Crystal measuring device

Abstract

The embodiment of the specification provides a crystal measuring device. The device comprises a measuring module and a temperature control module, wherein the measuring module comprises a measuring chamber for placing a crystal to be measured and a radioactive source; the temperature control module is in thermal conduction with the environment in the measurement chamber and is configured to control the environment temperature in the measurement chamber.

Description

Technical Field

[0001] The present invention relates to the field of crystal measurement technology, and in particular to a crystal measurement device. Background Art

[0002] Scintillator crystals (such as LYSO scintillator crystals) have become important materials in the field of radiation detection due to their stable physical and chemical properties such as high density, high light output, fast attenuation and excellent scintillation performance. They are widely used in high-energy physics experiments, medical PET-CT imaging, environmental detection and other fields. Light output is one of the most important technical indicators of scintillator crystals. It indicates the ability of scintillator crystals to convert high-energy particles into visible light and determines the characteristic parameters of optoelectronic devices (such as light guides) that match them. When applied to radiation physics, the scintillation detection system composed of scintillator crystals with high light output can effectively reduce statistical fluctuations in experiments, improve experimental accuracy, and reduce the uncertainty of experimental measurements.

[0003] However, in practical applications, scintillation crystals usually involve temperature changes, which may cause changes in the atomic or electronic states inside the crystal, thereby affecting the generation and emission of visible light, and ultimately causing changes in the amount or intensity of light output.

[0004] Therefore, it is necessary to provide a crystal measurement device to enable users to understand the impact of temperature changes on the light output characteristics of scintillation crystals. Utility Model Content

[0005] One or more embodiments of the present specification provide a crystal measuring device, the device comprising a measuring module, the measuring module comprising a measuring chamber for placing a crystal to be measured and a radiation source; a temperature control module, the temperature control module is thermally connected to the environment in the measuring chamber and is configured to control the ambient temperature in the measuring chamber.

[0006] In some embodiments, the temperature control module includes a refrigerator and / or a heater; the refrigerator is configured to reduce the ambient temperature in the measurement chamber; the heater is configured to increase the ambient temperature in the measurement chamber.

[0007] In some embodiments, the refrigerator is a two-stage semiconductor refrigerator, and the temperature control range of the refrigerator is -40°C to the current ambient temperature.

[0008] In some embodiments, the heater is a nickel-chromium wire heater, and the temperature control range of the heater is from the current ambient temperature to 200°C.

[0009] In some embodiments, the measurement module also includes a measurement cabin, a light guide component and a measurement host; the measurement cabin includes a cabin wall, and the cabin wall encloses the measurement chamber; one end of the light guide component is arranged in the measurement chamber, and the other end is arranged in the measurement host, and the light guide component is configured to guide the light emitted by the crystal to be measured into the measurement host.

[0010] In some embodiments, a temperature measurement component is further disposed in the bulkhead or the measurement chamber, and the temperature measurement component is configured to detect the ambient temperature in the measurement chamber.

[0011] In some embodiments, a heat insulation layer is provided between the measurement cabin and the measurement host, and the heat insulation layer is made of a heat insulation material.

[0012] In some embodiments, the measurement host includes a photosensitive device and a test circuit, the photosensitive device is configured to receive the light guided by the optical waveguide component; the photosensitive device is electrically connected to a first power supply, and the test circuit is electrically connected to a second power supply.

[0013] In some embodiments, the optical waveguide assembly includes an optical waveguide and a photomultiplier tube, one end of the optical waveguide is disposed in the measurement chamber, and the other end is connected to the photomultiplier tube; the end of the photomultiplier tube away from the optical waveguide is connected to the photosensitive device.

[0014] In some embodiments, the measurement host further includes a photomultiplier tube cooling assembly configured to adjust the temperature of the photomultiplier tube. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] This specification will be further described in the form of exemplary embodiments, which will be described in detail by the accompanying drawings. These embodiments are not restrictive, and in these embodiments, the same number represents the same structure, wherein:

[0016] Figure 1 is an exemplary schematic diagram of a crystal measurement device according to some embodiments of the present specification;

[0017] Figure 2 is an exemplary schematic diagram of a crystal measuring device according to some other embodiments of this specification;

[0018] Figure 3 is an exemplary module diagram of a crystal measurement device according to some embodiments of the present specification.

[0019] In the figure: 110, measurement module, 120, temperature control module,

[0020] 10. Crystal to be measured; 20. Radiation source; 30. Measuring cabin; 31. Measuring chamber; 32. Cabin wall; 40. Optical guide assembly; 41. Optical guide tube; 42. Photomultiplier tube; 43. Silicone oil layer; 50. Measuring host; 51. Photosensitive device; 52. Test circuit; 53. Photomultiplier tube cooling assembly; 60. Thermal insulation layer. DETAILED DESCRIPTION

[0021] In order to more clearly illustrate the technical solutions of the embodiments of this specification, the following is a brief introduction to the drawings required for the description of the embodiments. Obviously, the drawings described below are only some examples or embodiments of this specification. For ordinary technicians in this field, this specification can also be applied to other similar scenarios based on these drawings without creative work. Unless it is obvious from the language environment or otherwise explained, the same reference numerals in the figures represent the same structure or operation.

[0022] It should be understood that the "system", "device", "unit" and / or "module" used herein are a method for distinguishing different components, elements, parts, portions or assemblies at different levels. However, if other words can achieve the same purpose, the words can be replaced by other expressions.

[0023] As shown in this specification and claims, unless the context clearly indicates an exception, the words "a", "an", "an" and / or "the" do not refer to the singular and may also include the plural. Generally speaking, the terms "comprise" and "include" only indicate the inclusion of the steps and elements that have been clearly identified, and these steps and elements do not constitute an exclusive list. The method or device may also include other steps or elements.

[0024] Figure 1 is an exemplary schematic diagram of a crystal measurement device according to some embodiments of the present specification; Figure 2 is an exemplary schematic diagram of a crystal measuring device according to some other embodiments of this specification; Figure 3 is an exemplary module diagram of a crystal measurement device according to some embodiments of the present specification.

[0025] like Figure 1-Figure 3 As shown, the crystal measurement device 100 includes a measurement module 110 and a temperature control module 120. In some embodiments, the measurement module 110 includes a measurement chamber 31 for placing the crystal 10 to be measured and the radiation source 20. The temperature control module 120 is thermally connected to the environment in the measurement chamber 31 and is configured to control the ambient temperature in the measurement chamber 31.

[0026] The measurement module 110 is a module used to measure the light output and other characteristics of the crystal 10 to be tested. The light output of the crystal 10 to be tested can reflect the ability of the crystal 10 to convert the kinetic energy of high-energy particles (such as X-rays, gamma rays, etc.) into visible light. The higher the light output of the crystal 10 to be tested, the stronger the ability of the crystal 10 to convert the kinetic energy of high-energy particles into visible light.

[0027] In some embodiments, the measurement module 110 may include a plurality of devices or components, such as the measurement cabin 30, the optical guide component 40, and the measurement host 50 described below.

[0028] The measurement chamber 31 is a chamber for placing the crystal 10 to be measured and the radiation source 20. In some embodiments, the measurement chamber 31 can be designed in various structural shapes, such as cylindrical, conical, etc.

[0029] The radiation source 20 refers to a substance or entity made of radioactive material that can produce radiation. In some embodiments, the radiation source 20 can be 60 Co or 137 Cs isotope gamma radiation source.

[0030] The crystal 10 to be tested refers to a crystal that can convert the kinetic energy of high-energy particles into visible light under the impact of high-energy particles. In some embodiments, the crystal 10 to be tested is a scintillating crystal, including but not limited to cerium-doped lutetium yttrium silicate (Ce:LYSO, referred to as LYSO scintillating crystal).

[0031] In some embodiments, the radiation source 20 may be located directly above the crystal to be measured 10. For example, a clamping mechanism may be provided in the measurement chamber 31, and the radiation source 20 is provided in the clamping mechanism and is located on the extension line of the central axis of the crystal to be measured 10.

[0032] In some embodiments, radiation such as X-rays or gamma rays generated by the radiation source 20 will be incident on the crystal 10 to be tested, and the radiation will be absorbed by the crystal 10 to be tested to produce visible light or light. Other components of the measurement module 110 will transmit and process the light to obtain the light output of the crystal 10 to be tested.

[0033] For more information about the measurement module 110 , please refer to the relevant description below.

[0034] The temperature control module 120 is a module for controlling the ambient temperature in the measurement chamber 31 . The ambient temperature in the measurement chamber 31 can represent the degree of heat or cold in the measurement chamber 31 .

[0035] In some embodiments, the temperature control module 120 can control the ambient temperature in the measurement chamber 31 in various ways. For example, the temperature control module 120 can include a thermostat and the like.

[0036] In some embodiments, the temperature control module 120 may include a refrigerator (not shown). In some embodiments, the temperature control module 120 may include a heater (not shown). In some embodiments, the temperature control module 120 may include a refrigerator and a heater. The refrigerator is configured to reduce the ambient temperature in the measurement chamber 31, and the heater is configured to increase the ambient temperature in the measurement chamber 31.

[0037] In some embodiments, the refrigerator is a two-stage semiconductor refrigerator, and the temperature control range of the refrigerator is -40°C to the current ambient temperature.

[0038] A semiconductor refrigerator is a device that uses the thermoelectric effect of semiconductors to produce cold air. It is composed of thin sheets of two different materials, and the flow of electrons on the material sheets is controlled by electric current to achieve the effect of cooling. In some embodiments, the semiconductor refrigerator may include a single-stage semiconductor refrigerator and a two-stage semiconductor refrigerator. Since the semiconductor refrigerator has the characteristics of no noise, no vibration, no need for refrigerant, small size, light weight, sustainable operation, and no pollution source, and compared with the single-stage semiconductor refrigerator, the two-stage semiconductor refrigerator has a stronger cooling capacity, the refrigerator is preferably a two-stage semiconductor refrigerator, which can achieve fast and stable continuous cooling. In some embodiments, the semiconductor refrigerator can also achieve heating by reversing the power supply.

[0039] It should be noted that, in addition to the two-stage semiconductor refrigerator, other types of refrigerators may also be used, and this specification does not limit this.

[0040] The temperature control range of the refrigerator refers to the temperature adjustment range that the refrigerator can achieve. In some embodiments, the temperature control range of the refrigerator can be -40°C to the current ambient temperature. That is to say, when the current temperature of the environment in which the measurement chamber 31 is located is higher than -40°C, the refrigerator can reduce the ambient temperature in the measurement chamber 31 by cooling, thereby reaching the lower limit of the temperature within the temperature control range. Among them, the current ambient temperature refers to the current temperature of the environment in which the measurement chamber 31 is located, such as the current indoor temperature.

[0041] In some embodiments, the temperature control range of the refrigerator can be -50°C to the current ambient temperature. In some embodiments, the temperature control range of the refrigerator can be -30°C to the current ambient temperature. It is understandable that the user can select a refrigerator with a suitable temperature control range according to actual application requirements.

[0042] In some embodiments, the heater is a nickel-chromium wire heater, and the temperature control range of the heater is from the current ambient temperature to 200°C.

[0043] The nickel-chromium wire heater is an electric heating method that converts electrical energy into thermal energy by utilizing the resistance heating effect generated by current passing through nickel-chromium alloy wire. Since the nickel-chromium wire heater has the characteristics of fast heating speed, good stability at high temperature, and long service life, the heater is preferably a nickel-chromium wire heater, which can achieve rapid heating and is conducive to ensuring heating stability.

[0044] It should be noted that, in addition to the nickel-chromium wire heater, other types of heaters may also be used, and this specification does not limit this.

[0045] The temperature control range of the heater refers to the temperature adjustment range that the heater can achieve. In some embodiments, the temperature control range of the heater can be the current ambient temperature to 200° C. That is, when the current temperature of the environment in which the measurement chamber 31 is located is lower than 200° C., the heater can heat to increase the ambient temperature in the measurement chamber 31, thereby reaching the upper temperature limit of the temperature control range.

[0046] In some embodiments, the temperature control range of the heater may be from the current ambient temperature to 100° C. In some embodiments, the temperature control range of the heater may be from the current ambient temperature to 250° C. It is understandable that the user may select a heater with a suitable temperature control range according to actual application requirements.

[0047] In some embodiments, the temperature control module 120 further includes a temperature controller. The temperature controller can be used to control a refrigerator and / or a heater, thereby controlling the ambient temperature in the measurement chamber 31. Exemplarily, the temperature controller can include a semiconductor temperature controller, a thyristor temperature controller, or a refrigeration and heating temperature control device.

[0048] In some embodiments, the temperature controller may include two sub-temperature controllers to control the refrigerator and the heater respectively. For example, the temperature controller may include a semiconductor temperature controller and a thyristor temperature controller. Among them, the semiconductor temperature controller is used to control the refrigerator (such as a two-stage semiconductor refrigerator) to achieve temperature regulation within its temperature control range (such as -40°C to the current ambient temperature); the thyristor temperature controller is used to control the heater (such as a nickel-chromium wire heater) to achieve temperature regulation within its temperature control range (such as the current ambient temperature to 200°C).

[0049] In some embodiments, the temperature controller can realize dual control of the refrigerator and the heater. For example, the temperature controller can be a cooling and heating temperature control device, through which the temperature control range (such as -40°C to 200°C) formed by the superposition of the refrigerator and the heater can be realized.

[0050] In some embodiments, the temperature control module 120 controls the refrigerator and / or the heater via a temperature controller, thereby achieving accurate and continuous regulation and control of the ambient temperature in the measurement chamber 31 .

[0051] It should be noted that whether the temperature control module 120 needs to include both a refrigerator and a heater can be determined according to actual application requirements. For example, when the actual required temperature control range is the current ambient temperature to 100° C., the temperature control module 120 can include only a heater.

[0052] It can be understood that by setting a refrigerator and / or a heater, the ambient temperature in the measurement chamber 31 can be adjusted, and then the temperature of the crystal 10 to be measured can be adjusted, which can provide basic conditions for the measurement module 110 to measure the light output characteristics of the crystal 10 to be measured at low or high temperatures.

[0053] In some embodiments of the present specification, by using the measuring module 110 and the temperature control module 120, and the temperature control module 120 is thermally conductive with the environment in the measuring chamber 31, the temperature of the crystal 10 to be measured can be quickly adjusted and controlled, so that the measuring module 110 can measure the light output characteristics of the crystal 10 to be measured at different temperatures, thereby obtaining the influence of temperature on the light output characteristics of the crystal 10 to be measured. Moreover, the crystal measuring device 100 has a simple structure, is easy to implement, and has wide practicality.

[0054] In some embodiments, the measurement module 110 further includes a measurement cabin 30, a light guide assembly 40, and a measurement host 50. The measurement cabin 30 includes a cabin wall 32, which encloses a measurement chamber 31; one end of the light guide assembly 40 is disposed in the measurement chamber 31, and the other end is disposed in the measurement host 50. The light guide assembly 40 is configured to guide the light emitted by the crystal 10 to be measured into the measurement host 50.

[0055] The measurement cabin 30 refers to a structure for providing a measurement environment or condition. The cabin wall 32 refers to the outer peripheral wall of the measurement cabin 30, and the cabin wall 32 can enclose the measurement chamber 31. In some embodiments, the cabin wall 32 can be a single-layer wall. In some embodiments, the cabin wall 32 can be a double-layer wall or a multi-layer wall to meet the requirements of electromagnetic shielding, thereby helping to reduce electromagnetic interference and improve measurement accuracy.

[0056] In some embodiments, the cavity wall can be opened and closed to facilitate placement or replacement of the crystal 10 and the radiation source 20 to be measured in the measurement chamber 31. As an example only, the cavity wall can be designed with structures such as doors or movable covers, and the cavity wall can be opened and closed by opening or closing the doors or movable covers.

[0057] In some embodiments, a temperature measurement component is further disposed in the bulkhead 32 or the measurement chamber 31 , and is configured to detect the ambient temperature in the measurement chamber 31 .

[0058] The temperature measurement component refers to a device for detecting the ambient temperature in the measurement chamber 31. For example, the temperature measurement component may include a resistance thermometer, a pressure thermometer, and the like.

[0059] In some embodiments, the temperature measurement component can detect the ambient temperature in the measurement chamber 31 in real time and feed it back to the temperature controller. The temperature controller can control the operation of the refrigerator and / or heater according to the temperature, so that the ambient temperature in the measurement chamber 31 meets the actual temperature requirements.

[0060] It can be understood that by setting a temperature measurement component in the cavity wall or in the measurement chamber 31 and detecting the ambient temperature in the measurement chamber 31 in real time, it can be effectively ensured that the ambient temperature in the measurement chamber 31 meets the actual temperature requirement, thereby facilitating improving the measurement accuracy.

[0061] In some embodiments, a heat insulating layer 60 is disposed between the measurement cabin 30 and the measurement host 50 , and the heat insulating layer 60 is made of a heat insulating material.

[0062] The heat insulating layer 60 refers to a structural layer used to block the heat transfer between the measurement cabin 30 and the measurement host 50. The heat insulating material is a material that isolates the heat transfer. Exemplarily, the heat insulating material may include glass fiber, asbestos, foam plastic, etc.

[0063] In some embodiments, the thickness of the heat insulation layer 60 can be determined based on actual conditions, for example, according to the size of the light guide assembly or actual heat insulation requirements.

[0064] It can be understood that since the ambient temperature in the measuring chamber 31 needs to be maintained within a certain range (such as -40°C to 200°C) during measurement, an insulating layer 60 is provided between the measuring chamber 30 and the measuring host 50 to isolate heat transfer. On the one hand, it is beneficial to improve the stability and accuracy of temperature control, and on the other hand, it is also beneficial to protect the measuring host 50 and prevent the measuring host 50 from being burned or frozen.

[0065] The light guide assembly 40 refers to a device for guiding the light emitted by the crystal 10 to be measured into the measuring host 50. In some embodiments, the light guide assembly 40 can be any structure capable of conducting light, such as a light pipe, an optical fiber bundle, etc. In some embodiments, the light guide assembly 40 can include a light pipe 41 and a photomultiplier tube 42, wherein one end of the light pipe 41 is disposed in the measuring chamber 31, and the other end is connected to the photomultiplier tube 42.

[0066] The light guide 41 can be used to guide the light emitted by the crystal 10 to be measured into the photomultiplier tube 42. The light guide 41 has good light guiding performance.

[0067] In some embodiments, one end of the light pipe 41 is connected to the crystal to be measured 10, and the other end is connected to the photomultiplier tube 42. It can be understood that by arranging the light pipe 41 between the photomultiplier tube 42 and the crystal to be measured 10, not only the light collection efficiency can be improved, but also it can be ensured that when the temperature of the crystal to be measured 10 changes, the photomultiplier tube 42 can always maintain a constant temperature.

[0068] The photomultiplier tube 42 is a device for enhancing the intensity of the optical signal. The photomultiplier tube 42 can be directly connected or indirectly connected to the optical waveguide 41. In some embodiments, a silicone oil layer 43 is provided between the optical waveguide 41 and the photomultiplier tube 42, and the optical waveguide 41 and the photomultiplier tube 42 can be indirectly connected through the silicone oil layer 43. The silicone oil layer 43 refers to an optical interface layer formed by silicone oil. Since silicone oil not only has high viscosity and stability, but also has high refractive index and transparency, and can effectively transmit optical signals, the silicone oil layer 43 can effectively couple the light derived from the optical waveguide 41 (such as the light emitted by the crystal 10 to be measured) to the photomultiplier tube 42 while connecting the optical waveguide 41 and the photomultiplier tube 42, thereby improving the coupling efficiency of the photomultiplier tube 42.

[0069] In some embodiments, the end of the photomultiplier tube 42 away from the light pipe 41 is connected to the photosensitive device 51. In some embodiments, the photomultiplier tube 42 can receive the light guided by the light pipe 41, enhance it and transmit it to the photosensitive device 51. For more information about the photosensitive device 51, please refer to the relevant description below.

[0070] It can be understood that by setting up the light guide component 40, the light emitted by the crystal 10 to be measured is enhanced and then transmitted to the photosensitive component 51. The photosensitive component 51 can obtain the enhanced light signal, which is further processed by the measurement host 50, which is conducive to improving the measurement accuracy.

[0071] The measuring host 50 refers to a component for processing or analyzing the light emitted by the crystal 10 to be measured. In some embodiments, the measuring host 50 may include a photosensitive device 51 and a test circuit 52, and the photosensitive device 51 is configured to receive the light derived from the light guide component 40. In some embodiments, the photosensitive device 51 is electrically connected to the first power supply, and the test circuit 52 is electrically connected to the second power supply.

[0072] The photosensitive device 51 is a component used to receive the light from the light guide assembly 40 and process the light to output an electrical signal. Exemplary photosensitive devices 51 may include but are not limited to photodiodes and the like.

[0073] The first power supply refers to a high voltage power supply, which is used to power the photosensitive device 51. In some embodiments, the first power supply is a DC power supply, and its voltage range is 1500V to 1800V. The second power supply refers to a low voltage power supply, which is used to power the test circuit 52 (such as a matcher). In some embodiments, the second power supply is a DC power supply, and its voltage range is 12V to 14V. It can be understood that since the photosensitive device 51 is powered by a high voltage power supply and the test circuit 52 is powered by a low voltage power supply, that is, the crystal measurement device is powered by a negative high voltage power supply, this power supply method is more stable and safer.

[0074] The test circuit 52 refers to a component or assembly for further processing the electrical signal output by the photosensitive device 51. In some embodiments, the test circuit 52 may include a galvanometer, a shunt, a matcher, and the like.

[0075] In some embodiments, the test circuit 52 may receive the electrical signal output by the photosensitive device 51 , and analyze or process the electrical signal to obtain the light output characteristics of the crystal 10 to be tested.

[0076] In some embodiments, the measurement host 50 further includes a photomultiplier tube cooling assembly 53 configured to adjust the temperature of the photomultiplier tube 42 .

[0077] The photomultiplier tube cooling assembly 53 refers to a device for adjusting the temperature of the photomultiplier tube 42. In some embodiments, the photomultiplier tube cooling assembly 53 can be water-cooled, air-cooled, etc. to achieve temperature adjustment of the photomultiplier tube 42. For example, the photomultiplier tube cooling assembly 53 can include a photomultiplier tube cooling water jacket, and the temperature adjustment of the photomultiplier tube 42 is achieved by circulating cooling water in the photomultiplier tube cooling water jacket.

[0078] In some embodiments, the photomultiplier tube cooling assembly 53 may be disposed on the outer wall of the photomultiplier tube 42 to adjust the temperature of the photomultiplier tube 42. For example, the photomultiplier tube cooling assembly 53 may be disposed on both sides of the photomultiplier tube 42 along the axial direction of the photomultiplier tube 42. For another example, the photomultiplier tube cooling assembly 53 may be disposed on the photomultiplier tube 42.

[0079] It can be understood that by providing the photomultiplier tube cooling assembly 53 , it can be effectively ensured that the photomultiplier tube 42 is always within a suitable temperature range, thereby facilitating improving the stability of the photomultiplier tube 42 and the output signal quality.

[0080] It should be noted that the photosensitive device 51 can also be integrated into the photomultiplier tube 42. In this case, the photomultiplier tube 42 can receive the light guided by the light guide 41, enhance it, and further process it to output an electrical signal. Figure 2As shown, the measurement host 50 only includes a test circuit 52 and a photomultiplier tube cooling assembly 53 , and the first power supply is directly electrically connected to the photomultiplier tube 42 , and the first power supply is used to supply power to the photomultiplier tube 42 .

[0081] In some embodiments of the present specification, the measurement module 110 includes a measurement cabin 30, a light guide component 40 and a measurement host 50. The measurement cabin 30 can effectively reduce electromagnetic interference, and the light guide component 40 can enhance the light emitted by the crystal 10 to be measured and then introduce it into the measurement host 50, so that the measurement host 50 can better process or analyze the signal, thereby effectively ensuring the measurement accuracy of the crystal measurement device 100.

[0082] In some embodiments, the specific operation steps of the crystal measurement device 100 are as follows:

[0083] S1, placing a standard crystal in the measuring chamber 31, and making the measuring chamber 30 in a closed state;

[0084] S2, controlling the temperature control module 120 to work, adjusting the ambient temperature in the measuring chamber 31 to a preset temperature and maintaining it for a preset time, so that the temperature of the crystal 10 to be measured reaches the preset temperature;

[0085] S3, using the first power supply to power the photosensitive device 51, and measuring the background current I of the photosensitive device 51 b ;

[0086] S4, turning off the first power supply, placing the radiation source 20 in the measuring chamber 31, and making the measuring chamber 31 in a closed state;

[0087] S5, using the first power supply to supply power to the photosensitive device 51, and measuring the output current I0 of the photosensitive device 51;

[0088] S6, turning off the first power supply, replacing the standard crystal with the crystal to be measured 10, and keeping the measuring chamber 30 in a closed state;

[0089] S7, on the basis of keeping the magnification of the photomultiplier tube 42 unchanged, repeat S1 to S6, and measure the background current I of the photosensitive device 51 b The light output of the crystal 10 to be tested is calculated by comparing it with the output current I of the light sensing device 51 .

[0090] The standard crystal and the crystal to be tested 10 are of the same type and structure. The preset temperature may be any temperature value within the temperature control range (eg, -40°C to 200°C). In some embodiments, the preset temperature may be a temperature value at equal intervals within the temperature control range.

[0091] In some embodiments, the light output S of the crystal 10 to be tested can be calculated by the following formula:

[0092]

[0093] Where:

[0094] S0—calibration value of standard crystal, photon / MeV;

[0095] I0—output current of the photosensitive device 51 when using a standard crystal, A;

[0096] I b —background current of the photosensitive device 51, A;

[0097] I—output current of the photosensitive device 51 when using the crystal 10 to be tested, A.

[0098] In some embodiments of the present specification, the light output of the crystal 10 to be measured is measured by using a relative comparison method, which can effectively reduce the measurement error and improve the measurement accuracy compared to the absolute measurement method.

[0099] The basic concepts have been described above. Obviously, for those skilled in the art, the above detailed disclosure is only for example and does not constitute a limitation of this specification. Although not explicitly stated here, those skilled in the art may make various modifications, improvements and corrections to this specification. Such modifications, improvements and corrections are suggested in this specification, so such modifications, improvements and corrections still belong to the spirit and scope of the exemplary embodiments of this specification.

Claims

1. A crystal measuring device, characterized in that: include: A measuring module, the measuring module comprising a measuring chamber for placing a crystal to be measured and a radiation source; A temperature control module is thermally connected to the environment in the measurement chamber and is configured to control the environment temperature in the measurement chamber.

2. The crystal measuring device according to claim 1, characterized in that The temperature control module includes a refrigerator and / or a heater; The refrigerator is configured to reduce the ambient temperature within the measurement chamber; The heater is configured to increase the ambient temperature within the measurement chamber.

3. The crystal measuring device according to claim 2, characterized in that: The refrigerator is a two-stage semiconductor refrigerator, and the temperature control range of the refrigerator is -40°C to the current ambient temperature.

4. The crystal measuring device according to claim 2, characterized in that: The heater is a nickel-chromium wire heater, and the temperature control range of the heater is from the current ambient temperature to 200°C.

5. The crystal measuring device according to any one of claims 1 to 4, characterized in that: The measuring module also includes a measuring cabin, a light guide assembly and a measuring host; The measuring cabin comprises a cabin wall, and the cabin wall encloses and forms the measuring chamber; One end of the light guide component is disposed in the measurement chamber, and the other end is disposed in the measurement host. The light guide component is configured to guide the light emitted by the crystal to be measured into the measurement host.

6. The crystal measuring device according to claim 5, characterized in that A temperature measurement component is also provided in the bulkhead or the measurement chamber, and the temperature measurement component is configured to detect the ambient temperature in the measurement chamber.

7. The crystal measuring device according to claim 5, characterized in that: A heat insulation layer is arranged between the measuring cabin and the measuring host, and the heat insulation layer is made of heat insulation material.

8. The crystal measuring device according to claim 5, characterized in that: The measuring host comprises a photosensitive device and a test circuit, wherein the photosensitive device is configured to receive the light guided by the light guide component; The photosensitive device is electrically connected to a first power supply, and the test circuit is electrically connected to a second power supply.

9. The crystal measuring device according to claim 8, characterized in that The light guide assembly includes a light guide tube and a photomultiplier tube. One end of the light guide tube is arranged in the measurement chamber, and the other end is connected to the photomultiplier tube. One end of the photomultiplier tube away from the light guide tube is connected to the photosensitive device.

10. The crystal measuring device according to claim 9, characterized in that: The measurement host further includes a photomultiplier tube cooling assembly configured to adjust the temperature of the photomultiplier tube.

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