A test system development apparatus

Abstract

The application discloses a kind of test system development equipment.The test system development equipment includes: power starting module, control module, display module and mobile control module;Power starting module is used to control test system development equipment start, and provides electric energy for test system development equipment;Control module is used to respond to the instruction received by test system development equipment, and according to instruction control test system development equipment executes operation;Display module is used to show the running state information and test state information of test system development equipment;Mobile control module is used to control the position movement of main shaft, and stop moving after moving to target position.The technical scheme of the embodiment of the application can improve the innovation level of electronic information science and technology field, improve product production efficiency, stabilize production process and ensure product quality.

Description

TECHNICAL FIELD

[0001] The embodiment of the application relates to the technical field of electronic information science and technology, and particularly relates to a test system development device. BACKGROUND

[0002] With the rising and development trend of emerging industries such as the Internet of Things, the electronic information science and technology industry has become an important field that is inevitably competed for in the process of upgrading and development of the high-tech industrial structure of the world.

[0003] In recent years, the electronic information science and technology industry has developed rapidly, and the application mode in each field has gradually tended to be mature. However, due to the low level of the electronic information science and technology industry, poor technical innovation ability, and small enterprise scale, the electronic information science and technology industry presents a low-end surplus market pattern. Many enterprises only introduce foreign components for processing, and the homogenization is serious. The backward production equipment and unstable process cause the product indexes to be scattered and the stability to be poor. In the field of relative research and development, the basic development is ignored, and the commercialization development is seriously lagging behind. The lag of the electronic information science and technology development has hindered the smooth progress of the domestic strategic automobile industry. SUMMARY

[0004] The application provides a test system development device to research and solve the problems of poor innovation ability, unstable process, poor product quality and low production efficiency in the field of electronic information science and technology, and lays a foundation for further development of the electronic and electrical information technology engineering.

[0005] According to an aspect of the application, a test system development device is provided, which comprises a power start module, a control module, a display module and a movement control module.

[0006] The power start module is used for controlling the start of the test system development device and providing power for the test system development device.

[0007] The control module is electrically connected with the power start module, and is used for responding to an instruction received by the test system development device and controlling the test system development device to perform an operation according to the instruction.

[0008] A first end of the display module is electrically connected with the power start module, and a second end of the display module is electrically connected with the control module. The display module is used for displaying running state information and test state information of the test system development device.

[0009] The first end of the movement control module is electrically connected with the power start module, and the second end of the movement control module is electrically connected with the control module, the movement control module is used for controlling the spindle to move to a target position and stop moving.

[0010] Optionally, the movement control module comprises a position moving unit and a position monitoring unit.

[0011] The position moving unit is electrically connected with the control module, and the position moving unit is used for controlling the spindle to move and acquiring real-time coordinate position of the spindle.

[0012] The first end of the position monitoring unit is electrically connected with the position moving unit, and the second end of the position monitoring unit is electrically connected with the control module, and the position monitoring unit is used for monitoring whether the spindle moves to the target position.

[0013] Optionally, the position moving unit is further used for programming a profile track of a part to be measured, and converting the profile track of the part to be measured into a spindle center moving track.

[0014] Optionally, the position monitoring unit comprises an inductive sensor.

[0015] The inductive sensor is used for acquiring current position coordinate and moving distance data of the spindle in real time after sensing the spindle, and transmitting the current position coordinate of the spindle to the control module; and the control module sends a stop instruction to the position moving unit when the spindle moves to the target position.

[0016] The position moving unit is further used for receiving the stop instruction and controlling the spindle to stop moving.

[0017] Optionally, the power start module comprises a touch switch unit and a touch switch.

[0018] The touch switch is electrically connected with the touch switch unit, and the touch switch unit is electrically connected with the control module, the display module and the movement control module; the touch switch is used for outputting a switch instruction according to one touch operation, and the touch switch unit controls the test system development device to start or shut down according to the switch instruction.

[0019] Optionally, the power start module further comprises a battery and a charging protection unit.

[0020] The battery is electrically connected with the touch switch unit, and the charging protection unit is electrically connected between the battery and the touch switch unit.

[0021] The battery is used to power the test system development device, and the charging protection unit is used to avoid overcharging of the battery.

[0022] Optionally, the display module comprises a display screen.

[0023] The display screen is electrically connected to the control module, and the display screen is used to receive the data signal transmitted by the control module and display the data information.

[0024] Optionally, the control module comprises a central processing unit.

[0025] Optionally, the test system development device further comprises a warning module.

[0026] The warning module is electrically connected to the control module, and the warning module is used to receive the warning instruction issued by the control module, perform warning according to the warning instruction, and display the relevant processing information to the display module.

[0027] Optionally, the warning module comprises a buzzer and an indicator light.

[0028] The buzzer is used to emit a preset alarm sound according to the warning instruction, and the indicator light is used to emit light according to the warning instruction in a preset rule; the buzzer and the indicator light work simultaneously to realize alarm.

[0029] Optionally, the test system development device further comprises an illumination module; the illumination module is electrically connected to the power-on module, and the illumination module is used to illuminate when the ambient brightness is relatively dark.

[0030] Optionally, the illumination module comprises an ambient brightness acquisition unit and an LED lamp.

[0031] The ambient brightness acquisition unit is electrically connected to the power-on module, and the LED lamp is electrically connected to the ambient brightness acquisition unit; the ambient brightness acquisition unit is used to acquire ambient brightness data after the power-on module controls the test system development device to start, determine the ambient brightness state, and control the LED lamp to emit light for illumination when the ambient brightness is relatively dark.

[0032] The test system development device provided by the technical scheme of the embodiment of the present application has the power supply starting module, the control module, the display module and the movement control module, the power supply starting module is used for controlling the test system development device to start and providing power for the test system development device, the control module is used for responding to the instructions received by the test system development device and controlling the test system development device to perform operations according to the instructions, the display module is used for displaying the running state information and the test state information of the test system development device, and the movement control module is used for controlling the main shaft to move and stopping moving after moving to the target position. The test system development device provided by the embodiment of the present application can deeply research the field of electronic information science and technology, improve the innovation level of the field of electronic information science and technology, improve the product production efficiency, stabilize the production process and ensure the product quality, and promote the development of electronic and electrical information technology engineering.

[0033] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present application, nor is it intended to limit the scope of the present application. Other features of the present application will become apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0034] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0035] Figure 1 is a schematic diagram of the internal structure of a test system development device according to an embodiment of the present application;

[0036] Figure 2 is a schematic diagram of the internal structure of another test system development device according to an embodiment of the present application;

[0037] Figure 3 is a schematic diagram of the internal structure of another test system development device according to an embodiment of the present application;

[0038] Figure 4 is a schematic diagram of the structure of a soft start circuit according to an embodiment of the present application;

[0039] Figure 5 is a schematic diagram of the internal structure of another test system development device according to an embodiment of the present application;

[0040] Figure 6 is a schematic diagram of the structure of a charging protection circuit according to an embodiment of the present application;

[0041] Figure 7It is a schematic diagram of internal structure of another test system development device according to an embodiment of the present application;

[0042] Figure 8 It is a schematic diagram of internal structure of another test system development device according to an embodiment of the present application. DETAILED DESCRIPTION

[0043] In order to make the personnel in the art better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely below in combination with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor should belong to the protection scope of the present application.

[0044] It should be noted that the terms "first", "second" and the like in the specification and claims of the present application and the above-described drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or a chronological sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than that illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device that includes a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to the process, method, product or device.

[0045] As described in the background, there are still serious lags in some core manufacturing technologies, mainly in two aspects. One aspect is the lag of electronic information science and technology in the automotive industry in terms of sensing information, and the other aspect is the lag of electronic information science and technology itself in terms of intelligence and networking. Due to the lack of sufficient scale of application, electronic information science and technology products not only have low technology, but also have high prices, which are difficult to compete in the market.

[0046] Based on the above technical problems, the embodiments of the present application propose the following technical solutions.

[0047] The embodiments of the present application provide a test system development device. Figure 1 It is a schematic diagram of internal structure of another test system development device according to an embodiment of the present application. The test system development device covers multiple high-tech fields and is specially designed for test field applications. As shown in the figure, the test system development device comprises a power start module 10, a control module 20, a display module 30 and a mobile control module 40. Figure 1 It is a schematic diagram of internal structure of another test system development device according to an embodiment of the present application. The test system development device covers multiple high-tech fields and is specially designed for test field applications. As shown in the figure, the test system development device comprises a power start module 10, a control module 20, a display module 30 and a mobile control module 40. It is a schematic diagram of internal structure of another test system development device according to an embodiment of the present application. The test system development device covers multiple high-tech fields and is specially designed for test field applications. As shown in the figure, the test system development device comprises a power start module 10, a control module 20, a display module 30 and a mobile control module 40.

[0048] The power start module 10 is used to control the start of the test system development device and provide power for the test system development device. The control module 20 is electrically connected with the power start module 10. The control module 20 is used to respond to the instructions received by the test system development device and control the test system development device to perform operations according to the instructions. The first end of the display module 30 is electrically connected with the power start module 10, and the second end of the display module 30 is electrically connected with the control module 20. The display module 30 is used to display the running state information and the test state information of the test system development device. The first end of the movement control module 40 is electrically connected with the power start module 10, and the second end of the movement control module 40 is electrically connected with the control module 20. The movement control module 40 is used to control the spindle to move and stop moving after moving to the target position.

[0049] Specifically, the test system development device is started or turned off by controlling the power start module 10. The control module 20 is the core part of the test system development device and is used to perform data operation and output control signals. When the test system development device is started, the control module 20 controls the test system development device to perform corresponding operations according to the test instructions of the user.

[0050] The running state information of the test system development device can include that the test system development device is in a running state or a standby state, and the test state information can include the test results of the test system development device when performing tests. The control module 20 outputs control signals to control the test system development device to perform tests and outputs the obtained test results to the display module 30 for display. Exemplarily, the display module 30 can include a digital display panel or a liquid crystal display panel, etc. to realize the display function of the display module 30.

[0051] The movement control module 40 controls the spindle to move by the spindle feed motion according to the control signals output by the control module 20, so that the spindle moves in a certain direction. And when the spindle moves to the target position, the movement control module 40 can control the spindle to stop moving to protect the spindle from being damaged.

[0052] The test system development device provided by the technical scheme of the embodiment has the power supply starting module, the control module, the display module and the movement control module, the power supply starting module is used for controlling the test system development device to start and providing power for the test system development device, the control module is used for responding to the instructions received by the test system development device and controlling the test system development device to perform operations according to the instructions, the display module is used for displaying the running state information and the test state information of the test system development device, and the movement control module is used for controlling the spindle to move and stopping moving after moving to the target position. The test system development device provided by the embodiment can deeply study the field of electronic information science and technology, improve the innovation level of the field of electronic information science and technology, improve the product production efficiency, stabilize the production process and ensure the product quality, and promote the development of electronic and electrical information technology engineering.

[0053] Optionally, Figure 2 is another internal structure schematic view of the test system development device provided by the embodiment of the application. Based on the above-mentioned embodiment, as shown in Figure 2 the movement control module 40 includes a position moving unit 41 and a position monitoring unit 42.

[0054] The position moving unit 41 is electrically connected with the control module 20, and the position moving unit 41 is used for controlling the spindle to perform the feeding movement and acquiring the real-time coordinate position of the spindle;

[0055] The first end of the position monitoring unit 42 is electrically connected with the position moving unit 41, the second end of the position monitoring unit 42 is electrically connected with the control module 20, and the position monitoring unit 42 is used for monitoring whether the spindle moves to the target position.

[0056] Specifically, the position moving unit 41 mainly controls the coordinate axis position of the spindle when the spindle is in the feeding motion. The position moving unit 41 can be realized in the form of software combined with hardware, wherein the hardware part of the position moving unit 41 can be realized by using a dedicated integrated circuit position control chip. The digital signal input of the position moving unit 41 can be manually inputted through the keyboard on the display panel in the display module 30, and the open-loop quantity information such as the control button can be manually adjusted on the operation panel of the test system development device. The signal output of the position moving unit 41 can include the characters and graphics displayed to the display module 30 by the cathode ray tube (CRT), output the position servo control instruction and the strong electric control instruction through the corresponding interface, and obtain the real-time coordinate position of the spindle. In addition, the position moving unit 41 is also provided with a direct current motor electromagnetic conversion device to realize the conversion of electric energy into mechanical energy output by the spindle, so that the spindle moves in the feeding motion. The functions performed by the position moving unit 41 are realized by centralized control and time-sharing processing of the control module 20. For example, the control module 20 includes a central processing unit (CPU). The CPU collects and processes data information, and outputs a driving control signal to control the corresponding execution unit to perform an action. For example, the CPU can drive the position moving unit 41 to control the spindle to move in the feeding motion.

[0057] The position monitoring unit 42 can sense whether the spindle enters the monitoring range of the position monitoring unit 42. When the spindle is monitored, the position monitoring unit 42 can monitor the moving position of the spindle in real time, and obtain the position data of the spindle, and transmit the position data to the control module 20. The control module 20 compares the current position data of the spindle with the target position data, and determines whether the spindle moves to the target position. When the control module 20 determines that the spindle moves to the target position, a stop instruction is immediately sent to the position moving unit 41, so that the position moving unit 41 stops the feeding motion of the spindle.

[0058] Optionally, on the basis of the above embodiment, continuing to refer to Figure 2 The position moving unit 41 is also used for programming the profile track of the to-be-tested part, and converting the profile track of the to-be-tested part into the center moving track of the spindle.

[0059] Specifically, the position moving unit 41 can also obtain the spindle center moving track through a software method. The part program of the part to be tested is programmed with a part contour track, and the part contour track is converted into a spindle center track through the compensation effect of the through-hole pin shaft. The spindle moving speed in the program is the combined speed in the combined direction of the coordinate axes, and the processing of the speed first calculates the component speed in the direction of each coordinate axis. The compensation effect is also called the interpolation process, that is, the "densification of data points" on a curve with a determined starting point and an ending point is performed to determine the moving track of the spindle center. The interpolation process is also realized through a software program, and the interpolation program runs once in each interpolation period to calculate a tiny straight line data segment according to the instruction feed speed. After several interpolation periods, the interpolation completes a program segment track, that is, the "densification of data points" from the program segment starting point to the ending point is completed. The position moving unit 41 is located on the position loop in the servo control loop, and the position moving unit 41 can compare the difference between the theoretical position coordinates and the actually received position coordinates in each sampling period to obtain the control amount of the servo motor. In addition, the position moving unit 41 can also perform gain adjustment of the position loop, pitch error compensation and reverse gap compensation in each coordinate direction, so as to improve the positioning accuracy of the test system development device provided in the embodiment.

[0060] Optionally, on the basis of the above embodiment, the position monitoring unit 42 comprises an inductive sensor.

[0061] The inductive sensor is used to obtain the current position coordinates and moving distance data of the spindle in real time after the spindle is inducted, and transmit the current position coordinates of the spindle to the control module 20; the control module 20 determines that the spindle moves to the target position, and sends a stop instruction to the position moving unit 41;

[0062] The position moving unit 41 is also used to receive the stop instruction and control the spindle to stop moving.

[0063] Specifically, by employing the inductive sensor to monitor the position of the spindle movement, the movement information and position information of the spindle can be converted into electrical signals. Exemplarily, the inductive sensor employed in the embodiment is composed of LC high-frequency oscillator and amplification processing circuit, etc. The inductive sensor has a certain sensing area range and can output a switching value signal to indicate whether the spindle moves to the target position. When the position moving unit 41 controls the spindle to move to the sensing area of the inductive sensor, the inductive sensor can quickly issue an electrical instruction without contact, pressure and spark, and accurately reflect the position and stroke of the movement mechanism, so that the control module 20 can accurately control the feed movement of the spindle to stop, thereby improving the positioning accuracy of the test system development device, facilitating installation and adjustment, having long service life, and being applicable to harsh environments. In addition, the inductive sensor can also realize real-time monitoring of the displacement of the spindle coordinate position, ensuring continuous operation of the test system development device.

[0064] Optionally, Figure 3 is another internal structure schematic diagram of the test system development device provided by the embodiment of the present application. Based on the above-mentioned embodiments, as shown in Figure 3 , the power start module 10 includes a touch switch unit 11 and a touch switch.

[0065] The touch switch is electrically connected with the touch switch unit 11, and the touch switch unit 11 is electrically connected with the control module 20, the display module 30 and the movement control module 40. The touch switch is used to output a switching instruction according to a one-time touch operation, and the touch switch unit 11 controls the test system development device to start or shut down according to the switching instruction.

[0066] Specifically, the test system development device can be started or shut down through the touch switch. The touch switch is arranged on the outer surface of the test system development device, and the touch switch unit 11 is arranged in the test system development device. Figure 3The touch switch unit 11 is provided with a touch switch starting circuit, and the touch switch unit 11 is electrically connected with an external touch switch, so that the touch switch on the outer surface is realized, that is, the touch switch starting circuit is turned on, and the test system development device is started; and the touch switch is touched again, so that the touch switch starting circuit is turned off, and the test system development device is turned off. The input end of the touch switch starting circuit is a field effect tube structure, and the field effect tube is a voltage control element and hardly consumes current. Therefore, when a user touches the touch switch arranged on the outer surface with a hand, a weak induced voltage generated is sufficient to make the circuit normally work. A NAND logic element and a resistor and a capacitor in the touch switch starting circuit form a monostable trigger, so that a delay process can be performed, and interference and jitter generated by the user when touching the touch switch can be eliminated. Another NAND logic element in the touch switch starting circuit serves as a bistable trigger, and by triggering the bistable trigger, the process of turning off after being turned on by twice touching can be realized.

[0067] In addition, the test system development device provided by the embodiment can adopt a plurality of power supply starting modes. When an external input voltage is high, a soft starting circuit is immediately run. Because an initial voltage on the capacitor is zero at the moment when the power supply is connected to the input end of the touch switch starting circuit, a great instantaneous impact current is formed, and the instantaneous impact current can cause a fuse at the input end of the touch switch starting circuit to be burnt out. Therefore, the soft starting circuit can effectively prevent the instantaneous impact current from being generated on the capacitor, so as to ensure that the power supply starting module 10 normally and reliably works. The soft starting circuit can include a starting resistor, a rectifier diode and a filter capacitor and the like. Figure 4 is a structural schematic diagram of a soft starting circuit provided by the embodiment of the application. As shown in Figure 4 After the touch switch is touched once, the touch switch circuit starts to work. The starting working current required by the chip 111 is transmitted to the input end VIN of the chip 111 through the voltage input end, the resistor R1 and the resistor R2, so as to realize soft starting. When the switch tube Q1 enters a normal working state, a high-frequency voltage established on the switch transformer 112 is rectified and filtered through the rectifier diode D1 and the filter capacitor C1, and serves as a working voltage of the chip 111, and the soft starting process is ended.

[0068] Optionally, Figure 5 is another internal structural schematic diagram of a test system development device provided by the embodiment of the application. Based on the above embodiment, as shown in Figure 5 The power supply starting module 10 further includes a battery 12 and a charging protection unit 13.

[0069] The battery 12 is electrically connected with the touch switch unit 11, and the battery 12 is used for supplying power for the test system development device;

[0070] The charging protection unit 13 is electrically connected with the battery 12, and the charging protection unit 13 is used for avoiding overcharging of the battery 12.

[0071] Specifically, after the induced voltage generated by the touch controls the touch switch unit 11 to be turned on, the battery 12 connected with the touch switch unit 11 starts to work. The battery 12 is a secondary battery, and exemplarily can be a lithium ion battery. The battery 12 can include a positive electrode, a negative electrode, an electrolyte, a diaphragm, and a shell can include a steel shell, an aluminum shell, a cover plate, a tab, an insulating sheet, an insulating tape, a pressure relief valve and other auxiliary materials. The test system development device is powered by the battery 12 during operation. The charging protection unit 13 is provided with a charging protection circuit, which can protect the battery 12 from overcharging when the battery has a low remaining capacity. Figure 6 is a structural schematic diagram of a charging protection circuit provided by an embodiment of the application. As shown in Figure 6 When the charging protection chip 131 detects that the voltage between the positive electrode B+ and the negative electrode B- of the battery 12 reaches an overcharge protection threshold value, the level signal output by the CO pin is converted into a low-level signal, and the second MOS tube switch 132 is converted from the on state to the off state, thereby shutting down the charging loop and stopping charging the battery 12, and realizing overcharge protection of the battery 12. The overcharge protection threshold value can be set according to actual needs, which is not limited here.

[0072] During discharging of the battery 12, the current passes through the series-connected first MOS tube switch 133 and second MOS tube switch 132, and the voltage drop of the two MOS tube switches is detected by the VM pin of the charging protection chip 131. If the load causes the voltage drop to be abnormal, the loop current increases, and when the voltage drop is greater than a certain value, the voltage output by the DO pin of the charging protection chip 131 is converted from high voltage to low voltage, and the first MOS tube switch 133 is closed, thereby making the discharging loop current zero, and realizing overcurrent protection of the battery 12.

[0073] Optionally, on the basis of the above embodiment, the display module 30 comprises: a display screen.

[0074] The display screen is electrically connected with the control module 20, and the display screen is used for receiving the data signal transmitted by the control module 20 and displaying the data information.

[0075] Specifically, the display screen is arranged on the outer surface of the test system development device and is electrically connected with the control module 20. The display screen uses character display instead of digital display, and can more directly display the data information transmitted by the control module 20 to the display screen, which is convenient for users to check. Exemplarily, the display screen can be a thin film transistor liquid crystal display screen, and the display screen can be used to display part programs, test parameters, position coordinates of the perforated pin shaft, spindle states and test result prompt information, etc.

[0076] Optionally, Figure 7 is another internal structure schematic diagram of the test system development device provided by the embodiment of the present application. Based on the above-mentioned embodiment, as shown in the figure, Figure 7 the test system development device further comprises a pre-warning module 50.

[0077] The pre-warning module 50 is electrically connected with the control module 20, and the pre-warning module 50 is used for receiving the warning instruction sent by the control module 20, performing pre-warning according to the warning instruction, and displaying the related processing information to the display module 30.

[0078] Specifically, when the control module 20 controls each execution unit to act, any error or failure occurs in the execution process, or exceeds the corresponding preset threshold, the control module 20 can automatically detect the above-mentioned abnormal situation occurring in the monitoring area, generate a warning signal, and send it to the pre-warning module 50. The pre-warning module 50 alarms according to the warning signal and sends a prompt signal. The control module 20 can also detect the specific position where the abnormal situation occurs and display it on the display screen, and display the emergency measures that can be taken.

[0079] Exemplarily, based on the above-mentioned embodiment, the pre-warning module 50 comprises a buzzer 51 and an indicator light.

[0080] The buzzer 51 is used for sending a preset alarm sound according to the warning instruction; the indicator light is used for emitting light according to the warning instruction in a preset rule; the buzzer 51 and the indicator light work simultaneously to realize the alarm.

[0081] Specifically, the buzzer 51 is connected with a buzzer driving circuit, which can include a triode, a freewheeling diode and a power filter capacitor, etc. Among them, the buzzer 51 is a sound emitting element, which can include an active buzzer and a passive buzzer. Exemplarily, applying a direct current voltage at both ends of the active buzzer or applying a square wave at both ends of the passive buzzer can make the buzzer 51 emit sound. The buzzer 51 is an inductive element, and the current cannot be transient, so a freewheeling diode must be provided to provide freewheeling. Otherwise, a few tens of volts of peak voltage will be generated at both ends of the buzzer 51, which may damage the driving triode and interfere with other parts of the buzzer driving circuit. The filter capacitor can filter the influence of the current in the buzzer 51 on other parts of the buzzer driving circuit, and also can improve the AC impedance of the power supply by connecting a 220uF electrolytic capacitor in parallel. The on or off state of the triode can control the buzzer 51 to emit sound or stop. When the control electrode of the triode receives a high level, the triode is in a saturated conduction state, so that the buzzer 51 emits sound; when the control electrode of the triode receives a low level, the triode is in an off state, so that the buzzer 51 stops emitting sound. The buzzer 51 can send a prompt signal according to a preset alarm sound, for example: the preset alarm sound can be a long sound for 3 seconds, or three sounds with intervals, which is not limited here.

[0082] In addition, the test system development device is further provided with an indicator light which emits a prompt signal by emitting light. Exemplarily, the indicator light can be a light-emitting diode which converts electrical energy into light energy to emit light by releasing energy through electron-hole recombination. When the indicator light receives the warning instruction sent by the control module 20, the indicator light can emit light according to the preset light-emitting rule to play a prompting role. Exemplarily, the indicator light can be a red light-emitting diode, and the preset light-emitting rule can be that the indicator light emits red light in a long-bright mode or a red light in a flashing mode. The preset light-emitting rule can be set according to actual needs, which is not limited here. The indicator light is arranged outside the test system development device, Figure 7 which is not shown in the figure.

[0083] Optionally, Figure 8 is another internal structure schematic view of the test system development device provided by the embodiment of the present application. Based on the above-mentioned embodiment, as shown in the figure, Figure 8 the test system development device further comprises an illumination module 60. The illumination module 60 is electrically connected with the power start module 10, and the illumination module 60 is used for illuminating when the ambient brightness is relatively dark.

[0084] Specifically, the illumination module 60 comprises an illumination control circuit, which can control the illumination module 60 to operate when the ambient brightness is relatively dark, so as to facilitate the user to operate and ensure the accuracy of operation.

[0085] Exemplarily, based on the above-mentioned embodiment, continuing to refer to Figure 8 , the illumination module 60 comprises an ambient brightness acquisition unit 61 and an LED lamp.

[0086] The ambient brightness acquisition unit 61 is electrically connected with the power start module 10, and the LED lamp is electrically connected with the ambient brightness acquisition unit 61; the ambient brightness acquisition unit 61 is used for acquiring ambient brightness data to determine the ambient brightness state after the power start module 10 controls the test system development device to start, and controlling the LED lamp to emit light to illuminate when the ambient brightness is relatively dark.

[0087] Specifically, after starting the test system development device, the ambient brightness acquisition unit 61 in the illumination module 60 can automatically acquire ambient brightness data and compare with the pre-set brightness threshold value. If the current ambient brightness is less than the brightness threshold value, the illumination module 60 controls the LED lamp to light up to illuminate; if the current ambient brightness is greater than the brightness threshold value, the LED lamp remains in an extinguished state and does not need to illuminate. Wherein, the LED lamp is arranged outside the test system development device, and Figure 8The LED lamp used does not show. The LED lamp uses super high brightness light emitting tube, has high light emitting efficiency, small working current, small current loss, and good power saving performance, is powered by the battery 12 in the power supply starting module 10, and can be continuously used for more than ten hours.

[0088] The above detailed description does not constitute a limitation on the protection scope of the present application. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent replacement and improvement made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A test system development apparatus characterized by comprising: The application relates to a test system development device, which comprises a power starting module, a control module, a display module and a movement control module. The power starting module is used for controlling the starting of the test system development device and providing power for the test system development device. The control module is electrically connected with the power starting module, and the control module is used for responding to instructions received by the test system development device and controlling the test system development device to perform operations according to the instructions. The first end of the display module is electrically connected with the power starting module, the second end of the display module is electrically connected with the control module, and the display module is used for displaying running state information and test state information of the test system development device. The first end of the movement control module is electrically connected with the power starting module, the second end of the movement control module is electrically connected with the control module, and the movement control module is used for controlling the position movement of a main shaft and stopping the movement after the main shaft moves to a target position. The movement control module comprises a position movement unit and a position monitoring unit. The position movement unit is electrically connected with the control module, and the position movement unit is used for controlling the feeding movement of the main shaft and acquiring real-time coordinate positions of the main shaft. The first end of the position monitoring unit is electrically connected with the position movement unit, the second end of the position monitoring unit is electrically connected with the control module, and the position monitoring unit is used for monitoring whether the main shaft moves to the target position. The position movement unit is also used for programming a profile track of a part to be tested, and converting the profile track of the part to be tested into a center moving track of the main shaft. The position monitoring unit comprises an inductive sensor. The inductive sensor is used for acquiring current position coordinates and moving distance data of the main shaft in real time after the main shaft is inducted, and transmitting the current position coordinates of the main shaft to the control module; when the control module determines that the main shaft moves to the target position, the control module sends a stop instruction to the position movement unit. The position movement unit is also used for receiving the stop instruction and controlling the main shaft to stop moving. The power starting module comprises a touch switch unit and a touch switch.

2. The test system development device according to claim 1, characterized by The touch switch is electrically connected with the touch switch unit, the touch switch unit is electrically connected with the control module, the display module and the movement control module, the touch switch is used for outputting a switch instruction according to one touch operation, and the touch switch unit controls the starting or closing of the test system development device according to the switch instruction. The power starting module further comprises a battery and a charging protection unit.

3. The test system development device of claim 2, wherein, The battery is electrically connected with the touch switch unit, and the charging protection unit is electrically connected between the battery and the touch switch unit. The battery is used for supplying power for the test system development device, and the charging protection unit is used for avoiding overcharging of the battery. The display module comprises a display screen.

4. The test system development device of claim 1, wherein The display screen is electrically connected with the control module, and the display screen is used for receiving data signals transmitted by the control module and displaying data information. The control module comprises a central processing unit.

5. The test system development device of claim 1, wherein, The application further comprises a pre-warning module.

6. The test system development device of claim 1, wherein ​ ​ The early warning module is electrically connected with the control module, and is configured to receive a warning instruction sent by the control module, perform early warning according to the warning instruction, and display relevant processing information to the display module.

7. The test system development device of claim 6, wherein, The early warning module comprises a buzzer and an indicator light. The buzzer is configured to emit a preset alarm sound according to the warning instruction, and the indicator light is configured to emit light according to a preset rule according to the warning instruction; the buzzer and the indicator light work simultaneously to realize alarm.

8. The test system development device of claim 1, wherein Further comprising: An illumination module, which is electrically connected with the power start module, and is configured to illuminate when the ambient brightness is relatively dark.

9. The test system development device of claim 8, wherein, The illumination module comprises an ambient brightness acquisition unit and an LED lamp. The ambient brightness acquisition unit is electrically connected with the power start module, and the LED lamp is electrically connected with the ambient brightness acquisition unit; the ambient brightness acquisition unit is configured to acquire ambient brightness data, determine the ambient brightness state, and control the LED lamp to emit light and illuminate when the ambient brightness is relatively dark after the power start module controls the test system development device to start.

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