Back-illuminated ultraviolet avalanche photodiode based on delta-doping and preparation method thereof
By using a Δ-doped back-illuminated ultraviolet avalanche photodiode structure, the bottlenecks in material and structural optimization of existing ultraviolet detectors have been overcome, achieving efficient utilization of ultraviolet light and fast response, thus improving the overall performance of the detector.
Patent Information
- Application Number
- CN202610185171.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-02-09
- Publication Date
- 2026-05-29
AI Technical Summary
Existing ultraviolet detectors face material, structural, and process bottlenecks when optimizing external quantum efficiency, dark current density, response speed, and detection sensitivity. In particular, high-performance solar-blind ultraviolet detectors face insurmountable challenges in terms of optical loss, dark current noise, and response speed.
A back-illuminated ultraviolet avalanche photodiode structure based on Δ doping is adopted, including an N-type doped silicon substrate, an intrinsic multiplication region, an epitaxial P-type doped silicon layer, and a P-type boron Δ doped layer. Combined with low-temperature molecular beam epitaxy, a PIN junction structure is formed. The P-type boron Δ doped layer is used to achieve surface passivation and local electric field, thereby optimizing carrier collection and avalanche gain.
It significantly improves the effective injection of ultraviolet light, reduces surface dark current, and achieves a comprehensive performance of high external quantum efficiency, low noise, fast response and high gain, meeting the requirements of high-sensitivity detection.
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Figure CN122121287A_ABST