Multispectral photovoltaic device portable testing method, apparatus, device, and medium

Abstract

The application discloses a kind of multispectral photoelectric equipment portable test method, device, equipment and medium, the application relates to photoelectric technical field, the method includes: the optical axis consistency test is carried out to the equipment to be tested, obtains the optical axis deviation angle data corresponding to the equipment to be tested;The dynamic target simulation test is carried out to the equipment to be tested, and the tracking imaging data of the target image of the system is obtained by the equipment to be tested;The laser simulation ranging test is carried out to the equipment to be tested, and simulation laser echo signal data are obtained;The laser parameter detection is carried out to the equipment to be tested, and the laser parameter data corresponding to the equipment to be tested are obtained;Based on the test results of the above test, the target test result corresponding to the equipment to be tested is obtained.The application aims at solving the problems that existing photoelectric equipment test technology generally has narrow covering spectrum, single test function and difficult to carry.

Description

Technical Field

[0001] This application relates to the field of optoelectronic technology, and in particular to a portable testing method, apparatus, equipment and medium for multispectral optoelectronic devices. Background Technology

[0002] With the development of optoelectronic detection technology, optoelectronic equipment is no longer limited to visible and infrared light detection technologies, but is evolving towards multispectral applications. The application of multispectral technology necessitates that optoelectronic equipment include many subsystems for different spectral detection methods, such as visible light subsystems and long-wave infrared subsystems. Simultaneously, due to the increasingly complex functional requirements of optoelectronic equipment, it inevitably includes many subsystems for different functions, such as target detection, tracking, and laser ranging. For these two reasons, modern optoelectronic equipment has become a multi-optical-axis, structurally complex, and functionally integrated system. When optoelectronic equipment is subjected to adverse factors such as vibration, shock, temperature changes, and electromagnetic interference, malfunctions are inevitable, leading to a decline in key performance indicators or the inability to perform designated functions. Therefore, testing of optoelectronic equipment is crucial for ensuring its performance.

[0003] However, current testing techniques for optoelectronic devices have the following shortcomings: existing testing technologies mostly include single-performance testing systems, and testing all the performance of a certain optoelectronic device requires the use of multiple single-function testing systems, which is inefficient; at the same time, the hardware equipment of existing testing technologies is mostly bulky and unsuitable for the flexible and ever-changing application environment of optoelectronic devices. Summary of the Invention

[0004] The main objective of this application is to provide a portable testing method, apparatus, equipment, and medium for multispectral optoelectronic devices, aiming to solve the problems of narrow spectral coverage and limited testing functions that are common in existing optoelectronic device testing technologies.

[0005] To achieve the above objectives, this application provides a portable testing method for multispectral optoelectronic devices, which is applied to a portable testing system for multispectral optoelectronic devices; The method includes: Perform an optical axis consistency test on the device under test to obtain the corresponding optical axis deviation angle data of the device under test. The system uses a light source / target switching stage and a circular guide rail to perform dynamic target simulation testing on the device under test, thereby obtaining tracking imaging data of the target image of the system by the device under test. Based on the laser signal emitted by the device under test, a laser simulation ranging test is performed on the device under test to obtain simulated laser echo signal data, wherein the simulated laser echo signal data is used to characterize the ranging result corresponding to the device under test. Based on the laser signal, the laser parameters of the device under test are detected to obtain the laser parameter data corresponding to the device under test; The optical axis deviation angle data, the tracking imaging data, the simulated laser echo signal data, and the laser parameter data are processed to obtain the target test results corresponding to the tested device.

[0006] Specifically, before performing an optical axis consistency test on the tested device to obtain the corresponding optical axis deviation angle data, the method further includes: Adjust the relative position between the device under test and the system so that the infrared optical axis corresponding to the device under test coincides with the optical axis of the system, and confirm the infrared optical axis corresponding to the device under test as the reference optical axis.

[0007] Specifically, the optical axis deviation angle data includes the deviation angle value between the visible light optical axis of the system and the reference optical axis, and the deviation angle value between the laser emission optical axis of the system and the reference optical axis; The process of performing an optical axis consistency test on the tested device to obtain the corresponding optical axis deviation angle data includes: The infrared light source is switched to a visible light source by the light source / target switching station, so that the target image corresponding to the visible light source is projected onto the visible light imaging camera of the device under test after being projected by the collimator of the system. Acquire the spot image of the visible light imaging camera and extract the center position of the spot image; Based on the center position of the light spot, the pixel size of the visible light imaging camera, and the focal length parameter of the collimator, the deviation angle between the visible light optical axis and the reference optical axis is calculated. The near-infrared CCD camera of the system is moved to the focal plane of the collimator, and the focusing process of the near-infrared CCD camera is completed. The device under test is controlled to emit a laser so that the laser beam is reflected by a collimator and forms a laser spot image on the near-infrared CCD camera. Obtain the image center position of the laser spot image; Based on the image center position of the laser spot image, the pixel size of the near-infrared CCD camera, and the focal length parameter of the collimator, the deviation angle between the laser emission optical axis and the reference optical axis is calculated.

[0008] Specifically, the dynamic target simulation test of the device under test, conducted through the system's light source / target switching stage and the system's circular guide rail, to obtain tracking imaging data of the target image of the system by the device under test, includes: Based on preset test requirements, the light source / target switching stage is controlled so that the target image is projected into the entrance pupil of the device under test through the collimator. The annular guide rail is controlled so that the target image changes dynamically in both the horizontal and vertical directions simultaneously. The target image is captured in real time by the device under test to obtain the tracking imaging data, wherein the tracking imaging data includes the dynamic motion parameters of the target image and the corresponding capture response data of the device under test.

[0009] Specifically, the step of performing laser simulation ranging on the device under test based on the laser signal emitted by the device under test to obtain simulated laser echo signal data includes: The laser receiving module of the system sequentially converts, amplifies, and shapes the laser signal emitted by the device under test to obtain a shaped electrical pulse signal. The system's precision delay module performs delay processing on the shaped electrical pulse signal to obtain a trigger signal; The system's echo laser generator generates a laser echo signal based on the trigger signal. Based on the laser echo signal, the simulated laser echo signal data is obtained.

[0010] Specifically, the laser parameter data includes laser energy data, laser repetition rate parameters, and laser beam divergence angle data; The step of detecting laser parameters of the device under test based on the laser signal to obtain laser parameter data corresponding to the device under test includes: The laser signal is captured by the laser energy meter of the system to measure the laser energy data and the laser repetition rate parameter; The laser signal corresponding to the laser is projected onto the near-infrared CCD camera of the system through a collimator to form a laser spot image; Based on the focal length parameter of the collimator, the contour shape corresponding to the laser spot image, and the size parameter corresponding to the laser spot image, the laser beam divergence angle data is calculated using a preset image analysis algorithm.

[0011] Specifically, the laser beam divergence data is calculated using a preset image analysis algorithm based on the focal length parameter of the collimator, the contour shape corresponding to the laser spot image, and the size parameter corresponding to the laser spot image, including: The laser beam divergence angle data is calculated using the following formula: θ = 2 × arctan(d / (2 × f)) Wherein, θ represents the laser beam divergence angle data, d represents the diameter of the laser spot image in the size parameters corresponding to the laser spot image, and f represents the focal length parameter of the collimator.

[0012] To achieve the above objectives, this application also provides a portable testing device for multispectral optoelectronic devices, which is applied to a portable testing system for multispectral optoelectronic devices; The device includes: The first unit is used to perform optical axis consistency testing on the device under test and obtain the corresponding optical axis deviation angle data of the device under test. The second unit is used to perform dynamic target simulation testing on the device under test through the light source / target switching stage and the ring guide rail of the system, and to obtain the tracking imaging data of the device under test for the target image of the system. The third unit is used to perform laser simulation ranging test on the device under test based on the laser signal emitted by the device under test, and obtain simulated laser echo signal data, wherein the simulated laser echo signal data is used to characterize the ranging result corresponding to the device under test; The fourth unit is used to detect the laser parameters of the device under test based on the laser signal, and obtain the laser parameter data corresponding to the device under test. The fifth unit is used to process the optical axis deviation angle data, the tracking imaging data, the simulated laser echo signal data, and the laser parameter data to obtain the target test results corresponding to the tested device.

[0013] To achieve the above objectives, this application also provides an apparatus including a memory storing a plurality of instructions; the processor loads the instructions from the memory to execute the steps of any of the methods provided in this application.

[0014] To achieve the above objectives, this application also provides a medium storing a plurality of instructions adapted for loading by a processor to execute the steps in any of the methods provided in this application.

[0015] This application provides a portable testing method, apparatus, device, and medium for multispectral optoelectronic devices. It first performs an optical axis consistency test on the device under test to obtain optical axis deviation angle data; then performs a dynamic target simulation test on the device under test to obtain tracking imaging data of the target image of the system; next, it performs a laser simulation ranging test on the device under test to obtain simulated laser echo signal data; finally, it performs laser parameter detection on the device under test to obtain corresponding laser parameter data; and based on the test results, it obtains the target test results for the device under test. This addresses the common problems of narrow spectral coverage and limited testing functions in existing optoelectronic device testing technologies. Attached Figure Description

[0016] Figure 1 A schematic diagram of the architecture of a portable testing information system for multispectral optoelectronic devices based on artificial intelligence, provided in an embodiment of this application; Figure 2 A flowchart illustrating the method provided in the embodiments of this application; Figure 3 This is a schematic diagram of the structure of the portable testing device for multispectral optoelectronic equipment provided in the embodiments of this application; Figure 4 This is a schematic diagram of the device provided in the embodiments of this application; Figure descriptions: 1-Test device; 2-Laser energy meter; 3-Precision delay module; 4-Laser receiving module; 5-Target surface detection device; 6-Optical trap; 7-Plane reflector a; 8-Plane reflector b; 9-Echo laser generator; 10-Focal plane device switching rail; 11-Echo laser emitter; 12-Indicator laser emitter; 13-Light source / target switching stage; 14-Near-infrared CCD camera; 15-Parabolic primary mirror; 16-Industrial control computer; 17-Test equipment box; 18-Circular rail. Detailed Implementation

[0017] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0018] The current testing techniques for optoelectronic devices have the following shortcomings: existing testing technologies mostly include single-performance testing systems, and testing all the performance of a certain optoelectronic device requires the use of multiple single-function testing systems, which is inefficient; at the same time, the hardware equipment of existing testing technologies is mostly bulky and unsuitable for the flexible and ever-changing application environment of optoelectronic devices.

[0019] Therefore, this application provides a portable testing method, apparatus, equipment, and medium for multispectral optoelectronic devices to solve practical technical problems.

[0020] In some embodiments, the device may be integrated into an electronic device, such as a device, server, or similar device.

[0021] In some embodiments, the server may also be implemented as a device.

[0022] The server can be a standalone physical server, a server cluster or distributed device consisting of multiple physical servers, or a cloud server that provides basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communication, middleware services, domain name services, security services, CDN (Content Delivery Network), and big data and artificial intelligence platforms.

[0023] The devices may include smartphones, tablets, laptops, desktop computers, smart speakers, smartwatches, etc., but are not limited to these. The devices and servers may be connected directly or indirectly via wired or wireless communication, and this application does not impose any restrictions on this connection.

[0024] The following sections provide detailed descriptions of each example. It should be noted that the sequence numbers of the following embodiments are not intended to limit the preferred order of the embodiments.

[0025] This application provides a portable testing method for multispectral optoelectronic devices, which can solve the problems of narrow spectral coverage and limited testing functions that are common in existing optoelectronic device testing technologies.

[0026] The portable testing method for multispectral optoelectronic devices is applied to a portable testing system for multispectral optoelectronic devices.

[0027] In some embodiments, such as Figure 1 As shown, a portable testing system for multispectral optoelectronic devices includes an optical axis consistency testing system, a dynamic target simulation system, a laser simulation ranging system, and a laser parameter detection system. Along the central optical axis, the system comprises a parabolic primary mirror 15, a plane mirror b8, a plane mirror a7, a focal plane device switching rail 10, and on the rail, an echo laser reflector 11, an indicator laser emitter 12, a light source / target switching stage 13, and a near-infrared CCD camera 14. Outside the main optical axis, a target detection device 5, an optical trap 6, a laser receiving module 4, a precision delay module 3, a laser energy meter 2, and an industrial control computer 16 are distributed. All of the above components are located within a testing equipment box 17, which is placed on a circular guide rail 18.

[0028] The functions of each component are as follows: Laser energy meter: measures laser energy and evaluates laser emission performance.

[0029] Precision delay module: controls the time delay of the laser signal to simulate different ranging scenarios.

[0030] Laser receiver module: Receives and analyzes laser echo signals to achieve distance measurement.

[0031] Target surface detection device: detects the imaging quality of the optical axis and ensures the accuracy of optical axis consistency testing.

[0032] Optical traps: absorb excess laser light, reduce ambient light interference, and improve measurement accuracy.

[0033] Plane reflector: Adjust the optical path so that the beam direction meets the test requirements.

[0034] Planar reflector: Same as above, combined with other optical components to optimize the optical path design.

[0035] Echo laser generator: simulates the echo laser signal reflected from the target.

[0036] Focal plane device switching rail: Switch between different focal plane devices to adapt to different testing requirements.

[0037] Echo laser emitter: emits echo laser light for ranging tests.

[0038] Indicator laser emitter: Provides a visible or infrared indicator beam to assist in optical axis alignment.

[0039] Light source / target switcher: Switch between different light sources or targets to meet various testing needs.

[0040] Near-infrared CCD camera: captures light spot images for optical axis consistency testing.

[0041] Parabolic primary mirror: Provides high-quality optical collimation or focusing, improving testing accuracy.

[0042] Industrial control computer: Controls system operation, processes data, and provides test results.

[0043] Test equipment enclosure: houses all test components and provides power and environmental protection.

[0044] Circular guide rail: Used for dynamic target simulation, allowing the target to move along different trajectories.

[0045] The portable testing system for multispectral optoelectronic equipment adopts a modular design to improve system integration, integrating functions such as optical axis consistency testing, dynamic target simulation, and laser ranging accuracy testing into a single system, reducing equipment size and weight. The light source / target switcher 13 integrates multiple light sources and targets, reducing the number of independent light sources. The focal plane device switching rail 10 allows for rapid switching between different testing modes, reducing the need for additional equipment. The industrial control computer 16 integrates data processing, control, and storage functions, reducing reliance on external computing devices.

[0046] The portable testing system for multispectral optoelectronic equipment employs a compact optical design, utilizing high-efficiency optical components such as mirrors and collimators to optimize the optical path layout, shortening the system length and reducing space occupation. The parabolic primary mirror 15 replaces the traditional transmissive optical system, achieving a compact, chromatic aberration-free collimating optical design. Planar mirrors a7 and b8 are used to fold the optical path, reducing system length and improving the space utilization of optical components. An optical trap 6 absorbs excess laser light, avoiding the need for additional shielding devices and reducing additional space requirements.

[0047] The portable testing system for multispectral optoelectronic equipment employs highly integrated electronic components, using small, high-precision electronic modules to replace traditional large testing equipment, thus reducing the overall size of the device. The laser energy meter 2 integrates laser power and energy density measurement functions, eliminating the need for multiple independent measuring devices. The precision delay module 3 utilizes high-precision electronic control technology, reducing the size of traditional mechanical delay devices. The laser receiver module 4 features a high-sensitivity design, making the receiving device smaller and lighter, improving portability.

[0048] The portable testing system for multispectral optoelectronic equipment adopts a lightweight structural design, optimizes the mechanical structure, uses lightweight materials, reduces the weight of the shell and support structure, and improves mobility. The testing equipment housing 17 is made of lightweight materials, providing equipment protection while reducing overall weight. The circular guide rail 18 provides a more compact target motion solution compared to traditional large-size motion platforms.

[0049] The portable testing system for multispectral optoelectronic equipment employs portable optoelectronic detection devices, utilizing small, high-resolution sensors to reduce the need for large optical systems and improve adaptability. The near-infrared CCD camera 14 features a high-resolution, miniaturized design, improving detection accuracy while reducing the size of the optical system. The indicating laser emitter 12 uses a compact laser source to achieve optical axis alignment without requiring large mechanical calibration equipment.

[0050] The following section uses a portable testing method for multispectral optoelectronic devices to illustrate the portable testing information system for multispectral optoelectronic devices: like Figure 2This method, applied to portable testing systems for multispectral optoelectronic devices, can be described in the following specific steps according to the embodiments of this application: S110. Perform an optical axis consistency test on the device under test to obtain the optical axis deviation angle data corresponding to the device under test.

[0051] In some embodiments, before performing an optical axis consistency test on the device under test to obtain the corresponding optical axis deviation angle data, the method further includes the following specific implementation process: Adjust the relative position between the device under test and the system so that the infrared optical axis corresponding to the device under test coincides with the optical axis of the system, and confirm the infrared optical axis corresponding to the device under test as the reference optical axis.

[0052] Specifically, before performing the optical axis deviation angle measurement, the calibration and fixation of the reference optical axis must be completed first: Control commands are sent via the industrial control computer 16 to drive the focal plane device switching guide rail 10, moving the light source / target switching stage 13 to the working position of the collimator focal plane and controlling it to focus along the optical axis to avoid imaging deviation caused by defocusing; the infrared light source and cross target of the light source / target switching stage 13 are turned on, and the infrared target image is projected through the off-axis Newtonian collimator composed of the parabolic primary mirror 15, the plane mirror b8, and the plane mirror a7, and accurately incident on the infrared imaging camera of the device under test; the real-time imaging of the infrared imaging camera of the device under test is observed, and the relative position of the device under test and the test system is adjusted until the center of the infrared cross target and the imaging center of the camera are completely coincident. At this time, the infrared optical axis of the device under test and the optical axis of the test system are coaxial, and this infrared optical axis is confirmed as the reference optical axis; the relative position of the device under test and the test equipment box 17 is fixed to ensure that the reference optical axis does not shift during subsequent testing.

[0053] In some embodiments, the optical axis deviation angle data includes the deviation angle value between the visible light optical axis of the system and the reference optical axis, and the deviation angle value between the laser emission optical axis of the system and the reference optical axis.

[0054] Specifically, the step of performing an optical axis consistency test on the device under test to obtain the corresponding optical axis deviation angle data of the device under test includes the following steps S111 to S117: S111. The infrared light source is switched to a visible light source through the light source / target switching station, so that the target image corresponding to the visible light source is projected onto the visible light imaging camera of the device under test after being projected by the collimator of the system.

[0055] In some embodiments, the device under test and the test system remain in a fixed position, and the light source / target switching station 13 is controlled by the industrial control computer 16 to switch the currently operating infrared light source to a visible light source. The target image formed by the visible light source is collimated by the parabolic primary mirror 15 of the off-axis Newtonian collimator and the optical path is folded by the plane mirror a7 / 8 before being stably projected onto the visible light imaging camera of the device under test.

[0056] S112. Acquire the spot image of the visible light imaging camera and extract the center position of the spot image.

[0057] In some embodiments, the visible light imaging camera of the device under test captures a spot image formed by the target image and transmits the image data to the industrial control computer 16 in real time. The image analysis module of the industrial control computer 16 preprocesses the spot image (such as noise reduction and binarization) and extracts the precise center position coordinates (x1, y1) of the spot using the centroid method or edge fitting algorithm.

[0058] S113. Based on the center position of the light spot, the pixel size of the visible light imaging camera, and the focal length parameter of the collimator, the deviation angle between the visible light optical axis and the reference optical axis is calculated.

[0059] In some embodiments, the deviation angle is calculated using geometric optics principles based on preset parameters and the extracted center position of the light spot. Known parameters: pixel size p (unit: μm / pixel) of the visible light imaging camera, focal length f (unit: mm, must meet the design requirement of ≥2000mm) of the off-axis Newtonian collimator; Calculation logic: First, the pixel deviations Δx (|x1-x0|) and Δy (|y1-y0|) between the spot center and the imaging center are converted into physical distances (Δx_phys=Δx×p÷1000, unit: mm; Δy_phys=Δy×p÷1000, unit: mm), where (x0,y0) are the coordinates of the imaging center; The deviation angle formula is: the deviation angle between the visible light axis and the reference optical axis θ_vis=arctan(√(Δx_phys²+Δy_phys²) / f), the unit is mrad (milliradians), and the result is rounded to 4 decimal places.

[0060] S114. Move the near-infrared CCD camera of the system to the focal plane of the collimator and complete the focusing process of the near-infrared CCD camera.

[0061] In some embodiments, the industrial control computer 16 controls the focal plane device switching guide 10 to move the near-infrared CCD camera 14 to the focal plane of the off-axis Newtonian collimator, ensuring that the camera's photosensitive surface is completely aligned with the focal plane. Subsequently, the focal plane device switching guide 10 is finely adjusted along the optical axis to complete the focusing process of the near-infrared CCD camera 14, avoiding defocusing that would cause blurry laser spot imaging.

[0062] S115. Control the device under test to emit a laser so that the laser is reflected by the collimator and forms a laser spot image on the near-infrared CCD camera.

[0063] In some embodiments, a laser emission command is sent to the device under test. The laser beam emitted by the device under test is incident on the off-axis Newtonian collimator of the test system. After being reflected by the parabolic primary mirror 15 and deflected by the plane mirror a7 or plane mirror b8, the light path is focused on the photosensitive surface of the near-infrared CCD camera 14 to form a clear laser spot image.

[0064] S116. Obtain the image center position of the laser spot image.

[0065] In some embodiments, the near-infrared CCD camera 14 transmits the laser spot image to the industrial control computer 16. After the image analysis module processes the image by noise reduction (such as median filtering) and edge detection (such as Canny operator), it extracts the center position coordinates (x2, y2) of the laser spot using ellipse fitting or centroid method.

[0066] S117. Based on the image center position of the laser spot image, the pixel size of the near-infrared CCD camera, and the focal length parameter of the collimator, the deviation angle value between the laser emission optical axis and the reference optical axis is calculated.

[0067] In some embodiments, the parameters and calculation logic consistent with S113 are used: Calculate the physical deviation between the laser spot center and the imaging center: Δx_las = |x2-x0|×p÷1000 (unit: mm) and Δy_las = |y2-y0|×p÷1000 (unit: mm). The deviation angle between the laser emission optical axis and the reference optical axis is θ_las = arctan(√(Δx_las² + Δy_las²) / f), unit: mrad, and the result is rounded to 4 decimal places.

[0068] S120. Through the light source / target switching stage and the circular guide rail of the system, the device under test is subjected to dynamic target simulation test to obtain the tracking imaging data of the target image of the system by the device under test.

[0069] In some embodiments, the dynamic target simulation test of the device under test is performed through the light source / target switching stage and the circular guide rail of the system to obtain the tracking imaging data of the target image of the system by the device under test, including the steps S121 to S123 as shown below: S121. Based on preset test requirements, control the light source / target switching stage so that the target image is projected into the entrance pupil of the device under test through the collimator.

[0070] In some embodiments, based on preset test requirements (such as visible light dynamic target testing, infrared dynamic target testing), the industrial control computer 16 controls the light source / target switching station 13 to select the corresponding visible light or infrared light source and generate a target image (such as a cross target or simulated target outline) that conforms to the test scenario. After being collimated by the parabolic primary mirror 15 of the off-axis Newtonian collimator and refracted by the plane mirror a7 or plane mirror b8, the target image is accurately incident on the entrance pupil of the device under test, ensuring that the target image is within the field of view of the device under test.

[0071] S122. Control the annular guide rail so that the target image changes dynamically in both the horizontal and vertical directions simultaneously.

[0072] In some embodiments, the horizontal dynamic control is as follows: the industrial control computer 16 sends motion commands to the ring guide rail 18, driving the test equipment box 17 to move along the preset trajectory of the ring guide rail (such as uniform circular motion or variable speed linear motion) in the horizontal plane to simulate the horizontal displacement change of the target. The motion speed can be adjusted according to the test requirements (range: 0.1° / s-10° / s).

[0073] Vertical dynamic control: The pitch adjustment platform integrated on the ring guide rail 18 controls the test equipment box 17 to adjust the pitch angle (adjustment range: -10° to +10°) to simulate the vertical height change of the target, and the pitch speed and horizontal movement speed are coordinated and synchronized.

[0074] S123. The target image is captured in real time by the device under test to obtain the tracking imaging data, wherein the tracking imaging data includes the dynamic motion parameters of the target image and the capture response data corresponding to the device under test.

[0075] In some embodiments, the device under test activates a real-time tracking mode to continuously capture dynamically changing target images and transmits the captured image data, tracking accuracy data, response time data, etc., to the industrial control computer 16. The industrial control computer 16 synchronously records the target's dynamic motion parameters (including horizontal motion trajectory coordinates, pitch angle change curve over time, and motion speed) and the device under test's capture response data (including tracking error, imaging sharpness score, and response delay time), integrating them to form a tracking imaging data set.

[0076] S130. Based on the laser signal emitted by the device under test, perform a laser simulation ranging test on the device under test to obtain simulated laser echo signal data, wherein the simulated laser echo signal data is used to characterize the ranging result corresponding to the device under test.

[0077] In some embodiments, the step of performing laser simulation ranging test on the device under test based on the laser signal emitted by the device under test to obtain simulated laser echo signal data includes the steps S131 to S134 as shown below: S131. The laser signal emitted by the device under test is sequentially converted, amplified, and shaped by the laser receiving module of the system to obtain a shaped electrical pulse signal.

[0078] In some embodiments, the device under test emits a laser beam, and the optical trap 6 of the test system absorbs excess laser light to reduce environmental interference. The core laser pulse signal is captured by the laser receiving module 4 (the laser receiving module 4 is equipped with an avalanche diode APD with a high-voltage bias circuit). Conversion: The APD converts the laser pulse signal into a weak electrical pulse signal; Amplification: The weak electrical pulse signal is amplified by a transimpedance amplifier circuit to ensure that the signal amplitude meets the requirements of subsequent processing; Shaping: A constant ratio timing discrimination circuit is used to digitally shape the amplified electrical pulse signal to avoid threshold drift caused by signal amplitude fluctuations and output a standard rectangular electrical pulse signal.

[0079] S132. The shaped electrical pulse signal is delayed by the precision delay module of the system to obtain a trigger signal.

[0080] In some embodiments, the shaped standard electrical pulse signal is transmitted to the precision delay module 3, which employs a composite scheme of "coarse delay + fine delay": Coarse delay: Implemented by direct counting method using FPGA with a system frequency of 200MHz; delay range: 1μs-10ms; accuracy: 5ns. Fine delay: Implemented by the FPGA's phase-locked loop through multi-phase clock sampling method, delay range: 0-5ns, accuracy: 0.1ns; The industrial control computer 16 sets the total delay time according to the preset ranging scenario (such as short distance, medium distance, long distance), and the precision delay module 3 outputs the trigger signal after delaying the electrical pulse signal.

[0081] S133. The laser echo signal is obtained by the system's echo laser generator according to the trigger signal.

[0082] In some embodiments, the echo laser generator 9 receives the trigger signal output by the precision delay module 3, generates a laser echo signal with the same frequency and waveform as the laser emitted by the device under test, and transmits the signal to the echo laser transmitter 11.

[0083] S134. Based on the laser echo signal, obtain the simulated laser echo signal data.

[0084] In some embodiments, the echo laser transmitter 11 directionally transmits the laser echo signal to the laser receiver of the device under test. After receiving the echo signal, the device under test calculates the simulated ranging result and transmits the ranging result (including ranging value, ranging accuracy, and signal-to-noise ratio) to the industrial control computer 16 to form simulated laser echo signal data.

[0085] S140. Based on the laser signal, perform laser parameter detection on the device under test to obtain the laser parameter data corresponding to the device under test.

[0086] In some embodiments, the laser parameter data includes laser energy data, laser repetition rate parameters, and laser beam divergence angle data.

[0087] Specifically, the step of detecting laser parameters of the device under test based on the laser signal to obtain laser parameter data corresponding to the device under test includes the following steps S141 to S143: S141. The laser signal is captured by the laser energy meter of the system to measure the laser energy data and the laser repetition rate parameter.

[0088] In some embodiments, the device under test continuously emits laser light, and the laser energy meter 2 of the test system directly captures the laser signal, simultaneously measuring two parameters: Laser energy data: Laser energy meter 2 measures the energy value (unit: mJ) of a single laser pulse through an energy sensing element. The average value of 10 consecutive measurements is taken as the final laser energy data. Laser repetition rate parameter: The laser repetition frequency (unit: Hz) is calculated by counting the number of laser pulses received per unit time (e.g., 1 second). The measurement time is not less than 5 seconds to ensure data stability.

[0089] S142. The laser signal corresponding to the laser is projected onto the near-infrared CCD camera of the system through a collimator to form a laser spot image.

[0090] In some embodiments, the laser beam emitted by the device under test is incident on an off-axis Newtonian collimator, collimated by a parabolic primary mirror 15, and deflected by a plane mirror a7 / 8 before being focused onto the photosensitive surface of a near-infrared CCD camera 14, forming a clear laser spot image. The near-infrared CCD camera 14 transmits the spot image data to an industrial control computer 16.

[0091] S143. Based on the focal length parameter of the collimator, the contour shape corresponding to the laser spot image, and the size parameter corresponding to the laser spot image, the laser beam divergence angle data is calculated using a preset image analysis algorithm.

[0092] In some embodiments, the laser spot image is first preprocessed. The industrial control computer 16 performs noise reduction (Gaussian filtering) and binarization segmentation on the laser spot image to distinguish the spot area from the background area. Then, the spot contour and size are extracted. The closed contour of the spot is extracted by an edge detection algorithm (such as the Sobel operator), and geometric fitting (circular fitting or elliptical fitting) is performed according to the contour shape: if it is a circular spot, the equivalent diameter d of the contour is directly measured; if it is an elliptical spot, the average value of the major axis and the minor axis is taken as the equivalent diameter d (d=(a+b) / 2, where a is the length of the major axis and b is the length of the minor axis). After that, the size unit is converted. According to the pixel size p of the near-infrared CCD camera 14 (unit: μm / pixel), the pixel value of the equivalent diameter is converted into the physical diameter (d_phys=d_pixel×p÷1000, unit: mm). In some embodiments, the laser beam divergence data is calculated based on the focal length parameter of the collimator, the contour shape corresponding to the laser spot image, and the size parameter corresponding to the laser spot image, using a preset image analysis algorithm. This includes the specific implementation process shown below: The laser beam divergence angle data is calculated using the following formula: θ = 2 × arctan(d / (2 × f)) Wherein, θ represents the laser beam divergence angle data (unit: mrad), d represents the laser spot image diameter (unit: mm) in the size parameters corresponding to the laser spot image, and f represents the focal length parameter of the collimator.

[0093] S150. The optical axis deviation angle data, the tracking imaging data, the simulated laser echo signal data, and the laser parameter data are processed to obtain the target test results corresponding to the tested device.

[0094] In some embodiments, the industrial control computer 16 performs comprehensive processing on the four types of core data (optical axis deviation angle data, tracking imaging data, simulated laser echo signal data, and laser parameter data) collected in the early stage. The specific process is as follows: Data validity verification: Outlier removal algorithms (such as the 3σ criterion) are used to remove outliers from various types of data (such as out-of-range data caused by equipment interference) to ensure data reliability; Data standardization: Convert parameter data of different dimensions into a unified unit (e.g., unify the angle unit to mrad and the time unit to ms) to facilitate comprehensive evaluation; Performance index comparison: The processed data is compared with the preset performance standard thresholds for optoelectronic equipment (such as the maximum allowable optical axis deviation ≤ 0.5mrad, the maximum allowable laser beam divergence ≤ 1mrad, and the maximum allowable ranging error ≤ ±0.1m). Target test result generation: Based on the comparison results, a comprehensive test report of the tested equipment is generated, which is the target test result corresponding to the tested equipment. The report clarifies the performance level of the equipment in terms of optical axis consistency, dynamic tracking, laser ranging, laser parameters, etc. (such as "qualified", "good", "excellent"). The specific parameter deviations of the unqualified items are marked, and detailed test data record tables and analysis curves (such as optical axis deviation trend chart and dynamic tracking error curve) are output.

[0095] Finally, the industrial control computer 16 stores the test report and raw data, supports data export and printing, and completes the entire testing process for the multispectral optoelectronic equipment.

[0096] In summary, this application provides a portable testing method for multispectral optoelectronic devices, which solves the problems of narrow spectral coverage, limited testing functions, and difficulty in portability that are common in existing optoelectronic device testing technologies.

[0097] To better implement the above methods, this application also provides a portable testing device for multispectral optoelectronic equipment. This device can be integrated into an electronic device, such as a mobile phone, tablet computer, smart Bluetooth device, laptop computer, or personal computer. The server can be a single server or a server cluster composed of multiple servers.

[0098] For example, in this embodiment, the method of this application embodiment will be described in detail by taking the portable testing device for multispectral optoelectronic equipment specifically integrated into the device.

[0099] For example, such as Figure 3 As shown, the portable testing device 300 for multispectral optoelectronic devices may include a first unit 301, a second unit 302, a third unit 303, a fourth unit 304, and a fifth unit 305, and is applied to a portable testing system for multispectral optoelectronic devices. The device includes: The first unit 301 is used to perform optical axis consistency testing on the device under test and obtain the optical axis deviation angle data corresponding to the device under test. The second unit 302 is used to perform dynamic target simulation testing on the device under test through the light source / target switching stage and the ring guide rail of the system, and to obtain the tracking imaging data of the target image of the system by the device under test. The third unit 303 is used to perform laser simulation ranging test on the device under test based on the laser signal emitted by the device under test, and obtain simulated laser echo signal data, wherein the simulated laser echo signal data is used to characterize the ranging result corresponding to the device under test; The fourth unit 304 is used to perform laser parameter detection on the device under test based on the laser signal, and obtain the laser parameter data corresponding to the device under test; The fifth unit 305 is used to process the optical axis deviation angle data, the tracking imaging data, the simulated laser echo signal data, and the laser parameter data to obtain the target test results corresponding to the tested device.

[0100] In practice, each of the above units can be implemented as an independent entity or can be arbitrarily combined to be implemented as the same or several entities. For the specific implementation of each of the above units, please refer to the previous method embodiments, which will not be repeated here.

[0101] As can be seen from the above, the embodiments of this application can solve the problems of narrow coverage spectrum, single testing function and difficulty in portability that are common in existing optoelectronic equipment testing technologies.

[0102] This application also provides an electronic device, which can be a device, a server, or other similar device. The device can be a mobile phone, tablet computer, smart Bluetooth device, laptop computer, personal computer, etc.; the server can be a single server or a server cluster composed of multiple servers, etc.

[0103] In some embodiments, the product processing device may also be integrated into multiple electronic devices, such as multiple servers, with multiple servers implementing the portable testing method for multispectral optoelectronic devices of this application.

[0104] In this embodiment, the electronic device of this embodiment will be used as an example for detailed description, such as... Figure 4 As shown, it illustrates a structural schematic diagram of the device 400 involved in the embodiments of this application. Specifically: The device 400 may include components such as a processor 401 with one or more processing cores, a memory 402 with one or more media, a power supply 403, an input module 404, and a communication module 405. Those skilled in the art will understand that... Figure 4 The structure of device 400 shown does not constitute a limitation on device 400, and may include more or fewer components than shown, or combine certain components, or have different component arrangements. Wherein: The processor 401 is the control center of the device 400. It connects various parts of the device 400 via various interfaces and lines. By running or executing software programs and / or modules stored in the memory 402, and by calling data stored in the memory 402, it performs various functions of the device 400 and processes data, thereby providing overall monitoring of the device 400. In some embodiments, the processor 401 may include one or more processing cores; in some embodiments, the processor 401 may integrate an application processor and a modem processor, wherein the application processor mainly handles operating the device, user interface, and applications, and the modem processor mainly handles wireless communication. It is understood that the modem processor may also not be integrated into the processor 401.

[0105] The memory 402 can be used to store software programs and modules. The processor 401 executes various functional applications and data processing by running the software programs and modules stored in the memory 402. The memory 402 may mainly include a program storage area and a data storage area. The program storage area may store application programs required for operating the device and at least one function (such as sound playback function, image playback function, etc.); the data storage area may store data created based on the use of the device 400. In addition, the memory 402 may include high-speed random access memory and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other volatile solid-state storage device. Accordingly, the memory 402 may also include a memory controller to provide the processor 401 with access to the memory 402.

[0106] The device 400 also includes a power supply 403 that supplies power to the various components. In some embodiments, the power supply 403 can be logically connected to the processor 401 through a power management device, thereby enabling functions such as managing charging, discharging, and power consumption through the power management device. The power supply 403 may also include one or more DC or AC power supplies, recharging devices, power fault detection circuits, power converters or inverters, power status indicators, and other arbitrary components.

[0107] The device 400 may also include an input module 404, which can be used to receive input digital or character information and generate keyboard, mouse, joystick, optical or trackball signal inputs related to user settings and function control.

[0108] The device 400 may also include a communication module 405. In some embodiments, the communication module 405 may include a wireless module, through which the device 400 can perform short-range wireless transmission, thereby providing users with wireless broadband internet access. For example, the communication module 405 can be used to help users send and receive emails, browse web pages, and access streaming media.

[0109] Although not shown, device 400 may also include a display unit, etc., which will not be described in detail here. Specifically, in this embodiment, the processor 401 in device 400 loads the executable files corresponding to the processes of one or more applications into memory 402 according to the following instructions, and the processor 401 runs the applications stored in memory 402 to realize various functions, as follows: Perform an optical axis consistency test on the device under test to obtain the corresponding optical axis deviation angle data of the device under test. The system uses a light source / target switching stage and a circular guide rail to perform dynamic target simulation testing on the device under test, thereby obtaining tracking imaging data of the target image of the system by the device under test. Based on the laser signal emitted by the device under test, a laser simulation ranging test is performed on the device under test to obtain simulated laser echo signal data, wherein the simulated laser echo signal data is used to characterize the ranging result corresponding to the device under test. Based on the laser signal, the laser parameters of the device under test are detected to obtain the laser parameter data corresponding to the device under test; The optical axis deviation angle data, the tracking imaging data, the simulated laser echo signal data, and the laser parameter data are processed to obtain the target test results corresponding to the tested device.

[0110] As can be seen from the above, the embodiments of this application can solve the problems of narrow coverage spectrum and single testing function that are common in existing optoelectronic equipment testing technologies.

[0111] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be accomplished by instructions, or by instructions controlling related hardware. These instructions can be stored in a medium and loaded and executed by a processor.

[0112] Therefore, embodiments of this application provide a medium storing multiple instructions that can be loaded by a processor to execute steps in any of the portable testing methods for multispectral optoelectronic devices provided in embodiments of this application. For example, the instructions can execute the following steps: Perform an optical axis consistency test on the device under test to obtain the corresponding optical axis deviation angle data of the device under test. The system uses a light source / target switching stage and a circular guide rail to perform dynamic target simulation testing on the device under test, thereby obtaining tracking imaging data of the target image of the system by the device under test. Based on the laser signal emitted by the device under test, a laser simulation ranging test is performed on the device under test to obtain simulated laser echo signal data, wherein the simulated laser echo signal data is used to characterize the ranging result corresponding to the device under test. Based on the laser signal, the laser parameters of the device under test are detected to obtain the laser parameter data corresponding to the device under test; The optical axis deviation angle data, the tracking imaging data, the simulated laser echo signal data, and the laser parameter data are processed to obtain the target test results corresponding to the tested device.

[0113] The medium may include: read-only memory (ROM), random access memory (RAM), disk or optical disk, etc.

[0114] According to one aspect of this application, a computer program product or computer program is provided, comprising computer instructions stored in a medium. A processor of a computer device reads the computer instructions from the medium and executes the computer instructions, causing the computer device to perform the methods provided in the various optional implementations of the above embodiments.

[0115] Since the instructions stored in the medium can execute the steps in any of the portable testing methods for multispectral optoelectronic devices provided in the embodiments of this application, the beneficial effects that any of the portable testing methods for multispectral optoelectronic devices provided in the embodiments of this application can achieve can be realized. For details, please refer to the previous embodiments, which will not be repeated here.

[0116] The above provides a detailed description of a portable testing method, apparatus, device, and medium for multispectral optoelectronic devices provided in the embodiments of this application. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A portable testing method for multispectral optoelectronic devices, characterized in that, Applications include portable testing systems for multispectral optoelectronic equipment; The method includes: Perform an optical axis consistency test on the device under test to obtain the corresponding optical axis deviation angle data of the device under test. The system uses a light source / target switching stage and a circular guide rail to perform dynamic target simulation testing on the device under test, thereby obtaining tracking imaging data of the target image of the system by the device under test. Based on the laser signal emitted by the device under test, a laser simulation ranging test is performed on the device under test to obtain simulated laser echo signal data, wherein the simulated laser echo signal data is used to characterize the ranging result corresponding to the device under test. Based on the laser signal, the laser parameters of the device under test are detected to obtain the laser parameter data corresponding to the device under test; The optical axis deviation angle data, the tracking imaging data, the simulated laser echo signal data, and the laser parameter data are processed to obtain the target test results corresponding to the tested device.

2. The method as described in claim 1, characterized in that, Before performing the optical axis consistency test on the tested device to obtain the corresponding optical axis deviation angle data, the method further includes: Adjust the relative position between the device under test and the system so that the infrared optical axis corresponding to the device under test coincides with the optical axis of the system, and confirm the infrared optical axis corresponding to the device under test as the reference optical axis.

3. The method as described in claim 2, characterized in that, The optical axis deviation angle data includes the deviation angle value between the visible light optical axis of the system and the reference optical axis, as well as the deviation angle value between the laser emission optical axis of the system and the reference optical axis; The process of performing an optical axis consistency test on the tested device to obtain the corresponding optical axis deviation angle data includes: The infrared light source is switched to a visible light source by the light source / target switching station, so that the target image corresponding to the visible light source is projected onto the visible light imaging camera of the device under test after being projected by the collimator of the system. Acquire the spot image of the visible light imaging camera and extract the center position of the spot image; Based on the center position of the light spot, the pixel size of the visible light imaging camera, and the focal length parameter of the collimator, the deviation angle between the visible light optical axis and the reference optical axis is calculated. The near-infrared CCD camera of the system is moved to the focal plane of the collimator, and the focusing process of the near-infrared CCD camera is completed. The device under test is controlled to emit a laser so that the laser beam is reflected by a collimator and forms a laser spot image on the near-infrared CCD camera. Obtain the image center position of the laser spot image; Based on the image center position of the laser spot image, the pixel size of the near-infrared CCD camera, and the focal length parameter of the collimator, the deviation angle between the laser emission optical axis and the reference optical axis is calculated.

4. The method as described in claim 1, characterized in that, The dynamic target simulation test of the device under test is performed using the system's light source / target switching stage and the system's circular guide rail to obtain tracking imaging data of the target image of the system by the device under test, including: Based on preset test requirements, the light source / target switching stage is controlled so that the target image is projected into the entrance pupil of the device under test through the collimator. The annular guide rail is controlled so that the target image changes dynamically in both the horizontal and vertical directions simultaneously. The target image is captured in real time by the device under test to obtain the tracking imaging data, wherein the tracking imaging data includes the dynamic motion parameters of the target image and the corresponding capture response data of the device under test.

5. The method as described in claim 1, characterized in that, The method of performing laser simulation ranging on the device under test based on the laser signal emitted by the device under test to obtain simulated laser echo signal data includes: The laser receiving module of the system sequentially converts, amplifies, and shapes the laser signal emitted by the device under test to obtain a shaped electrical pulse signal. The system's precision delay module performs delay processing on the shaped electrical pulse signal to obtain a trigger signal; The system's echo laser generator generates a laser echo signal based on the trigger signal. Based on the laser echo signal, the simulated laser echo signal data is obtained.

6. The method as described in claim 1, characterized in that, The laser parameter data includes laser energy data, laser repetition rate parameters, and laser beam divergence angle data; The step of detecting laser parameters of the device under test based on the laser signal to obtain laser parameter data corresponding to the device under test includes: The laser signal is captured by the laser energy meter of the system to measure the laser energy data and the laser repetition rate parameter; The laser signal corresponding to the laser is projected onto the near-infrared CCD camera of the system through a collimator to form a laser spot image; Based on the focal length parameter of the collimator, the contour shape corresponding to the laser spot image, and the size parameter corresponding to the laser spot image, the laser beam divergence angle data is calculated using a preset image analysis algorithm.

7. The method as described in claim 6, characterized in that, The laser beam divergence data is calculated using a preset image analysis algorithm based on the focal length parameter of the collimator, the contour shape corresponding to the laser spot image, and the size parameter corresponding to the laser spot image. This includes: The laser beam divergence angle data is calculated using the following formula: θ = 2 × arctan(d / (2 × f)) Wherein, θ represents the laser beam divergence angle data, d represents the diameter of the laser spot image in the size parameters corresponding to the laser spot image, and f represents the focal length parameter of the collimator.

8. A portable testing device for multispectral optoelectronic equipment, characterized in that, Applications include portable testing systems for multispectral optoelectronic equipment; The device includes: The first unit is used to perform optical axis consistency testing on the device under test and obtain the corresponding optical axis deviation angle data of the device under test. The second unit is used to perform dynamic target simulation testing on the device under test through the light source / target switching stage and the ring guide rail of the system, and to obtain the tracking imaging data of the device under test for the target image of the system. The third unit is used to perform laser simulation ranging test on the device under test based on the laser signal emitted by the device under test, and obtain simulated laser echo signal data, wherein the simulated laser echo signal data is used to characterize the ranging result corresponding to the device under test; The fourth unit is used to detect the laser parameters of the device under test based on the laser signal, and obtain the laser parameter data corresponding to the device under test. The fifth unit is used to process the optical axis deviation angle data, the tracking imaging data, the simulated laser echo signal data, and the laser parameter data to obtain the target test results corresponding to the tested device.

9. A device, characterized in that, The method includes a processor and a memory, the memory storing multiple instructions; the processor loads instructions from the memory to perform the steps of the method as described in any one of claims 1 to 7.

10. A medium, characterized in that, The medium stores a plurality of instructions adapted for loading by a processor to execute the steps of the method according to any one of claims 1 to 7.

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