Time resolution measuring instrument based on nanosecond pulse laser

Abstract

The utility model discloses a time resolution measuring instrument based on nanosecond pulse laser. The measuring instrument comprises a light source system, a multi-pass reflection system and an image acquisition system, the light source system adopts a nanosecond laser and is divided into test light and reference light by a beam splitter, the test light passes through the multi-pass reflection system, and the reference light passes through the multi-pass reflection system. A series of transmission light with different optical path differences generated by multiple times of reflection and transmission enters four CCD surfaces of the image acquisition system to interfere with the reference light filtered by the point diffraction system, each interference pattern correspondingly solves time slice complex amplitude information, and finally time integration is performed to obtain nanosecond pulse laser complex amplitude information. Compared with a traditional wavefront measurement technology, the device can reconstruct complex amplitude information of nanosecond pulse light waves with higher precision.

Description

Technical Field

[0001] The utility model relates to the technical field of laser wavefront detection, in particular to a time resolution measuring instrument based on nanosecond pulse laser. Background Art

[0002] Multi-path interferometry is an advanced optical measurement technology that uses the interference phenomenon of two or more coherent light waves to perform precise measurements. The core of this technology is the principle of optical interference, that is, when two or more coherent light beams meet in space, they interact with each other to form interference fringes.

[0003] Optical time-resolved measurement technology is a technology used to detect and measure fast physical processes that occur on a time scale. It can provide time resolution for transient events and is usually used to analyze changes in optical signals or material states in a very short time. Optical time-resolved measurement technology usually relies on short-pulse lasers or ultrafast optical systems.

[0004] Nanosecond pulse laser technology is a technology that uses lasers to generate extremely short pulses, where the duration of each pulse is in nanoseconds (1 nanosecond = 10 -9 Seconds). For nanosecond pulse lasers, there is a spectral phase interferometry method, which obtains the phase information of the pulse by measuring the spectral interference between two frequency-shifted pulses. This method can provide very accurate time-resolved phase and amplitude information and is suitable for the measurement of extremely short pulses, but its time resolution is limited and may be insufficient when dealing with long pulses or very complex pulse shapes. Utility Model Content

[0005] Based on the combination of the above-mentioned multiple technologies, the purpose of this utility model is to provide a time resolution measuring instrument based on nanosecond pulse laser. Figure 1 The measuring instrument comprises a light source system, a multi-pass reflection system and an image acquisition system. The light source system comprises a nanosecond pulse laser (1a), a beam splitter (1b), a point diffraction system (1c) and a reflector (1d). The multi-pass reflection system (2) is composed of two semi-reflective and semi-transparent glass sheets with adjustable spacing. The image acquisition system (3) is composed of four CCD cameras. The measuring device is as shown in the attached Figure 1 shown.

[0006] In order to better realize the utility model, the following setting structure is particularly adopted: the light source system (1) mainly adopts a nanosecond pulse laser (1a), which is divided into measurement light and reference light via a beam splitter (1b), wherein the measurement light is incident on the multi-pass reflection system (2) at a downward angle of 15 degrees to the horizontal plane, and the reference light source is filtered and expanded by the point diffraction system (1c), and then reflected by the reflector to be incident on the image acquisition system (3) at a upward angle of 15 degrees to the horizontal plane.

[0007] In order to better realize the utility model, the following setting structure is particularly adopted: the multi-pass reflection system is composed of two semi-transparent and semi-reflective glass lenses, wherein the distance between the two glass sheets can be adjusted, and the specific optical path is that the first glass sheet receives the light incident from the measuring light source (1a) and transmits it to the second glass sheet, and the light beam is semi-reflected and semi-transmitted on the second glass sheet, wherein the transmitted part is incident on the first CCD of the image acquisition system (3), and the reflected part is reflected back to the first glass sheet for a second reflection, and is semi-reflected and semi-transmitted again on the second glass sheet, and the above process is repeated four times in total, and finally four beams of transmitted light emitted by the multi-pass reflection system are respectively incident on four CCDs of the image acquisition system.

[0008] In order to better realize the utility model, the following setting structure is particularly adopted: the four CCDs of the image acquisition system (3) are placed at the end, respectively receiving four beams of transmitted light with equal light intensity emitted from the multi-pass reflection system and the expanded reference light from the reference light source, each transmitted light and the reference expanded light interfere with each other on the CCD, and the CCD collects the interference image information.

[0009] In summary, the utility model has the following beneficial effects and advantages:

[0010] The utility model utilizes a multi-path optical path, introduces an optical path difference into each beam of light, performs time-resolved measurement on the pulse light, and the complex amplitude information of each time slice superimposed and reconstructed pulse light complex amplitude information will be more accurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] In order to better illustrate the technical solutions involved in the embodiments and devices of the utility model, the following is a brief description of the drawings required for use in the embodiments and technical descriptions. Obviously, the drawings introduced below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on the drawings without any creative work.

[0012] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0013] The numbers in the figure are:

[0014] 1—light source system; 1a—nanosecond pulse laser; 1b—beam splitter; 1c—point diffraction system; 1d—reflector;

[0015] 2—Multi-pass reflection system;

[0016] 3—Image acquisition system. DETAILED DESCRIPTION

[0017] In order to more clearly demonstrate the technical solutions and device advantages involved in the utility model, the technical details and specific implementation methods of the utility model are described in detail below:

[0018] The utility model provides a time resolution measuring instrument based on nanosecond pulse laser, which mainly includes a light source system, a multi-pass reflection system and an image acquisition system. The main body of the light source system adopts a second pulse laser, and also includes a beam splitter, a point diffraction system and a reflector. The multi-pass reflection system is composed of two semi-transparent and semi-reflective glass sheets with adjustable spacing, and the image acquisition system is composed of four CCD cameras.

[0019] Embodiment 1:

[0020] First, a nanosecond pulse laser is placed. The nanosecond pulse light source (1a) generates test light and reference light after passing through a beam splitter (1b). The position of the laser is adjusted so that the test light is incident on the multi-pass reflection system (2) at an angle of 15 degrees downward from the horizontal. The reference light of the point diffraction system (1c) is adjusted so that it passes through the point diffraction system (1c) and a reflector (1d) and is incident on the CCD of the image acquisition system (3) at an angle of 15 degrees upward from the horizontal. The distance between the two glass sheets in the multi-pass reflection system (2) is adjusted. After a series of reflection and transmission processes, four beams of transmitted light emitted from the second glass sheet are respectively incident on the four CCDs of the image acquisition system (3), and interfere with the reference light source after filtering and beam expansion to form interference fringes.

[0021] The above description is only a specific implementation of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention.

Claims

1. A time resolution measuring instrument based on nanosecond pulse laser, comprising a light source system (1), a multi-pass reflection system (2) and an image acquisition system (3), characterized in that: The light source system (1) is composed of a laser, a beam splitter, a point diffraction system and a reflector, the multi-pass reflection system is composed of two semi-transparent and semi-reflective glass sheets with adjustable spacing, and the image acquisition system (3) is composed of four CCD cameras.

2. The time resolution measuring instrument based on nanosecond pulse laser according to claim 1, characterized in that: The light source system (1) uses a nanosecond pulse laser, and the light beam is divided into a measuring light source and a reference light source via a beam splitter (1b), wherein the measuring light source is incident on the multi-pass reflection system (2) at an angle of 15 degrees downward from the horizontal plane, and the reference light source is filtered and expanded by a point diffraction system (1c) and then incident on the image acquisition system (3) via a reflector (1d) at an angle of 15 degrees upward from the horizontal plane.

3. The time resolution measuring instrument based on nanosecond pulse laser according to claim 1, characterized in that: The multi-pass reflection system (2) is composed of two semi-transparent and semi-reflective glass lenses, wherein the distance between the two glass lenses can be adjusted. The specific optical path is that the first glass lens receives the light incident from the measuring light source (1a) and transmits it to the second glass lens. The light beam is semi-reflected and semi-transmitted on the second glass lens, wherein the transmitted part is incident on the first CCD of the image acquisition system (3), and the reflected part is reflected back to the first glass lens for a second reflection and is semi-reflected and semi-transmitted again on the second glass lens. The above process is repeated four times in total. Finally, four beams of transmitted light emitted by the multi-pass reflection system are respectively incident on four CCDs of the image acquisition system.

4. The time resolution measuring instrument based on nanosecond pulse laser according to claim 1, characterized in that: The CMOS or CCD camera in the image acquisition system (3) is placed at the end, and receives four beams of transmitted light with equal light intensity emitted from the multi-pass reflection system and the expanded reference light from the reference light source. Each transmitted light and the reference expanded light interfere with each other on the CCD, and the CCD collects interference image information.

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