A method and system for identifying average life assessment of batches of electronic products
By using a segmented life distribution model and incomplete gamma function integration calculation, the deviation problem in the average life assessment of qualified batch electronic products in the existing technology is solved, realizing high-precision and efficient life assessment, and supporting equipment maintenance and spare parts planning.
Patent Information
- Application Number
- CN202610695499.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-05-19
- Publication Date
- 2026-08-28
AI Technical Summary
In existing technologies, the single exponential distribution model ignores the failure of later wear and tear, resulting in an overestimation of the average lifespan. The single Weibull distribution model may overfit later data, resulting in an underestimation. These technologies cannot accurately characterize the complex characteristics of different failure mechanisms in the early and late stages of the batch of electronic products being evaluated, thus affecting the scientific validity of the evaluation results.
A segmented lifespan distribution model is adopted, dividing the product life cycle into an accidental failure period and a wear-out failure period. The exponential distribution and Weibull distribution models are used respectively, and the average lifespan is calculated through parameter constraints and incomplete gamma function integration to establish an analytical expression.
It improves the accuracy of assessment, overcomes the bias of a single model, provides a more accurate mean life estimate, and supports scientific decision-making for maintenance and spare parts supply.