A laser chip far field divergence angle verification device
By using vector prediction and high-frequency closed-loop linkage interpolation technology, the problems of optical axis pointing deviation, sampling strategy and dynamic range matching of the laser chip far-field divergence angle measurement device were solved, and efficient and accurate laser chip far-field divergence angle measurement was achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- CENT CHINA OPTOELECTRONICS TECH RES INST (CHINA STATE SHIPBUILDING CORP 717TH RES INST)
- Filing Date
- 2026-06-04
- Publication Date
- 2026-07-17
AI Technical Summary
Existing laser chip far-field divergence angle measurement devices suffer from problems such as low testing efficiency due to optical axis pointing deviation, inability to balance efficiency and accuracy with fixed sampling strategies, and difficulty in dynamic range matching.
By employing vector prediction and high-frequency closed-loop linkage interpolation technology, and through the linkage of Z-axis, X-axis and Y-axis displacement mechanisms, combined with adaptive sampling and dynamic exposure strategies, the linear propagation equation of the laser chip beam in three-dimensional space is calculated and efficient image acquisition is achieved.
It enables rapid and accurate measurement of the far-field divergence angle of laser chips, shortens testing time, improves measurement accuracy and efficiency, and adapts to the testing needs of different types of laser chips.
Smart Images
Figure CN122409149A_ABST