An LCR test fixture

Abstract

This invention discloses an LCR test fixture, comprising: an insulating support base, a left probe and a right probe connected to the insulating support base, and a first guide and reset assembly. The first guide and reset assembly guides the left probe to move away from or towards the right probe to open or close the test clamp, and drives the right probe to automatically reset in a non-testing state. The contact positions of the left probe and / or the right probe with the test piece are configured to contact the surface of the test piece. This fixture employs a mating structure between the electrical probe and the insulating support base, significantly improving conductivity stability and measurement accuracy, achieving adaptive clamping, protecting the device under test, and optimizing testing efficiency and yield assessment.

Description

Technical Field

[0001] This invention relates to the field of electrical testing fixtures for electronic components, and more particularly to an LCR testing fixture. Background Technology

[0002] LCR (Liquid Crystal Count) testers (electronic measuring instruments specifically designed for the precise measurement of parameters of three basic passive components: inductance (L), capacitance (C), and resistance (R)) are key equipment in the production and quality inspection of electronic components. The quality of the electrical connection between the test fixture and the device under test directly determines the accuracy and reliability of the test data. Currently, for testing SMD (Surface Mount Device) devices such as chip resistors and chip capacitors, the mainstream solution mostly uses mechanical clamping fixtures, that is, using elastic clips or probes to clamp the electrodes at both ends of the component to establish an electrical connection. However, as electronic components develop towards miniaturization and high density (such as 0602, 0402, and even smaller packages), traditional clamping fixtures have gradually revealed the following significant technical bottlenecks in application: First, there is insufficient contact stability. Traditional clamping structures have limited contact area and rely on positioning accuracy during manual or semi-automatic operation. For tiny packaged components, even a slight shift in the clamping position or an underestimation of the clamping force can easily lead to poor contact (lack of connection). This not only introduces significant contact resistance, causing fluctuations in test data, but can also lead to misjudgments in severe cases, affecting the accuracy of product yield statistics.

[0003] Second, there is a high risk of mechanical damage. To overcome the problem of unstable contact, some fixture designs often use excessive clamping force. This rigid or highly elastic clamping method can easily cause stress concentration on the component pads, leading to pad scratches, plating peeling, or even microcracks in the ceramic substrate. Such damage not only changes the electrical characteristics of the components and reduces their long-term reliability, but may also "manufacture" defective products due to the testing process itself.

[0004] Third, latent defects are difficult to trace. Mechanical damage caused by fixtures is often hidden and difficult to detect in a timely manner during routine visual inspection. If such damaged parts flow into downstream assembly lines or even the end consumer market, they are very likely to cause functional failures. Once a customer complaint occurs, it will force companies to invest a lot of resources in failure analysis (FA) and fault tracing, which will not only significantly increase quality costs, but also have an irreversible negative impact on brand reputation.

[0005] In summary, existing technologies struggle to balance the trade-off between high-precision electrical connections and zero-damage protection when testing small-sized SMD components. Therefore, there is an urgent need to develop a new type of SMD fixture for LCR testers. Summary of the Invention

[0006] The purpose of this invention is to overcome the shortcomings of the prior art and provide an LCR test fixture to solve the technical problem that existing test fixtures cannot simultaneously achieve high-precision electrical connection and zero-damage protection.

[0007] To achieve the above objectives, the present invention adopts the following technical solution: An embodiment of the present invention provides an LCR test fixture, which includes: An insulating support base, wherein the insulating support base is provided with a first mounting hole extending laterally; The left probe is connected to the insulating support base; A right probe, connected to the insulating support base, and together with the left probe forming a test clamp; and The first guide reset component is embedded in the first mounting hole and is used to guide the right probe to move away from or closer to the left probe to open or close the test clamp and drive the right probe to automatically reset in the non-test state. The position where the left probe and / or the right probe contacts the test piece is configured to contact the surface of the test piece.

[0008] Both the left and right probes are equipped with elastic electrodes that contact the test piece.

[0009] The first guide reset assembly includes a first elastic element and a first guide element. The first elastic element is sleeved on the outside of the first guide element. One end of the first elastic element abuts against the right probe and the other end abuts against the insulating support base. The first guide element passes through the first mounting hole and its inner end is connected to the right probe.

[0010] The insulating support base has a first mounting groove at its top, the right probe is disposed in the first mounting groove, and the right probe reciprocates along the first mounting groove in the guiding direction of the first guide member.

[0011] Wherein, the first elastic element is a first spring, and the first guide element passes through the first guide rod of the first spring.

[0012] The surface of the first guide rod is plated with hard chrome or polished.

[0013] The insulating support base is further provided with a second mounting hole parallel to the first mounting hole, and a second guide reset assembly is provided in the second mounting hole; the second guide reset assembly includes: a second elastic member and a second guide member, the second elastic member is sleeved on the outside of the second guide member, one end of the second elastic member abuts against the right probe, the other end abuts against the insulating support base, the second guide member passes through the second mounting hole, and its inner end is connected to the right probe.

[0014] The insulating support base is further provided with a third mounting hole, which is parallel to the first mounting hole. An operating column is provided in the third mounting hole, one end of which is connected to the right probe, and the other end extends out of the insulating support base from the first mounting hole.

[0015] The top of the insulating support base is provided with a second mounting groove, and the left probe is fixedly installed in the second mounting groove.

[0016] The left probe has a clearance notch on its side near the right probe, which is used to leave a viewing window when the left probe and the right probe hold the test piece.

[0017] The LCR test fixture of the present invention adopts a cooperative structure of electrical probe and insulating support base, which significantly improves conductivity stability and measurement accuracy, realizes adaptive clamping, protects the device under test, and optimizes test efficiency and yield determination.

[0018] The above description is merely an overview of the technical solution of the present invention. In order to better understand the technical means of the present invention, it can be implemented according to the contents of the specification. In order to make the above and other objects, features and advantages of the present invention more obvious and understandable, preferred embodiments are described in detail below. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the overall structure of the LCR test fixture according to an embodiment of the present invention.

[0020] Figure 2 This is an exploded view of the LCR test fixture according to an embodiment of the present invention.

[0021] Figure 3 This is a schematic diagram of the LCR test fixture and the test piece under test in an embodiment of the present invention.

[0022] Figure 4 This is a schematic diagram of the insulating support base of the LCR test fixture according to an embodiment of the present invention.

[0023] Figure 5 This is a top view of the insulating support base portion of the LCR test fixture according to an embodiment of the present invention.

[0024] Figure 6 This is a side view of the insulating support portion of the LCR test fixture according to an embodiment of the present invention.

[0025] Figure 7 This is a schematic diagram of the left probe portion of the LCR test fixture according to an embodiment of the present invention.

[0026] Figure 8 This is a top view of the left probe portion of the LCR test fixture according to an embodiment of the present invention.

[0027] Figure 9 This is a side view of the left probe portion of the LCR test fixture according to an embodiment of the present invention.

[0028] Figure 10 This is a schematic diagram of the operating component of the LCR test fixture according to an embodiment of the present invention.

[0029] Figure 11 This is a schematic diagram of the right probe portion of the LCR test fixture according to an embodiment of the present invention.

[0030] Figure 12 This is a top view of the right probe portion of the LCR test fixture according to an embodiment of the present invention.

[0031] Figure 13 and Figure 14 These are different side views of the right probe portion of the LCR test fixture according to an embodiment of the present invention.

[0032] Figure 15 This is a schematic diagram of the first guide reset component of the LCR test fixture according to an embodiment of the present invention.

[0033] Figure 16 This is a schematic diagram of the second guide reset component of the LCR test fixture according to an embodiment of the present invention.

[0034] Figure 17 for Figure 1 The diagram shows a magnified view of part A.

[0035] Explanation of reference numerals in the attached figures: LCR test fixture 100, insulating support base 1, left probe 2, right probe 3, operating column 4, first guide 5, first elastic element 6, second guide 7, second elastic element 8, base body 11, first mounting groove 13, second mounting groove 12, first mounting hole 112, second mounting hole 113, third mounting hole 111, first insertion hole 121, second insertion hole 122, test piece 200, test clamp 201, plate part 21, first column 22, second column 23, notch 211, clearance notch 211, sheet part 31, block part 32, elastic electrode 321, right side part 301, rod part 41, end cap part 42. Detailed Implementation

[0036] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0037] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0038] In the description of this invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicating the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing this invention and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this invention.

[0039] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. In this invention, terms such as "installed," "connected," "joined," and "fixed" should be interpreted broadly. For example, they can refer to a connection, a detachable connection, or an integral part; they can refer to a connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0040] In the description of this specification, references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. The illustrative expressions of the above terms in this specification should not be construed as necessarily referring to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0041] LCR (Liquid Crystal Count) testers (electronic measuring instruments specifically designed for the precise measurement of parameters of three basic passive components: inductance (L), capacitance (C), and resistance (R)) are key equipment in the production and quality inspection of electronic components. The quality of the electrical connection between the test fixture and the device under test directly determines the accuracy and reliability of the test data. Currently, for testing SMD (Surface Mount Device) devices such as chip resistors and chip capacitors, the mainstream solution mostly uses mechanical clamping fixtures, that is, using elastic clips or probes to clamp the electrodes at both ends of the component to establish an electrical connection. However, as electronic components develop towards miniaturization and high density (such as 0602, 0402, and even smaller packages), traditional clamping fixtures have gradually revealed the following significant technical bottlenecks in application: First, there is insufficient contact stability. Traditional clamping structures have limited contact area and rely on positioning accuracy during manual or semi-automatic operation. For tiny packaged components, even a slight shift in the clamping position or an underestimation of the clamping force can easily lead to poor contact (lack of connection). This not only introduces significant contact resistance, causing fluctuations in test data, but can also lead to misjudgments in severe cases, affecting the accuracy of product yield statistics.

[0042] Second, there is a high risk of mechanical damage. To overcome the problem of unstable contact, some fixture designs often use excessive clamping force. This rigid or highly elastic clamping method can easily cause stress concentration on the component pads, leading to pad scratches, plating peeling, or even microcracks in the ceramic substrate. Such damage not only changes the electrical characteristics of the components and reduces their long-term reliability, but may also "manufacture" defective products due to the testing process itself.

[0043] Third, latent defects are difficult to trace. Mechanical damage caused by fixtures is often hidden and difficult to detect in a timely manner during routine visual inspection. If such damaged parts flow into downstream assembly lines or even the end consumer market, they are very likely to cause functional failures. Once a customer complaint occurs, it will force companies to invest a lot of resources in failure analysis (FA) and fault tracing, which will not only significantly increase quality costs, but also have an irreversible negative impact on brand reputation.

[0044] In summary, existing technologies struggle to balance the trade-off between high-precision electrical connections and zero-damage protection when testing small-sized SMD components. Therefore, there is an urgent need to develop a novel SMD fixture for LCR testing. Based on these requirements, this invention provides an LCR testing fixture 100.

[0045] Please see Figures 1 to 17 In this embodiment, the LCR test fixture 100 is mainly used for electrical testing of surface mount components.

[0046] The LCR test fixture 100 includes: An insulating support base 1 is provided with a first mounting hole 112 inside the insulating support base 1. The first mounting hole 112 extends laterally inside the insulating support base 1. Here, "lateral extension" refers to the first mounting hole 112 extending from left to right when the LCR test fixture 100 is placed horizontally.

[0047] Left probe 2, which is connected to the insulating support base 1, is used to clamp the test piece 200 from the left side; The right probe 3 is connected to the insulating support base 1 and together with the left probe 2 forms a test clamp 201. The right probe 3 is used to clamp the test piece 200 from the right side. The first guide reset component is embedded in the first mounting hole 112 and is used to guide the right probe 3 to move away from or towards the left probe 2 to open or close the test clamp 201, and to drive the right probe 3 to automatically reset in the non-test state. That is, the first guide reset component has two functions: first, it guides the movement path of the right probe 3 as it moves towards or away from the left probe 2, preventing the right probe 3 from shaking in the non-guided direction, which would affect the electrode contact accuracy with the test piece 200; second, after the test piece 200 is removed from the test clamp 201, it drives the right probe 3 to automatically reset along the guided direction, and in the test state, it drives the right probe 3 to elastically abut against the test piece 200, so that it has a stable and reliable electrical connection with the test piece 200.

[0048] In one embodiment, the left probe 2 and the right probe 3 can be moved relative to each other to open the test clamp 201. The right probe 3 can be manually pushed to the right to move it away from the left probe 2 to open the test clamp 201, or the left probe 2 can be manually pushed to the left to move it away from the right probe 3 to open the test clamp 201. Alternatively, the left probe 2 and the right probe 3 can be moved to the left and right simultaneously, respectively, to finally open the test clamp 201.

[0049] To address the shortcomings of existing testing instruments that use mechanical clamps and rely on manual operation, resulting in low alignment accuracy and unstable clamping, the contact positions of the left probe 2 and / or the right probe 3 with the test piece 200 are configured to make contact with the surface of the test piece 200. This surface contact structure is determined based on the specific shape of the side where the test pins of the test piece 200 are located, and is generally a curved surface structure, a planar structure, or an irregular surface contact structure.

[0050] The LCR test fixture 100 in this embodiment utilizes the stable surface contact pattern formed between the left probe 2 and the right probe 3 and the electrodes of the test piece 200, effectively overcoming the limitations of traditional point-line contact and significantly increasing the effective contact area. This not only significantly reduces contact resistance but also eliminates signal attenuation caused by poor contact, thereby greatly improving the accuracy, consistency, and repeatability of LCR test data.

[0051] Furthermore, both the left probe 2 and the right probe 3 are embedded with elastic electrodes or elastic probes that contact the test piece 200. These elastic electrodes or probes are connected to the main unit of the testing instrument via signal lines to acquire electrical test data and determine whether the electrical parameters of the test piece 200 meet the design requirements based on the test data.

[0052] Please refer to it again. Figure 1 , Figure 15 and Figure 17 The first guide reset assembly includes a first elastic element 6 and a first guide element 5. The first elastic element 6 is sleeved on the outside of the first guide element 5. One end of the first elastic element 6 abuts against the right probe 3, and the other end abuts against the insulating support base 1. The first guide element 5 passes through the first mounting hole 112, and its inner end is connected to the right probe 3. Since the first elastic element 6 is sleeved on the outside of the first guide element 5, both the first guide element 5 and the second elastic element 6 are inserted into the first mounting hole 112. The length of the first elastic element 6 is less than the length of the first guide element 5. The portion of the first guide element 5 not covered by the first elastic element 6 forms a directional sliding with the first mounting hole 112. The end of the first guide element 5 is fixedly connected to the right probe 3. Therefore, the right probe 3 can only reciprocate along the guiding direction of the first guide element 5 and the first mounting hole 112. In this embodiment, the inner end of the first elastic member 6 abuts against the right side of the right head 3, and the other end abuts against the insulating support 1. That is, the first elastic member 6 is squeezed between the right side 301 of the right probe 3 and the insulating support 1. When the right probe 3 moves to the right, the first elastic member 6 is squeezed and compressed. After the external force acting on the right probe 3 is released, under the action of the elastic restoring force of the first elastic member 6, the right probe 3 is driven to move automatically to the left until it is reset.

[0053] Please refer to it again. Figures 4 to 6 The insulating support base 1 includes: a base body 11, the top of which is provided with a first mounting groove 13, the right probe 3 being disposed in the first mounting groove 13, and the right probe 3 reciprocating along the first mounting groove 13 in the guiding direction of the first guide member 5. That is, the bottom part of the right probe 3 is inserted into the first mounting groove 13, and the right probe 3 can also reciprocate linearly along the first mounting groove 13 in the guiding direction of the first guide member 5.

[0054] In this embodiment, the first elastic element 6 is a first spring or a first elastic tube, and the first guide element 5 passes through the first guide rod of the first spring. The surface of the first guide rod is hard chrome plated or polished to reduce contact friction between the two elements during the movement of the first guide rod along the first mounting hole 112, making its movement smoother.

[0055] Please continue reading. Figures 4 to 6 The insulating support 1 also has a second mounting hole 113 parallel to the first mounting hole 112, and a second guide reset assembly is provided in the second mounting hole 113. The second guide reset assembly has the same structure as the first guide reset assembly and the two are arranged in parallel to each other, and are used to jointly provide guidance and reset power for the linear reciprocating movement of the right probe 3.

[0056] Please see Figure 16 The second guide reset assembly includes a second elastic element 8 and a second guide element 7. The second elastic element 8 is sleeved on the outside of the second guide element 7. One end of the second elastic element 8 abuts against the right probe 3, and the other end abuts against the insulating support base 1. The second guide element 7 passes through the second mounting hole 113, and its inner end is connected to the right probe 3. Obviously, using two sets of identical first and second guide reset assemblies to provide guidance and reset power for the movement of the right probe 3 can improve the movement stability and reliability of the right probe 3, and at the same time prevent the right probe 3 from shaking in the non-guided direction. This further improves the alignment accuracy between the elastic electrode of the right probe 3 and the test pin of the test piece 200. In addition, it can also improve the service life of the right probe 3, the first guide reset assembly, and the second guide reset assembly, making it suitable for a large number of rapid component electrical tests. The right ends of the first elastic element 6 and the second elastic element 8 both abut against the right side portion 301 of the right probe 3.

[0057] like Figure 4 and Figure 10 As shown, the insulating support base 1 is also provided with a third mounting hole 111, which is parallel to the first mounting hole 112. An operating column 4 is provided in the third mounting hole 111, one end of which is connected to the right probe 3, and the other end extends out of the insulating support base 1 through the third mounting hole 111.

[0058] Specifically, the operating column 4 includes a rod body 41 and an end cap 42 connected to the end of the rod body 41. The end cap 42 and the rod body 41 together form a screw-like structural component, such as... Figure 5As shown in the figure, the rod body 41 is inserted into the insulating support base 1 through the third mounting hole 111, and the inner end of the rod body 41 is fixedly connected to the right probe 3. The end cap 42 is always located outside the insulating support base 1. The end cap 42 can increase the contact area with the operator's hand on the one hand, and limit the maximum rightward movement of the rod body 41 on the other hand.

[0059] In this embodiment, the first mounting hole 112, the second mounting hole 113, and the third mounting hole 111 are parallel to each other and at the same height inside the base body 11. The third mounting hole 111 is located between the first mounting hole 112 and the second mounting hole 113. Specifically, the inner end of the rod portion 41 is connected to the middle position of the left side of the right probe 3. When the operator manually presses the operating column 4 to the right, the right probe 3 can be pushed to the right along the first guide reset assembly and the second guide reset assembly, simultaneously compressing the first elastic element 6 and the second elastic element 8.

[0060] Furthermore, the top of the insulating support base 1 is provided with a second mounting groove 12, and the left probe 2 is fixedly installed in the second mounting groove 12.

[0061] Please refer to it again. Figures 7 to 9 The left probe 2 includes: a plate portion 21, a first column 22 and a second column 23 vertically connected to the bottom of the plate portion 21, and correspondingly, a first insertion hole 121 and a second insertion hole 122 are provided at the bottom of the second mounting groove 12. The first column 22 and the second column 23 are respectively inserted into the first insertion hole 121 and the second insertion hole 122. The first column 22 is press-fitted with the first insertion hole 121, and the second column 23 is press-fitted with the second insertion hole 122, so that the left probe 2 is fixedly connected in the second mounting groove 12. A notch 211 is provided on the right side of the plate portion 21.

[0062] The left probe 2 is provided with a clearance notch 211 on the side near the right probe 3. The clearance notch 211 and the notch 211 are used to leave a viewing window when the left probe 2 and the right probe 3 clamp the test piece 200, so that the alignment status between the test piece 200 and the left probe 2 and the right probe 3 can be visually inspected.

[0063] Please refer to it again. Figures 11 to 14 The right probe 3 includes a sheet-like portion 31 and a block-like portion 32 protruding from the bottom of the sheet-like portion 31. When the right probe 3 is assembled onto the insulating support base 1, the sheet-like portion 31 is located above the first mounting groove 13, and the block-like portion 32 is recessed into the first mounting groove 13. The right side of the left probe 2, the left side of the right probe 3, and the top surface of the insulating support base 1 together form a test station for placing the test piece 200. Figure 14As shown, the right probe 3 is provided with an elastic electrode 321, the end of which protrudes from the test contact surface.

[0064] Compared with the prior art, the LCR test fixture 100 of this embodiment has the following advantages: Significantly improved conductivity stability and measurement accuracy: By utilizing the stable surface contact mode formed between the left probe 2 and the right probe 3 and the electrodes of the component under test, the limitations of traditional point and line contacts are effectively overcome, and the effective contact area is greatly increased. This not only significantly reduces contact resistance but also eliminates signal attenuation caused by poor contact, thereby greatly improving the accuracy, consistency, and repeatability of LCR test data.

[0065] Achieving adaptive clamping and protecting the device under test (DUT): A built-in spring guide mechanism provides a constant elastic restoring force. This structure automatically adapts to SMD components of varying thicknesses while ensuring a good electrical connection. It effectively avoids overpressure damage caused by rigid clamping, significantly reduces the risk of physical damage to the component electrodes, and extends the lifespan of the DUT.

[0066] Optimizing testing efficiency and yield assessment: This structure solves the problems of loose connections and abnormal contact resistance caused by improper clamping in traditional fixtures, reducing the test failure rate due to human error. While ensuring testing reliability, it simplifies the clamping operation process, significantly improves the efficiency of batch testing, and provides strong technical support for quality control in the electronic product manufacturing process. It has extremely high practical value and broad application prospects.

[0067] Please refer to it again. Figures 1 to 17 The testing process of the LCR test fixture 100 in this embodiment is as follows: Step 1, Loading: The operator holds the insulated support base 1 at the bottom of the clamp with their left hand as a support reference. The right index or middle finger, in conjunction with the left thumb, presses the protruding part on the operating column 4. Under mechanical thrust, the operating column 4 drives the rigidly connected right probe 3 to move to the right, overcoming internal resistance. Due to the high-precision linear guidance constraint provided by the first guide 5 and the second guide 7, the right probe 3 slides smoothly away from the left probe 2, significantly increasing the clamping gap between the left probe 2 and the right probe 3. Its advantages include ergonomics: manual unlocking via the independent guide column protrusion allows for convenient one-handed grip and operation. Smooth guidance: the two parallel first guide 5 and second guide 7 ensure that the movement trajectory of the right probe 3 is strictly horizontal, avoiding vertical swaying that could cause jamming or positioning deviation.

[0068] Step 2: Placement of the SMD component 200: With the right probe 3 in its fully open position, the operator uses tweezers to pick up the SMD component under test and place it in the test clamp 201 between the two probes. At this time, the SMD component lies flat on the surface of the insulating support 1 under its own weight, and its two electrodes are located directly below the projection area of ​​the left probe 2 and the right probe 3. This design offers unobstructed vision; the wide clamping gap provides the operator with excellent visibility and operating space, reducing placement difficulty. Short circuit prevention: The component is placed directly on the insulating support, effectively preventing short circuits between the component leads and the metal base, ensuring test safety.

[0069] Step 3, Clamping and Contact Establishment: The operator releases their fingers from the operating column 4. The right probe 3 rebounds under the elastic potential energy of the internal first elastic element 6 and the second elastic element 8. This action simultaneously pulls the right probe 3 to the left until it firmly presses against the right electrode of the SMD component, while the left probe 2, fixed on the left, presses against the left electrode of the component. Its design advantages include adaptive clamping; the spring-driven flexible clamping method can adapt to SMD components of different thicknesses, ensuring sufficient contact pressure to form a good electrical connection while avoiding damage to the fragile component body due to excessive pressure. Contact reliability is also ensured; the left and right probes are tightly fitted to the electrode surfaces, eliminating the risk of excessive contact resistance and guaranteeing the accuracy of subsequent test data.

[0070] Step 4: Power-on Test: After confirming secure clamping, start the test equipment to perform power-on performance testing on the SMD components. Throughout this process, the clamp maintains a stable clamping position to ensure the components do not shift during the test. Its design advantages include high stability; the dual guide post structure restricts lateral displacement, ensuring stable and reliable electrical connections during the test.

[0071] Step 5, Release and Unloading: After the test is completed, the operator presses the protruding part of the operating column 4 again with their left thumb, forcing the right probe 3 to retract to the right, widening the gap between the two probes. As the pressure is released, the right probe 3 releases the SMD component. Finally, the operator uses tweezers to remove the tested SMD component from the insulating support 1, completing a full test cycle. Its design advantage is a closed-loop process; the entire "unlock-clamp-release" mechanism is logically clear, enabling rapid manual batch testing without complex automation mechanisms, greatly improving production line efficiency.

[0072] The above examples are merely illustrative of the technical content of the present invention to facilitate easier understanding by the reader, but do not imply that the implementation of the present invention is limited to these examples. Any technical extensions or re-creations made based on the present invention are protected by the present invention. The scope of protection of the present invention is defined by the claims.

Claims

1. An LCR testing fixture, characterized in that, include: An insulating support base, wherein the insulating support base is provided with a first mounting hole; The left probe is connected to the insulating support base; The right probe is connected to the insulating support base and together with the left probe forms a test clamp. as well as The first guide reset component is embedded in the first mounting hole and is used to guide the right probe to move away from or closer to the left probe to open or close the test clamp and drive the right probe to automatically reset in the non-test state. The position where the left probe and / or the right probe contacts the test piece is configured to contact the surface of the test piece.

2. The LCR test fixture according to claim 1, characterized in that, Both the left and right probes are equipped with elastic electrodes that come into contact with the test piece.

3. The LCR test fixture according to claim 1, characterized in that, The first guide reset assembly includes a first elastic element and a first guide element. The first elastic element is sleeved on the outside of the first guide element. One end of the first elastic element abuts against the right probe and the other end abuts against the insulating support base. The first guide element passes through the first mounting hole and its inner end is connected to the right probe.

4. The LCR test fixture according to claim 3, characterized in that, The top of the insulating support is provided with a first mounting groove, the right probe is disposed in the first mounting groove, and the right probe reciprocates along the first mounting groove in the guiding direction of the first guide member.

5. The LCR test fixture according to claim 3, characterized in that, The first elastic element is a first spring, and the first guide element is a first guide rod that passes through the first spring.

6. The LCR test fixture according to claim 5, characterized in that, The surface of the first guide rod is plated with hard chrome or polished.

7. The LCR test fixture according to claim 1, characterized in that, The insulating support base is further provided with a second mounting hole parallel to the first mounting hole, and a second guide reset assembly is provided in the second mounting hole; the second guide reset assembly includes: a second elastic member and a second guide member, the second elastic member is sleeved on the outside of the second guide member, one end of the second elastic member abuts against the right probe, the other end abuts against the insulating support base, the second guide member passes through the second mounting hole, and its inner end is connected to the right probe.

8. The LCR test fixture according to any one of claims 1 to 7, characterized in that, The insulating support base is also provided with a third mounting hole, which is parallel to the first mounting hole. An operating column is provided in the third mounting hole, one end of which is connected to the right probe, and the other end extends out of the insulating support base from the first mounting hole.

9. The LCR test fixture according to claim 8, characterized in that, The top of the insulating support is provided with a second mounting groove, and the left probe is fixedly installed in the second mounting groove.

10. The LCR test fixture according to claim 9, characterized in that, The left probe has a clearance notch on its side near the right probe, which is used to leave a viewing window when the left probe and the right probe hold the test piece.

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