Test system, test method, control device, storage medium, and computer program product

Abstract

The application provides a test system, a test method, a control device, a storage medium and a computer program product; the test system comprises: a test device configured to test a test index of a to-be-tested device to obtain test data; a simulation device configured to simulate a function of an AIoT terminal and / or a function of an AIoT base station; the to-be-tested device comprises one or more of an AIoT terminal, an AIoT base station and a CW excitation source; a test environment module configured to provide a test environment and / or a physical connection environment for the to-be-tested device; a control device configured to obtain first information, the first information being a test configuration related to the to-be-tested device; one or more of the test device, the simulation device and the to-be-tested device are configured based on the first information; based on a test flow of the to-be-tested device, the test device and / or the simulation device are controlled to test the to-be-tested device, test data about the to-be-tested device measured by the test device is obtained; and a test report is output based on the first information and the test data of the to-be-tested device.

Description

Technical Field

[0001] This application relates to the field of communication technology, and in particular to a test system, test method, control device, storage medium, and computer program product. Background Technology

[0002] In related technologies, testing solutions for Internet of Things (IoT) devices mainly focus on basic radio frequency testing of traditional IoT devices. However, such testing solutions are not applicable to Ambient IoT (AIoT) systems and cannot meet the testing requirements of AIoT systems. Summary of the Invention

[0003] This application provides a testing system, testing method, apparatus, control device, storage medium, and computer program product that can meet the testing requirements of AIoT systems.

[0004] The technical solution of this application embodiment is implemented as follows: This application provides a testing system, the testing system comprising: Test equipment is used to test the test parameters of the device under test and obtain test data. Simulation equipment used to simulate the functions of AIoT terminals and / or AIoT base stations; The device under test includes one or more of AIoT terminals, AIoT base stations, and continuous wave (CW) excitation sources; The test environment module is used to provide a test environment and / or physical connection environment for the device under test; A control device is configured to acquire first information, wherein the first information is a test configuration related to the device under test; configure one or more of the test device, the simulation device, and the device under test based on the first information; control the test device and / or the simulation device to test the device under test based on the test process of the device under test, and acquire test data about the device under test measured by the test device; and output a test report based on the first information and the test data of the device under test.

[0005] In the above scheme, the simulation equipment includes: The first simulation device is used to simulate the function of an AIoT base station; and / or, The second simulation device is used to simulate the functions of an AIoT terminal.

[0006] In the above scheme, the testing equipment includes one or more of the following: A spectrum analyzer is used to measure test parameters related to the spectral characteristics of a device under test. An oscilloscope is used to measure test parameters related to the device-to-reader (D2R) channel. CW excitation source, used to transmit single-tone carrier signals and / or provide excitation signals for AIoT terminals; In the above scheme, the first information includes the operating parameters of the device under test, and one or more of the following: Test parameters of the device under test; Operating parameters of the simulation equipment; Test the operating parameters of the equipment; The type of device under test (DUT) is an AIoT terminal, an AIoT base station, or a CW excitation source. Test types, including over-the-air tests or conduction tests; Test metric thresholds.

[0007] This application embodiment also provides a testing method, the method comprising: Obtain first information, which is the test configuration related to the first device, and the first device is the AIoT-related device to be tested; The first device and the second device are configured based on the first information, and the second device is used to test the first device and / or to simulate a peer device communicating with the first device. The first device is tested based on the test process of the first device, and the test data about the first device measured by the second device is obtained; A test report is output based on the first information and the test data.

[0008] In the above scheme, the first information includes at least the first configuration information of the first device and the second configuration information of the second device; configuring the first device and the second device based on the first information includes: Configure the operating parameters of the first device based on the first configuration information; Configure the operating parameters of the second device and / or the test indicators for the first device based on the second configuration information.

[0009] In the above scheme, the second device includes a testing device and a simulation device. The testing device is used to test the test indicators of the first device, and the simulation device is used to simulate the peer device communicating with the first device. The step of testing the first device based on the testing process of the first device and obtaining test data about the first device obtained by the second device includes: Based on the testing process of the first device, control the interaction between the first device and the corresponding simulation device; Obtain test data on the test indicators of the first device obtained by the second device.

[0010] In the above scheme, the first device includes an AIoT terminal, the second device further includes a CW excitation source that can provide excitation signals to the AIoT terminal, and the simulation device includes a first simulation device, which is used to simulate the function of an AIoT base station. The test process based on the first device, which controls the interaction between the first device and the corresponding simulation device, includes: Control the CW excitation source to send a single-tone CW excitation signal; The first simulation device is controlled to send a first signal, and the AIoT terminal is controlled to receive the first signal and backscatter the first signal.

[0011] In the above scheme, the first device includes an AIoT base station, and the simulation device includes a second simulation device, which is used to simulate the function of the AIoT base station; The test process based on the first device, which controls the interaction between the first device and the corresponding simulation device, includes: Control the AIoT base station to send a second signal; The second simulation device is controlled to receive the second signal, and the index value of the first test index of the AIoT base station is determined based on the second signal; Acquire test data on the test indicators of the first device obtained by the second device, including: Obtain the index value of the first test index determined by the second simulation device; Obtain test data on the second test index of the AIoT base station measured by the test equipment.

[0012] In the above scheme, the first device includes a CW excitation source, and the second device includes a testing device; The step of testing the first device based on the testing process of the first device and obtaining test data about the first device obtained by the second device includes: The system controls the CW excitation source to send a single-tone carrier signal based on the configured operating parameters, and acquires test data on the test indicators of the CW excitation source measured by the test equipment.

[0013] In the above scheme, before configuring the first device and the second device based on the first information, the method further includes: Start the first device and the second device, and perform parameter calibration on the first device and the second device.

[0014] In the above scheme, the first information also includes one or more of the following: The first device type is an AIoT terminal, an AIoT base station, or a CW excitation source; Test types, including over-the-air tests or conduction tests; Test metric thresholds.

[0015] This application embodiment also provides a control device, including: An acquisition unit is used to acquire first information, wherein the first information is a test configuration related to a first device, and the first device is an AIoT-related device to be tested; A configuration unit is configured to configure the first device and the second device based on the first information, wherein the second device is used to test the first device and / or to simulate a peer device communicating with the first device; The testing unit is used to test the first device based on the testing process of the first device and to obtain test data about the first device measured by the second device. The output unit is used to output a test report based on the first information and the test data.

[0016] This application embodiment also provides a control device, including: a processor and a communication interface; wherein, The processor is configured to acquire first information, which is a test configuration related to a first device, wherein the first device is an AIoT-related device to be tested; configure the first device and a second device based on the first information, wherein the second device is used to test the first device and / or to simulate a peer device communicating with the first device; test the first device based on the test process of the first device, and acquire test data about the first device measured by the second device; and output a test report based on the first information and the test data.

[0017] This application also provides a control device, including a processor and a memory for storing a computer program or computer-executable instructions that can run on the processor, wherein the processor, when running the computer program or computer-executable instructions, performs the steps of any of the above methods.

[0018] This application also provides a storage medium storing a computer program or computer-executable instructions thereon, which, when executed by a processor, implements the steps of any of the above methods.

[0019] This application also provides a computer program product, including a computer program or computer executable instructions, which, when executed by a processor, implement the steps of any of the above methods.

[0020] The embodiments of this application have the following beneficial effects: This application provides a test system including a test device, a simulation device, a device under test (DUT), a test environment module, and a control device, as well as a test method implemented based on the test system. The test device is used to test the DUT's test indicators to obtain test data; the simulation device is used to simulate the functions of an AIoT terminal and / or an AIoT base station in an environment; the test environment module is used to provide a test environment and / or physical connection environment for the DUT; the control device can acquire first information, which is a test configuration related to the DUT, and the DUT includes one or more of an AIoT terminal, an AIoT base station, and a CW excitation source; configure one or more of the test device, the simulation device, and the DUT based on the first information; control the test device and / or the simulation device to test the DUT based on the DUT's test process, and obtain test data about the DUT measured by the test device; and output a test report based on the first information and the DUT's test data. The above solution can automatically test one or more devices among AIoT terminals, AIoT base stations, and continuous wave (CW) excitation sources through control equipment, eliminating measurement errors caused by human operation. While meeting the testing requirements of AIoT systems, it also improves the testing efficiency of AIoT-related devices. Furthermore, the simulation equipment in the testing system can simulate the functions of environmental IoT AIoT terminals and / or AIoT base stations, adapting to various testing scenarios and realizing integrated testing of all AIoT devices, thus improving the completeness of the test. Attached Figure Description

[0021] Figure 1 This is an example diagram of a test system architecture applicable to the AIoT communication scenario of this application embodiment; Figure 2 This is a schematic diagram of the AIoT terminal OTA air interface testing process provided in the embodiments of this application; Figure 3 This is a flowchart illustrating the testing method provided in an embodiment of this application; Figure 4 This is a schematic diagram of the structure of the testing device provided in the embodiments of this application; Figure 5 This is a schematic diagram of the structure of the control device provided in the embodiments of this application. Detailed Implementation

[0022] Ambient IoT (AIoT) is a core technology direction for the evolution of 5G (5G-A, 5G-Advanced) and the next generation of IoT. Related technologies have clarified the operating frequency bands, channel configurations, and RF performance testing requirements for AIoT terminals, base stations, and continuous wave (CW) excitation sources. Among these, the n8 band (FDD UL: 880-915MHz, DL: 925-960MHz) is one of the core operating frequency bands for AIoT, requiring support for 200 / 400 / 600 / 800kHz multi-bandwidth channel configurations and modulation methods such as On-Off Keying (OOK) and Binary Phase Shift Keying (BPSK). FDD UL refers to Frequency Division Duplexing (FDD) uplink, and DL refers to downlink.

[0023] Current testing solutions for IoT devices mainly focus on basic radio frequency (RF) testing of traditional IoT (Intelligence of Things) devices, and can be divided into the following two categories: Single-device-type IoT testing solutions: Most existing testing systems only support single-type testing of IoT terminals or base stations. For example, IoT terminal RF testing systems only conduct conducted tests on basic indicators such as transmit power and receive sensitivity of IoT terminals. They do not consider specific indicators such as backscatter characteristics of AIoT terminals and Radio Resource Management (RRM) processes, nor can they adapt to core testing requirements of AIoT base stations such as Block Error Rate (BLER) / Maximum Data Rate (MDR) and CW excitation source power. The coverage of test objects and indicators is insufficient.

[0024] General wireless communication testing solutions: Some 5G testing systems based on the 3rd Generation Partnership Project (3GPP) standard can perform RF performance testing. For example, a 5G terminal testing platform built with general instruments such as spectrum analyzers and signal generators can cover spectrum measurement in the n8 band, but it is not customized for the low power consumption, backscatter, and narrowband channel characteristics of AIoT technology. It does not support multi-level bandwidth configurations for device-to-reader (D2R) from 3.75kHz to 2880kHz, and lacks bidirectional simulation capabilities between AIoT terminals and base stations. It cannot complete the detection of AIoT-specific indicators such as backscatter power and out-of-band transmission in OTA (Over-The-Air) air interface testing. At the same time, the testing process requires manual control of instruments and analysis of data, resulting in low automation.

[0025] Furthermore, among the relevant technologies, there is no mature testing system that can meet the consistency testing requirements for AIoT base stations and CW excitation sources specified in the standard, such as transmitter modulation pulse rise and fall time testing, spectrum compatibility testing, etc. Existing testing solutions have not achieved the integration of OTA testing and conducted testing, and cannot meet the consistency verification requirements of AIoT full-link devices.

[0026] In summary, existing IoT and wireless communication testing solutions have significant technical shortcomings for AIoT end-to-end testing, as detailed below: 1. Incomplete coverage of test objects and indicators: The existing solution only supports testing of a single type of IoT terminal or base station, without taking into account the differentiated testing needs of the three core devices: AIoT terminals, base stations, and CW excitation sources. It also does not cover AIoT-specific indicators, such as the backscatter power and RRM process of the device, the BLER / MDR of the base station, and the average power of a single tone of the CW excitation source, and cannot meet the full indicator testing requirements.

[0027] 2. Poor frequency band and channel configuration adaptability: The existing solution is not customized for the FDD mode of the AIoT n8 frequency band, does not support multi-bandwidth configuration of Reader-to-Device (R2D) at 200 / 400 / 600 / 800kHz and dedicated bandwidth configuration of D2R devices from 3.75kHz to 2880kHz, and cannot achieve precise configuration of SCS=15kHz, N_RB=1 / 2 / 3 / 4 and the corresponding minimum guard band, which does not match the channel requirements of the 3GPP AIoT standard; where SCS is Subcarrier Spacing and RB is Resource Block.

[0028] 3. Lack of bidirectional simulation and integrated testing capabilities: Existing solutions lack bidirectional simulation modules for AIoT terminals and base stations, making it impossible to flexibly implement the functions of FPGA (Field-Programmable Gate Array) simulation devices and USRP (Universal Software Radio Peripheral) simulation base stations when the object under test is a reader / tag; at the same time, it does not achieve the integrated fusion of OTA air interface testing (applicable to AIoT terminals) and conducted testing (applicable to base stations and CW excitation sources), and cannot complete the consistency testing of the entire AIoT link.

[0029] 4. Low test automation and collaboration: Existing solutions mostly rely on manual operation of general test instruments. There is no unified host computer control module to realize the collaborative work of instruments, simulation equipment and devices under test. The test process requires manual configuration of parameters, data collection and result analysis, which not only has low test efficiency, but also easily introduces human error and cannot meet the needs of batch testing and high-precision verification.

[0030] 5. Not adapted to 3GPP AIoT conformance testing requirements: The existing solution lacks corresponding functions such as transmitter modulation quality, spectrum compatibility, and OTA wireless testing procedures, and cannot complete the conformance verification of AIoT base stations and CW excitation sources, thus being out of step with the development of industry standards.

[0031] To address the issues of poor frequency band and channel configuration adaptability and lack of bidirectional simulation and integrated testing capabilities in AIoT end-to-end testing, this application proposes an AIoT comprehensive testing method and system based on 3GPP standards. It strictly adheres to relevant 3GPP AIoT testing specifications, including but not limited to 3GPP TS 38.191 / 194 / 195 testing specifications. The system integrates testing equipment (also known as a general-purpose testing instrument module), simulation equipment (also known as a bidirectional simulation module), a testing environment module (also known as an integrated testing environment), and control equipment (also known as a host computer or host computer automation control module). This enables integrated OTA air interface testing and conducted testing for three types of devices: AIoT terminals, base stations, and CW excitation sources. It supports multi-channel configuration in the n8 frequency band and testing of all core AIoT indicators. Furthermore, it achieves full-process automation through the Visa+SCPI protocol, overcoming many shortcomings of existing technologies.

[0032] To make the objectives, technical solutions, and advantages of this application clearer, the application will be further described in detail below with reference to the accompanying drawings. The described embodiments should not be regarded as limitations on this application. All other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0033] First, to better illustrate the testing method provided in the embodiments of this application, the following is given: Figure 1 This application provides an example of a test system architecture applicable to AIoT communication scenarios.

[0034] like Figure 1 As shown, the test system includes a test device 101, a simulation device 102, a device under test (DUT) 103, a test environment module 104, and a control device 105. The control device 105 can communicate with the test device 101, simulation device 102, DUT 103, and test environment module 104 respectively. The test device 101 can also communicate with the simulation device 102, the simulation device 102 can communicate with the DUT 103, and the DUT 103 can communicate with the test environment module 104. In other words, the devices / modules can interconnect via radio frequency links and / or communication protocols. This test system supports AIoT terminal OTA air interface testing and AIoT base station / CW excitation source conduction testing, both of which are automatically controlled and executed by the control device 105, which includes, but is not limited to, a host computer. The functions of each component device / module of the test system are as follows: Test equipment 101 is used to test the test indicators of the device under test and obtain test data; Simulation device 102 is used to simulate the functions of an environmental Internet of Things (AIoT) terminal and / or the functions of an AIoT base station; The device under test 103 includes one or more of AIoT terminals, AIoT base stations, and continuous wave CW excitation sources; Test environment module 104 is used to provide a test environment and / or physical connection environment for the device under test; The control device 105 is used to acquire first information, which is the test configuration related to the device under test 103; configure one or more of the test device 101, simulation device 102 and device under test 103 based on the first information; control the test device 101 and / or simulation device 102 to test the device under test 103 based on the test process of the device under test 103, and acquire the test data of the device under test 103 measured by the test device 101; and output a test report based on the first information and the test data of the device under test 103.

[0035] In order to obtain the index values ​​of test indicators for different devices under test, in one embodiment, the test device 101 includes one or more of the following: A spectrum analyzer is used to measure test parameters related to the spectral characteristics of a device under test. An oscilloscope is used to measure test parameters related to the device-to-reader (D2R) channel. The terminal is an AIoT terminal, and the reader can be an AIoT base station. CW excitation source (also known as CW signal source) is used to transmit single-tone carrier signals and / or provide excitation signals for AIoT terminals; A circulator is used to achieve unidirectional transmission and isolation of signals.

[0036] Here, test equipment 101 is the basic measurement and signal generation unit of the test system. All instruments / devices included in test equipment 101 cover the AIoT n8 frequency band (880-960MHz). Spectrum characteristic-related test indicators can be described as spectrum characteristic-related indicators; device-to-reader (D2R) channel-related test indicators can be described as device-to-reader (D2R) channel-related indicators.

[0037] The spectrum analyzer is used to measure the spectral characteristics of the device under test 103, covering indicators such as backscatter power, out-of-band emission, spectrum compatibility, adjacent channel selectivity (ACS), in-band and out-of-band blocking, etc. It supports remote configuration of parameters such as center frequency, span, resolution bandwidth (RBW) / video bandwidth (VBW) by the host computer. A high-frequency oscilloscope is used to perform timing measurements of the D2R channel, capturing parameters such as the rise and fall times of the transmitter modulation pulse, timing jitter, and D2R signal delay. The CW signal source is used to transmit single-tone CW carrier signals to provide excitation signals for backscatter testing of AIoT terminals, and supports precise adjustment of power and frequency. A circulator is used to achieve unidirectional signal transmission and isolation, connecting the first simulation device (also known as the base station simulation unit) and the AIoT base station and AIoT terminal under test, avoiding signal reflection interference with test results and improving the accuracy of radio frequency measurements.

[0038] To enable bidirectional communication testing between AIoT terminals and / or AIoT base stations, in one embodiment, the simulation device 102 includes: The first simulation device is used to simulate the function of an AIoT base station; and / or, The second simulation device is used to simulate the functions of an AIoT terminal.

[0039] Here, the simulation device 102 has bidirectional simulation capabilities for both AIoT terminals and AIoT base stations, adapting to different test scenarios for devices under test. The simulation device 102 can be built based on software radio and field-programmable gate array (FPGA) technology, or other chips can be used to replace the FPGA.

[0040] The simulation device 102 may include a first simulation device and / or a second simulation device. It should be noted that the first simulation device and the second simulation device can be two relatively independent devices, or they can be combined; there is no limitation here. The simulation device 102 may be called a bidirectional simulation test module; the first simulation device may be called a base station simulation unit, such as a USRP base station simulation unit; and the second simulation device may be called a terminal simulation unit, such as an FPGA device simulation unit.

[0041] The first simulation device can be built on a software radio platform (such as USRP) and can simulate the transceiver function of an AIoT base station. It supports the n8 band FDD mode, adapts to the 200 / 400 / 600 / 800kHz bandwidth configuration of the Reader to Device (R2D) channel, and can achieve parameter configurations of SCS=15kHz, N_RB=1 / 2 / 3 / 4 and corresponding minimum guard bands of 2.5 / 12.5 / 22.5 / 32.5kHz. It can send reference measurement signals and complete the RRM process interaction with the AIoT terminal under test. The second simulation device can consist of a processor (such as an FPGA) and an RF board. It can simulate the backscattering and signal reception functions of AIoT terminals (also known as tags). It supports multiple bandwidth configurations from 3.75kHz to 2880kHz for D2R channels and can complete data interaction with the AIoT base station or reader under test. It is used to test the BLER / MDR index of the base station.

[0042] The bidirectional simulation logic of simulation device 102 is as follows: when the device under test is an AIoT base station, the second simulation device simulates an AIoT terminal; when the device under test is an AIoT terminal, the first simulation device simulates an AIoT base station, thereby achieving flexible adaptation to the test scenario.

[0043] To adapt to different testing scenarios, in one embodiment, the device under test 103 may include three types of AIoT core devices under test, each corresponding to different testing methods and indicators: AIoT terminals: Various AIoT tags (terminals) are tested via OTA over-the-air interface. The core test indicators are backscatter power, out-of-band transmission, receiver sensitivity (OOK / BPSK), RRM process, ACS, in-band and out-of-band blocking, etc. AIoT base station: AIoT base station equipment or reader, using conducted testing, with core test indicators including BLER, MDR, transmitter modulation quality, spectrum compatibility, etc. CW excitation source: AIoT carrier excitation device, using conducted testing, with core test indicators including average power per tone at the antenna connector and carrier frequency accuracy.

[0044] In one embodiment, the test environment module 104 provides a dedicated electromagnetic and physical connection environment for testing, enabling integrated OTA air interface testing and conducted testing. The test environment module 104 may include an anechoic chamber and / or conducted testing auxiliary components. The anechoic chamber provides an electromagnetic reflection-free test environment for OTA air interface testing of AIoT terminals, ensuring the accuracy of air interface performance tests such as backscatter power and OTA RRM procedures. The conducted testing auxiliary components include RF connection cables, test fixtures, power dividers, etc., providing physical connections for conducted testing of AIoT base stations and CW excitation sources, enabling direct transmission and measurement of RF signals, and meeting the conducted testing requirements of AIoT-related standards in 3GPP (e.g., 3GPP TS 38.194).

[0045] In one embodiment, the control device 105 is the core control unit of the test system. The control device 105 can be an industrial control computer. The control program of the control device 105 can be developed based on the Virtual Instrument Software Architecture (Visa) communication protocol and the Standard Commands for Programmable Instruments (SCPI) control instruction set. Of course, other communication protocols and control instruction sets can also be used; no restrictions are placed here. The control device 105 can realize parameter configuration, device coordination, process execution, data acquisition, result analysis, and report generation for the entire system. The control device 105 includes, but is not limited to, the following five functional units, which work collaboratively: Test configuration unit: Supports users to select test type (OTA air interface test / conduction test), type of device under test (AIoT terminal / AIoT base station / CW excitation source), configure n8 band channel parameters (bandwidth, SCS, N_RB, guard band), test equipment operating parameters (spectrum analyzer range, oscilloscope sampling rate, signal source power, etc.), and test index thresholds (thresholds based on 3GPP standards). Equipment coordination unit: Establishes a communication connection with test equipment 101 and / or simulation equipment 102 through a communication protocol (e.g., Visa protocol), and realizes remote start-up, parameter adjustment and status synchronization of each device through control commands (e.g., SCPI commands) to ensure the timing consistency of each device during the test. Process execution unit: Built-in standardized test process based on AIoT-related standards in 3GPP (such as 3GPP TS 38.191 / 194 / 195), automatically executes test steps according to user configuration, including signal generation, radio frequency measurement, simulation interaction, index detection, etc., without manual intervention; Data acquisition and analysis unit: synchronously acquires test data from general testing instruments and two-way simulation modules, supports export of comma-separated values ​​(CSV) format, compares measured data with test index thresholds, calculates index margins, automatically determines whether test results are qualified, and provides real-time warnings for abnormal data; Report generation unit: Supports the automatic generation of standardized test reports in Hyper Text Markup Language (HTML) format. The report includes basic test information (equipment type, channel configuration), test indicators (actual values, margins, pass criteria), number of tests, spectrum / waveform graphs, etc., which facilitates the archiving and traceability of test results.

[0046] To adapt to different test scenarios / devices under test, in one embodiment, the first information includes the operating parameters of the device under test, and one or more of the following: Test parameters of the device under test; Operating parameters of the simulation equipment; Test the operating parameters of the equipment; The type of device under test (DUT) is an AIoT terminal, an AIoT base station, or a CW excitation source. Test types, including over-the-air tests or conduction tests; Test metric thresholds.

[0047] Here, the test parameters of the device under test may include, but are not limited to, one or more of the following: output power, transmit transient period, frequency accuracy, modulation quality, occupied bandwidth, adjacent channel leakage ratio (ACLR), operating band unwanted emissions (OBUE), spurious emissions, receiver reference sensitivity, and adjacent channel selectivity (ACS). The operating parameters of the simulation equipment include, but are not limited to, one or more of the following: output power, frequency accuracy, modulation quality, and occupied bandwidth.

[0048] It should be noted that, when the device under test (DUT) is an AIoT terminal, the test metrics include, but are not limited to, one or more of the following: backscatter power, out-of-band transmit, receiver sensitivity (OOK / BPSK), RRM flow, ACS, OBUE, ACLR, in-band and out-of-band blocking, etc. When the DUT is an AIoT terminal, the test metrics include, but are not limited to, one or more of the following: BLER, MDR, transmitter modulation quality, spectrum compatibility, ACS, OBUE, ACLR. When the DUT is a CW excitation source, the test metrics include, but are not limited to, single-tone average power, and may also include carrier frequency accuracy.

[0049] based on Figure 1 The test system shown illustrates that the core test procedures of this application, which comply with 3GPP standards, are all executed by the control device 105. These include the AIoT terminal OTA air interface test procedure and the AIoT base station / CW excitation source conduction test procedure, which will be described in detail below.

[0050] like Figure 2 As shown, this is an AIoT terminal OTA air interface test procedure that follows 3GPP standards (e.g., 3GPP TS 38.191). It is applicable to the AIoT terminal (tag) under test. The test environment is an anechoic chamber. Core test parameters include backscatter power, receiver sensitivity, and RRM procedure. Other test parameters can also be included, depending on the specific situation; these will not be elaborated here. The specific steps are as follows: Step 1: Control device 105 to obtain the test configuration.

[0051] Here, the test configuration unit of the control device 105 receives the test configuration input by the user. For example, the user selects the test type as OTA air interface test, the test object as AIoT terminal, configures the n8 band uplink 880-915MHz, R2D channel bandwidth (e.g., 200kHz), SCS=15kHz, N_RB=1, minimum guard band 2.5kHz, modulation method as OOK / BPSK, and sets the 3GPP standard test index threshold (e.g., backscatter loss ≤-27dB). Step 2: Control device 105 Initialize the control device.

[0052] Here, the device coordination unit of the control device 105 can start the test device 101 (spectrum analyzer, CW excitation source, oscilloscope) through control commands (such as SCPI commands), complete parameter calibration, and configure the working parameters of the test device 101; start the first simulation device (also known as the USRP base station simulation unit), control the first simulation device to simulate the AIoT base station to enter the working state, and configure the working parameters of the first simulation device; when the tester places the AIoT terminal under test in the designated position in the anechoic chamber, control the AIoT terminal under test to establish an air interface connection with the first simulation device, and configure the working parameters of the AIoT terminal under test.

[0053] The operating parameters of test equipment 101 include spectrum analyzer range, oscilloscope sampling rate, and signal source power. The operating frequency of the test equipment can be defaulted to the AIoT n8 band (880-960MHz), or it can be configured to 880-915MHz. The AIoT terminal under test operates in the n8 band uplink 880-915MHz, and the modulation method can be OOK. The operating parameters of the first simulation equipment include 880-915MHz, R2D channel bandwidth (e.g., 200kHz), SCS=15kHz, N_RB=1, minimum guard band 2.5kHz, and modulation method OOK / BPSK.

[0054] Step 3: Control device 105 controls the CW excitation source to send excitation signals.

[0055] Here, the process execution unit of the control device 105 controls the CW excitation source to send a single-tone CW excitation signal (the transmission power of the single-tone CW excitation signal is configured according to the 3GPP standard, such as 10dBm). For example, it controls the CW excitation source to send a single-tone CW excitation signal to the AIoT terminal under test; at the same time, it controls the first simulation device (also known as the base station simulation unit) to send a reference measurement signal and an RRM process interaction signal.

[0056] Step 4: Control device 105 performs air interface signal measurement and interaction.

[0057] Here, the AIoT terminal under test (DUT) receives a single-tone CW excitation signal, thereby acquiring radio frequency energy to support signal reflection and data modulation. The DUT receives signals (such as reference measurement signals and RRM process interaction signals) sent by the first emulation device (also known as the base station emulation unit) and performs backscattering to transmit backscattered signals. The DUT can also execute related operations corresponding to the first signal, such as those corresponding to the RRM process interaction signals.

[0058] The spectrum analyzer measures the spectral characteristics of the backscattered signal from the AIoT terminal under test to obtain the backscattered power; the oscilloscope captures the D2R timing signal; the first simulation device completes the RRM process interaction with the AIoT terminal under test and records the process execution success rate; at the same time, the spectrum analyzer completes the measurement of indicators such as out-of-band emission, ACS, and in-band / out-of-band blocking.

[0059] Step 5: Control device 105 performs data acquisition and analysis.

[0060] Here, the data acquisition and analysis unit of the control device 105 synchronously collects the test data of the spectrum analyzer, oscilloscope and first simulation device for the AIoT terminal under test, compares the measured value of the test index with the corresponding test index threshold, calculates the index margin, automatically judges whether each test index is qualified, and obtains the test result.

[0061] Step 6: Control device 105 executes the result output and generates a report.

[0062] Here, the control device 105 displays the test results in real time, issues warnings for non-compliant indicators, and at the same time, the report generation unit of the control device 105 automatically generates an HTML format test report. The test report includes test parameters, measured data, indicator margins, spectrum waveforms, etc., and completes the export of test data in CSV format.

[0063] The AIoT base station / CW excitation source conduction test procedure, which follows 3GPP standards (e.g., 3GPP TS 38.194 / 195), includes the AIoT base station excitation source conduction test procedure and the CW excitation source conduction test procedure. These will be explained in detail below.

[0064] Sub-process 3.1: AIoT base station conduction test. The core test indicators include BLER and / or MDR. Of course, other test indicators can also be included. The specific test indicators can be set according to the actual situation, which will not be elaborated here.

[0065] Step 1: Control device 105 to obtain the test configuration.

[0066] Here, the test configuration unit of the control device 105 receives the test configuration input by the user. For example, it obtains the test type selected by the user through the operation interface of the control device as conduction test, the test object as AIoT base station, and configures the downlink frequency band of n8 to 925-960MHz, R2D channel bandwidth (e.g., 800kHz), SCS=15kHz, N_RB=4, and minimum guard band of 32.5kHz.

[0067] Step 2: Physical connection and initialization.

[0068] Here, the tester uses the conducted test auxiliary component in the test environment module 104 to establish an RF connection between the AIoT base station under test (DUT), the spectrum analyzer, and the second simulation device (also known as the terminal simulation unit). The device coordination unit in control device 105 starts all devices (DUT, spectrum analyzer, and second simulation device) and completes calibration, configuring the spectrum analyzer's operating parameters (e.g., spectrum analyzer range, operating frequency band 925-960MHz); configuring the DUT's operating parameters; and controlling the second simulation device to simulate an AIoT terminal entering data reception mode. The DUT's operating parameters include n8 band downlink 925-960MHz, R2D channel bandwidth (e.g., 800kHz), SCS=15kHz, N_RB=4, and minimum guard band 32.5kHz; and controlling the second simulation device to receive signals transmitted by the DUT's AIoT base station in the 925-960MHz range.

[0069] The operating parameters of the second simulation device can be the D2R channel bandwidth (e.g., 800kHz).

[0070] Step 3: Signal transmission and interaction of the AIoT base station under test.

[0071] Here, the AIoT base station under test sends data signals to the second simulation device. The second simulation device (such as an FPGA device simulation unit) receives and parses the data signals, counts the number of block errors and calculates the BLER value, and tests the MDR of the AIoT base station under test. The spectrum analyzer completes the measurement of the transmitter modulation quality (pulse rise / fall time), spectrum compatibility and other indicators of the AIoT base station under test.

[0072] Step 4: Control the medical and social security 105 system to perform data analysis and report generation.

[0073] Here, the data acquisition and analysis unit of the control device 105 acquires the test data obtained by the second simulation device and the spectrum analyzer, compares it with the test index threshold to determine the pass rate of the test index, and generates and exports the test report.

[0074] Subprocess 3.2: CW excitation source conduction test. The core test indicators include the average power of a single tone. Of course, other test indicators can also be included. The specific settings can be made according to the actual situation, which will not be elaborated here.

[0075] Step 1: Control device 105 to obtain the test configuration.

[0076] Here, the test configuration unit of the control device 105 receives the test configuration input by the user. For example, the user selects the test type as conducted test, the device under test as CW excitation source, and configures the n8 band carrier frequency.

[0077] Step 2: Physical connection and initialization.

[0078] Here, the tester connects the CW excitation source under test to the spectrum analyzer via an RF cable; the device coordination unit of the control device 105 starts the CW excitation source and the spectrum analyzer and completes parameter calibration. The control device 105 can also configure the operating parameters of the CW excitation source under test to the n8 band carrier frequency, and configure the spectrum analyzer to operate at the n8 band carrier frequency.

[0079] Step 3: Single-tone signal transmission and measurement.

[0080] Here, the CW excitation source under test sends a single-tone carrier signal, and the spectrum analyzer measures the average power, frequency accuracy, and other indicators of the single tone at the antenna connector of the CW excitation source under test.

[0081] Step 4: Control device 105 performs data analysis and generates reports.

[0082] Here, the test data measured by the 105 firearms spectrum analyzer is compared with the measured values ​​and the test index thresholds to determine the pass rate of the test index and generate a test report.

[0083] Compared with existing IoT wireless communication testing technologies, the embodiments of this application have the following advantages: 1. Achieve integrated testing of all AIoT devices, indicators, and standards: This application embodiment supports the testing of three types of devices—AIoT terminals, AIoT base stations, and CW excitation sources—through the integrated design of five core modules. It covers both OTA air interface and conducted testing methods, strictly adheres to all requirements of 3GPP TS 38.191 / 194 / 195, and the test indicators include all core indicators such as the backscatter power of AIoT terminals, the BLER / MDR of AIoT base stations, and the average power of a single tone of CW excitation sources. This solves the problem of incomplete coverage of test objects and indicators in existing solutions, and significantly improves the completeness and standard compatibility of testing.

[0084] 2. Precisely adapts to the multi-channel configuration requirements of the AIoT n8 band: This application embodiment has customized the design of RF measurement and simulation equipment for the FDD mode of the AIoT n8 band. It supports R2D multi-bandwidth configuration of 200 / 400 / 600 / 800kHz and D2R device-specific bandwidth configuration from 3.75kHz to 2880kHz. At the same time, it can accurately realize the parameter configuration of SCS=15kHz, N_RB=1 / 2 / 3 / 4 and the corresponding minimum guard band, which solves the problem of poor channel adaptability of existing solutions and ensures that the test parameters are highly consistent with the 3GPPAIoT standard.

[0085] 3. Possesses flexible bidirectional simulation capabilities and adapts to multiple test scenarios: The bidirectional simulation device built on USRP and FPGA in this application embodiment can flexibly switch simulation logic according to the object under test (reader / tag / base station) to realize mutual simulation between AIoT terminal and AIoT base station without the need for additional dedicated test equipment. This solves the problem of lack of simulation capabilities in existing solutions and improves the flexibility and reusability of the test system.

[0086] 4. Full-process automation, significantly improving testing efficiency and accuracy: In this embodiment, the control device 105 achieves coordinated control of all devices based on the Visa+SCPI protocol. It has a built-in standardized testing process, eliminating the need for manual operation of instruments. From parameter configuration to report generation, the entire process is automated, which not only improves testing efficiency by more than 50%, but also eliminates measurement errors caused by human operation. The testing accuracy meets the high-precision verification requirements of the 3GPP standard, solving the problem of low automation in existing solutions.

[0087] 5. Supports 3GPP TS 38.195 conformance testing, keeping pace with industry standards: This application embodiment is designed for the 3GPP TS 38.195 standard under development, and includes functions such as transmitter modulation quality, spectrum compatibility, and OTA wireless testing procedures. It can complete the conformance verification of AIoT base stations and CW excitation sources, solving the problem of existing solutions being out of sync with industry standard development, and providing testing support for the standardized certification of AIoT products.

[0088] 6. Strong traceability of test results, adaptable to batch testing needs: This application embodiment supports the synchronous acquisition of test data from multiple instruments and the export of CSV format, automatically generating a standardized HTML report containing measured values, margins, and waveforms. It also has an abnormal data warning function, which can meet the traceability requirements of batch testing in the enterprise's R&D stage and product certification stage, and solves the problem of chaotic data management in existing solutions.

[0089] Based on the test system shown in the above embodiments, and the AIoT terminal OTA air interface test process and AIoT base station / CW excitation source conduction test process implemented by the test system, this application's embodiments are described with the control device as the execution subject. It should be noted that the implementation principle of the test method with a single execution subject can be understood in the same way as the relevant content of the above embodiments of the AIoT terminal and AIoT base station / CW excitation source test processes, and will not be repeated below.

[0090] This application provides a testing method applied to control equipment. For example... Figure 3 As shown, the method includes: Step 101: Obtain first information, which is the test configuration related to the first device, and the first device is the AIoT related device to be tested.

[0091] Here, the control device acquires first information input or selected by the user through the control device's interactive interface. The first device includes one or more of the following: an AIoT terminal, an AIoT base station, and a CW excitation source.

[0092] To adapt to various testing scenarios, in one embodiment, the first information includes at least the first configuration information of the first device and the second configuration information of the second device, and further includes one or more of the following: The first device type is an AIoT terminal, an AIoT base station, or a CW excitation source; Test types, including over-the-air tests or conduction tests; Test metric thresholds.

[0093] Here, the first configuration information may include operating parameters, and the second configuration information may include operating parameters and / or test metrics. Test metric thresholds can be consistent with the thresholds of relevant test metrics in the 3GPP standard.

[0094] For example, when the device under test is an AIoT terminal, the first device includes the AIoT terminal, and the second device includes at least a test device and a simulation device (such as the first simulation device mentioned above). The second device may also include a CW excitation source, the test type is an air interface test, and the test indicators include backscatter power, receiver sensitivity, RRM process, etc. The first configuration information of the first device may include n8 band channel parameters, such as n8 band uplink 880-915MHz, modulation method OOK / BPSK. The second configuration information of the second device may include n8 band channel parameters; for example, the n8 band channel parameters of the first simulation device include: 880-915MHz, R2D channel bandwidth (such as 200kHz), SCS=15kHz, N_RB=1, minimum guard band 2.5kHz, modulation method OOK / BPSK; as another example, the second configuration information of the CW excitation source includes the n8 band carrier frequency, such as n8 band uplink 880-915MHz.

[0095] For example, when the device under test is an AIoT base station, the first device includes the AIoT base station, and the second device includes at least a test device and a simulation device (such as the second simulation device mentioned above). The test type is conducted test, and the test indicators include BLER and / or MDR. The first configuration information of the AIoT base station includes n8 band channel parameters, such as n8 band downlink 925-960MHz, R2D channel bandwidth (such as 800kHz), SCS=15kHz, N_RB=4, and minimum guard band 32.5kHz; the second configuration information of the simulation device (such as the second simulation device mentioned above) includes, but is not limited to, n8 band downlink 925-960MHz, R2D channel bandwidth (such as 800kHz), SCS=15kHz, N_RB=4, and minimum guard band 32.5kHz; the second configuration information of the test device may include, but is not limited to, n8 band downlink 925-960MHz.

[0096] For example, when the device under test is a CW excitation source, the first device includes the CW excitation source, and the second device includes at least the test equipment. The test type is conducted test, and the test indicators include average power per tone. The first configuration information of the first device and the second configuration information of the second device include the n8 band carrier frequency, such as 880-915MHz uplink in the n8 band.

[0097] Step 102: Configure the first device and the second device based on the first information. The second device is used to test the first device and / or to simulate a peer device communicating with the first device.

[0098] Here, the control device configures the first and second devices based on the first information, enabling both devices to operate in the n8 frequency band. The control device can also configure the n8 frequency band channel parameters. The second device may include test equipment and / or simulation equipment. For the specific implementation process of configuring the first and second devices, please refer to step 2 of the device initialization process in the test procedure for AIoT terminals, AIoT base stations, and CW excitation sources described above; it will not be repeated here.

[0099] To improve the accuracy of test results, the device parameters can also be calibrated. Therefore, in one embodiment, before configuring the first and second devices based on the first information, the method further includes: Start the first device and the second device, and perform parameter calibration on the first device and the second device.

[0100] Here, the control device can send start commands to the first device and the second device to start them; it can also send calibration commands to the first device and the second device to perform parameter adjustments and state synchronization operations to ensure timing consistency between them.

[0101] Step 103: Test the first device based on the test procedure of the first device, and obtain the test data about the first device measured by the second device.

[0102] Step 104: Output a test report based on the first information and the test data.

[0103] To improve test success rate and efficiency, in one embodiment, the first information includes at least first configuration information of the first device and second configuration information of the second device; configuring the first device and the second device based on the first information includes: Configure the operating parameters of the first device based on the first configuration information; Configure the operating parameters of the second device and / or the test indicators for the first device based on the second configuration information.

[0104] Here, the second configuration information may include operating parameters and / or test metrics.

[0105] When the device under test is an AIoT terminal, the second device includes a simulation device and a testing device. The control device can configure the AIoT terminal's operating frequency band to 880-915MHz based on the first configuration information. Based on the second configuration information, the simulation device (such as the first simulation device mentioned above) is configured with the following operating parameters: n8 band uplink 880-915MHz, R2D channel bandwidth (e.g., 200kHz), SCS=15kHz, N_RB=1, minimum guard band 2.5kHz, and modulation method OOK / BPSK. Since the simulation device needs to simulate communication between the AIoT base station and the AIoT terminal, such as completing the RRM process interaction with the AIoT terminal, the simulation device can also be configured to record the process execution success rate. It can also be configured with a spectrum analyzer to test backscatter power, out-of-band emission, ACS, in-band / out-of-band blocking, and other indicators, and an oscilloscope to capture D2R timing signals, etc.

[0106] When the device under test is an AIoT base station, the second device includes a simulation device (such as the second simulation device mentioned above) and a test device. The control device can configure the operating parameters of the AIoT base station based on the first configuration information as follows: downlink 925-960MHz in the n8 band, R2D channel bandwidth (e.g., 800kHz), SCS=15kHz, N_RB=4, and minimum guard band 32.5kHz. The control device can be configured to operate in the 925-960MHz band and to calculate the BLER value based on the number of signal statistical block errors transmitted by the AIoT base station. At the same time, the MDR of the AIoT base station is tested. The spectrum analyzer completes the measurement of the transmitter modulation quality (pulse rise / fall time), spectrum compatibility, and other indicators of the AIoT base station under test.

[0107] When the device under test is a CW excitation source, the second device includes a test device. The control device can configure the n8 band carrier frequency for the CW excitation source based on the first configuration information; configure the test device to work in the n8 band; and test indicators such as average power of a single tone and frequency accuracy.

[0108] In a scenario where the device under test is an AIoT base station and / or an AIoT terminal, in one embodiment, the second device includes a testing device and a simulation device. The testing device is used to test the test indicators of the first device, and the simulation device is used to simulate a peer device communicating with the first device. The step of testing the first device based on the testing process of the first device and obtaining test data about the first device obtained by the second device includes: Based on the testing process of the first device, control the interaction between the first device and the corresponding simulation device; Obtain test data on the test indicators of the first device obtained by the second device.

[0109] Here, the control equipment has pre-set test procedures for various devices under test; please refer to the test procedures above for specific test procedures, which will not be repeated here.

[0110] To enhance the flexibility and reusability of the testing system, when testing AIoT terminals, a simulation device can be used to simulate the functions of an AIoT base station and interact with the AIoT terminal. Based on this, in one embodiment, the first device includes an AIoT terminal, and the second device further includes a CW excitation source capable of providing excitation signals to the AIoT terminal. The simulation device includes a first simulation device used to simulate the functions of an AIoT base station. The test process based on the first device, which controls the interaction between the first device and the corresponding simulation device, includes: Control the CW excitation source to send a single-tone CW excitation signal; The first simulation device is controlled to send a first signal, and the AIoT terminal is controlled to receive the first signal and backscatter the first signal.

[0111] Here, when the AIoT terminal is a passive terminal, the control device can send corresponding control commands to the CW excitation source to control the CW excitation source to send a single-tone carrier signal in the n8 frequency band; for example, controlling the CW excitation source to send a single-tone CW excitation signal to the AIoT terminal in the n8 frequency band to provide radio frequency energy for the AIoT terminal under test, and support the AIoT terminal under test to complete signal reflection and data modulation.

[0112] The control device can control the first emulation device to establish a communication connection with the AIoT terminal, and send corresponding control commands to the first emulation device and the AIoT terminal to control the first emulation device to send a first signal to the AIoT terminal, and to control the AIoT terminal to receive the first signal and backscatter the first signal. The first signal includes, but is not limited to, a reference measurement signal and / or an RRM process interaction signal. The AIoT terminal can also perform related operations corresponding to the received RRM process-related signals, such as sending uplink signals or uplink data to the first emulation device.

[0113] It should be noted that controlling the CW excitation source to send a single-tone CW excitation signal can be described as controlling the CW excitation source to send a single-tone CW excitation signal to the AIoT terminal. Similarly, controlling the first emulation device to send a first signal can be described as controlling the first emulation device to send a first signal to the AIoT terminal.

[0114] To enhance the flexibility and reusability of the testing system, when testing an AIoT base station, a simulation device can be used to simulate the functions of an AIoT terminal and allow it to interact with the AIoT base station. Based on this, in one embodiment, the first device includes an AIoT base station, and the simulation device includes a second simulation device used to simulate the functions of the AIoT base station. The test process based on the first device, which controls the interaction between the first device and the corresponding simulation device, includes: Control the AIoT base station to send a second signal; The second simulation device is controlled to receive the second signal, and the index value of the first test index of the AIoT base station is determined based on the second signal; Acquire test data on the test indicators of the first device obtained by the second device, including: Obtain the index value of the first test index determined by the second simulation device; Obtain test data on the second test index of the AIoT base station measured by the test equipment.

[0115] Here, controlling the AIoT base station to send a second signal can be described as controlling the AIoT base station to send a second signal to the second emulation device; for example, triggering the AIoT base station to send second information to the second emulation device based on the configured operating parameters can be achieved by sending a corresponding control command to trigger the AIoT base station to send second information to the second emulation device based on the configured operating parameters.

[0116] Controlling the second emulation device to receive the second signal can be described as controlling the second emulation device to receive the second signal sent by the AIoT base station. For example, triggering the second emulation device to receive the second signal sent by the AIoT base station on the configured operating frequency band can be specifically triggered by corresponding control commands.

[0117] The first test metric includes, but is not limited to, BLER and / or MDR, and the second test metric includes, but is not limited to, the transmitter modulation quality (pulse rise / fall time) and spectrum compatibility of the AIoT base station.

[0118] In a scenario where a CW excitation source is being tested, in one embodiment, the first device includes a CW excitation source, and the second device includes a testing device; The step of testing the first device based on the testing process of the first device and obtaining test data about the first device obtained by the second device includes: The system controls the CW excitation source to send a single-tone carrier signal based on the configured operating parameters, and acquires test data on the test indicators of the CW excitation source measured by the test equipment.

[0119] Here, the test metrics for CW excitation sources include, but are not limited to, single-tone average power and / or carrier frequency accuracy.

[0120] In one embodiment, the first information further includes one or more of the following: The first device type is an AIoT terminal, an AIoT base station, or a CW excitation source; Test types, including over-the-air tests or conduction tests; Test metric thresholds.

[0121] To implement the testing method on the control device side of this application embodiment, this application embodiment also provides a testing device, which is installed on the control device, such as... Figure 4 As shown, the device includes: The acquisition unit 401 is used to acquire first information, wherein the first information is a test configuration related to a first device, and the first device is an AIoT-related device to be tested; Configuration unit 402 is configured to configure the first device and the second device based on the first information, wherein the second device is used to test the first device and / or to simulate a peer device communicating with the first device; Test unit 403 is used to test the first device based on the test process of the first device and obtain test data about the first device measured by the second device. Output unit 404 is used to output a test report based on the first information and the test data.

[0122] In one embodiment, the first information includes at least first configuration information of the first device and second configuration information of the second device; the configuration unit 402 is specifically used to configure the operating parameters of the first device based on the first configuration information; and to configure the operating parameters of the second device and / or test indicators for the first device based on the second configuration information.

[0123] In one embodiment, the second device includes a testing device and a simulation device, wherein the testing device is used to test the test indicators of the first device, and the simulation device is used to simulate a peer device communicating with the first device; The test unit 403 is specifically used to control the interaction between the first device and the corresponding simulation device based on the test process of the first device; and to obtain test data on the test indicators of the first device measured by the second device.

[0124] In one embodiment, the first device includes an AIoT terminal, the second device further includes a CW excitation source that can provide excitation signals to the AIoT terminal, and the simulation device includes a first simulation device for simulating the function of an AIoT base station; The test unit 403 is specifically used to control the CW excitation source to send a single-tone CW excitation signal; and to control the first simulation device to send a first signal, and to control the AIoT terminal to receive the first signal and backscatter the first signal.

[0125] In one embodiment, the first device includes an AIoT base station, and the simulation device includes a second simulation device, which is used to simulate the functions of the AIoT base station; The test unit 403 is specifically used to control the AIoT base station to send a second signal, control the second simulation device to receive the second signal, and determine the index value of the first test index of the AIoT base station based on the second signal; and to obtain the index value of the first test index determined by the second simulation device, and obtain the test data of the second test index of the AIoT base station measured by the test device.

[0126] In one embodiment, the first device includes a CW excitation source, and the second device includes a testing device; The test unit 403 is specifically used to control the CW excitation source to send a single-tone carrier signal based on the configured operating parameters, and to acquire test data on the test indicators of the CW excitation source measured by the test equipment.

[0127] In one embodiment, before configuring the first device and the second device based on the first information, the apparatus further includes: The device initialization unit is used to start the first device and the second device and to perform parameter calibration on the first device and the second device.

[0128] In one embodiment, the first information further includes one or more of the following: The first device type is an AIoT terminal, an AIoT base station, or a CW excitation source; Test types, including over-the-air tests or conduction tests; Test metric thresholds.

[0129] In practical applications, the acquisition unit 401, the configuration unit 402, the test unit 403, the output unit 404, and the device initialization unit can be implemented by the processor in the test device in conjunction with the communication interface.

[0130] It should be noted that the testing device provided in the above embodiments is only illustrated by the division of the above program modules. In actual applications, the above processing can be assigned to different program modules as needed, that is, the internal structure of the device can be divided into different program modules to complete all or part of the processing described above. In addition, the testing device and the testing method embodiments provided in the above embodiments belong to the same concept, and their specific implementation process can be found in the method embodiments, which will not be repeated here.

[0131] Based on the hardware implementation of the above program modules, and in order to implement the method on the control device side of the embodiments of this application, the embodiments of this application also provide a control device, such as... Figure 5 As shown, the control device 500 includes: Communication interface 501 enables information exchange with other network nodes; The processor 502 is connected to the communication interface 501 to enable information interaction with other network nodes and, when running a computer program, executes the methods provided by one or more technical solutions on the control device side. The computer program is stored in the memory 503.

[0132] Specifically, the processor 502 is used for: Obtain first information, which is the test configuration related to the first device, and the first device is the AIoT-related device to be tested; The first device and the second device are configured based on the first information, and the second device is used to test the first device and / or to simulate a peer device communicating with the first device. The first device is tested based on the test process of the first device, and the test data about the first device measured by the second device is obtained; A test report is output based on the first information and the test data.

[0133] In one embodiment, the first information includes at least first configuration information of the first device and second configuration information of the second device; the processor 502 is specifically configured to configure the operating parameters of the first device based on the first configuration information; and to configure the operating parameters of the second device and / or test indicators for the first device based on the second configuration information.

[0134] In one embodiment, the second device includes a testing device and a simulation device, wherein the testing device is used to test the test indicators of the first device, and the simulation device is used to simulate a peer device communicating with the first device; The processor 502 is specifically used to control the interaction between the first device and the corresponding simulation device based on the test process of the first device; and to acquire test data on the test indicators of the first device measured by the second device.

[0135] In one embodiment, the first device includes an AIoT terminal, the second device further includes a CW excitation source that can provide excitation signals to the AIoT terminal, and the simulation device includes a first simulation device for simulating the function of an AIoT base station; The processor 502 is specifically used to control the CW excitation source to send a single-tone CW excitation signal; and to control the first simulation device to send a first signal, and to control the AIoT terminal to receive the first signal and backscatter the first signal.

[0136] In one embodiment, the first device includes an AIoT base station, and the simulation device includes a second simulation device, which is used to simulate the functions of the AIoT base station; The processor 502 is specifically used to control the AIoT base station to send a second signal, control the second simulation device to receive the second signal, and determine the index value of the first test index of the AIoT base station based on the second signal; and to obtain the index value of the first test index determined by the second simulation device, and obtain the test data of the second test index of the AIoT base station measured by the test device.

[0137] In one embodiment, the first device includes a CW excitation source, and the second device includes a testing device; The processor 502 is specifically used to control the CW excitation source to send a single-tone carrier signal based on the configured operating parameters, and to acquire test data on the test indicators of the CW excitation source measured by the test equipment.

[0138] In one embodiment, before configuring the first device and the second device based on the first information, the processor 502 is further configured to start the first device and the second device and perform parameter calibration on the first device and the second device.

[0139] In one embodiment, the first information further includes one or more of the following: The first device type is an AIoT terminal, an AIoT base station, or a CW excitation source; Test types, including over-the-air tests or conduction tests; Test metric thresholds.

[0140] It should be noted that the specific processing procedures of processor 502 and communication interface 501 can be understood by referring to the above method.

[0141] Of course, in practical applications, the various components in the control device 500 are coupled together through the bus system 504. It can be understood that the bus system 504 is used to realize the connection and communication between these components. In addition to the data bus, the bus system 504 also includes a power bus, a control bus, and a status signal bus. However, for the sake of clarity, in... Figure 5 The general designated all buses as Bus System 504.

[0142] The memory 503 in this embodiment is used to store various types of data to support the operation of the control device 500. Examples of such data include any computer program used to operate on the control device 500.

[0143] The methods disclosed in the embodiments of this application can be applied to, or implemented by, the processor 502. The processor 502 may be an integrated circuit chip with signal processing capabilities. During implementation, each step of the above method can be completed by the integrated logic circuitry of the hardware in the processor 502 or by instructions in software form. The processor 502 may be a general-purpose processor, a digital signal processor (DSP), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The processor 502 can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of this application. A general-purpose processor may be a microprocessor or any conventional processor, etc. The steps of the methods disclosed in the embodiments of this application can be directly manifested as execution by a hardware decoding processor, or execution by a combination of hardware and software modules in the decoding processor. The software modules may be located in a storage medium, specifically in memory 503. The processor 502 reads information from memory 503 and, in conjunction with its hardware, completes the steps of the aforementioned method.

[0144] In an exemplary embodiment, the control device 500 may be implemented by one or more application-specific integrated circuits (ASICs), DSPs, programmable logic devices (PLDs), complex programmable logic devices (CPLDs), field-programmable gate arrays (FPGAs), general-purpose processors, controllers, microcontrollers (MCUs), microprocessors, or other electronic components to perform the aforementioned method.

[0145] It is understood that the memory (memory 503) in this embodiment of the application can be volatile memory or non-volatile memory, or both. The non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), ferromagnetic random access memory (FRAM), flash memory, magnetic surface memory, optical disc, or compact disc read-only memory (CD-ROM); the magnetic surface memory can be disk storage or magnetic tape storage. The volatile memory can be random access memory (RAM), which is used as an external cache. By way of example, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Synchronous Static Random Access Memory (SSRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic Random Access Memory (SDRAM), Double Data Rate Synchronous Dynamic Random Access Memory (DDRSDRAM), Enhanced Synchronous Dynamic Random Access Memory (ESDRAM), SyncLink Dynamic Random Access Memory (SLDRAM), and Direct Rambus Random Access Memory (DRRAM).The memories described in the embodiments of this application are intended to include, but are not limited to, these and any other suitable types of memories.

[0146] In an exemplary embodiment, this application also provides a storage medium, namely a computer storage medium, specifically a computer-readable storage medium, such as a memory 503 storing a computer program or computer-executable instructions. The computer program or computer-executable instructions can be executed by the processor 502 of the control device 500 to complete the steps described in the aforementioned control device-side method. The computer-readable storage medium can be a memory such as FRAM, ROM, PROM, EPROM, EEPROM, Flash Memory, magnetic surface memory, optical disc, or CD-ROM; or it can be various devices including one or any combination of the above-mentioned memories.

[0147] By way of example, this application also provides a computer program product, including a computer program or computer-executable instructions, which are stored in a storage medium. The computer program or computer-executable instructions can be read from the storage medium and executed by the processor 502 of the control device 500 to complete the steps described in the aforementioned control device-side method.

[0148] In some embodiments, computer-executable instructions may take the form of programs, software, software modules, scripts, or code, written in any form of programming language (including compiled or interpreted languages, or declarative or procedural languages), and may be deployed in any form, including as stand-alone programs or as modules, components, subroutines, or other units suitable for use in a computing environment.

[0149] As an example, computer-executable instructions may, but do not necessarily, correspond to files in a file system. They may be stored as part of a file that holds other programs or data, for example, in one or more scripts in a Hyper Text Markup Language (HTML) document, in a single file dedicated to the program in question, or in multiple co-located files (e.g., files that store one or more modules, subroutines, or code sections).

[0150] As an example, computer-executable instructions can be deployed to execute on a single electronic device, or on multiple electronic devices located at one location, or on multiple electronic devices distributed across multiple locations and interconnected via a communication network.

[0151] It should be noted that terms such as "first" and "second" are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. "Multiple" can refer to two or more items, and "multiple" can refer to two or more items. The term "and / or" in this document merely describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Furthermore, the term "one or more" in this document refers to any combination of at least two of the multiple elements. For example, including one or more of A, B, and C can represent including any one or at least two or more elements selected from the set consisting of A, B, and C.

[0152] Furthermore, the technical solutions described in the embodiments of this application can be combined arbitrarily without conflict.

[0153] The above description is merely an embodiment of this application and is not intended to limit the scope of protection of this application. Any modifications, equivalent substitutions, and improvements made within the spirit and scope of this application are included within the scope of protection of this application.

Claims

1. A testing system, characterized in that, The testing system includes: Test equipment is used to test the test parameters of the device under test and obtain test data. Simulation equipment used to simulate the functions of AIoT terminals and / or AIoT base stations in an environment; The device under test includes one or more of AIoT terminals, AIoT base stations, and continuous wave (CW) excitation sources; The test environment module is used to provide a test environment and / or physical connection environment for the device under test; A control device is configured to acquire first information, wherein the first information is a test configuration related to the device under test; configure one or more of the test device, the simulation device, and the device under test based on the first information; control the test device and / or the simulation device to test the device under test based on the test process of the device under test, and acquire test data about the device under test measured by the test device; and output a test report based on the first information and the test data of the device under test.

2. The method according to claim 1, characterized in that, The simulation equipment includes: The first simulation device is used to simulate the function of an AIoT base station; and / or, The second simulation device is used to simulate the functions of an AIoT terminal.

3. The method according to claim 1, characterized in that, The testing equipment includes one or more of the following: A spectrum analyzer is used to measure test parameters related to the spectral characteristics of a device under test. An oscilloscope is used to measure test parameters related to the terminal-to-reader (D2R) channel. CW excitation source, used to transmit single-tone carrier signals and / or provide excitation signals for AIoT terminals; A circulator is used to achieve unidirectional transmission and isolation of signals.

4. The method according to any one of claims 1 to 3, characterized in that, The first information includes the operating parameters of the device under test, and one or more of the following: Test parameters of the device under test; Operating parameters of the simulation equipment; Operating parameters of the testing equipment The type of device under test (DUT) is an AIoT terminal, an AIoT base station, or a CW excitation source. Test types, including over-the-air tests or conduction tests; Test metric thresholds.

5. A testing method, characterized in that, The method includes: Obtain first information, which is the test configuration related to the first device, and the first device is the AIoT-related device to be tested; The first device and the second device are configured based on the first information, and the second device is used to test the first device and / or to simulate a peer device communicating with the first device. The first device is tested based on the test process of the first device, and the test data about the first device measured by the second device is obtained; A test report is output based on the first information and the test data.

6. The method according to claim 5, characterized in that, The first information includes at least the first configuration information of the first device and the second configuration information of the second device; The configuration of the first device and the second device based on the first information includes: Configure the operating parameters of the first device based on the first configuration information; Configure the operating parameters of the second device and / or the test indicators for the first device based on the second configuration information.

7. The method according to claim 5 or 6, characterized in that, The second device includes a testing device and a simulation device. The testing device is used to test the test indicators of the first device, and the simulation device is used to simulate a peer device communicating with the first device. The step of testing the first device based on the testing process of the first device and obtaining test data about the first device obtained by the second device includes: Based on the testing process of the first device, control the interaction between the first device and the corresponding simulation device; Obtain test data on the test indicators of the first device obtained by the second device.

8. The method according to claim 7, characterized in that, The first device includes an AIoT terminal, and the second device further includes a CW excitation source that can provide excitation signals to the AIoT terminal. The simulation device includes a first simulation device, which is used to simulate the function of an AIoT base station. The test process based on the first device, which controls the interaction between the first device and the corresponding simulation device, includes: Control the CW excitation source to send a single-tone CW excitation signal; The first simulation device is controlled to send a first signal, and the AIoT terminal is controlled to receive the first signal and backscatter the first signal.

9. The method according to claim 7, characterized in that, The first device includes an AIoT base station, and the simulation device includes a second simulation device, which is used to simulate the functions of the AIoT base station; The test process based on the first device, which controls the interaction between the first device and the corresponding simulation device, includes: Control the AIoT base station to send a second signal; The second simulation device is controlled to receive the second signal, and the index value of the first test index of the AIoT base station is determined based on the second signal; Acquire test data on the test indicators of the first device obtained by the second device, including: Obtain the index value of the first test index determined by the second simulation device; Obtain test data on the second test index of the AIoT base station measured by the test equipment.

10. The method according to claim 5 or 6, characterized in that, The first device includes a CW excitation source, and the second device includes a testing device; The step of testing the first device based on the testing process of the first device and obtaining test data about the first device obtained by the second device includes: The system controls the CW excitation source to send a single-tone carrier signal based on the configured operating parameters, and acquires test data on the test indicators of the CW excitation source measured by the test equipment.

11. The method according to any one of claims 5 to 6, 8 to 9, characterized in that, Before configuring the first device and the second device based on the first information, the method further includes: Start the first device and the second device, and perform parameter calibration on the first device and the second device.

12. The method according to claim 6, characterized in that, The first information also includes one or more of the following: The first device type is an AIoT terminal, an AIoT base station, or a CW excitation source; Test types, including over-the-air tests or conduction tests; Test metric thresholds.

13. A control device, characterized in that, include: An acquisition unit is used to acquire first information, wherein the first information is a test configuration related to a first device, and the first device is an AIoT-related device to be tested; A configuration unit is configured to configure the first device and the second device based on the first information, wherein the second device is used to test the first device and / or to simulate a peer device communicating with the first device; The testing unit is used to test the first device based on the testing process of the first device and to obtain test data about the first device measured by the second device. The output unit is used to output a test report based on the first information and the test data.

14. A control device, characterized in that, include: Processor and communication interface; among which, The processor is configured to acquire first information, which is a test configuration related to a first device, wherein the first device is an AIoT-related device to be tested; configure the first device and a second device based on the first information, wherein the second device is used to test the first device and / or to simulate a peer device communicating with the first device; test the first device based on the test process of the first device, and acquire test data about the first device measured by the second device; and output a test report based on the first information and the test data.

15. A control device, characterized in that, This includes a processor and memory for storing computer programs or computer-executable instructions that can run on the processor. When the processor is used to run the computer program or computer-executable instructions, it performs the steps of the method according to any one of claims 5 to 12.

16. A storage medium having a computer program or computer-executable instructions stored thereon, characterized in that, When the computer program or computer-executable instructions are executed by a processor, they implement the steps of the method described in any one of claims 5 to 12.

17. A computer program product comprising a computer program or computer-executable instructions, characterized in that, The computer program or computer-executable instructions, when executed by a processor, implement the steps of the method according to any one of claims 5 to 12.

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