A full-automatic test equipment for discrete devices with intelligent temperature control and buffer scheduling

Abstract

The present application relates to discrete device testing technology field, especially to a kind of discrete device full automation test equipment with intelligent temperature control and buffer scheduling, setting tool handling unit, visual identification manipulator, at least one tool positioning area, multiple positioning material placing mechanisms, multiple aging test machines and at least one cooling buffer warehouse, multiple positioning material placing mechanisms include at least one to be tested positioning material placing mechanism, at least one tested positioning material placing mechanism, at least one defective positioning material placing mechanism and at least one buffer positioning material placing mechanism;Each positioning material placing mechanism is configured with material placing container, and the material placing container is configured to store multiple discrete devices;It can improve test efficiency and equipment utilization, through full-process unmanned collaborative work, multiple aging test machines synchronous test, non-stop buffer replacement and seamless connection of temperature control and equipment scheduling, avoid time-consuming and equipment emptying, plugging problem of artificial operation, significantly improve test pace and equipment utilization.

Description

Technical Field

[0001] This invention relates to the field of discrete device testing technology, and in particular to a fully automated testing device for discrete devices with intelligent temperature control and buffer scheduling. Background Technology

[0002] In the rapid development of the modern electronics industry, discrete devices, as core components of electronic devices, directly determine the quality and lifespan of end products through their operational reliability. Their stability, especially under high-temperature environments, is a key indicator of discrete device performance. Therefore, high-temperature reliability testing has become an indispensable and crucial step in the production process of discrete devices, serving as an important means to ensure product quality and mitigate usage risks.

[0003] Currently, high-temperature reliability testing of discrete devices in the industry mainly relies on automated testing equipment, and automated testing has become the mainstream development trend in this field. However, most existing traditional automated testing equipment for discrete devices adopts a semi-automated testing mode, making it difficult to achieve unmanned operation throughout the entire testing process and completely eliminate reliance on manual operation. For example, the automated testing equipment for discrete devices described in invention patent announcement number CN202022869839 still requires manual assistance to complete key operations such as loading and unloading of discrete devices during actual testing, failing to achieve a fully automated closed-loop testing process.

[0004] To address the shortcomings of the aforementioned semi-automated testing methods, the industry has gradually seen the emergence of automated testing equipment for discrete components capable of fully automated loading, unloading, and testing. This aims to replace manual operation with automation technology, fundamentally improving testing efficiency and accuracy, reducing labor costs, and ensuring the stability of the testing environment. The emergence of this fully automated equipment has alleviated the pain points of semi-automated testing to some extent, promoting the development of high-temperature reliability testing for discrete components towards intelligence and unmanned operation, and aligning with the industry's trend towards intelligent upgrading and domestic substitution.

[0005] However, existing fully automated high-temperature reliability testing equipment for discrete devices still has significant design flaws, failing to fully leverage the advantages of automation technology: Firstly, the loading and unloading mechanisms are mostly independently set up. This separate design leads to a significant increase in the number of components, not only increasing the overall footprint of the equipment and raising manufacturing and maintenance costs, but also reducing the compactness of the equipment structure. Secondly, in the core stage of high-temperature reliability testing for discrete devices—the aging test—because the aging test requires a certain amount of time, the loading and unloading mechanisms and other mechanisms are basically in standby mode and cannot participate in the test-related operations. This results in the inefficiency of each mechanism, low overall equipment utilization, and waste of resources. It is difficult to achieve simultaneous improvement in testing efficiency and equipment utilization, and it cannot better meet the high-efficiency, low-cost testing needs of large-scale mass production scenarios.

[0006] In summary, existing high-temperature reliability testing equipment for discrete devices, whether in semi-automatic or fully automated modes, has many shortcomings, making it difficult to simultaneously meet the comprehensive requirements of testing efficiency, testing accuracy, equipment cost, and equipment utilization. Therefore, developing a high-temperature reliability testing equipment for discrete devices that can solve the above-mentioned technical pain points, achieve full-process automation, compact structure, controllable cost, and high equipment utilization has become an urgent technical problem to be solved in the industry. Summary of the Invention

[0007] To overcome the shortcomings mentioned above, the present invention aims to provide a technical solution that can solve the above problems.

[0008] A fully automated testing device for discrete components with intelligent temperature control and buffer scheduling is provided, comprising a fixture handling unit, a vision recognition robot, at least one fixture positioning area, multiple positioning and unloading mechanisms, multiple aging test machines, and at least one cooling buffer chamber. The multiple positioning and unloading mechanisms include at least one unloading mechanism for components to be tested, at least one unloading mechanism for components already tested, at least one unloading mechanism for defective components, and at least one buffer positioning and unloading mechanism. Each positioning and unloading mechanism is equipped with a unloading container configured to store multiple discrete components. The fixture positioning area is positioned and docked with an aging test fixture, on which the aging test fixture... The aging test fixture is equipped with multiple positioning and electrical connection slots for electrical connection of discrete components, and the front end of the aging test fixture is equipped with a plug-in terminal block that is electrically connected to the positioning and electrical connection slots. The aging test machine is equipped with a high-temperature aging chamber and at least one set of plug-in terminal blocks installed in the high-temperature aging chamber. The plug-in terminal blocks are used to plug into and cooperate with the plug-in terminal blocks. A vision recognition robot is used to transfer discrete components between the feeding container of the positioning and feeding mechanism and the aging test fixture in the fixture positioning area. The fixture handling unit is used to transfer the aging test fixture between the aging test machine in the fixture positioning area and the cooling buffer chamber, and the fixture handling unit is also used to drive the aging test fixture to be inserted and removed in the aging test machine. The fully automated testing equipment for discrete components is also equipped with control logic to achieve intelligent temperature control scheduling and intelligent buffer traceability, specifically including: Firstly, during aging tests, the high-temperature aging chamber is preheated to the first temperature required for the aging test and the discrete components are subjected to aging tests. After the aging test is completed, the high-temperature aging chamber undergoes heat exchange to reduce the temperature to the second temperature. During the cooling process, the idle status of the cooling buffer chamber is monitored online. If the cooling buffer chamber is idle, the fixture handling unit moves the aging test fixture to the cooling buffer chamber and cools it to the third temperature. If the cooling buffer chamber is in operation, the high-temperature aging chamber continues heat exchange until the temperature drops to the third temperature. Secondly, when the feeding container of the tested positioning and feeding mechanism or the defective product positioning and feeding mechanism is full, the vision recognition robot will classify and cache the subsequently tested discrete components according to their pass or fail to the cache positioning and feeding mechanism, and establish an identification program for the discrete components of the cache positioning and feeding mechanism; when the empty feeding container is replaced, the vision recognition robot will transport the pass and fail discrete components of the cache positioning and feeding mechanism to the corresponding positioning and feeding mechanism based on the identification program. The control logic also includes: a vision recognition robot arm transfers the discrete components of the positioning and feeding mechanism to be tested to the aging test fixture and establishes an electrical connection; a fixture handling unit moves the aging test fixture filled with the components to be tested to the aging test machine and completes the insertion and docking to form a test electrical circuit; during the aging test, the discrete components are simultaneously identified as qualified or unqualified; after the aging test and cooling are completed, the fixture handling unit moves the aging test fixture back to the fixture positioning area; and the vision recognition robot arm transports the qualified and unqualified discrete components to the corresponding positioning and feeding mechanism.

[0009] Preferably, the fixture positioning area is provided with a linear conveying mechanism and a positioning plate installed on the linear conveying mechanism. The positioning plate is used to position and dock the aging test fixture. The positioning plate is moved out of the fixture positioning area by the linear conveying mechanism, so that the fixture handling unit and the vision recognition robot do not interfere with each other.

[0010] Preferably, the jig handling unit includes an X-axis linear conveyor track, a handling robot slidably connected to the X-axis linear conveyor track, a rack arranged along the X-axis linear conveyor track, and a power motor mounted on the handling robot and meshing with the rack. The positioning and unloading mechanism, the cooling buffer bin, and the aging test machine are laterally distributed on one side of the X-axis linear conveyor track, so that the handling robot is driven by the meshing of the power motor and the rack to move along the X-axis linear conveyor track to dock with the positioning and unloading mechanism, the cooling buffer bin, and the aging test machine respectively.

[0011] Preferably, the handling robot includes a base slidably connected to an X-axis linear conveying track, a Z-axis lifting power mechanism mounted on the base, two guide support frames fixed on both sides of the Z-axis lifting power mechanism, a Y-axis telescopic power mechanism powered by the Z-axis lifting power mechanism, and an insert plate powered by the Y-axis telescopic power mechanism. The insert plate is provided with hooks, and the aging test fixture is provided with hook holes that mate with the hooks. The two guide support frames are used to position and support the two sides of the aging test fixture.

[0012] Preferably, the defective product positioning and unloading mechanism includes a visual defect positioning and unloading mechanism, a test defect positioning and unloading mechanism, and an electrical parameter defect positioning and unloading mechanism. During the process of the visual recognition robot moving the discrete components from the test positioning and unloading mechanism to the fixture positioning area, the visual recognition system identifies whether the discrete components are defective. When the aging test fixture is inserted into the plug-in terminal block, the aging test machine monitors whether the discrete components on the aging test fixture have electrical parameter defects. Combined with the synchronous identification of whether the discrete components pass the test during the testing phase, it is determined whether the discrete components have visual defects, test defects, and electrical parameter defects from the loading stage to the aging test stage.

[0013] Preferably, the feeding container includes a tray, which is positioned on the positioning feeding mechanism. The tray can be arrayed to hold multiple discrete components. The recognition program is set to establish a coordinate system based on each position of the tray array. The test status of the discrete components is recorded based on the coordinate system and the discrete components placed in the buffer positioning feeding mechanism. Subsequently, according to the coordinate system and the test status, the corresponding discrete components are transported to the tested positioning feeding mechanism or the defective product positioning feeding mechanism by a vision recognition robot.

[0014] Preferably, the visual recognition robot includes an X-axis linear module disposed around the fixture positioning area and the positioning and feeding mechanism, a Y-axis linear module powered by the X-axis linear module, a fixed base powered by the Y-axis linear module, a Z-axis linear module mounted on the fixed base, a vacuum suction cup powered by the Z-axis linear module, and a visual recognition module mounted on the fixed base.

[0015] Preferably, the control logic further includes: when the cooling buffer chamber cools the aging test fixture from the second temperature to the third temperature and the fixture transport unit sends the cooled aging test fixture to the fixture positioning area, an identification command is triggered. Based on the identification command, it is identified whether there is a high-temperature aging cabinet in the heat exchange stage of cooling from the second temperature to the third temperature. If so, the fixture transport unit is controlled to transport the aging test fixture in the corresponding high-temperature aging cabinet to the cooling buffer chamber for cooling.

[0016] Preferably, it also includes a temperature isolation chamber, an aging test chamber, a cooling buffer chamber, and an X-axis linear conveyor track, all of which are located inside the temperature isolation chamber. A door is provided on one side of the temperature isolation chamber, and one end of the X-axis linear conveyor track extends out of the temperature isolation chamber along the door, allowing the handling robot to enter and exit the temperature isolation chamber along the door.

[0017] Preferably, the high-temperature aging cabinet is equipped with a sliding cabinet door, and the high-temperature aging cabinet is equipped with a door-pushing cylinder that is powered to the sliding cabinet door. The sliding cabinet door is opened and closed by the door-pushing cylinder.

[0018] Compared with the prior art, the beneficial effects of the present invention are: It can improve testing efficiency and equipment uptime by enabling fully automated collaborative operation, simultaneous testing of multiple aging testers, seamless integration of non-stop buffer material changing and temperature control with equipment scheduling. This avoids time-consuming manual operations and equipment idling and material blockage, significantly improving test cycle time and equipment utilization, and adapting to the needs of large-scale mass production. Furthermore, through visual recognition for precise positioning, fixture error-proof design, and intelligent temperature control logic, it avoids human operation errors and thermal damage to components, ensuring a stable testing environment and guaranteeing the accuracy and consistency of test data, thereby improving the yield rate from the source. Further, it can replace manual labor in loading, unloading, sorting, and buffering operations, reducing labor costs and the workload of operators. Simultaneously, through structural integration design, it reduces the number of equipment parts, shrinks the equipment footprint, and lowers equipment manufacturing and maintenance costs. In addition, it achieves intelligent scheduling throughout the entire process through a programmable controller and traces component status through buffer recognition programs, facilitating testing process monitoring and problem troubleshooting, improving equipment maintenance convenience and testing process standardization, and adapting to the high-quality and intelligent development needs of the modern electronics industry.

[0019] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 This is a schematic diagram of the structure of the present invention; Figure 2 This is a schematic diagram of the structure of the present invention after the temperature isolation chamber has been removed; Figure 3This is a schematic diagram of the structure of the visual recognition robot, the fixture positioning area, and the positioning and feeding mechanism in this invention; Figure 4 This is a partial structural diagram of the visual recognition robotic arm in this invention; Figure 5 This is a schematic diagram of the structure of the positioning and feeding mechanism and the feeding container in the separated state in this invention; Figure 6 This is a schematic diagram of the fixture handling unit in this invention; Figure 7 This is a schematic diagram of the handling robot in this invention; Figure 8 This is a schematic diagram of the aging test fixture in this invention; Figure 9 This is a schematic diagram of the aging test machine in this invention.

[0022] The reference numerals and names in the figure are as follows: 10. Fixture handling unit; 11. X-axis linear conveyor track; 12. Handling robot; 12. Base; 121. Z-axis lifting power mechanism; 122. Guide support frame; 123. Y-axis telescopic power mechanism; 124. Insertion plate; 125. Hook; 126. Rack; 13. Power motor; 14. Vision recognition robot; 20. X-axis linear module; 21. Y-axis linear module; 22. Fixed base; 23. Z-axis linear module; 24. Vacuum suction cup; 25. Vision recognition module; 26. Fixture positioning area; 30. Linear conveyor mechanism; 301. Positioning plate; 302. Aging test fixture; 31. Positioning electrical connection groove; 32. 33. Plug-in terminal block; 34. Hook hole; 40. Positioning and feeding mechanism; 401. Positioning and feeding mechanism to be tested; 402. Positioning and feeding mechanism for tested products; 403. Positioning and feeding mechanism for defective products; 403a. Positioning and feeding mechanism for visual defects; 403b. Positioning and feeding mechanism for test defects; 403c. Positioning and feeding mechanism for electrical parameter defects; 404. Buffer positioning and feeding mechanism; 41. Feeding container; 50. Aging test machine; 51. High temperature aging cabinet; 52. Plug-in terminal block; 53. Sliding cabinet door; 54. Door cylinder; 55. Support rod; 60. Cooling buffer chamber; 70. Temperature isolation chamber; 71. Door body. Detailed Implementation

[0023] The technical solutions in the embodiments of the present invention will be clearly and completely described below. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0024] Please see Figure 1-9In this embodiment of the invention, a fully automated discrete device testing equipment with intelligent temperature control and buffer scheduling is provided, comprising a fixture handling unit 10, a vision recognition robot 20, at least one fixture positioning area 30, multiple positioning and feeding mechanisms 40, multiple aging test machines 50, and at least one cooling buffer chamber 60. The multiple positioning and feeding mechanisms 40 include at least one positioning and feeding mechanism 401 to be tested, at least one positioning and feeding mechanism 402 already tested, at least one defective product positioning and feeding mechanism 403, and at least one buffer positioning and feeding mechanism 404. Each positioning and feeding mechanism 40 is equipped with a feeding container 41, configured to store multiple discrete devices. The fixture positioning area 30 is positioned and docked with the aging test fixture 31, and the aging test fixture 31 is provided with multiple positioning and electrical connection slots 32 for electrically connecting the discrete devices. The positioning and electrical connection slots 32 can be... The discrete components are magnetically attracted to each other for conduction, or they can be elastically engaged with the terminals of the discrete components using a spring-loaded structure. The front end of the aging test fixture 31 is equipped with a terminal block 33 electrically connected to the positioning terminal slot 32. The aging test machine 50 is equipped with a high-temperature aging chamber 51 and at least one set of terminal blocks 52 disposed within the high-temperature aging chamber 51. The terminal blocks 52 are used to engage with the terminal block 33. The visual recognition robot 20 is used to move the discrete components between the feeding container 41 of the positioning feeding mechanism 40 and the aging test fixture 31 in the fixture positioning area 30. The fixture transport unit 10 is used to move the aging test fixture 31 between the aging test machine 50 in the fixture positioning area 30 and the cooling buffer chamber 60, and the fixture transport unit 10 is also used to move the aging test fixture 31 into and out of the aging test machine 50. The fully automated testing equipment for discrete components is also equipped with control logic to achieve intelligent temperature control scheduling and intelligent buffer traceability. The control logic is based on a programmable logic controller (PLC) to operate the fully automated testing equipment for discrete components, and specifically includes: Firstly, during the aging test, the high-temperature aging chamber 51 is preheated to the first temperature required for the aging test and the discrete components are subjected to aging tests. After the aging test is completed, the high-temperature aging chamber 51 undergoes heat exchange treatment to reduce the temperature to the second temperature. During the cooling process, the idle status of the cooling buffer chamber 60 is monitored online. If the cooling buffer chamber 60 is idle, the fixture handling unit 10 transports the aging test fixture 31 to the cooling buffer chamber 60 to cool it to the third temperature. If the cooling buffer chamber 60 is in working condition, the high-temperature aging chamber 51 continues heat exchange until the temperature drops to the third temperature. In the aging test stage, the high-temperature aging chamber 51 is preheated to the first temperature required for the test to ensure that the discrete components complete the aging test under standard operating conditions and to ensure the accuracy of the test data. After the test is completed, the temperature is reduced to the second temperature through heat exchange treatment to avoid direct discharge of high-temperature components, which may cause thermal damage and abnormal performance of the components, thereby improving the test yield from the source. During the cooling process, the idle status of the cooling buffer chamber 60 is monitored in real time to achieve intelligent decision-making for "multi-path cooling". When the cooling buffer chamber 60 is idle, the fixture is immediately transferred to the chamber by the fixture handling unit 10 to cool to the third temperature, maximizing the use of cooling resources. When the cooling buffer chamber 60 is in working condition, it continues to cool to the third temperature in the high-temperature aging cabinet 51, avoiding equipment idling and fixture accumulation, achieving seamless coordination between temperature control process and equipment scheduling, and greatly improving the overall production cycle.

[0025] When the cooling buffer chamber 60 cools the aging test fixture 31 from the second temperature to the third temperature and the fixture transport unit 10 transports the cooled aging test fixture 31 to the fixture positioning area 30, an identification command is triggered. Based on the identification command, it is determined whether there is a high-temperature aging cabinet 51 in the heat exchange stage of cooling from the second temperature to the third temperature. If so, the fixture transport unit 10 is controlled to transport the aging test fixture 31 in the corresponding high-temperature aging cabinet 51 to the cooling buffer chamber 60 for cooling. Based on the intelligent scheduling function of the programmable controller, after the cooling buffer chamber 60 completes the cooling of the aging test fixture 31 from the second temperature to the third temperature, and the fixture transport unit 10 moves the cooled aging test fixture 31 back to the fixture positioning area 30, the identification command is automatically triggered. The identification command is used to detect the operating status of all high-temperature aging cabinets 51 in real time, and to determine whether any high-temperature aging cabinet 51 is in the heat exchange stage of cooling from the second temperature to the third temperature. Its core function is to realize the dynamic scheduling and efficient linkage between the cooling buffer chamber 60 and the high-temperature aging cabinet 51. When a high-temperature aging cabinet 51 is detected to be in the cooling stage, the fixture handling unit 10 is immediately controlled to move the aging test fixture 31 in the corresponding high-temperature aging cabinet 51 to the newly vacated cooling buffer chamber 60 for cooling, so as to avoid the cooling buffer chamber 60 being idle and wasted. At the same time, it reduces the cooling time of the high-temperature aging cabinet 51, speeds up the fixture turnover, further optimizes the overall scheduling efficiency of the equipment, shortens the test cycle, and ensures the orderly connection of cooling and transfer operations of multiple sets of fixtures.

[0026] Secondly, when the feeding container 41 of the tested positioning and feeding mechanism 402 or the defective product positioning and feeding mechanism 403 is full, the visual recognition robot 20 will classify and buffer the subsequently tested discrete components according to their pass / fail status into the buffer positioning and feeding mechanism 404, and establish an identification program for the discrete components in the buffer positioning and feeding mechanism 404; when the empty feeding container 41 is replaced, the visual recognition robot 20 will, based on the identification program, transport the qualified and unqualified discrete components of the buffer positioning and feeding mechanism 404 to the corresponding positioning and feeding mechanism 40; when the tested positioning and feeding mechanism 402 or the defective product positioning and feeding mechanism 403 is full, the visual recognition robot 20 will, based on the identification program, transport the qualified and unqualified discrete components of the buffer positioning and feeding mechanism 404 to the corresponding positioning and feeding mechanism 40; when the tested positioning and feeding mechanism 402 or the defective product positioning and feeding mechanism 403 is full, the visual recognition robot 20 will, based on the identification program, transport the qualified and unqualified discrete components of the buffer positioning and feeding mechanism 404 to the corresponding positioning and feeding mechanism 404 .... When the feeding container 41 of the positioning and feeding mechanism 403 is full, the system does not need to stop. It automatically uses the vision recognition robot arm 20 to classify and buffer the subsequently tested discrete components into qualified / unqualified categories and feed them into the buffer positioning and feeding mechanism 404. This ensures that the testing process continues and solves the problem of production interruption caused by material blockage due to full material in traditional equipment. The seamless integration of this buffer system with the sorting and feeding process enables the equipment to achieve a closed-loop operation of "continuous testing, automatic buffering, and non-stop material change", which significantly improves the equipment utilization rate. It is especially suitable for the continuous testing needs of large batches of discrete components and reduces production costs.

[0027] The control logic also includes: the visual recognition robot 20 transfers the discrete components of the positioning and feeding mechanism 401 to be tested to the aging test fixture 31 and establishes an electrical connection; the fixture transport unit 10 moves the aging test fixture 31, which is filled with the components to be tested, to the aging test machine 50 and completes the insertion and docking to form a test electrical circuit; during the aging test, the discrete components are simultaneously identified as qualified or unqualified; after the aging test and cooling are completed, the fixture transport unit 10 moves the aging test fixture 31 back to the fixture positioning area 30; and the visual recognition robot 20 transports the qualified and unqualified discrete components to the corresponding positioning and feeding mechanism 40 respectively.

[0028] In the above technical solution, the fully automated discrete device testing equipment is based on a programmable logic controller (PLC). It relies on the coordinated operation of a fixture handling unit 10, a vision recognition robot 20, a fixture positioning area 30, a multi-positioning feeding mechanism 40, a multi-aging test machine 50, and a cooling buffer 60. Combining intelligent temperature control scheduling and intelligent buffer traceability as two core control logics, it achieves fully automated closed-loop operation of the entire discrete device testing process. Its core principle is: the vision recognition robot 20 completes the precise turnover and posture recognition of discrete devices between the various positioning feeding mechanisms 40 and the aging test fixture 31; and the fixture positioning area 30 achieves precise positioning of the aging test fixture 31. The fixture handling unit 10 realizes the transfer of the aging test fixture 31 between the fixture positioning area 30, the aging test machine 50 and the cooling buffer chamber 60, and the insertion and docking with the aging test machine 50 to form a test electrical circuit. At the same time, through the intelligent temperature control scheduling logic, the cooling buffer chamber 60 is cooled according to its idle state after the aging test is completed. Through the intelligent buffer traceability logic, the device classification buffering and non-stop replenishment sorting are realized when the material container 41 is full. The device qualification status is identified in the aging test process. Finally, the unmanned and intelligent operation of discrete devices from testing, aging test, cooling to sorting and buffering is realized.

[0029] The core function of this technical solution is to address the pain points of existing discrete device testing equipment, such as semi-automation relying on manual labor, loose structure, low efficiency, easy material blockage, and unreasonable temperature control in fully automated equipment. It aims to achieve fully unmanned operation of the entire process for high-temperature reliability testing of discrete devices. Specific functions include: accurately completing automatic feeding of discrete devices, loading of the aging test fixture 31, high-temperature aging testing, graded cooling, sorting of qualified and unqualified devices, and intelligent buffering when the material is full. Intelligent temperature control scheduling avoids thermal damage to devices and improves equipment scheduling efficiency. Intelligent buffer traceability enables non-stop material changeover to ensure continuous testing. The parallel arrangement of multiple aging testers 50 and the coordination of the cooling buffer 60 improve the overall utilization rate of the equipment. Simultaneously, visual recognition and precise positioning ensure the accuracy of the testing process, replacing manual labor in tedious operations such as loading, unloading, and sorting. This standardizes the testing process, ensures a stable testing environment, and provides efficient and stable testing support for large-scale discrete device mass production.

[0030] Compared to existing technologies, this technical solution significantly improves testing efficiency and equipment uptime. Through fully automated collaborative operation, simultaneous testing of 50 units across multiple aging testers, seamless integration of non-stop buffer material changing and temperature control with equipment scheduling, it avoids time-consuming manual operations and equipment idling and blockages, significantly increasing testing cycle time and equipment utilization, thus meeting the demands of large-scale mass production. Furthermore, through precise positioning via visual recognition, foolproof fixture design, and intelligent temperature control logic, it avoids human error and thermal damage to components, ensuring a stable testing environment and guaranteeing the accuracy and consistency of test data, thereby improving the yield rate from the source. Moreover, it can replace manual labor in loading, unloading, sorting, and buffering operations, reducing labor costs and the workload of operators. Simultaneously, the integrated structural design reduces the number of equipment parts, shrinks the equipment footprint, and lowers manufacturing and maintenance costs. In addition, the programmable logic controller (PLC) enables intelligent scheduling throughout the entire process, and the buffer recognition program allows for component status traceability, facilitating testing process monitoring and troubleshooting, improving equipment maintenance convenience and testing process standardization, and meeting the high-quality and intelligent development needs of the modern electronics industry.

[0031] Please refer to Figure 3 The fixture positioning area 30 is equipped with a linear conveying mechanism 301 and a positioning plate 302 mounted on the linear conveying mechanism 301. The linear conveying mechanism 301 uses a linear guide rail combined with a synchronous pulley to drive the positioning plate 302 to slide along the linear guide rail. The positioning plate 302 is used to position and dock with the aging test fixture 31. It is positioned by setting a blocking structure around its perimeter. After the aging test fixture 31 is placed, it is constrained and positioned by the blocking structure. The positioning plate 302 is moved out of the fixture positioning area 30 by the linear conveying mechanism 301, so that the fixture handling unit 10 and the vision recognition robot 20 do not interfere with each other. By adding a linear conveying mechanism 301 and a positioning plate 302 mounted on it to the fixture positioning area 30, the positioning plate 302 is specifically used for precise positioning and docking with the aging test fixture 31. 1. The linear conveying mechanism 301 can move the positioning plate 302 back and forth between two positions. It can move the positioning plate 302 and the docked aging test fixture 31 into the fixture positioning area 30 for the visual recognition robot 20 to complete the turnover and loading of discrete components. It can also move the positioning plate 302 and the aging test fixture 31 with loaded components out of the fixture positioning area 30 and achieve precise docking with the fixture handling unit 10. This separates the working areas of the fixture handling unit 10 and the visual recognition robot 20, avoids interference between the two during operation, and ensures that the component loading operation of the visual recognition robot 20 and the fixture transfer operation of the fixture handling unit 10 can be carried out synchronously and in parallel. This further improves the coordination efficiency of the various mechanisms of the equipment and reduces the waiting time.

[0032] Please refer to Figure 6-9The jig handling unit 10 includes an X-axis linear conveyor track 11, a handling robot 12 slidably connected to the X-axis linear conveyor track 11, a rack 13 arranged along the X-axis linear conveyor track 11, and a power motor 14 mounted on the handling robot 12 and meshing with the rack 13. A positioning and unloading mechanism 40, a cooling buffer chamber 60, and an aging tester 50 are laterally distributed on one side of the X-axis linear conveyor track 11. The handling robot 12 is driven by the meshing of the power motor 14 and the rack 13 to move along the X-axis linear conveyor track 11 to engage with the positioning and unloading mechanism 40, the cooling buffer chamber 60, and the aging tester 50 respectively. The robotic arm 12 includes a base 121 slidably connected to the X-axis linear conveying track 11, a Z-axis lifting power mechanism 122 mounted on the base 121, two guide support frames 123 fixed on both sides of the Z-axis lifting power mechanism 122, a Y-axis telescopic power mechanism 124 powered on the Z-axis lifting power mechanism 122, and a material insertion plate 125 powered in front of the Y-axis telescopic power mechanism 124. The material insertion plate 125 is provided with hooks 126, and the aging test fixture 31 is provided with hook holes 34 that mate with the hooks 126. The two guide support frames 123 are used to position and support the two sides of the aging test fixture 31. By adopting a modular integrated design, based on the X-axis linear conveyor track 11, the transport robot 12, which is slidably connected to the track, moves laterally along the X-axis linear conveyor track 11 through the meshing transmission of the power motor 14 and the rack 13. Simultaneously, the positioning and unloading mechanism 40, the cooling buffer bin 60, and the aging test machine 50 are correspondingly arranged on one side of the track, ensuring that the transport robot 12 can accurately move to each work area for docking. The transport robot 12 slides with the X-axis linear conveyor track 11 through the base 121, and its vertical lifting operation is achieved by the Z-axis lifting power mechanism 122. The hook 126 and hook hole 34 are engaged, and the Y-axis telescopic power mechanism 124 drives the insert plate 125 to extend and retract back and forth. The hook 126 on the insert plate 125 engages with the hook hole 34 on the aging test fixture 31 to achieve stable gripping of the fixture. The guide support frame 123 on both sides positions and supports the fixture. Support rods 55 are set on both sides inside the high temperature aging cabinet 51. With the continuous guidance of the guide support frame 123 and support rods, the aging test fixture 31 can be inserted and removed into the plug terminal seat 52 by the drive of the Y-axis telescopic power mechanism 124, ensuring the stability of the gripping and transfer process.This technical solution enables precise, efficient, and stable transfer of the aging test fixture 31 across various work areas. X-axis lateral conveying facilitates rapid docking across multiple areas, while Z-axis lifting and Y-axis extension meet the operational needs at different heights and distances. The docking design of the hook 126 and hook hole 34, along with the positioning and bearing function of the guide support frame 123, effectively improves the stability and positioning accuracy of the fixture gripping, preventing fixture offset, detachment, or damage during transfer. Simultaneously, the modular structure design simplifies equipment debugging and maintenance processes, further enhancing fixture transfer efficiency. Combined with the overall equipment scheduling logic, it helps improve the overall testing cycle time of the equipment, adapting to the high-efficiency transfer requirements of large-scale mass production scenarios.

[0033] Please refer to Figure 3 The defective product positioning and unloading mechanism 403 includes a visual defect positioning and unloading mechanism 403a, a test defect positioning and unloading mechanism 403b, and an electrical parameter defect positioning and unloading mechanism 403c. During the process of the visual recognition robot 20 moving discrete components from the test positioning and unloading mechanism 401 to the fixture positioning area 30, the visual recognition robot identifies whether the discrete components are defective. When the aging test fixture 31 is inserted into the plug-in terminal block 52, the aging test machine 50 monitors whether the discrete components on the aging test fixture 31 have electrical parameter defects. Combined with the synchronous identification of whether the discrete components are qualified during the test stage, it is determined whether the discrete components have visual defects, test defects, and electrical parameter defects from the feeding stage to the aging test stage. This preferred technical solution involves finely dividing the defective product positioning and unloading mechanism 403 into three distinct parts: a visual defect positioning and unloading mechanism 403a, a test defect positioning and unloading mechanism 403b, and an electrical parameter defect positioning and unloading mechanism 403c. Defective product identification is integrated throughout the entire testing process at key points: during the process of the visual recognition robot 20 moving the discrete component to be tested from the test positioning and unloading mechanism 401 to the fixture positioning area 30, the image recognition module of the visual recognition robot 20 detects the appearance and posture of the discrete component in real time to determine if visual defects exist; when the aging test fixture 31 is inserted into the terminal block 52 of the aging test machine 50 to form a test electrical circuit, the aging test machine 50 monitors the electrical performance parameters of the discrete component in real time to determine if electrical parameter defects exist; and combining the results of the discrete component's test pass / fail status identified synchronously during the aging test stage, a comprehensive determination is made of the defect type of the discrete component from the previous stage to the aging test stage, corresponding to visual defects, test defects, and electrical parameter defects, respectively. Therefore, this technical solution enables refined classification and storage of defective products and precise traceability, avoiding the inconvenience of subsequent sorting and analysis caused by mixing various defective products. At the same time, through multi-node synchronous identification, it can pre-screen devices with visual defects and electrical parameter defects, reduce invalid testing processes, reduce testing resource waste, and facilitate staff to accurately locate the links where defective products are generated, optimize production and testing processes in a targeted manner, further improve the test yield and the standardization of the testing process, and provide more precise support for the quality control of discrete devices.

[0034] Preferably, the feeding container 41 includes a tray, which is positioned on the positioning feeding mechanism 40. The tray can array multiple discrete components. The recognition program is set to establish a coordinate system based on each position of the tray array. Based on the discrete components placed in the buffer positioning feeding mechanism 404, the test status of the discrete components is recorded in the coordinate system. Subsequently, according to the coordinate system and the test status, the visual recognition robot 20 transports the corresponding discrete components to the tested positioning feeding mechanism 402 or the defective product positioning feeding mechanism 403. Through the association between digital coordinates and test data, the precise positioning and traceable management of discrete components in the buffer positioning feeding mechanism 404 is achieved. This allows the visual recognition robot 20 to accurately and efficiently transport qualified components to the tested positioning feeding mechanism 402 and unqualified components to the defective product positioning feeding mechanism 403, based on the preset coordinate system and corresponding test status information. This ensures that the supplementary sorting process after buffering is accurate and automated, avoids mixing and missorting, and guarantees the continuity of the entire testing process and the final sorting accuracy.

[0035] Preferably, the visual recognition robot 20 includes an X-axis linear module 21 disposed around the fixture positioning area 30 and the positioning and unloading mechanism 40, a Y-axis linear module 22 powered to the X-axis linear module 21, a fixed base 23 powered to the Y-axis linear module 22, a Z-axis linear module 24 mounted on the fixed base 23, a vacuum suction cup 25 powered to the Z-axis linear module 24, and a visual recognition module 26 mounted on the fixed base 23. To achieve precise gripping, posture recognition, and efficient turnover of discrete components, the X-axis linear module 21 and Y-axis linear module 22 work together to cover all positioning and feeding mechanisms 40 and fixture positioning areas 30, ensuring that the robot arm can quickly move to the working position. The Z-axis linear module 24 precisely adjusts the height of the suction cup to adapt to different working scenarios. The vacuum suction cup 25 can smoothly grip discrete components of various specifications and avoid damage to the components. The vision recognition module 26 simultaneously completes real-time detection of the appearance, posture, and defective status of the components, which not only ensures the accuracy and efficiency of component turnover, but also screens out defective components in advance and reduces ineffective work. At the same time, the multi-axis module structure is stable in operation and easy to debug, further improving the overall automation level and operational reliability of the equipment, and adapting to the efficient and accurate testing requirements of large-scale mass production scenarios.

[0036] Preferably, the system also includes a temperature isolation chamber 70, an aging test machine 50, a cooling buffer chamber 60, and an X-axis linear conveyor track 11, all housed within the temperature isolation chamber 70. A door 71 is provided on one side of the temperature isolation chamber 70, and one end of the X-axis linear conveyor track 11 extends beyond the temperature isolation chamber 70 along the door 71, allowing the handling robot 12 to enter and exit the temperature isolation chamber 70 along the door 71. The high-temperature aging chamber 51 is equipped with a sliding door 53, and a door-pushing cylinder 54, powered by the sliding door 53, is installed on the high-temperature aging chamber 51. The sliding door 53 is opened and closed by the door-pushing cylinder 54. The aging test machine 50, which generates significant heat and is sensitive to temperature, and the cooling buffer chamber 60 are centrally located within the chamber, while one end of the X-axis linear conveyor track 11 passes through... The door 71 of the isolation chamber extends to the outside, allowing the handling robot 12 to move freely between the inside and outside. For the high-temperature aging cabinet 51, a sliding cabinet door 53 driven by a door-pushing cylinder 54 is provided to realize the automatic opening and closing of the cabinet door. This technical solution effectively isolates the heat exchange between the high temperature generated during the aging test and the external environment through physical isolation, maintains a constant temperature environment in the isolation chamber, ensures the accuracy and consistency of test data, and significantly reduces energy consumption. The automatic control design of the sliding cabinet door 53 replaces the traditional manual or cumbersome mechanical structure, realizing precise and rapid docking of fixtures entering and leaving the test station. Combined with the cross-area transfer of the handling robot 12, it further improves the overall temperature control efficiency and operating cycle of the equipment, providing a reliable environmental guarantee for the high-precision and high-stability testing of discrete components.

[0037] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. Therefore, the embodiments should be considered in all respects as exemplary and non-limiting, and the scope of the invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within the present invention.

Claims

1. A fully automated testing device for discrete devices with intelligent temperature control and buffer scheduling, characterized in that, The system includes a jig handling unit (10), a vision recognition robot (20), at least one jig positioning area (30), multiple positioning and unloading mechanisms (40), multiple aging test machines (50), and at least one cooling buffer chamber (60). The multiple positioning and unloading mechanisms (40) include at least one positioning and unloading mechanism to be tested (401), at least one tested positioning and unloading mechanism (402), at least one defective product positioning and unloading mechanism (403), and at least one buffer positioning and unloading mechanism (404). Each positioning and unloading mechanism (40) is equipped with a unloading container (41) configured to store multiple discrete components. The jig positioning area (30) is positioned and docked with the aging test jig (31), which has multiple positioning and electrical connection slots (32) for electrically connecting the discrete components. The aging test fixture (31) is provided with a plug-in terminal block (33) electrically connected to the positioning terminal block (32) at the front end. The aging test machine (50) is provided with a high temperature aging cabinet (51) and at least one set of plug-in terminal blocks (52) provided in the high temperature aging cabinet (51). The plug-in terminal blocks (52) are used to plug in and cooperate with the plug-in terminal blocks (33). The visual recognition robot (20) is used to transfer discrete components between the feeding container (41) of the positioning feeding mechanism (40) and the aging test fixture (31) in the fixture positioning area (30). The fixture handling unit (10) is used to transfer the aging test fixture (31) between the aging test machine (50) in the fixture positioning area (30) and the cooling buffer bin (60). The fixture handling unit (10) is also used to drive the aging test fixture (31) to be inserted and removed in the aging test machine (50). The fully automated testing equipment for discrete components is also equipped with control logic to achieve intelligent temperature control scheduling and intelligent buffer traceability, specifically including: Firstly, during the aging test, the high-temperature aging cabinet (51) is preheated to the first temperature required for the aging test and the discrete components are subjected to aging tests. After the aging test is completed, the high-temperature aging cabinet (51) undergoes heat exchange treatment to reduce the temperature to the second temperature. During the cooling process, the idle status of the cooling buffer chamber (60) is monitored online. If the cooling buffer chamber (60) is idle, the fixture handling unit (10) transports the aging test fixture (31) to the cooling buffer chamber (60) to cool it to the third temperature. If the cooling buffer chamber (60) is in working condition, the high-temperature aging cabinet (51) continues heat exchange until the temperature drops to the third temperature. Secondly, when the feeding container (41) of the tested positioning and feeding mechanism (402) or the defective product positioning and feeding mechanism (403) is full, the visual recognition robot (20) will classify and cache the subsequently tested discrete components according to whether they are qualified or not to the cache positioning and feeding mechanism (404), and establish an identification program for the discrete components of the cache positioning and feeding mechanism (404); when the empty feeding container (41) is replaced, the visual recognition robot (20) will transport the qualified and unqualified discrete components of the cache positioning and feeding mechanism (404) to the corresponding positioning and feeding mechanism (40) based on the identification program. The control logic also includes: the visual recognition robot (20) transfers the discrete components of the positioning and feeding mechanism (401) to be tested to the aging test fixture (31) and makes electrical connections; the fixture handling unit (10) transfers the aging test fixture (31) filled with the components to be tested to the aging test machine (50) and completes the plug-in docking to form a test electrical circuit; during the aging test stage, the discrete components are identified as qualified or unqualified; after the aging test and cooling are completed, the fixture handling unit (10) transfers the aging test fixture (31) back to the fixture positioning area (30); and the visual recognition robot (20) transports qualified and unqualified discrete components to the corresponding positioning and feeding mechanism (40) respectively.

2. The fully automated testing equipment for discrete devices with intelligent temperature control and buffer scheduling according to claim 1, characterized in that, A linear conveying mechanism (301) and a positioning plate (302) mounted on the linear conveying mechanism (301) are provided on the fixture positioning area (30). The positioning plate (302) is used to position and dock the aging test fixture (31). The positioning plate (302) is moved out of the fixture positioning area (30) by the linear conveying mechanism (301), so that the fixture handling unit (10) and the vision recognition robot (20) do not interfere with each other.

3. The fully automated testing equipment for discrete devices with intelligent temperature control and buffer scheduling according to claim 1, characterized in that, The jig handling unit (10) includes an X-axis linear conveyor track (11), a handling robot (12) slidably connected to the X-axis linear conveyor track (11), a rack (13) arranged along the X-axis linear conveyor track (11), and a power motor (14) mounted on the handling robot (12) and meshing with the rack (13). The positioning and feeding mechanism (40), the cooling buffer chamber (60), and the aging test machine (50) are laterally distributed on one side of the X-axis linear conveyor track (11), so that the handling robot (12) is driven by the meshing of the power motor (14) and the rack (13) to move along the X-axis linear conveyor track (11) to dock with the positioning and feeding mechanism (40), the cooling buffer chamber (60), and the aging test machine (50) respectively.

4. The fully automated testing equipment for discrete devices with intelligent temperature control and buffer scheduling according to claim 3, characterized in that, The handling robot (12) includes a base (121) slidably connected to the X-axis linear conveying track (11), a Z-axis lifting power mechanism (122) mounted on the base (121), two guide support frames (123) fixed on both sides of the Z-axis lifting power mechanism (122), a Y-axis telescopic power mechanism (124) powered on the Z-axis lifting power mechanism (122), and a material insertion plate (125) powered in front of the Y-axis telescopic power mechanism (124). The material insertion plate (125) is provided with hooks (126), and the aging test fixture (31) is provided with hook holes (34) that mate with the hooks (126). The two guide support frames (123) are used to position and support the two sides of the aging test fixture (31).

5. The fully automated testing equipment for discrete devices with intelligent temperature control and buffer scheduling according to claim 1, characterized in that, The defective product positioning and unloading mechanism (403) includes a visual defect positioning and unloading mechanism (403a), a test defect positioning and unloading mechanism (403b), and an electrical parameter defect positioning and unloading mechanism (403c). During the process of the visual recognition robot (20) moving the discrete device from the test positioning and unloading mechanism (401) to the fixture positioning area (30), the visual recognition of the discrete device is checked for defects. When the aging test fixture (31) inserts the plug-in terminal block (52), the aging test machine (50) monitors whether the discrete device on the aging test fixture (31) has electrical parameter defects. Combined with the synchronous identification of whether the discrete device is qualified during the test stage, it is determined whether the discrete device has visual defects, test defects, and electrical parameter defects from the loading stage to the aging test stage.

6. The fully automated testing equipment for discrete devices with intelligent temperature control and buffer scheduling according to claim 1, characterized in that, The feeding container (41) includes a tray, which is positioned on the positioning feeding mechanism (40). The tray can be arrayed to hold multiple discrete components. The recognition program is set to establish a coordinate system based on each position of the tray array. The test status of the discrete components is recorded based on the coordinate system of the discrete components placed in the buffer positioning feeding mechanism (404). Subsequently, according to the coordinate system and the test status, the corresponding discrete components are transported to the tested positioning feeding mechanism (402) or the defective product positioning feeding mechanism (403) by the vision recognition robot (20).

7. The fully automated testing equipment for discrete devices with intelligent temperature control and buffer scheduling according to claim 1, characterized in that, The visual recognition robot (20) includes an X-axis linear module (21) disposed around the fixture positioning area (30) and the positioning and feeding mechanism (40), a Y-axis linear module (22) powered by the X-axis linear module (21), a fixed base (23) powered by the Y-axis linear module (22), a Z-axis linear module (24) mounted on the fixed base (23), a vacuum suction cup (25) powered by the Z-axis linear module (24), and a visual recognition module (26) mounted on the fixed base (23).

8. The fully automated testing equipment for discrete devices with intelligent temperature control and buffer scheduling according to claim 1, characterized in that, The control logic also includes: When the cooling buffer chamber (60) cools the aging test fixture (31) from the second temperature to the third temperature and the fixture transport unit (10) sends the cooled aging test fixture (31) to the fixture positioning area (30), an identification command is triggered. Based on the identification command, it is identified whether there is a high-temperature aging cabinet (51) in the heat exchange stage of cooling from the second temperature to the third temperature. If so, the fixture transport unit (10) is controlled to transport the aging test fixture (31) in the corresponding high-temperature aging cabinet (51) to the cooling buffer chamber (60) for cooling.

9. The fully automated testing equipment for discrete devices with intelligent temperature control and buffer scheduling according to claim 3, characterized in that, It also includes a temperature isolation chamber (70), an aging test machine (50), a cooling buffer chamber (60) and an X-axis linear conveyor track (11) all located inside the temperature isolation chamber (70). A door (71) is provided on one side of the temperature isolation chamber (70), and one end of the X-axis linear conveyor track (11) extends out of the temperature isolation chamber (70) along the door (71), so that the handling robot (12) can enter and exit the temperature isolation chamber (70) along the door (71).

10. The fully automated testing equipment for discrete devices with intelligent temperature control and buffer scheduling according to claim 9, characterized in that, The high-temperature aging cabinet (51) is equipped with a sliding cabinet door (53), and the high-temperature aging cabinet (51) is equipped with a door-pushing cylinder (54) that is powered and connected to the sliding cabinet door (53). The sliding cabinet door (53) is opened and closed by the door-pushing cylinder (54).

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