current sensor

Abstract

A current sensor is provided. The current sensor includes a first measurement coil and a second measurement coil. The current sensor includes a substrate including a first layer, a second layer, a third layer, and a fourth layer; a first measurement coil disposed on the first layer and the third layer of the substrate; and a second measurement coil disposed on the second layer and the fourth layer of the substrate.

Description

Technical Field

[0001] This disclosure relates to a substrate for a current sensor, and more particularly to a current sensor comprising a first measuring coil and a second measuring coil. Background Technology

[0002] Current sensors detect and measure the current flowing through a conductor. They are used in many different applications, such as providing accurate current measurements in electricity meters.

[0003] One type of current sensor uses a shunt resistor connected in series with the current-carrying conductor. The voltage drop across the resistor can be measured, and the current flowing through the resistor can be calculated by knowing the resistance of the shunt. However, at higher currents, the temperature of the shunt may rise, changing its resistance and thus providing inaccurate current measurements. Furthermore, since the shunt is directly in the path of the measured current, it may be necessary to have isolation circuitry between the shunt and the sensitive measurement and processing electronics.

[0004] Another type of current sensor uses an electromagnetic transducer to detect changes in the magnetic field generated by a current-carrying conductor. These rate-of-change current sensors (e.g., Rogowski coils) do not require any physical connection to the current-carrying conductor and therefore do not require any additional isolation components to isolate them from the conductor.

[0005] However, because magnetic field change rate sensors rely on magnetic field coupling, they are susceptible to interference from other changing magnetic fields generated near the sensor. For example, a second current-carrying conductor, not the target of the measurement operation, may pass near the Rogowski coil. The magnetic field generated by this second current-carrying conductor may couple into the Rogowski coil, thus affecting the coil's measurement accuracy.

[0006] A major challenge with Rogowski coils is their sensitivity to electrostatic or capacitive coupling from nearby AC conductors. Electrostatic coupling from nearby AC conductors is particularly problematic for sensors with potentially low gain, such as PCB-implemented current sensors. This means that even small erroneous signals picked up from nearby AC conductors are significant and can affect the sensor's SNR. For example, in meters, electrostatic coupling can be prevalent due to the location of the AC bus, which carries the measured current but also the phase voltage, typically 240V. With electrostatic coupling, the voltage on the bus is coupled into the coil via stray capacitance, and even small stray capacitances can generate erroneous signals in the sensor due to the high voltage on the conductor.

[0007] There is a need to provide a current sensor implemented on a substrate with reduced noise in its signal output. Summary of the Invention

[0008] According to one aspect of the present invention, a current sensor is provided, the current sensor comprising: a substrate including a first layer, a second layer, a third layer and a fourth layer; a first measuring coil disposed on the first layer and the third layer of the substrate; and a second measuring coil disposed on the second layer and the fourth layer of the substrate.

[0009] According to another aspect of the invention, a current sensor is provided, comprising: a substrate including a path for a current-carrying conductor; a first measuring coil formed on the substrate and arranged to advance circumferentially around the path for the current-carrying conductor, wherein the first measuring coil includes a first plurality of loops; and a second measuring coil arranged to advance circumferentially around the path for the current-carrying conductor, wherein the second measuring coil includes a second plurality of loops; wherein the first measuring coil and the second measuring coil are arranged relative to each other such that a corresponding loop in the first plurality of loops is adjacent to a corresponding loop in the second plurality of loops in the circumferential direction around the path for the current-carrying conductor.

[0010] According to another aspect of the present invention, a current sensor is provided, the current sensor comprising: a first output terminal; a second output terminal; a first measuring coil having a first end and a second end, the first end of the first measuring coil being coupled to the first output terminal; and a second measuring coil having a first end and a second end, the first end of the second measuring coil being coupled to the second output terminal, wherein the second end of the first measuring coil is coupled to the second end of the second measuring coil and is configured to be coupled to a reference voltage. Attached Figure Description

[0011] Various aspects of this disclosure will now be described by way of example only and with reference to the accompanying drawings, wherein the same reference numerals denote the same parts, and wherein:

[0012] Figure 1 This is a schematic diagram of a Rogowski coil;

[0013] Figure 2a This is a schematic diagram of a differential Rogowski coil according to the present invention;

[0014] Figure 2b This is a simplified schematic diagram of the Rogowski coil according to Figure 2 of the present invention;

[0015] Figure 3 This is a four-layer substrate implementation of the differential Rogowski coil according to the present invention;

[0016] Figure 4a This is a PCB layout of a first measuring coil on two layers of a substrate according to the present invention;

[0017] Figure 4b This is a PCB layout of a second measuring coil on two layers of a substrate according to the present invention;

[0018] Figure 4c This is a three-dimensional cross-sectional view of a portion of the first measuring coil;

[0019] Figure 4d This is a three-dimensional cross-sectional view of a portion of the second measuring coil;

[0020] Figure 5a The present invention relates to a PCB layout having turns of a first measuring coil on two layers of a substrate with an outer circumferential advancement.

[0021] Figure 5b The present invention relates to a PCB layout having turns of a second measuring coil on two layers of a substrate with an outer circumferential advancement.

[0022] Figure 5c It is a combination according to the present invention Figure 5a and Figure 5b PCB layout of the coil;

[0023] Figure 6a The present invention relates to a PCB layout having turns of a first measuring coil on two layers of a substrate with inner circumferential advancement;

[0024] Figure 6b The present invention relates to a PCB layout having turns of a second measuring coil on two layers of a substrate with inner circumferential advancement;

[0025] Figure 6c It is a combination according to the present invention Figure 6a and Figure 6b PCB layout of the coil;

[0026] Figure 7a The present invention relates to a PCB layout having a centrally driven first measuring coil turn on two layers of a substrate;

[0027] Figure 7b The present invention relates to a PCB layout having a centrally advanced second measuring coil with turns on two layers of a substrate;

[0028] Figure 7c It is a combination according to the present invention Figure 7a and Figure 7b PCB layout of the coil;

[0029] Figure 8a The present invention relates to a PCB layout having continuously advancing turns of a first measuring coil on two layers of a substrate;

[0030] Figure 8bThe present invention relates to a PCB layout having continuously advancing turns of a second measuring coil on two layers of a substrate;

[0031] Figure 8c It is a combination according to the present invention Figure 8a and Figure 8b PCB layout of the coil;

[0032] Figure 9 It is a PCB or substrate stack according to the present invention;

[0033] Figure 10 This is a schematic diagram of capacitor filtering according to the present invention;

[0034] Figure 11 This is a schematic diagram of the current measurement coil coupled to the processing system. Detailed Implementation

[0035] Rogowski coils are known to be susceptible to both electrostatic coupling noise and magnetic coupling noise. This noise can originate from current-carrying conductors near the Rogowski coil. Electrostatic coupling noise in a Rogowski coil comprising multiple coils may differ in each coil, meaning it cannot be easily canceled or removed. If the noise coupled to multiple coils is identical, it can be easily canceled or removed via differential connections between the coils, especially when the subsequent processing stage of the differential output coupled to the coils has a good common-mode rejection ratio (CMRR).

[0036] Solutions for removing magnetic coupling noise, such as using compensating conductors or return conductors, may be difficult to implement in the printed circuit board implementation of Rogowski coils.

[0037] To improve the operation of a current sensor, two measuring coils can be implemented on a single printed circuit board or substrate. The two measuring coils are used to wrap around, partially around, or essentially around the conductor being measured (also known as the current-carrying conductor). The output voltage of the Rogowski coil or measuring coil is proportional to the number of loops or turns of the measuring coil. Providing two coils increases the number of turns and therefore increases the sensitivity of the system.

[0038] Each measuring coil forms a loop around the conductor being measured and is composed of multiple loops or turns wound from a first end or terminal of each coil to a second end or terminal to form the coil. Two measuring coils are provided such that, starting from the first terminal of each coil, each turn or radial loop in the first measuring coil is wound in a first direction (e.g., clockwise), and each turn or radial loop in the second measuring coil is wound in the opposite direction (e.g., counterclockwise). The second terminals of the coils may be coupled together. Winding the coils with opposite polarities ensures that the first measuring coil picks up a positive voltage from the conductor being measured, while the second coil picks up a negative voltage from the conductor being measured. This ensures that the output voltages of the two coils are differentially summed, thereby increasing the system sensitivity by increasing the output voltage of the coils.

[0039] Alternatively, or as an alternative to winding each loop of the coil in opposite directions, the first and second measuring coils can travel around the conductor in the same direction and follow similar or adjacent paths. By following the same path, the current sensor balances the electrostatic coupling of noise voltages from outside the coil. The same electrostatic coupling exists in both coils, generating a common-mode signal that can be easily removed, thereby improving system performance when testing small currents without the need for shielding.

[0040] Current sensors are used to suppress external longitudinal electromagnetic fields. These fields can be caused by external noise-generating conductors located outside the current sensor but in a direction substantially the same as the conductor being measured. Because the measuring coil is arranged in a roughly circular configuration around the conductor being measured, the closer portion of the coil (closer to the longitudinal electromagnetic field) may experience a larger electromagnetic field strength over a smaller area. The farther portion of the coil (around 180 degrees) may experience a lower electromagnetic field strength over a larger area. This results in coupling noise of equal magnitude but opposite sign in these two sections of the coil. Therefore, the noise caused by the longitudinal electromagnetic field is canceled out due to the shape of the coil.

[0041] Current sensors are also used to suppress external transverse electromagnetic fields. These fields may be caused by external noise-generating conductors perpendicular to the conductor being measured, such as across the surface of a substrate on which the measuring coils are formed. If the current measuring coils travel from 0 degrees to 360 degrees in the same direction, the same noise from the transverse noise source couples into both the first and second measuring coils. This coupled noise can then be easily canceled out.

[0042] Suppressing both lateral and side external field sources reduces crosstalk, enabling the current sensor to be easily integrated into harsh environments.

[0043] By following similar paths, each coil is approximately equidistant from external noise sources.

[0044] In addition, the measurement coil requires only two vias per turn or per loop, which reduces the implementation cost of the system and improves reliability.

[0045] Figure 1 This is a schematic diagram of a known Rogowski coil. To measure the current I(t) flowing through the current-carrying conductor 100, a measuring coil 102 is arranged such that the current-carrying conductor 100 passes through the measuring coil. The measuring coil 102 is wound into a helical shape such that the helical loop or turns enclose a cross-sectional area 104, A. The current-carrying conductor 100 can be, for example, a busbar.

[0046] When the current I(t) in the current-carrying conductor 100 changes, the field generated by the current also changes. The positioning of the measuring coil causes a voltage proportional to the rate of change of current dI / dt to be induced in the measuring coil 102. Therefore, integrating the output v(t) of the measuring coil provides a value proportional to the current. Each turn or loop of the coil forms a measuring area 104 in a plane perpendicular to the extension direction of the current-carrying conductor.

[0047] However, the voltage induced in the measuring coil may be affected by external conductors that the user does not intend to measure. In addition to forming loops of multiple coils with a measuring area of ​​104, the extension of the coil itself also effectively forms a single loop in the plane of the current-carrying conductor. To address the problem of magnetic field coupling into this single loop, a compensating conductor may be included.

[0048] Figure 1 The Rogowski coil is a single-ended Rogowski coil, including a measuring coil 102 extending around conductor 100. A current sensor may include more than one measuring coil and is arranged to provide a differential output.

[0049] Figure 2a This is a schematic diagram of a current sensor 200 or a current measuring device. The current sensor 200 includes a first measuring coil 202 and a second current measuring coil 204. The first current measuring coil 202 has a first end 206 and a second end. The second current measuring coil 204 has a first end 208 and a second end. The second ends of the first current measuring coil 202 and the second ends of the second current measuring coil 204 are coupled together at a point, terminal, or node 210.

[0050] A first current measuring coil 202 and a second current measuring coil 204 are arranged around the conductor 212 to be measured. The conductor 212 is adapted to carry the current to be measured by the first current measuring coil 202 and the second current measuring coil 204. When the conductor 212 carries AC current, the magnetic field generated by the current will induce a voltage in each radial loop or turn of the measuring coil that is proportional to both the amplitude and frequency of the AC current. Therefore, the first current measuring coil 202 and the second current measuring coil 204 can be regarded as current sensors or current measuring devices.

[0051] Figure 2b It shows Figure 2a A simplified schematic diagram of the current sensor 200. The first current measuring coil 202 and the second current measuring coil 204 are shown in a simplified manner.

[0052] The second end of the first current measuring coil 202 and the second end of the second current measuring coil 204 are coupled together at node 210. Node 210 is coupled to a reference terminal 214, which can be coupled to a reference voltage or ground.

[0053] The first end 206 of the first current measuring coil 202 is coupled to the first output terminal 216. The first end 208 of the second current measuring coil 204 is coupled to the second output terminal 218.

[0054] The coupling of the first current measuring coil 202 and the second current measuring coil 204 in this manner causes the current measuring coils to function as differential current measuring coils. The current measuring coils provide a differential output signal relative to a reference voltage between the first output terminal 216 and the second output terminal 218. The first output terminal 216 can be considered as the positive output or first output of the differential output signal. The second output terminal 218 can be considered as the negative output or second output of the differential output signal.

[0055] The first output terminal 216 and the second output terminal 218 can be coupled to a signal processing circuit for further processing. The signal processing circuit may include a differential amplifier. The signal processing circuit may be included on the substrate 302. Alternatively, the signal processing circuit may be external to the substrate 302.

[0056] Each measuring coil comprises multiple turns or loops. When viewed through the loop shape formed by the coils, the turns or loops of each measuring coil are arranged to extend from the first terminal or end of each measuring coil in a clockwise or counterclockwise direction.

[0057] The first measuring coil 202 may have turns or loops extending clockwise from a first end 206 of the first current measuring coil 202. The second measuring coil 204 may have turns or loops extending counterclockwise from a first end 208 of the second current measuring coil 204. Alternatively, the turns of the first coil may be wound counterclockwise, and the second coil may be wound clockwise. This results in the first measuring coil 202 having a polarity opposite to that of the second measuring coil 204. This opposite winding polarity is determined by… Figure 2b The polarity markings are shown.

[0058] Winding the first measuring coil 202 and the second measuring coil 204 in this manner induces a positive voltage 220 in the first measuring coil 202 and a negative voltage 222 in the second measuring coil 204. These induced voltages will be subtracted to produce a differential signal representing the magnetic field from the conductor passing through the center of the coil.

[0059] like Figure 2a As shown, the first measuring coil 202 and the second measuring coil 204 form a circumferential loop around the conductor under test in the same direction from their first ends 206, 208 to their second ends 210. Therefore, any pickup of a transverse external magnetic field (such as from an external cable or noise source) across the surface of the substrate (which induces a voltage across the circumferential loop of the coils) will result in the same common-mode voltage on the first measuring coil 202 and the second measuring coil 204 (and thus no differential noise voltage will be picked up). The common-mode rejection ratio (CMRR) of the differential amplifier coupled to the first output node 216 and the second output node 218 can remove most of this signal.

[0060] Although Figure 2a and Figure 2b A differentially coupled current sensor is shown, but the measuring coil can alternatively be single-ended coupled. For example, a first output terminal 216 can be used as an output terminal 218, and a second output terminal 218 can be coupled to ground or a reference voltage. Terminal 214 can remain unconnected or disconnected. The signal from the first output terminal 216 can be coupled or connected to a signal processor or other processing circuitry. Differential coupling of the current sensor provides improved performance compared to a single-ended connection of the current sensor.

[0061] Figure 3 It shows Figure 2a and Figure 2b The current sensor 200 shown is implemented as a printed circuit board (PCB) 300. The printed circuit board 300 includes a substrate 302 having four layers.

[0062] The substrate 302 includes a first plurality of vias 304 arranged around the inner circumference of the first measuring coil 202 and a second plurality of vias 306 arranged around the inner circumference of the second measuring coil 204. The first plurality of vias 304 and the second plurality of vias 306 can be arranged around the same circumference or around concentric circumferences. Arranging the vias around a concentric circumference improves electrostatic coupling performance because the distance from the measured conductor to the two measuring coils will be equal. The vias can be arranged non-concentrically, allowing for a denser arrangement on the substrate. While this may affect electrostatic coupling performance, providing a denser via arrangement allows for more loops or turns for each measuring coil.

[0063] The substrate 302 also includes a third plurality of vias 320 arranged around the outer circumference of the first measuring coil 202 and a fourth plurality of vias 322 arranged around the outer circumference of the second measuring coil 204. The third plurality of vias 320 and the fourth plurality of vias 322 may be arranged around the same circumference or around concentric circumferences. The diameter of the inner circumference is smaller than the diameter of the outer circumference.

[0064] The current sensor 300 includes a conductor 212 for carrying a current to be measured by a first current measuring coil 202 and a second current measuring coil 204. The conductor 212 is implemented along a path 308 of the substrate 302. The path 308 may be an aperture for receiving the conductor 212. Alternatively, the conductor 212 may be a conductive trace through the substrate without an aperture.

[0065] The first current measuring coil 202 and the second current measuring coil 204 are implemented across four layers of the substrate, including conductors or conductive traces located on different layers of the substrate. Illustrations are provided in the accompanying drawings, in which conductors on different layers of the substrate 302 are represented using different line types.

[0066] The first current measuring coil 202 is implemented on the first and third layers of the substrate 302. The second current measuring coil 204 is implemented on the second and fourth layers of the substrate 302.

[0067] Each layer of substrate 302 includes a plurality of measurement conductors. A first plurality of measurement conductors 310 are located on the first layer of substrate 302. A second plurality of measurement conductors 312 are located on the second layer of substrate 302. A third plurality of measurement conductors 314 are located on the third layer of substrate 302. A fourth plurality of measurement conductors 316 are located on the fourth layer of substrate 302.

[0068] The third multiple measuring conductor 314 and the fourth multiple measuring conductor 316 are in Figure 3 They are not visible because the first plurality of measuring conductors 310 are aligned with the third plurality of measuring conductors 314, and the second plurality of measuring conductors 312 are aligned with the fourth plurality of measuring conductors 316. These conductors can be Figures 5a to 5c As can be seen in the accompanying drawings, the conductors are shown as being in a slightly misaligned state for ease of understanding.

[0069] The substrate 302 also includes a plurality of circumferential advance conductors 318. The circumferential advance conductors are arranged to provide circumferential advance for a first current measuring coil 202 and a second current measuring coil 204.

[0070] The circumferential advancing conductor of the first measuring coil 202 is located on the first and third layers of the substrate. The circumferential advancing conductor of the second measuring coil 204 is disposed on the second and fourth layers of the substrate. Because the circumferential advancing conductors of the two measuring coils cross each other (e.g., ... Figure 3 As shown in the diagram, if they are located on the same layer of the substrate, additional vias are required to prevent them from interacting with or obstructing each other.

[0071] By placing the first and second measuring coils on different layers of the substrate, and specifically by placing the circumferential advance conductors of the first and second measuring coils on different layers, it is ensured that the circumferential advance conductor of the first measuring coil does not obstruct, hinder, or interact with the circumferential advance conductor of the second measuring coil. Therefore, only two vias are required per turn or per loop of each measuring coil. This reduces the manufacturing complexity of the system and ensures that the loop areas of the two measuring coils are matched, as only a minimal number of vias that could potentially alter the loop shape or size are required.

[0072] Although the first measuring coil is described as being disposed on the first and third layers of the substrate, and the second measuring coil is described as being disposed on the second and fourth layers of the substrate, it should be understood that the coils can be disposed on different layers. For example, the first measuring coil can be disposed on the first and fourth layers of the substrate, and the second measuring coil can be disposed on the second and third layers of the substrate. While this may reduce the matching between these coils (because one of the coils will have a slightly different loop area), such mismatch may be acceptable in some cases if the distance between the layers is small. Distributing the measuring coils across different layers of the substrate ensures that the circumferentially advancing conductors and vias do not interfere with or obstruct each other. Alternatively, the measuring coils can be implemented across four layers of a substrate or PCB with more than four layers.

[0073] Figure 4a and Figure 4b It shows Figure 3 The PCB implementation of the current sensor 300 is a sub-section.

[0074] Figure 4aIt includes only vias and conductive traces for forming the first measuring coil 202. The substrate 302 includes a first plurality of vias 304 arranged around the inner circumference of the first measuring coil 202. The substrate also includes a third plurality of vias 320 arranged around the outer circumference of the first measuring coil 202.

[0075] Figure 4b The vias and conductive traces for forming the second measuring coil 204 are shown. The substrate includes a second plurality of vias 306 arranged around the inner circumference of the second measuring coil 204. The substrate 302 also includes a fourth plurality of vias 322 arranged around the outer circumference of the second measuring coil 204.

[0076] The diameter of the inner circumference is smaller than the diameter of the outer circumference. Although the first plurality of vias 304 and the second plurality of vias are shown arranged around the same circumference, the first plurality of vias and the second plurality of vias may be located on concentric circumferences. Furthermore, the third plurality of vias 320 and the fourth plurality of vias 322 may be located on concentric circumferences. The inner and outer circumferences of the first and second measuring coils may refer to the circumferences surrounding the conductor 212 or the path 308 for the conductor.

[0077] Figure 4c A 3D sub-segment of the first measuring coil 202 implemented on the first and third layers of the substrate is shown. Figure 4d A 3D sub-segment of the second measuring coil 204 disposed on the second and fourth layers of the substrate is shown. These figures clearly show the winding direction of the loops of the first measuring coil 202 and the second measuring coil 204. These figures include arrows indicating the forward direction of the loops of the measuring coils.

[0078] The first measuring coil 202 begins at the first end 206, and the loop of the first measuring coil 202 extends from the first end 206 in a first direction. Figure 4c In the middle, the loops proceed counterclockwise from the first end 206; however, this is merely an example, and they can also proceed clockwise.

[0079] The second measuring coil 204 originates from the first end 208, and the loop of the second measuring coil 204 extends from the first end 208 in a second direction. This second direction is opposite to the first direction of the loop of the first measuring coil 202. Figure 4d In this example, the loop of the second measuring coil 204 advances clockwise from the first end 208; however, this is merely exemplary and they may alternatively advance counterclockwise.

[0080] As described, the loops of the first measuring coil 202 and the second measuring coil 204 have opposite rotation or winding directions, ensuring that the first measuring coil 202 picks up a positive voltage from the conductor being measured, and the second coil 204 picks up a negative voltage from the conductor being measured (and vice versa). This ensures that the output voltages of the two coils are differentially summed, thereby increasing the system sensitivity by increasing the output voltage of the coils.

[0081] Figure 4c and Figure 4d The circumferential advance shown is around the circumference of the measuring coil; however, it should be understood that the circumferentially advancing conductor can alternatively advance in both the circumferential and radial directions, as shown below. Figures 5a to 5c As shown.

[0082] Figure 5a It shows Figure 4a A simplified sub-segment of the conductive trace of the first measuring coil 202. Figure 5b It shows Figure 4b The simplified sub-segment of the conductive trace of the second measuring coil 202. Figure 5c It shows Figure 3 The simplified sub-segments of the conductive traces specifically illustrate how the first current measuring coil 202 and the second current measuring coil 204 can be combined in an interleaved manner to form a differential current sensor. Illustrations are provided in the figures, where conductors on different layers of the substrate are represented using different line types.

[0083] For ease of understanding, the measuring conductors on the first and third layers, as well as the measuring conductors on the second and fourth layers, are shown as adjacent to each other, rather than directly located in the same plane. However, it should be understood that the first and third measuring conductors are aligned in a radial plane, and the second and fourth measuring conductors are aligned in a radial plane.

[0084] Figure 5a A subsection of the first current measuring coil 202 implemented on the first layer and the third layer of the substrate is shown.

[0085] The first plurality of measuring conductors and the third plurality of measuring conductors are coupled through corresponding through holes in the first plurality of through holes 304 and the third plurality of through holes 320 to form the first measuring coil 202.

[0086] The first turn or first loop of the first current measuring coil 202 includes a measuring conductor 502 among a first plurality of measuring conductors 310 formed on a first layer of the substrate, and a measuring conductor 504 among a third plurality of measuring conductors 314 formed on a third layer of the substrate. The measuring conductors 502 and 504 are positioned in the same plane passing through the substrate. The measuring conductors 502 and 504 are coupled at a first end of the measuring conductor (closer to the end of a hole, path, or current-carrying conductor) through a via 506 of a first plurality of vias 304 located on the inner circumference of the first measuring coil 202.

[0087] The second turn or second loop of the first current measuring coil 202 includes a measuring conductor 508 among a first plurality of measuring conductors 310 formed on a first layer of the substrate, and a measuring conductor 510 among a third plurality of measuring conductors 314 formed on a third layer of the substrate. The measuring conductors 508 and 510 are coupled at the first end of the measuring conductor (closer to the end of the hole, path, or current-carrying conductor) through a via 512 of a first plurality of vias 304 located on the inner circumference of the first measuring coil.

[0088] Figures 5a to 5c The vias shown in the following figures are depicted as straight lines. This is for ease of understanding. The vias in the first plurality of vias 304 and the second plurality of vias 306 may alternatively be as shown in the figures below. Figure 3 As shown, it extends along the circumference.

[0089] At the outer circumference, a circumferential advancing element is used to provide circumferential advancement of the first measuring coil 202, which connects the measuring conductor to a corresponding via in a third plurality of vias 320 at the outer circumference. These circumferential advancing conductors 318 allow the measuring coil to advance from a first end of the current measuring coil to a second end of the current measuring coil. This causes the measuring coil to surround or substantially surround the conductor 212. While the measuring coil can travel 360 degrees around the substrate or conductor, it can alternatively travel substantially 360 degrees, such as 340 degrees, 345 degrees, 350 degrees, 355 degrees, or any value between 340 and 360 degrees. This allows space to be provided for incorporating external mounts or connectors. Larger openings or holes 308 may be included to allow insertion of the conductor under test, such that the diameter or width of the hole 308 is larger than the diameter of the conductor 212 under test.

[0090] The measuring conductor 504 is coupled to a first circumferential advance conductor 516 of a plurality of circumferential advance conductors or circumferential push conductors 318 to a via 514 in a third plurality of vias 320. The via 514 is coupled to the measuring conductor 508 via a second circumferential advance conductor 518.

[0091] A circumferential advancing conductor provides circumferential advancement around a substrate 302 for the first measuring coil 202. This makes the first measuring coil 202 substantially surround the current-carrying conductor 212. The measuring conductor is arranged radially from the center of the substrate. The circumferential advancing conductor is located adjacent to the second plurality of vias and directly connected to the second plurality of vias at the outer circumference of the substrate. The plurality of circumferential advancing conductors 318 form a advancing region or advancing region of the measuring coil. The advancing region is closer to the third plurality of vias 320 and the fourth plurality of vias 322 than the first plurality of vias 304 and the second 306 plurality of vias 320, such that the advancing region is closer to or adjacent to the outer circumference of the measuring coil than the inner circumference of the measuring coil.

[0092] Figure 5b A subsection of the second current measuring coil implemented on the second layer of the substrate and the fourth layer of the substrate 302 is shown.

[0093] The first turn or first loop of the second current measuring coil 204 includes a conductor 520 among a fourth plurality of measuring conductors formed on a fourth layer of the substrate, and a measuring conductor 522 among a second plurality of measuring conductors 306 formed on a second layer of the substrate. The measuring conductors 520 and 522 are coupled at a first end of the measuring conductor (closer to the end of the hole, path, or current-carrying conductor) through a via 524 of a second plurality of vias 306 located on the inner circumference of the second measuring coil 204.

[0094] The second turn or second loop of the second current measuring coil 202 includes a measuring conductor 526 among a fourth plurality of measuring conductors formed on a fourth layer of the substrate, and a measuring conductor 528 among a second plurality of measuring conductors formed on a second layer of the substrate. The measuring conductors 526 and 528 are coupled at a first end of the measuring conductor (closer to the end of the hole, path, or current-carrying conductor) through a via 530 of a second plurality of vias 306 located on the inner circumference of the second measuring coil 204.

[0095] The first turn or first loop of the second current measuring coil 204 and the second turn or second loop of the second current measuring coil 204 are coupled together at the fourth plurality of through holes 322 on the outer circumference of the substrate.

[0096] The measuring conductor 522 is coupled to a via 532 in the fourth plurality of vias 322 using a first forward conductor 534. The via 532 is coupled to the measuring conductor 526 via a second forward conductor 536.

[0097] Figure 5c A subsection of a current sensor including both a first measuring coil 202 and a second measuring coil 204 is shown, wherein the first measuring coil is implemented on the first and third layers of the substrate, and the second measuring coil is implemented on the second and fourth layers of the substrate.

[0098] The first turn 538 of the first measuring coil 202 is located adjacent to the first turn 540 of the second measuring coil. The second turn 542 of the first measuring coil 202 is located adjacent to the second turn 544 of the second measuring coil. The turns of the measuring coils proceed around the substrate in this order, wherein the turns or loops of the first measuring coil 202 follow or are adjacent to the turns or loops of the second measuring coil 204. Providing the turns in this adjacent, staggered manner improves the coil's suppression capability because they follow similar paths around the conductor.

[0099] Alternatively, the first turn of the first measuring coil 202 may be located adjacent to the second turn of the first measuring coil 202. The second turn of the first measuring coil may be adjacent to the first turn of the second measuring coil 204, which in turn is adjacent to the second turn of the second measuring coil 204. This pattern may be repeated around the substrate. The coils may also be arranged such that 3, 4, 5, 6, or more turns of each coil are adjacent to each other, followed by the same number of adjacent turns of another coil.

[0100] As shown in Figure 5, the turns or loops of the first measuring coil 202 and the second measuring coil 204 are arranged in adjacent radial planes, rather than in the same radial plane. By doing so, the measuring conductor of one coil is not in the same plane as the measuring conductor of the other coil. If an external noise source is located above the substrate 302, both the first measuring coil 202 and the second measuring coil will experience nearly identical capacitive coupling from that noise source, resulting in the same or similar noise in each coil. This achieves noise cancellation at the differential output.

[0101] If the measuring conductor of the first measuring coil 202 is located in the same plane as the measuring conductor of the second measuring coil 204, the measuring conductor of the first measuring coil 202 may block or reduce the capacitive coupling of the noise to the conductor of the second measuring coil 204. This will result in different capacitive noise coupling into the two coils, so the noise will not cancel out. Positioning these turns close to each other, such that they are in separate or independent planes, provides more uniform or equal capacitive coupling to the two measuring coils.

[0102] Although the turns of the first measuring coil 202 and the second measuring coil 204 have been described in conjunction with Figure 5 as being positioned in an adjacent radial plane, it should be understood that this can be applied to any measuring coil implementation or layout described in this specification.

[0103] The measuring coils can also be arranged on multiple PCBs or substrates, allowing them to be separated for inserting conductors and then reassembled to form coils again. For example, one substrate may contain a 180-degree version of the first measuring coil 202 and the second measuring coil, starting from a common reference and ending at two outputs on that board. The first substrate can then be attached to the second substrate via connectors or spring probes. Thus, only two connections are required between the substrates. The second substrate may include a further 180-degree extension of the first measuring coil 202 and the second measuring coil 204, where the first measuring coil 202 and the second measuring coil 204 begin at two endpoints or outputs on the first board and end at two endpoints on the second board. The endpoints or outputs on the second board provide a signal containing the sum of signals picked up on the first and second boards. The first or second substrate may include amplifiers or processing circuitry coupled to the first and second measuring coils. This split coil arrangement can be applied to any current sensor described in this specification.

[0104] This arrangement allows for the use of clamp-on type coils, which exhibit the same characteristics as a full 360-degree coil regarding external field suppression and electrostatic coupling. This can be further improved by stacking four plates, where plates 1 and 4 sandwich plates 2 and 3, such that their average value relative to the vertical magnetic field is the same as the average value of the other two plates. This also helps to make the stack robust to conductor tilt. In arrangements with multiple plates, it is necessary to cascade these conductors downwards along the stack so that they are all in series, allowing the output to be the sum of plates 1+2+3+4. Therefore, it is necessary to combine the base plates or boards such that plates 1 and 2 are in series and plates 3 and 4 are in series. These plates are then coupled in parallel, such that the output is the average value of plates 1+2 plus the average value of plates 3+4.

[0105] The first turn or first loop of the first current measuring coil 202 and the second turn or second loop of the first current measuring coil 202 are coupled together at the third plurality of through holes 320 on the outer circumference of the first measuring coil 202.

[0106] like Figures 5a to 5c As shown, the first measuring coil is disposed across the first and third layers of the substrate, while the second measuring coil is disposed across the second and fourth layers of the substrate. However, it should be understood that each measuring coil may be disposed across more than two layers of the substrate. The layers mentioned herein may refer to the order in which the layers are disposed on the substrate, such that the first layer may be the top of four layers, the second layer is below the first layer, the third layer is below the second layer, and the fourth layer is below the third layer. Other layers may be disposed around, on top of, below, or between the mentioned layers.

[0107] For example, instead of the arrangement shown in Figure 5, the first measuring coil can be positioned across the first and fourth layers, and the second measuring coil can be positioned across the second and third layers. This may result in a slight imbalance between the first and second measuring coils because the distance between the first and fourth layers is greater than the distance between the second and third layers. This means that the loop area of ​​the first measuring coil is greater than the loop area of ​​the second measuring coil. This arrangement can be used when the impact of the imbalance in the loop area is limited.

[0108] Alternatively, each measuring coil can be arranged alternately across all four layers. For example, a first plurality of loops or turns of the first measuring coil can be arranged on two of the four layers (e.g., layers 1-3, layers 2-4, layers 1-4, or layers 2-3), and a second plurality of loops or turns of the first measuring coil can be arranged on the other two layers where the first plurality of loops are not arranged (e.g., layers 1-3, layers 2-4, layers 1-4, layers 2-3). The pattern formed by this alternating arrangement can be arranged as a repeating pattern. For example, the pattern or layout can be repeated once per turn. For example, each turn of the first plurality of turns can be followed by a turn of the second plurality of turns. Alternatively, multiple turns of the first plurality of turns can be followed by multiple turns of the second plurality of turns.

[0109] The second measuring coil can be configured accordingly. Alternating turns in this manner ensure that each coil diffuses across all four layers of the substrate. If the conductor sensed by the current sensor travels parallel to the substrate surface before traversing the path of the current sensor, the coupling entering the two coils will be identical because, on average, the coils occupy the same proportion of each layer of the substrate. This ensures matched electrostatic coupling. Furthermore, for non-constant magnetic field noise sources, the distance from the noise source to both the first and second measuring coils will be the same.

[0110] As described above, alternating the layers where the coils are located can be applied to any coil layout described in this specification.

[0111] Figures 3 to 5c A current sensor is illustrated in which the circumferential advancement or propulsion of the measuring coil, adjacent to a second plurality of vias, occurs at the outer circumference of the measuring conductor. However, circumferential advancement can occur at various locations of the measuring coil. For example, the circumferentially advancing conductor can be positioned adjacent to the inner circumference of the measuring coil (adjacent to the first and second plurality of vias), adjacent to the outer circumference of the measuring coil (adjacent to the third and fourth plurality of vias), or between the inner and outer circumferences.

[0112] Proximity to the inner circumference may mean that these circumferentially advancing conductors are closer to the inner circumference than to the outer circumference. Similarly, proximity to the outer circumference may mean that these circumferentially advancing conductors are closer to the outer circumference than to the inner circumference. The position between the inner and outer circumferences may mean that these circumferentially advancing conductors are equidistant from both the inner and outer circumferences.

[0113] Figures 6a to 6c A simplified sub-section of the measuring coil is shown, wherein circumferential advancement occurs near the first plurality of through-holes 304 at the inner circumference. Figure 6a A simplified subsection of the conductive trace of the first measuring coil 202 is shown. Figure 6b A simplified sub-section of the conductive trace of the second measuring coil 202 is shown. Figure 6c Simplified sub-segments of the conductive traces of both the first current measuring coil 202 and the second current measuring coil 204 are shown, arranged in an interleaved manner to form a differential current sensor. Illustrations are provided in the figures, where conductors on different layers of the substrate are represented using different line types. Figures 3 to 5c The teaching content is equally applicable Figures 6a to 6c The measuring coil is shown, therefore, it will not be repeated in detail here.

[0114] Figure 6a A subsection of a first current measuring coil implemented on the first layer and the third layer of a substrate is shown.

[0115] The first turn or first loop of the first current measuring coil 202 includes a measuring conductor 602 among a third plurality of measuring conductors 320 formed on a third layer of the substrate, and a measuring conductor 604 among a first plurality of measuring conductors 304 formed on a first layer of the substrate. The measuring conductors 602 and 604 are coupled at the second end of the measuring conductor (away from the end of the hole, path, or current-carrying conductor) through a via 606 in a third plurality of vias 320 located on the outer circumference of the measuring coil.

[0116] The second turn or second loop of the first current measuring coil 202 includes a measuring conductor 608 among a third plurality of measuring conductors 320 formed on a third layer of substrate 302, and a measuring conductor 610 among a first plurality of measuring conductors 304 formed on a first layer of substrate 302. The measuring conductors 608 and 610 are coupled at the second end of the measuring conductor (away from the end of the hole, path, or current-carrying conductor) through a via 612 in a third plurality of vias 320 located on the outer circumference of the measuring coil.

[0117] At the inner circumference, a plurality of circumferential advancing elements or conductors 318 are used to provide circumferential advancement of the first measuring coil 202, which connect the measuring conductor to corresponding through-holes in a plurality of first through-holes 304 located at the inner circumference of the measuring coil. These circumferential advancing conductors 318 allow the measuring coil to advance from a first end of the current measuring coil to a second end of the current measuring coil.

[0118] The first turn or first loop of the first current measuring coil 202 and the second turn or second loop of the first current measuring coil 202 are coupled together at the first plurality of through holes 304 on the inner circumference of the measuring coil.

[0119] The measuring conductor 604 is coupled to a via 614 in one of the first plurality of vias 304 using a first forward conductor 616. The via 614 is coupled to the measuring conductor 608 via a second forward conductor 618.

[0120] Figure 6b A subsection of the second current measuring coil implemented on the second layer and the fourth layer of the substrate is shown.

[0121] The first turn or first loop of the second current measuring coil 204 includes a conductor 620 among a second plurality of measuring conductors 306 formed on a second layer of the substrate, and a measuring conductor 622 among a fourth plurality of measuring conductors 322 formed on a fourth layer of the substrate. The measuring conductors 620 and 622 are coupled at the second end of the measuring conductor (away from the end of the hole, path, or current-carrying conductor) through a via 624 among a fourth plurality of vias 322 located on the outer circumference of the measuring coil.

[0122] The second turn or second loop of the second current measuring coil 202 includes a measuring conductor 626 among a second plurality of measuring conductors 306 formed on a second layer of the substrate, and a measuring conductor 628 among a fourth plurality of measuring conductors formed on a fourth layer of the substrate. The measuring conductors 626 and 628 are coupled at their second ends (away from the end of the hole, path, or current-carrying conductor) through a via 630 among a fourth plurality of vias 322 located on the outer circumference of the measuring coil.

[0123] The first turn or first loop of the second current measuring coil 204 and the second turn or second loop of the second current measuring coil 204 are coupled together at the second plurality of through holes 306 on the inner circumference of the measuring coil.

[0124] The measuring conductor 622 is coupled to a via 632 in a second plurality of vias 306 using a first forward conductor 634. The via 632 is coupled to the measuring conductor 626 via a second forward conductor 636.

[0125] Figure 6c A subsection of a current sensor including both a first measuring coil 202 and a second measuring coil 204 is shown, wherein the first measuring coil is implemented on the first and third layers of the substrate, and the second measuring coil is implemented on the second and fourth layers of the substrate.

[0126] The first turn 638 of the first measuring coil 202 is located adjacent to the first turn 640 of the second measuring coil. The second turn 642 of the first measuring coil 202 is located adjacent to the second turn 644 of the second measuring coil. The turns of the measuring coils advance around the substrate in this order, wherein the turns or loops of the first measuring coil 202 are followed by or adjacent to the turns or loops of the second measuring coil 204.

[0127] exist Figures 6a to 6c In the current sensor, a circumferential conductor located on the inner circumference of the measuring coil, adjacent to a first plurality of vias and a second plurality of vias, is used to provide circumferential advance. The advance region is closer to the first plurality of vias 304 and the second plurality of vias 306 than to the third plurality of vias 320 and the fourth plurality of vias 322, such that the advance region is closer to or adjacent to the inner circumference of the measuring coil than to the outer circumference of the measuring coil. More specifically, the circumferential advance conductor can be directly coupled to the inner circumferential vias 302 and 306.

[0128] Providing advance or circumferential advancement of the first measuring coil 202 and the second measuring coil 204 at the inner circumference of the measuring coil reduces the length of the circumferential loop formed by the circumferential conductor. Compared to current sensors where circumferential advancement occurs at the outer circumference of the substrate, adjacent to the location of the second plurality of vias, reducing the size of the circumferential loop reduces the common-mode signal coupled into the first measuring coil 202 and the second measuring coil 204 by the external lateral field. This reduces noise coupled into the system, thereby improving the signal-to-noise ratio (SNR).

[0129] Figures 7a to 7c A simplified sub-section of the measuring coil is shown, wherein circumferential advance occurs at a partial, half-stroke, or central position between the first plurality of vias 304 and the second plurality of vias 306. Figure 7a A simplified subsection of the conductive trace of the first measuring coil 202 is shown. Figure 7b A simplified sub-section of the conductive trace of the second measuring coil 202 is shown. Figure 7c Simplified sub-segments of the conductive traces of both the first current measuring coil 202 and the second current measuring coil 204 are shown, arranged in an interleaved manner to form a differential current sensor. Illustrations are provided in the figures, where conductors on different layers of the substrate are represented using different line types.

[0130] Figure 7aA subsection of a first current measuring coil implemented on the first layer and the third layer of a substrate is shown.

[0131] The first turn or first loop of the first current measuring coil 202 includes a measuring conductor 702 and a measuring conductor 704, one of a first plurality of measuring conductors formed on a first layer of a substrate. The measuring conductor 702 is coupled to the measuring conductor 704 via a first forward-facing conductor 706. The first turn or first loop also includes a measuring conductor 708 and a measuring conductor 710, one of a third plurality of measuring conductors 314. The measuring conductor 704 is coupled to the measuring conductor 708 via a second forward-facing conductor 710. The measuring conductor 704 is coupled to the measuring conductor 708 using a via 714, one of a first plurality of vias 304. This first turn of the first measuring coil is coupled to a second turn using a via 716, one of a third plurality of vias 320.

[0132] Figure 7b A subsection of the second current measuring coil implemented on the second layer and the fourth layer of the substrate is shown.

[0133] The first turn or first loop of the second current measuring coil 202 includes a measuring conductor 718 and a measuring conductor 620 among a fourth plurality of measuring conductors 716 formed on a fourth layer of the substrate. The measuring conductor 718 is coupled to the measuring conductor 720 via a first forward-facing conductor 722. The first turn or first loop also includes a measuring conductor 724 and a measuring conductor 726 among a second plurality of measuring conductors 312. The measuring conductor 724 is coupled to the measuring conductor 726 via a second forward-facing conductor 728. The measuring conductor 720 is coupled to the measuring conductor 724 via a via 730 among a second plurality of vias 306. This first turn of the first measuring coil is coupled to the second turn via a via 732 among a fourth plurality of vias 322.

[0134] Figure 7c A subsection of a current sensor including both a first measuring coil 202 and a second measuring coil 204 is shown, wherein the first measuring coil is implemented on the first and third layers of the substrate, and the second measuring coil is implemented on the second and fourth layers of the substrate.

[0135] The first turn 738 of the first measuring coil 202 is located adjacent to the first turn 740 of the second measuring coil. The second turn 742 of the first measuring coil 202 is located adjacent to the second turn 744 of the second measuring coil. The turns of the measuring coils advance around the substrate in this order, wherein the turns or loops of the first measuring coil 202 are followed by or adjacent to the turns or loops of the second measuring coil 204.

[0136] exist Figures 7a to 7cIn the current sensor, a circumferential conductor located between the first / second plurality of vias and the third / fourth plurality of vias is used to provide circumferential advance. The advance region can be located at the center between the circumference of the inner via and the circumference of the outer via. In other words, an advance region can be provided such that the circumferential advance conductor is coupled to the radial measuring conductor at both ends of the circumferential advance conductor.

[0137] Figures 5a to 7c The substrate or PCB implementation of the current measuring coils shown depicts the turns of the first measuring coil 202 and the second measuring coil 204 as being adjacent to each other.

[0138] Figures 5a to 7c A measuring coil is shown, comprising circumferentially advancing conductors that provide coil propulsion. These circumferentially advancing conductors... Figures 5a to 5c The middle is located at the outer circumference, in Figures 6a to 6c The center is located at the inner circumference, and... Figures 7a to 7c The measuring coil is located between the inner and outer circumferences. However, the measuring coil may include a circumferential advancing conductor providing coil advance at locations at the inner circumference, the outer circumference, and combinations thereof. For example, the measuring coil may include circumferential advance or advancement at both the outer and inner circumferences, wherein the measuring conductor is coupled to the circumferential advancing conductor at both ends, rather than just at a single end.

[0139] Although Figures 5a to 7c A measuring coil is shown comprising a radially extending measuring conductor and a circumferential advancing conductor that provides coil propulsion; however, these conductors can alternatively be combined into a single conductor providing both radial and circumferential advance. These combined conductors allow only two conductors to be required per turn of the current measuring coil.

[0140] Figures 8a to 8c A simplified subsection of the measuring coil is shown, in which a measuring conductor is used to generate circumferential advance, such that the measuring conductor provides both radial and circumferential advance. Figure 8a A simplified subsection of the conductive trace of the first measuring coil 202 is shown. Figure 8b A simplified sub-section of the conductive trace of the second measuring coil 202 is shown. Figure 8c Simplified sub-segments of the conductive traces of both the first current measuring coil 202 and the second current measuring coil 204 are shown, arranged in an interleaved manner to form a differential current sensor. Illustrations are provided in the figures, where conductors on different layers of the substrate are represented using different line types.

[0141] Figure 8a A subsection of a first current measuring coil implemented on the first layer and the third layer of a substrate is shown.

[0142] The first turn or first loop of the first current measuring coil 202 includes a measuring conductor 802 of a first plurality of measuring conductors formed on a first layer of the substrate, and a measuring conductor 804 of a third plurality of measuring conductors formed on a third layer of the substrate. The measuring conductors 802 and 804 are coupled at the first end of the measuring conductors (closer to the end of the hole, path, or current-carrying conductor) through a via 806 of a first plurality of vias 304 located on the inner circumference of the measuring coil.

[0143] The second turn or second loop of the first current measuring coil 202 includes a measuring conductor 810 of a first plurality of measuring conductors formed on a first layer of the substrate, and a measuring conductor 812 of a third plurality of measuring conductors formed on a third layer of the substrate. The measuring conductors 810 and 812 are coupled at a first end of the measuring conductor (closer to the end of the hole, path, or current-carrying conductor) through a via 814 of a first plurality of vias 304 located on the inner circumference of the measuring coil.

[0144] The two turns of the measuring coil are coupled to each other at the via 808 in the third plurality of vias 320 on the outer circumference of the substrate.

[0145] Figure 8b A subsection of the second current measuring coil implemented on the second layer and the fourth layer of the substrate is shown.

[0146] The first turn or first loop of the first current measuring coil 202 includes a measuring conductor 816 of a fourth plurality of measuring conductors formed on a fourth layer of the substrate, and a measuring conductor 818 of a second plurality of measuring conductors formed on a second layer of the substrate. The measuring conductors 816 and 818 are coupled at a first end of the measuring conductor (closer to the end of the hole, path, or current-carrying conductor) through a via 820 of a second plurality of vias 306 located on the inner circumference of the measuring coil.

[0147] The second turn or second loop of the first current measuring coil 202 includes a measuring conductor 824 of a fourth plurality of measuring conductors formed on a fourth layer of the substrate, and a measuring conductor 826 of a second plurality of measuring conductors formed on a second layer of the substrate. The measuring conductors 824 and 826 are coupled at a first end of the measuring conductor (closer to the end of the hole, path, or current-carrying conductor) through a via 828 of a second plurality of vias 306 located on the inner circumference of the measuring coil.

[0148] The two turns of the second measuring coil 204 are coupled to each other at the through hole 822 in the fourth plurality of through holes 322 on the outer circumference of the measuring coil.

[0149] Figure 8cA subsection of a current sensor including both a first measuring coil 202 and a second measuring coil 204 is shown, wherein the first measuring coil is implemented on the first and third layers of the substrate, and the second measuring coil is implemented on the second and fourth layers of the substrate.

[0150] The first turn 830 of the first measuring coil 202 is located adjacent to the first turn 640 of the second measuring coil. The second turn 642 of the first measuring coil 202 is located adjacent to the second turn 644 of the second measuring coil. The turns of the measuring coils advance around the substrate in this order, wherein the turns or loops of the first measuring coil 202 are followed by or adjacent to the turns or loops of the second measuring coil 204.

[0151] Figures 8a to 8c The measuring conductor used in the current measuring coil does not extend through the substrate in a radial plane, but rather at a non-zero angle relative to the radial plane from the center of the measuring coil. For example, the measuring conductor is positioned at an angle between 5 and 45 degrees relative to the radial plane, such as 20, 25, or 30 degrees relative to the radial plane. In this way, both the radial advance of the loop or turns forming the current measuring coil and the circumferential advance of the measuring coil are provided using a single set of measuring conductors.

[0152] Figures 5a to 8c Each turn of the illustrated measurement coil includes a single via in a first plurality of vias and a single via in a third plurality of vias, or a single via in a second plurality of vias and a single via in a fourth plurality of vias. This provides an efficient measurement coil layout with a minimum number of vias required per turn (two vias). This simplifies the fabrication of the current sensor and provides higher measurement coil gain per unit substrate or printed circuit board area. Furthermore, all portions of the measurement conductor in the measurement coil contribute to the additional measurement coil sensitivity, without any portion of the measurement conductor attenuating the current sensor's output signal.

[0153] It should be understood that the inner and outer vias may not be precisely located on the circumference—alternating pairs of vias can be staggered to accommodate a closer arrangement, or they may not be precisely located on the circumference to accommodate other components or coils or to meet mechanical constraints.

[0154] Figure 9 A plan view or cross-sectional view of the stacked structure or layer sequence of substrate 900 is shown. The aforementioned current sensor is implemented across four layers of the substrate. Substrate 900 can be used in a current measuring coil according to any of the foregoing figures.

[0155] The substrate 900 includes a first layer 902, a second layer 904, a third layer 906, and a fourth layer 908 arranged sequentially on the substrate, such that layers 1-4 are arranged in a direction perpendicular to the surface of the substrate 900. The first layer 902 and the second layer 904 are spaced apart by a first distance 910. The second layer 904 and the third layer 906 are spaced apart by a second distance 912. The third layer 906 and the fourth layer 908 are spaced apart by a third distance 914.

[0156] The first distance 910 and the third distance 914 are essentially the same. For example, the first distance 910 and the third distance 914 can be 0.1 mm. Alternatively, the first distance 910 and the third distance 914 can be 0.2 mm, 0.3 mm, etc. The second distance 912 is greater than the first distance 910 and the third distance 914. For example, the second distance can be 1.7 mm, or alternatively, it can be 1.5 mm, 2 mm, or 1-2 mm. Therefore, the distance between the first layer and the second layer is less than the distance between the second layer and the third layer; and the distance between the third layer and the fourth layer is less than the distance between the second layer and the third layer. This distance between the layers of the substrate can be determined based on the manufacturing process.

[0157] The first measuring coil is implemented on the first layer 902 and the third layer 906, and the second measuring coil is implemented on the second layer 904 and the fourth layer 908, ensuring that the radial loop area of ​​the first measuring coil or the area enclosed by the turns of the first measuring coil is equal to the area enclosed by the turns of the second measuring coil.

[0158] Furthermore, this ensures that almost the entire substrate thickness is used for the radial turns of both the first measuring coil 202 and the second measuring coil 204. This maximizes the average radial loop area, thereby maximizing the voltage induced in the loop for a given substrate thickness.

[0159] Furthermore, the distance between the average positions of the radial loops of the first measuring coil 202 and the second measuring coil 204 is minimized, such that the average distance between the radial loops is equal to either the first distance 910 or the third distance 914. This ensures that even in the presence of a non-uniform magnetic field, the voltage induced in the large circumferential loop formed by the circumferentially advancing conductor in the advancing region of the first measuring coil 202 and the second measuring coil 204 due to the external transverse alternating magnetic field is very close to equal. The electrostatic coupling from nearby conductors (located above or below the substrate and having a potential difference) to the first and second measuring coils will also be very close to equal for both coils.

[0160] Although substrate 302 is described as having four layers, the substrate may have four or more layers, with the current sensor implemented across all four layers of substrate 302. For example, in a 6-layer board, the current sensor may be implemented on layers 2 and 4, and layers 3 and 5, while layers 1 and 6 provide power and ground wiring or are used by components. Layers 1 and 6 may alternatively or additionally carry current into the center of the coil and guide it through power vias to conductors extending from the other side, this process being performed once or multiple times to provide multiple primary windings. Layers 1 and 6 may alternatively or additionally include electrostatic shielding, for example, they may include a ground plane spanning the layers. The ground plane may be a copper plating layer of the substrate. This provides the current-carrying conductor 212 for PCB implementation.

[0161] Figure 10 A current sensor including a capacitor is shown. Figure 10 The capacitors can be implemented in any of the aforementioned current sensors or current measuring coils. A first capacitor 1002 is coupled between the first terminal 206 of the first measuring coil 202 and ground or a reference voltage. A second capacitor 1004 is coupled between the first terminal 206 of the first measuring coil 202 and the first terminal 208 of the second measuring coil 204. A third capacitor 1006 is coupled between the first terminal 208 of the second measuring coil 204 and ground or a reference voltage. The first capacitor 1002, the second capacitor 1004, and the third capacitor 1006 can be disposed adjacent to the measuring coil on the substrate 302 of the current sensor. The capacitors serve to provide both common-mode filtering and differential-mode filtering, while also removing high-frequency signals, which may be relatively large because the voltage across the sensing coil of the measuring coil is proportional to the frequency.

[0162] Figure 10 The capacitors are particularly useful for the previously described measuring coils. Due to the large circumferential loop formed by the circumferentially advancing conductor in the propulsion region, the measuring coil generates a large common-mode signal proportional to the frequency. This can be a significant antenna for RF signals. Capacitors 1002 and 1006, coupled between the first measuring coil 202 and the second measuring coil 204 and ground, serve to provide low impedance at high frequencies to shunt this common-mode signal. Capacitor 1004 serves to filter out any differential signals remaining due to coupling or component mismatch. The coils provide resistance and inductance to form a filter together with the components. Other filtering methods may also be used.

[0163] The capacitor 1004 coupled between the first measuring coil 202 and the second measuring coil 204 serves to filter the differential signal, while ensuring that: although the induced differential noise signal has frequency-proportional characteristics, the differential mode gain will not continue to increase at frequencies higher than the cutoff frequency formed by the combination of the capacitor and coil resistance.

[0164] The current sensors described throughout this specification can be coupled to or constitute part of a larger processing system.

[0165] Figure 11 A current sensor is shown, comprising a first current measuring coil 202 and a second current measuring coil 204 and coupled to system 1102. A first output terminal 216 and a second output terminal 218 are coupled to differential inputs 1104 and 1106 of processing system 1102.

[0166] System 1102 may include processing circuitry configured to receive the output of a current sensor and determine the current (the measured current through a current-carrying conductor) measured by the current measuring coil. Since the current measuring coil measures the rate of change of current di / dt, the system may include an integrator, such as a low-pass filter, configured to integrate the output of the current measuring coil. System 1102 may also include a differential amplifier. The differential amplifier may amplify the output of the current measuring coils 202, 204 and remove any common-mode noise coupled into the current measuring coils. System 1002 may additionally or alternatively include an analog-to-digital converter (ADC) coupled to the output of the current measuring coils 202, 204.

[0167] In addition to providing current measurement, the processing system 1102 can also function as a utility meter or power meter. The processing system 1102 can receive voltage measurement signals 1102 and determine power or energy consumption based on the received voltage and the determined current. The voltage measurement can be provided by any suitable sensor, such as a shunt resistor. The processing system can additionally or alternatively function as or include a circuit breaker system.

[0168] Various modifications can be made to the above examples to provide further examples, whether by adding, deleting, or replacing features, all of which are intended to be covered by the attached aspects.

[0169] aspect

[0170] The following are aspects of the first group of numbers:

[0171] 1. A current sensor formed on a substrate, the current sensor comprising:

[0172] A first measuring coil, the first measuring coil being disposed on the first layer and the third layer of the substrate; and

[0173] The second measuring coil is disposed on the second and fourth layers of the substrate.

[0174] 2. The current sensor according to aspect 1, wherein the first layer, the second layer, the third layer and the fourth layer are disposed sequentially on the substrate.

[0175] 3. The current sensor according to aspect 1 or aspect 2, wherein the distance between the first layer and the second layer is less than the distance between the second layer and the third layer; and

[0176] The distance between the third layer and the fourth layer is less than the distance between the second layer and the third layer.

[0177] 4. The current sensor according to any of the foregoing aspects, wherein the substrate comprises:

[0178] The first plurality of measuring conductors arranged on the first layer;

[0179] A second plurality of measuring conductors arranged on the second layer;

[0180] The third plurality of measuring conductors are arranged on the third layer; and

[0181] The fourth plurality of measuring conductors are arranged on the fourth layer.

[0182] The first measuring coil includes the first plurality of measuring conductors and the third plurality of measuring conductors, and

[0183] The second measuring coil includes the second plurality of measuring conductors and the fourth plurality of measuring conductors.

[0184] 5. The current sensor according to aspect 4, wherein the substrate includes a first plurality of through holes arranged around the inner circumference of the first coil, a second plurality of through holes arranged around the inner circumference of the second coil, a third plurality of through holes arranged around the outer circumference of the first coil, and a fourth plurality of through holes arranged around the outer circumference of the second coil.

[0185] 6. The current sensor according to aspect 5, wherein:

[0186] The first plurality of measuring conductors and the third plurality of measuring conductors are coupled through corresponding through-holes in the first plurality of through-holes and the third plurality of through-holes to form the first measuring coil; and

[0187] The second plurality of measuring conductors and the fourth plurality of measuring conductors are coupled through corresponding through holes in the second plurality of through holes and the fourth plurality of through holes to form the second measuring coil.

[0188] 7. The current sensor according to aspect 6, wherein:

[0189] The measuring conductor extends radially from the center of the current sensor; and

[0190] The substrate also includes a plurality of circumferential advance conductors arranged to provide circumferential advance of the first measuring coil and the second measuring coil.

[0191] 8. The current sensor according to aspect 7, wherein the circumferential propulsion conductor is arranged according to at least one of the following:

[0192] Adjacent to the first plurality of through holes and the second plurality of through holes;

[0193] Adjacent to the third plurality of through holes and the fourth plurality of through holes;

[0194] The position is located between the first plurality of through holes and the second plurality of through holes and the third plurality of through holes and the fourth plurality of through holes.

[0195] 9. The current sensor according to any one of aspects 1 to 6, wherein the measuring conductor is arranged at an angle relative to the radial direction of the first measuring coil and the second measuring coil, such that the measuring conductor provides radial and circumferential advance around the substrate.

[0196] 10. The current sensor according to any of the foregoing aspects, wherein the substrate includes a path for a current-carrying conductor, and

[0197] The first measuring coil and the second measuring coil are arranged circumferentially around the path.

[0198] 11. The current sensor according to any of the foregoing aspects, wherein:

[0199] The first measuring coil has a first end and a second end;

[0200] The second measuring coil has a first end and a second end.

[0201] 12. The current sensor according to aspect 11, wherein the first measuring coil includes a first plurality of loops, and the second measuring coil includes a second plurality of loops.

[0202] 13. The current sensor according to aspect 12, wherein the first measuring coil and the second measuring coil are arranged relative to each other such that a corresponding loop in the first plurality of loops is adjacent to a corresponding loop in the second plurality of loops in a circumferential direction around the path for the current-carrying conductor.

[0203] 14. The current sensor according to aspect 11, wherein:

[0204] Each of the first plurality of loops of the first measuring coil is wound clockwise starting from the first end of the first measuring coil; and

[0205] Each of the plurality of loops of the second measuring coil is wound in a counterclockwise direction starting from the first end of the second measuring coil.

[0206] 15. The current sensor according to any one of aspects 11 to 14, wherein the second end of the first measuring coil is coupled to the second end of the second measuring coil and is configured to be coupled to a reference voltage.

[0207] 16. The current sensor according to any one of aspects 11 to 15, wherein the first end of the first measuring coil and the first end of the second measuring coil are configured to be coupled to a differential signal processing circuit.

[0208] 17. A current sensor, the current sensor comprising:

[0209] A substrate, the substrate including paths for current-carrying conductors;

[0210] A first measuring coil is formed on the substrate and arranged to advance circumferentially around the path for the current-carrying conductor, wherein the first measuring coil includes a first plurality of loops;

[0211] A second measuring coil is arranged to advance circumferentially around the path for the current-carrying conductor, wherein the second measuring coil includes a second plurality of loops;

[0212] The first measuring coil and the second measuring coil are arranged relative to each other such that a corresponding loop in the first plurality of loops is adjacent to a corresponding loop in the second plurality of loops in the circumferential direction surrounding the path for the current-carrying conductor.

[0213] 18. The current sensor according to aspect 17, wherein each corresponding loop in the first plurality of loops is not aligned with each corresponding loop in the second plurality of loops in a direction perpendicular to the substrate.

[0214] 19. The current sensor according to aspect 17 or aspect 18, wherein:

[0215] The first measuring coil has a first end and a second end; and

[0216] The second measuring coil has a first end and a second end.

[0217] 20. The current sensor according to aspect 19, wherein:

[0218] Each of the plurality of loops of the first measuring coil is wound clockwise starting from the first end of the first measuring coil; and

[0219] Each of the plurality of loops of the second measuring coil is wound in a counterclockwise direction starting from the first end of the second measuring coil.

[0220] 21. The current sensor according to aspect 19 or 20, wherein the second end of the first measuring coil is coupled to the second end of the second measuring coil and is configured to be coupled to a reference voltage.

[0221] 22. The current sensor according to any one of aspects 19 to 21, wherein the first end of the first measuring coil and the first end of the second measuring coil are used for coupling to a signal processing circuit.

[0222] 23. A current sensor according to any one of aspects 17 to 22, wherein the first measuring coil includes a first plurality of measuring conductors formed on the substrate to extend radially from the path for the current-carrying conductor, and

[0223] The second measuring coil includes a second plurality of measuring conductors formed on the substrate to extend radially from the path used for the current-carrying conductor.

[0224] 24. The current sensor according to aspect 23, wherein the first plurality of measuring conductors and the second plurality of measuring conductors do not overlap in a direction perpendicular to the surface of the substrate.

[0225] 25. A current sensor, the current sensor comprising:

[0226] A first measuring coil, the first measuring coil having a first end and a second end;

[0227] A second measuring coil, the second measuring coil having a first end and a second end;

[0228] The second end of the first measuring coil is coupled to the second end of the second measuring coil and is configured to be coupled to a reference voltage.

[0229] 26. The current sensor according to aspect 25, wherein:

[0230] The first end of the first measuring coil is coupled to the first output terminal of the current sensor; and

[0231] The first end of the second measuring coil is configured to be coupled to the second output terminal of the current sensor.

[0232] 27. The current sensor according to aspect 26, wherein the first output terminal and the second output terminal are used for coupling to a differential signal processing circuit.

[0233] 28. The current sensor according to any one of aspects 25 to 27, wherein the second end of the first measuring coil and the second end of the second measuring coil are coupled to a reference terminal of the current sensor.

[0234] 29. The current sensor according to aspect 28, wherein the reference terminal is used for coupling to a reference voltage source.

[0235] 30. The current sensor according to any one of aspects 25 to 29, wherein the current sensor comprises:

[0236] A first capacitor is coupled between the first terminal of the first measuring coil and ground;

[0237] A second capacitor, coupled between the first end of the first measuring coil and the first end of the second measuring coil; and

[0238] A third capacitor is coupled between the first end of the second measuring coil and ground.

[0239] 31. The current sensor according to any one of aspects 25 to 30, wherein the current sensor further comprises a path for a current-carrying conductor, the path being positioned at the center of the first measuring coil and the second measuring coil.

[0240] The following are aspects of the second group of numbers:

[0241] 1. A current sensor, the current sensor comprising:

[0242] A substrate, the substrate comprising a first layer, a second layer, a third layer and a fourth layer;

[0243] A first measuring coil is formed on the first layer and the third layer of the substrate; and

[0244] A second measuring coil is formed on the second and fourth layers of the substrate.

[0245] 2. The current sensor according to aspect 1, wherein the second layer is positioned between the first layer and the third layer, and the third layer is positioned between the second layer and the fourth layer.

[0246] 3. The current sensor according to aspect 1 or aspect 2, wherein the distance between the first layer and the second layer is less than the distance between the second layer and the third layer; and

[0247] The distance between the third layer and the fourth layer is less than the distance between the second layer and the third layer.

[0248] 4. The current sensor according to any of the foregoing aspects, wherein the substrate comprises:

[0249] The first plurality of measuring conductors arranged on the first layer;

[0250] A second plurality of measuring conductors arranged on the second layer;

[0251] The third plurality of measuring conductors are arranged on the third layer; and

[0252] The fourth plurality of measuring conductors are arranged on the fourth layer.

[0253] The first measuring coil includes the first plurality of measuring conductors and the third plurality of measuring conductors, and

[0254] The second measuring coil includes the second plurality of measuring conductors and the fourth plurality of measuring conductors.

[0255] 5. The current sensor according to aspect 4, wherein the current sensor comprises:

[0256] A plurality of through holes are formed in the substrate and arranged around the inner circumference of the first coil;

[0257] A second plurality of through holes are formed in the substrate and arranged around the inner circumference of the second coil;

[0258] A third plurality of vias are formed in the substrate and arranged around the outer circumference of the first coil; and

[0259] A fourth plurality of vias are formed in the substrate and arranged around the outer circumference of the second coil.

[0260] 6. The current sensor according to aspect 5, wherein:

[0261] The first plurality of measuring conductors and the third plurality of measuring conductors are coupled through corresponding through-holes in the first plurality of through-holes and the third plurality of through-holes to form the first measuring coil; and

[0262] The second plurality of measuring conductors and the fourth plurality of measuring conductors are coupled through corresponding through holes in the second plurality of through holes and the fourth plurality of through holes to form the second measuring coil.

[0263] 7. The current sensor according to aspect 6, wherein:

[0264] The measuring conductor extends substantially radially from the center of the current sensor; and

[0265] The current sensor also includes a plurality of circumferentially advancing conductors formed on the substrate and arranged to provide circumferential advance of the first measuring coil and the second measuring coil.

[0266] 8. The current sensor according to aspect 7, wherein the circumferentially advancing conductor is positioned on the substrate such that:

[0267] Adjacent to the first plurality of vias and the second plurality of vias; or

[0268] Adjacent to the third plurality of vias and the fourth plurality of vias; or

[0269] The position is located between the first plurality of through holes and the second plurality of through holes and the third plurality of through holes and the fourth plurality of through holes.

[0270] 9. The current sensor according to any one of aspects 1 to 6, wherein the measuring conductor is arranged at an angle relative to the radial direction of the first measuring coil and the second measuring coil, such that the measuring conductor provides radial and circumferential advance around the substrate.

[0271] 10. The current sensor according to any of the foregoing aspects, wherein the substrate includes a path for a current-carrying conductor, and

[0272] The first measuring coil and the second measuring coil are arranged circumferentially around the path.

[0273] 11. The current sensor according to any of the foregoing aspects, wherein:

[0274] The first measuring coil has a first end and a second end; and

[0275] The second measuring coil has a first end and a second end.

[0276] 12. The current sensor according to aspect 11, wherein the first measuring coil includes a first plurality of loops, and the second measuring coil includes a second plurality of loops.

[0277] 13. The current sensor according to aspect 11, wherein the first measuring coil and the second measuring coil are formed on the substrate such that the first plurality of loops of the first measuring coil are interleaved with the second plurality of loops of the second measuring coil in the circumferential direction.

[0278] 14. The current sensor according to aspect 12, wherein the first measuring coil and the second measuring coil are arranged relative to each other such that a corresponding loop in the first plurality of loops is adjacent to a corresponding loop in the second plurality of loops in a circumferential direction around the path for the current-carrying conductor.

[0279] 15. The current sensor according to aspect 12, wherein:

[0280] Each of the first plurality of loops of the first measuring coil is wound clockwise starting from the first end of the first measuring coil; and

[0281] Each of the second plurality of loops of the second measuring coil is wound in a counterclockwise direction starting from the first end of the second measuring coil.

[0282] 16. The current sensor according to any one of aspects 11 to 15, wherein:

[0283] The second end of the first measuring coil is coupled to the second end of the second measuring coil, and is adapted to be coupled to a reference voltage; and

[0284] The first end of the first measuring coil and the first end of the second measuring coil are adapted to be coupled to a differential signal processing circuit.

[0285] 17. A current sensor, the current sensor comprising:

[0286] A substrate, the substrate including paths for current-carrying conductors;

[0287] A first measuring coil, formed on the substrate and arranged circumferentially around the path for the current-carrying conductor, wherein the first measuring coil includes a first plurality of loops; and

[0288] A second measuring coil is formed on the substrate and arranged to advance circumferentially around the path for the current-carrying conductor, wherein the second measuring coil includes a second plurality of loops;

[0289] The first measuring coil and the second measuring coil are arranged relative to each other such that a corresponding loop in the first plurality of loops is adjacent to a corresponding loop in the second plurality of loops in the circumferential direction surrounding the path for the current-carrying conductor.

[0290] 18. The current sensor according to aspect 17, wherein each corresponding loop in the first plurality of loops is not aligned with each corresponding loop in the second plurality of loops in a direction perpendicular to the substrate.

[0291] 19. The current sensor according to aspect 17 or aspect 18, wherein:

[0292] The first measuring coil has a first end and a second end, and each of the plurality of loops of the first measuring coil is wound clockwise starting from the first end of the first measuring coil; and

[0293] The second measuring coil has a first end and a second end, and each of the plurality of loops of the second measuring coil is wound in a counterclockwise direction starting from the first end of the second measuring coil.

[0294] 20. The current sensor according to aspect 19, wherein the second end of the first measuring coil is coupled to the second end of the second measuring coil and is configured to be coupled to a reference voltage.

[0295] 21. The current sensor according to any one of aspects 19 to 20, wherein the first end of the first measuring coil and the first end of the second measuring coil are used for coupling to a signal processing circuit.

[0296] 22. A current sensor according to any one of aspects 17 to 21, wherein the first measuring coil includes a first plurality of measuring conductors formed on the substrate to extend radially from the path for the current-carrying conductor, and

[0297] The second measuring coil includes a second plurality of measuring conductors formed on the substrate to extend radially from the path used for the current-carrying conductor.

[0298] 23. The current sensor according to aspect 22, wherein the first plurality of measuring conductors and the second plurality of measuring conductors do not overlap in a direction perpendicular to the surface of the substrate.

[0299] 24. A current sensor, the current sensor comprising:

[0300] First output terminal;

[0301] Second output terminal;

[0302] A first measuring coil having a first end and a second end, wherein the first end of the first measuring coil is coupled to the first output terminal;

[0303] A second measuring coil having a first end and a second end, wherein the first end of the second measuring coil is coupled to the second output terminal;

[0304] The second end of the first measuring coil is coupled to the second end of the second measuring coil and is configured to be coupled to a reference voltage.

[0305] 25. The current sensor according to aspect 24, wherein:

[0306] The first output terminal and the second output terminal are used to couple to a differential signal processing circuit; and

[0307] The second end of the first measuring coil and the second end of the second measuring coil are coupled to the reference terminal of the current sensor, wherein the reference terminal is used to couple to a reference voltage source.

[0308] 26. A current measuring system, the current measuring system comprising:

[0309] The current sensor according to any of the foregoing aspects; and

[0310] A processing circuit is coupled to the current sensor and configured to determine the measured current.

[0311] 27. The current sensor according to any one of aspects 25 to 26, wherein the current sensor comprises:

[0312] A first capacitor is coupled between the first terminal of the first measuring coil and ground;

[0313] A second capacitor, coupled between the first end of the first measuring coil and the first end of the second measuring coil; and

[0314] A third capacitor is coupled between the first end of the second measuring coil and ground.

[0315] 28. A current sensor according to any one of aspects 25 to 27, wherein the current sensor further comprises a path for a current-carrying conductor, the path being positioned at the center of the first measuring coil and the second measuring coil.

[0316] 29. A current sensor, the current sensor comprising:

[0317] A substrate with four layers;

[0318] A first measuring coil formed on the four layers of the substrate, the first measuring coil including a first plurality of turns and a second plurality of turns,

[0319] The first plurality of turns of the first measuring coil are formed on two of the four layers of the substrate, and the second plurality of turns of the first measuring coil are formed on the other two of the four layers of the substrate.

[0320] 30. The current sensor according to aspect 29, further comprising:

[0321] A second measuring coil is formed on the four layers of the substrate, the second measuring coil including a first plurality of turns and a second plurality of turns.

[0322] The first plurality of turns of the second measuring coil are formed on two of the four layers of the substrate, and the second plurality of turns of the second measuring coil are formed on the other two of the four layers of the substrate.

[0323] 31. The current sensor according to aspect 29 or 30, wherein the first plurality of turns of the first measuring coil comprises the same number of turns as the second plurality of turns of the first measuring coil.

[0324] 32. The current sensor according to any one of aspects 29 to 31, wherein the first plurality of turns of the first measuring coil are formed across a first layer and a third layer of the substrate, and the second plurality of turns of the first measuring coil are formed across a second layer and a fourth layer of the substrate.

[0325] 33. The current sensor according to any one of aspects 29 to 31, wherein the first plurality of turns of the first measuring coil are formed across a first layer and a fourth layer of the substrate, and the second plurality of turns of the first measuring coil are formed across a second layer and a third layer of the substrate.

[0326] 34. The current sensor according to any one of aspects 29 to 33, wherein the first plurality of turns of the first measuring coil and the second plurality of turns of the first measuring coil are arranged in an alternating manner.

[0327] 35. The current sensor according to aspect 34, wherein each of the first plurality of turns of the first measuring coil is subsequently connected in the circumferential direction to a turn of the second plurality of turns of the first measuring coil.

[0328] 36. The current sensor according to aspect 34, wherein one or more turns of the first plurality of turns of the first measuring coil are followed by one or more turns of the second plurality of turns of the first measuring coil.

[0329] 37. The current sensor according to aspect 35, wherein the pattern formed by the first plurality of turns of the first measuring coil and the second plurality of turns of the first measuring coil repeats in a circumferential direction around the first measuring coil.

[0330] 38. A current sensor, the current sensor comprising:

[0331] Path for conductors;

[0332] First substrate;

[0333] A first portion of a first measuring coil formed on the first substrate;

[0334] A first portion of a second measuring coil formed on the first substrate;

[0335] Second substrate;

[0336] The second portion of the first measuring coil formed on the second substrate; and

[0337] The second portion of the second measuring coil formed on the second substrate.

[0338] 39. The current sensor according to aspect 38, wherein:

[0339] The first portion of the first measuring coil has a first end and a second end; and

[0340] The first portion of the second measuring coil has a first end and a second end;

[0341] The second portion of the first measuring coil has a first end and a second end; and

[0342] The second portion of the second measuring coil has a first end and a second end.

[0343] 40. The current sensor according to aspect 38 or 39, wherein:

[0344] The combination of the first portion of the first measuring coil and the second portion of the first measuring coil advances substantially around the path for the conductor in the circumferential direction;

[0345] The combination of the first portion of the second measuring coil and the second portion of the second measuring coil advances substantially around the path for the conductor in the circumferential direction.

[0346] 41. The current sensor according to any one of aspects 38 to 40, wherein:

[0347] The first portion of the first measuring coil and the first portion of the second measuring coil advance 180 degrees around the path used for the conductor; and

[0348] The second portion of the first measuring coil and the second portion of the second measuring coil advance 180 degrees around the path for the conductor.

[0349] 42. The current sensor according to any one of aspects 38 to 40, wherein:

[0350] The first portion of the first measuring coil and the first portion of the second measuring coil advance 270 degrees around the path for the conductor; and

[0351] The second portion of the first measuring coil and the second portion of the second measuring coil advance 90 degrees around the path for the conductor.

[0352] 43. The current sensor according to any one of aspects 38 to 42, wherein the second substrate includes processing circuitry coupled to the second portion of the first measuring coil and the second portion of the second measuring coil.

[0353] 44. The current sensor according to any one of aspects 38 to 43, wherein the first substrate and the second substrate are coupled to each other by means of a hinge.

Claims

1. A current sensor, the current sensor comprising: A substrate, the substrate comprising a first layer, a second layer, a third layer and a fourth layer; A first measuring coil is formed on the first layer and the third layer of the substrate; as well as A second measuring coil is formed on the second and fourth layers of the substrate.

2. The current sensor of claim 1, wherein the second layer is positioned between the first layer and the third layer, and the third layer is positioned between the second layer and the fourth layer.

3. The current sensor according to claim 1 or claim 2, wherein the distance between the first layer and the second layer is less than the distance between the second layer and the third layer; and The distance between the third layer and the fourth layer is less than the distance between the second layer and the third layer.

4. The current sensor according to any one of the preceding claims, wherein the substrate comprises: The first plurality of measuring conductors arranged on the first layer; A second plurality of measuring conductors arranged on the second layer; A third plurality of measuring conductors arranged on the third layer; as well as The fourth plurality of measuring conductors are arranged on the fourth layer. The first measuring coil includes the first plurality of measuring conductors and the third plurality of measuring conductors, and The second measuring coil includes the second plurality of measuring conductors and the fourth plurality of measuring conductors.

5. The current sensor according to claim 4, wherein the current sensor comprises: A plurality of through holes are formed in the substrate and arranged around the inner circumference of the first coil; A second plurality of through holes are formed in the substrate and arranged around the inner circumference of the second coil; A third plurality of through holes are formed in the substrate and arranged around the outer circumference of the first coil; as well as A fourth plurality of vias are formed in the substrate and arranged around the outer circumference of the second coil.

6. The current sensor according to claim 5, wherein: The first plurality of measuring conductors and the third plurality of measuring conductors are coupled through corresponding through holes in the first plurality of through holes and the third plurality of through holes to form the first measuring coil; and The second plurality of measuring conductors and the fourth plurality of measuring conductors are coupled through corresponding through holes in the second plurality of through holes and the fourth plurality of through holes to form the second measuring coil.

7. The current sensor according to claim 6, wherein: The measuring conductor extends substantially radially from the center of the current sensor; and The current sensor also includes a plurality of circumferentially advancing conductors formed on the substrate and arranged to provide circumferential advance of the first measuring coil and the second measuring coil.

8. The current sensor of claim 7, wherein the circumferential advancing conductor is positioned on the substrate such that: Adjacent to the first plurality of through holes and the second plurality of through holes; or Adjacent to the third plurality of through holes and the fourth plurality of through holes; or The position is located between the first plurality of through holes and the second plurality of through holes and the third plurality of through holes and the fourth plurality of through holes.

9. The current sensor according to any one of claims 1 to 6, wherein the measuring conductor is arranged at an angle relative to the radial direction of the first measuring coil and the second measuring coil, such that the measuring conductor provides radial and circumferential advance around the substrate.

10. The current sensor according to any one of the preceding claims, wherein: The first measuring coil has a first end and a second end; and The second measuring coil has a first end and a second end.

11. The current sensor of claim 10, wherein the first measuring coil comprises a first plurality of loops, and the second measuring coil comprises a second plurality of loops.

12. The current sensor of claim 11, wherein the first measuring coil and the second measuring coil are formed on the substrate such that the first plurality of loops of the first measuring coil are interleaved with the second plurality of loops of the second measuring coil in the circumferential direction.

13. The current sensor according to claim 11 or claim 12, wherein: Each of the first plurality of loops of the first measuring coil is wound in a clockwise direction starting from the first end of the first measuring coil; and Each of the second plurality of loops of the second measuring coil is wound in a counterclockwise direction starting from the first end of the second measuring coil.

14. The current sensor according to any one of claims 11 to 13, wherein: The second end of the first measuring coil is coupled to the second end of the second measuring coil, and is adapted to be coupled to a reference voltage; and The first end of the first measuring coil and the first end of the second measuring coil are adapted to be coupled to a differential signal processing circuit.

15. A current sensor, the current sensor comprising: A substrate, the substrate including paths for current-carrying conductors; A first measuring coil is formed on the substrate and arranged to advance circumferentially around the path for the current-carrying conductor, wherein the first measuring coil includes a first plurality of loops; as well as A second measuring coil is formed on the substrate and arranged to advance circumferentially around the path for the current-carrying conductor, wherein the second measuring coil includes a second plurality of loops; The first measuring coil and the second measuring coil are arranged relative to each other such that a corresponding loop in the first plurality of loops is adjacent to a corresponding loop in the second plurality of loops in the circumferential direction surrounding the path for the current-carrying conductor.

16. The current sensor of claim 15, wherein each corresponding loop in the first plurality of loops is not aligned with each corresponding loop in the second plurality of loops in a direction perpendicular to the substrate.

17. The current sensor according to claim 15 or claim 16, wherein: The first measuring coil has a first end and a second end, and each of the plurality of loops of the first measuring coil is wound in a clockwise direction starting from the first end of the first measuring coil; and The second measuring coil has a first end and a second end, and each of the plurality of loops of the second measuring coil is wound in a counterclockwise direction starting from the first end of the second measuring coil.

18. A current sensor, the current sensor comprising: First output terminal; Second output terminal; A first measuring coil having a first end and a second end, wherein the first end of the first measuring coil is coupled to the first output terminal; A second measuring coil having a first end and a second end, wherein the first end of the second measuring coil is coupled to the second output terminal; The second end of the first measuring coil is coupled to the second end of the second measuring coil and is configured to be coupled to a reference voltage.

19. The current sensor according to claim 18, wherein: The first output terminal and the second output terminal are used to couple to a differential signal processing circuit; and The second end of the first measuring coil and the second end of the second measuring coil are coupled to the reference terminal of the current sensor, wherein the reference terminal is used to couple to a reference voltage source.

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