Correction method and system of laser system, electronic equipment and storage medium

Abstract

This application discloses a laser system calibration method, system, electronic device, and storage medium, relating to the field of laser control technology. This application divides the scanning area into multiple local regions and calculates specific calibration parameters for each local region. When a target irradiation position exists within a local region, the calibration parameters for that local region are used to calibrate the laser system when irradiating the target irradiation position, ensuring that the laser accurately irradiates the target irradiation position. Because this application calculates different calibration parameters for different local regions within the scanning area and specifically corrects the theoretical attitude of the irradiation position in each local region, refining the granularity of the calibration, even under complex laser irradiation error conditions, the calibration scheme of this application can still achieve good calibration results, ensuring that the laser accurately irradiates the desired position.

Description

Technical Field

[0001] This application relates to the field of laser control technology, and in particular to a laser system calibration method, system, electronic device and storage medium. Background Technology

[0002] Fractional laser is a common treatment mode in skin laser therapy devices. It uses a galvanometer to deflect the laser beam according to the preset software logic, so that the laser is directed to a designated location within the treatment area for treatment.

[0003] Galvanometers are typically driven by a motor, and the input control voltage causes the galvanometer to deflect by a corresponding angle, thereby adjusting the laser irradiation position. However, in practical applications, due to differences in the hardware parameters of the motor drive circuit, installation errors of the galvanometer and focusing field lens, and wear and tear, the laser system may fail to accurately irradiate the desired location. Therefore, current laser systems suffer from inaccurate irradiation problems.

[0004] The above content is only used to help understand the technical solution of this application and does not represent an admission that the above content is prior art. Summary of the Invention

[0005] The main purpose of this application is to provide a calibration method, system, electronic device and storage medium for laser systems, aiming to solve the technical problem that inaccuracies may still exist after calibration by traditional calibration methods.

[0006] To achieve the above objectives, this application proposes a calibration method for a laser system. The laser system includes a galvanometer and a laser source. The laser source emits laser light, which is reflected by the galvanometer and then onto a scanning area. The scanning area is provided with multiple local regions. The calibration method for the laser system includes:

[0007] The multiple local regions are calibrated separately to obtain the correction parameters corresponding to each local region;

[0008] The laser system is calibrated based on the target correction parameters of the local area of ​​the target region where the target illumination position is located.

[0009] Optionally, the step of calibrating the plurality of local regions respectively to obtain the correction parameters corresponding to each local region includes:

[0010] For any one of the multiple local regions, the galvanometer is controlled to guide the laser emitted by the laser source to illuminate each vertex of the local region, and the actual galvanometer postures of the galvanometer when the laser illuminates each vertex are obtained.

[0011] The correction parameters for the local region are determined based on the attitude difference between the actual galvanometer attitude and the theoretical galvanometer attitude when the laser illuminates each vertex.

[0012] Optionally, the step of determining the correction parameters of the local region based on the difference between the actual galvanometer postures and the theoretical galvanometer postures when the laser illuminates each vertex includes:

[0013] For any one of the actual galvanometer poses, calculate the pose difference between the actual galvanometer pose and the corresponding theoretical galvanometer pose, wherein the actual galvanometer pose and the corresponding theoretical galvanometer pose correspond to the same vertex;

[0014] After traversing each actual galvanometer posture, the obtained posture differences are used as correction parameters for the local region.

[0015] Optionally, the step of correcting the laser system based on the target correction parameters of the local target region where the laser system corresponds to the target irradiation position includes:

[0016] Based on the positional differences between the target illumination position and each target vertex in the local target region, and the target correction parameters, calculate the compensation amount for the theoretical deflection of the galvanometer-guided laser illuminating the target illumination position;

[0017] The theoretical deflection is compensated by the compensation amount to correct the theoretical deflection.

[0018] Optionally, the type of the galvanometer is a two-dimensional galvanometer, which is used to guide the laser to move in a first direction and a second direction, wherein the first direction is perpendicular to the second direction, and the compensation amount includes a first compensation amount and a second compensation amount.

[0019] The step of calculating the compensation amount for the theoretical deflection of the galvanometer-guided laser illuminating the target irradiation position based on the positional difference between the target irradiation position and each target vertex in the local target region, and the target correction parameters, includes:

[0020] Based on the first position difference between the target illumination position and each target vertex in the first direction, and the first attitude difference in the target correction parameters in the first direction, a first compensation amount in the first direction is obtained by linear calculation.

[0021] Based on the second position difference between the target illumination position and each target vertex in the second direction, and the second attitude difference in the target correction parameters in the second direction, a second compensation amount in the second direction is obtained by linear calculation.

[0022] Optionally, the step of compensating the theoretical deflection amount with the compensation amount includes:

[0023] The first target deflection is obtained by adding the theoretical deflection amount in the first direction to the first deflection amount and the first compensation amount.

[0024] The second target deflection is obtained by adding the theoretical deflection amount in the second direction to the second compensation amount;

[0025] The galvanometer is deflected according to the first target deflection and the second target deflection to guide the laser to irradiate the target irradiation position.

[0026] Optionally, the step of controlling the galvanometer to guide the laser emitted by the laser source to illuminate each vertex of the local region includes:

[0027] For any one of the vertices, control the laser source to emit a laser beam to illuminate the scanning area and form a light spot on the scanning area, thereby acquiring a real-time image of the scanning area;

[0028] The contour pattern of the light spot in the real-time image is obtained based on the edge detection algorithm, and the coordinates of the light spot are determined by the contour pattern.

[0029] When the coordinates of the light spot are different from the coordinates of the corresponding vertex, the adjustment angle of the galvanometer is obtained based on the coordinate difference between the coordinates of the light spot and the coordinates of the corresponding vertex.

[0030] The galvanometer is deflected based on the adjusted angle, and the step of acquiring a real-time image of the scanning area is performed after the galvanometer is deflected, until the position of the light spot is the same as that of the vertex.

[0031] Furthermore, to achieve the above objectives, this application also provides a laser system, which includes a galvanometer and a laser source. The laser source emits laser light, which is reflected by the galvanometer and then onto a scanning area. The scanning area is provided with multiple local regions. The laser system includes:

[0032] The calibration module is used to calibrate the multiple local regions respectively to obtain the correction parameters corresponding to each local region;

[0033] The correction module is used to perform correction based on the target correction parameters of the local area of ​​the target corresponding to the target irradiation position of the laser system.

[0034] In addition, to achieve the above objectives, this application also proposes an electronic device, the device comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, the computer program being configured to implement the steps of the correction method for the laser system as described above.

[0035] In addition, to achieve the above objectives, this application also proposes a storage medium, which is a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, it implements the steps of the laser system calibration method as described above.

[0036] In addition, to achieve the above objectives, this application also provides a computer program product, which includes a computer program that, when executed by a processor, implements the steps of the laser system correction method described above.

[0037] One or more technical solutions proposed in this application have at least the following technical effects:

[0038] In this embodiment, the plurality of local regions are calibrated separately to obtain correction parameters corresponding to each local region; correction is then performed based on the target correction parameters of the target local region where the laser system is located corresponding to the target irradiation position. It is understood that this embodiment divides the scanning area into multiple local regions and calculates specific correction parameters for each local region. When a target irradiation position exists in a local region, the correction parameters for that local region are used to correct the laser system when irradiating the target irradiation position, ensuring that the laser accurately irradiates the target irradiation position. It is understood that because this application calculates different correction parameters for different local regions in the scanning area and specifically corrects the theoretical attitude of the irradiation position in each local region, refining the granularity of the correction, even in cases of complex laser irradiation error, the correction scheme of this application can still achieve good correction results, ensuring that the laser accurately irradiates the desired position and improving the accuracy of the laser system. Attached Figure Description

[0039] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0040] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0041] Figure 1 This is a schematic diagram of laser system illumination distortion in the laser system correction method of this application;

[0042] Figure 2 This is a schematic diagram of the laser system structure in the laser system calibration method of this application;

[0043] Figure 3 This is a flowchart illustrating the first embodiment of the laser system calibration method of this application;

[0044] Figure 4 This is a schematic diagram of the nine-grid distortion in the correction method of the laser system of this application;

[0045] Figure 5 This is a flowchart illustrating the second embodiment of the laser system calibration method of this application;

[0046] Figure 6 This is a flowchart illustrating the third embodiment of the laser system calibration method in this application;

[0047] Figure 7 This is a schematic diagram of the laser system framework in the laser system calibration method of this application;

[0048] Figure 8 This is a schematic diagram of the hardware operating environment involved in the laser system calibration method in this application embodiment.

[0049] The purpose, features, and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0050] It should be understood that the specific embodiments described herein are merely illustrative of the technical solutions of this application and are not intended to limit this application.

[0051] To better understand the technical solution of this application, a detailed description will be provided below in conjunction with the accompanying drawings and specific implementation methods.

[0052] Currently, fractional laser is a common treatment mode in skin laser therapy devices. It uses a galvanometer to deflect the laser beam according to the preset software logic, so that the laser is directed to a designated location within the treatment area for treatment.

[0053] Galvanometers are typically driven by a motor. An input control voltage causes the galvanometer to deflect by a specific angle. The mapping between this deflection angle and the coordinates of the laser beam within the treatment area is calculated using a relevant mathematical model. However, in practical applications, differences in motor drive circuit hardware parameters and installation errors in the galvanometer and focusing field lens can lead to inaccurate mapping between the motor deflection angle and the laser coordinates. This results in the laser system failing to accurately irradiate the desired location. Furthermore, since many factors can cause distortion in the mapping, the resulting pattern error can manifest in various ways. These errors may include proportional changes (errors in the actual pattern size ratio), translation (movement of the actual pattern), and barrel distortion (the actual pattern undergoes a barrel-like deformation, with the edges contracting inwards or expanding outwards, as shown in the image). Figure 1 (A1 and A2 in the image), pincushion distortion (the actual pattern undergoes a pincushion-like deformation, with one side of the pattern expanding outwards and the opposite side contracting inwards, such as...) Figure 1 A3 in the middle, etc. Figure 1 As shown, A represents the target pattern, which is the pattern that is intended to be projected by the laser. A1 to A3 represent the distorted patterns, i.e., the actual patterns projected. Currently, the traditional calibration method for laser systems is mainly a global linear calibration. However, due to the diverse forms of error, the proportion of laser error may differ when the laser is irradiated at different locations. Therefore, even after using the traditional global linear calibration method, significant errors may still exist, leading to inaccurate irradiation positions.

[0054] The main solution of this application embodiment is: to calibrate the multiple local regions respectively to obtain the correction parameters corresponding to each local region; to correct the laser system according to the target correction parameters of the target local region where the target irradiation position is located, wherein the main correction is to correct the parameters of the galvanometer in the laser system so that the laser is reflected to the accurate position after the galvanometer reflects.

[0055] This application provides a solution that divides the scanning area into multiple local regions and calculates specific correction parameters for each local region. When a target irradiation position exists within a local region, the correction parameters for that local region are used to correct the laser system's illumination of the target position, ensuring accurate laser irradiation. It is understood that because this application calculates different correction parameters for different local regions within the scanning area and specifically corrects the theoretical orientation of the irradiation position in each local region, refining the granularity of the correction, even under complex laser irradiation error conditions, this correction scheme can still achieve good correction results, ensuring accurate laser irradiation of the desired position and improving the accuracy of the laser system.

[0056] It should be noted that the executing entity in this embodiment can be a computing service device with data processing, network communication and program execution functions, such as a laser therapy device, a computer, or an electronic device capable of performing the above functions.

[0057] Based on this, embodiments of this application provide a calibration method for a laser system, referring to... Figure 2 , Figure 2This is a schematic diagram of the laser system structure in the correction method of the laser system in this application. The laser system 10 includes a galvanometer 12 and a laser source 13. The laser emitted by the laser source 13 is reflected by the galvanometer 12 and then onto the scanning area 11. It should be noted that the laser system 10 can be the aforementioned skin laser treatment device, a laser engraving machine for carving, or a laser marking machine for marking, etc. In practical applications, the laser source 13 can be a laser generator for emitting laser light, or a lens for receiving and focusing laser light. There are usually two galvanometers 12, each guiding the laser light in a different direction. Specifically, the galvanometer 12 reflects the laser light; when the laser light irradiates the galvanometer 12, the galvanometer 12 reflects the laser light to change its optical path. The scanning area 11 refers to the area of ​​effect of the laser light emitted by the laser source 13. As the angle of the galvanometer 12 changes, the corresponding laser irradiation position also changes. The scanning area 11 refers to the set of positions that the laser light can irradiate at the movable angle of the galvanometer 12. In the case where the laser system 10 is a skin laser treatment device, the scanning area 11 is aligned with the skin to be treated, i.e., the scanning area 11 corresponds to the working area. Furthermore, in this embodiment, a camera 14 is also provided in the laser system 10 to acquire images of the scanning area. The aforementioned galvanometer 12 is equivalent to a lens that can reflect laser light. The laser system can change the orientation of the galvanometer through a driving mechanism, thereby guiding the laser to irradiate different positions. The driving mechanism can be a motor or an electromagnetic drive mechanism connected to the galvanometer. For electromagnetic drive mechanisms, a magnetic material (such as a permanent magnet) is fixed on the galvanometer or its mounting structure. The electromagnetic drive mechanism changes the orientation of the galvanometer by changing the magnetic field of its environment. Additionally, the type of galvanometer can include one-dimensional and two-dimensional galvanometers. A one-dimensional galvanometer refers to a galvanometer that guides the laser to move along a single direction, such as the X-axis or Y-axis; while a two-dimensional galvanometer refers to a galvanometer that can guide the laser to move along multiple directions, such as the X-axis and Y-axis. Therefore, a two-dimensional galvanometer allows the laser to irradiate any position within the scanning area. In practical applications, a two-dimensional galvanometer can include one or more galvanometers. In the case of a single galvanometer, the first and second galvanometers in this application can be considered fused into a single galvanometer, which can deflect at two different angles, such as by being driven by the aforementioned electromagnetic drive mechanism. In the case of multiple galvanometers, different galvanometers can deflect at different angles; for example, different galvanometers can be driven to deflect by motors with different rotation directions. Therefore, calibrating the laser system essentially involves calibrating the drive mechanism to ensure that the galvanometer reflects at a specified angle, so that the reflected laser reaches the expected position.

[0058] In addition, it should be noted that the above Figure 2 This does not impose limitations on the structure of the laser system. In practical applications, the laser system 10 can include more than Figure 2The additional components shown are used to implement other functions.

[0059] Reference Figure 3 This is a flowchart illustrating the first embodiment of the laser system correction method in this application.

[0060] The laser system calibration method includes steps S10 to S30:

[0061] Step S10: Calibrate the multiple local regions respectively to obtain the correction parameters corresponding to each local region;

[0062] It should be noted that, in order to address the various error patterns that may occur when the laser system irradiates the laser, this embodiment sets or divides multiple local regions within the scanning area of ​​the laser system. Typically, these local regions can be rectangular, such as squares. The size and shape of the local calibration regions can be the same or different, ensuring that the combined local regions cover the scanning area. For example, if the scanning area is square, it can be divided into local regions using a 3x3 grid, with each small square in the grid corresponding to a local region. (See reference...) Figure 4 This is a diagram of a nine-grid distortion pattern. Regions 1 to 9 in the diagram represent nine local regions, and also include the distortion result without correction, such as... Figure 4 The image on the left is the image before distortion, and the image on the right is the image after distortion. In practical applications, the size, shape, and number of local regions can be set with reference to the above example. The smaller and more numerous the local regions are, the better the calibration effect will be.

[0063] For example, in this embodiment, the laser system will be calibrated for each local area to obtain the corresponding correction parameters for each local area. During the calibration process, the laser system can first emit a laser beam into a local area (i.e., the target location to be illuminated is located in this local area), record the actual illumination position of the laser, and then calculate the difference between the actual illumination position and the target position. The compensation parameters for the laser in that local area, i.e., the correction parameters corresponding to that local area, can be calculated from this difference. By repeating the above process, the correction parameters for each local area can be obtained.

[0064] In one feasible implementation, the step of calibrating the plurality of local regions respectively to obtain the correction parameters corresponding to each local region includes steps S11 to S12:

[0065] Step S11: For any one of the multiple local regions, control the galvanometer to guide the laser emitted by the laser source to irradiate each vertex of the local region, and obtain the actual galvanometer posture of the galvanometer when the laser irradiates each vertex.

[0066] Step S12: Determine the correction parameters for the local region based on the attitude difference between the actual galvanometer attitudes and the theoretical galvanometer attitudes when the laser illuminates each vertex.

[0067] It should be noted that since the process of obtaining correction parameters by calibrating each local area is basically similar, this embodiment will use one local area as an example for explanation.

[0068] For example, for any one of multiple local regions, the control galvanometer guides the laser emitted by the laser source to illuminate each vertex of the local region, and obtains the actual galvanometer posture when the laser illuminates each vertex. It is worth noting that since the local regions are pre-defined, the coordinates of the vertices of the local regions within the scanning area are known. The process of controlling the galvanometer to guide the laser emitted by the laser source to illuminate the vertices can be achieved by acquiring images of the scanning area in real time using the camera of the laser machine system. For example, during the calibration phase, the laser source incorporates colored light when emitting laser light, thereby forming a light spot on the scanning area to represent the laser's illumination position. This light spot will also be reflected in the acquired image. Image recognition technology is then used to identify the light spot from the image, thus obtaining the coordinates of the light spot in the scanning area. The deflection angle of the galvanometer is then controlled based on the difference between the coordinates of the light spot in the scanning area and the corresponding coordinates of the vertex, thereby gradually adjusting the light spot to the vertex position, ensuring that the laser emitted by the laser source illuminates the vertex, and recording the galvanometer posture at this time to obtain the actual galvanometer posture corresponding to that vertex. This process is repeated to illuminate each vertex, obtaining each actual galvanometer posture. Furthermore, it is worth noting that in practical applications, the laser system can also scan all local region vertices in the scanned area at once to obtain a set of actual galvanometer attitudes. When calculating the correction parameters for each local region, these can be directly obtained from the set. Taking the aforementioned 3x3 grid as an example, there are 9 local regions in the 3x3 grid, with a total of 16 vertices. All 16 vertices can be scanned at once to obtain the aforementioned set. When calculating the correction parameters for each local region, the actual galvanometer attitude of the corresponding vertex for that local region can be directly obtained from the set. Alternatively, the scanning and correction parameter calculation can be performed region by region. Since adjacent local regions may share common vertices, the scanning results of adjacent local regions can be directly reused for the actual galvanometer attitudes of common vertices when scanning region by region. Therefore, this embodiment does not limit the order or process of obtaining the actual galvanometer attitudes of each vertex; those skilled in the art can refer to the above example for configuration.

[0069] It should be noted that in practical applications of laser systems, the theoretical deflection of the galvanometer is usually calculated based on the coordinates of the position to be illuminated, and then the galvanometer is controlled to deflect according to the theoretical amount. However, due to error issues, deflecting according to the theoretical amount may not ensure that the laser accurately illuminates the vertex, thus requiring correction. In this embodiment, the theoretical galvanometer attitude when the laser illuminates each vertex is the theoretical attitude of the galvanometer calculated from the coordinates of each vertex (i.e., the theoretical deflection amount of the galvanometer). The theoretical galvanometer attitude can be calculated using a preset theoretical geometric model. For example, in one embodiment, the galvanometer is a two-dimensional galvanometer, and the calculation formula for the preset theoretical geometric model is as follows:

[0070]

[0071] In the formula, (x, y) are the coordinates in the plane corresponding to the scanning area, and (θ) are the coordinates in the plane corresponding to the scanning area. xref ,θ yref ) represents the theoretical deflection angle (i.e., the theoretical galvanometer orientation) calculated based on the geometric model when the laser moves to the position (x,y), e represents the vertical distance between the two galvanometers, and d represents the vertical distance between the galvanometer closest to the scanning plane and the scanning plane.

[0072] In practical applications, the coordinate data of the vertex in the corresponding plane coordinate system of the scanning area can be substituted into the above calculation formula of the galvanometer geometric model, and the obtained (θ) can be used to calculate the coordinates of the vertex in the plane coordinate system of the scanning area. xref ,θ yref The theoretical galvanometer pose corresponding to that vertex can be obtained.

[0073] For example, by calculating the attitude difference between the actual galvanometer attitude and the theoretical galvanometer attitude at each vertex, the correction parameters for that local region can be obtained.

[0074] In one feasible implementation, the step of determining the correction parameters of the local region based on the difference between the actual galvanometer orientation and the theoretical galvanometer orientation when the laser illuminates each vertex includes steps S21 to S22:

[0075] Step S21: For any one of the actual galvanometer poses, calculate the pose difference between the actual galvanometer pose and the corresponding theoretical galvanometer pose, wherein the actual galvanometer pose and the corresponding theoretical galvanometer pose correspond to the same vertex.

[0076] Step S22: After traversing each actual galvanometer posture, the obtained posture differences are used as correction parameters for the local region.

[0077] For example, for any actual galvanometer pose, the pose difference between the actual galvanometer pose and the corresponding theoretical galvanometer pose is calculated. It is worth noting that the corresponding theoretical galvanometer pose refers to the theoretical galvanometer pose relative to the same vertex as the actual galvanometer pose. The angle difference can be obtained by subtracting the actual galvanometer pose from the corresponding theoretical galvanometer pose, and this angle difference is the pose difference mentioned above. After traversing all actual galvanometer poses, the obtained pose differences can be used as the pose correction parameters for that local region.

[0078] In one embodiment, the aforementioned local region is assumed to be a square with four vertices, and the coordinates of the four vertices are (x1, y1), (x2, y2), (x3, y3), and (x4, y4), respectively. The theoretical galvanometer deflection angle (i.e., theoretical galvanometer attitude) corresponding to each coordinate is calculated based on the two-dimensional galvanometer geometric model, yielding (θ) as the result. xref1 ,θ yref1 ), (θ xref2 ,θ yref2 ), (θ xref3 ,θ yref3 ), (θ xref4 ,θ yref4 ), with (θ xref1 ,θ yref1 For example, θ xref1 Characterized by the theoretical calculation of the angle of deflection of the galvanometer in the x-direction when the laser strikes the vertex (x1, y1), θ yref1 This characterizes the angle of deflection of the galvanometer in the y-direction when the laser strikes the vertex (x1, y1) theoretically. During galvanometer calibration, the aiming beam strikes four calibration points sequentially, and the corresponding galvanometer deflection angles are recorded. The actual deflection angle (i.e., the actual galvanometer attitude) (θ) is also recorded. x1 ,θ y1 ), (θ x2 ,θ y2 ), (θ x3 ,θ y3 ), (θ x4 ,θ y4 The attitude difference is obtained by pairwise subtraction of the actual galvanometer attitude with the corresponding theoretical galvanometer attitude. The calculation formula is as follows:

[0079] dx=θ x -θ xref

[0080] dy = θ y -θ yref

[0081] The corresponding attitude differences (or deflection angle differences, or correction parameters) are obtained as (dx1, dy1), (dx2, dy2), (dx3, dy3), and (dx4, dy4). Taking (dx1, dy1) as an example, dx1 = θ x1 -θ xref1 dy1=θ y1 -θ yref1 .

[0082] Step S20: Correct the laser system according to the target correction parameters of the local area of ​​the target corresponding to the target irradiation position of the laser system.

[0083] For example, the theoretical deflection of the galvanometer-guided laser illuminating the target irradiation position is corrected based on the target correction parameters of the target local area where the laser system corresponds to the target irradiation position. If there is a position to be irradiated in the target local area, i.e., the aforementioned target irradiation position, the theoretical deflection of the galvanometer-guided laser illuminating the target irradiation position (i.e., the theoretical galvanometer attitude at the target irradiation position; since the attitude of the galvanometer can be basically known after knowing the deflection, in this embodiment, the theoretical galvanometer attitude and theoretical deflection can be considered equivalent) can be corrected based on the target correction parameters of the target local area. For example, the coefficient of the target correction parameter (i.e., attitude difference or angle difference) can be calculated based on the relative positional relationship between the target irradiation position and the positions of each vertex in the target local area, and then the compensation amount can be calculated using the coefficient and the target correction parameter. The theoretical deflection amount is then corrected based on the compensation amount. For example, the theoretical deflection amount and the correction amount are added together to obtain the correction result. The correction result is then used to control the galvanometer, so that the galvanometer-guided laser accurately irradiates the target irradiation position. It is worth noting that the theoretical deflection of the target irradiation position by the guided laser can also be calculated by substituting the coordinates of the target irradiation position into the two-dimensional galvanometer geometric model.

[0084] In this embodiment, the multiple local regions are calibrated separately to obtain correction parameters corresponding to each local region; correction is then performed based on the target correction parameters of the target local region where the laser system is located corresponding to the target irradiation position. It is understood that this embodiment divides the scanning area into multiple local regions and calculates specific correction parameters for each local region. When a target irradiation position exists in a local region, the correction parameters for that local region are used to correct the laser system when irradiating that target irradiation position, ensuring that the laser accurately irradiates the target irradiation position. It is understood that because this application calculates different correction parameters for different local regions in the scanning area and specifically corrects the theoretical attitude of the irradiation position in each local region, refining the granularity of the correction, even in cases of complex laser irradiation error, the correction scheme of this application can still achieve good correction results, ensuring that the laser accurately irradiates the desired position and improving the accuracy of the laser system.

[0085] Reference Figure 5 This is a flowchart illustrating a second embodiment based on the first embodiment of this application. Contents in this embodiment that are the same as or similar to those in the above embodiments can be referred to the above description and will not be repeated hereafter. The step of correcting according to the target correction parameters of the local target region where the laser system corresponds to the target irradiation position includes steps S21 to S22:

[0086] Step S21: Based on the positional difference between the target illumination position and each target vertex in the local area of ​​the target, and the target correction parameters, calculate the compensation amount of the theoretical deflection of the galvanometer-guided laser illuminating the target illumination position;

[0087] Step S22: The theoretical deflection is compensated by the compensation amount to correct the theoretical deflection.

[0088] For example, in practical applications, the compensation amount for the theoretical deflection when the galvanometer-guided laser irradiates the target location is related to the target correction parameters of the local target region where the target location is located, and the positional differences between the target location and each target vertex in the local target region. Once the correction parameters for a local region are calculated, they can be saved for reuse; therefore, the correction parameters are usually fixed. The positional differences between the target location and the target vertices change with the target location. Correspondingly, a linear calculation based on the positional differences and target correction parameters yields the compensation amount for the theoretical deflection when the galvanometer-guided laser irradiates the target location. The compensation amount has a linear relationship with the positional differences and target correction parameters, and the specific linear calculation formula can be set by technicians according to actual needs. After calculating the compensation amount, the theoretical deflection can be compensated for to correct the theoretical deflection. For example, the compensation amount can be added to the theoretical deflection to complete the compensation correction.

[0089] In one feasible implementation, the galvanometer is a two-dimensional galvanometer, used to guide the laser to move in a first direction and a second direction, the first direction being perpendicular to the second direction. The compensation amount includes a first compensation amount and a second compensation amount. The step of calculating the compensation amount of the theoretical deflection of the galvanometer when the laser irradiates the target irradiation position based on the positional difference between the target irradiation position and each target vertex, and the correction parameters, includes steps S211 to S212:

[0090] Step S211: Based on the first position difference between the target illumination position and each target vertex in the first direction, and the first attitude difference in the target correction parameters in the first direction, a first compensation amount in the first direction is obtained by linear calculation.

[0091] Step S212: Based on the second position difference between the target illumination position and each target vertex in the second direction, and the second attitude difference in the target correction parameters in the second direction, a second compensation amount in the second direction is obtained by linear calculation.

[0092] It should be noted that, in this embodiment, the galvanometer can be a two-dimensional galvanometer, which can guide the laser to move in a first direction and a second direction. For example, the first direction can be the X-axis of the coordinate system corresponding to the scanning area, and the second direction can be the Y-axis of the coordinate system corresponding to the scanning area. Accordingly, the first direction and the second direction are perpendicular. The compensation amount can include a first compensation amount and a second compensation amount, where the first compensation amount corresponds to the first direction and the second compensation amount corresponds to the second direction.

[0093] For example, based on the first position difference between the target illumination position and each vertex in the first direction, and the first pose difference in the correction parameters in the first direction, a first compensation amount in the first direction is obtained through linear calculation. Correspondingly, based on the second position difference between the target illumination position and each vertex in the second direction, and the second pose difference in the correction parameters in the second direction, a second compensation amount in the second direction is obtained through linear calculation. Similarly, taking the scenario where the local region is a square and the coordinates of the four vertices are (x1, y1), (x2, y2), (x3, y3), and (x4, y4) as an example, the formula for calculating the first compensation amount is as follows:

[0094]

[0095] In the formula, x is the X-axis coordinate of the target's illumination position, x n Let be the X-axis coordinate of vertex n. dx1 and dx2 represent the X-axis orientation differences (i.e., the first direction) of the upper vertex of the local square region within the first orientation difference. dx3 and dx4 represent the X-axis orientation differences of the lower vertex of the local square region within the first orientation difference. (x2-x) and (x-x1) represent the X-axis positional differences between the upper vertex of the local square region and the target illumination position within the first positional difference. (x4-x) and (x-x3) represent the X-axis positional differences between the lower vertex of the local square region and the target illumination position within the first positional difference. (x2-x1) represents the X-axis positional difference of the upper vertex, (x3-x4) represents the X-axis positional difference of the lower vertex, dxU represents the intermediate value in the upper X-axis direction, and dxD represents the intermediate value in the lower X-axis direction.

[0096] A linear algorithm is applied to the top and bottom edges to obtain the compensation amount (i.e., the first compensation amount) in the X-axis direction:

[0097]

[0098] In the formula, y is the Y-axis coordinate of the target's illumination position. n Let dxU be the Y-axis coordinate of vertex n, dxD be the middle value of the upper X-axis, dx be the middle value of the lower X-axis, and dx be the compensation value in the X-axis direction, which is also the first compensation value.

[0099] The formula for calculating the second compensation amount is as follows:

[0100]

[0101] In the formula, y is the Y-axis coordinate of the target's illumination position. nLet be the Y-coordinate of vertex n. dy1 and dy4 represent the Y-axis orientation differences (i.e., the second direction) of the left vertex of the local square region in the second orientation difference. dy2 and dy3 represent the Y-axis orientation differences of the right vertex of the local square region in the second orientation difference. (y-y4) and (y1-y) represent the Y-axis positional differences between the left vertex of the local square region and the target illumination position in the second positional difference. (y-y3) and (y2-y) represent the Y-axis positional differences between the right vertex of the local square region and the target illumination position in the first positional difference. (y1-y4) represents the Y-axis positional difference of the left vertex, (y2-y3) represents the Y-axis positional difference of the right vertex, dyL represents the median value in the left Y-axis direction, and dyR represents the median value in the right X-axis direction.

[0102] A linear algorithm is applied to the left and right sides to obtain the compensation amount in the Y-axis direction:

[0103]

[0104] In the formula, x is the X-axis coordinate of the target's illumination position, x n Let ddyL be the X-axis coordinate of vertex n, dyR be the middle value in the left Y-axis direction, dyR be the middle value in the right X-axis direction, and dy be the compensation value in the Y-axis direction, which is also the second compensation value.

[0105] In one feasible implementation, the step of compensating the theoretical deflection amount with the compensation amount includes steps S221 to S223:

[0106] Step S221: Add the theoretical deflection amount in the first direction to the first deflection amount and the first compensation amount to obtain the first target deflection amount;

[0107] Step S222: Add the theoretical deflection amount in the second direction to the second deflection amount and the second compensation amount to obtain the second target deflection amount;

[0108] Step S223: Deflect the galvanometer according to the first target deflection amount and the second target deflection amount to guide the laser to irradiate the target irradiation position.

[0109] It should be noted that if the galvanometer is a two-dimensional galvanometer, the theoretical deflection calculated based on the target illumination position coordinates also has quantities in two directions: a first deflection in the first direction and a second deflection in the second direction. Correspondingly, adding the first deflection in the first direction to the first compensation amount calculated in the previous steps completes the compensation for the first deflection, yielding the first target deflection. Adding the second deflection in the second direction to the second compensation amount calculated in the previous steps completes the compensation for the second deflection, yielding the second target deflection. After compensation, the galvanometer can be deflected according to the first and second target deflections. If there are two galvanometers, such as a first galvanometer (corresponding to the first direction) and a second galvanometer (corresponding to the second direction), then the first galvanometer is controlled to deflect in the first direction by the first target deflection, and the second galvanometer is controlled to deflect in the second direction by the second target deflection, thereby enabling the deflected galvanometer to accurately guide the laser to the target illumination position.

[0110] For example, the correction formula is as follows:

[0111] θ x =θ xref +dx

[0112] θ y =θ yref +dy

[0113] In the formula, θ xref For the first deflection, θ yref dx is the second deflection, dy is the first compensation, and θ is the second compensation. x Let θ be the first target deflection. f This is the second target deflection.

[0114] Reference Figure 6 This is a flowchart illustrating a third embodiment based on the first and second embodiments of this application. Contents identical or similar to those in the above embodiments can be found in the above description and will not be repeated hereafter. The step of controlling the galvanometer to guide the laser emitted from the laser source to irradiate each vertex of the local region includes steps S110 to S140:

[0115] Step S110: For any one of the vertices, control the laser source to emit a laser to illuminate the scanning area and form a light spot on the scanning area, thereby acquiring a real-time image of the scanning area;

[0116] Step S120: Obtain the contour pattern of the light spot in the real-time image based on the edge detection algorithm, and determine the light spot coordinates through the contour pattern;

[0117] Step S130: If the light spot coordinates are different from the coordinates corresponding to the vertex, the adjustment angle of the galvanometer is obtained based on the coordinate difference between the light spot coordinates and the coordinates corresponding to the vertex.

[0118] Step S140: Control the deflection of the galvanometer based on the adjustment angle, and after the galvanometer deflects, perform the step of acquiring a real-time image of the scanning area until the position of the light spot is the same as that of the vertex.

[0119] It should be noted that in this embodiment, the laser needs to be guided to illuminate each vertex of a local area. The process of illuminating each vertex is basically the same, so in this embodiment, we will use one vertex as an example for explanation.

[0120] For example, for any one of the vertices, the laser source first emits a laser beam to illuminate the scanning area, forming a light spot on the scanning area. (It should be noted that in practical applications, laser light is usually invisible and difficult for the camera to capture; therefore, during the calibration and debugging phase, the light emitted by the laser source can consist of both laser light and visible light.) The initial orientation of the galvanometer can be randomly set. After the laser is emitted, an image of the scanning area, i.e., a real-time image, can be acquired by the camera. The outline of the light spot in this real-time image can be obtained using a preset edge detection algorithm. The size and color of the light spot can be preset by technicians, which will not be elaborated here. Correspondingly, based on the position of the light spot in the image, the coordinates of the light spot in the scanning area, i.e., the aforementioned light spot coordinates, can be determined.

[0121] After obtaining the spot coordinates, they can be compared with the coordinates of the corresponding vertex. If they are different, the adjustment angle of the galvanometer can be determined based on the coordinate difference between the spot coordinates and the corresponding vertex coordinates. This coordinate difference can include the difference in the X-axis direction and the difference in the Y-axis direction. It should be noted that in practical applications, the laser system may have two galvanometers, each used to control the movement of the laser spot in different directions, such as the X-axis or Y-axis. The mapping relationship between the distance the spot moves in different directions and the deflection angle of the galvanometer can be preset. That is, after the galvanometer position is fixed, the distance the laser moves across the scanning area due to the galvanometer deflection can be calculated using geometric formulas. The distance the laser moves across the scanning area can be used to deduce the required deflection angle of the galvanometer. After obtaining the adjustment angle of the galvanometer based on the pixel coordinate difference, the galvanometer is deflected based on this angle to attempt to move the spot to the vertex position. After deflecting the galvanometer, the process returns to the step of acquiring the real-time image of the scanning area until the spot and the vertex are at the same position.

[0122] It is understandable that the process of guiding the laser to illuminate each vertex can refer to the above process, and correspondingly, the actual galvanometer posture of the galvanometer when the laser illuminates each vertex can be recorded.

[0123] This application also provides a laser system, as shown in the reference. Figure 7 The laser system includes a galvanometer and a laser source. The laser emitted by the laser source is reflected by the galvanometer and then onto the scanning area. The scanning area is provided with multiple local regions. The laser system includes:

[0124] The calibration module 10 is used to calibrate the plurality of local regions respectively to obtain the correction parameters corresponding to each local region;

[0125] The correction module 20 is used to perform correction based on the target correction parameters of the local area of ​​the target where the laser system is located corresponding to the target irradiation position.

[0126] Optionally, the calibration module 10 is further configured to:

[0127] For any one of the multiple local regions, the galvanometer is controlled to guide the laser emitted by the laser source to illuminate each vertex of the local region, and the actual galvanometer postures of the galvanometer when the laser illuminates each vertex are obtained.

[0128] Based on the attitude difference between the actual galvanometer attitudes and the theoretical galvanometer attitudes when the laser illuminates each vertex, the correction parameters for the local region are determined.

[0129] Optionally, the calibration module 10 is further configured to:

[0130] For any one of the actual galvanometer poses, calculate the pose difference between the actual galvanometer pose and the corresponding theoretical galvanometer pose, wherein the actual galvanometer pose and the corresponding theoretical galvanometer pose correspond to the same vertex;

[0131] After traversing each actual galvanometer posture, the obtained posture differences are used as correction parameters for the local region.

[0132] Optionally, the correction module 20 is further configured to:

[0133] Based on the positional differences between the target illumination position and each target vertex in the local target region, and the target correction parameters, calculate the compensation amount for the theoretical deflection of the galvanometer-guided laser illuminating the target illumination position;

[0134] The theoretical deflection is compensated by the compensation amount to correct the theoretical deflection.

[0135] Optionally, the galvanometer is a two-dimensional galvanometer, used to guide the laser to move in a first direction and a second direction, the first direction being perpendicular to the second direction, and the compensation amount including a first compensation amount and a second compensation amount; the correction module 20 is further used for:

[0136] Based on the first position difference between the target illumination position and each target vertex in the first direction, and the first attitude difference in the target correction parameters in the first direction, a first compensation amount in the first direction is obtained by linear calculation.

[0137] Based on the second position difference between the target illumination position and each target vertex in the second direction, and the second attitude difference in the target correction parameters in the second direction, a second compensation amount in the second direction is obtained by linear calculation.

[0138] Optionally, the correction module 20 is further configured to:

[0139] The first target deflection is obtained by adding the theoretical deflection amount in the first direction to the first deflection amount and the first compensation amount.

[0140] The second target deflection is obtained by adding the theoretical deflection amount in the second direction to the second compensation amount;

[0141] The galvanometer is deflected according to the first target deflection and the second target deflection to guide the laser to irradiate the target irradiation position.

[0142] Optionally, the calibration module 20 is further configured to:

[0143] For any one of the vertices, control the laser source to emit a laser beam to illuminate the scanning area and form a light spot on the scanning area, thereby acquiring a real-time image of the scanning area;

[0144] The contour pattern of the light spot in the real-time image is obtained based on the edge detection algorithm, and the coordinates of the light spot are determined by the contour pattern.

[0145] When the coordinates of the light spot are different from the coordinates of the corresponding vertex, the adjustment angle of the galvanometer is obtained based on the coordinate difference between the coordinates of the light spot and the coordinates of the corresponding vertex.

[0146] The galvanometer is deflected based on the adjusted angle, and the step of acquiring a real-time image of the scanning area is performed after the galvanometer is deflected, until the position of the light spot is the same as that of the vertex.

[0147] Optionally, the galvanometer changes its posture via a drive mechanism to guide the laser beam to different positions; the galvanometer is a one-dimensional galvanometer or a two-dimensional galvanometer, and the two-dimensional galvanometer includes two laser guiding directions.

[0148] The laser system calibration system provided in this application employs the laser system calibration method described in the above embodiments, aiming to solve the technical problem that inaccuracies may still exist after calibration using traditional methods. Compared with the prior art, the beneficial effects of the laser system provided in this application are the same as those of the laser system calibration method described in the above embodiments, and other technical features of this laser system are the same as those disclosed in the methods of the above embodiments, and will not be repeated here.

[0149] This application provides an electronic device, which includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to perform the laser system correction method of the above embodiment 1.

[0150] The following is for reference. Figure 8 The diagram illustrates a structural schematic of an electronic device suitable for implementing embodiments of this application. The electronic devices in these embodiments may include, but are not limited to, mobile terminals such as mobile phones, laptops, digital broadcast receivers, PDAs (Personal Digital Assistants), PADs (Portable Application Descriptions), PMPs (Portable Media Players), in-vehicle terminals (e.g., in-vehicle navigation terminals), and fixed terminals such as digital TVs and desktop computers. Figure 8 The electronic device shown is merely an example and should not impose any limitation on the functionality and scope of use of the embodiments of this application.

[0151] like Figure 8As shown, the electronic device may include a processing system 1001 (e.g., a central processing unit, a graphics processor, etc.) that can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) 1002 or a program loaded from a storage system 1003 into a random access memory (RAM) 1004. The RAM 1004 also stores various programs and data required for the operation of the electronic device. The processing system 1001, ROM 1002, and RAM 1004 are interconnected via a bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Typically, the following systems can be connected to the I / O interface 1006: an input system 1007 including, for example, a touchscreen, touchpad, keyboard, mouse, image sensor, microphone, accelerometer, gyroscope, etc.; an output system 1008 including, for example, a liquid crystal display (LCD), speaker, vibrator, etc.; a storage system 1003 including, for example, magnetic tape, hard disk, etc.; and a communication system 1009. Communication system 1009 allows electronic devices to communicate wirelessly or wiredly with other devices to exchange data. While the figure shows electronic devices with various systems, it should be understood that implementation or possession of all the systems shown is not required. More or fewer systems may be implemented alternatively.

[0152] Specifically, according to the embodiments disclosed in this application, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, embodiments disclosed in this application include a computer program product comprising a computer program carried on a computer-readable medium, the computer program containing program code for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via a communication system, or installed from storage system 1003, or installed from ROM 1002. When the computer program is executed by processing system 1001, it performs the functions defined in the methods of the embodiments disclosed in this application.

[0153] The electronic device provided in this application, employing the laser system calibration method described in the above embodiments, can solve the technical problem that inaccuracies may still exist after calibration using traditional methods. Compared with the prior art, the beneficial effects of the electronic device provided in this application are the same as those of the laser system calibration method provided in the above embodiments, and other technical features of this electronic device are the same as those disclosed in the method of the previous embodiment, and will not be repeated here.

[0154] It should be understood that the various parts disclosed in this application can be implemented using hardware, software, firmware, or a combination thereof. In the description of the above embodiments, specific features, structures, materials, or characteristics can be combined in any suitable manner in one or more embodiments or examples.

[0155] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

[0156] This application provides a computer-readable storage medium having computer-readable program instructions (i.e., a computer program) stored thereon, the computer-readable program instructions being used to perform the correction method of the laser system in the above embodiments.

[0157] The computer-readable storage medium provided in this application may be, for example, a USB flash drive, but is not limited to, electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices, or any combination thereof. More specific examples of computer-readable storage media may include, but are not limited to: electrical connections having one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, system, or device. The program code contained on the computer-readable storage medium may be transmitted using any suitable medium, including but not limited to: wires, optical cables, RF (Radio Frequency), etc., or any suitable combination thereof.

[0158] The aforementioned computer-readable storage medium may be included in an electronic device or may exist independently without being assembled into an electronic device.

[0159] The aforementioned computer-readable storage medium carries one or more programs, which, when executed by an electronic device, cause the electronic device to:

[0160] For any local region in the scanning area, the galvanometer is controlled to guide the laser emitted by the laser source to irradiate each vertex of the local region, and the actual galvanometer postures of the galvanometer when the laser irradiates each vertex are obtained.

[0161] Based on the attitude difference between the actual galvanometer attitude and the theoretical galvanometer attitude when the laser illuminates each vertex, the correction parameters of the local region are determined;

[0162] When a target irradiation position exists in the local area, the theoretical deflection of the galvanometer-guided laser irradiating the target irradiation position is corrected based on the correction parameters.

[0163] Computer program code for performing the operations of this application can be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, and C++, and conventional procedural programming languages ​​such as the "C" language or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving remote computers, the remote computer can be connected to the user's computer via any type of network—including a Local Area Network (LAN) or a Wide Area Network (WAN)—or can be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0164] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of this application. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions indicated in the blocks may occur in a different order than those indicated in the drawings. For example, two consecutively indicated blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, can be implemented using a dedicated hardware-based system that performs the specified function or operation, or using a combination of dedicated hardware and computer instructions.

[0165] The modules described in the embodiments of this application can be implemented in software or hardware. The names of the modules do not necessarily limit the functionality of the unit itself.

[0166] The readable storage medium provided in this application is a computer-readable storage medium that stores computer-readable program instructions (i.e., a computer program) for executing the calibration method of the laser system described above. This solves the technical problem that inaccuracies may still exist after calibration using traditional methods. Compared with the prior art, the beneficial effects of the computer-readable storage medium provided in this application are the same as those of the calibration method of the laser system provided in the above embodiments, and will not be repeated here.

[0167] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the steps of the laser system calibration method described above.

[0168] The computer program product provided in this application can solve the technical problem of laser system calibration. Compared with the prior art, the beneficial effects of the computer program product provided in this application are the same as the beneficial effects of the laser system calibration method provided in the above embodiments, and will not be repeated here.

[0169] The above description is only a part of the embodiments of this application and does not limit the patent scope of this application. All equivalent structural transformations made under the technical concept of this application and using the contents of the specification and drawings of this application, or direct / indirect applications in other related technical fields, are included in the patent protection scope of this application.

Claims

1. A calibration method for a laser system, characterized in that, The laser system includes a galvanometer and a laser source. The laser source emits laser light, which is reflected by the galvanometer and then onto the scanning area. The scanning area is provided with multiple local regions. The correction method for the laser system includes: The multiple local regions are calibrated separately to obtain the correction parameters corresponding to each local region; The laser system is calibrated based on the target correction parameters of the local area of ​​the target region where the target illumination position is located.

2. The laser system calibration method as described in claim 1, characterized in that, The step of calibrating the plurality of local regions respectively to obtain the correction parameters corresponding to each local region includes: For any one of the multiple local region scanning areas, the galvanometer is controlled to guide the laser emitted by the laser source to irradiate each vertex of the local region, and the actual galvanometer postures of the galvanometer when the laser irradiates each vertex are obtained. The correction parameters for the local region are determined based on the attitude difference between the actual galvanometer attitude and the theoretical galvanometer attitude when the laser illuminates each vertex.

3. The laser system calibration method as described in claim 2, characterized in that, The step of determining the correction parameters of the local region based on the difference between the actual galvanometer postures and the theoretical galvanometer postures calculated when the laser illuminates each vertex includes: For any one of the actual galvanometer poses, calculate the pose difference between the actual galvanometer pose and the corresponding theoretical galvanometer pose, wherein the actual galvanometer pose and the corresponding theoretical galvanometer pose correspond to the same vertex; After traversing each actual galvanometer posture, the obtained posture differences are used as correction parameters for the local region.

4. The laser system calibration method as described in claim 1, characterized in that, The step of correcting the laser system based on the target correction parameters of the local area of ​​the target region corresponding to the target illumination position of the laser system includes: Based on the positional differences between the target illumination position and each target vertex in the local target region, and the target correction parameters, calculate the compensation amount for the theoretical deflection of the galvanometer-guided laser illuminating the target illumination position; The theoretical deflection is compensated by the compensation amount to correct the theoretical deflection.

5. The laser system calibration method as described in claim 4, characterized in that, The type of galvanometer is a two-dimensional galvanometer, which is used to guide the laser to move in a first direction and a second direction. The first direction is perpendicular to the second direction. The compensation amount includes a first compensation amount and a second compensation amount. The step of calculating the compensation amount for the theoretical deflection of the galvanometer-guided laser illuminating the target irradiation position based on the positional difference between the target irradiation position and each target vertex in the local target region, and the target correction parameters, includes: Based on the first position difference between the target illumination position and each target vertex in the first direction, and the first attitude difference in the target correction parameters in the first direction, a first compensation amount in the first direction is obtained by linear calculation; Based on the second position difference between the target illumination position and each target vertex in the second direction, and the second attitude difference in the target correction parameters in the second direction, a second compensation amount in the second direction is obtained by linear calculation.

6. The laser system calibration method as described in claim 5, characterized in that, The step of compensating the theoretical deflection amount using the compensation amount includes: The first target deflection is obtained by adding the theoretical deflection amount in the first direction to the first deflection amount and the first compensation amount. The second target deflection is obtained by adding the theoretical deflection amount in the second direction to the second compensation amount; The galvanometer is deflected according to the first target deflection and the second target deflection to guide the laser to irradiate the target irradiation position.

7. The laser system calibration method as described in claim 2, characterized in that, The step of controlling the galvanometer to guide the laser emitted by the laser source to illuminate each vertex of the local region includes: For any one of the vertices, control the laser source to emit a laser beam to illuminate the scanning area and form a light spot on the scanning area, thereby acquiring a real-time image of the scanning area; The contour pattern of the light spot in the real-time image is obtained based on the edge detection algorithm, and the coordinates of the light spot are determined by the contour pattern. When the coordinates of the light spot are different from the coordinates of the corresponding vertex, the adjustment angle of the galvanometer is obtained based on the coordinate difference between the coordinates of the light spot and the coordinates of the corresponding vertex. The galvanometer is deflected based on the adjusted angle, and the step of acquiring a real-time image of the scanning area is performed after the galvanometer is deflected, until the position of the light spot is the same as that of the vertex.

8. A laser system, characterized in that, The laser system includes a galvanometer and a laser source. The laser source emits laser light, which is reflected by the galvanometer and then onto the scanning area. The scanning area is provided with multiple local regions. The laser system includes: The calibration module is used to calibrate the multiple local regions respectively to obtain the correction parameters corresponding to each local region; The correction module is used to perform correction based on the target correction parameters of the local area of ​​the target corresponding to the target irradiation position of the laser system.

9. An electronic device, characterized in that, The device includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, the computer program being configured to implement the steps of the correction method for the laser system as described in any one of claims 1 to 7.

10. A storage medium, characterized in that, The storage medium is a computer-readable storage medium, and a computer program is stored on the storage medium, the computer program being configured to implement the steps of the correction method for the laser system as described in any one of claims 1 to 7.

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