Rapid testing device for diode

Abstract

The utility model discloses a diode rapid testing device, which comprises a base and a testing part for testing a diode main body, and is characterized in that the testing part comprises a supporting seat fixed on the outer wall of the top of the base, and a bracket is welded on the upper surface of the supporting seat; the electric telescopic rod is fixed to the outer wall of the top of the support, and a tester is fixed to the output end of the electric telescopic rod through a pin shaft; the U-shaped seat is fixed on the outer wall of the bottom of the tester through a screw, and a sliding groove formed in the top of the U-shaped seat is movably connected with a sliding block. The two-way threaded rod is rotated to enable the sliding block to slide along the sliding groove formed in the top of the U-shaped base, so that the linear distance between the two probes is adjusted, the two probes are made to be matched with pins of diode bodies of different specifications, the height of the probes in the vertical direction can be rapidly adjusted through the electric telescopic rod, and the detection accuracy is improved. And when the probes are plugged with the pins of the diode main body, the diode main body is tested.

Description

Technical Field

[0001] The utility model relates to the technical field of diode testing, in particular to a diode fast testing device. Background Art

[0002] In the prior art, a diode is an electronic device made of semiconductor materials. A diode has two electrodes, a positive electrode and a negative electrode. When a forward voltage is applied between the two electrodes of the diode, the diode is turned on, and when a reverse voltage is applied, the diode is turned off. After the diode is produced, it needs to be tested for performance. The test items include forward working voltage test and on-resistance test. During the test process, when the number of diodes is large, the existing diode test device cannot effectively improve the test rate, which has certain shortcomings;

[0003] After searching, the Chinese patent application number 202121241827.3 discloses a semiconductor diode rapid testing device, which includes a heating box, a wireless temperature sensor, a heater, a terminal block, a connector, a wire, and a constant current source-voltmeter. A heating groove for placing the diode is provided on the top plate of the heating box, and a wireless temperature sensor is installed in the heating groove. A heater is provided inside the heating box, and the terminal block is installed above the heating box, and the terminal block is provided with wiring holes for facilitating the installation of the diode pins.

[0004] A semiconductor diode rapid testing device in the above patent has the following shortcomings: during the test, due to differences in the specifications of the diodes, the spacing distance between the two pins of the diodes is different, and the terminal block cannot be flexibly adjusted according to the distance between the pins of diodes of different specifications, and the diode pins and the terminal block cannot be accurately fixed, which easily causes the diode pins to bend. Utility Model Content

[0005] The utility model aims to solve the shortcomings in the prior art and provides a diode fast testing device.

[0006] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0007] A diode rapid testing device comprises a base and a testing unit for testing a diode body, wherein the testing unit comprises:

[0008] Support seat: It is fixed to the outer wall of the top of the base, and a bracket is welded on the upper surface of the support seat;

[0009] Electric telescopic rod: It is fixed to the outer wall of the top of the bracket, and the output end of the electric telescopic rod is fixed with a tester through a pin shaft;

[0010] U-shaped seat: It is fixed to the outer wall of the bottom of the tester by screws, and the slide groove opened on the top of the U-shaped seat is movably connected to the slider, and the bottom of the slider is fixed with a probe electrically connected to the tester by screws;

[0011] Bidirectional threaded rod: It is movably connected to the inner wall of the through hole opened on both sides of the U-shaped seat, and a nut matching the outer diameter of the bidirectional threaded rod is embedded on the surface of the slider;

[0012] Knob: It is fixed to one end of the bidirectional threaded rod by means of a snap connection.

[0013] As a further solution of the utility model: a mounting frame is fixed to the top outer wall of the base, a rotating motor is fixed to the top inner wall of the mounting frame, and the output end of the rotating motor is connected to a rotating rod through a coupling, and a turntable is welded to the top of the rotating rod.

[0014] As a further solution of the utility model: a discharge hole is provided on the surface of the turntable, and a discharge hole matching the discharge hole is provided on the top of the support seat.

[0015] As a further solution of the utility model: a suspension plate is fixed to the inner wall of the top of the support seat, a swing motor is fixed to the outer wall of one side of the suspension plate, and a frame is fixed to the output end of the swing motor through a pin.

[0016] As a further solution of the utility model: the through hole opened at the end of the frame is movably connected with a T-shaped rod, and the same spring is fixed between the inner wall of one side of the T-shaped rod and the inner wall of one side of the frame by means of a clamping connection.

[0017] As a further solution of the utility model: a swing plate is welded to one end of the T-shaped rod, and a roller is movably connected to the inner wall of the swing plate.

[0018] As a further solution of the utility model: a rubber pad is bonded to the outer wall of the top of the support seat, and a through hole matching the discharge hole is opened on the surface of the rubber pad.

[0019] As a further solution of the utility model: a partition is fixed on the top outer wall of the base.

[0020] Compared with the prior art, the utility model provides a diode rapid testing device, which has the following beneficial effects:

[0021] 1. By rotating the bidirectional threaded rod, the slider slides along the slide groove opened on the top of the U-shaped seat, so as to adjust the linear distance between the two probes, so that the two probes are adapted to the pins of the diode body of different specifications. The electric telescopic rod can be used to quickly adjust the height of the probe in the vertical direction. When the probe is plugged into the pin of the diode body, the diode body is tested.

[0022] 2. By setting the turntable to rotate, the turntable rotates the diode body to the test part for testing during the rotation process, and then the diode body after the test is led out from the discharge hole opened on the top of the support seat to realize the blanking of the diode body.

[0023] 3. A swing motor can be provided to drive the swing plate to rotate. The swing plate has different tilt directions, and qualified or unqualified diode bodies can be introduced to both sides of the partition respectively to screen the qualified and unqualified diode bodies.

[0024] The parts not involved in the device are the same as those in the prior art or can be implemented by using the prior art. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 This is a schematic diagram of the overall structure of a diode rapid testing device proposed by the utility model;

[0026] Figure 2 This is a schematic diagram of the side structure of a diode rapid testing device proposed by the utility model;

[0027] Figure 3 This is a schematic diagram of the partial explosion structure of a diode rapid testing device proposed by the utility model;

[0028] Figure 4 This is a schematic diagram of the structure of a diode rapid testing device proposed by the utility model when viewed from above;

[0029] Figure 5 This is a schematic diagram of the structure of a screening component of a diode rapid testing device proposed by the utility model;

[0030] Figure 6 The present invention is a schematic diagram of the structure of a test assembly of a diode rapid test device proposed by the present invention.

[0031] In the figure: 1-base, 2-support seat, 3-diode body, 4-turntable, 5-electric telescopic rod, 6-bracket, 7-partition, 8-rotating motor, 9-mounting frame, 10-swinging motor, 11-suspension plate, 12-discharging hole, 13-rubber pad, 14-rotating rod, 15-frame, 16-spring, 17-T-bar, 18-roller, 19-swinging plate, 20-tester, 21-slider, 22-knob, 23-probe, 24-U-shaped seat, 25-bidirectional threaded rod. DETAILED DESCRIPTION

[0032] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0033] In the description of the present invention, it should be understood that the terms "upper", "lower", "front", "back", "left", "right", "top", "bottom", "inside", "outside", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore should not be understood as a limitation on the present invention.

[0034] Embodiment 1:

[0035] A diode fast testing device, in order to improve the testing efficiency, such as Figure 1-6 As shown, it includes a base 1 and a test part for testing a diode body 3, and the test part includes:

[0036] Support seat 2: It is fixed to the top outer wall of the base 1 by bolts, and a bracket 6 is welded on the upper surface of the support seat 2;

[0037] Electric telescopic rod 5: It is fixed to the top outer wall of the bracket 6 by bolts, and the output end of the electric telescopic rod 5 is fixed with a tester 20 by a pin shaft;

[0038] U-shaped seat 24: It is fixed to the outer wall of the bottom of the tester 20 by screws, and the slide block 21 is slidably connected to the slide groove opened on the top of the U-shaped seat 24, and the probe 23 electrically connected to the tester 20 is fixed to the bottom of the slide block 21 by screws;

[0039] The bidirectional threaded rod 25 is rotatably connected to the inner wall of the through hole opened on both sides of the U-shaped seat 24, and a nut matching the outer diameter of the bidirectional threaded rod 25 is embedded on the surface of the slider 21;

[0040] Knob 22: fixed to one end of the bidirectional threaded rod 25 by means of a snap connection;

[0041] When the diode body 3 needs to be tested, the knob 22 is used to rotate the bidirectional threaded rod 25, and the circumferential outer wall of the bidirectional threaded rod 25 is provided with positive and negative threads. When the bidirectional threaded rod 25 rotates, the two sliders 21 move in opposite directions along the slide groove opened on the top of the U-shaped seat 24, thereby adjusting the straight-line distance between the two probes 23 so that the distance between the two probes 23 is adapted to the distance between the two pins of the diode body 3. During the test, the electric telescopic rod 5 is used to drive the two groups of probes 23 to move downward and then insert them into the two pins of the diode body 3 respectively, so as to test the diode body 3. The test items include forward working voltage test and on-resistance test, etc., and the test data is collected by the tester 20.

[0042] Furthermore, a mounting frame 9 is fixed to the top outer wall of the base 1 by bolts, a rotating motor 8 is fixed to the top inner wall of the mounting frame 9 by bolts, and the output end of the rotating motor 8 is connected to a rotating rod 14 by a coupling, and a turntable 4 is welded to the top of the rotating rod 14, and a discharge hole 12 is opened on the surface of the turntable 4, and a discharge hole adapted to the discharge hole 12 is opened on the top of the support seat 2;

[0043] The rotating motor 8 is used to drive the turntable 4 to rotate. After the diode body 3 is loaded through the discharge hole 12, the support seat 2 can receive the diode body 3 to prevent the diode body 3 from falling out of the discharge hole 12. When the rotating motor 8 drives the diode body 3 in one of the discharge holes 12 to rotate to the bottom of the probe 23, the diode body 3 is tested by the test part. During this process, other diode bodies 3 that have not been tested can be placed in the remaining discharge holes 12, so that the turntable 4 can continuously transport the diode body 3 to the test part for testing during the rotation process.

[0044] Furthermore, a rubber pad 13 is bonded to the outer wall of the top of the support seat 2, and a through hole matching the discharge hole 12 is opened on the surface of the rubber pad 13;

[0045] The rubber pad 13 is provided to reduce the friction between the bottom of the diode body 3 and the support seat 2 during the rotation feeding process, thereby protecting the diode body 3.

[0046] Working principle: when the diode body 3 needs to be tested, the diode body 3 is first placed in the discharge hole 12 in sequence, and then the rotary motor 8 is used to drive the turntable 4 to rotate. During the rotation, the turntable 4 drives the diode body 3 in the discharge hole 12 to rotate synchronously. When the diode body 3 rotates to the test part, the straight-line distance between the two probes 23 is adjusted so that the straight-line distance between the two probes 23 is adapted to the pins of the diode body 3. Then, the electric telescopic rod 5 is used to drive the two probes 23 to move down and contact the pins of the diode body 3, and then the diode body 3 is tested. After the test is completed, the rotary motor 8 is used to continue to drive the turntable 4 to rotate. When the diode body 3 after the test is completed rotates to the discharge hole opened on the top of the support seat 2, the diode body 3 falls from the discharge hole under the action of its own gravity, thereby realizing the discharge of the diode body 3.

[0047] Embodiment 2:

[0048] A diode fast testing device, such as Figure 1-6As shown, in order to effectively screen the diode body 3 after the test; this embodiment makes the following supplements on the basis of embodiment 1: the inner wall of the top of the support seat 2 is fixed with a suspension plate 11 by bolts, and the outer wall on one side of the suspension plate 11 is fixed with a swing motor 10 by bolts, and the output end of the swing motor 10 is fixed with a frame 15 by a pin, and the through hole opened at the end of the frame 15 is slidably connected with a T-shaped rod 17, and the inner wall on one side of the T-shaped rod 17 and the inner wall on one side of the frame 15 are fixed with the same spring 16 by a clamping method, and a swing plate 19 is welded at one end of the T-shaped rod 17, and the inner wall of the swing plate 19 is rotatably connected with a roller 18;

[0049] By providing a swing motor 10, the frame 15 and the swing plate 19 can be driven to rotate. During the rotation of the frame 15 and the swing plate 19, the elastic force of the spring 16 is used to effectively ensure the fit between the roller 18 and the inner wall of the top of the support seat 2. After the diode body 3 is tested and the diode body 3 is qualified, the swing motor 10 drives the swing plate 19 to tilt to one side, so that the qualified diode body 3 slides along the outer surface of the swing plate 19. When the diode body 3 is unqualified, the swing motor 10 drives the swing plate 19 to tilt to the other side, so that the diode body 3 slides along the swing plate 19 in another direction, thereby screening the qualified and unqualified diode bodies 3.

[0050] Furthermore, a partition plate 7 is fixed to the top outer wall of the base 1 by bolts;

[0051] The screened diode bodies 3 are separated by a partition 7 to avoid confusion between the two.

[0052] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A diode rapid testing device, comprising a base (1) and a testing unit for testing a diode body (3), characterized in that: The testing unit comprises: Support seat (2): fixed to the top outer wall of the base (1), and a bracket (6) is welded on the upper surface of the support seat (2); An electric telescopic rod (5) is fixed to the top outer wall of the bracket (6), and a tester (20) is fixed to the output end of the electric telescopic rod (5) via a pin shaft; The U-shaped seat (24) is fixed to the outer wall of the bottom of the tester (20) by screws, and the slide groove provided on the top of the U-shaped seat (24) is movably connected to the slider (21), and the bottom of the slider (21) is fixed with a probe (23) electrically connected to the tester (20) by screws; A bidirectional threaded rod (25) is movably connected to the inner wall of the through hole opened on both sides of the U-shaped seat (24), and a nut matching the outer diameter of the bidirectional threaded rod (25) is embedded on the surface of the slider (21); The knob (22) is fixed to one end of the bidirectional threaded rod (25) by means of a clamping connection.

2. A diode rapid testing device according to claim 1, characterized in that: A mounting frame (9) is fixed to the top outer wall of the base (1), a rotating motor (8) is fixed to the top inner wall of the mounting frame (9), and an output end of the rotating motor (8) is connected to a rotating rod (14) via a coupling, and a rotating disk (4) is welded to the top of the rotating rod (14).

3. A diode rapid testing device according to claim 2, characterized in that: The surface of the turntable (4) is provided with a discharge hole (12), and the top of the support seat (2) is provided with a discharge hole adapted to the discharge hole (12).

4. A diode rapid testing device according to claim 3, characterized in that: A suspension plate (11) is fixed to the inner wall at the top of the support seat (2), a swing motor (10) is fixed to the outer wall on one side of the suspension plate (11), and a frame (15) is fixed to the output end of the swing motor (10) via a pin.

5. A diode rapid testing device according to claim 4, characterized in that: A through hole formed at the end of the frame (15) is movably connected to a T-shaped rod (17), and a spring (16) is fixed between an inner wall on one side of the T-shaped rod (17) and an inner wall on one side of the frame (15) by means of a clamping connection.

6. A diode rapid testing device according to claim 5, characterized in that: A swing plate (19) is welded to one end of the T-shaped rod (17), and a roller (18) is movably connected to the inner wall of the swing plate (19).

7. A diode rapid testing device according to claim 6, characterized in that: A rubber pad (13) is bonded to the outer wall of the top of the support seat (2), and a through hole matching the discharge hole (12) is opened on the surface of the rubber pad (13).

8. A diode rapid testing device according to claim 7, characterized in that: A partition plate (7) is fixed to the top outer wall of the base (1).

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