A kind of integrated test system suitable for straight pipe type through-hole capacitor

Abstract

This invention discloses an integrated testing system for straight-tube feedthrough capacitors, comprising a protective frame on which multiple straight-tube feedthrough capacitor bodies are mounted; a multi-parameter testing module including an LCR meter, a high-resistance meter, and a withstand voltage tester; a dedicated test fixture electrically connected to the straight-tube feedthrough capacitor bodies, the fixture having four BNC interfaces: LCUR, LPOT, HPOT, and HCUR; and an interface switching module connected to the four BNC interfaces. The advantages of this invention are: it integrates the testing functions of four core parameters—capacity, loss, insulation resistance, and breakdown voltage—into a single system, significantly improving testing efficiency; and it automates the entire process of test mode switching, parameter setting, data acquisition, storage, and analysis through a main control module, reducing manual intervention, minimizing human error, and ensuring the reliability and consistency of test data.

Description

Technical Field

[0001] This invention belongs to the field of electronic component testing technology, specifically relating to an integrated testing system suitable for straight-tube feedthrough capacitors. Background Technology

[0002] Feedthrough capacitors, as a type of filter capacitor with a special structure, are widely used in fields with stringent electromagnetic compatibility requirements, such as communication equipment, aerospace electronic systems, power electronic devices, and rail transit traction systems, due to their excellent high-frequency filtering performance, low parasitic inductance characteristics, and good sealing protection capabilities. Among them, straight tube feedthrough capacitors occupy an important position in high-density integrated electronic devices because of their compact structure, convenient installation, and outstanding environmental resistance.

[0003] In the production, manufacturing, factory inspection, and practical application maintenance of straight-tube feedthrough capacitors, accurate testing of their core performance parameters is crucial to ensuring the stable operation of electronic systems. The core parameters that need to be tested include capacitance, loss, insulation resistance, and breakdown voltage. These four parameters directly determine the reliability and service life of straight-tube feedthrough capacitors, and the accuracy and comprehensiveness of their test results are of great significance for the design verification and quality control of electronic systems.

[0004] However, current testing techniques for straight-tube feedthrough capacitors have significant limitations, mainly in the following aspects: In existing technologies, the testing of the four core parameters of straight-tube feedthrough capacitors requires multiple independent devices: capacitance and loss testing requires an LCR meter, insulation resistance testing requires a high-resistance meter, and breakdown voltage testing relies on a withstand voltage tester. Due to the dispersed testing equipment, operators must manually disassemble and reconnect the test fixtures, switch test instruments, and set parameters separately for different devices each time a complete set of parameter tests is completed. The entire testing process involves multiple fixture clamping, interface switching, and parameter debugging, making the operation cumbersome, time-consuming, and prone to human error leading to test data deviations, seriously affecting testing efficiency and data reliability. Because the data formats of different testing equipment are not uniform, operators need to manually record the test data of each equipment after the test is completed, and then manually sort and analyze it. This not only increases the workload, but may also lead to problems such as data recording errors and omissions. At the same time, the scattered test data lacks a unified storage and management platform, making it difficult to achieve rapid traceability and batch analysis of test data, which is not conducive to quality control and problem investigation in the production process. Summary of the Invention

[0005] The purpose of this invention is to provide an integrated testing system for straight-tube feedthrough capacitors, enabling centralized and automated testing of four core parameters: capacitance, loss, insulation resistance, and breakdown voltage. This simplifies the testing process, improves testing efficiency and data accuracy, and reduces testing costs.

[0006] To achieve the above objectives, the present invention provides the following technical solution: an integrated testing system for straight-tube feedthrough capacitors, comprising... A protective frame, on which multiple straight tube-type feedthrough capacitor bodies are provided; A multi-parameter testing module, which includes an LCR meter, a high resistance meter, and a withstand voltage tester; A dedicated test fixture electrically connected to the body of a straight-tube feedthrough capacitor, the dedicated test fixture having four BNC interfaces, namely LCUR interface, LPOT interface, HPOT interface and HCUR interface; An interface switching module is connected to four BNC interfaces. The interface switching module can be electrically connected to an LCR meter, a high resistance meter, and a withstand voltage tester, and can control the short-circuit state of the four BNC interfaces according to the test requirements. The main control module is electrically connected to the interface switching module and the multi-parameter test module, respectively, and is used to control the connection status of the interface switching module and the test parameters of the multi-parameter test module, and to receive test data. The data storage and analysis module is electrically connected to the main control module.

[0007] As a preferred technical solution of the present invention, the special test fixture includes a fixture body, two inner pins and two copper blocks. The two inner pins are symmetrically arranged at the axial position of the receiving cavity of the fixture body for contacting the inner wall of the straight tube type through-hole capacitor body. The two copper blocks are symmetrically arranged on the inner side wall of the receiving cavity for contacting the outer wall of the straight tube type through-hole capacitor body. The two inner pins are electrically connected to the LCUR interface and the LPOT interface respectively, and the two copper blocks are electrically connected to the HPOT interface and the HCUR interface respectively.

[0008] As a preferred technical solution of the present invention, the interface switching module includes a switching controller and an adapter. The switching controller receives instructions from the main control module and can control the LCUR interface to be shorted with the LPOT interface, the HPOT interface to be shorted with the HCUR interface, or control the four BNC interfaces to remain in an independent state.

[0009] As a preferred embodiment of the present invention, it further includes a fixing cylinder installed inside the protective frame, wherein the special test fixture is installed inside the fixing cylinder.

[0010] As a preferred technical solution of the present invention, it further includes a limiting opening at the top of the fixed cylinder and a receiving groove inside the fixed cylinder that communicates with the limiting opening.

[0011] As a preferred embodiment of the present invention, a spring is provided inside the receiving groove, and one end of the spring is connected to a movable plate.

[0012] As a preferred embodiment of the present invention, the other end of the movable plate is located above the limiting opening, and a protruding handle is provided on the top of the movable plate.

[0013] Compared with the prior art, the beneficial effects of the present invention are: This invention integrates the testing functions of four core parameters—capacity, loss, insulation resistance, and breakdown voltage—into a single system, significantly improving testing efficiency. The main control module automates the entire process of test mode switching, parameter setting, data acquisition, storage and analysis, reducing manual intervention, minimizing human error, and ensuring the reliability and consistency of test data. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the first axial side structure of the present invention; Figure 2 This is a schematic diagram of the second axial side structure of the present invention; Figure 3 For the present invention Figure 2 A schematic diagram of a local structure in the image; Figure 4 For the present invention Figure 3 A schematic diagram of a local structure in the image; Figure 5 For the present invention Figure 4 A schematic diagram of a partial cross-sectional structure in the diagram; In the picture: 1. Protective frame; 11. Straight tube type through-hole capacitor body; 2. Fixing cylinder; 21. Limiting port; 22. Receiving slot; 220. Spring; 3. Special test fixture; 4. Interface switching module; 5. LCR meter; 6. High resistance meter; 7. Withstand voltage tester; 8. Movable plate; 81. Protruding handle. Detailed Implementation

[0015] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0016] Please see Figures 1 to 5 This invention provides an integrated testing system suitable for straight-tube feedthrough capacitors, including... The protective frame 1 can provide physical protection for the straight tube type feed-through capacitor body 11 and the core test components inside the system. Multiple straight tube type feed-through capacitor bodies 11 are set on the protective frame 1, which provides a basis for batch testing and solves the problem that the existing technology can only test a single capacitor at a time and has low efficiency. The multi-parameter testing module includes an LCR meter (5), a high-resistance meter (6), and a withstand voltage tester (7), which are used to test the capacitance and loss, insulation resistance, breakdown voltage, and leakage current of straight-tube feedthrough capacitors, respectively. This addresses the problems of dispersed testing equipment and high procurement and maintenance costs associated with existing technologies. The LCR meter (5), high-resistance meter (6), and withstand voltage tester (7) are all mature, high-precision instruments in the industry, ensuring the accuracy of the test data for each parameter and guaranteeing the reliability of the test results. A dedicated test fixture 3 is electrically connected to the straight-tube feedthrough capacitor body 11. The fixture 3 has four BNC interfaces: LCUR, LPOT, HPOT, and HCUR. The fixture 3 is specifically adapted to the unique "inner wall-outer wall" electrode structure of the straight-tube feedthrough capacitor, solving the problems of poor compatibility and unstable contact in existing general-purpose fixtures. The four BNC interfaces provide dedicated signal transmission channels for different test modes (LCR test, IR test, and breakdown test). The BNC interfaces have strong anti-interference capabilities and stable signal transmission, reducing signal loss and interference during testing and improving data acquisition accuracy. Interface switching module 4 connects to four BNC interfaces and can be electrically connected to an LCR meter 5, a high resistance meter 6, and a withstand voltage tester 7. It can control the short-circuit status of the four BNC interfaces according to testing requirements. This enables automatic switching between the dedicated test fixture 3 and different instruments in the multi-parameter test module, eliminating the need for manual cable plugging and unplugging. This solves the problems of cumbersome and error-prone manual equipment switching in existing technologies, improving testing efficiency. It can automatically control the interface short-circuit status according to the test type (LCR / IR / breakdown), adapting to the interface quantity requirements of different instruments (4 interfaces for the LCR meter, 2 interfaces for the high resistance meter / withstand voltage tester), solving the problem of instrument interface incompatibility and enhancing system versatility. The switching process is automatically executed by the module, reducing human intervention and lowering the risk of test data deviation or equipment damage due to incorrect interface connections. The main control module is electrically connected to both the interface switching module 4 and the multi-parameter test module. It controls the connection status of the interface switching module 4 and the test parameters of the multi-parameter test module, and receives test data. As the system's "central hub," it achieves fully automated control of the testing process, uniformly coordinating interface switching, parameter setting, and data acquisition, solving the problems of fragmented testing processes and the need for manual step-by-step operations in existing technologies. It allows for centralized setting of key parameters for each testing instrument (such as the LCR meter's test frequency, the high-resistance meter's applied voltage, and the withstand voltage tester's voltage boosting rate), avoiding chaotic parameter settings and ensuring consistency in testing standards. It receives and integrates test data from each instrument in real time, providing a unified data source for subsequent data storage and analysis, preventing data loss and improving the standardization of data management. The data storage and analysis module is electrically connected to the main control module to achieve long-term stable storage of test data, support historical data traceability, and solve the problems of manual recording, omission, or error in existing technology data; it can perform automated analysis on stored data (such as generating IR curves over time and leakage current curves over voltage), present test results intuitively, and reduce the workload of manual data analysis; it provides data support for production quality control, facilitates rapid identification of non-conforming product problems, and meets the quality traceability needs of modern manufacturing industry.

[0017] In this embodiment, the dedicated test fixture 3 includes a fixture body, two inner pins, and two copper blocks. The two inner pins are symmetrically positioned at the axial center of the receiving cavity of the fixture body to contact the inner wall of the straight tube-type feedthrough capacitor body 11. The two copper blocks are symmetrically positioned on the inner sidewall of the receiving cavity to contact the outer wall of the straight tube-type feedthrough capacitor body 11. The two inner pins are electrically connected to the LCUR and LPOT interfaces, respectively, and the two copper blocks are electrically connected to the HPOT and HCUR interfaces, respectively. The symmetrical layout of the inner pins and copper blocks precisely matches the structure of the straight tube-type feedthrough capacitor, where the inner wall is one pole and the outer wall is the other pole, ensuring the comprehensiveness and stability of electrode contact and solving the problem of unstable contact resistance in existing temporary contact methods (such as wire winding). The one-to-one connection between the inner pins and the LCUR / LPOT interfaces, and the one-to-one connection between the copper blocks and the HPOT / HCUR interfaces, forms an independent signal transmission path, avoiding interference between signals from different electrodes and ensuring the accuracy of test data. The conductive materials (inner pins and copper blocks) have good conductivity, reducing signal transmission loss and further improving the repeatability and reliability of test data.

[0018] In this embodiment, the interface switching module 4 includes a switching controller and an adapter. The switching controller receives instructions from the main control module and can control the LCUR interface to be shorted with the LPOT interface, the HPOT interface to be shorted with the HCUR interface, or control the four BNC interfaces to remain in an independent state. The switching controller responds to the instructions from the main control module to realize rapid switching of interface states, ensuring the continuity of test mode (LCR / IR / breakdown) conversion and improving the smoothness of the test process. The adapter adapts to the interface specifications of different test instruments, solving the problem of inconsistent interfaces of LCR meters, high resistance meters, and withstand voltage testers, and enhancing the compatibility of system hardware. The interface shorting logic is clearly defined (LCUR and LPOT shorted, HPOT and HCUR shorted), accurately matching the dual interface requirements of high resistance meters and withstand voltage testers, avoiding test failures caused by interface connection errors, and ensuring the stability of the test process.

[0019] In this embodiment, a fixing cylinder 2 is also installed inside the protective frame 1, and a special test fixture 3 is installed inside the fixing cylinder 2. The fixing cylinder 2 provides a stable mounting carrier for the special test fixture 3, preventing the fixture from shifting due to vibration or collision during the test, ensuring the contact stability between the capacitor body 11 and the fixture electrodes, and reducing data fluctuations. The fixing cylinder 2 and the protective frame 1 form a double protection structure, providing a safer test environment for the fixture and capacitor.

[0020] In this embodiment, a limiting opening 21 is provided at the top of the fixed cylinder 2, and a receiving groove 22 is provided inside the fixed cylinder 2 and communicates with the limiting opening 21. A spring 220 is provided inside the receiving groove 22, and one end of the spring 220 is connected to a movable plate 8. When the wire on the BNC interface passes through the limiting opening 21, the movable plate compresses the spring 220. When the wire is placed on the limiting opening 21, the compressed spring 220 resets and drives the movable plate 8 back to the initial position. The movable plate 8 is used to limit the position of the wire, which has the effect of wire binding.

[0021] In this embodiment, the other end of the movable plate 8 is located above the limiting opening 21, and a protruding handle 81 is provided on the top of the movable plate 8 to increase the convenience of moving the movable plate 8.

[0022] The working principle and usage process of this invention: Check that the protective frame 1, multi-parameter test module (LCR meter 5, high resistance meter 6, withstand voltage tester 7), interface switching module 4 and other equipment are powered on normally and connected securely; Make the inner pin and copper block of the special test fixture 3 contact the inner wall and outer wall of the capacitor respectively; the wires pass through the limiting port 21, and the movable plate 8 resets the wire bundle; Test parameters (such as LCR meter test frequency, high resistance meter applied voltage, etc.) are set through the main control module. Upon system startup, the main control module controls interface switching module 4 to automatically switch interface states, sequentially completing LCR testing, insulation resistance testing, and breakdown voltage testing, with data stored and analyzed in real time.

[0023] Although embodiments of the invention have been shown and described (see the detailed description above), it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An integrated testing system for straight-tube feedthrough capacitors, characterized in that: include A protective frame (1) is provided with multiple straight tube type through-core capacitor bodies (11). A multi-parameter testing module, comprising an LCR meter (5), a high resistance meter (6), and a withstand voltage tester (7); A special test fixture (3) electrically connected to the straight tube type feedthrough capacitor body (11) has four BNC interfaces, namely LCUR interface, LPOT interface, HPOT interface and HCUR interface. Interface switching module (4), the interface switching module (4) is connected to 4 BNC interfaces, and the interface switching module (4) can be electrically connected to LCR meter (5), high resistance meter (6), withstand voltage tester (7), and can control the short-circuit state of 4 BNC interfaces according to test requirements; The main control module is electrically connected to the interface switching module (4) and the multi-parameter test module respectively. It is used to control the connection status of the interface switching module (4) and the test parameters of the multi-parameter test module, and to receive test data. The data storage and analysis module is electrically connected to the main control module.

2. The integrated testing system for straight-tube feedthrough capacitors according to claim 1, characterized in that: The special test fixture (3) includes a fixture body, two inner pins and two copper blocks. The two inner pins are symmetrically arranged at the axial position of the receiving cavity of the fixture body to contact the inner wall of the straight tube type through-hole capacitor body (11). The two copper blocks are symmetrically arranged on the inner side wall of the receiving cavity to contact the outer wall of the straight tube type through-hole capacitor body (11). The two inner pins are electrically connected to the LCUR interface and the LPOT interface respectively, and the two copper blocks are electrically connected to the HPOT interface and the HCUR interface respectively.

3. The integrated testing system for straight-tube feedthrough capacitors according to claim 1, characterized in that: The interface switching module (4) includes a switching controller and an adapter. The switching controller receives instructions from the main control module and can control the LCUR interface to be short-circuited with the LPOT interface, the HPOT interface to be short-circuited with the HCUR interface, or control the four BNC interfaces to remain in an independent state.

4. The integrated testing system for straight-tube feedthrough capacitors according to claim 1, characterized in that: It also includes a fixed cylinder (2) installed inside the protective frame (1), and the special test fixture (3) is installed inside the fixed cylinder (2).

5. The integrated testing system for straight-tube feedthrough capacitors according to claim 4, characterized in that: It also includes a limiting opening (21) at the top of the fixed cylinder (2) and a receiving groove (22) inside the fixed cylinder (2) and communicating with the limiting opening (21).

6. The integrated testing system for straight-tube feedthrough capacitors according to claim 5, characterized in that: The accommodating groove (22) is provided with a spring (220), and one end of the spring (220) is connected to a movable plate (8).

7. The integrated testing system for straight-tube feedthrough capacitors according to claim 6, characterized in that: The other end of the movable plate (8) is located above the limiting opening (21), and a protruding handle (81) is provided on the top of the movable plate (8).

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