A diffuse reflectance measuring device and method

Abstract

This invention provides a device and method for measuring diffuse reflectance, comprising a single visible light source, a diffuse reflectance integrating sphere, a first receiver, a second receiver, and a processor. The diffuse reflectance integrating sphere is positioned below the single visible light source. The first and second receivers are positioned vertically on the same side of the single visible light source. A side of the diffuse reflectance integrating sphere is used to place the sample to be tested, which is located on the opposite side of the single visible light source. The first and second receivers are electrically connected to the processor. The single visible light source generates a light signal, one of which is received by the first receiver. Simultaneously, another light signal, under the influence of the diffuse reflectance integrating sphere, causes diffuse reflection from the sample to be tested, and the diffusely reflected light signal is received by the second receiver. The processor calculates the diffuse reflectance of the sample based on the light signals received by the first and second receivers. This method not only provides high measurement stability but also reduces measurement errors and improves measurement efficiency.

Description

Technical Field

[0001] This invention relates to the field of spectral measurement, and more particularly to a device and method for measuring diffuse reflectance. Background Technology

[0002] Diffuse reflectance is a physical quantity that describes the ability of an object's surface to diffusely reflect incident light. It is used to quantify the ratio of reflected light flux to incident light flux when light undergoes diffuse reflection on a rough or non-mirror surface.

[0003] Diffuse reflectance (usually denoted by the symbol Rd) refers to the ratio of the total luminous flux reflected from an object's surface to the total luminous flux incident on that surface during diffuse reflection. The formula is: Rd = Φreflected(diffuse) / Φincident. The range of diffuse reflectance is 0 to 1, i.e., 0 to 100%. Where: Φincident is the total luminous flux incident on the object's surface; Φreflected(diffuse) is the sum of the luminous flux scattered in all directions after diffuse reflection from the object's surface.

[0004] Existing publicly available technologies all employ optical path designs with a single light source and a single receiver, or dual light sources and a single receiver, to achieve diffuse reflection from the sample and thus perform colorimetric measurements. These designs not only yield high error rates but also involve cumbersome calculations, are prone to errors, and result in extremely low efficiency and complex procedures for measuring diffuse reflectance.

[0005] Therefore, there is an urgent need for a diffuse reflectance measuring device and method to improve the above problems. Summary of the Invention

[0006] The purpose of this invention is to provide a diffuse reflectance measuring device and method that can reduce diffuse reflectance measurement errors and improve measurement efficiency.

[0007] In a first aspect, the present invention provides a diffuse reflectance measuring device, comprising a single visible light source, a diffuse reflectance integrating sphere, a first receiver, a second receiver, and a processor; The diffuse reflection integrating sphere is positioned below the single visible light source; The first receiver and the second receiver are arranged vertically and located on the same side of the single visible light source; The side of the diffuse reflection integrating sphere is used to place the sample to be tested, which is located on the opposite side of the single visible light source. The first receiver and the second receiver are electrically connected to the processor, respectively; The single visible light source generates a light signal, one of which is received by the first receiver; simultaneously, another light signal causes the sample to undergo diffuse reflection under the action of the diffuse reflection integrating sphere, and the diffusely reflected light signal is received by the second receiver. The processor calculates the diffuse reflectance of the sample under test based on the optical signals received by the first receiver and the second receiver.

[0008] Optionally, the diffuse reflection integrating sphere has three openings, namely a single visible light source incident slit, a test aperture, and a reflected light reflection slit.

[0009] Optionally, the single visible light source is located outside the diffuse reflection integrating sphere, and the amount of incident light from the single visible light source into the single visible light source entrance slit is the same as the amount of light entering the first receiver.

[0010] Optionally, the diameter of the diffuse reflection integrating sphere can be configured, but the total area of ​​the opening portion shall not exceed 10% of the total area of ​​the diffuse reflection integrating sphere reflected by the inner wall of the sphere.

[0011] Optionally, a first optical signal amplification lens may also be included; The first optical signal amplifying lens is disposed between the first receiver and the single visible light source to amplify the optical signal. And / or may also include a second optical signal amplification lens; The second optical signal magnifying lens is disposed between the second receiver and the diffuse reflection integrating sphere to amplify the optical signal after diffuse reflection of the other optical signal.

[0012] Optionally, the inner wall of the diffuse reflection integrating sphere is provided with a diffuse reflectance brightening coating.

[0013] Optionally, the diffuse reflectance brightening coating is a barium sulfate coating layer.

[0014] Optionally, the angle between the normal of the sample under test and the axis of the diffusely reflected light signal does not exceed 10°; and / or the first receiver and the second receiver are the same dual-receiver optical signal detector.

[0015] The beneficial effects of the device of the present invention are as follows: it includes a single visible light source, a diffuse reflection integrating sphere, a first receiver, a second receiver, and a processor; the diffuse reflection integrating sphere is disposed below the single visible light source; the first receiver and the second receiver are disposed vertically and located on the same side of the single visible light source; the side of the diffuse reflection integrating sphere is used to place the sample to be tested, and the sample to be tested is located on the opposite side of the single visible light source; the first receiver and the second receiver are electrically connected to the processor respectively; the single visible light source generates a light signal, one of which is received by the first receiver; simultaneously, another light signal, under the action of the diffuse reflection integrating sphere, causes the sample to be tested to undergo diffuse reflection, and the diffusely reflected light signal is received by the second receiver; the processor calculates the diffuse reflectance of the sample to be tested based on the light signals received by the first receiver and the second receiver. The dual-optical-path design monitors the energy fluctuations of the light source while monitoring the diffuse reflection signal of the sample to be tested, thereby reducing interference during measurement, achieving higher measurement stability, ensuring high standards of instrument performance in terms of measurement speed, accuracy, stability, and inter-stage consistency, and simultaneously improving measurement efficiency through faster testing.

[0016] Secondly, the present invention provides a method for measuring diffuse reflectance, based on any possible combination of the apparatus described in the first aspect, comprising the steps of: Define the wavelength range and wavelength interval of the visible light generated by the single visible light source; Under the same wavelength of visible light signal, one optical signal from the single visible light source is received by the first receiver; at the same time, the other optical signal causes the sample to undergo diffuse reflection under the action of the diffuse reflection integrating sphere, and the diffusely reflected optical signal is received by the second receiver. The diffuse reflectance of the sample under test at different wavelengths is calculated based on the light signals received by the first receiver and the second receiver. The average value of all diffuse reflectances is calculated and the average value is used as the actual diffuse reflectance of the sample under test. Wherein, the wavelength range is 400nm to 700nm; and / or the wavelength interval is 10mm.

[0017] The beneficial effects of the method of the present invention are as follows: by measuring the diffuse reflectance of the same sample under visible light at different wavelengths, and taking the average value after multiple measurements, the diffuse reflectance of the sample can be obtained. This not only solves the problem of low efficiency of spectrophotometer measurement method, but also makes the measurement work efficient and convenient, the data reading convenient and intuitive, the algorithm simple, and the accuracy and reliability high.

[0018] Thirdly, the present invention provides an electronic device including a memory and a processor, wherein the memory stores a program executable on the processor, and when the program is executed by the processor, the electronic device performs the method described in the second aspect.

[0019] For details regarding the beneficial effects of the third aspect mentioned above, please refer to the description of the second aspect mentioned above. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of a diffuse reflectance measuring device provided in an embodiment of the present invention; Figure 2 A schematic flowchart of a method for measuring diffuse reflectance provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention.

[0021] Explanation of reference numerals in the attached figures: 1. Single visible light source; 2. Diffuse reflection integrating sphere; 3. Sample to be tested; 4. First optical signal magnifying lens; 5. Second optical signal magnifying lens; 6. First receiver; 7. Second receiver. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions in the embodiments of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without inventive effort are within the scope of protection of this invention. Unless otherwise defined, the technical or scientific terms used herein should have the ordinary meaning understood by those skilled in the art. The terms "comprising" and similar expressions used herein mean that the element or object preceding the word covers the element or object listed following the word and its equivalents, but do not exclude other elements or objects.

[0023] The technical solutions of the embodiments of the present invention will be described below with reference to the accompanying drawings. In the description of the embodiments of the present invention, the terminology used in the following embodiments is for the purpose of describing specific embodiments only and is not intended to limit the present invention. The singular expressions “a,” “the,” “the,” “the,” and “this” are intended to also include expressions such as “one or more,” unless the context clearly indicates otherwise. It should also be understood that in the following embodiments of the present invention, “at least one” and “one or more” refer to one or more (including two). The term “and / or” is used to describe the relationship between related objects, indicating that three relationships can exist; for example, A and / or B can represent: A alone, A and B simultaneously, or B alone, where A and B can be singular or plural. The character “ / ” generally indicates that the preceding and following related objects are in an “or” relationship.

[0024] References to "one embodiment" or "some embodiments" in this specification mean that a particular feature, structure, or characteristic described in connection with that embodiment is included in one or more embodiments of the invention. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," and "in still other embodiments" appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. The terms "comprising," "including," "having," and variations thereof mean "including, but not limited to," unless otherwise specifically emphasized. The term "connection" includes both direct and indirect connections, unless otherwise stated. "First" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated.

[0025] In embodiments of the present invention, "exemplarily" or "for example" are used to indicate that they are examples, illustrations, or descriptions. Any embodiment or design described as "exemplarily" or "for example" in embodiments of the present invention should not be construed as being more preferred or advantageous than other embodiments or design solutions. Rather, the use of "exemplarily" or "for example" is intended to present the relevant concepts in a specific manner.

[0026] like Figure 1 As shown, the present invention provides a diffuse reflectance measuring device, which includes a single visible light source 1, a diffuse reflectance integrating sphere 2, a first receiver 6, a second receiver 7, and a processor; the diffuse reflectance integrating sphere 2 is disposed below the single visible light source 1 (e.g., ...). Figure 1 Directly below the light source 1, and with a certain distance between them; the first receiver 6 and the second receiver 7 are arranged vertically, and are located on the same side of the single visible light source 1 (e.g., directly below the light source 1, and at a certain distance from each other); Figure 1 (Left side of the diffuse reflection integrating sphere 2); the side of the diffuse reflection integrating sphere 2 is used to place the sample to be tested 3, and the sample to be tested 3 is located on the opposite side of the single visible light source 1 (e.g., the left side of the sphere 2). Figure 1 (Right side of the image); the first receiver 6 and the second receiver 7 are electrically connected to the processor respectively; the single visible light source 1 generates a light signal, one of which is received by the first receiver 6; simultaneously, the other light signal, under the action of the diffuse reflection integrating sphere 2, causes the sample 3 to undergo diffuse reflection, and the diffusely reflected light signal is received by the second receiver 7; the processor calculates the diffuse reflectance of the sample 3 based on the light signals received by the first receiver 6 and the second receiver 7, adopting a dual-optical-path design to monitor the energy fluctuation of the light source while monitoring the diffuse reflection signal of the sample 3, thereby reducing interference during measurement, obtaining higher measurement stability, ensuring high standards of instrument measurement speed, accuracy, stability, and inter-stage difference consistency, and simultaneously improving measurement efficiency. It is worth noting that the light signal received by the first receiver 6 is the incident light signal, and the light signal received by the second receiver 7 is the diffusely reflected light signal.

[0027] In some embodiments, the diffuse reflection integrating sphere 2 has three openings, namely a single visible light source incident slit, a test aperture, and a reflected light reflection slit.

[0028] In some specific embodiments, in order to improve the accuracy of the measurement of diffuse reflectance, the single visible light source 1 is located outside the diffuse reflectance integrating sphere 2, and the amount of incident light from the single visible light source 1 into the single visible light source entrance slit is the same as the amount of light entering the first receiver 6, that is, the amount of incident light received by the first receiver 6 is the same as the amount of incident light passing through the diffuse reflectance integrating sphere 2 entrance slit.

[0029] In other specific embodiments, in order to improve the stability and accuracy of the measurement, the diameter of the diffuse reflection integrating sphere 2 can be configured, that is, the diameter of the diffuse reflection integrating sphere 2 can be any size, but the total area of ​​the opening portion does not exceed 10% of the total area of ​​the diffuse reflection integrating sphere 2 reflected by the inner wall of the sphere.

[0030] In some embodiments, in order to improve the intensity of the optical signal at the receiving end, extend the transmission distance, optimize the alignment accuracy, and suppress interference without energy consumption or distortion, the device further includes a first optical signal amplifying lens 4; the first optical signal amplifying lens 4 is disposed between the first receiver 6 and the single visible light source 1, and is used to amplify the optical signal.

[0031] In other embodiments, in order to improve the intensity of the optical signal at the receiving end, extend the transmission distance, optimize the alignment accuracy, and suppress interference without energy consumption or distortion, the device further includes a second optical signal magnifying lens 5; the second optical signal magnifying lens 5 is disposed between the second receiver 7 and the diffuse reflection integrating sphere 2, and is used to amplify the optical signal after diffuse reflection of the other optical signal.

[0032] In some embodiments, the inner wall of the diffuse reflection integrating sphere 2 is provided with a diffuse reflectance brightening coating, which can maximize light utilization, achieve a uniform light field, ensure signal purity and long-term stability, and directly solve the core pain points of insufficient light energy, uneven light field, signal distortion and short lifespan of the diffuse reflection integrating sphere 2, so that the diffuse reflection integrating sphere 2 can achieve high-precision measurement and efficient optical signal transmission.

[0033] In some specific embodiments, the diffuse reflectance brightening coating is a barium sulfate coating layer, which is close to the top-level PTFE coating in terms of optical performance (high reflectance, uniform distribution, and wide spectrum). At the same time, it has outstanding advantages such as low cost, flexible construction, strong stability, and environmental protection and non-toxicity, making it perfectly suited for mid-to-high-end precision requirements.

[0034] In some embodiments, the angle between the normal of the sample 3 to be tested and the axis of the diffusely reflected light signal does not exceed 10°. By limiting the propagation angle of the diffusely reflected light to within ±10° of the range where energy is most concentrated, interference is minimal, and system adaptation is optimal, the collection efficiency and purity of the light signal are improved, while ensuring the accuracy, repeatability, and authenticity of the measurement. This perfectly matches the core requirements of the diffuse reflection integrating sphere 2 in scenarios such as material detection, low-light sensing, and industrial screening, and represents the optimal angle design that balances signal strength, detection accuracy, and practical fault tolerance.

[0035] In other embodiments, the first receiver 6 and the second receiver 7 are the same dual-receive optical signal detector. By integrating the two receivers into a dual-receive detector, the parameter deviation and synchronization error of independent devices are eliminated, the measurement accuracy and stability are improved, the system structure, optical path debugging and signal processing are simplified, and the cost, power consumption and failure rate are reduced.

[0036] The advantages of this invention's embodiments lie in the improved repeatability achieved through a dual-optical-path design. By monitoring the diffuse reflection signal of the sample 3 under test while simultaneously monitoring the energy fluctuations of the light source, interference is reduced during measurement, resulting in higher measurement stability. This ensures high standards of instrument performance in terms of measurement speed, accuracy, stability, and inter-stage consistency. Furthermore, faster testing speeds improve measurement efficiency. Achieving a spectroscopic capability better than 10nm significantly enhances the product's technical performance, while also providing faster testing speeds and improved measurement efficiency.

[0037] To facilitate understanding, this embodiment further elaborates on the specific implementation process of the above-mentioned device in conjunction with a specific application scenario. Taking paint as the sample to be tested 3, the first receiver 6 is used to receive the incident light signal, and the second receiver 7 is used to receive the diffuse reflected light signal. The first receiver 6 and the second receiver 7 are the same dual-receiver light signal detector. The first optical signal magnifying lens 4 is used to amplify the incident light signal, and the second optical signal magnifying lens 5 is used to amplify the reflected light signal. Specifically, it includes: The instrument comprises a single visible light source 1, a diffuse reflection integrating sphere 2, optical signal magnifying lenses (first optical signal magnifying lens 4 and second optical signal magnifying lens 5), dual receiving optical signal detectors (first receiver 6 and second receiver 7), and a processor. During the measurement of the diffuse reflectance of the sample 3, the first receiver 6 receives the incident light from the single visible light source 1, amplified by the incident light optical signal magnifying lens. Simultaneously, the second receiver 7 receives the diffuse reflection from the sample 3, amplified by the reflected light optical signal magnifying lens. The processor calculates the diffuse reflectance of the sample 3 based on the optical signals received by the first and second receivers 7. This dual-optical-path design monitors both the diffuse reflection signal of the sample 3 and the energy fluctuations of the light source, thereby reducing interference during measurement, achieving higher measurement stability, and ensuring high standards of instrument performance in terms of measurement speed, accuracy, stability, and inter-stage consistency. Furthermore, it allows for faster testing and improved measurement efficiency.

[0038] The diffuse reflection integrating sphere 2 has three openings: a single visible light source entrance slit, a test aperture, and a reflected light reflection slit.

[0039] The single visible light source 1 is designed outside the diffuse reflection integrating sphere 2, and the amount of incident light received by the first receiver 6 is the same as the amount of incident light passing through the incident slit of the diffuse reflection integrating sphere 2.

[0040] The diameter of the diffuse reflection integrating sphere 2 is arbitrary, and the total area of ​​the opening portion of the diffuse reflection integrating sphere 2 is 8% of the total area of ​​the sphere reflected by the inner wall of the diffuse reflection integrating sphere 2.

[0041] A diffuse reflectance brightening coating is provided on the inner wall of the diffuse reflectance integrating sphere 2, and the diffuse reflectance brightening coating is a barium sulfate coating layer.

[0042] Under the action of the diffuse reflection integrating sphere 2, light produces diffuse illumination, and the sample 3 to be tested is diffusely illuminated by the diffuse reflection integrating sphere 2.

[0043] The angle between the normal of the sample 3 under test and the axis of the observation beam (i.e., the straight line between the location of the reflected light signal receiving detector and the perpendicular point of the normal of the sample 3 under test) is 8°.

[0044] Based on the above diffuse reflectance measuring device, such as Figure 2As shown, the present invention also provides a method for measuring diffuse reflectance, comprising the following steps: S201, the wavelength range of the visible light generated by the single visible light source 1 is set to 400nm to 700nm and the wavelength interval is 10mm.

[0045] S202, under the same wavelength visible light signal, one optical signal of the single visible light source 1 is received by the first receiver 6; at the same time, the other optical signal causes the sample 3 to undergo diffuse reflection under the action of the diffuse reflection integrating sphere 2, and the diffusely reflected optical signal is received by the second receiver 7.

[0046] S203, calculate the diffuse reflectance of the sample under test 3 at different wavelengths based on the light signals received by the first receiver 6 and the second receiver 7, calculate the average value of all diffuse reflectances, and use the average value as the actual diffuse reflectance of the sample under test 3.

[0047] The advantages of the embodiments of the present invention are that they are simple to calculate, require little computation, are fast to calculate, and are intuitive and accurate.

[0048] For example: 1. To meet the requirements of visual observation, a single visible light source 1 with a wavelength range of 400nm to 700nm was selected as the measurement light source; 2. Simultaneously read the incident light quantity signal data of the first receiver 6 and the diffuse reflectance signal data of the second receiver 7 under the condition of a single visible light source 1 with the same wavelength, and thus obtain the diffuse reflectance. 3. After multiple measurements, the diffuse reflectance of the sample was measured at different wavelengths within the visible light wavelength range of 400nm to 700nm at 10nm intervals. 4. Using formula R d =(R 400 +R 410 +……+R 700 ) / 31 to calculate the average diffuse reflectance, and then calculate the diffuse reflectance value of the sample 3 to be tested.

[0049] The advantages of this invention are that by using the measuring device to measure the diffuse reflectance of the same sample 3 under visible light at different wavelengths, and taking the average value after multiple measurements, the diffuse reflectance of the sample 3 can be obtained. This not only solves the problem of low efficiency of spectrophotometer measurement method, but also makes the measurement work efficient and convenient, the data reading convenient and intuitive, the algorithm simple, and the accuracy and reliability high.

[0050] In other embodiments of the present invention, an electronic device 300 is disclosed, such as... Figure 3As shown, the device may include: one or more processors 301; memory 302; display 303; one or more application programs (not shown); and one or more computer programs 304. These devices can be connected via one or more communication buses 305. The one or more computer programs 304 are stored in the memory 302 and configured to be executed by the one or more processors 301. The one or more computer programs 304 include instructions that can be used to perform actions such as... Figure 2 Each step in the corresponding embodiment.

[0051] Processor 301 can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor can be a microprocessor or any conventional processor.

[0052] The memory 302 can be an internal storage unit of the electronic device 300, such as a hard disk or RAM of the electronic device 300. The memory 302 can also be an external storage device of the electronic device 300, such as a plug-in hard disk, Smart Media Card (SMC), Secure Digital (SD) card, or FlashCard equipped on the electronic device 300. Furthermore, the memory 302 can include both internal and external storage units of the electronic device 300. The memory 302 is used to store computer programs and other programs and data required by the electronic device. The memory 302 can also be used to temporarily store data that has been output or will be output.

[0053] The computer program 304 can be divided into one or more modules / units. The one or more modules / units can be a series of computer program instruction segments that can perform a specific function. The instruction segments are used to describe the execution process of the computer program 304 in the electronic device 300.

[0054] In addition to the above-described structure, those skilled in the art will understand that Figure 3This is merely an example of electronic device 300 and does not constitute a limitation on electronic device 300. Electronic device 300 may include more or fewer components than shown, or combine certain components, or different components. For example, electronic device may also include input / output devices, network access devices, buses, etc.

[0055] Those skilled in the art will understand that, for the sake of convenience and brevity, the above-described division of functional units and modules is merely an example. In practical applications, the functions described above can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units and modules are only for easy differentiation and are not intended to limit the scope of protection of this invention. The specific working process of the units and modules in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0056] Those skilled in the art will understand that all or part of the steps in the methods of the above embodiments can be implemented by a program instructing a processor. The program can be stored in a computer-readable storage medium, which is a non-transitory medium, such as random access memory, read-only memory, flash memory, hard disk, solid-state drive, magnetic tape, floppy disk, optical disk, and any combination thereof. The storage medium can be any available medium accessible to a computer or a data storage device such as a server or data center that integrates one or more available media. This available medium can be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., digital video disc (DVD)), or a semiconductor medium (e.g., solid-state drive (SSD)).

[0057] The descriptions of the processes or structures corresponding to the above figures each have their own emphasis. For parts of a process or structure that are not described in detail, please refer to the relevant descriptions of other processes or structures.

[0058] In summary, the diffuse reflectance measuring device and method disclosed in this invention comprises a single visible light source 1, a diffuse reflectance integrating sphere 2, a first receiver 6, a second receiver 7, and a processor. The diffuse reflectance integrating sphere 2 is positioned below the single visible light source 1. The first receiver 6 and the second receiver 7 are positioned vertically on the same side of the single visible light source 1. The side of the diffuse reflectance integrating sphere 2 is used to place the sample to be tested 3, which is located on the opposite side of the single visible light source 1. The first receiver 6 and the second receiver 7 are electrically connected to the processor. The single visible light source 1 generates a light signal, one of which is received by the first receiver 6. Simultaneously, another light signal, under the action of the diffuse reflectance integrating sphere 2, causes the sample to be tested 3 to undergo diffuse reflection, and the diffusely reflected light signal is received by the second receiver 7. The processor calculates the diffuse reflectance of the sample to be tested 3 based on the light signals received by the first receiver 6 and the second receiver 7. A dual-optical-path design is adopted, which monitors the energy fluctuation of the light source while simultaneously monitoring the diffuse reflectance signal of the sample 3 under test. This reduces interference during measurement, achieves higher measurement stability, and ensures high standards for the instrument's measurement speed, accuracy, stability, and inter-stage consistency. Furthermore, the testing speed is faster, improving measurement efficiency. To improve the accuracy of diffuse reflectance measurement, the single visible light source 1 is located outside the diffuse reflectance integrating sphere 2, and the amount of incident light from the single visible light source 1 entering the single visible light source entrance slit is the same as the amount of light entering the first receiver 6. That is, the amount of incident light received by the first receiver 6 and the amount of light entering through the diffuse reflectance integrating sphere 2 are the same. The incident light amount at the slit is consistent. To improve the light signal strength at the receiving end, extend the transmission distance, optimize alignment accuracy, and suppress interference without energy consumption or distortion, a first optical signal amplification lens 4 and a second optical signal amplification lens 5 are set up. By limiting the propagation angle of diffuse reflection light within ±10° of the range with the most concentrated energy, the least interference, and the best system adaptation, the collection efficiency and purity of the light signal are improved, while ensuring the accuracy, repeatability, and authenticity of the measurement. This perfectly matches the core needs of diffuse reflection integrating sphere 2 in material detection, low-light sensing, and industrial screening scenarios, and is the optimal angle design that balances signal strength, detection accuracy, and practical fault tolerance. By measuring the diffuse reflectance of the same sample 3 under different wavelengths of visible light, and taking the average value after multiple measurements, the diffuse reflectance of sample 3 is obtained. This not only solves the problem of low efficiency in spectrophotometer measurement methods, but also makes the measurement work efficient and convenient, the data reading convenient and intuitive, the algorithm simple, and the accuracy and reliability high.

[0059] Although the embodiments of the present invention have been described in detail above, it will be apparent to those skilled in the art that various modifications and variations can be made to these embodiments. The above descriptions are merely embodiments of the present invention and do not limit the patent scope of the present invention. However, it should be understood that such modifications and variations fall within the scope and spirit of the present invention. Moreover, the present invention described herein may have other embodiments and can be implemented or realized in various ways. All equivalent transformations made based on the description and drawings of the present invention, or direct or indirect applications in related technical fields, are similarly included within the patent protection scope of the present invention.

Claims

1. A diffuse reflectance measuring device, characterized in that, It includes a single visible light source, a diffuse reflection integrating sphere, a first receiver, a second receiver, and a processor; The diffuse reflection integrating sphere is positioned below the single visible light source; The first receiver and the second receiver are arranged vertically and located on the same side of the single visible light source; The side of the diffuse reflection integrating sphere is used to place the sample to be tested, which is located on the opposite side of the single visible light source. The first receiver and the second receiver are electrically connected to the processor, respectively; The single visible light source generates a light signal, one of which is received by the first receiver; simultaneously, another light signal causes the sample to undergo diffuse reflection under the action of the diffuse reflection integrating sphere, and the diffusely reflected light signal is received by the second receiver. The processor calculates the diffuse reflectance of the sample under test based on the optical signals received by the first receiver and the second receiver.

2. The diffuse reflectance measuring device according to claim 1, characterized in that, The diffuse reflection integrating sphere has three openings: a single visible light source incident slit, a test aperture, and a reflected light reflection slit.

3. The diffuse reflectance measuring device according to claim 2, characterized in that, The single visible light source is located outside the diffuse reflection integrating sphere, and the amount of incident light from the single visible light source into the single visible light source entrance slit is the same as the amount of light entering the first receiver.

4. The diffuse reflectance measuring device according to claim 2, characterized in that, The diameter of the diffuse reflection integrating sphere can be configured, but the total area of ​​the opening portion shall not exceed 10% of the total area of ​​the diffuse reflection integrating sphere reflected by the inner wall of the sphere.

5. The diffuse reflectance measuring device according to claim 1, characterized in that, It also includes a first optical signal amplification lens; The first optical signal amplifying lens is disposed between the first receiver and the single visible light source to amplify the optical signal. And / or may also include a second optical signal amplification lens; The second optical signal magnifying lens is disposed between the second receiver and the diffuse reflection integrating sphere to amplify the optical signal after diffuse reflection of the other optical signal.

6. The diffuse reflectance measuring device according to claim 1, characterized in that, The inner wall of the diffuse reflection integrating sphere is provided with a diffuse reflectance brightening coating.

7. The diffuse reflectance measuring device according to claim 6, characterized in that, The diffuse reflectance brightening coating is a barium sulfate coating layer.

8. The diffuse reflectance measuring device according to claim 1, characterized in that, The angle between the normal of the sample under test and the axis of the diffusely reflected light signal does not exceed 10°; and / or the first receiver and the second receiver are the same dual-receiver optical signal detector.

9. A method for measuring diffuse reflectance, based on the diffuse reflectance measuring apparatus as described in any one of claims 1-8, characterized in that, Including the following steps: The wavelength range and wavelength interval of the visible light generated by the single visible light source are set, wherein the wavelength range is 400nm to 700nm and the wavelength interval is 10mm; Under the same wavelength of visible light signal, one optical signal from the single visible light source is received by the first receiver; at the same time, the other optical signal causes the sample to undergo diffuse reflection under the action of the diffuse reflection integrating sphere, and the diffusely reflected optical signal is received by the second receiver. The diffuse reflectance of the sample under test at different wavelengths is calculated based on the light signals received by the first receiver and the second receiver. The average value of all diffuse reflectances is calculated and the average value is taken as the actual diffuse reflectance of the sample under test.

10. An electronic device, characterized in that, The device includes a memory and a processor, wherein the memory stores a program that can run on the processor, and when the program is executed by the processor, causes the electronic device to perform the method of claim 9.

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