Test carrier plate stock bin structure

By designing and testing the carrier sheet silo structure, using supporting blocks, limit blocks and sensors and other components, the problems of low storage efficiency and poor positioning of the chip test carrier board are solved, and efficient, stable and safe storage and inspection of the carrier board are achieved. process.

CN222248544UActive Publication Date: 2024-12-27SHENZHEN LIKE AUTOMATION EQUIP CO LTD
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Patent Information

Application Number
CN202421140292.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-05-23
Publication Date
2024-12-27
Estimated Expiration
2034-05-23

AI Technical Summary

Technical Problem

The storage and pick-up efficiency of existing chip test carrier boards is low, and the lack of positioning and monitoring protection measures can easily lead to detection errors.

Method used

A test-mounted sheet silo structure is designed, including mounting frame, placement mechanism and protective mechanism. The stacked storage and precise positioning of the carrier plate are achieved through supporting blocks, limit blocks, sensors and gratings, ensuring efficient operation and Safety.

Benefits of technology

It realizes efficient, stable storage and rapid access of the test carrier board, ensures the accuracy and security of the detection, and avoids errors in the carrier board during the access process.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of chip detection, in particular to a test carrier plate stock bin structure which comprises mounting frames, a placing mechanism is mounted on the mounting frames and comprises supporting blocks, and a plurality of supporting blocks which are symmetrically distributed at equal intervals are mounted on the opposite sides in the two mounting frames. Limiting blocks are installed at one ends of the multiple supporting blocks respectively, clamping grooves are formed in the bottom sides of one ends of the multiple supporting blocks, sensors are installed in the clamping grooves and located at the bottoms of the limiting blocks, and protection mechanisms are installed on the outer sides of the two installation frames. Test support plates can be inserted and stored in a laminated mode, storage is convenient and large in quantity, subsequent equipment can be conveniently and rapidly stored and taken, operation is convenient, efficiency is high, and stability is good.
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Description

Technical Field

[0001] The utility model relates to a material bin structure, in particular to a test carrier material bin structure, belonging to the technical field of chip detection. Background Art

[0002] Chip, also known as integrated circuit or microcircuit, microchip, wafer / chip, is a way of miniaturizing circuits in electronics and is often manufactured on the surface of semiconductor wafers. The development of chips has provided impetus for the production and manufacturing of electronic products, enabling more new electronic products to be applied and developed. During the chip production and testing process, chip test carriers need to be stored to facilitate access during subsequent testing or after the test is completed, making the operation more convenient.

[0003] At present, most chip test carriers are transported by conveyor belts or manually placed. This back-and-forth operation is inefficient and difficult to locate when placed. At the same time, there is a lack of monitoring and protection measures, which can easily cause errors in the subsequent storage and access of the carrier, affecting the normal detection of the chip. Utility Model Content

[0004] The purpose of the utility model is to provide a test carrier material bin structure in order to solve the above problems, which can insert and store test carriers in layers, is convenient for storage, has a large quantity, and is convenient for rapid access by subsequent equipment, is easy to operate, has high efficiency and good stability.

[0005] The utility model achieves the above-mentioned purpose through the following technical scheme, a test carrier material bin structure, including a mounting frame, a placing mechanism is installed on the mounting frame, the placing mechanism includes a support block, a plurality of equidistant and symmetrically distributed support blocks are installed on opposite sides inside the two mounting frames, a limit block is installed at one end of the plurality of support blocks respectively, a card slot is provided on the bottom side of one end of the plurality of support blocks, a sensor is installed inside the card slot, the sensor is located at the bottom of the limit block, and a protective mechanism is installed on the outside of the two mounting frames.

[0006] Preferably, the mounting frame is a frame-type structure, and the length of the support block is equal to the width of the mounting frame.

[0007] Preferably, the support block is provided with three fixing holes, and the support block is detachably connected to the inner side wall of the mounting frame through the fixing holes.

[0008] Preferably, a plurality of groups of threaded holes distributed at equal distances are respectively provided on opposite sides inside the two mounting frames, and three horizontally distributed threaded holes form a group.

[0009] Preferably, the support block is an "L"-shaped structure, and a guide groove is provided on the bottom side of the other end of the support block, and the guide groove is a trapezoidal structure.

[0010] Preferably, two connecting plates are detachably connected between the two mounting frames, and protective shells are detachably connected to the outer side walls of the two mounting frames.

[0011] Preferably, the four inner corners of the two mounting frames are respectively fixedly connected with reinforcement blocks, and the reinforcement blocks are of "L"-shaped structure.

[0012] Preferably, the protection mechanism comprises a connecting block, two groups of symmetrically distributed connecting blocks are respectively installed on the outer sides of the two mounting frames, a grating is connected between the two connecting blocks, and the two gratings are symmetrical to each other.

[0013] Preferably, the limit block is slidably connected to the support block, a limit rod is threadedly connected to the limit block, and the limit rod extends to the outside of the limit block to abut against the support block.

[0014] The beneficial effects of the utility model are as follows: by installing multiple groups of support blocks at equal intervals, it is convenient to distribute multiple test carriers in layers and on the inner side of the mounting frame, and it is convenient to store multiple test carriers. Moreover, by installing limit blocks, it is convenient to limit the test carriers after insertion, so that the test carriers can be better stored. With the coordinated installation of multiple sensors, it is convenient to detect the test carriers after insertion, so as to play a role in monitoring the presence or absence of the test carriers. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0016] Figure 2 for Figure 1 A schematic diagram of the enlarged structure of part A shown;

[0017] Figure 3 This is a schematic diagram of the connection structure between the limit block and the support block of the utility model;

[0018] Figure 4 It is a structural schematic diagram of the reinforcement block of the utility model.

[0019] In the figure: 1. mounting frame; 2. protective shell; 3. connecting plate; 4. protective mechanism; 401. grating; 402. connecting block; 5. placing mechanism; 501. supporting block; 502. threaded hole; 503. sensor; 504. limiting block; 505. fixing hole; 506. slot; 507. guide groove; 508. limiting rod; 6. reinforcement block. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0021] See also Figure 1-4 As shown, the test carrier material bin structure includes a mounting frame 1, on which a placing mechanism 5 is installed, and the placing mechanism 5 includes a support block 501, and a plurality of equidistant and symmetrically distributed support blocks 501 are installed on opposite sides inside the two mounting frames 1, and a limiting block 504 is respectively installed at one end of the plurality of support blocks 501, and a slot 506 is provided on the bottom side of one end of the plurality of support blocks 501, and a sensor 503 is installed inside the slot 506, and the sensor 503 is located at the bottom of the limiting block 504, and a protective mechanism 4 is installed on the outside of the two mounting frames 1.

[0022] As a technical optimization solution of the utility model, the mounting frame 1 is a frame-type structure, and the length of the support block 501 is equal to the width of the mounting frame 1, which is conducive to the stacking and distribution of multiple test carriers, and the test carriers are stored inside the mounting frame 1.

[0023] As a technical optimization solution of the utility model, three fixing holes 505 are provided on the support block 501, and the support block 501 is detachably connected to the inner wall of the mounting frame 1 through the fixing holes 505. The opening of the fixing holes 505 facilitates the detachable connection between the support block 501 and the inner side of the support frame by bolts, which is convenient for subsequent disassembly and maintenance.

[0024] As a technical optimization solution of the utility model, a plurality of groups of equally spaced threaded holes 502 are respectively provided on opposite sides inside the two mounting frames 1, and three horizontally distributed threaded holes 502 form a group. By opening the threaded holes 502, it is convenient to adjust the height of the support block 501 and to place test carriers of different heights.

[0025] As a technical optimization solution of the utility model, the support block 501 is an "L"-shaped structure, and a guide groove 507 is provided on the bottom side of the other end of the support block 501. The guide groove 507 is a trapezoidal structure, which is conducive to supporting and placing the test carrier board, and facilitates the smooth insertion of the test carrier board into the support block 501, making the operation more convenient.

[0026] As a technical optimization solution of the utility model, two connecting plates 3 are detachably connected between the two mounting frames 1, and protective shells 2 are detachably connected to the outer side walls of the two mounting frames 1, which is beneficial to the stable connection of the two mounting frames 1, so that the mounting frames 1 can be kept installed horizontally, and the protective cover can protect the mounting frames 1 and stabilize the installation.

[0027] The four inner corners of the two mounting frames 1 are respectively fixedly connected with reinforcement blocks 6, and the reinforcement blocks 6 are "L"-shaped structures. Through the installation of the reinforcement blocks 6, the mounting frames 1 are made more solid and less prone to deformation.

[0028] As a technical optimization solution of the utility model, the protective mechanism 4 includes a connecting block 402, and two groups of symmetrically distributed connecting blocks 402 are respectively installed on the outer sides of the two mounting frames 1. A grating 401 is connected between the two connecting blocks 402. The two gratings 401 are symmetrical to each other. The installation of the connecting block 402 facilitates the connection of the gratings 401. The two symmetrical gratings 401 are detected in correspondence with each other to play a role of safety protection.

[0029] As a technical optimization solution of the utility model, the limit block 504 is slidably connected to the support block 501, and the limit rod 508 is threadedly connected to the limit block 504. The limit rod 508 extends to the outside of the limit block 504 and contacts the support block 501. Through the contact and separation of the limit rod 508 and the support block 501, the position of the limit block 504 can be easily adjusted, and the position of the test carrier insertion can be easily adjusted and controlled.

[0030] When the utility model is used, firstly, two mounting frames 1 are connected by two connecting plates 3, and the protective shell 2 is detachably connected to the outer sides of the two mounting frames 1 for protection. After the two mounting frames 1 and the equipment are stably installed, a plurality of symmetrically distributed support blocks 501 are detachably installed with the inner sides of the mounting frames 1 through the cooperation of bolts and fixing holes 505, and the height adjustment of the support blocks 501 is convenient with the cooperation of threaded holes 502, and the insertion and placement of carriers of different heights is convenient. With the cooperation of guide grooves 507, the carriers can be smoothly slid into the support blocks 501 for storage, and a plurality of With the cooperation of multiple groups of support blocks 501, the carrier can be placed in a stacked distribution to increase the storage capacity. Under the control of the limit block 504, the insertion position of the carrier can be adjusted conveniently. At the same time, after the carrier is inserted into a certain position, the sensor 503 can detect the insertion of the carrier, which is convenient for signal feedback, thereby performing subsequent process work and playing a monitoring role. Then, symmetrical gratings 401 are installed on the outside of the two mounting frames 1. When the carrier is inserted, the carrier is between the two gratings 401. At this time, the equipment cannot work, which plays a role of safety monitoring to prevent accidents when storing and retrieving the carrier.

[0031] It is obvious to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be regarded as exemplary and non-restrictive from any point of view, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention. Any reference numeral in a claim should not be regarded as limiting the claim to which it relates.

[0032] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. A test plate carrier silo structure, comprising a mounting frame (1), characterized in that: A placement mechanism (5) is installed on the mounting frame (1), the placement mechanism (5) comprising a support block (501), a plurality of equidistant and symmetrically distributed support blocks (501) are installed on opposite sides inside the two mounting frames (1), a limiting block (504) is installed at one end of each of the plurality of support blocks (501), a card slot (506) is provided at the bottom side of one end of each of the plurality of support blocks (501), a sensor (503) is installed inside the card slot (506), and the sensor (503) is located at the bottom of the limiting block (504), and a protection mechanism (4) is installed on the outside of the two mounting frames (1).

2. The test carrier material bin structure according to claim 1, characterized in that: The mounting frame (1) is a frame-type structure, and the length of the support block (501) is equal to the width of the mounting frame (1).

3. The test carrier material bin structure according to claim 1, characterized in that: The support block (501) is provided with three fixing holes (505), and the support block (501) is detachably connected to the inner wall of the mounting frame (1) through the fixing holes (505).

4. The test carrier material bin structure according to claim 1, characterized in that: A plurality of groups of threaded holes (502) distributed at equal intervals are respectively provided on opposite sides of the two mounting frames (1), and three horizontally distributed threaded holes (502) form a group.

5. The test carrier material bin structure according to claim 1, characterized in that: The support block (501) is an "L"-shaped structure, and a guide groove (507) is provided on the bottom side of the other end of the support block (501), and the guide groove (507) is a trapezoidal structure.

6. The test carrier material bin structure according to claim 1, characterized in that: Two connecting plates (3) are detachably connected between the two mounting frames (1), and protective shells (2) are detachably connected to the outer side walls of the two mounting frames (1).

7. The test carrier material bin structure according to claim 1, characterized in that: Reinforcement blocks (6) are fixedly connected to the four inner corners of the two mounting frames (1), respectively, and the reinforcement blocks (6) are of an "L"-shaped structure.

8. The test carrier material bin structure according to claim 1, characterized in that: The protection mechanism (4) comprises a connection block (402), two groups of symmetrically distributed connection blocks (402) are respectively installed on the outside of the two mounting frames (1), a grating (401) is connected between the two connection blocks (402), and the two gratings (401) are symmetrical to each other.

9. The test carrier material bin structure according to claim 1, characterized in that: The limit block (504) is slidably connected to the support block (501); a limit rod (508) is threadedly connected to the limit block (504); the limit rod (508) extends to the outside of the limit block (504) to contact the support block (501).