Error reproduction repair method, device, equipment and storage medium
By using sensors and a background monitoring module to obtain logs and environmental parameters of operational errors during the operation of flash memory chips, and combining keywords and program code for repair, the problem of low error repair efficiency under harsh conditions of flash memory chips in existing technologies is solved, and efficient and accurate error repair is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHENZHEN DOUDAN TECHNOLOGY CO LTD
- Filing Date
- 2026-04-02
- Publication Date
- 2026-07-10
AI Technical Summary
Existing technologies have low error repair efficiency under harsh conditions caused by flash memory chips, making it difficult to achieve efficient repair.
By using sensors and a background monitoring module to obtain target operation logs of operational errors during the operation of flash memory chips, extracting keywords, and combining target physical environment parameters and operation environment parameters, errors are repaired based on preset keywords, input data, and program code.
It enables precise repair of errors under harsh conditions, improves repair efficiency and accuracy, and ensures the reliability of the storage system and the lifespan of the equipment.
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Figure CN122363973A_ABST