Slope-adjustable power supply automatic test method

Abstract

The invention provides a slope-adjustable power supply automatic test method, which comprises the following steps: sending a control parameter to a control unit of a power supply through an upper computer, and controlling the change of an input power supply of a tested chip based on the adjustment parameter through the control unit; controlling the input power supply to be in a boost stage; detecting whether the input power supply is boosted according to a preset boosting parameter in a boosting stage, and if so, maintaining the boosting stage for a preset time; controlling an input power supply to be in a step-down stage; and detecting whether the input power supply is subjected to voltage reduction according to a preset voltage reduction parameter in the voltage reduction stage, and if so, maintaining the voltage reduction stage for a preset time. According to the method and the device, the voltage can be adjusted to increase and decrease time in a larger range, the test efficiency can be improved, manual intervention can be reduced, misjudgment or omission possibly caused by manual operation can be effectively avoided, and the accuracy and consistency of test results are further guaranteed.

Description

Technical Field

[0001] The embodiments of this application belong to the field of testing technology, and in particular relate to an automated power supply testing method with adjustable slope. Background Technology

[0002] With the rapid development of new energy vehicles, their low-voltage electrical systems face higher requirements in terms of safety and stability. In the design and testing of electrical systems, voltage ramp-up and ramp-down testing has become a key evaluation method, primarily used to verify the system's operational stability and reliability under conditions of slow voltage changes.

[0003] The power supply voltage gradual rise and fall test simulates real-world conditions where the power supply voltage gradually rises or falls, evaluating the performance of an electrical system during these dynamic voltage changes. The technical principles of this test mainly include the following three aspects:

[0004] Voltage ramp-up principle: In practical applications, the power supply voltage may rise slowly due to factors such as battery status, charging status, or external environment. Voltage ramp-up testing simulates this scenario to examine the electrical system's response capability, functional stability, and overall reliability during the gradual increase of voltage.

[0005] Voltage sag principle: Similarly, power supply voltage may also decrease slowly due to load changes, battery discharge, or other factors. Voltage sag testing simulates this process to evaluate the system's operational stability and functional retention under continuously decreasing voltage conditions.

[0006] Stability assessment principle: By conducting system tests under various set voltage ramp-up and ramp-down conditions, the operating status and performance of the electrical system in different voltage ranges can be comprehensively analyzed, thereby providing strong data support and technical basis for system design improvement and optimization.

[0007] Existing technologies rely on the built-in slope control of the DC power supply to gradually increase and decrease the power input. The disadvantage is that the adjustable slope range and period of the power supply instrument are limited. Alternatively, the slope of the power input can be gradually increased and decreased by combining a signal generator and a DC power supply. The disadvantage is that the power supply instrument that can directly achieve the corresponding function is expensive. Alternatively, the instrument service provider can provide supporting software. The disadvantage is that the corresponding data cannot be directly recorded during the test. Summary of the Invention

[0008] To address or mitigate the technical problems in the prior art, embodiments of this application provide an automated power supply testing method with an adjustable slope, the method comprising:

[0009] The host computer sends control parameters to the power supply control unit, which then controls the changes in the input power supply of the chip under test based on the adjustment parameters.

[0010] Control the input power supply to be in the boost phase;

[0011] The system detects whether the input power supply boosts voltage according to the preset boost parameters during the boost phase. If it does, the boost phase is maintained for a preset time.

[0012] The input power supply is controlled to be in the step-down phase;

[0013] The system detects whether the input power supply is stepping down according to the preset step-down parameters during the step-down phase. If it is stepping down according to the preset step-down parameters, the step-down phase is maintained for a preset time.

[0014] As a preferred embodiment of this application, if the voltage is not boosted according to the preset boost parameters, the current change of the chip to be tested within a preset time is detected to exceed a preset value; if it exceeds the preset first preset current value, an alarm is triggered and the boost operation of the input power supply is no longer performed.

[0015] As a preferred embodiment of this application, if the voltage reduction is not performed according to the preset voltage reduction parameters, the current change of the chip under test within a preset time is detected to exceed a preset value; if it exceeds the second preset current value, an alarm is triggered and the voltage reduction operation of the input power supply is no longer performed.

[0016] As a preferred embodiment of this application, the method further includes: when the input power supply is controlled to be in the boost phase and the buck phase, recording the voltage of the input power supply at each time point, and calculating the average voltage of the input power supply in the boost phase and the buck phase.

[0017] As a preferred embodiment of this application, controlling the input power supply to be in a boost phase or a buck phase includes:

[0018] Read the current voltage of the input power supply and filter the current voltage;

[0019] Calculate the actual error between the current voltage at a certain point in time and the preset voltage value to be boosted or bucked;

[0020] If the error value is greater than the preset error value;

[0021] If the input power supply has already been used, the first adjustment control module adjusts the preset voltage value to be boosted or bucked based on the historical usage data of the input power supply so that the actual error value is within the preset error value range.

[0022] In a preferred embodiment of this application, if the input power supply is a power supply used for the first time, the second adjustment control module adjusts the preset voltage value to be boosted or bucked according to the input power supply based on empirical values, so that the actual error value is within the preset error value range.

[0023] In a preferred embodiment of this application, if the error value is less than a preset error value, the actual preset voltage value is obtained by summing the current voltage value and the preset voltage value to be boosted or bucked according to their weights.

[0024] The input power supply is boosted or bucked according to the actual preset voltage value;

[0025] Determine whether the input power supply reaches the actual preset voltage value after being boosted or bucked.

[0026] If the actual preset voltage value is reached, when the input power supply is in the boost stage, it is determined whether the current of the chip under test exceeds the first preset current value; when the input power supply is in the buck stage, it is determined whether the current of the chip under test exceeds the second preset current value.

[0027] When the input power supply is in the boost phase, if the current of the chip under test exceeds a first preset current value; when the input power supply is in the buck phase, if the current of the chip under test exceeds a second preset current value; an alarm will be triggered.

[0028] If the input power supply reaches the preset final target voltage value after being boosted or bucked, the boost or buck control of the input voltage is terminated.

[0029] In a preferred embodiment of this application, if the input power supply fails to reach the actual preset voltage value after being boosted or bucked according to the actual preset voltage value, then the current voltage value of the input power supply after being boosted or bucked according to the actual preset voltage value is multiplied by an influence factor so that the current voltage value of the input power supply after being boosted or bucked according to the actual preset voltage value can reach the actual preset voltage value.

[0030] In a preferred embodiment of this application, the influence factor is adjusted according to the performance of each input power supply.

[0031] As a preferred embodiment of this application, if the input power supply fails to reach the preset final target voltage value after being boosted or bucked, the boosting or bucking process of the input power supply continues.

[0032] Compared with existing technologies, this application provides an automated power supply testing method with adjustable slope, which can achieve adjustable rise and fall times over a wider range of voltage, adapt to various testing scenarios with a comprehensive adaptive voltage slope control algorithm, and enable independent control of multiple module channels. Furthermore, it can record voltage and current at corresponding times during the test, allowing for data backtracking and analysis. This application improves testing efficiency, reduces manual intervention, and effectively avoids misjudgments or omissions that may result from human operation, further ensuring the accuracy and consistency of test results. Attached Figure Description

[0033] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments and are used to explain this application, but do not constitute an undue limitation of this application. Some specific embodiments of this application will be described in detail below with reference to the accompanying drawings in an exemplary and non-limiting manner. The same reference numerals in the drawings designate the same or similar parts or components. Those skilled in the art should understand that these drawings are not necessarily drawn to scale. In the drawings:

[0034] Figure 1 This is a flowchart of an automated power supply testing method with adjustable slope provided in an embodiment of this application. Detailed Implementation

[0035] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are merely some, not all, of the embodiments of the present application. All other embodiments obtained by those skilled in the art based on the embodiments of the present application without creative effort should fall within the scope of protection of the present application.

[0036] like Figure 1 As shown in the figure, this application provides an automated power supply testing method with an adjustable slope, the method comprising:

[0037] Step S101: Send control parameters to the power supply control unit via the host computer, and control the input power supply of the chip under test based on the adjustment parameters.

[0038] It should be noted that the host computer provided in this application refers to the host computer software. The adjustable slope power supply automated testing method provided in this application is executed by an automated testing system, which includes a host computer, a power supply module, and the module under test. The host computer directly controls the power supply to achieve gradual rise and fall of the input power to the chip module under test. The host computer is developed based on the Python language and uses PyQt to design the interface. The host computer is connected to the control unit in the power supply module via USB, and the host computer sends the adjustment parameters to the control unit. The power supply parameters that the host computer can control include: cycle period, low-level voltage of each channel, high-level voltage, rise time, fall time, low-level hold time, high-level hold time, and rise delay between different channels. After the user inputs the above adjustment parameters into the host computer, the data is sent to the control unit. The control unit uses an adaptive voltage slope control algorithm combined with high and low level times to control the entire cycle. Furthermore, this cycle control meets the requirements for reliability tests such as temperature cycling experiments. During the calculation process, the host computer uses intelligent anomaly detection and graded protection strategies to monitor voltage and current surges and overvoltage / overcurrent conditions, further protecting the chip under test. Simultaneously, a data recording algorithm records data parameters at equal intervals and abnormal states, calculating the maximum, minimum, and average values. During measurement, if overvoltage or overcurrent is detected, the system will automatically stop and interrupt data recording. By analyzing the recorded test data, the stability and reliability of the chip under test can be accurately assessed, providing a reliable basis for product performance optimization. This mechanism significantly improves the system's automation level, greatly increasing testing efficiency, reducing manual intervention, and effectively avoiding misjudgments or omissions that may be caused by human operation, further ensuring the accuracy and consistency of test results.

[0039] Step S102: Control the input power supply to be in the boost phase;

[0040] It should be noted that after startup via the host computer, the host computer connects to the control unit in the power module via USB, initializes the power supply, and configures parameters, including output channels, output voltage, current limiting, and time. The power supply is then tested cyclically, and the input power supply is controlled to be in the boost phase. If the power supply is boost controlled, the boost phase is performed using an adaptive control algorithm.

[0041] Step S103: Detect whether the input power supply boosts voltage according to the preset boost parameters during the boost phase. If it boosts voltage according to the preset boost parameters, maintain the boost phase for a preset time.

[0042] It should be noted that if the voltage is boosted to the preset voltage according to the preset boost parameters, it will be held at a high level for a preset time.

[0043] Step S104: Control the input power supply to be in the step-down phase;

[0044] It should be noted that when the voltage is boosted to the preset voltage according to the preset boost parameters, it will be kept at a high level for a preset time before the input power supply is controlled to enter the buck phase. If the power supply is buck controlled, the buck phase is performed through an adaptive control algorithm.

[0045] Step S105: Detect whether the input power supply is stepping down according to the preset step-down parameters during the step-down phase. If it is stepping down according to the preset step-down parameters, maintain the step-down phase for a preset time.

[0046] It should be noted that if the voltage is reduced to the preset voltage according to the preset step-down parameters, the low level will be maintained for the preset time.

[0047] In a preferred embodiment of this application, controlling the input power supply to be in a boost phase or a buck phase includes:

[0048] Read the current voltage of the input power supply and filter the current voltage;

[0049] Calculate the actual error between the current voltage at a certain point in time and the preset voltage value to be boosted or bucked;

[0050] If the error value is greater than the preset error value;

[0051] If the input power supply has already been used, the first adjustment control module adjusts the preset voltage value to be boosted or bucked based on the historical usage data of the input power supply so that the actual error value is within the preset error value range.

[0052] It's important to note that the current voltage first needs to be filtered to remove or reduce unwanted fluctuations and noise components in the power supply or signal, resulting in a smoother, more stable, and cleaner voltage. Next, the current voltage at a specific time point is calculated, and then the difference between the preset boost and buck voltage values ​​and the current voltage at that time point is taken to obtain the error value. This error value is used to determine whether the preset boost or buck voltage needs adjustment. If the error value is too large, it indicates that the preset boost or buck voltage value is set incorrectly.

[0053] In a preferred embodiment of this application, if the input power supply is a power supply used for the first time, the second adjustment control module adjusts the preset voltage value to be boosted or bucked according to the input power supply based on empirical values, so that the actual error value is within the preset error value range.

[0054] It should be noted that if the input power supply is being used for the first time, the preset voltage value to be boosted or bucked needs to be adjusted based on experience so that the actual error value is within the preset error range. Therefore, when setting the preset voltage value to be boosted or bucked, it is necessary to determine whether the input power supply is being used for the first time and to call different condition control modules to adjust the preset voltage value to be boosted or bucked according to the type of input power supply.

[0055] Furthermore, if the error value is less than the preset error value, the actual preset voltage value is obtained by summing the current voltage value and the preset voltage value to be boosted or bucked according to their weights.

[0056] The input power supply is boosted or bucked according to the actual preset voltage value;

[0057] Determine whether the input power supply reaches the actual preset voltage value after being boosted or bucked.

[0058] If the actual preset voltage value is reached, when the input power supply is in the boost stage, it is determined whether the current of the chip under test exceeds the first preset current value; when the input power supply is in the buck stage, it is determined whether the current of the chip under test exceeds the second preset current value.

[0059] When the input power supply is in the boost phase, if the current of the chip under test exceeds a first preset current value; when the input power supply is in the buck phase, if the current of the chip under test exceeds a second preset current value; an alarm will be triggered.

[0060] If the input power supply reaches the preset final target voltage value after being boosted or bucked, the boost or buck control of the input voltage is terminated.

[0061] It should be noted that if the actual error between the current voltage and the preset voltage value to be boosted or bucked at a certain point in time is less than the preset error value, the current voltage value and the preset voltage value to be boosted or bucked need to be summed according to their weights to obtain the actual preset voltage value. Then, the input power supply is boosted or bucked according to the actual preset voltage value. If the actual preset voltage value is reached after boosting or bucking the input power supply, it is necessary to determine whether there are current surges or overvoltage / overcurrent conditions in the chip under test during the boost and buck phases, so as to further protect the chip under test.

[0062] Furthermore, if the input power supply fails to reach the actual preset voltage value after being boosted or bucked according to the actual preset voltage value, then the current voltage value of the input power supply after being boosted or bucked according to the actual preset voltage value is multiplied by an influence factor so that the current voltage value of the input power supply after being boosted or bucked according to the actual preset voltage value can reach the actual preset voltage value.

[0063] It should be noted that if the input power supply fails to reach the actual preset voltage value after being boosted or bucked, the actual preset voltage value needs to be adjusted according to the influencing factor. Specifically, the influencing factor is adjusted according to the performance of each input power supply.

[0064] Furthermore, if the input power supply fails to reach the preset final target voltage value after being boosted or bucked, the boosting or bucking process of the input power supply continues.

[0065] It should be noted that, since this application mainly tests the performance of the chip under test by gradually increasing or decreasing the input power supply, if the preset final target voltage value is not reached during the testing process, some performance tests of the chip under test may be incomplete. Therefore, it is necessary to continue the input power supply boosting and bucking process.

[0066] After completing steps S101 to S105, repeat the above steps cyclically to perform an automated test of the adjustable slope of the power supply boost and buck.

[0067] As a preferred embodiment of this application, if the voltage is not boosted according to the preset boost parameters, the current change of the chip to be tested within a preset time is detected to exceed a preset value; if it exceeds the preset first preset current value, an alarm is triggered and the boost operation of the input power supply is no longer performed.

[0068] It should be noted that when the host computer controls the power supply to boost the voltage, it is necessary to detect whether the chip under test exceeds the first preset current value during the boost. If it does, an alarm will be triggered to protect the chip under test.

[0069] As a preferred embodiment of this application, if the voltage reduction is not performed according to the preset voltage reduction parameters, the current change of the chip under test within a preset time is detected to exceed a preset value; if it exceeds the second preset current value, an alarm is triggered and the voltage reduction operation of the input power supply is no longer performed.

[0070] It should be noted that when the host computer controls the power supply to step down, it is necessary to detect whether the chip under test exceeds the second preset current value during the step-down process. If it does, an alarm will be triggered to protect the chip under test.

[0071] As a preferred embodiment of this application, the method further includes: when the input power supply is controlled to be in the boost phase and the buck phase, recording the voltage of the input power supply at each time point, and calculating the average voltage of the input power supply in the boost phase and the buck phase.

[0072] It should be noted that the average voltage of the input power supply during the boost and buck phases is calculated to examine the distribution law of the chip during the testing process.

[0073] This application provides an automated power supply testing method with adjustable slope. Target data is input to a host computer and sent to a control unit via USB. The control unit processes the data using an adaptive voltage slope control algorithm, and the output is sent to the chip under test via a power operational amplifier. Compared to power supplies with built-in slope control, this method can save costs per unit. This application allows for independent control of each channel, and data can be recorded during automated testing without human supervision, saving more than 50% in equipment and personnel efficiency.

[0074] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. An automated power supply testing method with adjustable slope, characterized in that, The method includes: The host computer sends control parameters to the power supply control unit, which then controls the changes in the input power supply of the chip under test based on the adjustment parameters. Control the input power supply to be in the boost phase; The system detects whether the input power supply boosts voltage according to the preset boost parameters during the boost phase. If it does, the boost phase is maintained for a preset time. The input power supply is controlled to be in the step-down phase; The system detects whether the input power supply is stepping down according to the preset step-down parameters during the step-down phase. If it is stepping down according to the preset step-down parameters, the step-down phase is maintained for a preset time.

2. The power supply automated testing method with adjustable slope as described in claim 1, characterized in that, If the voltage is not boosted according to the preset boost parameters, the current change of the chip under test within a preset time is detected to see if it exceeds a preset value; if it exceeds the first preset current value, an alarm is triggered and the boost operation of the input power supply is stopped.

3. The power supply automated testing method with adjustable slope as described in claim 1, characterized in that, If the voltage reduction is not performed according to the preset voltage reduction parameters, the current change of the chip under test within a preset time is detected to see if it exceeds a preset value; if it exceeds the second preset current value, an alarm is triggered and the voltage reduction operation of the input power supply is stopped.

4. The power supply automated testing method with adjustable slope as described in claim 1, characterized in that, The method further includes: when the input power supply is controlled to be in the boost phase and the buck phase, recording the voltage of the input power supply at each time point, and calculating the average voltage of the input power supply in the boost phase and the buck phase.

5. The power supply automated testing method with adjustable slope as described in claim 1, characterized in that, The control of the input power supply to be in the boost or buck phase includes: Read the current voltage of the input power supply and filter the current voltage; Calculate the actual error between the current voltage at a certain point in time and the preset voltage value to be boosted or bucked; If the error value is greater than the preset error value; If the input power supply has already been used, the first adjustment control module adjusts the preset voltage value to be boosted or bucked based on the historical usage data of the input power supply so that the actual error value is within the preset error value range.

6. The power supply automated testing method with adjustable slope as described in claim 5, characterized in that, If the input power supply is a power supply used for the first time, the second adjustment control module adjusts the preset voltage value to be boosted or bucked according to the input power supply based on empirical values, so that the actual error value is within the preset error value range.

7. The power supply automated testing method with adjustable slope as described in claim 5, characterized in that, If the error value is less than the preset error value, the actual preset voltage value is obtained by summing the current voltage value and the preset voltage value to be boosted or bucked according to their weights. The input power supply is boosted or bucked according to the actual preset voltage value; Determine whether the input power supply reaches the actual preset voltage value after being boosted or bucked. If the actual preset voltage value is reached, when the input power supply is in the boost stage, it is determined whether the current of the chip under test exceeds the first preset current value. When the input power supply is in the step-down phase, determine whether the current of the chip under test exceeds the second preset current value; When the input power supply is in the boost phase, if the current of the chip under test exceeds a first preset current value; when the input power supply is in the buck phase, if the current of the chip under test exceeds a second preset current value; an alarm will be triggered. If the input power supply reaches the preset final target voltage value after being boosted or bucked, the boost or buck control of the input voltage is terminated.

8. The power supply automated testing method with adjustable slope as described in claim 7, characterized in that, If the input power supply fails to reach the actual preset voltage value after being boosted or bucked according to the actual preset voltage value, then the current voltage value of the input power supply after being boosted or bucked according to the actual preset voltage value is multiplied by an influence factor so that the current voltage value of the input power supply after being boosted or bucked according to the actual preset voltage value can reach the actual preset voltage value.

9. The power supply automated testing method with adjustable slope as described in claim 8, characterized in that, The influence factor is adjusted according to the performance of each input power supply.

10. The power supply automated testing method with adjustable slope as described in claim 7, characterized in that, If the input power supply fails to reach the preset final target voltage value after being boosted or bucked, the boosting or bucking process of the input power supply will continue.

Images