Method and device for characterizing quality factor frequency response characteristic of radio frequency resonator

By selecting the geometric mean of the series and parallel resonant impedances in the RF resonator as the new port reference impedance, the problem of inaccurate centering of the resonant circle in the prior art is solved, realizing efficient and accurate calculation of the quality factor frequency response characteristics, and supporting the optimization and development of RF circuits.

CN122065747APending Publication Date: 2026-05-19SEMICON TECH INNOVATION CENT(BEIJING) CORP +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SEMICON TECH INNOVATION CENT(BEIJING) CORP
Filing Date
2025-12-16
Publication Date
2026-05-19

AI Technical Summary

Technical Problem

In existing technologies, the resonant circle after centering is deviated from the center in the calculation of the quality factor frequency response characteristics of RF resonators, resulting in calculation and characterization errors and affecting the design, optimization and development of RF circuits.

Method used

By using the geometric mean of the series and parallel resonant impedances of the RF resonator as the new port reference impedance, the reflection coefficient is updated to ensure that the resonant circle is centered at the origin of the complex plane, and then the quality factor frequency response characteristics are calculated.

Benefits of technology

This method enables accurate, convenient, and efficient characterization of the quality factor and frequency response characteristics of RF resonators, reduces calculation errors, and provides a precise technical foundation for the design and development of RF circuits.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention provides a characterization method and device for a quality factor frequency response characteristic of a radio frequency resonator, and the method comprises the steps: converting an original reflection coefficient, which changes along with the angular frequency, in the radio frequency resonator into corresponding radio frequency resonator impedance, which changes along with the angular frequency, based on original port reference impedance; determining corresponding series resonance impedance and parallel resonance impedance based on the minimum value and the maximum value of the absolute value of the impedance of the radio frequency resonator in the resonant circular frequency range; taking a geometric mean value of the series resonance impedance and the parallel resonance impedance as a new port reference impedance; based on the radio frequency resonator impedance and the new port reference impedance, obtaining a new reflection coefficient which is updated under the condition of the new port reference impedance and changes along with the angular frequency; and substituting the absolute value and the phase of the updated new reflection coefficient into a quality factor calculation formula, calculating to obtain the frequency response characteristic of the quality factor changing along with the angular frequency, and completing the characterization of the quality factor frequency response characteristic of the radio frequency resonator.
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Description

Technical Field

[0001] This application relates to the field of radio frequency resonator characteristic analysis technology, and in particular to a method and apparatus for characterizing the quality factor frequency response characteristics of a radio frequency resonator. Background Technology

[0002] Radio frequency (RF) resonators are key components in building basic RF unit circuits such as RF oscillators and RF filters, and their performance directly determines the final performance of the corresponding RF circuits. Therefore, testing, characterizing, modeling, and extracting model parameters for the RF resonator's RF resonance characteristics is fundamental to the design, optimization, fabrication, and development of these devices and related RF circuits. The resonance characteristics of an RF resonator primarily depend on its impedance frequency response, especially its impedance frequency response near the resonant frequency.

[0003] In the field of radio frequency (RF), impedance is typically converted to reflection coefficient for processing, which is more convenient. RF characteristic testing actually involves directly measuring network scattering parameters (S-parameters) such as port reflection coefficient and transmission coefficient of the device under test using test instruments such as vector network analyzers. Especially for single-port RF resonators, given a port reference impedance, the frequency response characteristics of its RF reflection coefficient can be fully used to characterize its resonant characteristics.

[0004] In actual RF characteristic testing and characterization, the trajectory of the resonator's reflection coefficient as a function of frequency near the resonant frequency (including closely spaced series and parallel resonant frequencies, where the parallel resonant frequency is slightly larger than the series resonant frequency) forms a circle on the complex plane. This circle can be called the resonant circle of the resonator. Typically, the resonant circle obtained using a 50 Ω port reference impedance does not have its center coincide with the origin of the complex plane; that is, the resonant circle is not centered. To facilitate technical research and development in resonator characteristic characterization, modeling, and model parameter extraction, it is necessary to calculate and characterize the frequency response characteristics, which is the most important technical performance indicator of the resonator's resonance characteristics. This requires selecting an appropriate port reference impedance value (usually no longer 50 Ω, and may even be a complex impedance value containing both real and imaginary parts) to transform the corresponding resonant reflection coefficient resonant circle to a centered position where its center coincides with the origin of the complex plane.

[0005] However, current technology still results in a significant deviation of the resonant circle from the center when performing centering operations. This can lead to errors in the calculation and characterization of the quality factor and frequency response characteristics, which is detrimental to the design, optimization, research and development of subsequent RF circuits. Summary of the Invention

[0006] In view of this, this application provides a method and apparatus for characterizing the quality factor frequency response characteristics of a radio frequency resonator to solve at least one of the problems mentioned above.

[0007] To achieve the above objectives, this application adopts the following approach:

[0008] According to a first aspect of this application, a method for characterizing the quality factor frequency response characteristics of a radio frequency resonator is provided, the method comprising:

[0009] Based on the original port reference impedance, the original reflection coefficient in the RF resonator that varies with the angular frequency is converted into the corresponding RF resonator impedance that varies with the angular frequency.

[0010] Based on the minimum and maximum absolute values ​​of the impedance of the radio frequency resonator within the resonant circular frequency range, the corresponding series resonant impedance and parallel resonant impedance are determined respectively.

[0011] The geometric mean of the series resonant impedance and the parallel resonant impedance is used as the new port reference impedance;

[0012] Based on the RF resonator impedance and the new port reference impedance, a new reflection coefficient that varies with angular frequency is obtained under the condition of the new port reference impedance.

[0013] Substituting the absolute value and phase of the updated new reflection coefficient into the quality factor calculation formula, the frequency response characteristics of the quality factor as a function of angular frequency are calculated, thus completing the characterization of the frequency response characteristics of the quality factor of the RF resonator.

[0014] As an embodiment of this application, the method described above, based on the original port reference impedance, converts the original reflection coefficient of the RF resonator, which varies with the angular frequency, into the corresponding RF resonator impedance, which varies with the angular frequency, including:

[0015] The following formula can be used to convert the original reflection coefficient of the RF resonator, which varies with angular frequency, into the corresponding RF resonator impedance, which also varies with angular frequency:

[0016] ;

[0017] Where Z(ω) is the impedance of the RF resonator, ω is the angular frequency, Z0 is the original port reference impedance, and Γ(ω) is the original reflection coefficient.

[0018] As an embodiment of this application, the original port reference impedance in the above method is 50Ω. .

[0019] As an embodiment of this application, the method described above determines the corresponding series resonant impedance and parallel resonant impedance based on the minimum and maximum values ​​of the absolute values ​​of the impedance of the radio frequency resonator within the resonant angular frequency range, including:

[0020] The series resonant frequency is determined based on the minimum absolute value of the RF resonator impedance within the resonant circular frequency range, and the parallel resonant frequency is determined based on the maximum absolute value of the RF resonator impedance within the resonant circular frequency range.

[0021] The impedance value corresponding to the series resonant frequency is determined as the series resonant impedance, and the impedance value corresponding to the parallel resonant frequency is determined as the parallel resonant impedance.

[0022] As an embodiment of this application, the method described above uses the geometric average of the series resonant impedance and the parallel resonant impedance as the new port reference impedance, including:

[0023] The geometric mean of the series resonant impedance and the parallel resonant impedance is obtained using the following formula, and is used as the new port reference impedance:

[0024] ;

[0025] Among them, Z ref Z is the reference impedance for the new port. s For series resonant impedance, Z p It is a parallel resonant impedance.

[0026] As an embodiment of this application, the method described above, based on the RF resonator impedance and the new port reference impedance, obtains a new reflection coefficient that varies with angular frequency under the new port reference impedance condition, including:

[0027] Based on the RF resonator impedance and the new port reference impedance, the updated reflection coefficient as a function of angular frequency under the new port reference impedance condition is obtained using the following formula:

[0028] ;

[0029] Where S(ω) is the new reflection coefficient, ω is the angular frequency, Z(ω) is the impedance of the RF resonator, and Z... ref This is the reference impedance for the new port.

[0030] As an embodiment of this application, the formula for calculating the quality factor in the above method is:

[0031] ;

[0032] in φ is the quality factor, ω is the angular frequency, S(ω) is the new reflection coefficient, and φ(ω) is the phase of the new reflection coefficient.

[0033] According to a second aspect of this application, a device for characterizing the quality factor frequency response characteristics of a radio frequency resonator is provided, the device comprising:

[0034] The conversion unit is used to convert the original reflection coefficient of the RF resonator, which varies with the angular frequency, into the corresponding RF resonator impedance, which varies with the angular frequency, based on the original port reference impedance.

[0035] The resonant impedance determination unit is used to determine the corresponding series resonant impedance and parallel resonant impedance based on the minimum and maximum values ​​of the absolute values ​​of the impedance of the radio frequency resonator within the resonant circumfrequency range.

[0036] A reference impedance update unit is used to take the geometric mean of the series resonant impedance and the parallel resonant impedance as the new port reference impedance.

[0037] The reflection coefficient update unit is used to obtain a new reflection coefficient that varies with angular frequency under the condition of the new port reference impedance, based on the impedance of the radio frequency resonator and the new port reference impedance.

[0038] The frequency response characterization unit is used to substitute the absolute value and phase of the updated new reflection coefficient into the quality factor calculation formula to calculate the frequency response characteristics of the quality factor as a function of angular frequency, thus completing the characterization of the frequency response characteristics of the quality factor of the RF resonator.

[0039] As an embodiment of this application, the above-mentioned conversion unit is specifically used for:

[0040] The following formula can be used to convert the original reflection coefficient of the RF resonator, which varies with angular frequency, into the corresponding RF resonator impedance, which also varies with angular frequency:

[0041] ;

[0042] Where Z(ω) is the impedance of the RF resonator, ω is the angular frequency, Z0 is the original port reference impedance, and Γ(ω) is the original reflection coefficient.

[0043] As one embodiment of this application, the original port reference impedance is 50Ω. .

[0044] As an embodiment of this application, the above-mentioned resonant impedance determination unit is specifically used for:

[0045] The series resonant frequency is determined based on the minimum absolute value of the RF resonator impedance within the resonant circular frequency range, and the parallel resonant frequency is determined based on the maximum absolute value of the RF resonator impedance within the resonant circular frequency range.

[0046] The impedance value corresponding to the series resonant frequency is determined as the series resonant impedance, and the impedance value corresponding to the parallel resonant frequency is determined as the parallel resonant impedance.

[0047] As an embodiment of this application, the above-mentioned reference impedance update unit is specifically used for:

[0048] The geometric mean of the series resonant impedance and the parallel resonant impedance is obtained using the following formula, and is used as the new port reference impedance:

[0049] ;

[0050] Among them, Z ref Z is the reference impedance for the new port. s For series resonant impedance, Z p It is a parallel resonant impedance.

[0051] As an embodiment of this application, the above-mentioned reflection coefficient update unit is specifically used for:

[0052] Based on the RF resonator impedance and the new port reference impedance, the updated reflection coefficient as a function of angular frequency under the new port reference impedance condition is obtained using the following formula:

[0053] ;

[0054] Where S(ω) is the new reflection coefficient, ω is the angular frequency, Z(ω) is the impedance of the RF resonator, and Z... ref This is the reference impedance for the new port.

[0055] As an embodiment of this application, the above-mentioned quality factor calculation formula is as follows:

[0056] ;

[0057] Where Q(ω) is the quality factor, ω is the angular frequency, S(ω) is the new reflection coefficient, and φ(ω) is the phase of the new reflection coefficient.

[0058] According to a third aspect of this application, an electronic device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the method described above.

[0059] According to a fourth aspect of this application, a computer-readable storage medium is provided, on which a computer program is stored, which, when executed by a processor, implements the steps of the above-described method.

[0060] As can be seen from the above technical solution, the method and apparatus for characterizing the frequency response characteristics of the quality factor of a radio frequency resonator provided in this application, by selecting the geometric average of the series resonant impedance and the parallel resonant impedance as the updated port reference impedance, can theoretically and strictly guarantee the transformation of the original reflection coefficient resonant circle into a centered resonant circle whose center coincides with the origin of the complex plane. Furthermore, the transformation method is simple, efficient, and applicable to any type of resonator. Based on the centering of the resonant circle of the reflection coefficient, this application can effectively conduct accurate, convenient, efficient, and rapid calculation and characterization of the frequency response characteristics of the quality factor, which is the most important technical performance indicator of the resonator's resonance characteristics. This creates the necessary preconditions for technical research and development in areas such as characteristic characterization, modeling, and model parameter extraction of related resonators. Attached Figure Description

[0061] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. In the drawings:

[0062] Figure 1 This is a flowchart illustrating a method for characterizing the quality factor frequency response characteristics of a radio frequency resonator according to an embodiment of this application.

[0063] Figure 2 This is a schematic diagram of the reflection coefficient resonance circle and its centering process provided in the embodiments of this application;

[0064] Figure 3 This is a schematic diagram showing the frequency response characteristics of the resonator impedance as a function of frequency, provided in an embodiment of this application.

[0065] Figure 4 This is a schematic diagram of the frequency response characteristics of the resonator provided in the embodiment of this application, showing the change of the quality factor with frequency.

[0066] Figure 5 This is a schematic diagram of the structure of a characterization device for the quality factor frequency response characteristics of a radio frequency resonator provided in an embodiment of this application;

[0067] Figure 6 This is a schematic block diagram of the system configuration of the electronic device provided in the embodiments of this application. Detailed Implementation

[0068] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the embodiments of this application will be further described in detail below with reference to the accompanying drawings. Here, the illustrative embodiments and descriptions of this application are used to explain this application, but are not intended to limit this application.

[0069] As indicated in this application and claims, unless the context clearly indicates otherwise, the words "a," "an," "an," and / or "the" are not specifically singular and may include plural forms. Generally speaking, the terms "comprising" and "including" only indicate the inclusion of explicitly identified steps and elements, which do not constitute an exclusive list, and the method or apparatus may also include other steps or elements.

[0070] Furthermore, it should be noted that the use of terms such as "first" and "second" to define related concepts is merely for the purpose of distinguishing the corresponding concepts. Unless otherwise stated, these terms have no special meaning and therefore should not be construed as limiting the scope of protection of this application. In addition, although the terminology used in this application is selected from commonly known and used terms, some terms mentioned in this application's specification may have been chosen by the applicant according to his or her judgment, and their detailed meanings are explained in the relevant sections of this description. Moreover, this application should be understood not only through the actual terms used, but also through the meaning implied by each term.

[0071] Currently, existing technologies provide formulas and specific methods for calculating the quality factor frequency response characteristics of radio frequency resonators, as detailed below:

[0072] First, the formula for calculating the resonator quality factor frequency response characteristics is shown in the following equation (1):

[0073] (1)

[0074] Where Q(ω) is the quality factor, and ω is the angular frequency, the value of which is equal to the product of twice pi (π) and the frequency f. Let Γ(ω) be the magnitude of the reflection coefficient. Let Γ(ω) be the phase of the reflection coefficient.

[0075] Secondly, existing technologies also specifically emphasize that the applicable condition for the above calculation formula is the magnitude of the reflection coefficient Γ(ω). The derivative with respect to angular frequency It needs to be constant at 0 within the corresponding frequency range, that is, the magnitude of the reflection coefficient Γ(ω) within the corresponding frequency range. It is a constant that does not change with frequency. This requires that the prerequisite for using equation (1) to calculate the frequency response characteristics of the quality factor Q(ω) as a function of frequency is to first center the resonant circle of the frequency response characteristics of the reflection coefficient Γ(ω), which is the original data, on its complex plane. That is, by selecting a suitable port reference impedance value, the resonant circle of the corresponding resonator reflection coefficient is transformed into a new centered resonant circle whose center coincides with the origin of the complex plane.

[0076] Finally, after centering the original resonant circle to obtain a new centered resonant circle, the frequency response characteristics of the quality factor of the RF resonator can be characterized by calculation using the above formula (1).

[0077] However, the above-mentioned centering process in the current technology is not very effective. The resonant circle after centering will still deviate significantly from the center. Strictly speaking, the processing still does not meet the prerequisite of using formula (1) to calculate the frequency response characteristics of the quality factor of the resonator. Therefore, it will inevitably cause corresponding calculation and characterization errors to a certain extent.

[0078] For the reasons mentioned above, this application proposes a method and apparatus for characterizing the quality factor frequency response characteristics of a radio frequency resonator, so that the center of the centered resonant circle after processing can completely coincide with the origin of the complex plane, thereby making the characterization of the quality factor frequency response characteristics more accurate. Figure 1 The diagram shown is a flowchart illustrating a method for characterizing the quality factor frequency response of a radio frequency resonator according to an embodiment of this application. The method includes the following steps:

[0079] Step S101: Based on the original port reference impedance, convert the original reflection coefficient of the RF resonator, which varies with the angular frequency, into the corresponding RF resonator impedance, which varies with the angular frequency.

[0080] The original reflection coefficient in this step is the single-port S-parameter reflection coefficient Γ(ω) of the RF resonator. Its frequency response characteristics as a function of angular frequency ω exhibit a typical reflection coefficient resonance circle, specifically as follows: Figure 2 The small solid circle in the diagram is shown.

[0081] The original port reference impedance in this step is the usual port reference impedance, typically 50Ω. This step maps the unit reference impedance and reflection coefficient on the port to the impedance value at the resonator end, which facilitates subsequent impedance cascade analysis and centering.

[0082] Preferably, this step can convert the original reflection coefficient Γ(ω) into the corresponding RF resonator impedance that varies with angular frequency using the following impedance transformation formula (2):

[0083] (2)

[0084] Where Z(ω) is the impedance of the RF resonator, ω is the angular frequency, Z0 is the original port reference impedance, and Γ(ω) is the original reflection coefficient.

[0085] Step S102: Based on the minimum and maximum absolute values ​​of the impedance of the radio frequency resonator within the resonant circumfrequency range, determine the corresponding series resonant impedance and parallel resonant impedance, respectively.

[0086] Preferably, this step may further include: determining the series resonant frequency based on the minimum absolute value of the RF resonator impedance within the resonant circumfrequency range, and determining the parallel resonant frequency based on the maximum absolute value of the RF resonator impedance within the resonant circumfrequency range; determining the impedance value corresponding to the series resonant frequency as the series resonant impedance, and determining the impedance value corresponding to the parallel resonant frequency as the parallel resonant impedance.

[0087] Specifically, the absolute value of the resonator impedance obtained in step S101 is used to obtain the corresponding... With angular frequency The changing frequency response characteristics are then converted into corresponding frequency-dependent characteristics. Varying frequency response characteristics (e.g.) Figure 3 (As shown). By Figure 3 Find the corresponding resonant circumfrequency range The minimum and maximum values ​​of are used to determine the series resonant frequency of the resonator. and parallel resonant frequency Therefore, the corresponding series resonant impedance is obtained. and the parallel resonant impedance is .

[0088] Step S103: Use the geometric mean of the series resonant impedance and the parallel resonant impedance as the new port reference impedance.

[0089] The new port reference impedance here is relative to the original port reference impedance mentioned above. It is the updated port reference impedance and is used as a reference for subsequent complex plane centering. The geometric mean can maintain the balance of the amplitude and phase relationship of the impedance in the complex domain, helping to center the resonant circle to the origin of the complex plane.

[0090] Preferably, the new port reference impedance can be obtained in this step using the following formula (3):

[0091] (3)

[0092] Among them, Z ref Z is the reference impedance for the new port. s For series resonant impedance, Z p It is a parallel resonant impedance.

[0093] Step S104: Based on the RF resonator impedance and the new port reference impedance, obtain the new reflection coefficient updated with angular frequency under the new port reference impedance condition.

[0094] This step addresses the original reflection coefficient of the RF resonator. With angular frequency The raw data of the changing frequency response characteristics are processed by complex plane centering. Specifically, this is done using the resonator impedance frequency response characteristic data obtained in step S101. The new port reference impedance is obtained in step S103. The updated resonator reflection coefficient under the new port reference impedance condition is calculated according to the following equation (4). With angular frequency The changing frequency response characteristics result in a new centrally located resonant circle whose center coincides with the origin of the complex plane, specifically as follows: Figure 2 The dashed circle in the diagram is shown.

[0095] (4)

[0096] Where S(ω) is the new reflection coefficient, ω is the angular frequency, Z(ω) is the impedance of the RF resonator, and Z... ref This is the reference impedance for the new port.

[0097] Step S105: Substitute the absolute value and phase of the updated new reflection coefficient into the quality factor calculation formula to calculate the frequency response characteristics of the quality factor as a function of angular frequency, thus completing the characterization of the frequency response characteristics of the quality factor of the RF resonator.

[0098] This step utilizes the new centered resonant circle obtained above to update the new reflection coefficient of the RF resonator. absolute value and phase Substitute into formula (1) and replace respectively absolute value and phase That is, by using the following formula (5), the quality factor of the RF resonator is finally completed. With angular frequency Computational characterization of varying frequency response characteristics.

[0099] (5)

[0100] Where Q(ω) is the quality factor, ω is the angular frequency, S(ω) is the new reflection coefficient, and φ(ω) is the phase of the new reflection coefficient.

[0101] Then, the calculated characterization of the frequency response characteristics of the quality factor Q(ω) as a function of angular frequency ω can be converted into the corresponding frequency response characteristics as a function of frequency f, as follows: Figure 4 As shown.

[0102] As described above, the method for characterizing the frequency response characteristics of the quality factor of a radio frequency resonator provided in this application, by selecting the geometric mean of the series resonant impedance and the parallel resonant impedance as the updated port reference impedance, can theoretically guarantee the transformation of the original reflection coefficient resonant circle into a centered resonant circle whose center coincides with the origin of the complex plane. Furthermore, the transformation method is simple, efficient, and applicable to any type of resonator. Based on the centered processing of the resonant circle of the reflection coefficient, this application can effectively conduct accurate, convenient, efficient, and rapid computational characterization of the frequency response characteristics of the quality factor, which is the most important technical performance indicator of the resonator's resonance characteristics. This creates the necessary preconditions for technical research and development in areas such as characteristic characterization, modeling, and model parameter extraction of related resonators.

[0103] like Figure 5 The diagram shows a structural schematic of a radio frequency resonator quality factor frequency response characterization device according to an embodiment of this application. The device includes: a conversion unit 510, a resonant impedance determination unit 520, a reference impedance update unit 530, a reflection coefficient update unit 540, and a frequency response characterization unit 550, which are connected sequentially.

[0104] The conversion unit 510 is used to convert the original reflection coefficient of the RF resonator, which varies with the angular frequency, into the corresponding RF resonator impedance, which varies with the angular frequency, based on the original port reference impedance.

[0105] The resonant impedance determination unit 520 is used to determine the corresponding series resonant impedance and parallel resonant impedance based on the minimum and maximum values ​​of the absolute values ​​of the impedance of the radio frequency resonator within the resonant angular frequency range.

[0106] The reference impedance update unit 530 is used to take the geometric mean of the series resonant impedance and the parallel resonant impedance as the new port reference impedance.

[0107] The reflection coefficient update unit 540 is used to obtain a new reflection coefficient that varies with angular frequency under the new port reference impedance, based on the impedance of the radio frequency resonator and the new port reference impedance.

[0108] The frequency response characterization unit 550 is used to substitute the absolute value and phase of the updated new reflection coefficient into the quality factor calculation formula to calculate the frequency response characteristics of the quality factor as a function of angular frequency, thus completing the characterization of the frequency response characteristics of the quality factor of the RF resonator.

[0109] In one embodiment of this application, the conversion unit 510 is specifically used for:

[0110] The following formula can be used to convert the original reflection coefficient of the RF resonator, which varies with angular frequency, into the corresponding RF resonator impedance, which also varies with angular frequency:

[0111] ;

[0112] Where Z(ω) is the impedance of the RF resonator, ω is the angular frequency, Z0 is the original port reference impedance, and Γ(ω) is the original reflection coefficient.

[0113] In one embodiment of this application, the original port reference impedance is 50Ω. .

[0114] In one embodiment of this application, the resonant impedance determination unit 520 is specifically used for:

[0115] The series resonant frequency is determined based on the minimum absolute value of the RF resonator impedance within the resonant circular frequency range, and the parallel resonant frequency is determined based on the maximum absolute value of the RF resonator impedance within the resonant circular frequency range.

[0116] The impedance value corresponding to the series resonant frequency is determined as the series resonant impedance, and the impedance value corresponding to the parallel resonant frequency is determined as the parallel resonant impedance.

[0117] In one embodiment of this application, the reference impedance update unit 530 is specifically used for:

[0118] The geometric mean of the series resonant impedance and the parallel resonant impedance is obtained using the following formula, and is used as the new port reference impedance:

[0119] ;

[0120] Among them, Z ref Z is the reference impedance for the new port. s For series resonant impedance, Z p It is a parallel resonant impedance.

[0121] In one embodiment of this application, the reflection coefficient update unit 540 is specifically used for:

[0122] Based on the RF resonator impedance and the new port reference impedance, the updated reflection coefficient as a function of angular frequency under the new port reference impedance condition is obtained using the following formula:

[0123] ;

[0124] Where S(ω) is the new reflection coefficient, ω is the angular frequency, Z(ω) is the impedance of the RF resonator, and Z... ref This is the reference impedance for the new port.

[0125] In one embodiment of this application, the formula for calculating the quality factor is as follows:

[0126] ;

[0127] Where Q(ω) is the quality factor, ω is the angular frequency, S(ω) is the new reflection coefficient, and φ(ω) is the phase of the new reflection coefficient.

[0128] As described above, the characterization device for the frequency response characteristics of the RF resonator's quality factor provided in this application, by selecting the geometric average of the series resonant impedance and the parallel resonant impedance as the updated port reference impedance, can theoretically guarantee the transformation of the original reflection coefficient resonant circle into a centered resonant circle whose center coincides with the origin of the complex plane. Furthermore, the transformation method is simple, efficient, and applicable to any type of resonator. Based on the centered processing of the resonant circle of the reflection coefficient, this application can effectively conduct accurate, convenient, efficient, and rapid calculations and characterizations of the frequency response characteristics of the quality factor, which is the most important technical performance indicator of the resonator's resonance characteristics. This creates the necessary preconditions for technical research and development in areas such as characteristic characterization, modeling, and model parameter extraction of related resonators.

[0129] This application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the above-described method.

[0130] This application also provides a computer-readable storage medium storing a computer program that performs the above-described methods.

[0131] like Figure 6 As shown, the electronic device 600 may also include: a communication module 110, an input unit 120, an audio processor 130, a display 160, and a power supply 170. It is worth noting that the electronic device 600 does not necessarily need to include these components. Figure 6 All components shown; in addition, the electronic device 600 may also include Figure 6 For components not shown, please refer to existing technologies.

[0132] like Figure 6 As shown, the central processing unit 100, sometimes also referred to as a controller or operating control, may include a microprocessor or other processor device and / or logic device. The central processing unit 100 receives inputs and controls the operation of various components of the electronic device 600.

[0133] The memory 140 may be, for example, one or more of a cache, flash memory, hard drive, removable media, volatile memory, non-volatile memory, or other suitable devices. It may store the aforementioned failure-related information, and also store a program for executing that information. The central processing unit 100 may execute the program stored in the memory 140 to perform information storage or processing, etc.

[0134] Input unit 120 provides input to central processing unit 100. Input unit 120 may be, for example, a keypad or touch input device. Power supply 170 provides power to electronic device 600. Display 160 displays images and text. Display may be, for example, an LCD display, but is not limited thereto.

[0135] The memory 140 can be a solid-state memory, such as a read-only memory (ROM), random access memory (RAM), a SIM card, etc. It can also be a memory that retains information even when power is off, can be selectively erased, and contains more data; examples of this type of memory are sometimes referred to as EPROMs. The memory 140 can also be some other type of device. The memory 140 includes a buffer memory 141 (sometimes referred to as a buffer). The memory 140 may include an application / function storage unit 142 for storing application programs and function programs or processes for executing the operation of the electronic device 600 via the central processing unit 100.

[0136] The memory 140 may also include a data storage unit 143 for storing data, such as contacts, digital data, pictures, sounds, and / or any other data used by the electronic device. The driver storage unit 144 of the memory 140 may include various drivers for the electronic device for communication functions and / or for performing other functions of the electronic device (such as messaging applications, address book applications, etc.).

[0137] The communication module 110 is a transmitter / receiver that transmits and receives signals via the antenna 111. The communication module 110 (transmitter / receiver) is coupled to the central processing unit 100 to provide input signals and receive output signals, which can be the same as in a conventional mobile communication terminal.

[0138] Based on different communication technologies, multiple communication modules 110 can be configured in the same electronic device, such as cellular network modules, Bluetooth modules, and / or wireless LAN modules. The communication module 110 (transmitter / receiver) is also coupled to a speaker 131 and a microphone 132 via an audio processor 130 to provide audio output via the speaker 131 and receive audio input from the microphone 132, thereby enabling typical telecommunications functions. The audio processor 130 may include any suitable buffer, decoder, amplifier, etc. Additionally, the audio processor 130 is coupled to a central processing unit 100, enabling on-device recording via the microphone 132 and on-device playback of stored audio via the speaker 131.

[0139] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0140] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0141] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0142] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0143] This application uses specific embodiments to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A method for characterizing the quality factor frequency response characteristics of a radio frequency resonator, characterized in that, The method includes: Based on the original port reference impedance, the original reflection coefficient in the RF resonator that varies with the angular frequency is converted into the corresponding RF resonator impedance that varies with the angular frequency. Based on the minimum and maximum absolute values ​​of the impedance of the radio frequency resonator within the resonant circular frequency range, the corresponding series resonant impedance and parallel resonant impedance are determined respectively. The geometric mean of the series resonant impedance and the parallel resonant impedance is used as the new port reference impedance; Based on the RF resonator impedance and the new port reference impedance, a new reflection coefficient that varies with angular frequency is obtained under the condition of the new port reference impedance. Substituting the absolute value and phase of the updated new reflection coefficient into the quality factor calculation formula, the frequency response characteristics of the quality factor as a function of angular frequency are calculated, thus completing the characterization of the frequency response characteristics of the quality factor of the RF resonator.

2. The method for characterizing the quality factor frequency response characteristics of a radio frequency resonator as described in claim 1, characterized in that, The process of converting the original reflection coefficient of the RF resonator, which varies with angular frequency, into the corresponding RF resonator impedance, based on the original port reference impedance, includes: The following formula can be used to convert the original reflection coefficient of the RF resonator, which varies with angular frequency, into the corresponding RF resonator impedance, which also varies with angular frequency: ; Where Z(ω) is the impedance of the RF resonator, ω is the angular frequency, Z0 is the original port reference impedance, and Γ(ω) is the original reflection coefficient.

3. The method for characterizing the quality factor frequency response characteristics of a radio frequency resonator as described in claim 2, characterized in that, The original port reference impedance is 50Ω. .

4. The method for characterizing the quality factor frequency response characteristics of a radio frequency resonator as described in claim 1, characterized in that, The series resonant impedance and parallel resonant impedance are determined based on the minimum and maximum values ​​of the absolute value of the RF resonator impedance within the resonant circumfrequency range, respectively, including: The series resonant frequency is determined based on the minimum absolute value of the RF resonator impedance within the resonant circular frequency range, and the parallel resonant frequency is determined based on the maximum absolute value of the RF resonator impedance within the resonant circular frequency range. The impedance value corresponding to the series resonant frequency is determined as the series resonant impedance, and the impedance value corresponding to the parallel resonant frequency is determined as the parallel resonant impedance.

5. The method for characterizing the quality factor frequency response characteristics of a radio frequency resonator as described in claim 1, characterized in that, The step of using the geometric mean of the series resonant impedance and the parallel resonant impedance as the new port reference impedance includes: The geometric mean of the series resonant impedance and the parallel resonant impedance is obtained using the following formula, and is used as the new port reference impedance: ; Among them, Z ref Z is the reference impedance for the new port. s For series resonant impedance, Z p It is a parallel resonant impedance.

6. The method for characterizing the quality factor frequency response characteristics of a radio frequency resonator as described in claim 1, characterized in that, The process of obtaining the updated reflection coefficient as a function of angular frequency based on the RF resonator impedance and the new port reference impedance includes: Based on the RF resonator impedance and the new port reference impedance, the updated reflection coefficient as a function of angular frequency under the new port reference impedance condition is obtained using the following formula: ; Where S(ω) is the new reflection coefficient, ω is the angular frequency, Z(ω) is the impedance of the RF resonator, and Z... ref This is the reference impedance for the new port.

7. The method for characterizing the quality factor frequency response characteristics of a radio frequency resonator as described in claim 1, characterized in that, The formula for calculating the quality factor is: ; in φ is the quality factor, ω is the angular frequency, S(ω) is the new reflection coefficient, and φ(ω) is the phase of the new reflection coefficient.

8. A device for characterizing the quality factor frequency response characteristics of a radio frequency resonator, characterized in that, The device includes: The conversion unit is used to convert the original reflection coefficient of the RF resonator, which varies with the angular frequency, into the corresponding RF resonator impedance, which varies with the angular frequency, based on the original port reference impedance. The resonant impedance determination unit is used to determine the corresponding series resonant impedance and parallel resonant impedance based on the minimum and maximum values ​​of the absolute values ​​of the impedance of the radio frequency resonator within the resonant circumfrequency range. A reference impedance update unit is used to take the geometric mean of the series resonant impedance and the parallel resonant impedance as the new port reference impedance. The reflection coefficient update unit is used to obtain a new reflection coefficient that varies with angular frequency under the condition of the new port reference impedance, based on the impedance of the radio frequency resonator and the new port reference impedance. The frequency response characterization unit is used to substitute the absolute value and phase of the updated new reflection coefficient into the quality factor calculation formula to calculate the frequency response characteristics of the quality factor as a function of angular frequency, thus completing the characterization of the frequency response characteristics of the quality factor of the RF resonator.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 7.