Topological heterostructure and sensing detection method
By designing a topological heterostructure and utilizing the phase compensation effect and anomalous dispersion characteristics of the HMM layer and the dielectric layer, the angle dependence problem of traditional photonic crystals is solved, realizing omnidirectional dispersion-free bandgap and high-sensitivity sensing and detection, which is suitable for integrated photonic chips and complex sensing environments.
Patent Information
- Application Number
- CN202610584496.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-04-29
- Publication Date
- 2026-06-09
AI Technical Summary
The bandgap edge of traditional one-dimensional all-dielectric photonic crystals shifts towards higher frequencies as the incident angle increases, resulting in a severe angle dependence. Existing dispersionless bandgap solutions rely on materials with negative refractive index or negative magnetic permeability, making them difficult to achieve.
A topological heterostructure is designed by alternating stacking of HMM layers and dielectric layers. The anomalous dispersion characteristics of HMM are used to compensate for the phase shift of the dielectric layer, forming an omnidirectional dispersion-free bandgap. Topologically protected local interface states are constructed at the interface, and phase singularities are used for sensing and detection.
Achieving a constant frequency omnidirectional dispersion-free bandgap over a wide incident angle range improves sensing sensitivity and detection accuracy, resists structural disturbances, and maintains a high signal-to-noise ratio.