a dimensional deviation value between each piece of geometric feature data and a design value corresponding to each parameter variable according to the mapping matching relationship; according to the dimensional deviation value and a preset compensation rule, correcting a corresponding parameter variable in the CAD graphic model; and according to the CAD graphic model, generating an instruction file used for driving the processing equipment to execute conductive position processing, and feeding back the instruction file to the processing equipment. The problem that the manual efficiency is low in traditional conductive position machining is solved, automatic adjustment and optimization of the conductive position machining precision are achieved, and the machining yield and the debugging efficiency are improved.

Description

Technical Field

[0001] This invention relates to the field of precision machining technology, specifically to a method, apparatus, equipment, and medium for processing conductive positions based on parameterization. Background Technology

[0002] In the field of precision machining of metal parts, it is often necessary to use laser technology to remove the oxide layer on the surface of anodized metal parts to form specific laser-engraved conductive sites. Traditional machining processes often rely on pre-set CAD static models for driving the process, and then use machining equipment to process specific parts of the workpiece.

[0003] In traditional technical solutions, parametric design methods are typically introduced to improve the machining accuracy of conductive parts. These methods use preset parameter variables to control the geometry of the machining area. After sample machining is completed, technicians use measuring tools to obtain the actual dimensions of the conductive parts and manually compare them with the design values. If deviations are found, the model parameters are manually corrected based on engineering experience, and a trial production is conducted again.

[0004] However, the above-mentioned solutions still have significant limitations in the actual production of laser-engraved conductive parts. Because conductive parts have extremely high requirements for positional and contour accuracy, traditional debugging methods rely entirely on manual analysis and experience-based judgment of large amounts of discrete measurement data. This non-closed-loop adjustment process is not only inefficient, but also struggles to accurately calculate and quickly converge compensation values ​​when faced with complex geometric deviations. It often requires multiple cycles of processing, measurement, and debugging, greatly increasing production costs and the difficulty of controlling processing accuracy. Summary of the Invention

[0005] In view of the above problems, the present invention provides a parameterized conductive bit processing method, apparatus, device and medium to solve the above technical problems.

[0006] In a first aspect, the present invention provides a parameterized conductive bit processing method, comprising: Construct a CAD graphic model of the conductive part to be processed, and set the geometric features of the conductive part as multiple adjustable parameter variables in the CAD graphic model; Acquire multiple geometric feature data of the conductive potentials of the processed sample, and establish a mapping and matching relationship between the multiple geometric feature data and the multiple parameter variables; Based on the mapping and matching relationship, calculate the dimensional deviation value between each geometric feature data and the design value corresponding to each parameter variable; Based on the dimensional deviation value and the preset compensation rule, the corresponding parameter variables in the CAD graphic model are corrected; The instruction file is generated based on the CAD graphic model to drive the processing equipment to perform conductive part processing, and the instruction file is fed back to the processing equipment to process the conductive part.

[0007] Secondly, the present invention provides a parameterized conductive bit processing apparatus, comprising: The CAD parametric design module is used to construct a CAD graphic model of the conductive part to be processed, and to set the geometric features of the conductive part as multiple adjustable parameter variables in the CAD graphic model. The data interaction module is used to acquire multiple geometric feature data of the conductive potentials of the processed sample and establish a mapping and matching relationship between the multiple geometric feature data and the multiple parameter variables; The data matching and deviation calculation module is used to calculate the dimensional deviation value between each geometric feature data and the design value corresponding to each parameter variable according to the mapping matching relationship; The debugging and compensation module is used to correct the corresponding parameter variables in the CAD graphic model according to the dimensional deviation value and the preset compensation rules. The processing module is used to generate an instruction file based on the CAD graphic model to drive the processing equipment to perform conductive part processing, and to feed the instruction file back to the processing equipment to process the conductive part.

[0008] Thirdly, the present invention provides an electronic device, including a memory and a processor, wherein: The memory is used to store computer programs; The processor is used to read the program in the memory and execute the steps of the parameterized conductive bit processing method provided in the first aspect above.

[0009] Fourthly, the present invention provides a computer-readable storage medium having a readable computer program stored thereon, which, when executed by a processor, implements the steps of the parameterized conductive bit processing method provided in the first aspect above.

[0010] This invention provides a parameterized conductive bit processing method, apparatus, equipment, and medium. The parameterized conductive bit processing method constructs a CAD graphic model with adjustable parameter variables and establishes a mapping relationship with the measured geometric feature data of processed samples, realizing a digital association between the design and measurement ends. It automatically calculates the dimensional deviation between the design and measured values ​​of each geometric feature and calls preset compensation rules to specifically correct the parameter variables in the CAD model, thereby establishing a closed-loop automatic compensation mechanism driven by measured data. This invention replaces the traditional discretization mode that relies on manual experience to compare discrete data and manually adjust parameters. It solves the problems of low efficiency in manual debugging, unintuitive deviation data mapping, and inaccurate compensation value calculation in traditional laser-engraved conductive bit processing, achieving rapid convergence and automated optimization of conductive bit processing accuracy, significantly improving processing yield and debugging efficiency, and effectively reducing production costs. Attached Figure Description

[0011] Figure 1 A flowchart of a parameterized conductive bit processing method provided in an embodiment of the present invention.

[0012] Figure 2 This is a flowchart of step S100 of the parameterized conductive bit processing method provided in the embodiments of the present invention.

[0013] Figure 3 A flowchart of step S200 of the parameterized conductive bit processing method provided in an embodiment of the present invention.

[0014] Figure 4 A flowchart of step S400 of the parameterized conductive bit processing method provided in an embodiment of the present invention.

[0015] Figure 5 Another flowchart of the parameterized conductive bit processing method provided in the embodiments of the present invention.

[0016] Figure 6 This is another flowchart of a parameterized conductive bit processing method provided in an embodiment of the present invention.

[0017] Figure 7 This is a schematic diagram of a parameterized conductive bit processing device provided in an embodiment of the present invention.

[0018] Figure 8 This is a schematic diagram of an electronic device provided in an embodiment of the present invention.

[0019] Figure 9 A schematic diagram of a computer storage medium provided in an embodiment of the present invention. Detailed Implementation

[0020] To facilitate understanding of the present invention, a more complete description will be given below with reference to the accompanying drawings. Preferred embodiments of the invention are shown in the drawings. However, the invention can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a thorough and complete understanding of the disclosure of the invention.

[0021] It should be noted that when a component is said to be "fixed to" another component, it can be directly attached to the other component or there may be an intervening component. When a component is said to be "connected to" another component, it can be directly connected to the other component or there may be an intervening component.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.

[0023] This invention provides a parameterized conductive bit processing method. Figure 1 A flowchart of the parameterized conductive bit processing method provided in the embodiments of the present invention is shown below. Figure 1 As shown, the parameterized conductive bit processing method includes the following steps: S100: Construct a CAD graphic model of the conductive part to be processed, setting the geometric features of the conductive part as multiple adjustable parameter variables in the CAD graphic model. Optionally, in this step, the designer establishes a digital model of the conductive part using CAD design software. Through parametric modeling technology, the geometric features of the conductive part, such as its outline shape (e.g., circle, rectangle, or polygon), linear dimensions (e.g., length, width, diameter), and position coordinates relative to a reference, are defined as dynamically adjustable parameter variables. For example, if the conductive part is a rectangular area, its length is defined as variable L, its width as variable W, and its center coordinates as variable (X, Y). This processing method eliminates the need for subsequent redrawing; precise geometric deformation of the graphic can be driven simply by modifying the underlying parameter values.

[0024] It is understood that the embodiments of the present invention do not limit the specific software platform or modeling environment used to construct the model. CAD graphic models can be constructed based on any computer-aided design software, graphics processing plugin, or custom graphics editing tool with geometric modeling and parametric definition functions. As long as the relevant software can support mapping geometric features to editable parameter variables and can synchronously update the graphic structure according to changes in variable values, it falls within the modeling methods covered by the present invention.

[0025] S200: Acquire multiple geometric feature data of the conductive sites of the processed sample, and establish a mapping and matching relationship between these geometric feature data and multiple parameter variables. Optionally, the conductive sites of the processed sample are first detected to obtain measured data. The measured data reflects the actual processing state of the sample, such as the actual measured values ​​of each key processing point of the conductive site. Establishing a mapping and matching relationship means logically associating the actual data of the actual conductive sites with the parameter variables defined in the CAD graphic model one-to-one. For example, the measurement item marked as "Width of Area 1" in the measurement report is bound to the parameter variable W in the CAD model. Through this mapping and matching, it is possible to identify which geometric dimension in the model each measured value specifically corresponds to, thereby introducing the measurement results of the physical space into the digital design space.

[0026] It is understood that the specific means of obtaining the geometric feature data of the conductive potential of the sample does not constitute a limitation of this solution. Geometric feature data can be obtained through automated measuring equipment or manually measured and entered using measuring tools. The focus of this invention is on the mapping and processing of the acquired data, rather than the measurement action itself; therefore, any data source capable of generating data that reflects the true physical dimensions of the workpiece is applicable.

[0027] S300: Based on the mapping and matching relationship, calculate the dimensional deviation between each geometric feature data and the corresponding design value of each parameter variable. Optionally, automatically extract the design values ​​of each parameter variable from the CAD graphic model. These design values ​​are the initial values ​​set by the designer for the geometric features when designing the CAD graphic model. Compare these design values ​​with the corresponding measured geometric feature data to obtain the dimensional deviation between the two. For example, if the X-coordinate of the center point of the conductive potential designed in the CAD graphic model is 50.00 mm, while the actual measured X-coordinate of the center point is 50.05 mm, then the deviation value for this dimension is calculated to be +0.05 mm. This step quantifies the abstract measurement results into specific geometric errors, providing quantified data input for subsequent compensation calculations.

[0028] S400: Based on the dimensional deviation value and preset compensation rules, correct the corresponding parameter variables in the CAD graphic model. Optionally, the compensation rules define the logic for converting the measured deviation into the model adjustment amount. Dimensional deviations during the machining process are often affected by multiple complex variables such as equipment accuracy, environmental factors, and process characteristics. The measured deviation and the actual adjustment amount to be compensated are not simply equivalent. Therefore, by designing compensation rules, targeted weighted calculations, directional limitations, or scaling operations are performed on deviations of different natures, so that the corrected parameter variables can more scientifically offset machining errors, ensuring the accuracy and stability of the debugging process and avoiding ineffective or over-adjustment.

[0029] S500: Generates an instruction file based on the CAD graphic model to drive the machining equipment to perform conductive part machining, and feeds the instruction file back to the machining equipment to machine the conductive parts. Optionally, after the parameter variables of the CAD graphic model are corrected, the corrected CAD graphic model is converted into an instruction file (such as code or parameter configuration file) that can be recognized by the conductive part machining equipment (such as laser engraving machine, CNC machine tool, etc.). The instruction file contains updated geometric paths and position information. After feeding this file back to the machining equipment, the equipment will machine the conductive parts according to the corrected model.

[0030] The present invention provides a parameterized conductive bit processing method that constructs a CAD graphic model with adjustable parameter variables and establishes a mapping and matching relationship with the measured geometric feature data of the processed sample, thereby realizing a digital association between the design and measurement ends. This allows for the automatic calculation of the dimensional deviation between the design and measured values ​​of each geometric feature, and the invocation of preset compensation rules to specifically correct the parameter variables in the CAD model, thus establishing a closed-loop automatic compensation mechanism driven by measured data. This replaces the traditional discretization mode that relies on manual experience to compare discrete data and manually adjust parameters. It solves the problems of low efficiency in manual debugging, unintuitive deviation data mapping, and inaccurate compensation value calculation in traditional laser-engraved conductive bit processing, achieving rapid convergence and automated optimization of conductive bit processing accuracy, significantly improving processing yield and debugging efficiency, and effectively reducing production costs.

[0031] In some embodiments, Figure 2 A flowchart of step S100 of the parameterized conductive bit processing method provided in the embodiments of the present invention is shown below. Figure 2 As shown, S100: Setting the geometric features of the conductive bit as adjustable parameter variables in the CAD graphic model includes: S110: Assign a unique identifier to each shape feature, dimension feature, and position feature of the conductive part in the CAD graphic model. This identifier establishes a one-to-one correspondence between the geometric features of the conductive part and multiple parameter variables. Optionally, this step aims to identify each geometric element in the CAD graphic model. Specifically, when constructing the CAD graphic model of the conductive part, designers need to attach a unique identifier (e.g., text or numerical ID) to each element that controls the graphic changes. For example, for a conductive area with multiple chamfers, the left chamfer radius can be labeled "R_Left," and the right chamfer radius can be labeled "R_Right." For its center point coordinates, "X" and "Y" labels can be assigned respectively. In this way, the originally continuous geometric shape can be decomposed into a set of attributes with independent identifiers, ensuring that when processing massive amounts of measured data, each measurement value can accurately find its corresponding graphic feature through the label, avoiding ambiguity caused by too many features.

[0032] S120: Configure the CAD graphic model to update the shape, size, or position of conductive points based on the identification labels and their corresponding design values. Optionally, this step aims to establish a driving mechanism between the identification labels and the geometry. When a new value (design value) is assigned to a specific label (such as "Width_01") in the CAD graphic model via external input, the CAD graphic model can automatically retrieve the geometric boundaries bound to that label and adjust the span of the graphic in real time according to the change in value. For example, when the value of the label "X" is updated from 10.0 mm to 10.5 mm, the entire conductive point graphic in the CAD model will automatically translate 0.5 mm in the positive direction of the coordinate axis without manual redrawing. This configuration ensures that the CAD graphic model has high flexibility, allowing geometric features to undergo instantaneous and accurate physical deformation as parameters change.

[0033] The parameterized conductive bit processing method provided in this invention solves the problem of traditional CAD models struggling to achieve precise local control when faced with numerous and detailed debugging needs by assigning unique identifiers to geometric features and establishing a driving mechanism. It realizes the discretized management and digital driving of CAD graphic features, improving the efficiency and accuracy of model modification.

[0034] In some embodiments of the present invention, the parameterized conductive potential processing method includes multiple geometric feature data, such as multiple measurement dimension names of the sample conductive potential and multiple measurement point data corresponding to the multiple dimension names. Optionally, the measurement dimension name is an index label used to identify a specific geometric feature region of the conductive potential, and the measurement point data refers to one or more specific physical measurement values ​​collected under that dimension name. For example, for a specific border feature named "FAI_579_LE_1B", the measured data may include the coordinates of four points distributed at different locations in that region.

[0035] Figure 3 A flowchart of step S200 of the parameterized conductive bit processing method provided in the embodiments of the present invention is shown below. Figure 3 As shown, S200: Acquire multiple geometric feature data of the conductive potentials of the processed sample, and establish a mapping and matching relationship between the multiple geometric feature data and multiple parameter variables, including: S210: Obtain the measured data report of the sample conductivity potential, and extract the measurement dimension name and the corresponding measurement point data from the measured data report. Optionally, the detection results of the sample conductivity potential often exist in the form of a data report. In actual operation, the measured data report may contain a lot of auxiliary information (such as measurement time, equipment number, operator information, etc.). This step uses extraction logic to filter and obtain only the key data directly related to the geometric characteristics of the conductivity potential from the report, that is, extract the measurement dimension name and the corresponding measurement point value, and eliminate irrelevant redundant information, thereby achieving lightweight data processing and improving the efficiency of subsequent calculations.

[0036] It is understood that the embodiments of the present invention do not limit the generation method or source of the measured data report. The report can be generated by manually entering measurement results, automatically exported from automated testing equipment based on scan points, or retrieved from an electronic record in the production execution system. Regardless of the form or device by which the report is generated, as long as it contains names and values ​​that reflect the physical characteristics of the conductive potentials, it can serve as the data source for this step.

[0037] S220: Match the measured dimension names with the identifiers on the CAD graphic model. When a match is successful, associate the measured point data with the parameter variable corresponding to the identifier. Optionally, this step aims to establish a logical alignment between the CAD graphic model and the physical measurement results. Specifically, the measured dimension names extracted from the report are compared with the preset identifiers in the CAD graphic model's backend. When the names are completely identical, a successful match is determined. At this point, a mapping association is established between one or more measured point data under that name and the parameter variable bound to that identifier. This association mechanism allows the parameter variables in the CAD graphic model to perceive the measurement status of their corresponding physical entities in real time, realizing a logical connection between the design space and the measurement space without the need for manual searching and matching.

[0038] As one implementation method, in this embodiment of the invention, for the matching between the measurement dimension name and the identification label of the CAD graphic model, and the association between the measurement point data and parameter variables, the extracted measurement dimension name and measurement point data are stored in a database, and automatically compared and associated with the predefined identification label in the CAD graphic model through database query, thereby establishing and maintaining the mapping matching relationship.

[0039] In some embodiments of the parametric conductive potential processing method provided by the present invention, the preset compensation rules include adjustment direction rules and compensation ratio rules. Optionally, the adjustment direction rules are used to convert the measured deviation direction in the physical space into the correction polarity of the parameter variable in the design space, and the compensation ratio rules are used to solve the problem of how many times the adjustment amount is of the size deviation value.

[0040] Figure 4 A flowchart of step S400 of the parameterized conductive bit processing method provided in the embodiments of the present invention is shown below. Figure 4 As shown, S400: Based on the dimensional deviation value and the preset compensation rules, correct the corresponding parameter variables in the CAD graphic model, including: S410: Based on the correspondence between the measurement datum and the machining datum, determine the adjustment direction of the parameter variables. Optionally, in actual machining, the measurement datum (i.e., the measurement coordinate system) and the machining datum of the laser engraving equipment (i.e., the machining coordinate system) may be inconsistent or mirror images of each other. This step aims to establish the conversion relationship between the two to determine the logical correspondence between the positive and negative signs of the deviation value and the adjustment direction of the model parameters. For example, if the measurement result shows that the conductive position deviates positively along the Y-axis, and according to the datum correspondence, this requires reducing the corresponding position parameter in the CAD model, then the adjustment direction is determined to be negative. This ensures that the correction action accurately points in the direction of error compensation.

[0041] S420: Determine the compensation ratio of the parameter variable based on the tolerance attribute category of the geometric feature. Optionally, different geometric features of the conductive part (such as position, contour, size, etc.) have different sensitivities to machining errors. This step assigns a corresponding gain coefficient (i.e., compensation ratio) to the parameter by identifying the tolerance attribute category to which the parameter belongs (i.e., whether the parameter controls position or shape contour).

[0042] S430: Based on the adjustment direction and compensation ratio, a weighted calculation is performed on the dimensional deviation value to obtain the target compensation value. The corresponding parameter variables in the CAD graphic model are then corrected according to the target compensation value. Optionally, the target compensation value is obtained by multiplying the calculated dimensional deviation value by the corresponding compensation ratio and weighting it according to the positive or negative characteristics of the adjustment direction. For example, if the deviation is 0.1mm, the ratio is 0.8, and the direction is negative, the target compensation value is -0.08mm. This compensation value is then accumulated into the corresponding parameter variables of the CAD model, driving the model to produce the expected geometric deformation.

[0043] This invention, through the introduction of a weighted calculation mechanism combining adjustment direction and classification compensation ratio, corrects errors in laser-engraved conductive parts. By transforming complex processing experience into quantifiable calculation rules, it not only solves the problem of misjudgment of adjustment direction that may occur during the correction of CAD graphic model parameter variables, but also compensates for physical characteristic deviations that occur during processing through ratio adjustment, thereby improving the accuracy and stability of model correction.

[0044] In some embodiments of the parameterized conductive bit processing method provided by the present invention, the compensation ratio rule includes: When the tolerance attribute category of the geometric feature is positional tolerance, the compensation multiplier is set to the preset first compensation multiplier. Optionally, positional tolerance is mainly used to describe the deviation of the center position of the conductive part. During actual debugging, in order to achieve precise offsetting of positional deviation, the first compensation multiplier is called to compensate for the dimensional deviation value according to this attribute. This first compensation multiplier can be preset according to the stability of the processing equipment, for example, it can be set as a fixed empirical value, a statistical value calculated based on historical processing data, or a parameter adjusted in real time according to the current production environment, so as to flexibly adapt to the correction needs of positional offset.

[0045] When the tolerance attribute category of the geometric feature is contour, the compensation ratio is set to a preset second compensation ratio. Optionally, contour is mainly used to describe the deviation of the conductive part edge shape. Considering that the correction logic for the edge shape may differ from the correction logic for the center position, a dedicated second compensation ratio is set to handle such deviations. Similar to the first compensation ratio, this second compensation ratio is also determined based on actual process requirements. For example, it can be an empirical coefficient value measured experimentally, or a weighted coefficient calculated based on a specific algorithm, and operators are allowed to dynamically adjust it according to the processing effect during actual debugging.

[0046] In one implementation method, this embodiment of the invention sets the compensation ratio in a preset coefficient table. Specifically, this coefficient table can be a predefined set of rules, storing compensation ratio values ​​corresponding to different tolerance attribute categories. Specifically, when the tolerance attribute category is positional tolerance, the coefficient table is automatically queried and the first compensation ratio is called; when the tolerance attribute category is contour tolerance, the coefficient table is automatically queried and the second compensation ratio is called. The coefficient table can be generated based on historical processing data and process experience, or it can be adjusted according to actual production conditions.

[0047] Figure 5 Another flowchart of the parameterized conductive bit processing method provided in this embodiment of the invention is shown below. Figure 5 As shown, S300: Based on the mapping matching relationship, calculate the dimensional deviation value between each geometric feature data and the design value corresponding to each parameter variable, and also includes: S310: Determine whether the dimensional deviation values ​​exceed the preset tolerance threshold. Optionally, the tolerance threshold is a qualified fluctuation range preset based on the design standard of the conductive potential. In this step, the calculated dimensional deviation values ​​are quantitatively compared with the corresponding tolerance thresholds to automatically identify which geometric features meet the design requirements and which features still exceed the tolerance, thereby providing a basis for decision-making on whether further model correction is needed.

[0048] If the tolerance threshold is exceeded, the process returns to the following steps: Based on the dimensional deviation value and preset compensation rules, the corresponding parameter variables in the CAD drawing model are corrected. Optionally, when a dimensional deviation value is detected to be outside the tolerance range, a correction mechanism is automatically triggered.

[0049] In addition, if the tolerance threshold is exceeded, the parameter variables in the CAD graphic model that exceed the tolerance threshold should be marked so that these out-of-tolerance parameter variables can be specially visualized or logically marked (such as highlighted or marked with a specific status bit), so that engineers can monitor which parts are in error and thus achieve accurate tracking of out-of-tolerance parts in multiple iterations.

[0050] If the tolerance threshold is not exceeded, the following steps are executed: Generate an instruction file based on the CAD graphic model to drive the machining equipment to perform conductive part machining, and feed the instruction file back to the machining equipment to machine the conductive parts. Optionally, if all calculated dimensional deviations are within the allowable range of the tolerance threshold, it is determined that the current CAD graphic model has met the machining accuracy requirements. In this case, no further correction is needed, and the process proceeds directly to the instruction generation stage.

[0051] Figure 6 Another flowchart of the parameterized conductive bit processing method provided in the embodiments of the present invention is shown below. Figure 6 As shown, S500: After generating an instruction file based on the CAD graphic model to drive the machining equipment to perform conductive bit machining, and feeding the instruction file back to the machining equipment to machine the conductive bit, it also includes: S600: The conductive bits processed by the processing equipment according to the instruction file are set as the current sample conductive bits. Optionally, after each round of processing, the newly produced conductive bits are used as the latest physical sample for data feedback, replacing the old data from the previous round. Based on the new sample conductive bit data, steps S200 to S500 are executed, ensuring that the parameter variables of the CAD graphic model are optimized in each cycle based on the latest processing deviation, until the measured values ​​completely fall within the preset tolerance range. This dynamic feedback mechanism simulates the logic of multiple manual trial production adjustments, but achieves more efficient accuracy convergence through a digital closed loop.

[0052] It is understood that the parameterized conductive bit processing method provided in this embodiment of the invention can be developed and executed based on technical carriers such as computer programs, scripting languages, instruction sets, or integrated software systems. These technical carriers can be written in compiled languages ​​(such as C++, Java, etc.) or interpreted scripting languages ​​(such as Python, etc.) and run in general-purpose computers, industrial servers, or embedded controllers.

[0053] It should be noted that in actual industrial applications, due to differences in interface standards, data transmission efficiency, and CAD software API calling mechanisms of processing equipment, the steps described in this invention may not be strictly limited to the order or single logical path described in the specification during actual execution. For example, some steps may be executed in parallel, asynchronously, or automatically through preset triggers. Such adjustments to the logical timing and data processing flow made during actual operation based on system resources, hardware feedback, and external constraints should all be included within the scope of protection of this invention.

[0054] For example, as an implementation example, this invention can construct a self-developed digital processing management platform that integrates a graphical user interface (UI) and a logic processing engine. During execution, operators can directly import measured data reports of sample conductivity potentials through the UI. The platform automatically parses the data and logically calls the CAD modeling kernel. This platform transforms abstract parameter calculations into visualized model deformation debugging. This implementation method, centered on a software platform and driven by script logic for model deformation, constitutes the specific technical path of this invention's automated closed-loop system.

[0055] Based on the above-described parameterized conductive bit processing method, this invention also provides a parameterized conductive bit processing apparatus. Figure 7 This is a schematic diagram of a parameterized conductive bit processing device provided in an embodiment of the present invention, as shown below. Figure 7 As shown, the device includes: The CAD parametric design module 100 is used to construct a CAD graphic model of the conductive part to be processed, and to set the geometric features of the conductive part as multiple adjustable parameter variables in the CAD graphic model.

[0056] The data interaction module 200 is used to acquire multiple geometric feature data of the conductive potentials of the processed sample and establish a mapping and matching relationship between the multiple geometric feature data and multiple parameter variables.

[0057] The data matching and deviation calculation module 300 is used to calculate the dimensional deviation between each geometric feature data and the design value corresponding to each parameter variable based on the mapping matching relationship.

[0058] The debugging compensation module 400 is used to correct the corresponding parameter variables in the CAD graphic model according to the dimensional deviation value and the preset compensation rules.

[0059] The machining module 500 is used to generate an instruction file based on the CAD graphic model to drive the machining equipment to perform conductive bit machining, and to feed the instruction file back to the machining equipment to process the conductive bit.

[0060] For other details regarding the implementation of the above technical solution by each module in the parameterized conductive bit processing device, please refer to the description in the parameterized conductive bit processing method provided in the above-mentioned embodiments of the invention, which will not be repeated here.

[0061] Based on the above-described parameterized conductive bit processing method, this invention also provides an electronic device. Figure 8 A schematic diagram of an electronic device provided in an embodiment of the present invention, such as... Figure 8As shown, the electronic device 80 provided in this embodiment of the invention includes a processor 81 and a memory 82 coupled to the processor 81. The memory 82 stores a computer program, which, when executed by the processor 81, causes the processor 81 to perform the steps of the parameterized conductive bit processing method in the above embodiment.

[0062] For other details regarding the implementation of the above technical solution by the processor 81 in the above electronic device, please refer to the description in the parameterized conductive bit processing method provided in the above embodiments of the invention, which will not be repeated here.

[0063] The processor 81 can also be called a CPU (Central Processing Unit). The processor 81 may be an integrated circuit chip with signal processing capabilities. The processor 81 can also be a general-purpose processor, a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. The general-purpose processor can be a microprocessor, or the processor 81 can be any conventional processor.

[0064] Based on the above-described parameterized conductive bit processing method, this embodiment of the invention also provides a computer-readable storage medium 90. Figure 9 A schematic diagram of a computer storage medium provided in an embodiment of the present invention, as shown below. Figure 9 As shown, the storage medium 90 stores a readable computer program 91. This computer program 91 can be stored in the storage medium as a software product, including several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, magnetic disks or optical disks, ROM (Read-Only Memory), RAM (Random Access Memory), or terminal devices such as computers, servers, mobile phones, and tablets.

[0065] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0066] The above embodiments merely illustrate preferred implementations of the present invention, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of the invention. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these all fall within the protection scope of the present invention. Therefore, the protection scope of this invention should be determined by the appended claims.

Claims

1. A method for processing conductive bits based on parameterization, characterized in that, include: Construct a CAD graphic model of the conductive part to be processed, and set the geometric features of the conductive part as multiple adjustable parameter variables in the CAD graphic model; Acquire multiple geometric feature data of the conductive potentials of the processed sample, and establish a mapping and matching relationship between the multiple geometric feature data and the multiple parameter variables; Based on the mapping and matching relationship, calculate the dimensional deviation value between each geometric feature data and the design value corresponding to each parameter variable; Based on the dimensional deviation value and the preset compensation rule, the corresponding parameter variables in the CAD graphic model are corrected; The instruction file is generated based on the CAD graphic model to drive the processing equipment to perform conductive part processing, and the instruction file is fed back to the processing equipment to process the conductive part.

2. The parameterized conductive bit processing method according to claim 1, characterized in that, Setting the geometric features of the conductive potential as adjustable parameter variables in the CAD graphic model includes: In the CAD graphic model, a unique identifier is assigned to each shape feature, each size feature, and each position feature of the conductive part. The identifier is used to establish a one-to-one correspondence between the geometric features of the conductive part and multiple parameter variables. The CAD graphic model can be configured to update the shape, size, or position of the conductive part based on the identification label and the design value corresponding to the identification label.

3. The parameterized conductive bit processing method according to claim 2, characterized in that, The plurality of geometric feature data includes a plurality of measurement dimension names of the conductive potentials of the sample and a plurality of measurement point data corresponding to the plurality of dimension names; The step of acquiring multiple geometric feature data of the conductive potentials of the processed sample and establishing a mapping and matching relationship between the multiple geometric feature data and the multiple parameter variables includes: Obtain a measured data report of the conductive potential of the sample, and extract the measurement size name and the measurement point data corresponding to the multiple size names from the measured data report; The measurement dimension name is matched with the identification label of the CAD graphic model. When the match is successful, the measurement point data is associated with the parameter variable corresponding to the identification label.

4. The parameterized conductive bit processing method according to claim 1, characterized in that, The preset compensation rules include debugging direction rules and compensation ratio rules; The step of correcting the corresponding parameter variables in the CAD graphic model according to the dimensional deviation value and the preset compensation rule includes: Based on the correspondence between the measurement reference and the processing reference, the adjustment direction of the parameter variables is determined; The compensation ratio of the parameter variable is determined based on the tolerance attribute category of the geometric feature; Based on the debugging direction and the compensation ratio, the dimensional deviation value is weighted and calculated to obtain the target compensation value. The corresponding parameter variables in the CAD graphic model are then corrected according to the target compensation value.

5. The parameterized conductive bit processing method according to claim 4, characterized in that, The compensation ratio rules include: When the tolerance attribute category of the geometric feature is positional, the compensation ratio is set to a preset first compensation ratio. When the tolerance attribute category of the geometric feature is contour degree, the compensation ratio is set to the preset second compensation ratio.

6. The parameterized conductive bit processing method according to claim 1, characterized in that, The step of calculating the dimensional deviation value between each geometric feature data and the design value corresponding to each parameter variable based on the mapping matching relationship further includes: Determine whether the dimensional deviation value exceeds a preset tolerance threshold; If the tolerance threshold is exceeded, the following steps are performed: Based on the dimensional deviation value and the preset compensation rule, the corresponding parameter variables in the CAD graphic model are corrected; and the parameter variables in the CAD graphic model that exceed the tolerance threshold are marked. If the tolerance threshold is not exceeded, the following steps are performed: generate an instruction file based on the CAD graphic model to drive the processing equipment to perform conductive bit processing, and feed the instruction file back to the processing equipment to process the conductive bit.

7. The parameterized conductive bit processing method according to claim 1, characterized in that, After generating an instruction file based on the CAD graphic model to drive the machining equipment to perform conductive bit machining, and feeding the instruction file back to the machining equipment to machine the conductive bit, the process further includes: The conductive bits obtained by the processing equipment according to the instruction file are set as the current sample conductive bits.

8. A parameterized conductive bit processing device, characterized in that, include: The CAD parametric design module is used to construct a CAD graphic model of the conductive part to be processed, and to set the geometric features of the conductive part as multiple adjustable parameter variables in the CAD graphic model. The data interaction module is used to acquire multiple geometric feature data of the conductive potentials of the processed sample and establish a mapping and matching relationship between the multiple geometric feature data and the multiple parameter variables; The data matching and deviation calculation module is used to calculate the dimensional deviation value between each geometric feature data and the design value corresponding to each parameter variable according to the mapping matching relationship; The debugging and compensation module is used to correct the corresponding parameter variables in the CAD graphic model according to the dimensional deviation value and the preset compensation rules. The processing module is used to generate an instruction file based on the CAD graphic model to drive the processing equipment to perform conductive part processing, and to feed the instruction file back to the processing equipment to process the conductive part.

9. An electronic device, characterized in that, Includes memory and processor, wherein: The memory is used to store computer programs; The processor is used to read the computer program in the memory and execute the steps of the parameterized conductive bit processing method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, It stores a readable computer program that, when executed by a processor, implements the steps of the parameterized conductive bit processing method as described in any one of claims 1 to 7.

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