Method for transmitting electrical signal for detecting electrical defect of thin film transistor display panel

By applying electrical signals to the circuit layer electrodes of the thin-film transistor display panel for electrical aging treatment, the problem of difficulty in identifying potential abnormal points in the prior art is solved, realizing high-precision and high-stability electrical defect detection, and improving panel process yield and detection reliability.

CN122410171APending Publication Date: 2026-07-17GUANGZHOU XINGYING TESTING EQUIPMENT CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
GUANGZHOU XINGYING TESTING EQUIPMENT CO LTD
Filing Date
2026-05-06
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing technologies struggle to identify potential anomalies in the early stages of thin-film transistor display panel manufacturing, leading to display abnormalities and reduced product yield. Furthermore, traditional detection methods suffer from limitations such as limited signal types, inability to verify probe contact status, and inaccurate determination of electrode short-circuit defects, failing to meet the high precision and stability requirements of high-end display panels.

Method used

Electrical aging is performed by applying an electrical signal output from an array generator to the circuit layer electrodes of a thin-film transistor display panel. Using DC, AC signals or a combination thereof, combined with overcurrent protection and probe contact confirmation, explicit electrical defects of foreign objects and abnormal points of insulating film characteristics are detected. A multi-degree-of-freedom PROBE structure and a multi-axis drive system are used for precise contact and signal transmission.

Benefits of technology

It significantly improves panel manufacturing yield, reduces the probability of missed detections and false damage, enables early detection and handling of potential defective points, and improves the reliability and coverage of detection. It is suitable for panels of different specifications and layouts.

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Abstract

本发明公开了薄膜晶体管显示面板电气不良检测用电信号传输方法,应用于LCD / OLED显示屏TFT ARRAY面板。通过在面板各工程LAYER电路层电极施加阵列发生器电学信号,经单一或多个PROBE结构体传输,或将PROBE结构体移动至STAGE结构体,对面板活跃区及GOA回路异物、绝缘膜特性异常位置进行电学老化,将不良候补点提前暴露为实际电学不良。阵列发生器可输出直流、交流或直流交流合成电压 / 电流信号,同时判定电极SHORT不良;PROBE结构体可更换END‑CONTACTOR,支持移动与旋转,兼容POGO‑PIN、BLADE PIN、METAL BUMP等结构,适配单一或多种焊盘组合。本发明可早期激发隐性缺陷,检测稳定、安全、精准,兼容性强,适用于高精度TFT ARRAY面板不良检测。
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