Test system and test method

Abstract

This application discloses a testing system and a testing method. The testing system includes: an excitation light source configured to output excitation light for exciting an object under test to emit light; an integrating sphere configured to collect the light emitted by the object under test when excited; a sample holder configured to place the object under test between the excitation light source and the integrating sphere; and a processing device configured to determine the material parameters of the object under test based on the light collected by the integrating sphere. In this testing system, the object under test is placed outside the integrating sphere during performance testing, which facilitates equipment maintenance.

Description

Technical Field

[0001] This application relates to the field of testing technology, and in particular to a testing system and testing method for a material. Background Technology

[0002] The performance indicators of quantum dot films are important parameters for evaluating the fluorescence performance of quantum dot materials and the thin film processing scheme. Existing testing systems for the performance indicators of quantum dot films place the quantum dot films inside an integrating sphere for testing, which is not conducive to equipment maintenance. Summary of the Invention

[0003] In view of this, this application provides a testing system and a testing method.

[0004] This application provides a testing system, including:

[0005] An excitation source is configured to output excitation light, which is used to excite the analyte to emit light.

[0006] An integrating sphere configured to collect light emitted when the object to be detected is excited;

[0007] A sample holder, configured to hold the analyte between the excitation source and the integrating sphere; and

[0008] A processing device configured to determine the material parameters of the object to be tested based on the light collected by the integrating sphere.

[0009] Accordingly, this application also provides a testing method, including the following steps:

[0010] The analyte is placed on the sample holder between the integrating sphere and the excitation light source;

[0011] The excitation light source emits excitation light to excite the object to be detected to emit light;

[0012] At least a portion of the light emitted by the object to be detected is collected through the integrating sphere;

[0013] The processing device detects the collected light and confirms the material parameters of the object to be tested based on the detection results.

[0014] When the test system performs performance testing on the object under test, the object under test is placed outside the integrating sphere rather than inside the integrating sphere. This allows the use of an integrating sphere with a smaller volume and facilitates equipment maintenance, thereby effectively reducing testing costs. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 This is a schematic diagram of the structure of a testing system provided in an embodiment of this application;

[0017] Figure 2 This is a flowchart of a testing method provided in an embodiment of this application.

[0018] Figure label:

[0019] Test system 100; excitation light source 10; light emitting surface 101; excitation light emitting area 1011; integrating sphere 20; light inlet aperture 21; light collecting aperture 22; processing device 30; detection device 31; computing device 32; sample holder 40; optical fiber 50; object to be tested 1. Detailed Implementation

[0020] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application. Furthermore, it should be understood that the specific embodiments described herein are only for illustration and explanation of this application and are not intended to limit this application.

[0021] In this application, unless otherwise stated, directional terms such as "upper" and "lower" generally refer to the upper and lower positions of the device in its actual use or operating state, specifically the drawing directions in the accompanying drawings; while "inner" and "outer" refer to the outline of the device. Furthermore, in the description of this application, the term "comprising" means "including but not limited to". The terms first, second, third, etc., are used merely as illustrative purposes and do not impose numerical requirements or establish a numerical order.

[0022] Various embodiments of this application may exist in the form of a range; it should be understood that the description in the form of a range is merely for convenience and brevity and should not be construed as a hard limitation on the scope of this application; therefore, it should be considered that the range description has specifically disclosed all possible sub-ranges and single numerical values ​​within that range. For example, it should be considered that the range description from 1 to 6 has specifically disclosed sub-ranges such as from 1 to 3, from 1 to 4, from 1 to 5, from 2 to 4, from 2 to 6, from 3 to 6, etc., and single numbers within the range, such as 1, 2, 3, 4, 5, and 6, regardless of the range. Furthermore, whenever a numerical range is referred to herein, it means including any referenced number (fraction or integer) within the referred range.

[0023] With the continuous evolution of display forms, new solutions based on quantum dot light conversion technology have emerged, including Mini LED and Micro LED. The performance indicators of quantum dot films are important parameters for evaluating the fluorescence performance of quantum dot materials and thin-film processing schemes. Currently, the parameters and calculation methods for characterizing the performance of quantum dot films are relatively complex. For example, the method of directly reading the data using a luminance meter is simple and convenient, but it can only collect photons in the vertical direction. Photons in non-vertical directions cannot be collected by the luminance meter, resulting in a relatively large deviation in the test data. The method of placing the backlight system and quantum dot film in an integrating sphere for performance testing can collect all photons in all directions, but it requires a large integrating sphere, and the maintenance of the testing equipment is relatively troublesome, making it difficult for general laboratories to meet the testing conditions.

[0024] The technical solution of this application is as follows:

[0025] In a first aspect, embodiments of this application provide a testing system 100, which is mainly used to test the performance of the object to be tested 1. The testing system 100 includes an excitation light source 10, an integrating sphere 20, a processing device 30, and a sample holder 40.

[0026] The excitation light source 10 is configured to output excitation light for stimulating the object to be detected 1 to emit light.

[0027] The integrating sphere 20 is configured to collect light emitted from the object to be detected 1 when it is excited.

[0028] The processing device 30 is configured to determine the material parameters of the object to be tested based on the light collected by the integrating sphere.

[0029] The sample holder 40 is configured to place the analyte 1 between the excitation light source 10 and the integrating sphere 20.

[0030] In some embodiments, the object to be detected 1 may be a quantum dot film.

[0031] In some embodiments, the excitation light emitted by the excitation light source 10 can be blue light or ultraviolet light, wherein blue light is used to excite the red and green quantum dot films to emit light, and ultraviolet light is used to excite the blue quantum dot film to emit light. The wavelength of the blue light is 440–470 nm, for example, 440 nm, 447 nm, 448 nm, 449 nm, 450 nm, 460 nm, 461 nm, 462 nm, 463 nm, 464 nm, 465 nm, 466 nm, 467 nm, 468 nm, 469 nm, 470 nm, and any range between any two of these values. In some embodiments, the wavelength of the blue light can be 447–450 nm or 460–470 nm. The wavelength of the ultraviolet light can be 100-400nm, for example, 100nm, 150nm, 200nm, 250nm, 300nm, 350nm, 365nm, 400nm, and any range between any two of the above values.

[0032] In some embodiments, the excitation light source 10 is a surface light source, which has high light emission uniformity, thus facilitating accurate and effective detection of the performance of the object to be tested 1. In some embodiments, the brightness of the light source 10 is adjustable, which is beneficial for the performance detection of the object to be tested 1.

[0033] The integrating sphere 20 is a hollow sphere. In some embodiments, the inner wall of the integrating sphere 20 is provided with a white diffuse reflective material. This is beneficial for light reflection and allows light to be scattered more evenly within the sphere.

[0034] The integrating sphere 20 has a light inlet 21, and the excitation light source 10 is disposed opposite to the light inlet 21. The sample holder 40 is configured to hold the test object 1 and to position the test object 1 between the excitation light source 10 and the light inlet 21. When testing the performance of the test object 1, the test object 1 is placed on the sample holder 40 and positioned between the excitation light source 10 and the light inlet 21. In this way, the excitation light emitted by the excitation light source 10 can irradiate the test object 1, causing the test object 1 to emit photons, and the emitted photons can enter the integrating sphere 20 through the light inlet 21.

[0035] The surface light source has a light-emitting surface 101, which is disposed opposite to the light-entry aperture 21. The light-emitting surface 101 has an excitation light emitting region 1011, which is disposed opposite to the light-entry aperture 21. The sample holder 40 is configured to hold the object to be tested 1 and to position the object to be tested 1 between the excitation light emitting region 1011 and the light-entry aperture 21.

[0036] The object to be tested 1 is arranged parallel to the excitation light emitting region 1011. The area of ​​the object to be tested 1 is greater than or equal to that of the excitation light emitting region 1011, and the orthographic projection of the excitation light emitting region 1011 onto the plane containing the object to be tested 1 falls entirely on the object to be tested 1. Furthermore, the orthographic projection of the excitation light emitting region 1011 onto the object to be tested 1 also falls entirely within the orthographic projection of the light entrance aperture 21 onto the object to be tested 1. This arrangement maximizes the amount of light excited by the object to be tested 1 that enters the integrating sphere 20, thus minimizing performance measurement errors of the object to be tested 1.

[0037] In some embodiments, the area of ​​the excitation light emitting region 1011 is less than or equal to the opening area of ​​the light inlet aperture 21. This allows the integrating sphere 20 to collect as much or all of the light emitted by the object under test 1 as possible, reducing or even avoiding measurement errors caused by light leakage.

[0038] In some embodiments, the excitation light emitting region 1011 occupies the entire light-emitting surface 101. In other embodiments, the area of ​​the light-emitting surface 101 is larger than the area of ​​the excitation light emitting region 1011, in which case the light emitted by the excitation light emitting region 1011 can be blocked so that only the light emitted by the excitation light emitting region 1011 can illuminate the object to be detected 1.

[0039] The design of the aperture size of the light inlet 21 and its relative size with the excitation light emission region 1011 described in this application is beneficial to the uniform scattering of light entering the integrating sphere 200 within the sphere, and to minimizing the performance measurement error of the object under test 1.

[0040] In at least some embodiments, the excitation light emitting region 1011 is circular. In some embodiments, the light-entry aperture 21 can be a circular aperture, a square aperture, an irregular aperture, etc. In at least one embodiment, the light-entry aperture 21 is a circular aperture.

[0041] In some embodiments, the aperture of the light inlet 21 is greater than or equal to 0.5 cm and less than or equal to 3 cm. For example, it can be 0.5 cm, 1 cm, 1.5 cm, 2 cm, 2.5 cm, 3 cm, or any range between two of these values. This facilitates accurate and effective detection of the performance of the object to be tested 1.

[0042] In some embodiments, when performing performance testing on the test object 1, the test object 1 is placed on the sample holder 40 and sandwiched between the excitation light source 10 and the integrating sphere 20, with the excitation light emission region 1011 of the excitation light source 10 facing the light entrance aperture 21. This allows as much of the light excited by the test object 1 as possible to enter the integrating sphere 20, thus minimizing performance measurement errors of the test object 1.

[0043] In some embodiments, the processing apparatus 30 includes a detection device 31 and a computing device 32. The detection device 31 is configured to receive light output from the integrating sphere 20 and acquire information and / or parameters of the light based on the received light. The computing device 32 is configured to acquire the information and / or parameters of the light and determine the material parameters of the object to be detected 1 based on the information and / or parameters of the light.

[0044] In some embodiments, the integrating sphere 20 is provided with a light collecting hole 22, and the testing system 100 further includes an optical fiber 50, one end of which is disposed in the light collecting hole 22, and the other end of which is connected to the detection device 31. Thus, the optical fiber 50 can transmit the light entering the light collecting hole 22 in the integrating sphere 20 to the detection device 31.

[0045] In some embodiments, the integrating sphere 20 has a cube structure, and further, the side length of the cube structure is 40 to 100 cm, for example, 40 cm, 50 cm, 60 cm, 70 cm, 80 cm, 90 cm, 100 cm, and the range between any two of the above values.

[0046] In some embodiments, the light inlet 21 and the light collecting hole 22 are respectively disposed on two adjacent faces of the cube structure. Furthermore, the light inlet 21 and the light collecting hole 22 are respectively disposed at the center of two adjacent faces of the cube structure. This facilitates the uniform scattering of light entering the integrating sphere 20 within the sphere, thus minimizing the performance measurement error of the object under test 1.

[0047] In some embodiments, the detection device 31 can be a spectrometer, which can separate and analyze the received light signal to obtain spectral information and related parameters, such as the emission peak position, half-peak width, and number of photons of the light emitted by the object to be detected 1.

[0048] The computing device 32 can be a machine composed of a computer or other programmable data processing device. The computing device 32 can calculate the material parameters of the object to be detected 1, such as brightness (L), external quantum efficiency (EQE), power efficiency (LCE), and blue light absorption rate, based on the information and / or parameters obtained from the detection device 31.

[0049] The testing system 100 described in this application uses an integrating sphere 20 as a photon collector. The test object 1 is placed outside the integrating sphere 20 and between the excitation light source 10 and the integrating sphere 20. The system collects the spectral information and related parameters of the light emitted by the excited test object 1, and then calculates parameters to evaluate the performance of the quantum dot film. The testing system 100 provided in this application offers a simple, fast, low-cost, and highly accurate testing system for evaluating the performance of the test object 1 in color conversion display technology. It provides an extremely convenient means for processes such as quantum dot material screening and quantum dot ink formulation optimization applied to the development of quantum dot film color conversion technology.

[0050] Furthermore, when the test system 100 described in this application performs performance testing on the test object 1, the test object 1 is placed outside the integrating sphere 20 rather than inside the integrating sphere 20. In this way, the integrating sphere 20 with a smaller volume can be used, and it is also beneficial to equipment maintenance, thereby effectively reducing the testing cost.

[0051] When the test system 100 is used to perform performance testing on the test object 1, the test object 1 is placed on the sample holder 40 and sandwiched between the light inlet 21 of the integrating sphere 20 and the excitation light emission area 1011 of the excitation light source 10. The intensity of the excitation light emitted by the excitation light source 10 is adjusted to a reasonable value by the excitation light source 10, and the photons entering the integrating sphere 20 are collected. The light signal to be tested is transmitted to the detection device 31 through the optical fiber 50. Then, the detection device 31 separates and analyzes the light signal to obtain spectral information and related parameters. Finally, the material parameters of the test object 1 are calculated by the calculation device 32.

[0052] Secondly, please refer to Figure 2 This application also provides a testing method, comprising the following steps:

[0053] Step S11: Place the object to be tested 1 on the sample holder 40 between the integrating sphere 20 and the excitation light source 10;

[0054] Step S12: The excitation light source 10 emits excitation light to excite the object to be detected 1 to emit light;

[0055] Step S13: Collect at least a portion of the light emitted by the object to be detected 1 through the integrating sphere 20;

[0056] Step S14: The processing device 30 detects the collected light and confirms the material parameters of the object to be tested 1 based on the detection result.

[0057] The processing device 30 calculates the optical power at a certain wavelength of the collected light, and calculates the brightness (L), external quantum efficiency (EQE), power efficiency (LCE), and blue or ultraviolet light absorption rate of the object to be detected 1 based on the optical power.

[0058] The optical power is calculated using the following formula (I):

[0059]

[0060] Among them, S λ This represents the CCD (Charge-Coupled Device) count, which is proportional to the spectral energy; D λ Cp represents the CCD count in the dark state. λ This indicates that the spectrometer was calibrated using a standard light source to obtain the correction coefficient; T represents the spectrometer integration time; Δλ represents the spectral wavelength interval, which can be 0.1–2 nm; A represents the effective area of ​​the device; S r The spatial angle is represented by π. Since the excitation light emission region 1011 of the excitation light source 10 and the object to be tested 1 are attached to the light inlet 21 of the integrating sphere 20 when the object is tested, the value is π.

[0061] The external quantum efficiency (EQE) can be calculated using the following equations (II-1) to (II-4):

[0062]

[0063] Among them, P ex-B P represents the total number of photons within the excitation wavelength range. em-G P represents the total number of photons excited by the excitation light in the green quantum dot film. em-R E represents the total number of photons excited by the excitation light in a red quantum dot thin film. λ Let λ represent the photon energy at wavelength λ (in μJ), T represent the spectrometer integration time (in seconds), and h represent Planck's constant h = 6.626 × 10⁻⁶. -34 J·s,c represents the speed of light 3×10⁻⁶ 8 m / s, λ represents the excitation wavelength (in nm), λ G The wavelength (in nm) of green quantum dots is represented by λ. R The wavelength of the red quantum dot is represented in nm.

[0064] The brightness (L) can be calculated using the following formulas (III-1) to (III-3):

[0065]

[0066] Where Φ represents luminous flux, V λ Represents the human visual acuity function; Intensity represents the average light intensity; A represents the effective area of ​​the device, A (unit: mm). 2 ).

[0067] The power efficiency (LCE) can be calculated using the following equation (IV):

[0068]

[0069] Among them, L QD-em L represents the brightness of the light emitted by the object being tested 1. B-ex This indicates the brightness of the excitation light.

[0070] The blue light absorption rate can be calculated using the following formula (V):

[0071]

[0072] Among them, L B-ex Indicates the brightness of the excitation light; L B-em This indicates the brightness of the blue light emitted by the sample 1.

[0073] The present application will be specifically described below through specific embodiments. The following embodiments are only some embodiments of the present application and are not intended to limit the present application.

[0074] Example 1

[0075] A quantum dot ink is provided, comprising red quantum dots CdZnSe / ZnSe / ZnS, TiO2, hydroxyethyl methacrylate, diimidazole, and propylene glycol methyl ether acetate. The quantum dot ink contains 30 wt% quantum dots, 10 wt% scattering particles, 40 wt% curing monomer, 3 wt% photoinitiator, and 17 wt% solvent.

[0076] The quantum dot ink was spin-coated onto a glass substrate, dried at 90°C for 5 minutes using a heating plate, and then photocured using ultraviolet light with a wavelength of 365nm and an exposure dose of 70mJ / cm². 2 Then, it is dried at 100℃ for 10 minutes to obtain a red quantum dot film with a thickness of 50nm;

[0077] The test system 100 described in this application is provided, in which the red quantum dot film is placed on the sample holder 40 and the red quantum dot film is sandwiched between the light inlet 21 of the integrating sphere 20 and the excitation light emission region 1011 of the excitation light source 10; the test system 100 is turned on to perform performance testing on the test object 1.

[0078] In this embodiment, the wavelength of the excitation light emitted by the excitation light source 10 is 450nm; the light inlet 21 is a circular hole with a diameter of 1cm; the integrating sphere 20 has a cubic structure with a side length of 70cm, and the light inlet 21 and the light collecting hole 22 are respectively located at the center of two adjacent faces of the cubic structure; the detection device 31 is a spectrometer; and the processing device 30 is a computer.

[0079] Example 2

[0080] This embodiment is basically the same as Embodiment 1, except that green quantum dots are used instead of red quantum dots in Embodiment 1. The wavelength of the excitation light emitted by the excitation source 10 in this embodiment is 450 nm.

[0081] Example 3

[0082] This embodiment is basically the same as Embodiment 1, except that blue quantum dots are used instead of red quantum dots in Embodiment 1. The wavelength of the excitation light emitted by the excitation source 10 in this embodiment is 365 nm.

[0083] Comparative Example 1

[0084] This comparative example is basically the same as that of thin film example 1, except that the test system 100 used in this comparative example is different from that in example 1. The quantum dot thin film of the test system in this comparative example is placed inside the integrating sphere 20 during the detection.

[0085] Comparative Example 2

[0086] This comparative example is basically the same as Comparative Example 1, except that green quantum dots are used instead of red quantum dots in Comparative Example 1. The wavelength of the excitation light emitted by the excitation source 10 in this comparative example is 450 nm.

[0087] Comparative Example 3

[0088] This comparative example is basically the same as Comparative Example 1, except that blue quantum dots are used instead of red quantum dots in Comparative Example 1. The wavelength of the excitation light emitted by the excitation source 10 in this comparative example is 365 nm.

[0089] The external quantum efficiency (EQE), brightness (L), and blue (ultraviolet) absorption rate of the thin films of Examples 1-3 and Comparative Examples 1-3 were tested using blue light or ultraviolet light with an excitation intensity of 1000 nits. The test results are shown in Table 1.

[0090] Table 1:

[0091] EQE Brightness (L) Blue light (ultraviolet light) absorption rate Example 1 52％ 2955 99％ Example 2 50％ 7560 98.5％ Example 3 45％ 1500 96％ Comparative Example 1 50％ 2785 98％ Comparative Example 2 49％ 7440 97％ Comparative Example 3 42％ 1350 95％

[0092] As shown in Table 1:

[0093] The test system 100 described in this application can effectively measure the external quantum efficiency, brightness, and blue / ultraviolet light absorption rate of quantum dot films, and the test results are higher, indicating that the test system 100 described in this application has higher test accuracy.

[0094] The technical solutions provided by the embodiments of this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A testing system, characterized in that, include: An excitation source is configured to output excitation light, which is used to excite the analyte to emit light. An integrating sphere configured to collect light emitted when the object to be detected is excited; A sample holder configured to hold the analyte between the excitation source and the integrating sphere; as well as A processing device configured to determine the material parameters of the object to be tested based on the light collected by the integrating sphere.

2. The testing system as described in claim 1, characterized in that, The processing device includes a detection device and a computing device; wherein... The detection device is configured to receive light output from the integrating sphere and acquire information and / or parameters of the light based on the received light. And / or, the computing device is configured to acquire information and / or parameters of the light, and determine the material parameters of the object to be detected based on the information and / or parameters of the light.

3. The testing system as described in claim 2, characterized in that, The integrating sphere has a light inlet aperture, the excitation light source is disposed opposite to the light inlet aperture, and the object to be detected is located between the excitation light source and the light inlet aperture.

4. The testing system as described in claim 3, characterized in that, The excitation light source is a surface light source, which has a light-emitting surface and is arranged opposite to the light-entry hole.

5. The testing system as described in claim 4, characterized in that, The light-emitting mask has an excitation light emitting area, which is disposed opposite to the light inlet hole, and the object to be detected is located between the excitation light emitting area and the light inlet hole; Optionally, the area of ​​the excitation light emitting region is less than or equal to the opening area of ​​the light inlet aperture.

6. The testing system as described in claim 3, characterized in that, The light inlet is a circular hole, and the diameter of the light inlet is greater than or equal to 0.5 cm and less than or equal to 3 cm. And / or, the integrating sphere is provided with a light collecting hole, and the testing system further includes an optical fiber, one end of which is disposed in the light collecting hole, and the other end of which is connected to the detection device.

7. The testing system as described in claim 6, characterized in that, The integrating sphere has a cube structure with a side length of 40-100cm, and the light inlet and light collecting hole are respectively disposed on two adjacent faces of the cube structure.

8. The testing system as described in claim 2, characterized in that, The object to be detected includes a quantum dot film; And / or, the excitation light emitted by the excitation source is blue light or ultraviolet light, wherein the wavelength of the blue light is 440-470 nm and the wavelength of the ultraviolet light is 100-400 nm; And / or, the detection device is a spectrometer; And / or, the computing device is a machine consisting of a computer or other programmable data processing device.

9. A testing method for use in the testing system according to any one of claims 1 to 8, characterized in that, Includes the following steps: The analyte is placed on the sample holder between the integrating sphere and the excitation light source; The excitation light source emits excitation light to excite the object to be detected to emit light; At least a portion of the light emitted by the object to be detected is collected through the integrating sphere; The processing device detects the collected light and confirms the material parameters of the object to be tested based on the detection results.

10. The test method as described in claim 9, characterized in that, The processing device calculates the optical power at a certain wavelength of the collected light, and then calculates the brightness, external quantum efficiency, power efficiency, and light absorption rate of the quantum dot film based on the optical power.

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