Variable distance multispectral optical axis consistency spatio-temporal reference calibration method
By establishing a tilted imaging coordinate system and an optical path model, spot center extraction and pixel-angle conversion were performed, solving the problem of optical axis consistency calibration for multi-spectral optoelectronic systems under variable distance and complex environments, and realizing high-precision optical axis consistency calibration and automated judgment.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
- Filing Date
- 2026-04-17
- Publication Date
- 2026-06-26
AI Technical Summary
Existing methods for calibrating the optical axis consistency of multi-band optoelectronic systems are not accurate enough in variable distances and complex environments, and cannot adapt to different hangar space conditions. They also suffer from problems such as uncompensated tilt errors, simplified spot models, and missing index conversion links, which lead to target imaging shifts and inaccurate positioning.
By establishing a tilted imaging coordinate system and optical path model, introducing pitch and azimuth tilt angles, performing perspective projection transformation, combining distortion correction and inter-frame difference, extracting non-Gaussian spot contours, establishing pixel-angle conversion relationships, performing multi-distance weighted fusion and consistency judgment, and constructing a spatiotemporal reference parameter library.
It achieves high-precision optical axis consistency calibration within the range of 30m-80m, with pixel deviation controlled within ±0.1 pixels and angle deviation measurement accuracy better than ±0.05mrad. It adapts to non-Gaussian spot characteristics, ensuring the accuracy of calibration results and automated judgment.
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Abstract
Citation Information
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