Gemstone sorting machine and analysis method

Abstract

Embodiments of the present disclosure relate to a modular system that sorts and analyzes gemstones of a particulate size in an automated manner. The system can use a rotating worktable design to isolate gemstones for individual analysis and sorting. For example, a feeder subsystem can obtain gemstones, and a singulation subsystem can orient the gemstones for further processing. Due to rotation of the worktable, the gemstones can move between subsystems. A set of metrology subsystems disposed about the worktable can process various aspects of the gemstones to derive metrics of the gemstones. Further, a sorting subsystem can sort the gemstones into corresponding bins based on the derived metrics of the gemstones.

Description

[0001] Cross-reference to related applications This application claims priority to U.S. Provisional Application No. 63 / 535,059, filed August 28, 2023, the entire contents of which are incorporated herein by reference. Technical Field

[0002] This embodiment relates to a system for analyzing gemstones. Specifically, this embodiment relates to a modular testing system for bulk melee gemstones. Background Technology

[0003] Various analytical tools and methods are used to examine gemstones to determine their properties (such as color, cut / facet, clarity, carat weight) and whether they are natural, lab-grown, treated, etc. However, these tests typically require multiple hardware sets and the movement between them to achieve all the testing objectives. Various techniques for providing computer-implemented gemstone analysis systems rely on manually moving the gemstone between these multiple testing units. While this technique may be useful for large stones, it may be undesirable for smaller gemstones (such as small stones), where efficiency may be more important.

[0004] In some previously designed automation methods, systems have utilized linear conveyor belts and pick-and-place robotic systems. However, these can be extremely resource-intensive, bulky, and difficult to implement. Furthermore, in such systems, the various analytical instruments may not be readily replaceable or modular, and may require significant resources for implementation and maintenance. Therefore, there is a need for systems and methods that utilize multiple test setups to efficiently and accurately analyze gemstones with small fragment sizes. Summary of the Invention

[0005] Embodiments of this disclosure may include systems and methods for sorting and analyzing gemstones.

[0006] In a first example embodiment, a gemstone analysis system is provided. The gemstone analysis system may include a circular stage configured to rotate about a central point. The gemstone analysis system may also include a set of subsystem test stations arranged around the circular stage. For example, at least a first gemstone in a bulk group may be fed into the system and singulated by the rotation of the circular stage to access each subsystem in this set of subsystems.

[0007] This set of subsystems may include a feeder subsystem configured to receive a first gemstone and a batch of gemstones. This set of subsystems may also include a single-stone subsystem configured to orient the first gemstone to a first orientation and one or more measurement subsystems. In some cases, the single-stone subsystem includes one or more single-stone arms disposed at a circular stage. The one or more single-stone arms may be configured to orient the first gemstone to a first orientation, including a top-down orientation, as the circular stage rotates, and / or to separate the first gemstone from another gemstone by at least a threshold interval.

[0008] In some cases, this set of subsystems further includes a photo position detection subsystem comprising one or more cameras configured to capture images of the first gemstone and a computer vision model configured to process the captured images of the first gemstone and determine the actual orientation of the first gemstone. Additionally, this set of systems may include a refeed subsystem comprising a first air burst element. The refeed subsystem may be configured to receive an instruction to eject the first gemstone in response to the computer vision model determining that the orientation of the first gemstone is outside a threshold orientation range. The refeed subsystem may also provide an air burst to the first gemstone via the air burst element, thereby guiding the first gemstone to a bin located outside the circular worktable.

[0009] The metric subsystem can be configured to generate data related to the first gem using each of the one or more metric subsystems. The metric subsystem can be further configured to derive one or more metrics for each of the one or more metric subsystems using the data generated by each of the one or more metric subsystems. The metric subsystem can be further configured to derive an evaluation metric for the first gem based on the derived metrics of the first gem.

[0010] This set of subsystems may also include a sorting subsystem configured to guide each gem in the first gem to a first sorting bin based on an evaluation metric derived from the first gem.

[0011] In another example embodiment, a system is provided. The system may include a worktable configured to rotate about a central point (e.g., via a motor). The system may also include a set of subsystems arranged around the worktable. This set of subsystems may include a feeder subsystem configured to receive at least one gemstone.

[0012] This set of subsystems may further include one or more measurement subsystems, which include one or more sensors configured to capture gem-related data and at least one computing node. The number of subsystems in the measurement subsystem can be variable, thus providing a modular gem analysis system. The computing node can be configured to acquire gem-related data, derive one or more gem-related measurements using the acquired data, and generate an evaluation metric for each gem based on the one or more measurements. This set of subsystems may further include a sorting subsystem configured to guide each of the one or more gems to a first sorting bin according to the derived evaluation metric for each gem.

[0013] In another example embodiment, a method for analyzing and sorting gemstones is provided. The method may include receiving at least one gemstone (e.g., crushed gemstones) at a feeder subsystem.

[0014] The method may further include orienting the gemstones to a first orientation via a monolithization subsystem. This monolithization subsystem may include one or more arms that can separate the gemstones from each other by at least a threshold distance and orient the gemstones in a top-down orientation.

[0015] The method may also include processing the gemstones by a set of measurement subsystems. A feeder subsystem, a single-stone processing subsystem, and a set of measurement subsystems can be arranged around a single worktable. Furthermore, each gemstone can be fed into these subsystems by rotating the worktable.

[0016] Processing a gemstone by a set of measurement subsystems may involve each subsystem generating gemstone-related data. This gemstone-related data may include images, absorption spectra (e.g., captured by a UV-VIS spectrophotometer), etc. The gemstone-related data can be processed to derive gemstone-related measurements.

[0017] The derived metric can be used to derive an evaluation metric for a gemstone. This evaluation metric can include a combination of values ​​representing the overall quality of the gemstone. For example, an evaluation metric can be derived based on a combination of metrics related to the gemstone's size, cut, color, clarity, etc.

[0018] The method may also include guiding gemstones to a first sorting bin based on the derived evaluation metric of the gemstone. For example, the sorting subsystem may use an air burst to guide gemstones to the bin corresponding to the gemstone's evaluation metric. Attached Figure Description

[0019] To better understand the various embodiments described in this application, reference should be made to the following detailed description in conjunction with the accompanying drawings, in which the same reference numerals refer to corresponding parts.

[0020] Figure 1 This is a diagram illustrating an example of the overall system layout based on certain aspects described in this article.

[0021] Figure 2 This is an illustration of rotating a worktable as an example of some aspects described in this article.

[0022] Figure 3A This is an illustration of an example vibrating drum prefeeder based on certain aspects described herein.

[0023] Figure 3B This is an illustration of an example guide arm for a feeder, based on certain aspects described herein.

[0024] Figure 3C These are illustrations of example pre-feeders and feeders based on certain aspects described in this article.

[0025] Figures 4A-4F These are illustrations of sorting guides or arms based on certain aspects described in this article.

[0026] Figures 5A-5D The illustrations are of example monolithic systems and arms based on certain aspects described in this article.

[0027] Figure 6 This is an illustration of the output based on example location identification of certain aspects described in this article.

[0028] Figure 7 An example refeed subsystem is shown based on some aspects described herein.

[0029] Figure 8 An example shape of the crushed gemstone used in the systems and methods described herein is shown.

[0030] Figure 9 This is an illustration of an example side view of a workbench layout for a modular test system based on certain aspects described herein.

[0031] Figure 10 This is an example of a modular test system and workbench based on certain aspects described in this article.

[0032] Figures 11A-11B This is an example sorting subsystem based on certain aspects described in this article.

[0033] Figure 12 These are example methods for analyzing and sorting gemstones, based on certain aspects described in this article.

[0034] Figure 13 It is a computer network used in conjunction with the systems and methods described herein, based on certain aspects thereof.

[0035] Figure 14 These are diagrams of example computer systems based on certain aspects described in this article. Detailed Implementation

[0036] Reference will now be made in detail to embodiments, examples of which are illustrated in the accompanying drawings. Numerous specific details are set forth in the following detailed description to provide a full understanding of the subject matter presented herein. However, it will be apparent to those skilled in the art that the subject matter can be practiced without these specific details. Furthermore, the specific embodiments described herein are provided by way of example and should not be construed as limiting the scope of these specific embodiments. In other instances, well-known data structures, timing protocols, software operations, programs, and components have not been described in detail to avoid unnecessarily obscuring aspects of the various embodiments herein.

[0037] Overview Crush stones can include single-cut or full-cut stones weighing less than a certain carat weight (e.g., but not limited to 1 / 5 carat (ct)). Typically, stones of this size only need to be analyzed and grouped, without requiring individual tracking of each stone. In many cases, it is desirable to analyze crush stones, such as identifying the weight or clarity of each stone, determining whether they are lab-grown or natural, and whether they have undergone treatment. However, analyzing such stones can be time-consuming and laborious due to their size. Batch analysis might be more efficient, but not at the expense of test quality. Therefore, a system is needed to efficiently analyze smaller stones (such as crush stones), but with the highest quality available from the analytical systems and methods.

[0038] This embodiment relates to a modular system for the automated sorting and analysis of gemstone fragments. The system utilizes a rotating table design to introduce large quantities of gemstone fragments, which are then separated and oriented for rapid individual analysis and sorting.

[0039] Furthermore, if desired, the system described herein can also utilize a modular design to allow for customized layout of testing equipment and rapid instrument changeover. This can further enable rapid gemstone handling / processing using a high-precision system.

[0040] Rotary worktable example Because gemstone analysis requires multiple testing devices, the system and method described herein can be used to receive a large number of gemstones of fragment size, arrange them individually, and pass each of them through multiple testing stations for analysis, followed by sorting based on that analysis. The system and method described herein do this using a rotary table instead of a linear conveyor belt or a pick-and-place robot. By using such a rotary table, gemstones can be individually isolated using radial movement as described, and gemstones can be moved efficiently within a relatively small footprint to achieve all desired analyses.

[0041] Figure 1 An example of an overall system schematic diagram described in top-down view of stage 102 is shown, stage 102 being configured to rotate 104 using a motor or other coherent rotating device (not shown). In some examples, an absolute encoder or servo motor may be used to simultaneously control the rotation of the stage and the position of the sensor probe. In such an example, the stage can achieve a positional accuracy of 0.01 degrees and the probe position can achieve a positional accuracy of + / - 3 micrometers. All these motors will communicate with a computer system to send and receive commands and data, such as test data, as described herein.

[0042] In some cases, as described herein, the worktable can have a rotational speed controlled by a computer communicating with the worktable motor. Furthermore, gemstones can be placed on the worktable based on its rotation, such as feeding 15 gemstones for every 100 degrees of rotation, or feeding one gemstone for every 15 degrees of rotation. For example, the worktable speed can be set to any of 2, 5, 10, or 15 degrees per second.

[0043] The workbench is shown to be clockwise, but it can also be arranged counterclockwise depending on the test station layout. In some examples, the workbench can reverse and go backward according to commands from the computer system or for safety reasons (such as in response to blockages, obstructions, or other rapid decelerations sensed by the workbench rotation motor).

[0044] Positioned around workbench 102 are various test stations 116, 118, 120, and 122 for gemstone interaction, along with a sorting arm 112, position detection 114, and a hopper 124 for post-analysis storage. In many examples, the test stations may include analytical hardware, which may be modular to allow a variable number of subsystems to be placed near workbench 202, replaced, or removed for maintenance or upgrades. Examples of test stations may include UV Vis analysis, camera imaging of gemstones, Raman probe analysis, or other analyses using lasers, digital cameras, or other equipment. This will be discussed below regarding... Figure 9 , Figure 10Further discussion of the modular test station will follow.

[0045] Figure 2 Another angle of the rotatable stage 202 is shown, along with a central rotating hub 206 and several example test stations 216, 218 positioned around the stage 202. For example, the stage 102 can be rotated clockwise 104 to expose the gemstones to the various measuring stations as described herein, but it can also be rotated counterclockwise. A roller feeder 210 is also shown, where gemstones can be loaded in batches to begin the process as described herein. Guide arms 220 of the roller feeder and additional guide arms 240 are also shown to position the gemstones on the stage for analysis.

[0046] Therefore, the systems and methods described herein involve using a circular rotating stage system to examine multiple small gemstones (e.g., diamonds, rubies, and sapphires, or any other gemstones) via multiple modularly placed analytical subsystems (e.g., ultraviolet-visible spectroscopy (UV-VIS)) and sorting the analyzed gemstones based on the recorded measurements.

[0047] Bowl feeder example To begin the process, the system may include batch loading and feeding elements. Figure 2 A roller feeder 210 is shown positioned near a circular rotary table 202. In this way, a large number of gemstones can be loaded at once, but then placed individually on the table 202 for analysis as described herein. Figure 3A A close-up detail of this roller feeder 310 is shown, which can be loaded with a large number of small gemstones for analysis.

[0048] Figure 2 The feeder 210 and Figures 3A-3C The 310 designation allows an entire batch of gemstones to be evaluated with a single interaction between the operator and the automated system used for loading. In some examples, gemstones of more than one hundred grain sizes can be loaded into the feeder, but this example is not limiting. Figure 1 The feeder 110 in the middle Figure 2 The feeder 210 in the middle Figures 3B-3C The feeder 310 can be configured to cycle on and off to prevent overfeeding to the sorting subsystem and to move the gemstones to a rotating circular conveyor table via the described vibrations for analysis as described herein.

[0049] Figure 2 The roller feeder 210 and Figure 3A 310 in the middle can be arranged with Figure 2The feeder chute 250 is attached to the guide arm 220, which has a built-in hole guide system. Figure 3B Details of this guide arm 320, in which a hole 322 is arranged at one end, are shown. Figure 3C The feeder chute is also shown.

[0050] like Figure 2 220 and Figure 3B The guide arm shown in 320 will be positioned as follows: Figure 2 Above the worktable 202 shown, and with holes 322 in guide arms 220, 320 arranged below the chute 250 of the roller feeder 210, loose fragments of gemstones falling from the vibrating roller feeder 210 onto the worktable 202. In some examples, guide 320 may include a funnel-shaped portion (not shown) attached thereto, wherein at the top of the funnel is... Figure 2 The outlet of the roller feeder shown in Figure 250.

[0051] In some examples, the diameter of the hole 322 in the dispensing guide rod may be 0.7 inches. In some examples, the diameter of the hole 322 may be between 0.5 inches and 1 inch. In some examples, the width of the portion extending beyond the flat portion of the guide rod may be 1.1 inches. In some examples, the portion extending beyond the flat portion of the guide rod may be 0.9 inches deep. In some examples, the chamfer on the bottom side of the guide rod may be at a 15-degree angle to the horizontal. In some examples, the guide rod may be 5 inches long. In some examples, the guide rod may be 0.5 inches deep. In some examples, the guide rod may be 0.6 inches high. These dimensions are merely example dimensions and may be 10%-20% larger or smaller depending on the implementation.

[0052] Figure 3C Another detail of the roller feeder 310 and the guide arm 320 with holes (not shown) therein is shown. Arrow 370 indicates the direction in which the gemstone falls as it is dispensed from the roller feeder 310 through the holes in the guide arm 320 and falls onto the worktable.

[0053] In some examples, the roller feeder may include a vibration feature. This vibration or pushing of the roller feeder can help induce the gemstones to descend along the feeder chute as described. This vibration can be turned on or off depending on the flow of the gemstones, and the frequency of the vibration can be increased or decreased based on a motor rotating a counterweight system to vibrate the roller 210. Other examples may be batch pre-sorters, pre-single-stone sorting, or pre-vibration single-stone sorting.

[0054] In some examples, the roller feeders 210 and 310 can implement a half-bridge rectifier circuit on a potentiometer to control the intensity of vibration. In such examples, this allows for finer control over the speed at which the stone is fed from the roller feeder onto the worktable. Additionally, it enables the movement of stones of different sizes using a single mechanical device. For example, this arrangement can be used to move stones with diameters ranging from 1 mm to 4 mm. Other arrangements can be used for different size ranges. In some cases, the roller feeder, along with other components as described herein, can be opened and closed to perform the steps described herein. Furthermore, the spacing between the stones from the roller feeder can be, for example, a minimum spacing of 5 mm, or between 5 and 7 mm.

[0055] Guide arm example As described, when gemstones fall from the feeder bowl onto the worktable, multiple guide arms can be positioned to move or manipulate the gemstones on the rotating or swirling worktable surface. Due to the radial movement of the worktable and the gemstones falling upon it, these guide arms can be angled such that as the gemstones interact with them as the guide arms rotate, they gently move, orient, or otherwise slide to the desired position as described herein. The ultimate goal of the guide arms is to orient each gemstone in a table-down position and to separate each gemstone from one another in a line so that it passes under or near each individual test hardware station, then move it from the worktable into a coordinated hopper based on the results of any test analysis performed.

[0056] like Figure 1 As shown, after the roller feeder 110, the guide arm 112 is encountered first to guide the gemstone as it falls and then begins to rotate. This guide arm... Figure 2 The center is shown as 240, and it is arranged after the first guide rod 220 guides the gemstone from the roller feeder 210 onto the worktable 202. (See figure) Figure 2 , Figure 3B and Figure 3C As shown, the first guide rod can be arranged to attach to the funnel section, which receives gemstones from the feeder hopper. These gemstones then pass through... Figure 3B The hole 322 in the first guide rod fell to Figure 2 On workbench 202. For more description of this guide arm, see [link to relevant documentation]. Figure 5C .

[0057] After the gemstones fall onto stage 202, they are oriented and monolithized for analysis, as described, through interaction with the various guide rods and the rotating stage. For example, once the gemstones land on stage 202, as the stage rotates or spins, the gemstones interact and collide with the various guide arms as discussed herein, with the ultimate goal of separating and monolithizing them when they are placed on the rotating stage, so that they pass one after another beneath each station of the test apparatus described herein.

[0058] The sorting guide arm can be made of plastics such as Delrin acetal homopolymer (polyoxymethylene POM). Other possible materials include, but are not limited to, aluminum, stainless steel, and plastics (such as, but not limited to, ABS, TPU, PET-G, PA, PAHT CF15, PP, PP GF30, Teflon, etc.).

[0059] An example of this type of guide arm is as follows: Figure 4A As shown. Figure 4A This illustration shows an example of sorting guide arms 410, 420 after the feeder has placed the gemstone 401 onto the worktable 402. The sorting arms 410, 420 can be positioned close to and just above the rotating worktable 402, and in the example shown, they are angled away from the radial line of the worktable, such that when the worktable rotates 404, the gemstone 401 on the rotating worktable 402 first encounters and interacts with the first sorting arm 410. As the worktable 402 rotates 404 and because the arm 410 is angled relative to the center line of the worktable, the gemstone can interact with the arm 410, and the resultant force can act on the gemstone 401 to push the stone along the first guide arm 410 and begin to arrange them into a row of individual stones, rather than a large pile of stones. In some examples, friction grippers made of or incorporating aluminum, stainless steel, or plastics (ABS, TPU, PET-G, PA, PAHT CF15, PP, PP GF30, Teflon) may be included, and in some examples, the average roughness may be Ra > 1µm. In some examples, Ra may be equal to or close to 1µm.

[0060] In some examples, the worktable surface 402 can be textured to aid in moving the gemstone using friction grippers. In some examples, the worktable can be constructed from aluminum, AL6061-T6F, and an outer edge containing MJF nylon 12. A chemical polishing process can be used to impart a surface roughness of 1.6 to 6.3 μm. The lay can be granular, non-directional, or raised. Once the gemstone 401 encounters the first guide arm 410 and the worktable 404 is rotated to move the stone along that arm, the gemstone can disengage from contact with the first arm and encounter the second arm 420 for proper positioning on the worktable.

[0061] As an illustrative example, small gemstones can be cut into certain shapes, such as... Figure 8 The shape in the example. This example shape can be referred to as a round brilliant cut and can include a table 802, crown 804, girdle 806, and culet 808. Many measurements can be taken in a top view or in a table-down orientation of a round brilliant cut gemstone. Therefore, as all the gemstone fragments on the worktable move around the circulating surface, it may be desirable to flip or orient them so that their table side is table-down for analysis and sorting.

[0062] In such Figure 4A In the example shown, the second arm 420 can be angled in the opposite direction to the first arm 410, thereby causing the gem 401 to move along the second arm 420 as the worktable 402 rotates. Figure 4A In the example, the second arm 420 may include an embodiment having a fan-shaped surface with cutouts 422 to assist in flipping the stone 401 and help orient the gemstone 401 with the tabletop facing down. The fan-shaped guides may vary in that each guide has three to ten fan-shaped sections. The distance from the bottom of the arm to the circulating worktable may vary between 0.2 and 4.0 mm.

[0063] Figure 4B and Figure 4C An example sorting guide arm with curved fan-shaped sections is shown, which are used to help align gemstones as they move around the worktable, according to certain aspects described herein.

[0064] exist Figure 4B The image shows a top-down view 440, a front view 430, and a side view 450. As shown in the top-down view 440, the fan-shaped side includes alternating outer extensions 442 and holes or recesses 444 between adjacent extensions 446, 448, 452, and 454. As can be seen from the top-down view, in... Figure 4B In the example, these extensions gradually become shorter along the edge. As shown, the first extension 442 and the last extension 454 have different lengths. Viewed from top-down 440, this example of an angled arm can be used to aid in moving the stone as described. In this example, a fan shape can be seen from the front view 430, where the bottom edge 432 rotates and, in some examples, vibrates. Figure 4A The worktable 402 moves to align the gemstone as described. Side view 450 shows how the various extensions between the fan-shaped edges become shorter and shorter, and in this example how the bottom edge 456 is also angled to form the edge that contacts the worktable during use.

[0065] Figure 4CThe fan-shaped edges of the sorting guide arm 420 in this example are arranged from the longer 442 to gradually shortening 446, 448, 452, and finally 454. In some examples, a gap or space may be formed between the guide and the rotary table to avoid scratching. A recess 444 is cut into this angled arm, and the bottom 456 is also angled as shown. In use, this arm 420 can be configured to vibrate or remain stationary. In either case, the arm 420 can remain stationary relative to the rotary table as described to monolithize the gemstones as the table moves. In some example embodiments, the arm 420 does not vibrate when the table rotates.

[0066] The dimensions of the fan-shaped edges can vary, but in some examples, the fan-shaped guides can vary from three to ten fan-shaped sections per guide. In some examples, the distance from the bottom of arm 460 to the circulating table can vary between 0.1 and 4.0 mm. In some examples, the sorting arm can be 5 inches long. In some examples, the sorting arm can be 3 to 6 inches long. In some examples, the depth of the sorting arm can be 1.1 inches deep. In some examples, the sorting arm can be 0.9 to 1.3 inches deep. In some examples, the front angle of the sorting arm can be 45 to 60 degrees with the horizontal. In some examples, the height of the sorting arm can be 1.6 inches. In some examples, the height of the sorting arm can be 1.3 to 2.1 inches. These dimensions are merely example dimensions and can be 10%-20% larger or smaller depending on the implementation.

[0067] Figure 4D Another example embodiment of the single-piece guide rod 421 is shown, which has a straight geometry and no fan-shaped portion. This example arm will not have any geometric features or embellishments, but can be angled to aid in the single-piece shaping of stone on a rotating workbench as described herein. In some examples, the guide rod 421 can be coupled with, for example... Figure 5B The illustrated motorized pivoting system communicates or is otherwise connected to pivot relative to the rotatable table as described herein. In some examples, any shaped guide rod can be mounted as described herein.

[0068] In some examples, the guide rod 421 may be 0.3 inches deep. In some examples, the guide rod may be 3 inches long. In some examples, the chamfer on the bottom of the guide rod may be at a 15-degree angle to the horizontal. In some examples, the guide rod may be 0.36 inches high. These dimensions are merely examples and may be 10%-20% larger or smaller depending on the implementation.

[0069] Figure 4E Another example of a monolithic guide rod 427 geometry is shown. (See example...) Figures 5B-5CAs shown, this circular geometry 484 helps ensure the stone is positioned radially on the workbench. In some examples, the guide bar can be 0.795 inches deep. In some examples, the guide bar can be 3 inches long. In some examples, the curved portion of the guide bar can be a curve with a 2-inch radius. These dimensions are merely examples and can be 10%-20% larger or smaller depending on the implementation. In some examples, the short flat portion on either side of the curved portion can be 0.118 inches long.

[0070] Figure 4F Another example of a monolithic guide rod geometry is shown. In such an example, the guide rod comprises a circular geometry 482. Figures 5B-5C As shown, this shape helps ensure that the stone is in the same radial position on the workbench.

[0071] In some examples, the guide rod may be 0.36 inches high. In some examples, the guide rod may be 1 inch deep. In some examples, the guide rod may be 5 inches long. In some examples, the curved portion of the guide rod may be a curve with a radius of 4 inches. In some examples, the short flat portion on either side of the curved portion may be 0.118 inches long. These dimensions are merely examples and may be 10%-20% larger or smaller depending on the implementation.

[0072] Single-particle and spacing examples In such Figure 4A As shown, by orienting the gemstone with its table side facing down, it can be individualized. Individualized gemstones can include those that are oriented as the stage rotates and separated at certain intervals for individual analysis.

[0073] Figure 5A An example of a monolithized gemstone 501 is shown when the worktable 520 rotates 590 degrees and the arm 530 interacts with the gemstone 501. Figure 5A In the example, the final straight sorting guide 530 can be angled on the worktable 520 such that when the worktable rotates 590 degrees, it pushes the gem 501 upward along the angled guide rod 530 and eventually pushes it away from the last guide arm 530.

[0074] Then rotate the worktable to keep moving the gem 501 after it leaves the guide rod, and eventually space it out and position it properly as the gem 501 moves around the circulating worktable 520. Figure 5A The straight arm 530 in the example can be derived from... Figures 4B-4F Any other example structure shown can be substituted, such as... Figure 4E and Figure 4F The curved sorting arm shown.

[0075] Figure 5B This is an example guide rod subsystem, attached with a motor 552 and an encoder 550 to pivot or rotate the guide rod 530, thereby changing the angle of the guide rod as needed. This motorized, rotatable guide rod helps ensure the desired stone flow rate / spacing for stones of different sizes, as the angle of the guide rod 530 determines the spacing of the stones as they rotate on the worktable and interact with the individual guide rods as described herein. It allows for rapid adjustments and changes to the system and allows users or programs to correct for individual stone variations or spacing consistency.

[0076] This robotic arm may include a motor 552 and an encoder 550 attached to the guide arm 530. The geometry of the guide arm may be... Figures 4A-4F Any geometry shown. This arrangement allows the guide rod 530 to move via the rotation of the arm. This movement allows the guide rod to be positioned at different angles on the rotating worktable, such as... Figure 5C The rotation shown helps to change the distance between individual fossil particles.

[0077] Figure 5C The diagram shows the overall layout of the worktable 520, roller feeder 510, and several example sorting arms arranged around the worktable such that as the worktable rotates 590 degrees, the stones move individually and interact with each other to achieve single-stone processing as described herein. Dashed line 575 illustrates how the stone can traverse its path through the guide rods and ultimately achieve single-stone processing on the rotating worktable.

[0078] First, such as Figure 3B As shown, the roller feeder 510 feeds the gemstone through a hole in the first guide rod 525. The gemstone then moves to a spaced-apart second guide rod 521, which may include, for example, Figure 4B and Figure 4C The fan-shaped edge is shown. The guide rod 521 helps orient the gemstone face down on the worktable 520 and also initiates the spacing process. As the worktable 520 moves 590, the gemstone then interacts with another guide rod 523, and then with another guide rod 530, to help space it apart as they rotate. In some examples, one or more, or any of these guide rods, can be as follows: Figure 5B As described, it is motorized. This arrangement will allow the operator or system to quickly adjust the angle of guide rod 530 and pivot it to help change its spacing as the gem continues its journey. Next, the gem can interact with the last guide rod, which in this example is a curved guide rod 584. This guide rod... Figure 4E and Figure 4FThe example is shown below. Following this guide rod, the gemstone can be monolithized and spaced at a specific distance from the edge of stage 520 for interaction with individual test stations. In some examples, the camera 513 is positioned to capture digital images of the gemstone for spacing and alignment purposes, such as... Figure 6 As shown. In some examples, this may also include identification analysis.

[0079] In one example embodiment, the minimum inter-gem spacing required by the UV-Vis probe may be approximately 6 mm. Additionally, the minimum spacing of stones at the ejection pin may be approximately 2.5 mm. The natural stone refer rate, the percentage of stones that might be incorrectly identified as synthetic gemstones, may be approximately 5%, and in some examples less than 5%. The throughput per batch may be approximately one stone per second, and the stone size (such as the diameter of the girdle for round-cut stones) may be between 0.8 and 4 mm. For each of the 0.8-4 mm stones, the maximum stone diameter deviation per batch may include more than and / or less than 0.5 mm. Gemstone cuts may include round brilliant stones, and stone types may include diamonds, rubies, and / or sapphires, as examples only. The stones may be cleaned (e.g., acid-washed) prior to analysis. The stone balance rate may include the average measurement time per stone after the first batch of stones has been distributed from the roller feeder, passed through the sorting guide, and arrived at the UV-Vis measurement probe.

[0080] In some cases, gemstones can be spaced according to the minimum spray spacing. Sorting guides can be used to determine the radial position and stone-to-stone spacing. For example, this spacing can be between 6.2 and 7.8 mm or between 5 and 8 mm. The stones can be positioned approximately 3.8 mm from the spray nozzle, with the air spray duration set to approximately 100 ms.

[0081] Example of a pressurized air system In some example embodiments, pressurized air can be used on the system in different ways to move the gemstone. This pressurized air can be generated by an air compressor attached to a hose or line through which air can flow and a valve that can be opened or closed by manual or computerized commands.

[0082] In some examples, this pressurized air can be used to help clean the worktable and guide arms, thus keeping the broken gemstones free of debris. Figure 5D A side view of a worktable 520 and a guide rod 530 is shown. However, in Figure 5DIn the example arrangement, an additional air compressor or blower 560 is shown, having an exhaust or air line 562 and a nozzle 564 to direct a pressurized airflow below the guide rod 530 and between the guide rod 530 and the worktable 520. This arrangement can supply positive air pressure below the single-particle guide to help remove trapped particles (such as dust and debris) and ensure a continuous flow of stone on the rotating worktable 520. This system can also be incorporated as needed before running stone on the worktable, as part of a calibration process, or as a cleaning mode between loads, thereby helping to maintain the cleanliness of the system.

[0083] In some examples, the overall housing of the particle sorting equipment can be constructed to prevent dust from adhering to the worktable / guide rods, etc. In some examples, a small gap may exist between the guide rods and the rotating worktable, within which unwanted dust and debris may obstruct or interrupt the flow of stone around the test station. This obstruction effect can be seen in stone of various sizes, but may be particularly pronounced for stones smaller than 1.2 mm.

[0084] In some examples, a positive pressure air filtration system based on a high-efficiency particulate air (HEPA) filter can be used in this closed system to keep dust and debris out. In this approach, an air compressor or blower can force air into the system and use the HEPA filter to remove unwanted particulate matter. In such examples, air can be blown into the closed system through air ducts to supply positive air pressure into the housing and prevent dust and fibrous particulate matter from contaminating the system.

[0085] Camera detection Return to Figure 1 After the roller feeder 110 drops the gems onto the worktable 102, these gems are then interacted with the guide monolithization arm 112 and arranged in a row for evaluation in any number of test arrangements. In some examples, such as Figure 1 As shown, the first substation beneath the gemstone may be a photo position detection subsystem 114, which includes one or more cameras configured to capture images of the first gemstone and a computer vision model configured to process the captured images of the first gemstone and determine the actual orientation of the first gemstone.

[0086] This position detection system 114 may include one or more camera components to identify various aspects of the monolithic gemstone. This also... Figure 5CThe camera 513 is shown behind the guide arm. The camera-based position detection system 114 can be used to capture a set of digital images of the gemstones on the worktable, allowing the system to determine whether the stones are properly positioned / spaced for interaction with individual test pieces in terms of their radial position on the worktable. In some examples, this digitally pixelated image data can be analyzed to determine whether the stone diameter matches information provided by the operator; for example, assuming a batch of 1 mm stones suddenly includes 3 mm stones. Furthermore, image analysis can help determine whether stones are table-side down and / or whether single gemstones are properly spaced; for example, if two stones are attached together or too close together, they may not be properly spaced for test analysis, as described herein. Image analysis can also be used to help determine if there are any unsuccessful attempts during the stone sorting / spaced process.

[0087] If the image camera system 114 detects any of the problems described above, the system can be programmed to avoid screening those stones. Those problematic stones will either undergo the sorting process again directly, or be removed from the system and marked as undetermined and / or returned to the system after proper cleaning / identification as described herein.

[0088] A set of images can be captured for each gemstone, and these images are processed by an imaging processing system, which is part of the position detection subsystem 114, to determine the orientation and position of each gemstone.

[0089] In some cases, the position detection subsystem 114 may generate an alarm or trigger a specific action at system 100 in response to determining that the gemstone is in an inappropriate position or outside of various separation parameters. In this way, as described herein, the system can reject misaligned stones for later feeding into the system.

[0090] also, Figure 1 The position detection subsystem 114 in the middle can be used to capture images of the gemstone and respond to monolithization (i.e., Figures 5A-5D The single-grain gemstone (501) is used to determine the separation and orientation of the gemstone.

[0091] like Figure 1 As described, once the stone is granulated on the workbench 102 via the granulation subsystem 112, it can first pass under the vision system camera position detection system 114, such as Figure 6As described herein, control software communicating with a camera digital image capture system, using data from the table rotary encoder and vision system, can assign position coordinates to each imaged gemstone. These coordinates can be used to position other measuring instruments as described, as well as the jet air nozzles. Measuring instruments (such as UV VIS fibers) can be aligned such that they are positioned above the desired area of ​​the gemstone as it passes beneath the measuring station for measurement.

[0092] Figure 6 An example image of a position detection subsystem is also shown, wherein the position detection subsystem is captured from a self-camera system comprising one or more cameras for capturing images of gemstone 601 on workbench 602 and an automated computer system for analyzing one or more captured digital images from said cameras to identify gemstone 601 and various aspects of each sample gemstone. Figure 6 In the example, virtual box 610 can be drawn by a computer system on the captured digital image to determine its location, and can also be used to determine the measurement results of the gemstone, and in some cases, to indicate a good identification of gemstone 601. This analysis can be accomplished through pixel counting, image measurements based on geometry and the distance from the camera to the worktable and the gemstone, or other example image processing systems and methods. In such an example, a computer system communicating with the camera can track which individual stones are moving around the circulating worktable so that when the modular test is completed, the computer knows which stones the analysis data applies to, allowing it to properly sort the stones in the sorting stage. This can be achieved by counting the gemstones as they leave the individualization arm, comparing images for analysis, or other methods.

[0093] As described, the system can use the capture and comparison of images to determine whether a gemstone is in the proper orientation for testing. In some examples, artificial intelligence software can be used to determine whether the gemstone is properly oriented, its markings, size, etc.

[0094] Refeeding Example In some cases, it can also be achieved through computerized systems and methods (including the use of...) Figure 1 and Figure 6A camera-based inspection system analyzes and processes the proper spacing of gemstones on the worktable. For example, if one or more gemstones are not properly spaced or are improperly oriented on the worktable (such as an improperly spaced string of stones or gemstones that have been flipped over), different analytical tools may not be able to analyze the gemstones properly. In such an example, the computer can identify these problems through image analysis and can send instructions to the refeeding system to refeed the string of gemstones back into the system via commands to the compressor nozzle arrangement, which causes a burst of compressed air from pneumatic pressure valves and nozzles to remove or push these gemstones off the worktable and capture them in a receiver for recirculation through the system before analysis begins. Gemstones marked for refeeding can continue to be fed back to the original sorting path for normal analysis.

[0095] Figure 7 An example refeed subsystem is shown. In some embodiments, the refeed subsystem may be located near the position detection subsystem 114. Furthermore, the refeed subsystem may be configured to receive instructions, for example, from a computing device associated with the position detection subsystem to remove gemstones from the worktable and image analysis as described. For example, an air pressure valve may provide a burst of compressed air to remove gemstones from the worktable 702, similar to the arrangement for sorting into bins described below. In some cases, the bin may receive any removed gemstones for refeeding into the first batch feeder 110. In some examples, the refeed subsystem... Figure 1 After the sorting subsystem 124. In such an example, gems marked by the computer for refeeding will pass through all other subsystems without any control measures until the refeeding station.

[0096] In some examples, this system may include a refeed subsystem comprising a first air burst element. The refeed subsystem 730 may be configured to receive an instruction to reject or otherwise remove an identified gemstone in response to a computer vision model determining that the orientation of a first gemstone is outside a threshold orientation range. In some examples, the refeed subsystem may operate, individually or in combination, by moving to a worktable for robotic arm sweeping to guide the gemstone away from the worktable and / or by including a pneumatic burst of air onto the gemstone via the air burst element, thereby guiding the gemstone to a hopper located outside the circular worktable 702. When not instructed to remove one or more gemstones to the refeed option, Figure 7 The refeeding system can be separated from the worktable 702.

[0097] Modular test example like Figure 1As shown, because the stage 102 is configured to rotate and present the gemstones beneath different subsystems arranged, placed, positioned, or otherwise constructed around the stage subsystems 116, 118, 120, 122, a row of gemstones, monolithized by the sorting arm 112, can encounter each subsystem one at a time for individual analysis as the stage 102 rotates along direction 104. Each subsystem may include various sensors to capture various aspects of the gemstones, receive test data, and / or otherwise analyze each gemstone. In some examples, each analysis subsystem sends data directly to a local computer system for analysis and sorting determination. In some examples, the analysis data may be sent to an off-site cloud computing system for analysis and sorting determination. In any arrangement, computer judgments can be made and sent to a local pneumatic sorting system as described herein.

[0098] Examples of modular testing equipment may include, but are not limited to, UV-VIS spectroscopy for diamonds, rubies, and / or sapphires. Systems used for testing, including digital image analysis techniques, can be used to assess the quality of gemstones based on their size, cut, clarity, color, and authenticity. Other analytical techniques may include determining whether clarity enhancement techniques, such as fillers, oils, resins, or other compounds or chemicals, like those used to enhance emerald green, have been applied to the gemstone. Cameras can capture images of one or more gemstones, which can be fed into a computer vision model implemented on a computing device or a series of interconnected computing devices to derive measurements of the gemstones, such as size, clarity, and color for each gemstone.

[0099] Computer vision technology can process images of gem facets to determine quantitative measures that can make the gem evaluation process more accurate and consistent than manual analysis. Features extracted from digital images can also be used to distinguish gems made of natural materials from samples made of synthetic compounds, and to identify specific grades of gems from other similar-looking samples.

[0100] The accuracy and repeatability of these techniques for digital image analysis can depend on the quality of the images used for analysis. To capture high-quality images that clearly capture the features of a gemstone sample and have sufficient resolution and contrast to observe table reflections and other hard-to-see features, each sample can be aligned with one or more cameras capturing the image. For example, the sample may need to be focused and may include orientation aligned with one or more cameras. Other testing systems can be implemented using testing hardware such as image sensors, UV-Vis, Raman probes, laser-induced photoluminescence analysis, etc., as noted.

[0101] A measurement or testing subsystem can be configured to generate data associated with each gemstone by each of one or more measurement or testing subsystems. The measurement or testing subsystem can be further configured to derive one or more measurements for each of the one or more measurement subsystems using the data generated by each of the one or more measurement subsystems. The measurement or testing subsystem can be further configured to derive evaluation measurement or testing data for the first gemstone based on the derived measurements of the first gemstone. In some cases, any of these measurement or testing subsystems includes one or more testing systems configured to capture data associated with the first gemstone and a measurement generation model configured to process the data to determine at least one measurement of the first gemstone. The at least one measurement may include a value specifying any one of the following: size, weight, cut type, clarity, origin, natural or synthetic origin, and color of the first gemstone. This data (including image data and test data) may be stored for future use and, as described, for determining which bin each gemstone is sorted into.

[0102] For example, any number of subsystems 116, 118, 120, and 122, labeled for non-limiting illustrative purposes only, may include various hardware systems for performing gem measurements that use computer vision techniques to determine quantitative measures of the gems to derive an evaluation metric for each gem. In some examples, these subsystems may be modular and removable or replaceable. In some examples, they may be upgradeable. For example, subsystems 116, 118, 120, and 122 may implement any number of cameras, Raman probes, lasers, or any other kind of device(s) for gem analysis. Other examples may use cameras under different lighting conditions such as diffuse white light, directional light, LWUV LEDs, SWUV LEDs, Xe flash lamps, Raman probes, reflective probes for fluorescence measurements, and reflective probes for UV-VIS absorption measurements. Furthermore, any subsystem described herein may be electrically communicating with one or more computing devices to perform the processing as described herein. In such examples, as described herein, the hardware may be simply plugged into the computer interface of the system herein for sending and receiving data to and from the host system computer.

[0103] In some cases, the gemstone can be positioned directly below one or more sensors of any measuring subsystem surrounding the rotating stage. Figure 9A side view shows an example location of a stone 902 positioned on a rotatable stage 920 and below a fiber element 904. As described herein, the fiber element 904 can be connected to a sensor device to capture data related to the gemstone. Any type of analytical tool or sensor described herein can be mounted in such a manner that the system can automatically analyze the gemstone 902 one at a time as the individual gemstones 902 rotate on the stage 920 and come under the sensor 904. In some examples, these test stations or analysis stations 950 may include standard or uniformly arranged mounting positions 922 configured to extend upwards around and above the edge of the rotatable stage 920, such that they can be removed, exchanged, altered, rearranged, or otherwise modularly configured. See also Figure 1 It shows a top-down view of various test or analysis stations 116, 118, 120, 122, 124, etc. In some cases, the presence of a gemstone can be detected using one or more sensors as the gemstone passes the sensor on the rotating stage 920. The sensor can be a gate sensor, which is configured to trip when the gemstone is in a specific position or when the light source generated by the sensor is interrupted.

[0104] In some examples using, for instance, UV-Vis analysis, the camera system can acquire a set of pixelated digital images of a gemstone arranged on a worktable. In some cases, the optics used for the camera assembly can have one or more spectrometer slits, such as two slits, one 25 μm wide and the other 50 μm wide. The probe can be positioned approximately 3 mm above the gemstone, and the integration time can vary from 10 ms to 50 ms.

[0105] Figure 10 An example hardware testing setup is shown that can be placed at any of the described substation areas 116, 118, 120, and 122. In this example, the UV-Vis subsystem can be arranged at one of the stations around the workbench 1020, with hardware 1080 fixedly positioned and used to interact with gems that may pass beneath the rotating workbench 1020.

[0106] The subsystems described in previously filed patent applications may be used herein in conjunction with or in combination with any other analytical system, such as those described in any or all of the following patents / applications: US 9,953,406 Automated System and Method for Clarity Measurements and Clarity Grading; US 8,402,066 Method and System for Providing a Clarity Grade for a Gem; US 8,120,758 Fast UV-VIS-NIR Absorption Spectrometer System and Method; US 9,678,018 Apparatus and Method for Assessing Optical Quality of Gemstones; US 10,107,757 Apparatus and Method for Fluorescence Grading of Gemstones; US 10,684,230 Device and Method for Screening Gemstones; US Application 17 / 200,706 Image Assisted Scanning Spectroscopy for Gemstones. Identification; US Application 17 / 332,513 Luminescence Imaging for Gemstone Screening; US Application 17 / 105,065 Fluorescence Imaging of Gemstones on a Transparent Stage; US Application 17 / 200,706 Imaging Assisted Scanning Spectroscopy for Gem Identification; US Application 17 / 382,317 Ultraviolet Visible Absorption Spectroscopy for Gemstone Identification; US Application 17 / 555,241 Measurement and Characterization of the Effect of Blue Fluorescence on the Appearance of Diamonds, all of which are incorporated herein by reference in their entirety.Accordingly, the system described herein may include a sensor holder with sensors that can move vertically relative to the disc stage as a unit when the disc stage rotates. These sensors can be mounted on a holder that rests on the rotating disc stage and moves up and down with it. This mounting method eliminates relative movement between the sensors and the disc stage and keeps the stone within a constant detection range, thus detecting all stone regardless of the stage's vertical movement.

[0107] Extraction and storage This set of subsystems may also include a sorting subsystem configured to guide each gemstone to a sorting bin based on evaluation metrics derived for each gemstone. In this way, batches of fragmented gemstones can be sorted into subdivisions based on analyses performed at various testing stations. These subdivisions can be based on any number of metrics or test data, such as natural / laboratory culture, carat size, color, treatment, cut, clarity, or any other metrics or test data.

[0108] In some cases, it is possible to, for example Figure 1 A series of sorting bins, including a first sorting bin, are provided at the sorting subsystem 124. Each sorting bin may correspond to a series of evaluation metrics that correspond to software programming that enables the system to label each gem after evaluation. The sorting subsystem may be further configured to receive instructions to guide the first gem to the first sorting bin 124. As noted above, the various subsystems described herein can obtain measurements for each gem and process these measurements to generate an evaluation metric for each gem. Evaluation metrics (e.g., scores) may be assigned to each gem. The sorting subsystem 124 can identify the bin corresponding to the evaluation metric for each gem. Furthermore, the sorting subsystem 124 may include dispensing elements (e.g., an air pressure system) to dispense gems into corresponding bins. For example, a pre-positioned air pressure system may be movably oriented to direct high-pressure air to the gems through nozzles, thereby dispensing the gems into corresponding bins. In some examples, a nozzle may be movable or rotated to guide the gems as described. An air compressor can be connected to a nozzle, and a computer can use computer analysis to guide the valve to open or close, thereby blowing air to move the crushed gemstones into the corresponding hopper or bin, as described in this article.

[0109] Figure 11A and Figure 11BDetails of an example air hose 1110 with nozzle 1104 are shown. Nozzle 1104 directs a burst of pressurized air toward the crushed gemstones 1130 on the worktable 1120 and into the corresponding pre-programmed hopper 1122. For example, a first hopper can be designated for gemstones with a first evaluation metric range (e.g., gemstones with the highest evaluation metric), while a second hopper can be designated for gemstones with a second evaluation metric range (e.g., gemstones with the lowest evaluation metric). In some examples, real or lab-grown diamonds can be separated. In some examples, gemstones that exhibit fluorescence and those that do not can be separated. Any number of parameters or variables can be considered, programmed into the system as described herein, and used for gemstone separation.

[0110] The sorting subsystem can also use a second air burst element to provide an air burst to the first gemstone, thereby guiding the first gemstone into the first sorting bin in this series of sorting bins. To leave the worktable, after analysis by any or all of the analysis subsystems, under computer command, the stone travels around the circulating worktable to one or more pneumatic or air nozzles and is blown into the bins. Multiple bins can be included as needed based on sorting parameters. For example, Figure 1 The sorting subsystem 124 can receive instructions to direct a burst of compressed / pressurized air to the gemstone, thereby moving the gemstone to the desired bin.

[0111] Can about Figures 11A-11B Example sorting system 124 is shown. Different nozzles 1102, 1104 can be pre-positioned to guide gemstones 1130 from worktable 1110 and into corresponding bins 1120, 1122 using pneumatic air puffing, based on computer evaluation of one or more evaluation systems as described herein. These nozzles 1102, 1104 can be connected to an air compressor and computer-operated valves, allowing the computer to open and close the valves to puff air and move gemstones 1130 as described above. In some examples, Figures 11A-11B The system layout and description can also be used in the refeeder example described in this article.

[0112] Example of method steps Figure 12 An example method for analyzing and sorting gemstones is shown. This method may include receiving at least one gemstone (e.g., fragments) at the feed subsystem at point 1202. Figure 1 A sample roller feeder subsystem is described at point 110. For example, as described herein, one or more gemstones are provided at the vibratory batch feeder of the roller feeder subsystem to separate the gemstones for further processing.

[0113] The method may further include sorting the gemstones via a sorting guide 1204 and performing a single-stone process 1206. This may include orienting the gemstones to a first orientation by a single-stone subsystem. The single-stone subsystem 112 may include one or more arms that can separate the gemstones from each other by at least a threshold distance and orient the gemstones in a top-down orientation.

[0114] In some cases, at 1208, the method may include [method name missing]. Figure 1 One or more cameras in the photo position detection subsystem 114 capture images of the gemstones. An image of each gemstone can be captured for processing to derive the actual orientation of each gemstone. The method may further include processing the images to determine the actual orientation of the gemstone. For example, a computer vision model (i.e., a computer-implemented model implemented by the computational nodes of the photo position detection subsystem) can process the images of the gemstones and derive their orientation. The computer vision model can determine whether the actual orientation of the gemstone is outside a threshold orientation range (e.g., the range of orientation values ​​corresponding to a table-down orientation).

[0115] In response to determining that the actual orientation of the gemstone is outside the threshold orientation range, the computer vision model can... Figure 7 The refeed subsystem provides instructions 1214 to reject gemstones. The refeed subsystem can provide burst air to the gemstones via an air burst element to guide the gemstones to a hopper located outside the worktable.

[0116] The method may also include: at 1210, through any number of testing or analysis platforms (such as...) Figure 1 A set of metric subsystems (116, 118, 120, 122) are used to process gemstones. For example... Figure 9 As described, these testing subsystems can be modular or removable / replaceable, allowing for the analysis of gemstones as they move around the circular stage and arrive at the test or analysis sensors one at a time, in any sequential order in which the testing or analysis systems are arranged around the stage. The feeder subsystem, the single-stone subsystem, and this set of measurement subsystems can be arranged around a single stage 102.

[0117] Processing a gemstone using this set of measurement subsystems may involve generating gemstone-related data by each of the subsystems. Gemstone-related data may include images, absorption spectra (e.g., captured by a UV-VIS spectrophotometer), etc. This data may be processed to derive gemstone-related measurements. As described herein or incorporated herein by reference, these measurements may include values ​​(or a series of values) specifying any one of the following: size, weight, cut type, clarity, origin, natural or synthetic origin (e.g., whether the gemstone is natural or synthetic), and color. In some examples, these systems and methods may be used to determine the size, color, and / or natural or synthetic origin of a gemstone to be evaluated, as described herein.

[0118] In addition, any measurement subsystem can derive measurement or test data (e.g., the gem's origin, color, and clarity) based on the gem's absorption spectrum.

[0119] The method may also include: at 1212, guiding the gemstone to the first sorting bin based on the derived evaluation metric of the gemstone. For example, Figure 1 The sorting subsystem 124 can use an air burst to guide the gemstones into a bin corresponding to the gemstone's evaluation metric.

[0120] Network Example This disclosure embodiment can utilize networked computing arrangements, such as... Figure 13 The arrangement shown. In Figure 13 In this process, any of the various computers or computer components within the other testing system 1302 can be used to process the test data, send and receive instructions to the workbench motor and air compressor, or send and receive other data (such as sample position, gemstone test data, gemstone identification information, time and date, etc.). The computer 1302 used for these steps can be any number of computer types, such as those included in the testing system, camera, and / or other computer arrangements communicating with the computer components (including, but not limited to, laptop computers, desktop computers, tablet computers, tablet phones, smartphones, or any other type of device for processing and transmitting digital data).

[0121] exist Figure 13In this example, instead of or attached to a local computer, data from gemstone testing, stone sample identification, and location-captured data from any computer 1602 can be analyzed on a backend system. In such an example, data can be transferred to a backend computer 1330 and associated data storage device 1332 for storage, analysis, calculation, comparison, or other manipulation. In some examples, communication between the control system and the hardware computer system can use a socket communication protocol. In some examples, additionally or alternatively, data transfer can be wirelessly transmitted via cellular or WiFi transmission with associated routers and hubs 1310. In some examples, additionally or alternatively, transmission can be performed via a wired connection 1312. In some examples, additionally or alternatively, transmission can be performed via a network such as the Internet 1320 to the backend server computer 1330 and associated data storage device 1332. At the back-end server computer 1330 and associated data storage device 1332, test data, calibration documents, sample identification, sample location, time, and date can be stored, analyzed, and compared with previously stored data for matching, identification, and / or any other type of data analysis. In some examples, additionally or alternatively, data storage, analysis, and / or processing can be performed at the computer 1302 involved in the original data collection. In some examples, additionally or alternatively, data storage, analysis, and / or processing can be shared between the local computer 1302 and the back-end computing system 1330. In such examples, networked computer resource 1330 can allow the use of more data processing capabilities than are available at the local computer 1302. In this way, data processing and / or storage can be offloaded to available computing resources. In some examples, additionally or alternatively, networked computer resource 1330 can be a virtual machine in a cloud infrastructure or distributed infrastructure. In some examples, additionally or alternatively, networked computer resource 1330 can be distributed among many physical or virtual computer resources via a cloud infrastructure. The example of a single computer server 1330 is not intended to be limiting, but merely an example of computational resources that can be utilized by the systems and methods described herein. In some examples, additionally or alternatively, artificial intelligence and / or machine learning can be used to analyze image data from the sample, align the sample with a camera, and / or focus the imaging camera in conjunction with stage movement. Such a system can employ datasets to train algorithms to help produce increasingly better results in sample imaging, sample alignment, sample analysis, identification of focused samples, stage movement, camera movement, etc.

[0122] Example computer devices Figure 14An example computing device 1400 is shown, which can be used in the systems and methods described herein, or as a general-purpose computer that sends commands to and / or receives test data from various test stations and air compressors. In the example computer 1400, a CPU or processor 1410 communicates with a user interface 1414 via a bus or other communication means 1412. This user interface includes example input devices such as a keyboard, mouse, touchscreen, buttons, joystick, or other user input devices. The user interface 1414 also includes a display device 1418, such as a screen. Figure 14 The illustrated computing device 1400 also includes a network interface 1420 for communicating with the CPU 1410 and other components. The network interface 1420 allows the computing device 1400 to communicate with other computers, databases, networks, user equipment, or any other computing-capable device. In some examples, additionally or alternatively, the communication method may be via Wi-Fi, cellular, Bluetooth Low Energy, wired communication, or any other type of communication means. In some examples, additionally or alternatively, the example computing device 1400 includes peripheral devices 1424 that also communicate with the processor 1410. In some examples, additionally or alternatively, the peripheral devices include a stage motor 1426, such as an electric servo and / or stepper motor for moving the stage for sample analysis. In some examples, the peripheral device 1424 may include lighting or camera equipment 1428 and / or instruments 1429 such as a spectrometer, air compressor, etc. In some example computing devices 1400, a memory 1422 communicates with the processor 1410. In some examples, additionally or alternatively, this memory 1422 may include instructions for executing software, such as an operating system 1432, a network communication module 1434, other instructions 1436, an application program 1438, an application program 1440 for controlling a workbench or instrument, an application program 1442 for processing test data, a data storage device 1458, data such as data table 1460, transaction log 1462, sample data 1464, sample location data 1470, or any other kind of data.

[0123] Conclusion As disclosed herein, features consistent with embodiments of this disclosure can be implemented using computer hardware, software, and / or firmware. For example, the systems and methods disclosed herein can be embodied in various forms, including, for example, data processors (such as computers, which also include databases, digital electronic circuits, firmware, software, computer networks, servers, or combinations thereof). Furthermore, while some embodiments of the disclosed implementations describe specific hardware components, systems and methods consistent with the invention can be implemented using any combination of hardware, software, and / or firmware. Moreover, the foregoing features and other aspects and principles of the invention can be implemented in a variety of environments. Such environments and related applications can be specifically constructed to perform various routines, processes, and / or operations according to the embodiments, or they may include computers or computing platforms that are selectively activated or reconfigured by code to provide necessary functionality. The processes disclosed herein are not inherently associated with any particular computer, network, architecture, environment, or other device and can be implemented using appropriate combinations of hardware, software, and / or firmware. For example, various machines can be used with programs written according to the teachings of the embodiments, or it may be more convenient to construct specialized devices or systems to perform the required methods and techniques.

[0124] The aspects of the methods and systems described herein, such as logic, can be implemented as functions programmed into any of a variety of circuit systems, including programmable logic devices (“PLDs”), such as field-programmable gate arrays (“FPGAs”), tensor processing units (“TPUs”), graphics processing units (“GPUs”), programmable array logic (“PAL”) devices, electrically programmable logic and memory devices, and standard cell-based devices, as well as application-specific integrated circuits (ASICs). Other possibilities for implementation include memory devices, microcontrollers with memory (such as 4PROMs), embedded microprocessors, firmware, software, etc. Furthermore, some aspects can be embodied in microprocessors with software-based circuit emulation, discrete logic (sequential and combinational), custom devices, fuzzy (neural) logic, quantum devices, and hybrids of any of the above device types. Basic device technologies can be provided in various component types, such as metal-oxide-semiconductor field-effect transistor (“MOSFET”) technology such as complementary metal-oxide-semiconductor (“CMOS”), bipolar technology such as emitter-coupled logic (“ECL”), polymer technologies (e.g., silicon conjugated polymers and metal conjugated polymer-metal structures), hybrid analog and digital, etc.

[0125] It should also be noted that the various logics and / or functions disclosed herein can be enabled using any number of combinations of hardware, firmware, and / or data and / or instructions embodied in various machine-readable or computer-readable media, depending on their behavior, register passing, logic components, and / or other characteristics. Computer-readable media that can embody such formatted data and / or instructions include, but are not limited to, various forms of non-volatile storage media (e.g., optical, magnetic, or semiconductor storage media) and carrier waves that can be used to transmit such formatted data and / or instructions via wireless, optical, or wired signal transmission media or any combination thereof. Examples of transmitting such formatted data and / or instructions via carrier waves include, but are not limited to, transmission (upload, download, email, etc.) over the Internet and / or other computer networks via one or more data transmission protocols (e.g., HTTP, FTP, SMTP, etc.).

[0126] Unless the context explicitly requires otherwise, throughout the specification and claims, the terms “comprising,” “including,” etc., shall be interpreted as inclusive, contrary to their meanings of exclusivity or exhaustiveness; that is, in the sense of “including but not limited to.” Use of singular or plural terms shall also include both singular and plural forms, respectively. Additionally, the terms “in this document,” “in the following,” “above,” “below,” and similar terms refer to this application as a whole, and not to any particular part of this application. When the term “or / or” is used in a list referring to two or more items, the term encompasses all of the following interpretations: any item in the list, all items in the list, and any combination of items in the list.

[0127] Although certain currently preferred embodiments have been specifically described herein, it will be apparent to those skilled in the art to which these descriptions pertain that variations and modifications can be made to the various embodiments shown and described herein without departing from the spirit and scope of the embodiments. Therefore, the embodiments are intended to be limited only to the extent required by applicable legal rules.

[0128] This disclosure can be embodied in the form of methods and apparatus for practicing these methods. It can also be embodied in the form of program code embodied in a tangible medium (such as a floppy disk, CD-ROM, hard disk, or any other machine-readable storage medium), wherein when the program code is loaded onto and executed by a machine such as a computer, the machine becomes an apparatus for practicing the embodiments. This disclosure can also be in the form of program code, for example, whether stored in a storage medium, loaded onto a machine and / or executed by a machine, or transmitted via some transmission medium (such as via electrical wiring or cable, via optical fiber, or via electromagnetic radiation), wherein when the program code is loaded onto and executed by a machine such as a computer, the machine becomes an apparatus for practicing the embodiments. When implemented on a processor, program code segments are combined with the processor to provide a unique device similar to the operation of a particular logic circuit.

[0129] Software is stored in a machine-readable medium that can take many forms, including but not limited to tangible storage media, carrier media, or physical transmission media. Non-volatile storage media include, for example, optical discs or disks, any storage device such as any computer(s). Volatile storage media include dynamic memory, such as the main memory of such computer platforms. Tangible transmission media include: coaxial cables; copper wires and optical fibers, including wires included in buses within a computer system. Carrier transmission media can take the form of electrical or electromagnetic signals, or sound or light waves (such as waves generated during radio frequency (RF) and infrared (IR) data communications). Therefore, common forms of computer-readable media include, for example: disks (e.g., hard disks, floppy disks, retractable disks) or any other magnetic media, CD-ROMs, DVDs or DVD-ROMs, any other optical media, any other physical storage media, RAM, PROMs and EPROMs, FLASH-EPROMs, any other memory chips, carriers that transport data or instructions, cables or links that transport such carriers, or any other medium from which a computer can read programming code and / or data. Many of these forms of computer-readable media may involve loading one or more sequences of one or more instructions into a processor for execution.

[0130] For purposes of explanation, the foregoing description has been given with reference to specific embodiments. However, the above illustrative discussion is not intended to be exhaustive or to limit the embodiments to the precise forms disclosed. Many modifications and variations are possible in light of the foregoing teachings. The embodiments were chosen and described in order to best explain the principles of the embodiments and their practical application, thereby enabling others skilled in the art to best utilize the various embodiments with various modifications suitable for the particular intended use.

Claims

1. A gemstone analysis system, comprising: A circular worktable, configured to rotate about a central axis point; and A set of subsystems arranged around the circular worktable, wherein at least a first gemstone is configured to be fed into each subsystem of the set of subsystems by rotation of the circular worktable, the set of subsystems comprising: A batch feeder subsystem is configured to receive the first gemstone; A monolithization subsystem configured to orient the first gemstone toward a first orientation; One or more metric subsystems are configured as follows: Data related to the first gem is generated by each of the one or more measurement subsystems; Using the data generated by each of the one or more metric subsystems, derive one or more metrics for each of the one or more metric subsystems; and Based on the derived metrics of the first gemstone, derive the evaluation metrics of the first gemstone; and A sorting subsystem is configured to guide each of the first gems to a sorting bin based on the derived evaluation metric of the first gem.

2. The gemstone analysis system according to claim 1, wherein the single-grain subsystem comprises: One or more monolithic arms are disposed at the circular worktable, wherein the one or more monolithic arms are configured to: orient the first gemstone to a first orientation including a top-down orientation as the circular worktable rotates, and / or separate the first gemstone from another gemstone by at least a threshold interval.

3. The gemstone analysis system according to claim 1, wherein the set of subsystems further comprises: The photo location detection subsystem includes: One or more cameras are configured to capture images of the first gemstone; and A computer vision model is configured to process the captured image of the first gemstone and determine the actual orientation of the first gemstone.

4. The gemstone analysis system according to claim 3, further comprising: The refeed subsystem includes a first air burst element, and the refeed subsystem is configured to: In response to the computer vision model determining that the actual orientation of the first gemstone is outside the threshold orientation range, an instruction to remove the first gemstone from the worktable is received. and Remove the first gemstone, thereby guiding it to a hopper located outside the circular worktable.

5. The gem analysis system according to claim 1, wherein any one of the set of measurement subsystems comprises: One or more testing systems configured to capture the data associated with the first gem; and A metric generation model is configured to process the data to determine at least one metric of the first gemstone, the at least one metric including a value specifying any one of the following: size, weight, cut type, clarity, origin, natural or synthetic origin, and color of the first gemstone.

6. The gemstone analysis system of claim 5, wherein the one or more testing systems include a UV-Vis spectrophotometer that captures the data including the absorption spectrum of the first gemstone, and wherein the metric generation model is further configured to derive the metric based on the absorption spectrum of the first gemstone.

7. The gemstone analysis system according to claim 1, further comprising: Multiple sorting bins, each corresponding to a series of evaluation metrics, and wherein the sorting subsystem is further configured to: An instruction is obtained to guide the first gemstone to the corresponding sorting bin, wherein the corresponding sorting bin includes a stored series of evaluation metrics, the stored series of evaluation metrics including the derived evaluation metrics of the first gemstone; and The first gemstone is removed by an air burst or a mechanical sweeping arm, thereby guiding the first gemstone into the first sorting bin in the series of sorting bins.

8. The gemstone analysis system according to claim 1, further comprising: At least one computing node is electrically in communication with the set of subsystems, wherein the derivation of at least one or more metrics and the derivation of the evaluation metric of the first gem are performed by the at least one computing node.

9. A system comprising: The worktable is configured to rotate around a central point; and A modularly arranged set of subsystems arranged around the workbench, the set of subsystems including: A roller feeder subsystem configured to receive at least one gemstone; One or more metric subsystems, comprising: One or more sensors, mounted on a removable and replaceable test platform, are configured to capture data related to the gemstone; and At least one compute node is configured as follows: Obtain the data related to the gemstone; Use the obtained data to derive one or more metrics related to the gemstone; and An evaluation metric for each gemstone is generated based on one or more of the aforementioned metrics; and A sorting subsystem is configured to guide each of the one or more gems to a first sorting bin based on the derived evaluation metric for each gem.

10. The system of claim 9, further comprising: A single-stone subsystem comprising one or more single-stone arms disposed at the worktable, wherein the one or more single-stone arms are configured to: orient the gemstone to a top-down orientation as the worktable rotates, and / or separate the gemstone from another gemstone by a threshold interval distance.

11. The system of claim 9, further comprising: A motor provides the rotation of the worktable about a central axis point. The top of the workbench is made of aluminum, stainless steel, glass, or plastic.

12. The system of claim 9, wherein the measurement subsystem comprises at least one of an image sensor, a UV-Vis sensor, a Raman probe, and a laser-induced photoluminescence analyzer.

13. The system of claim 9, wherein the set of subsystems further comprises: The photo location detection subsystem includes: One or more cameras are configured to capture an image of each of the one or more gems; and A computer vision model, configured to process images of each captured gemstone and determine the actual orientation of each gemstone.

14. The system of claim 9, wherein any one of the set of metric subsystems comprises: One or more testing systems configured to capture the data related to the gemstone; and A metric generation model is configured to process the data to determine at least one metric of the gemstone, the at least one metric including a value specifying any one of the gemstone's size, natural origin, or synthetic origin.

15. The system of claim 14, wherein the one or more testing systems include a UV-Vis spectrophotometer that captures the data including the absorption spectrum of the gemstone, and wherein the metric generation model is further configured to derive the metric based on the absorption spectrum of the gemstone.

16. The system of claim 9, further comprising: A series of sorting bins, including the first sorting bin, wherein each sorting bin corresponds to a series of evaluation metrics derived for the gemstone, and wherein the sorting subsystem is further configured to: An instruction is obtained to guide the gemstone to the first sorting bin, wherein the first sorting bin includes a corresponding series of evaluation metrics, the corresponding series of evaluation metrics including the derived evaluation metrics of the gemstone; and A second air burst element is used to provide an air burst to the gemstone, thereby guiding the gemstone into the first sorting bin in the series of sorting bins.

17. A method performed by a gem analysis system for analyzing and sorting gemstones, the method comprising: Receive at least one gem at the batch feeder subsystem; The gemstone is placed on a rotating worktable; The gemstone is oriented to a first orientation by a single-grain subsystem on the rotating worktable; The gemstone is processed by a set of measurement subsystems, wherein the gemstone is rotated through the subsystems by rotation of the worktable, wherein the processing includes: Data related to the gemstone is generated by each of a set of measurement subsystems; For each of the set of measurement subsystems, derive one or more measurements of the gem from the data generated by each of the set of measurement subsystems; and Based on the derived metrics of the gemstone, derive the evaluation metrics of the gemstone; and Based on the derived evaluation metrics of the gemstone, the sorting subsystem guides the gemstone to the first sorting bin.

18. The method of claim 17, wherein the one or more measures include specifying a value for any one of the following: size, weight, cut type, clarity, origin, natural or synthetic origin, and color of the gemstone.

19. The method of claim 17, wherein any one of the measurement subsystems comprises a UV-Vis spectrophotometer that captures the data including the absorption spectrum of the gemstone, and wherein any one of the set of measurement subsystems is further configured to derive the measurement based on the absorption spectrum of the gemstone.

20. The method of claim 17, further comprising: Images of the gemstone are captured by one or more cameras of the photo location detection subsystem; The image is processed by the computer vision model of the photo location detection subsystem to determine the actual orientation of the gemstone; The computer vision model determines whether the actual orientation of the gemstone is outside the threshold orientation range; In response to determining that the actual orientation of the gemstone is outside the threshold orientation range, the computer vision model provides an instruction to the refeed subsystem to remove the gemstone; as well as An air burst is provided to the gemstone by the air burst element of the refeed subsystem, thereby guiding the gemstone to a hopper located outside the worktable.

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