An integrated circuit single particle transient pulse accurate identification and function interruption intelligent judgment system and method

Abstract

This application discloses a system and method for accurate identification of single-event transient pulses and intelligent determination of functional interruptions in integrated circuits. The system includes: a signal generation and control unit for providing the chip under test (DUT) and a reference chip with identical operating power signals, analog excitation signals, and digital control signals; functional circuit units for the DUT and reference chips, including DUT functional circuits and reference chip functional circuits with identical structures, both receiving identical excitation signals and outputting the DUT signal and reference signal respectively; a high-speed multi-channel synchronous analog-to-digital conversion acquisition unit for synchronously acquiring the DUT signal and reference signal and converting them into digital signals; and an intelligent data analysis and determination unit for synchronously calibrating the DUT digital signal and reference digital signal, identifying single-event transient pulses, determining single-event functional interruptions, and performing multi-dimensional statistical analysis and report generation. This application improves the accuracy and efficiency of single-event effect testing of integrated circuits under extreme radiation environments.

Description

Technical Field

[0001] This application relates to the field of radiation resistance reliability testing technology for integrated circuits, and in particular to a system and method for accurate identification of single-particle transient pulses and intelligent determination of function interruption in integrated circuits. Background Technology

[0002] Single event effects (SEE) are transient or permanent failure phenomena caused by high-energy particles striking sensitive nodes of integrated circuits. Single event transients (SETs) manifest as brief positive or negative amplitude deviations in the output signal, while single event functional interruptions (SEFIs) lead to prolonged abnormal outputs or even complete device failure, directly threatening the reliability and safety of electronic systems in extreme environments.

[0003] In existing single-event effect (SEFI) tests for integrated circuits, a fixed-frequency square wave is typically used as the excitation and output response carrier, and the SET and SEFI are determined by observing changes in the output waveform. However, existing technologies have the following main problems:

[0004] Insufficient recognition accuracy: It lacks an automated, high-precision transient pulse recognition mechanism, making it difficult to effectively distinguish between positive and negative SET. It has limited ability to capture mV-level micro-amplitude and microsecond-level narrow pulses, often relying on manual waveform analysis, which is prone to missed or misjudgment.

[0005] Inconsistent judgment criteria: The definition of SET and SEFI lacks quantitative thresholds, the triggering conditions for function interruption are vague, and subjective judgment leads to unreliable statistical results.

[0006] Weak anti-interference capability: It does not fully consider factors such as acquisition noise, quantization error, and inherent circuit deviation, and lacks effective synchronous calibration and noise suppression methods, resulting in low data reliability.

[0007] Statistical analysis is inefficient: test data needs to be manually processed, and it is impossible to automatically obtain multi-dimensional information such as pulse number, duration distribution, amplitude extreme value, and time distribution. The test cycle is long and the efficiency is low.

[0008] The aforementioned deficiencies limit the refined evaluation of the single-event effect resistance performance of high-end integrated circuits and the optimization of hardened design. Summary of the Invention

[0009] This application provides a system and method for accurate identification of single-particle transient pulses and intelligent determination of function interruption in integrated circuits, which solves the problems of low identification accuracy, subjective judgment, cumbersome statistics, and weak anti-interference in the prior art.

[0010] This application provides the following solution:

[0011] According to a first aspect, a system for accurate identification of single-event transient pulses and intelligent determination of functional interruptions in integrated circuits is provided. The system includes: a signal generation and control unit for providing a common operating power signal, analog excitation signal, and digital control signal to the chip under test (DUT) and a reference chip; functional circuit units for the DUT and the reference chip, including a DUT functional circuit and a reference chip functional circuit with identical structures, wherein the DUT functional circuit is located in an irradiated area and the reference chip functional circuit is located in a non-irradiated area, both receiving a common excitation signal and outputting a DUT signal and a reference signal respectively; a high-speed multi-channel synchronous analog-to-digital conversion acquisition unit for synchronously acquiring the DUT signal and the reference signal, converting them into digital signals to obtain a DUT digital signal and a reference digital signal; and an intelligent data analysis and determination unit for receiving the DUT digital signal and the reference digital signal, performing synchronous calibration, single-event transient pulse identification, single-event functional interruption determination, and multi-dimensional statistical analysis and report generation on the DUT digital signal and the reference digital signal.

[0012] According to one achievable method in the embodiments of this application, the high-speed multi-channel synchronous analog-to-digital converter acquisition unit is configured as follows: the sampling rate is not less than 2MHz, the resolution is 16 bits, and the acquisition voltage range is -10V to 10V; distributed clock synchronization technology is adopted, and the synchronization error between acquisition channels is not greater than 10 nanoseconds.

[0013] According to one achievable method in an embodiment of this application, the intelligent data analysis and judgment unit includes: a pre-acquisition module, used to acquire at least one complete cycle of the measured digital signal and the reference digital signal, and extract and compare the cycle values ​​of the two signals based on the Fourier transform algorithm; a signal synchronization calibration module, used to adjust the sampling timing based on the phase difference to achieve precise alignment of the signal cycle; and an amplitude error calibration module, used to set an allowable amplitude error range with the reference digital signal as a reference to eliminate the influence of quantization error and noise.

[0014] According to one achievable method in an embodiment of this application, the intelligent data analysis and judgment unit includes a single-event transient pulse recognition module, configured to: adaptively set a dynamic recognition threshold X based on the peak amplitude of the reference digital signal, wherein the value of X ranges from 1% to 20%; compare the amplitude of the measured digital signal with the peak amplitude of the reference digital signal; when the amplitude of the measured digital signal exceeds (1+X) times the peak value of the reference digital signal, and the duration of the over-amplitude state is not less than 10 microseconds, it is determined to be a positive single-event transient pulse; when the amplitude of the measured digital signal is lower than (1-X) times the peak value of the reference digital signal, and the duration of the low-amplitude state is not less than 10 microseconds, it is determined to be a negative single-event transient pulse; amplitude fluctuations with a duration of less than 10 microseconds are determined to be noise interference.

[0015] According to one achievable method in an embodiment of this application, the intelligent data analysis and judgment unit includes a single-event function interruption judgment module, which is configured to: use the period of the reference digital signal as a time threshold; when the duration of a positive single-event transient pulse or a negative single-event transient pulse exceeds the period threshold, it is judged as a single-event function interruption.

[0016] According to one achievable method in an embodiment of this application, the intelligent data analysis and judgment unit is also used to automatically count the following: the total number of positive / negative single-particle transient pulses, the total number of single-particle functional interruptions and their respective proportions; the number of positive / negative transient pulse occurrences and the triggering period and time distribution of functional interruptions within each signal period; the maximum / minimum amplitude, longest / shortest duration and occurrence time of positive / negative transient pulses.

[0017] According to a second aspect, a test method for accurate identification of single-event transient pulses and intelligent determination of functional interruptions in integrated circuits is provided. The method comprises: providing a common operating power supply signal, an analog excitation signal, and a digital control signal to a functional circuit of a chip under test (DUT) and a functional circuit of a reference chip, enabling the DUT and the reference chip to operate under the same operating conditions, wherein the DUT is located in an irradiated area and the reference chip is located in a non-irradiated area; synchronously acquiring the test signal output by the DUT and the reference signal output by the reference chip, and converting the acquired analog signal into a digital signal; receiving the digital signal, performing synchronous calibration processing on the DUT and the reference digital signal, and based on the calibrated reference digital signal, performing single-event transient pulse identification and single-event functional interruption determination on the DUT; performing multi-dimensional statistical analysis on the results of the single-event transient pulse identification and single-event functional interruption determination, and generating a test report.

[0018] According to one achievable method in an embodiment of this application, the synchronous calibration process includes: pre-acquiring at least one complete cycle of the digital signal under test and the reference digital signal; extracting and comparing the cycle values ​​of the digital signal under test and the reference digital signal based on a Fourier transform algorithm; if there is a cycle deviation between the digital signal under test and the reference digital signal, dynamically adjusting the sampling timing of the digital signal under test based on the phase difference to achieve cycle alignment; and calibrating the amplitude error of the digital signal under test using the reference digital signal as an amplitude reference.

[0019] According to one achievable method in an embodiment of this application, the single-event transient pulse identification includes: adaptively setting a dynamic identification threshold X based on the peak amplitude of the reference digital signal, wherein the value of X ranges from 1% to 20%; comparing the amplitude of the measured digital signal with the peak amplitude of the reference digital signal; when the amplitude of the measured digital signal exceeds (1+X) times the peak amplitude of the reference digital signal, and the duration of the over-amplitude state is not less than 10 microseconds, it is determined to be a positive single-event transient pulse; when the amplitude of the measured digital signal is lower than (1-X) times the peak amplitude of the reference digital signal, and the duration of the low-amplitude state is not less than 10 microseconds, it is determined to be a negative single-event transient pulse; amplitude fluctuations with a duration of less than 10 microseconds are determined to be noise interference.

[0020] According to one achievable method in an embodiment of this application, the single-event function interruption determination includes: acquiring the period of the reference digital signal as a determination time threshold; monitoring the duration of the positive or negative single-event transient pulse; if the duration exceeds the determination time threshold, determining that a single-event function interruption has occurred; after a function interruption determination, automatically restarting the transient pulse identification and function interruption determination process starting from the next complete period of the reference digital signal.

[0021] According to a third aspect, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the steps of the method described in any one of the first aspects above.

[0022] According to the fourth aspect, an electronic device is provided, comprising:

[0023] One or more processors; and

[0024] A memory associated with the one or more processors, the memory being used to store program instructions that, when read and executed by the one or more processors, perform the steps of the method described in any one of the first aspects above.

[0025] According to the specific embodiments provided in this application, the following technical effects are disclosed:

[0026] This application provides a common operating power supply, analog excitation, and digital control signals through a signal generation and control unit, ensuring that the chip under test (located in the irradiated area) and the reference chip (located in the non-irradiated area) receive the same excitation in a structurally consistent functional circuit unit, outputting the tested signal and the reference signal. The system utilizes a high-speed multi-channel synchronous analog-to-digital converter to achieve synchronous acquisition and digital conversion of the two signals, obtaining high-resolution tested digital signals and reference digital signals. Subsequently, an intelligent data analysis and judgment software system receives these digital signals, performs synchronous calibration to eliminate phase and amplitude errors, accurately identifies single-event transient pulses (distinguishing between positive and negative amplitude deviations), intelligently judges single-event functional interruptions (based on duration thresholds), and performs multi-dimensional statistical analysis and report generation. This technology significantly improves the accuracy and efficiency of single-event effect testing of integrated circuits under extreme radiation environments, capable of capturing millivolt-level micro-amplitude and microsecond-level narrow-pulse transient signals, quantifying the boundary between transients and functional interruptions, enhancing noise immunity, and achieving automated data processing and visualization output, providing reliable support for chip reliability assessment and hardened design in aerospace, nuclear industry, and other fields.

[0027] Of course, any product implementing this application does not necessarily need to achieve all of the advantages described above at the same time. Attached Figure Description

[0028] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0029] Figure 1 This is a structural block diagram of the integrated circuit single-event transient pulse accurate identification and function interruption intelligent determination system provided in the embodiments of this application;

[0030] Figure 2 A flowchart of the method for accurate identification of single-particle transient pulses and intelligent determination of function interruption in integrated circuits provided in the embodiments of this application. Detailed Implementation

[0031] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of this application are within the scope of protection of this application.

[0032] The terminology used in the embodiments of this invention is for the purpose of describing particular embodiments only and is not intended to limit the invention. The singular forms “a,” “the,” and “the” as used in the embodiments of this invention and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise.

[0033] It should be understood that the term "and / or" used in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this article generally indicates that the preceding and following related objects have an "or" relationship.

[0034] Depending on the context, the word "if" as used here can be interpreted as "when," "when," "in response to determination," or "in response to detection." Similarly, depending on the context, the phrase "if determination" or "if detection (of the stated condition or event)" can be interpreted as "when determination," "in response to determination," "when detection (of the stated condition or event)," or "in response to detection (of the stated condition or event)."

[0035] To facilitate understanding of this application, the system architecture on which this application is based will be described first. Figure 1 An exemplary system architecture that can be applied to embodiments of this application is shown, such as Figure 1 As shown, the integrated circuit single-particle transient pulse accurate identification and functional interruption intelligent determination system architecture 100 may include:

[0036] The signal generation and control unit 101 is used to provide the chip under test and the reference chip with the same source of working power signal, analog excitation signal and digital control signal;

[0037] The functional circuit unit 102 of the chip under test and the reference chip includes a functional circuit of the chip under test and a functional circuit of the reference chip with the same structure. The functional circuit of the chip under test is located in the irradiation area, and the functional circuit of the reference chip is located in the non-irradiation area. Both receive the same source excitation signal and output the test signal and the reference signal respectively.

[0038] The high-speed multi-channel synchronous analog-to-digital conversion acquisition unit 103 is used to synchronously acquire the measured signal and the reference signal, and convert them into digital signals to obtain the measured digital signal and the reference digital signal.

[0039] The intelligent data analysis and judgment unit 104 is used to receive the measured digital signal and the reference digital signal, and to perform synchronous calibration, single-event transient pulse identification, single-event functional interruption judgment, and multi-dimensional statistical analysis and report generation on the measured digital signal and the reference digital signal.

[0040] As can be seen from the above system, this application provides a common operating power supply, analog excitation, and digital control signals through a signal generation and control unit, ensuring that the chip under test (placed in the irradiated area) and the reference chip (placed in the non-irradiated area) receive the same excitation in a functional circuit unit with consistent structure, and output the tested signal and the reference signal. The system utilizes a high-speed multi-channel synchronous analog-to-digital converter to achieve synchronous acquisition and digital conversion of the two signals, obtaining high-resolution tested digital signals and reference digital signals. Subsequently, an intelligent data analysis and judgment software system receives these digital signals, performs synchronous calibration to eliminate phase and amplitude errors, accurately identifies single-event transient pulses (distinguishing between positive and negative amplitude deviations), intelligently judges single-event functional interruptions (based on duration thresholds), and performs multi-dimensional statistical analysis and report generation. This technology significantly improves the accuracy and efficiency of single-event effect testing of integrated circuits under extreme radiation environments, can capture millivolt-level micro-amplitude and microsecond-level narrow pulse transient signals, quantifies and defines the boundary between transients and functional interruptions, enhances noise interference resistance, and achieves automated data processing and visualization output, providing reliable support for chip reliability assessment and hardened design in aerospace, nuclear industry, and other fields.

[0041] The following describes in detail each unit in the above system and the effects that can be further produced, with reference to the embodiments. This system adopts a modular design and consists of four core modules: a signal generation and control unit, a functional circuit unit for the chip under test and the reference chip, a high-speed multi-channel synchronous analog-to-digital conversion acquisition unit, and an intelligent data analysis and judgment software system. Each module works together through standardized interfaces to ensure the synchronization of signal transmission and the real-time performance of data processing.

[0042] The signal generation and control unit 101, as the core excitation and control module of the system, mainly performs the following functions: providing a stable operating power signal for the functional circuit units of the chip under test and the reference chip, ensuring the stable operation of the two chips; outputting an analog excitation signal that meets the test requirements, providing a unified input excitation for the chip; wherein, the analog excitation signal can be a square wave, sine wave, or other waveforms; and outputting digital control signals to realize the automated triggering and control of the test process, wherein the digital control signals can include the linkage control of key processes such as irradiation start / end and data acquisition start / stop.

[0043] The signal generation and control unit 101, through its design of outputting signals from the same source, ensures that the chip under test and the reference chip receive completely identical input signals, laying a synchronous foundation for the subsequent comparative analysis of the two output signals.

[0044] The functional circuit unit 102 for the chip under test and the reference chip includes a functional circuit for the chip under test and a functional circuit for the reference chip with identical structures. During circuit design, the core components of the two circuits of the functional circuit under test and the functional circuit for the reference chip are completely identical, such as the input matching network, load resistor, and isolation circuit, thus eliminating system errors caused by differences in the circuits themselves at the hardware level.

[0045] In the functional circuit unit 102 for both the chip under test (DUT) and the reference chip, the input terminals of both are connected to the same excitation signal output from the signal generation and control unit. The reference chip is placed in a non-irradiated area, and its output signal serves as a "pure reference." The DUT is placed in an irradiated area, subjected to radiation particle bombardment. Both circuits output square wave signals with a fixed frequency and amplitude (in this embodiment, a 100Hz square wave with a peak-to-peak value of 5V and a duty cycle of 50%). The output impedance is matched to ensure distortion-free signal transmission. Preferably, the two circuits of the functional circuit for the DUT and the functional circuit for the reference chip in this application output 100Hz square wave signals with a peak-to-peak value of 5V and a duty cycle of 50%.

[0046] The high-speed multi-channel synchronous analog-to-digital converter acquisition unit 103 is used to synchronously acquire the measured signal and the reference signal, and convert them into digital signals to obtain the measured digital signal and the reference digital signal. As the core of signal sensing, the high-speed multi-channel synchronous analog-to-digital converter acquisition unit 103 has the technical characteristics of high sampling rate, high resolution, and high synchronization, ensuring the accuracy of signal acquisition.

[0047] The parameters of the high-speed multi-channel synchronous analog-to-digital converter acquisition unit 103 can be configured as follows: sampling rate not less than 2MHz, expandable to 100MHz, ensuring a minimum of 10 A single-particle pulse of a certain width enables high-density acquisition of no less than 20 sampling points per cycle; the resolution is 16 bits, the acquisition voltage range is -10V to 10V, and the minimum quantization accuracy is [value missing]. It can meet the identification requirements of mV-level micro-amplitude transient signals.

[0048] The high-speed multi-channel synchronous analog-to-digital converter (ADC) acquisition unit 103 employs distributed clock synchronization technology. Distributed clock synchronization technology refers to the technique used in distributed systems to keep the clocks of multiple independent nodes (such as computers, network devices, or sensors) consistent through specific algorithms and protocols, ensuring the order of events, data consistency, and coordinated operation within the system. By using distributed clock synchronization technology, the synchronization error between the two signal acquisition channels is no greater than 10ns, ensuring precise time alignment between the measured signal and the reference signal. A high-speed communication interface is configured to support real-time uploading of continuously acquired data, avoiding data loss due to buffer overflow. Simultaneously, the high-speed multi-channel synchronous ADC acquisition unit 103 also incorporates a noise suppression module to filter the acquired raw signals, reducing the interference of random noise on signal recognition.

[0049] The intelligent data analysis and judgment unit 104 is the core processing unit of the system, integrating six major functions: data storage, synchronous calibration, transient identification, interruption judgment, statistical analysis, and report generation. It is used to receive the measured digital signal and the reference digital signal, perform synchronous calibration, single-event transient pulse identification, single-event functional interruption judgment, and multi-dimensional statistical analysis and report generation on the measured digital signal and the reference digital signal.

[0050] As an implementable approach, the intelligent data analysis and judgment unit includes: a pre-acquisition module, used to acquire at least one complete cycle of the measured digital signal and the reference digital signal, and extract and compare the cycle values ​​of the two signals based on the Fourier transform algorithm; a signal synchronization calibration module, used to adjust the sampling timing based on the phase difference to achieve precise alignment of the signal cycle; and an amplitude error calibration module, used to set the allowable amplitude error range with the reference digital signal as a reference to eliminate the influence of quantization error and noise.

[0051] The main function of the pre-acquisition module is to acquire at least one complete cycle of the tested digital signal and the reference digital signal. Preferably, the first 10 cycles of the two signal data can be selected. Specifically, after power-on or test startup, the module first acquires an initial data segment from the high-speed multi-channel synchronous analog-to-digital converter acquisition unit to ensure coverage of one or more complete cycles of the signal. Using a Fourier transform algorithm, the module performs frequency domain analysis on the acquired data, extracting the period values ​​of the two signals. For example, the period of the reference signal typically corresponds to the reciprocal of the frequency of the excitation square wave. Subsequently, the period values ​​of the two signals are compared to detect any initial deviations, laying the foundation for subsequent calibration. This pre-acquisition process helps the system quickly enter a stable state, avoiding analysis errors caused by incomplete signals.

[0052] The signal synchronization calibration module focuses on alignment in the time dimension. Based on the period value extracted by the pre-acquisition module, it calculates the phase difference between the two signals. This module achieves precise alignment of the signal periods by dynamically adjusting the sampling timing, such as modifying the trigger delay of the acquisition unit or the software interpolation method. This adjustment ensures that the measured signal and the reference signal are completely synchronized on the time axis, with the error controlled within the nanosecond level, thus accurately capturing the occurrence time and duration of transient pulses during comparative analysis. Without this calibration, the measured signal in a radiation environment may be misaligned due to clock drift or transmission delay, affecting the correct identification of single-event effects.

[0053] The amplitude error calibration module is responsible for handling deviations in signal amplitude. It uses a reference digital signal as a standard and sets an allowable amplitude error range, such as ±3%. This module identifies and compensates for quantization errors and noise by comparing the peak or average amplitude of two signals. Specific methods include applying digital filtering or offset compensation algorithms to eliminate analog-to-digital conversion distortion and external electromagnetic interference during the acquisition process. This calibration improves the system's anti-interference capability, ensuring that weak single-event transient signals are not overwhelmed by noise, while preventing normal fluctuations from being misinterpreted as abnormal events.

[0054] As one feasible approach, the intelligent data analysis and judgment unit 104 includes a single-event transient pulse recognition module, configured to: adaptively set a dynamic recognition threshold X based on the peak amplitude of the reference digital signal, wherein the value of X ranges from 1% to 20%; compare the amplitude of the measured digital signal with the peak amplitude of the reference digital signal; when the amplitude of the measured digital signal exceeds (1+X) times the peak amplitude of the reference digital signal, and the duration of the over-amplitude state is not less than 10 microseconds, it is determined to be a positive single-event transient pulse; when the amplitude of the measured digital signal is lower than (1-X) times the peak amplitude of the reference digital signal, and the duration of the low-amplitude state is not less than 10 microseconds, it is determined to be a negative single-event transient pulse; amplitude fluctuations with a duration of less than 10 microseconds are determined to be noise interference.

[0055] One of the core components of the intelligent data analysis and judgment unit 104 is the single-event transient pulse recognition module. This module is designed to automatically detect and classify abnormal fluctuations in the tested digital signal, which are typically caused by single-event effects. This application employs an edge detection method, triggered by a rising or falling edge, to monitor the output signal of the chip under test in real time. By comparing the tested digital signal with a reference digital signal in real time, this module can accurately identify the type and characteristics of transient pulses, ensuring the reliability of the test results.

[0056] This module first adaptively sets a dynamic identification threshold X based on the peak amplitude of a reference digital signal. This threshold X is set between 1% and 20%, allowing for flexible adjustment based on the sensitivity of the chip under test and the ambient noise level. For example, in low-noise environments, a smaller X value can be selected to capture weaker signal deviations, while a larger X value is used in high-noise scenarios to reduce false positives. This adaptive mechanism enables the system to adapt to different types of integrated circuits, such as operational amplifiers or digital-to-analog converters, without requiring a manually preset fixed threshold.

[0057] Next, the module monitors for anomalies by comparing the amplitude of the measured digital signal with the peak amplitude of a reference digital signal. Specifically, it continuously tracks the voltage changes of the measured signal. If the amplitude of the measured digital signal exceeds 1 + X times the reference peak value, and the duration of this over-amplitude state is not less than 10 microseconds, it is identified as a positive single-event transient pulse. This positive transient typically manifests as a sudden increase in signal voltage, possibly caused by charge collection generated by high-energy particles at the chip's sensitive nodes.

[0058] Similarly, if the amplitude of the measured digital signal is less than 1 minus X times the reference peak value, and the duration of this low-amplitude state is not less than 10 microseconds, it is determined to be a negative single-event transient pulse. This negative transient corresponds to a brief drop in signal voltage, which is common in the response of some analog circuits. This module records the occurrence time, amplitude value, and duration of these transient pulses, providing data support for subsequent statistical analysis.

[0059] Furthermore, for amplitude fluctuations lasting less than 10 microseconds, the module uniformly classifies them as noise interference. This filtering mechanism avoids mistaking inherent circuit noise or transient interference for single-event effects, thereby improving the accuracy of identification and the overall robustness of the system. Through this quantification standard, the module effectively distinguishes transient signals from noise, ensuring the purity and reliability of test data.

[0060] As one possible implementation, the intelligent data analysis and judgment unit 104 includes a single-event function interruption judgment module, which is configured to: use the period of the reference digital signal as a time threshold; when the duration of a positive single-event transient pulse or a negative single-event transient pulse exceeds the period threshold, it is judged as a single-event function interruption.

[0061] The Single Event Detection (SED) module is designed to assess whether a single-event transient pulse evolves into a more severe SED, thus providing a quantitative criterion for radiation reliability testing of integrated circuits. By monitoring previously identified transient pulses, this module can distinguish between brief disturbances and persistent failures, ensuring the accuracy and objectivity of test results.

[0062] This module first uses the period of a reference digital signal as the time threshold. This period typically corresponds to the reciprocal of the excitation signal's frequency; for example, for a 100 Hz square wave signal, the period is ten milliseconds. The reference digital signal originates from a chip in a non-irradiated area, thus its period is stable and reliable, representing the signal characteristics under normal operating conditions. The selection of this threshold is based on practical experimental experience, ensuring it is sufficient to cover the typical duration of transient pulses while highlighting the unusual persistence of functional interruptions.

[0063] During the determination process, this module monitors the duration of identified positive or negative single-event transient pulses in real time. These transient pulses are amplitude deviation events detected by the previous module. If the duration of the transient pulse exceeds the period threshold of the reference signal, it is determined as a single-event interrupt. This interruption indicates that the chip's function has been significantly affected, which may lead to prolonged uncontrolled or complete failure of the output signal, thereby triggering a system alarm or recording the event.

[0064] Furthermore, the module's decision-making logic includes a boundary handling mechanism. For example, when a transient pulse spans multiple cycles, the counting is based on whether it covers a complete cycle. This design avoids duplicate or missed statistics, ensuring accurate quantification of interruption events. In this way, the module improves the intelligence level of the testing system, reduces manual intervention, and provides a reliable data foundation for subsequent statistical analysis.

[0065] As an feasible approach, the intelligent data analysis and judgment unit is also used to automatically count the following: the total number of positive / negative single-event transient pulses, the total number of single-event functional interruptions and their respective proportions; the number of positive / negative transient pulse occurrences and the triggering period and time distribution of functional interruptions within each signal cycle; the maximum / minimum amplitude, longest / shortest duration and occurrence time of positive / negative transient pulses.

[0066] The automatic statistical function of the intelligent data analysis and judgment unit 104 is an important extension of the entire system. After the test, it can comprehensively summarize and analyze the identified single-particle transient pulses and functional interruption events. The duration of the irradiation test can be defined by the user, enabling tests of any length between 100 seconds and 100 hours. This automated processing replaces traditional manual data processing methods, significantly improving testing efficiency and providing multi-dimensional data views to help users quickly evaluate the radiation resistance performance of integrated circuits.

[0067] First, this unit counts the total number of positive and negative single-event transients, as well as the total number of single-event interruptions, and calculates the proportions of these phenomena. Specifically, it sums the number of positive transient events, negative transient events, and interruption events that occur throughout the entire test period, and calculates metrics such as the proportion of positive transients or the ratio of interruption events to total transients. This overall statistical analysis helps users grasp the overall scale and type distribution of radiation effects; for example, in high-radiation environments, positive transients may account for a higher proportion, reflecting the chip's sensitivity to particle energy.

[0068] Secondly, this unit performs fine-grained statistics on events within each signal cycle, including the number of positive and negative transient pulses and the trigger cycle of functional interruptions. It divides the test time into intervals based on the reference signal cycle and counts relevant events within each interval. This intra-cycle statistics reveals the local density of phenomena; for example, an abnormally high number of transients within a certain cycle may indicate a peak in radiative flux, thus guiding users in analyzing the time-varying characteristics of the radiation source.

[0069] Furthermore, this unit analyzes the periodic and temporal distributions of phenomena. By generating distribution maps or heatmaps, it shows the frequency of transient pulses and functional interruptions occurring in different period intervals or test periods. This distribution analysis helps identify event clusters; for example, temporal distributions may show that radiation events occur in concentrated periods during the test, while periodic distributions can highlight vulnerabilities in certain signal phases, providing deeper reliability insights.

[0070] Finally, this unit records the maximum and minimum amplitudes, longest and shortest durations of positive and negative transient pulses, as well as the timestamps corresponding to these extreme values. It extracts peak data from all events and associates them with timestamps. This extreme value statistics provide key parameters for chip hardening design; for example, events with a longest duration exceeding a threshold may indicate the need for enhanced recovery mechanisms. Through these automated statistics, this unit ensures comprehensive and visually appealing data output, supporting report generation and subsequent optimization. This application can automatically generate standardized test reports, support data export (formats include Excel, CSV, and PDF), and visualize waveforms, statistical histograms, and trend curves.

[0071] Figure 2 This is a flowchart of a test method for accurate identification of single-event transient pulses and intelligent determination of functional interruptions in integrated circuits, provided in an embodiment of this application. This method can be performed by... Figure 1 The system execution is as shown. (For example...) Figure 2 As shown, the method may include the following steps:

[0072] Step 201: Provide the same operating power signal, analog excitation signal and digital control signal to the functional circuit of the chip under test and the functional circuit of the reference chip, so that the functional circuit of the chip under test and the functional circuit of the reference chip operate under the same operating conditions, wherein the functional circuit of the chip under test is located in the irradiation area and the functional circuit of the reference chip is located in the non-irradiation area.

[0073] Step 202: Synchronously acquire the test signal output by the functional circuit of the chip under test and the reference signal output by the functional circuit of the reference chip, and convert the acquired analog signal into a digital signal.

[0074] Step 203: Receive the digital signal, perform synchronous calibration processing on the digital signal under test and the reference digital signal, and perform single-event transient pulse identification and single-event function interruption determination on the digital signal under test based on the calibrated reference digital signal.

[0075] Step 204: Perform multi-dimensional statistical analysis on the results of single-event transient pulse identification and single-event functional interruption determination, and generate a test report.

[0076] As can be seen from the above steps, this application achieves closed-loop automated testing from signal excitation to data analysis through a systematic end-to-end design, significantly improving the accuracy, objectivity, and efficiency of single-event effect evaluation of analog / mixed-signal integrated circuits under extreme radiation environments. The method first uses co-source excitation to drive the chip under test and the reference chip placed in the irradiated and non-irradiated areas, ensuring that the two signals operate under the same conditions, eliminating circuit difference errors at the source. Then, high-quality digital signals are acquired through high-speed synchronous acquisition and analog-to-digital conversion, and precise synchronous calibration is performed to effectively eliminate clock drift, phase deviation, and amplitude quantization errors, providing a reliable benchmark for subsequent analysis. The core component, based on the calibrated reference digital signal, intelligently identifies single-event transient pulses and quantizes functional interruptions in the signal under test, clearly defining the boundary between transients and interruptions, reducing subjective misjudgments. Finally, multi-dimensional statistical analysis automatically summarizes the number of events, distribution characteristics, and extreme parameters, generating a standardized test report. This method not only captures abnormal fluctuations of mV-level micro-amplitude and microsecond-level narrow pulses, but also achieves comprehensive quantification and visualization of the effect phenomenon. It provides efficient and accurate data support for the verification, selection optimization and hardening design of single-event performance of chips in aerospace, nuclear industry and other fields, and greatly reduces manual intervention and testing cycle.

[0077] As an implementable approach, in step 202, when synchronously acquiring the test signal output by the functional circuit of the chip under test and the reference signal output by the functional circuit of the reference chip, the sampling rate is not less than 2MHz, the resolution is 16 bits, and the acquisition voltage range is -10V to 10V; distributed clock synchronization technology is adopted, and the synchronization error between acquisition channels is not greater than 10ns.

[0078] As one feasible approach, the synchronous calibration process includes: pre-acquiring at least one complete cycle of the measured digital signal and the reference digital signal; extracting the cycle values ​​of the measured digital signal and the reference digital signal based on the Fourier transform algorithm and comparing them;

[0079] If there is a period deviation between the measured digital signal and the reference digital signal, the sampling timing of the measured digital signal is dynamically adjusted based on the phase difference to achieve period alignment; the amplitude error of the measured digital signal is calibrated using the reference digital signal as the amplitude reference.

[0080] As one feasible approach, the single-event transient pulse identification includes: adaptively setting a dynamic identification threshold X based on the peak amplitude of the reference digital signal, wherein the value of X ranges from 1% to 20%; comparing the amplitude of the measured digital signal with the peak amplitude of the reference digital signal; when the amplitude of the measured digital signal exceeds (1+X) times the peak amplitude of the reference digital signal, and the duration of this over-amplitude state is not less than 10 microseconds, it is determined to be a positive single-event transient pulse; when the amplitude of the measured digital signal is lower than (1-X) times the peak amplitude of the reference digital signal, and the duration of this low-amplitude state is not less than 10 microseconds, it is determined to be a negative single-event transient pulse.

[0081] Amplitude fluctuations lasting less than 10 microseconds are considered noise interference.

[0082] As one feasible approach, the single-event function interruption determination includes: acquiring the period of the reference digital signal as a determination time threshold; monitoring the duration of the positive or negative single-event transient pulse; if the duration exceeds the determination time threshold, determining that a single-event function interruption has occurred; and automatically restarting the transient pulse identification and function interruption determination process starting from the next complete period of the reference digital signal after a function interruption determination.

[0083] As an feasible approach, multidimensional statistical analysis includes: the total number of positive / negative single-event transient pulses, the total number of single-event functional interruptions and their respective proportions; the number of positive / negative transient pulse occurrences and the triggering period and time distribution of functional interruptions within each signal period; the maximum / minimum amplitude, longest / shortest duration and occurrence time of positive / negative transient pulses.

[0084] The systems and methods provided in the embodiments of this application have the following beneficial effects:

[0085] 1. Breakthrough improvement in recognition accuracy: Through 16-bit high-resolution acquisition, dynamic threshold recognition and noise suppression algorithm, it can accurately capture transient signals with an amplitude of 0.305mV and a width of 10 microseconds. The accuracy of positive / negative transient classification and recognition is ≥99.5%, which solves the pain point of existing technology that "cannot distinguish transient types and misses small amplitude signals".

[0086] 2. Quantitative and unified judgment criteria: Establish a dual judgment model based on "amplitude threshold + time threshold", clarify the boundary between single-event transient and functional interruption, eliminate the subjectivity of manual judgment, the judgment delay is ≤1 microsecond, and the false judgment rate is reduced to below 0.5%;

[0087] 3. Significantly improved testing efficiency: It replaces the traditional manual data analysis mode, realizes the automated collection, identification, statistics and report generation of test data, and reduces the data analysis time from several hours to minutes, improving testing efficiency by more than 10 times;

[0088] 4. Strong anti-interference capability: Adopting a dual anti-interference mechanism of "hardware synchronization + software calibration" combined with noise suppression technology, it can maintain stable test performance even in complex electromagnetic environments, with data reliability ≥99%;

[0089] 5. Wide compatibility: It is compatible with different types of integrated circuits with different operating parameters, and can meet the single-event test requirements of various devices such as operational amplifiers, power conversion chips, DACs / ADCs. The core test parameters (sampling rate, threshold ratio, test duration) can be flexibly configured, making it highly versatile.

[0090] 6. Significant engineering value: It provides comprehensive and accurate data support for evaluating the single-event effect resistance of integrated circuits used in extreme environments. It can be directly applied to the selection, verification and hardening design of aerospace-grade and nuclear-grade electronic devices, effectively reducing the risk of on-orbit failure of electronic systems, and has important engineering application prospects and economic value.

[0091] The foregoing has described specific embodiments of this specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims may be performed in a different order than that shown in the embodiments and may still achieve the desired result. Furthermore, the processes depicted in the drawings do not necessarily require the specific or sequential order shown to achieve the desired result. In some embodiments, multitasking and parallel processing are possible or may be advantageous.

[0092] The various embodiments in this specification are described in a progressive manner. Similar or identical parts between embodiments can be referred to mutually. Each embodiment focuses on its differences from other embodiments. In particular, the system embodiments are basically similar to the method embodiments, so the description is relatively simple; relevant parts can be referred to the descriptions in the method embodiments. The system embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. Components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without creative effort.

[0093] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties. Furthermore, the collection, use and processing of the relevant data must comply with the relevant laws, regulations and standards of the relevant countries and regions, and corresponding operation entry points are provided for users to choose to authorize or refuse.

[0094] As can be seen from the above description of the embodiments, those skilled in the art can clearly understand that this application can be implemented by means of software plus necessary general-purpose hardware platforms. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a computer program product. This computer program product can be stored in a storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in various embodiments or some parts of the embodiments of this application.

[0095] The technical solutions provided in this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the methods and core ideas of this application. Furthermore, those skilled in the art will recognize that, based on the ideas of this application, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A system for accurate identification of single-event transient pulses and intelligent determination of function interruptions in integrated circuits, characterized in that, The system includes: The signal generation and control unit is used to provide the chip under test and the reference chip with the same source of working power signals, analog excitation signals and digital control signals; The functional circuit unit of the chip under test and the reference chip includes a functional circuit of the chip under test and a functional circuit of the reference chip with identical structures. The functional circuit of the chip under test is located in the irradiation area, and the functional circuit of the reference chip is located in the non-irradiation area. Both receive the same source excitation signal and output the test signal and the reference signal respectively. A high-speed multi-channel synchronous analog-to-digital converter acquisition unit is used to synchronously acquire the measured signal and the reference signal, and convert them into digital signals to obtain the measured digital signal and the reference digital signal. The intelligent data analysis and judgment unit is used to receive the measured digital signal and the reference digital signal, and to perform synchronous calibration, single-event transient pulse identification, single-event functional interruption judgment, and multi-dimensional statistical analysis and report generation on the measured digital signal and the reference digital signal.

2. The system according to claim 1, characterized in that, The high-speed multi-channel synchronous analog-to-digital converter acquisition unit is configured as follows: The sampling rate is no less than 2MHz, the resolution is 16-bit, and the sampling voltage range is -10V to 10V. Using distributed clock synchronization technology, the synchronization error between acquisition channels is no greater than 10 nanoseconds.

3. The system according to claim 1, characterized in that, The intelligent data analysis and judgment unit includes: The pre-acquisition module is used to acquire at least one complete cycle of the measured digital signal and the reference digital signal, and extract and compare the cycle values ​​of the two signals based on the Fourier transform algorithm. The signal synchronization calibration module is used to adjust the sampling timing based on the phase difference to achieve precise alignment of the signal period; The amplitude error calibration module is used to set the allowable amplitude error range with the reference digital signal as a reference, thereby eliminating the effects of quantization error and noise.

4. The system according to claim 1, characterized in that, The intelligent data analysis and judgment unit includes a single-particle transient pulse recognition module, which is configured as follows: Based on the peak amplitude of the reference digital signal, an adaptive dynamic identification threshold X is set, wherein the value of X ranges from 1% to 20%. Compare the amplitude of the measured digital signal with the peak amplitude of the reference digital signal; When the amplitude of the measured digital signal exceeds (1+X) times the peak value of the reference digital signal, and the duration of the over-amplitude state is not less than 10 microseconds, it is determined to be a positive single-event transient pulse. When the amplitude of the measured digital signal is less than (1-X) times the peak value of the reference digital signal, and the duration of the low amplitude state is not less than 10 microseconds, it is determined to be a negative single-particle transient pulse. Amplitude fluctuations lasting less than 10 microseconds are considered noise interference.

5. The system according to claim 1, characterized in that, The intelligent data analysis and judgment unit includes a single-particle function interruption judgment module, which is configured as follows: The period of the reference digital signal is used as the time threshold; When the duration of a positive or negative single-event transient pulse exceeds the period threshold, it is determined to be a single-event function interruption.

6. The system according to any one of claims 1, characterized in that, The intelligent data analysis and judgment unit is also used to statistically analyze the following: Total number of positive / negative single-event transient pulses, total number of single-event interrupts, and their respective proportions; The number of positive / negative transient pulses occurring within each signal cycle, and the triggering period and time distribution of the function interruption; Maximum / minimum amplitude, longest / shortest duration and time of occurrence of positive / negative transient pulses.

7. A method for accurate identification of single-event transient pulses and intelligent determination of function interruptions in integrated circuits, characterized in that, The method includes: The test chip functional circuit and the reference chip functional circuit are provided with the same source of working power supply signal, analog excitation signal and digital control signal, so that the test chip functional circuit and the reference chip functional circuit operate under the same working conditions, wherein the test chip functional circuit is located in the irradiation area and the reference chip functional circuit is located in the non-irradiation area. The test signal output by the functional circuit of the chip under test and the reference signal output by the functional circuit of the reference chip are acquired simultaneously, and the acquired analog signals are converted into digital signals. The system receives the digital signal, performs synchronous calibration on the digital signal under test and the reference digital signal, and performs single-event transient pulse identification and single-event functional interruption determination on the digital signal under test based on the calibrated reference digital signal. The results of single-event transient pulse identification and single-event functional interruption determination are subjected to multi-dimensional statistical analysis, and a test report is generated.

8. The method according to claim 7, characterized in that, The synchronous calibration process includes: At least one complete cycle of the measured digital signal and the reference digital signal is pre-acquired; The period values ​​of the measured digital signal and the reference digital signal are extracted and compared based on the Fourier transform algorithm; If there is a period deviation between the measured digital signal and the reference digital signal, the sampling timing of the measured digital signal is dynamically adjusted based on the phase difference to achieve period alignment. Using the reference digital signal as the amplitude reference standard, the amplitude error of the measured digital signal is calibrated.

9. The method according to claim 7, characterized in that, The single-particle transient pulse identification includes: Based on the peak amplitude of the reference digital signal, an adaptive dynamic identification threshold X is set, wherein the value of X ranges from 1% to 20%. Compare the amplitude of the measured digital signal with the peak amplitude of the reference digital signal; When the amplitude of the measured digital signal exceeds (1+X) times the peak value of the reference digital signal, and the duration of the over-amplitude state is not less than 10 microseconds, it is determined to be a positive single-event transient pulse. When the amplitude of the measured digital signal is less than (1-X) times the peak value of the reference digital signal, and the duration of the low amplitude state is not less than 10 microseconds, it is determined to be a negative single-particle transient pulse. Amplitude fluctuations lasting less than 10 microseconds are considered noise interference.

10. The method according to claim 7, characterized in that, The single-event function interruption determination includes: The period of the reference digital signal is used as the time threshold for judgment; Monitor the duration of the positive or negative single-event transient pulse; If the duration exceeds the determination time threshold, a single-particle function interruption is determined to have occurred. After a function interruption determination, the transient pulse identification and function interruption determination process is automatically restarted starting from the next complete cycle of the reference digital signal.

Images