A secondary electron trap for electron beam evaporation
By using permanent magnets and magnetically conductive structures to actively confine secondary electrons in an electron beam evaporation apparatus, combined with a cooling system, the problems of secondary electron diffusion and contamination were solved, thereby improving the film quality and optical performance.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- CHENGDU GUOTAI VACUUM EQUIP CO LTD
- Filing Date
- 2026-05-28
- Publication Date
- 2026-06-30
AI Technical Summary
Existing technologies struggle to effectively control and capture secondary electrons generated during electron beam evaporation, leading to decreased film quality, reduced optical performance, and increased risk of contamination.
The magnetic circuit structure consists of a permanent magnet, a magnetic block, a side magnetic plate, a cooling plate, a fixed bracket, and an anti-fouling protective plate. It uses a magnetic field to confine secondary electrons and guide them to collide with the anti-fouling protective plate to release energy. Combined with the cooling structure, it reduces the thermal impact.
It achieves active capture and energy dissipation of secondary electrons, improves film quality and optical performance, reduces pollution risk, and is suitable for various electron beam evaporation equipment.
Smart Images

Figure CN122303801A_ABST