Preparation method and application of ultra-thin glass through hole TGV
By forming an array of blind vias on a silicon wafer and performing wet oxidation vitrification, combined with hybrid bonding and thinning processes, the problems of low yield and brittle damage in existing TGV manufacturing have been solved, achieving high-precision, low-cost ultrathin TGV fabrication suitable for high-density interconnects and advanced packaging.
CN122055009APending Publication Date: 2026-05-15YONGJIANG LAB
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- YONGJIANG LAB
- Filing Date
- 2025-12-31
- Publication Date
- 2026-05-15
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Figure CN122055009A_ABST
Abstract
The invention discloses a preparation method and application of an ultra-thin glass through hole TGV, and belongs to the technical field of three-dimensional integration, MEMS devices and advanced packaging. According to the technical scheme, the front face of the silicon wafer is etched to form a high-density blind hole template, then oxidation is carried out for a long time in a wet oxygen environment, silicon around the blind holes is converted into thermal growth SiO2 in situ, then copper columns are prepared in the blind holes to form a copper / SiO2 coplanar bonding level interface, mixed bonding with Cu-Cu + SiO2-SiO2 of a butt-joint wafer is achieved, silicon is removed from the back face till copper is exposed, and finally the high-density blind hole silicon wafer is obtained. And forming the ultra-thin TGV through structure. Different from the route that holes are firstly formed in glass in the prior art, the method does not directly process ultra-thin glass, blind holes and vitrification are completed on silicon, and then metallization and bonding are performed, so that coplanarity / roughness and mass production consistency required by an ultra-thin TGV are obtained on a 8-12-inch silicon platform.
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