A compensation calibration method and system for a magnetostrictive level gauge
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- XIAN JINGZHUN ELECTRON CO LTD
- Filing Date
- 2026-04-27
- Publication Date
- 2026-05-26
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
Existing magnetostrictive level gauge compensation methods are prone to overcorrection or response lag, resulting in inaccurate level measurement. In particular, when the liquid temperature changes dynamically, it is difficult to effectively distinguish and quantify interference factors such as wave velocity changes, crystal oscillator drift, and changes in the force state of the float.
By acquiring the liquid temperature and measured liquid level of the magnetostrictive level gauge at various times, deviation-liquid temperature curves for each interference dimension are constructed, segmentation points are selected and subdivision coefficients are obtained, dynamic correction is performed in combination with the liquid temperature change trend, and liquid level is weighted by comprehensively considering the influence weight of each interference factor.
It achieves high-precision compensation for liquid level measurement results under different temperature conditions, improves the accuracy and stability of liquid level measurement, and can simultaneously integrate the influence of multiple interference factors and reflect their direction and intensity.
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