Transmission electron microscopy of ion and molecule flows

By using a pulsed electron beam intersecting with a particle stream in a transmission electron microscope, the particle structure can be directly analyzed, solving the problem of complex and time-consuming sample preparation in existing technologies and achieving efficient three-dimensional structure reconstruction.

CN122095244APending Publication Date: 2026-05-26FEI CO +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-10-15
Publication Date
2026-05-26

AI Technical Summary

Technical Problem

Existing electron microscopy techniques for studying the three-dimensional structure of submicron particles involve complex and time-consuming sample preparation processes, making it difficult to obtain high-resolution three-dimensional structural information quickly and efficiently, especially for complex protein molecules.

Method used

By using a method that intersects a pulsed electron beam with a particle stream, neutral molecules or ions are directly introduced into the objective gap of a transmission electron microscope. The electron beam is then used for analysis to generate a high-resolution electron diffraction pattern. Combined with mass spectrometry, the three-dimensional structure of the particles is reconstructed.

Benefits of technology

It enables a rapid and simplified sample preparation process, and can generate high-resolution three-dimensional structural images in a short time, improving the efficiency of structural research on complex molecules such as proteins.

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Abstract

A method for analyzing a sample using an electron microscope includes: generating ions, molecules, or other particles, such as droplets, from a target sample; introducing the ions, molecules, or other particles into a vacuum cavity of a transmission electron microscope (TEM) in a direction intersecting the path of a pulsed electron beam; recording an electron diffraction pattern associated with the ions through which the pulse passes at each pulse of the electron beam; and calculating the three-dimensional (3D) structure of the ion species based on the recorded electron diffraction pattern.
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Citation Information

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