On-chip quantum light source test calibration method, system, device and storage medium

Abstract

This invention provides a method, system, device, and storage medium for testing and calibrating an on-chip quantum light source, belonging to the field of integrated photonics technology. The method includes: acquiring correlated measurement data and Franson interferometric measurement data of the on-chip quantum light source, and extracting time correlation information and interference phase parameters for each frequency channel based on the correlated measurement data and Franson interferometric measurement data; determining the time delay relationship between each frequency channel and constructing a unified time reference for aligning the interference phase parameters; constructing a frequency-phase relationship model and performing correction processing on the interference phase parameters to obtain standardized interference phase parameters; and generating calibration results and consistency evaluation results for each frequency channel based on the standardized interference phase parameters. This invention achieves quantitative characterization and consistent calibration of the entanglement performance of multi-frequency channel quantum light sources, thereby improving phase consistency between channels and obtaining overall consistency evaluation results.

Description

Technical Field

[0001] This invention relates to the field of integrated photonics technology, and more specifically to an on-chip quantum light source testing and calibration method, system, device, and storage medium. Background Technology

[0002] As the application of on-chip integrated quantum light sources in quantum communication, quantum computing, and quantum precision measurement continues to advance, multi-frequency channel entangled light sources based on micro-ring resonant structures or lithium niobate waveguide structures are gradually becoming the mainstream implementation path. In engineering implementation, to improve photon yield and information carrying capacity, it is usually necessary to simultaneously generate entangled photon pairs across multiple frequency channels on the same chip. However, due to factors such as fabrication process fluctuations, device structural inhomogeneities, and temperature drift, differences in time delay, phase response, and interference characteristics are prevalent among different frequency channels.

[0003] Existing testing methods primarily rely on correlation measurements and Franson interferometers to verify entanglement characteristics. For example, second-order correlation functions are used to determine the correlation of photon pairs, and the visibility of interference fringes is used to determine whether energy-time entanglement exists. These methods can complete basic performance assessments under single-channel conditions, but in multi-channel scenarios, the test results often exhibit significant dispersion. The lack of a unified reference benchmark between different channels makes it difficult to conduct cross-sectional comparisons and consistency evaluations of the test data.

[0004] Furthermore, in actual testing, there are non-negligible time response differences between each frequency channel, and the interference phase is also affected by frequency-dependent dispersion, causing coupling deviations in the position and phase shift of the interference fringes as the frequency changes. Existing solutions typically only compensate for individual channels independently, lacking a unified modeling and calibration mechanism for the overall relationship of multiple channels, making it difficult to achieve phase alignment and consistent calibration across channels.

[0005] Therefore, how to construct a unified time reference and eliminate the coupling effect between frequency and phase under multi-frequency channel conditions, and achieve unified calibration and consistency evaluation of interference phase parameters of each frequency channel, has become an urgent problem to be solved in the current on-chip quantum light source testing process. Summary of the Invention

[0006] The purpose of this invention is to provide an on-chip quantum light source testing and calibration method, system, device, and storage medium to at least solve the problems of inconsistent time references and difficulty in aligning and evaluating interference phase parameters due to frequency and phase coupling during multi-frequency channel quantum light source testing.

[0007] To achieve the above objectives, a first aspect of the present invention provides a method for testing and calibrating an on-chip quantum light source. The method includes: acquiring correlated measurement data and Franson interferometric measurement data of the on-chip quantum light source; extracting time correlation information and interference phase parameters corresponding to each frequency channel based on the correlated measurement data and the Franson interferometric measurement data; determining the time delay relationship between each frequency channel based on the time correlation information; constructing a unified time reference based on the time delay relationship to align the interference phase parameters; constructing a frequency-phase relationship model based on the aligned interference phase parameters; performing correction processing on the interference phase parameters based on the frequency-phase relationship model to obtain standardized interference phase parameters; and generating calibration results and consistency evaluation results corresponding to each frequency channel based on the standardized interference phase parameters.

[0008] Optionally, extracting time correlation information and interference phase parameters for each frequency channel based on the correlated measurement data and the Franson interferometric measurement data includes: constructing a time coincidence count sequence for each frequency channel based on the correlated measurement data, and calculating the coincidence count values ​​under different time delays according to the time coincidence count sequence to form a time correlation function for each frequency channel, and determining the time correlation information for each frequency channel based on the time correlation function; obtaining interference fringe data for each frequency channel based on the Franson interferometric measurement data, and performing periodic fitting processing on the interference fringe data to determine the fringe phase offset, and extracting the interference phase parameters for each frequency channel based on the fringe phase offset.

[0009] Optionally, determining the time delay relationship between each frequency channel based on the time correlation information includes: obtaining the time correlation function corresponding to each frequency channel based on the time correlation information, and performing peak search processing on each time correlation function to determine the maximum coincidence count position of each frequency channel under different time delays, and using the time delay value corresponding to the maximum coincidence count position as the relative time delay between each frequency channel; constructing a time delay difference relationship set based on the relative time delay between each frequency channel, and establishing a time delay relationship model corresponding to each frequency channel according to the time delay difference relationship set to characterize the relative time offset relationship between each frequency channel; selecting a preset reference channel based on the time delay relationship model, and using the time delay corresponding to the preset reference channel as a benchmark, performing uniform offset processing on the time delay of the remaining frequency channels to obtain the time delay relationship between each frequency channel.

[0010] Optionally, a unified time reference is constructed based on the time delay relationship to align the interference phase parameters, including: obtaining the time delay value of each frequency channel relative to a preset reference channel based on the time delay relationship, and constructing a unified time reference sequence based on the time delay value to characterize the time alignment position of each frequency channel under the unified time reference; performing remapping processing on the time coordinates corresponding to the interference phase parameters based on the unified time reference sequence to map the interference phase parameters of each frequency channel to the time reference position corresponding to the unified time reference sequence to obtain the initially aligned interference phase parameters; and eliminating the phase offset component introduced by the time delay difference based on the initially aligned interference phase parameters to obtain the time-aligned interference phase parameters.

[0011] Optionally, constructing a frequency-phase relationship model based on the aligned interference phase parameters includes: obtaining phase data sequences for each frequency channel based on the aligned interference phase parameters, and obtaining frequency parameters for each frequency channel to construct a frequency-phase data pair set; performing function fitting processing on the relationship between frequency and interference phase based on the frequency-phase data pair set to obtain an initial frequency-phase relationship function characterizing the change of interference phase with frequency; performing residual analysis processing on the aligned interference phase parameters based on the initial frequency-phase relationship function to determine the frequency-related coupling offset component in the interference phase parameters, and performing correction processing on the initial frequency-phase relationship function according to the coupling offset component to obtain a frequency-phase relationship model.

[0012] Optionally, the interference phase parameters are corrected based on the frequency-phase relationship model to obtain standardized interference phase parameters. This includes: obtaining the phase correction function for each frequency channel based on the frequency-phase relationship model, and inputting the aligned interference phase parameters into the phase correction function to calculate the phase compensation amount for each frequency channel; performing compensation processing on the aligned interference phase parameters based on the phase compensation amount to eliminate the frequency-related coupling offset component in the interference phase parameters, and obtaining initially corrected interference phase parameters; and performing constraint processing on the phase consistency between each frequency channel based on the initially corrected interference phase parameters to further eliminate residual phase deviations between channels, and obtaining standardized interference phase parameters.

[0013] Optionally, generating calibration results and consistency evaluation results for each frequency channel based on the standardized interferometric phase parameters includes: obtaining phase stability parameters for each frequency channel based on the standardized interferometric phase parameters, and determining single-channel entanglement characterization parameters for each frequency channel in conjunction with the interferometric visibility of each frequency channel; constructing a cross-frequency channel consistency evaluation parameter set based on the single-channel entanglement characterization parameters of each frequency channel, and determining the phase consistency deviation between each frequency channel according to the consistency evaluation parameter set to characterize the entanglement consistency level between each frequency channel; performing channel-level calibration processing on the standardized interferometric phase parameters based on the phase consistency deviation to generate calibration results for each frequency channel; and outputting the overall consistency evaluation result for the corresponding on-chip quantum light source based on the consistency evaluation parameter set.

[0014] A second aspect of the present invention provides an on-chip quantum light source testing and calibration system, the system comprising: a data acquisition unit, configured to acquire correlated measurement data and Franson interferometric measurement data of the on-chip quantum light source, and extract time correlation information and interference phase parameters corresponding to each frequency channel based on the correlated measurement data and the Franson interferometric measurement data; an alignment unit, configured to determine the time delay relationship between each frequency channel based on the time correlation information, and construct a unified time reference according to the time delay relationship to align the interference phase parameters; a model construction unit, configured to construct a frequency-phase relationship model based on the aligned interference phase parameters, and perform correction processing on the interference phase parameters based on the frequency-phase relationship model to obtain standardized interference phase parameters; and a result output unit, configured to generate calibration results and consistency evaluation results corresponding to each frequency channel based on the standardized interference phase parameters.

[0015] A third aspect of the present invention provides an electronic device, comprising: one or more processors; and a storage device having stored one or more programs thereon, wherein when the one or more programs are executed by the one or more processors, the one or more processors implement the on-chip quantum light source test and calibration method as described above.

[0016] On the other hand, the present invention provides a computer-readable storage medium storing instructions that, when executed on a computer, cause the computer to perform the above-described on-chip quantum light source test and calibration method.

[0017] Through the above technical solution, this invention extracts the time correlation information and interference phase parameters of each frequency channel by jointly processing the correlated measurement data and Franson interferometric measurement data of the on-chip quantum light source. Based on this, a unified time reference is constructed to achieve time alignment between different frequency channels. Furthermore, by establishing a frequency-phase relationship model, the coupling deviation introduced by frequency-related factors in the interference phase parameters is corrected to obtain standardized interference phase parameters. Based on these standardized interference phase parameters, calibration results for each frequency channel are generated, and cross-channel consistency evaluation is conducted. This ensures that the test results of the multi-frequency channel quantum light source have a unified benchmark and comparability, improving the reliability and consistency of the test results.

[0018] Other features and advantages of the embodiments of the present invention will be described in detail in the following detailed description section. Attached Figure Description

[0019] The accompanying drawings are provided to further illustrate embodiments of the present invention and form part of the specification. They are used together with the following detailed description to explain the embodiments of the present invention, but do not constitute a limitation thereof. In the drawings: Figure 1 This is a flowchart of the steps of an on-chip quantum light source testing and calibration method provided in one embodiment of the present invention; Figure 2 This is a system structure diagram of an on-chip quantum light source testing and calibration system provided in one embodiment of the present invention; Figure 3 This is an internal structural diagram of a computer device provided in one embodiment of the present invention. Detailed Implementation

[0020] The specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are for illustration and explanation only and are not intended to limit the present invention.

[0021] like Figure 1 As shown, this invention provides an on-chip quantum light source testing and calibration method, the method comprising: Step S10: Obtain the correlation measurement data and Franson interferometric measurement data of the on-chip quantum light source, and extract the time correlation information and interference phase parameters of each frequency channel based on the correlation measurement data and Franson interferometric measurement data.

[0022] Specifically, based on correlated measurement data and Franson interferometric measurement data, time correlation information and interference phase parameters for each frequency channel are extracted. This includes: constructing a time coincidence count sequence for each frequency channel based on the correlated measurement data, and statistically analyzing the coincidence count values ​​under different time delays according to the time coincidence count sequence to form a time correlation function for each frequency channel, and determining the time correlation information for each frequency channel based on the time correlation function; obtaining interference fringe data for each frequency channel based on the Franson interferometric measurement data, and performing periodic fitting processing on the interference fringe data to determine the fringe phase offset, and extracting the interference phase parameters for each frequency channel based on the fringe phase offset.

[0023] In this embodiment of the invention, correlated measurement data and Franson interferometric measurement data are processed uniformly to form time correlation information and interference phase parameters for each frequency channel. This process revolves around time statistical characteristics and interference fringe structure, and by structuring the measurement data, different frequency channels have comparable parameter forms.

[0024] For correlated measurement data, photon arrival events are recorded using time stamping, and the time axis is discretized according to a preset time resolution. On the discrete time axis, a coincidence count sequence is constructed with time delay as the variable. This coincidence count sequence represents the joint count under different time delay conditions. Furthermore, with time delay as the independent variable and the coincidence count value under the corresponding time delay as the function value, a time correlation function is formed. The time correlation function can be expressed as: ; in, Indicates a time delay. and These represent the two detection channels at time [time]. The photon counting signal, Indicates a time delay of The value of the second-order correlation function under the given conditions. Through... Analyze the distribution and extract the peak positions. As the time correlation center of this frequency channel, the full width at half maximum (FWHM) parameter is also extracted. As a time extension feature, the time correlation information of the corresponding frequency channel is obtained.

[0025] For Franson interferometry data, interference fringe data are obtained for each frequency channel. The interference fringe data appears as a counting sequence that varies with phase modulation. Using phase as the independent variable and the corresponding counting results as the function value, the interference fringe function is formed. It can be represented as: ; in, Indicates the modulation phase. Indicates the average count intensity. Indicates the visibility of interference. This represents the phase shift. The phase shift is extracted by performing period fitting on the interference fringe function. The phase offset is used as the interference phase parameter for the corresponding frequency channel.

[0026] After extracting the time correlation information and interference phase parameters, the two types of parameters are correlated according to frequency channels to form a unified data description structure. This data structure contains both time and phase dimension information and serves as input for subsequent time delay relationship calculations and phase alignment processing.

[0027] In one specific implementation, the on-chip quantum light source operates in the 1550nm band, with eight frequency channels configured, each spaced 100GHz apart. The time resolution is set to 50ps, and 10 samples are collected at each frequency channel. 6 The arrival of secondary photons forms a time-stamped sequence. Based on the time-stamped sequence, a coincidence counting sequence with a time delay range of [-2ns, 2ns] is constructed, and the corresponding second-order correlation function is calculated. In a certain frequency channel, the peak position is obtained. Half height and width This allows us to determine the time-related information of the channel.

[0028] Meanwhile, during the Franson interferometry process, the phase range... A uniform scan is performed to collect the corresponding count data. The parameters of the interference fringe function are obtained through fitting, where the fitting result for a certain frequency channel is: visibility. Phase offset .Will This serves as the interference phase parameter for the channel.

[0029] Step S20: Determine the time delay relationship between each frequency channel based on the time correlation information, and construct a unified time reference based on the time delay relationship to align the interference phase parameters.

[0030] Specifically, determining the time delay relationship between frequency channels based on time correlation information includes: obtaining the time correlation function for each frequency channel based on the time correlation information, and performing peak search processing on each time correlation function to determine the maximum coincidence count position for each frequency channel under different time delays, and using the time delay value corresponding to the maximum coincidence count position as the relative time delay between each frequency channel; constructing a time delay difference relationship set based on the relative time delay between each frequency channel, and establishing a time delay relationship model for each frequency channel based on the time delay difference relationship set to characterize the relative time offset relationship between each frequency channel; selecting a preset reference channel based on the time delay relationship model, and using the time delay corresponding to the preset reference channel as a benchmark, performing uniform offset processing on the time delay of the remaining frequency channels to obtain the time delay relationship between each frequency channel.

[0031] Furthermore, a unified time reference is constructed based on the time delay relationship to align the interferometric phase parameters. This includes: obtaining the time delay value of each frequency channel relative to a preset reference channel based on the time delay relationship, and constructing a unified time reference sequence based on the time delay value to characterize the time alignment position of each frequency channel under the unified time reference; performing remapping processing on the time coordinates corresponding to the interferometric phase parameters based on the unified time reference sequence to map the interferometric phase parameters of each frequency channel to the time reference position corresponding to the unified time reference sequence, thereby obtaining the initially aligned interferometric phase parameters; and eliminating the phase offset component introduced by the time delay difference based on the initially aligned interferometric phase parameters to obtain the time-aligned interferometric phase parameters.

[0032] In this embodiment of the invention, the determination of the time delay relationship depends on the time correlation function corresponding to each frequency channel. The time correlation function has been constructed from the coincidence counting sequence in the previous processing stage, and its distribution structure on the time axis reflects the joint response characteristics of photon pairs under different time delay conditions. For each frequency channel, there is a corresponding time correlation function curve, which typically exhibits a significant peak near a certain time delay. The position of this peak corresponds to the most likely time difference of photon pair arrival and can therefore be used as a time reference characteristic quantity for that frequency channel.

[0033] In the specific processing, peak search is performed on the time correlation function of each frequency channel. Peak search can be achieved through sliding window comparison or local extremum detection. For the time correlation function... Its peak position can be represented as: ; in, Indicates the first One frequency channel, Indicates the corresponding frequency channel The position with the maximum coincidence count. The time delay value corresponding to this position is the time response center of this channel.

[0034] After obtaining the peak positions of each frequency channel, the time differences between different frequency channels are combined to form a set of time delay difference relationships. Specifically, this can be represented as: ; in, Indicates frequency channel With frequency channel The relative time delay between them Indicates the corresponding frequency channel The maximum coincidence count position. By pairwise combining all frequency channels, a complete set of time delay difference relationships can be obtained. This set reflects the overall time offset structure between frequency channels, rather than isolated single-channel characteristics.

[0035] Based on the set of time delay difference relationships, a time delay relationship model can be established. The goal of this model is to assign a time offset under a unified reference to each frequency channel, such that the time difference between any two channels satisfies the aforementioned difference relationship. This problem can be transformed into a consistency constraint solution process, expressed as follows: ; in, Indicates frequency channel Time offset under a unified time reference Indicates frequency channel Time offset under a unified time reference Indicates frequency channel With frequency channel The time delay representation under a unified time reference. By solving this system of equations, the time delay representations of all frequency channels under a unified reference can be obtained. To avoid redundant degrees of freedom, one frequency channel is selected as the reference channel, for example, set as follows: The time delay values ​​of the remaining channels are determined relative to this reference channel.

[0036] After solving the time delay relationship model, the set of time delay values ​​for each frequency channel relative to the reference channel can be obtained. ,in, This indicates the number of frequency channels. This set forms the basis of a unified time reference.

[0037] Based on this, a unified time reference series is constructed. It can be represented as a set of discrete-time coordinates: ; in, Represents the first under a unified time base Each time sampling point. For each frequency channel, its original time coordinates. By time offset Mapped to a unified time reference: ; Through the above mapping, the time axes of different frequency channels are aligned to the same time reference system, thereby achieving time alignment.

[0038] After constructing the time reference, a time coordinate remapping process is performed on the interferometric phase parameters. Since the interferometric phase parameters are typically related to the time scanning process, their corresponding data points implicitly contain time dimension information. By replacing the original time coordinates with time coordinates under a unified time reference, the interferometric phase parameters of different frequency channels can be mapped to the same time reference position, resulting in an initially aligned set of interferometric phase parameters.

[0039] Furthermore, considering that the time delay difference introduces additional phase shift, compensation processing is required for the initially aligned interference phase parameters. The phase and time satisfy the following relationship: ; in, Indicates phase, This indicates the angular frequency of the corresponding frequency channel. This indicates a time delay. Therefore, for a frequency channel... The phase shift introduced by the time offset can be expressed as: ; Based on this relationship, the initially aligned interference phase parameters Perform phase compensation processing: ; in, This represents the interference phase parameters after time alignment.

[0040] In one specific implementation, consider an on-chip quantum light source with eight frequency channels, each channel having a center frequency spacing of 100 GHz. The peak positions of each channel are calculated using a time correlation function as follows: ; If the first channel is selected as the reference channel and its time delay is set to 0, then the time delays of the remaining channels are as follows: ; get: ; Based on the aforementioned time delay values, a remapping process is performed on the time coordinates of each channel, and the phase compensation is further calculated. For example, for a channel with a center frequency of 193.5 THz, its angular frequency is: ; If the time delay of this channel is 40 ps, ​​then the corresponding phase offset is: ; After subtracting the phase offset from the original interference phase, the aligned interference phase parameters are obtained.

[0041] Through the above processing, the interference phases of different frequency channels can be uniformly mapped to the same time reference system, and the phase shift introduced by the time delay difference can be eliminated, so that the phase parameters of each channel have a unified reference, providing a stable input for subsequent frequency-phase relationship modeling and consistency evaluation.

[0042] Step S30: Construct a frequency-phase relationship model based on the aligned interference phase parameters, and perform correction processing on the interference phase parameters based on the frequency-phase relationship model to obtain standardized interference phase parameters.

[0043] Specifically, a frequency-phase relationship model is constructed based on the aligned interferometric phase parameters, including: obtaining the phase data sequence of each frequency channel based on the aligned interferometric phase parameters, and obtaining the frequency parameters of each frequency channel to construct a frequency-phase data pair set; performing function fitting processing on the relationship between frequency and interferometric phase based on the frequency-phase data pair set to obtain an initial frequency-phase relationship function characterizing the change of interferometric phase with frequency; performing residual analysis processing on the aligned interferometric phase parameters based on the initial frequency-phase relationship function to determine the frequency-related coupling offset component in the interferometric phase parameters, and performing correction processing on the initial frequency-phase relationship function according to the coupling offset component to obtain the frequency-phase relationship model.

[0044] Furthermore, the interference phase parameters are corrected based on the frequency-phase relationship model to obtain standardized interference phase parameters. This includes: obtaining the phase correction function for each frequency channel based on the frequency-phase relationship model, and inputting the aligned interference phase parameters into the phase correction function to calculate the phase compensation amount for each frequency channel; performing compensation processing on the aligned interference phase parameters based on the phase compensation amount to eliminate the frequency-related coupling offset component in the interference phase parameters and obtain the initially corrected interference phase parameters; and performing constraint processing on the phase consistency between each frequency channel based on the initially corrected interference phase parameters to further eliminate residual phase deviations between channels and obtain standardized interference phase parameters.

[0045] In this embodiment of the invention, the aligned interference phase parameters are already under a unified time reference, and the time reference differences between different frequency channels have been eliminated. At this point, the main source of difference between phase parameters shifts to frequency-dependent factors. The goal of this stage is to characterize the intrinsic law of interference phase variation with frequency, and based on this law, to correct the coupling offset in the phase, so that the phase parameters of each frequency channel have a unified scale.

[0046] The modeling process is used to extract the structural relationship between frequency and phase, and the correction process is used to eliminate the non-ideal offset components introduced into this relationship, thereby obtaining the standardized interference phase parameters.

[0047] The frequency-phase relationship model is constructed based on the aligned interference phase parameters of each frequency channel, while also introducing the frequency parameters of the corresponding frequency channels. Each frequency channel can be represented as a set of data pairs: ; in, Indicates the first The center frequency of each frequency channel This represents the corresponding aligned interference phase parameters. The above data sets constitute a frequency-phase data pair set.

[0048] Based on the frequency-phase data set, a function fitting process is performed on the relationship between frequency and interference phase. Considering that the phase response in optical systems usually has a polynomial relationship with frequency, a low-order polynomial model can be used. To express: ; in, The parameters to be fitted are... This represents the order of the polynomial. In engineering applications, it is usually chosen as... or To achieve a balance between fitting accuracy and computational complexity, the parameters of the above model are estimated using the least squares method, minimizing the error of the fitting function across all frequency channels.

[0049] After fitting, the initial frequency-phase relationship function is obtained. : ; in, , This represents the parameters obtained from the fitting.

[0050] After obtaining the initial fitting function, residual analysis is performed on the aligned interferometric phase parameters. The residual is defined as the difference between the actual measured phase and the fitted phase. ; Residual sequence It is used to characterize the parts that the model cannot explain, which usually come from frequency-related non-ideal coupling effects, such as phase shifts caused by dispersion, device non-uniformity, and measurement errors.

[0051] Statistical analysis of the residual sequence can extract regularly occurring components. Specifically, this involves smoothing or performing a quadratic fitting on the residual sequence to separate the frequency-dependent coupled offset components. It can be represented as: ; The coupled offset component is combined with the initial fitting function to obtain the corrected frequency-phase relationship model. : ; The frequency-phase relationship model can more accurately characterize the correspondence between frequency and phase in a real system.

[0052] After model construction is completed, the phase correction processing stage begins. This stage, based on the frequency-phase relationship model, calculates the corresponding phase correction function for each frequency channel. For the... For each frequency channel, its phase correction function can be expressed as: This function outputs the phase value of the corresponding frequency channel under ideal conditions. Based on this value, the phase compensation amount can be calculated: ; in, This indicates the phase offset that needs to be compensated in this channel.

[0053] Based on the phase compensation amount, compensation processing is performed on the aligned interference phase parameters: ; in, This represents the interference phase parameters after initial correction. After this step, the frequency-dependent coupling offset components are effectively eliminated.

[0054] Based on this, a constraint process is performed on the phase consistency between each frequency channel. The goal of this process is to further reduce residual differences between channels, ensuring that the phase distribution of all channels revolves around a unified reference value. Specifically, this involves calculating the average phase of all channels: ; And perform consistency constraint adjustments for each channel: ; Obtain the standardized interferometric phase parameters This set of parameters provides a unified phase reference across all frequency channels.

[0055] In one specific implementation, consider 8 frequency channels, with center frequencies as follows: ; The corresponding aligned interference phase parameters are: ; Performing a quadratic polynomial fit on the above data yields: ; After calculating the residuals, the coupled offset components are extracted and a correction model is constructed. Based on this model, the phase compensation is calculated, and compensation processing is performed on the original phase to obtain the initial correction results. ; After further performing consistency constraint processing, the standardized interference phase parameters are obtained: ; Through the above processing, the interference phase of each frequency channel is uniformly mapped to the same reference value, eliminating frequency-related coupling deviations and residual differences between channels.

[0056] This implementation method enables unified correction of the phase parameters of multi-frequency channel interference, giving them a consistent phase reference and providing a reliable data foundation for subsequent consistency assessment and system optimization.

[0057] Step S40: Generate calibration results and consistency evaluation results for each frequency channel based on standardized interference phase parameters.

[0058] Specifically, phase stability parameters for each frequency channel are obtained based on standardized interferometric phase parameters, and single-channel entanglement characterization parameters for each frequency channel are determined by combining the interferometric visibility of each frequency channel. A set of cross-frequency channel consistency evaluation parameters is constructed based on the single-channel entanglement characterization parameters of each frequency channel, and the phase consistency deviation between each frequency channel is determined according to the set of consistency evaluation parameters to characterize the entanglement consistency level between each frequency channel. Channel-level calibration processing is performed on the standardized interferometric phase parameters based on the phase consistency deviation to generate calibration results for each frequency channel. The overall consistency evaluation result of the corresponding on-chip quantum light source is output based on the set of consistency evaluation parameters.

[0059] In this embodiment of the invention, during the parameter construction process, standardized interferometric phase parameters are used as input to extract phase stability parameters for each frequency channel. The phase stability parameters describe the degree of phase fluctuation within the sampling period and can be obtained statistically from phase sequences obtained from multiple measurements. For example, for the first... Each frequency channel has a phase stability parameter It can be represented as: ; in, Indicates the first The frequency channel in the first Standardized interferometric phase parameters in this measurement This indicates the average phase of the channel. This indicates the number of measurements. This parameter reflects the level of phase jitter; the smaller the value, the higher the phase stability.

[0060] Based on this, the interference visibility corresponding to each frequency channel is introduced. This parameter, obtained by fitting the Franson interference fringes, reflects the contrast of the interference fringes. The phase stability parameter is combined with the interference visibility to construct a single-channel entanglement characterization parameter. Specifically, it can be expressed as: ; in, Indicates the first A single-channel entanglement characterization parameter for each frequency channel. This parameter simultaneously considers interference quality and phase stability, allowing the entanglement performance of different channels to be described by a unified index.

[0061] After obtaining the single-channel entanglement characterization parameters for each frequency channel, a set of consistency evaluation parameters across frequency channels is further constructed: ; in, This indicates the number of frequency channels. Based on this parameter set, the phase consistency deviation between channels can be calculated, which characterizes the overall consistency level among multiple channels. The phase consistency deviation can be expressed in variance form: ; in, This represents the average value of the entanglement characterization parameters across all channels. This deviation value reflects the degree of consistency between channels; the smaller the value, the higher the consistency.

[0062] After obtaining the phase consistency deviation, this deviation is used as a constraint to perform channel-level calibration on the standardized interferometric phase parameters. Specifically, the phase is fine-tuned based on the deviation between the entanglement characterization parameters of each channel and the overall average value. For example, for the ... Each frequency channel, its calibrated phase It can be represented as: ; in, This represents the adjustment coefficient, used to control the calibration amplitude. This process ensures that the phase distribution of each frequency channel is made more consistent, thereby generating the corresponding calibration results for each frequency channel.

[0063] After completing channel-level calibration, an overall consistency evaluation result is output based on the consistency evaluation parameter set. This result can be expressed in the form of consistency indices, for example: ; in, This represents the overall consistency index, with values ​​ranging from 0 to 1. The closer the value is to 1, the higher the consistency.

[0064] like Figure 2 As shown, this invention provides an on-chip quantum light source testing and calibration system. The system includes: a data acquisition unit 11, used to acquire correlated measurement data and Franson interferometric measurement data of the on-chip quantum light source, and extract time correlation information and interference phase parameters for each frequency channel based on the correlated measurement data and Franson interferometric measurement data; an alignment unit 12, used to determine the time delay relationship between each frequency channel based on the time correlation information, and construct a unified time reference based on the time delay relationship to align the interference phase parameters; a model construction unit 13, used to construct a frequency-phase relationship model based on the aligned interference phase parameters, and perform correction processing on the interference phase parameters based on the frequency-phase relationship model to obtain standardized interference phase parameters; and a result output unit 14, used to generate calibration results and consistency evaluation results for each frequency channel based on the standardized interference phase parameters.

[0065] The present invention also provides a computer-readable storage medium storing instructions that, when executed on a computer, cause the computer to perform the above-described on-chip quantum light source testing and calibration method.

[0066] This invention also provides an electronic device, including: one or more processors; and a storage device storing one or more programs thereon, wherein when the one or more programs are executed by the one or more processors, the one or more processors implement the on-chip quantum light source testing and calibration method as described above.

[0067] In one embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 3As shown, the computer device includes a processor A01, a network interface A02, memory (not shown), and a database (not shown) connected via a system bus. The processor A01 provides computing and control capabilities. The memory includes internal memory A03 and a non-volatile storage medium A04. The non-volatile storage medium A04 stores an operating system B01, a computer program B02, and a database (not shown). The internal memory A03 provides an environment for the operation of the operating system B01 and the computer program B02 stored in the non-volatile storage medium A04. The network interface A02 is used for communication with external terminals via a network connection. When the computer program B02 is executed by the processor A01, it implements an on-chip quantum light source testing and calibration method.

[0068] Those skilled in the art will understand that all or part of the steps in the methods of the above embodiments can be implemented by a program instructing related hardware. This program is stored in a storage medium and includes several instructions to cause a microcontroller, chip, or processor to execute all or part of the steps of the methods of the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as a USB flash drive, portable hard drive, read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk.

[0069] The optional embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the embodiments of the present invention are not limited to the specific details described above. Within the scope of the technical concept of the embodiments of the present invention, various simple modifications can be made to the technical solutions of the embodiments of the present invention, and these simple modifications all fall within the protection scope of the embodiments of the present invention. It should also be noted that the various specific technical features described in the above specific embodiments can be combined in any suitable manner without contradiction. To avoid unnecessary repetition, the embodiments of the present invention will not further describe the various possible combinations.

[0070] Furthermore, various different embodiments of the present invention can be combined in any way, as long as they do not violate the spirit of the embodiments of the present invention, they should also be regarded as the content disclosed by the embodiments of the present invention.

Claims

1. A method for testing and calibrating an on-chip quantum light source, characterized in that, The method includes: Acquire correlated measurement data and Franson interferometric measurement data of the on-chip quantum light source, and extract time correlation information and interference phase parameters for each frequency channel based on the correlated measurement data and the Franson interferometric measurement data; Based on the time correlation information, the time delay relationship between each frequency channel is determined, and a unified time reference is constructed according to the time delay relationship to align the interference phase parameters. A frequency-phase relationship model is constructed based on the aligned interference phase parameters, and the interference phase parameters are corrected based on the frequency-phase relationship model to obtain standardized interference phase parameters. Based on the standardized interference phase parameters, calibration results and consistency evaluation results for each frequency channel are generated.

2. The on-chip quantum light source testing and calibration method according to claim 1, characterized in that, Based on the correlated measurement data and the Franson interferometric measurement data, time correlation information and interferometric phase parameters for each frequency channel are extracted, including: Based on the associated measurement data, a time coincidence count sequence corresponding to each frequency channel is constructed, and the coincidence count value under different time delays is statistically calculated according to the time coincidence count sequence to form a time association function corresponding to each frequency channel, and the time association information corresponding to each frequency channel is determined based on the time association function. Based on the Franson interferometric measurement data, interference fringe data corresponding to each frequency channel are obtained, and the interference fringe data are subjected to periodic fitting processing to determine the fringe phase offset, so as to extract the interference phase parameters corresponding to each frequency channel based on the fringe phase offset.

3. The on-chip quantum light source testing and calibration method according to claim 1, characterized in that, Determining the time delay relationship between each frequency channel based on the aforementioned time correlation information includes: Based on the time correlation information, the time correlation function corresponding to each frequency channel is obtained, and peak search processing is performed on each time correlation function to determine the maximum coincidence count position of each frequency channel under different time delays. The time delay value corresponding to the maximum coincidence count position is used as the relative time delay between each frequency channel. A time delay difference relationship set is constructed based on the relative time delay between each frequency channel, and a time delay relationship model corresponding to each frequency channel is established according to the time delay difference relationship set to characterize the relative time offset relationship between each frequency channel; Based on the time delay relationship model, a preset reference channel is selected, and the time delay corresponding to the preset reference channel is used as a benchmark to perform a uniform offset processing on the time delay of the remaining frequency channels in order to obtain the time delay relationship of each frequency channel.

4. The on-chip quantum light source testing and calibration method according to claim 1, characterized in that, A unified time reference is constructed based on the time delay relationship to align the interference phase parameters, including: Based on the time delay relationship, the time delay value of each frequency channel relative to the preset reference channel is obtained, and a unified time reference sequence is constructed according to the time delay value to characterize the time alignment position of each frequency channel under the unified time reference. Based on the unified time reference sequence, the time coordinates corresponding to the interference phase parameters are remapped to map the interference phase parameters of each frequency channel to the time reference position corresponding to the unified time reference sequence, so as to obtain the initially aligned interference phase parameters. Based on the initially aligned interference phase parameters, the phase offset component introduced by the time delay difference is eliminated to obtain the time-aligned interference phase parameters.

5. The on-chip quantum light source testing and calibration method according to claim 1, characterized in that, A frequency-phase relationship model is constructed based on the aligned interference phase parameters, including: Based on the aligned interference phase parameters, obtain the phase data sequence corresponding to each frequency channel, and obtain the frequency parameters corresponding to each frequency channel to construct a frequency-phase data pair set; Based on the frequency-phase data set, a function fitting process is performed on the relationship between frequency and interference phase to obtain an initial frequency-phase relationship function characterizing the change of interference phase with frequency; Residual analysis is performed on the aligned interference phase parameters based on the initial frequency-phase relationship function to determine the frequency-related coupling offset component in the interference phase parameters, and the initial frequency-phase relationship function is corrected according to the coupling offset component to obtain the frequency-phase relationship model.

6. The on-chip quantum light source testing and calibration method according to claim 1, characterized in that, Based on the frequency-phase relationship model, the interference phase parameters are corrected to obtain standardized interference phase parameters, including: Based on the frequency-phase relationship model, the phase correction function for each frequency channel is obtained, and the aligned interference phase parameters are input into the phase correction function to calculate the phase compensation amount for each frequency channel. Based on the phase compensation amount, compensation processing is performed on the aligned interference phase parameters to eliminate the frequency-related coupling offset components in the interference phase parameters and obtain the initially corrected interference phase parameters. Based on the initially corrected interference phase parameters, a constraint process is performed on the phase consistency between each frequency channel to further eliminate residual phase deviations between channels and obtain standardized interference phase parameters.

7. The on-chip quantum light source testing and calibration method according to claim 1, characterized in that, Based on the standardized interferometric phase parameters, calibration results and consistency evaluation results for each frequency channel are generated, including: Based on the standardized interference phase parameters, the phase stability parameters of each frequency channel are obtained, and the single-channel entanglement characterization parameters of each frequency channel are determined by combining the interference visibility of each frequency channel. Based on the single-channel entanglement characterization parameters of each frequency channel, a set of consistency evaluation parameters across frequency channels is constructed, and the phase consistency deviation between each frequency channel is determined according to the set of consistency evaluation parameters to characterize the entanglement consistency level between each frequency channel. Based on the phase consistency deviation, channel-level calibration is performed on the standardized interferometric phase parameters to generate calibration results for each frequency channel. Based on the set of consistency evaluation parameters, the overall consistency evaluation result of the corresponding on-chip quantum light source is output.

8. An on-chip quantum light source testing and calibration system, characterized in that, The system includes: The data acquisition unit is used to acquire the correlation measurement data and Franson interferometric measurement data of the on-chip quantum light source, and extract the time correlation information and interference phase parameters of each frequency channel based on the correlation measurement data and the Franson interferometric measurement data. An alignment unit is used to determine the time delay relationship between each frequency channel based on the time correlation information, and to construct a unified time reference based on the time delay relationship in order to align the interference phase parameters. The model building unit is used to construct a frequency-phase relationship model based on the aligned interference phase parameters, and to perform correction processing on the interference phase parameters based on the frequency-phase relationship model to obtain standardized interference phase parameters; The result output unit is used to generate calibration results and consistency evaluation results for each frequency channel based on the standardized interference phase parameters.

9. An electronic device, characterized in that, include: One or more processors; A storage device having stored one or more programs thereon, which, when executed by the one or more processors, cause the one or more processors to implement the on-chip quantum light source test and calibration method as described in any one of claims 1-7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores instructions that, when executed on a computer, cause the computer to perform the on-chip quantum light source testing and calibration method as described in any one of claims 1-7.

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