Testing equipment for micro annular capacitor
By designing automated testing equipment and using clamping probes to test tiny annular capacitors, the problems of low testing efficiency and large deviation in the prior art are solved, and higher testing accuracy and factory efficiency are achieved.
Patent Information
- Application Number
- CN202323657600.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-29
- Publication Date
- 2025-01-17
- Estimated Expiration
- 2033-12-29
AI Technical Summary
In the prior art, the test efficiency of micro ring capacitors is low and there are test deviations, which affects the factory efficiency and quality of the capacitor.
A test equipment including a feeding part, a robot and a test part is designed, and the jaws of the first probe and the second probe are clamped to achieve automated testing, ensuring the accuracy of the test and improving factory efficiency. and quality.
Through automated testing, the test accuracy and factory efficiency of tiny ring capacitors are improved, the scrap rate of capacitors is reduced, and the testing accuracy and efficiency are achieved.
Smart Images
Figure CN222365045U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of electronic technology, in particular to a testing device for a tiny annular capacitor. Background Art
[0002] Currently, capacitors are widely used in various scenarios and devices. Capacitors can be divided into many types, including tiny ring capacitors.
[0003] Usually, capacitors need to undergo various performance tests before leaving the factory. Currently, small toroidal capacitors are usually tested manually.
[0004] However, manual operation has problems such as low testing efficiency and large testing deviation, which affects the efficiency and quality of capacitors leaving the factory.
[0005] It should be noted that the above introduction to the technical background is only for the convenience of providing a clear and complete description of the technical solutions of the present application and for the convenience of understanding by those skilled in the art. It cannot be considered that the above technical solutions are well known to those skilled in the art simply because they are described in the background technology section of the present application. Utility Model Content
[0006] In order to solve at least one of the above problems or other similar problems, an embodiment of the utility model provides a testing device for a tiny ring capacitor.
[0007] According to an embodiment of the utility model, a testing device for a tiny annular capacitor is provided, the testing device comprising:
[0008] A feeding portion, which is used to load the capacitor to be tested, wherein the capacitor is arranged in the feeding portion with the through holes facing the first direction;
[0009] a manipulator capable of moving to move the capacitor; and
[0010] At least one testing unit, each testing unit tests different parameters of the capacitor, and the testing unit is arranged at the end of the manipulator and moves with the manipulator.
[0011] The testing part includes a clamping claw part, which includes a first probe and a second probe for clamping a capacitor for testing, the first probe extends along the first direction, the outer diameter of the first probe is not greater than the inner diameter of the capacitor, and the second probe can move away from or close to the first probe.
[0012] In one or more embodiments,
[0013] The first probe includes a contact portion and a terminal portion disposed at an end of the contact portion.
[0014] The contact portion contacts the inner peripheral surface of the capacitor when the first probe is inserted into the capacitor.
[0015] A radial dimension of a portion of the terminal portion away from the contact portion is smaller than a radial dimension of a portion of the terminal portion close to the contact portion.
[0016] In one or more embodiments,
[0017] The terminal end is in a conical shape.
[0018] In one or more embodiments,
[0019] On the axial cross section of the contact portion, a portion of the contact portion for contacting the inner circumferential surface of the capacitor is a straight line or an arc protruding toward the capacitor.
[0020] In one or more embodiments,
[0021] The portion of the second probe that contacts the outer peripheral surface of the capacitor is a curved surface.
[0022] In one or more embodiments,
[0023] The second probe comprises a bending portion, and an outer side surface of a bending corner portion of the bending portion is the curved surface.
[0024] In one or more embodiments, the feeding part comprises:
[0025] a vibration bowl, comprising an annular guide groove, wherein the capacitor moves along the annular guide groove as the vibration bowl vibrates; and
[0026] A feeding platform is connected to the end of the annular guide groove, and the capacitors are arranged on the feeding platform in a manner that the through holes face the first direction.
[0027] In one or more embodiments, the testing device further comprises:
[0028] At least one bin for storing tested capacitors,
[0029] a bin driving unit, which drives the at least one bin along a predetermined track; and
[0030] A control unit is provided, wherein the control unit is connected to the testing unit and the bin driving unit, wherein the control unit determines the bin division result of the tested capacitor according to the testing result of the testing unit and sends a corresponding driving signal to the bin driving unit, wherein the bin driving unit drives at least one bin according to the driving signal and moves the bin corresponding to the bin division result to the lower part of the clamping claw that clamps the capacitor to be binned.
[0031] In one or more embodiments,
[0032] The testing device further includes a transfer table, which is disposed between the feeding part and the bin position corresponding to the bin division result, and the number of the transfer tables is one less than the number of the testing parts.
[0033] In one or more embodiments,
[0034] The at least one testing section includes a first testing section and a second testing section for testing different parameters of the resistor,
[0035] The manipulator comprises a swing arm and a driving mechanism for driving the swing arm, the first test section and the second test section are arranged at different positions of the swing arm,
[0036] The feeding part, the transfer table, and the bins corresponding to the bin division results are arranged in a straight line with the same intervals between them.
[0037] Driven by the driving mechanism, the swing arm moves between a first position and a second position. In the first position, the first test section and the second test section are respectively aligned with the feeding section and the transfer table; in the second position, the first test section and the second test section are respectively aligned with the transfer table and the bin position of the corresponding bin division result.
[0038] One of the beneficial effects of the embodiment of the utility model is that: through the testing equipment provided by the utility model, the testing unit uses a clamping claw part including a first probe and a second probe to clamp the tiny ring-shaped capacitor for testing, and the testing unit is arranged on a movable manipulator, thereby enabling automated testing of the tiny ring-shaped capacitor to be achieved, ensuring the test accuracy and improving the factory efficiency and quality of the tiny ring-shaped capacitor.
[0039] With reference to the following description and drawings, specific embodiments of the present invention are disclosed in detail, indicating the manner in which the principles of the present invention can be adopted. It should be understood that the embodiments of the present invention are not limited in scope. Within the scope of the terms of the appended claims, the embodiments of the present invention include many changes, modifications and equivalents.
[0040] Features described and / or illustrated with respect to one embodiment may be used in the same or similar manner in one or more other embodiments, combined with features in other embodiments, or substituted for features in other embodiments.
[0041] It should be emphasized that the term “include / comprises” when used herein refers to the presence of features, integers, steps or components, but does not exclude the presence or addition of one or more other features, integers, steps or components. BRIEF DESCRIPTION OF THE DRAWINGS
[0042] The elements and features described in one figure or one implementation of the utility model embodiment can be combined with the elements and features shown in one or more other figures or implementations. In addition, in the accompanying drawings, similar reference numerals represent corresponding parts in several figures, and can be used to indicate corresponding parts used in more than one implementation.
[0043] The included drawings are used to provide a further understanding of the embodiments of the utility model, which constitute a part of the specification, are used to illustrate the implementation of the utility model, and together with the text description, explain the principle of the utility model. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings:
[0044] Figure 1 is a schematic diagram of a test device according to an embodiment of the utility model;
[0045] Figure 2 It is another schematic diagram of the testing device of the embodiment of the utility model;
[0046] Figure 3 is a schematic diagram of a clamping claw portion of an embodiment of the present application;
[0047] Figure 4 is another schematic diagram of a clamping jaw portion according to an embodiment of the present application;
[0048] Figure 5 is another schematic diagram of a clamping claw portion according to an embodiment of the present application;
[0049] Figure 6 It is a schematic diagram of an embodiment of the present application including a feeding table. DETAILED DESCRIPTION
[0050] The foregoing and other features of the utility model will become apparent through the following description with reference to the accompanying drawings. In the description and the accompanying drawings, specific embodiments of the utility model are specifically disclosed, which show some embodiments in which the principles of the utility model can be adopted. It should be understood that the utility model is not limited to the described embodiments. On the contrary, the utility model includes all modifications, variations and equivalents falling within the scope of the attached claims. Various embodiments of the utility model are described below in conjunction with the accompanying drawings. These embodiments are only exemplary and are not limitations of the utility model.
[0051] In the embodiments of the present invention, the terms "first", "second", "upper", "lower", etc. are used to distinguish different elements from the title, but do not indicate the spatial arrangement or time order of these elements, etc., and these elements should not be limited by these terms. The term "and / or" includes any one and all combinations of one or more of the associated listed terms. The terms "comprise", "include", "have", etc. refer to the existence of the stated features, elements, components or components, but do not exclude the existence or addition of one or more other features, elements, components or components.
[0052] In the embodiments of the present invention, the singular forms "a", "the", etc. include plural forms and should be broadly understood as "a kind" or "a type" rather than being limited to the meaning of "one"; in addition, the term "said" should be understood to include both singular and plural forms, unless the context clearly indicates otherwise. In addition, the term "according to" should be understood as "at least in part according to...", and the term "based on" should be understood as "at least in part based on...", unless the context clearly indicates otherwise.
[0053] The embodiment of the utility model provides a testing device for a tiny ring capacitor.
[0054] Figure 1 It is a schematic diagram of a testing device according to an embodiment of the utility model. Figure 2 is another schematic diagram of the test equipment of the utility model embodiment, showing Figure 1 Observe the test equipment from different directions.
[0055] like Figure 1 and Figure 2 As shown, the testing device 10 includes a feeding portion 11 , a robot 12 , and at least one testing portion 13 .
[0056] in, Figure 1 and Figure 2 Two test units 13 are shown, but the present application is not limited thereto. The number of test units 13 may also be 1 or 3 or more than 3. In addition, the number may be determined according to the type of parameters to be tested. For example, the number of test units 13 may be equal to the type of parameters to be tested.
[0057] In an embodiment of the present application, the feeding portion 11 is used to load the capacitor to be tested. The capacitors are arranged in the feeding portion 11 with the through holes facing a first direction. The manipulator 12 can move to move the capacitors. Each test portion 13 tests different parameters of the capacitor respectively. The test portion 13 is arranged at the end of the manipulator 12 and moves with the manipulator 12.
[0058] In the embodiments of the present application, Figure 1 and Figure 2 As shown, the testing part 13 includes a clamping claw part 14, Figure 3 It is a schematic diagram of a clamping claw portion according to an embodiment of the present application.
[0059] like Figure 3 As shown, the clamping claw portion 14 includes a first probe 141 and a second probe 142 for clamping the capacitor 15 for testing. The first probe 141 extends along a first direction, and the outer diameter of the first probe 141 is not greater than the inner diameter of the capacitor 15. The second probe 142 can move away from or close to the first probe 141.
[0060] It can be seen from the above embodiments that the testing unit utilizes a clamping claw portion including a first probe and a second probe to clamp the tiny ring-shaped capacitor for testing, and the testing unit is arranged on a movable manipulator, thereby enabling automated testing of the tiny ring-shaped capacitor to be achieved, thereby ensuring the testing accuracy of the tiny ring-shaped capacitor and improving the factory efficiency and quality of the tiny ring-shaped capacitor.
[0061] like Figure 3 As shown, the annular capacitor refers to an annular capacitor with a through hole, that is, the annular capacitor includes an inner peripheral surface S1 as a first electrode and an outer peripheral surface S2 as a second electrode. In addition, the annular capacitor also includes two bottom surfaces (upper bottom surface S3 and lower bottom surface S4) to connect the inner peripheral surface S1 and the outer peripheral surface S2.
[0062] In the prior art, the annular capacitor is usually tested by manual operation. For example, the annular capacitor is usually placed on a setting table in a manner that the outer circumference S2 is in contact with the setting table, and a probe is manually pressed into the inner circumference S1 of the annular capacitor from a side opening of the annular capacitor, and the other probe abuts the outer circumference S2 of the annular capacitor. In this way, the test unit is electrically connected to the first electrode and the second electrode of the annular capacitor through the two probes, thereby realizing the detection of the annular capacitor.
[0063] However, the inventors of the present application have discovered that such a detection method has many disadvantages. For example, the setting table is usually rotating, so the annular capacitor is easy to rotate during the test, and the probe may scratch the capacitor, or the contact between the probe and the outer circumference of the annular capacitor may be insufficient, resulting in poor release. In addition, the contact between the probe and the inner circumference of the annular capacitor may be insufficient, resulting in poor contact. In addition, when the size of the annular capacitor is small, for example, the annular capacitor is a tiny annular capacitor with a radial dimension in the range of 0 to 10 mm or smaller, the manual operation requires high precision and it is difficult to ensure the reliability of the contact between the probe and the inner and outer circumferences of the capacitor. Therefore, such a method has the problems of large test errors, low test stability, and high capacitor scrap rate. In addition, for tiny annular capacitors, the manual operation method also has the problem of greater difficulty in loading, resulting in low test efficiency.
[0064] In the embodiment of the present application, the tiny annular capacitors are arranged in the feeding portion with the through holes facing the first direction, that is, in the feeding portion, the through holes of the tiny annular capacitors face the predetermined direction, for example, the first direction, that is, the predetermined direction, is the plumb direction, that is, Figure 1 The Y direction shown in the figure, so that the first probe extending along the same Y direction can be automatically inserted into the interior of the tiny annular capacitor, thereby realizing automated operation and improving test efficiency, but the present application is not limited to this. The first direction or the predetermined direction can also be an angle with the plumb bob direction, and the angle of the angle is, for example, within 45 degrees, such as within 30 degrees or within 10 degrees. In addition, the second probe can move away from or close to the first probe. In this way, after the first probe is inserted into the interior of the tiny annular capacitor, the second probe can move in a manner close to the first probe, so that it can contact and abut the outer peripheral surface of the tiny annular capacitor, thereby, at least a portion of the first probe inserted into the interior of the tiny annular capacitor can be in close contact with at least a portion of the inner peripheral surface of the tiny annular capacitor, so that the tiny annular capacitor can be reliably clamped by the first probe and the second probe, that is, the first probe and the second probe respectively achieve reliable electrical connection with the inner peripheral surface and the outer peripheral surface of the tiny annular capacitor, so that the test accuracy of the tiny annular capacitor can be ensured and damage to the capacitor can be avoided.
[0065] The structures of the first probe and the second probe are exemplarily described below.
[0066] like Figure 3 As shown, in one or more embodiments, the first probe 141 includes a contact portion 143 and a terminal portion 145 arranged at the end of the contact portion 144, the contact portion 144 contacts the inner circumferential surface S1 of the capacitor 15 when the first probe 141 is inserted into the capacitor 15, and the radial dimension of the portion of the terminal portion 145 away from the contact portion 144 is smaller than the radial dimension of the portion of the terminal portion 145 close to the contact portion 144.
[0067] Thus, the end portion 145 of the first probe 141 can play a guiding role in the process of inserting the capacitor, making it easier for the first probe 141 to be inserted into the capacitor, thereby facilitating further automatic clamping of the capacitor. However, the present application is not limited thereto, and the first probe 141 can also be in other shapes, such as a standard columnar shape.
[0068] like Figure 3 As shown, in one or more embodiments, the end portion 145 of the first probe 141 may be conical, thereby preventing damage to the capacitor 15 during the process of guiding the first probe 141 to insert into the capacitor 15. However, the present application is not limited thereto, for example, the end portion 145 of the first probe 141 may also be spherical.
[0069] like Figure 3As shown, in one or more embodiments, the portion of the second probe 142 for contacting the outer peripheral surface S2 of the capacitor 15 is a curved surface S, thereby ensuring reliable contact between the second probe 142 and the outer peripheral surface S2 of the capacitor 15. For example, when the outer diameter of the capacitor is uneven, even if the angle between the second probe 142 and the first probe 141 changes, reliable contact with the outer peripheral surface S2 of the capacitor 15 can be achieved through different portions of the curved surface S of the second probe 142, but the present application is not limited thereto. For example, the portion of the second probe 142 for contacting the outer peripheral surface S2 of the capacitor 15 can also be a plane or a rough surface, and the present application does not impose any limitation on this.
[0070] like Figure 3 As shown, in one or more embodiments, the second probe 142 may include a bending portion 146, and the outer side surface of the bending corner portion of the bending portion 146 is a curved surface, thereby, a curved surface for contacting the outer peripheral surface S2 of the capacitor 15 can be formed in a simple manner, and a reliable electrical connection can be achieved. However, the present application is not limited to this, for example, the second probe 142 can also be a straight strip, and a portion of the straight strip protrudes toward the capacitor to form a curved surface.
[0071] In one or more embodiments, on an axial cross section of the contact portion of the first probe, a portion of the contact portion for contacting the inner circumference of the capacitor is a straight line or an arc protruding toward the capacitor.
[0072] For example, Figure 4 and Figure 5 Two schematic diagrams of the clamping jaws of the embodiment of the present application are shown, as shown in FIG. Figure 4 As shown, the portion of the contact portion 144-1 of the first probe 141-1 that is used to contact the inner peripheral surface S1 of the capacitor 15 is a straight line. Figure 5 As shown, the portion of the contact portion 144-2 of the first probe 141-2 that is used to contact the inner circumference S1 of the capacitor 15 is an arc. Thus, reliable contact between the first probe and the inner circumference of the capacitor can be ensured, thereby achieving reliable electrical connection to ensure the accuracy of the test. The inventor of the present application has found that in the test performed using the test equipment of the embodiment of the present application, the accuracy of the capacitance test of the capacitor can reach ±1%, which can improve the accuracy of the test compared to the manual test results.
[0073] In an embodiment of the present application, the second probe can be moved away from or close to the first probe, so that before clamping the capacitor, the second probe is away from the first probe to prevent the second probe from interfering with the insertion of the first probe into the interior of the capacitor. After the first probe is inserted into the interior of the capacitor, the second probe can be moved from a position away from the first probe to a position close to the first probe, and the second probe abuts against the outer peripheral surface of the capacitor at a position close to the first probe, so that the first probe and the second probe are respectively in reliable contact with the inner peripheral surface and the outer peripheral surface of the capacitor, thereby ensuring the accuracy of capacitor detection.
[0074] In the embodiments of the present application, there is no limitation on the specific structure of the movable component for moving the second probe relative to the first probe. For example, a probe driving unit may be provided at the base end of the second probe. The probe driving unit may include, for example, a cylinder, but the present application is not limited thereto. The base end is the end opposite to the end of the second probe for contacting the outer peripheral surface of the capacitor. The probe driving unit drives the second probe under the control of the controller so that the second probe moves away from or approaches the first probe. The probe driving unit may drive the second probe in a manner that the second probe is translated as a whole or the end of the second probe is rotated around the base end. The present application does not impose any limitation on this.
[0075] In an embodiment of the present application, an elastic component may be connected to the end of the first probe, such as a spring, and the elastic component may be deformed to cause the first probe to displace in a first direction. Thus, even if the height of the capacitor is different at different clamping positions, the consistency of the depth of the first probe inserted into the capacitor can be ensured, thereby ensuring reliable contact between the first probe and the inner circumference of the capacitor.
[0076] In the embodiment of the present application, a limiting portion may be further provided at the end of the first probe, and the radial dimension of the limiting portion may be larger than the inner diameter of the capacitor, thereby preventing the first probe from being excessively inserted into the capacitor and ensuring that the second probe can contact the outer circumference of the capacitor.
[0077] In the embodiment of the present application, there is no limitation on the specific structure of the feeding part. Figure 1 and Figure 2 As shown, in one or more embodiments, the feeding portion 11 may include a vibration bowl 111 and a feeding table 112, the vibration bowl 111 includes an annular guide groove, the capacitor moves along the annular guide groove as the vibration bowl 111 vibrates, the feeding table 112 is connected to the end of the annular guide groove of the vibration bowl 111, and the capacitor is arranged on the feeding table 112 with the through holes facing the first direction.
[0078] Among them, the vibration bowl can also be called a vibration plate, a vibration feeding bowl, and a vibration bowl feeder. Regarding the vibration bowl, reference can be made to relevant technologies. For example, the vibration bowl may include a continuous annular guide groove arranged on the inner and outer circumferential surfaces. The vibration bowl can be fixed on a vibrator. For example, the vibrator can generate high-frequency vibrations through the piezoelectric effect. As a result, the capacitor can move on the annular guide groove as the vibration bowl vibrates, and the capacitor is aligned to the end of the annular guide groove. In addition, during the movement of the capacitor on the annular guide groove, if the outer circumferential surface of the capacitor contacts the annular guide groove, the capacitor will roll into the vibration bowl. In this way, it can be ensured that the capacitor aligned to the end of the annular guide groove is arranged in a manner with the through hole facing the first direction, that is, the bottom surface of the capacitor contacts the annular guide groove. In addition, a detection mechanism can also be provided at the upper end of the annular guide groove on the inner side of the vibration bowl. When it is detected that the bottom surface of the capacitor is not in contact with the annular guide groove, the capacitor is pushed into the vibration bowl, further ensuring that the capacitor aligned to the end of the annular guide groove is arranged in a manner with the through hole facing the first direction.
[0079] In an embodiment of the present application, the feeding table is connected to the end of the annular guide groove of the vibrating bowl, thereby ensuring that the capacitors are arranged on the feeding table with the through holes facing the first direction. For example, the feeding table can be integrally connected to the vibrating bowl, that is, the feeding table and the vibrating bowl can vibrate together, so that after the capacitor at the end of the feeding table is taken away by the clamping claw portion, the capacitor on the feeding table can move forward through vibration, ensuring that the end of the feeding table is reloaded with the capacitor, but the present application is not limited to this. For example, the feeding table may not vibrate. After the capacitor at the end of the feeding table is taken away by the clamping claw portion, the capacitor arranged on the annular guide groove moves forward under vibration and pushes the capacitor on the feeding table to move forward, thereby ensuring that the end of the feeding table is reloaded with the capacitor. Therefore, the clamping claw part only needs to clamp the capacitor at a predetermined position of the feeding table (for example, the end of the feeding table), which can improve the automation level. In this case, it is also possible to detect whether the predetermined position is loaded with a capacitor by an optical component facing the predetermined position of the feeding table, so that the manipulator determines the timing for the clamping claw part to grasp the capacitor under the control of the controller, which can further improve the automation level and improve the testing efficiency.
[0080] In the embodiments of the present application, there is no limitation on the specific structure of the manipulator. For example, the manipulator may include a movable swing arm and a driving mechanism for driving the swing arm. The driving mechanism may control the movement of the swing arm under the control of a controller. For the relevant contents of the controller controlling the manipulator, reference may be made to the existing related technologies and will not be introduced one by one here.
[0081] In the embodiment of the present application, there is no limitation on the specific structure of the feeding table. Figure 6 It is a schematic diagram of an embodiment of the present application including a feeding table.
[0082] like Figure 6As shown, the feeding platform 112 may be in the shape of a strip with a linear groove 113, and the capacitor 15 is arranged in the linear groove 113. The end of the feeding platform 112 may also include a stopper 114 to prevent the capacitor from falling from the feeding platform. However, the present application is not limited thereto, and the feeding platform may also be other structures, as long as the capacitors are arranged in the feeding part with the through holes facing the first direction.
[0083] in addition, Figure 1 and Figure 2 The feeding part 11 including the vibration bowl 111 and the feeding table 112 shown in the figure is only for exemplary illustration, but the present application is not limited thereto. The feeding part 11 may also be other structures. For example, the feeding part may only include a feeding table or a disc, and the capacitors are manually arranged in the feeding part with the through holes facing the first direction. The clamping part grabs the capacitors for detection through optical components and a controller.
[0084] In one or more embodiments, the testing device may further include at least one storage location for storing the tested capacitor. Figure 1 and Figure 2 It is shown that the test equipment includes two bins 16, but the present application is not limited to this. The number of bins 16 can also be 1 or 3 or more than 3, which can be determined according to the type of capacitor to be tested. For example, the number of bins 16 can be greater than or equal to the type of capacitor to be tested. In addition, two bins can be included to store capacitors with good test results and capacitors with defective test results, respectively.
[0085] In the embodiment of the present application, the test equipment may further include a bin driving unit 17 and a control unit, the bin driving unit 17 drives the bin 16 along a predetermined track 18, the control unit connects the test unit and the bin driving unit, the control unit determines the bin division result of the tested capacitor according to the test result of the test unit and sends a corresponding drive signal to the bin driving unit, the bin driving unit drives at least one bin according to the drive signal, and moves the bin corresponding to the bin division result to the bottom of the clamping claw holding the capacitor to be binned. In this way, automatic bin division can be achieved according to the test results, and compared with manual bin division, bin division errors can be avoided, further improving the factory efficiency and quality of capacitors.
[0086] It is worth noting that the above is only an exemplary description of the storage position, but the present application is not limited to this. The storage position can also be other structures. For example, the storage position can be a fixed-position structure, and a movable slide groove can be provided under the clamping claw part that clamps the capacitor to be separated. The upper end of the slide groove is located below the clamping claw part, and the lower end of the slide groove can be driven by the driving component to rotate to the corresponding storage position according to the separation result, thereby realizing automatic separation.
[0087] like Figure 1 and Figure 2As shown, in one or more embodiments, the testing device 10 further includes a transfer table 19, which is disposed between the feeding portion 11 and the bin position corresponding to the bin result (such as Figure 2 The number of the transfer tables 19 is one less than the number of the test units 13. Therefore, when testing two or more parameters of a capacitor, the capacitor that has completed the previous test can be placed on the transfer table by the corresponding clamping part, and the clamping part of the test unit for the next test can clamp the capacitor placed on the transfer table for the next test, thereby automatically completing the tests of various parameters that need to be performed.
[0088] In the embodiment of the present application, there is no limitation on the specific structure of the transfer table 19. For example, the transfer table may include a horizontal portion, and the capacitor can be placed in the horizontal portion with the through hole facing the first direction. Thus, the clamping claw portion can automatically clamp the capacitor from the transfer table, further improving the level of automation.
[0089] The following is an illustrative description using the test of two aspects of capacitor parameters as an example.
[0090] For example, Figure 1 and Figure 2 As shown, the test section includes a first test section 13a and a second test section 13b for testing different parameters of the resistor. For example, the first test section 13a can test the capacitance value of the capacitor, and the second test section 13b can test the insulation resistance value of the capacitor, but the present application is not limited to this.
[0091] like Figure 1 and Figure 2 As shown, the manipulator 12 includes a swing arm 121 and a driving mechanism for driving the swing arm 121 , and the first test part 13 a and the second test part 13 b are disposed at different positions of the swing arm 121 .
[0092] like Figure 1 and Figure 2 As shown, the feeding part 11, the transfer table 19, and the bin positions 16a corresponding to the bin division results are arranged in a straight line with the same intervals between them.
[0093] Driven by the driving mechanism, the swing arm 121 moves between the first position and the second position. In the first position, the first test part 13a and the second test part 13b are aligned with the feeding part 11 and the transfer table 19 respectively. In the second position, the first test part 13a and the second test part 13b are aligned with the transfer table 19 and the bin position 16a corresponding to the bin division result respectively.
[0094] Therefore, the swing arm 121 only needs to move between two positions to realize the transfer of capacitance from the feeding part to the testing part, the transfer of capacitance between the testing parts, and the transfer of capacitance between the testing part and the sub-bins.
[0095] For example, the transfer of a capacitor C1 is taken as an example for illustration.
[0096] After the capacitor C1 reaches the predetermined position of the feeding part 11, for example, the end of the feeding part 11, when the swing arm 121 is in the first position, the clamping portion 14a of the first testing portion 13a is aligned with the predetermined position of the feeding part 11, the capacitor C1 is grasped by the clamping portion 14a and the first parameter test of the capacitor is performed. When the swing arm 121 is transferred from the first position to the second position under the drive of the driving structure, the clamping portion 14a of the first testing portion 13a is aligned with the turntable 19, and the clamping portion 14a transfers the capacitor C1 to the turntable 19.
[0097] When the swing arm 121 moves from the second position to the first position, the clamping portion 14b of the second test portion 13b is aligned with the turntable 19, the capacitor C1 on the turntable 19 is grasped by the clamping portion 14b and the second parameter test of the capacitor is completed. When the swing arm 121 moves from the first position to the second position driven by the driving mechanism, the clamping portion 14b and the storage position 16a are aligned, and the clamping portion 14b transfers the capacitor C1 to the storage position 16a.
[0098] Thus, the capacitor C1 test and binning can be completed automatically. Therefore, compared with the manual operation method, the embodiment of the present application can greatly reduce the time required for the operation, improve the test efficiency, and ensure the accuracy of the operation.
[0099] In addition, when three or more parameters of a capacitor need to be tested, automated testing and binning can be performed with reference to the above description, which will not be introduced one by one here.
[0100] In an embodiment of the present application, the heights of the feeding part 11, the transfer table 19 and the storage position 16 can be the same, so as to ensure the consistency of the depth of the first probe inserted into the interior of the capacitor 15, but the present application is not limited to this. The heights of the feeding part 11, the transfer table 19 and the storage position 16 can also be different. In this case, an elastic component can be set at the end of the first probe, so as to ensure the consistency of the depth of the first probe inserted into the interior of the capacitor 15.
[0101] In one or more embodiments, the position for setting the capacitor in the feeding part 11 and the transfer table 19 may have a groove whose radial dimension is smaller than the outer diameter of the capacitor, so that when the first probe is inserted into the capacitor, the first probe can penetrate the capacitor, that is, Figures 3 to 5 As shown, the distal ends 145 of the first probes 141 , 141 - 1 , and 141 - 2 may protrude from the capacitor 15 , thereby improving the clamping reliability of the clamping claw portion 14 .
[0102] In the embodiment of the present application, although not shown in the figures, the embodiment of the present application may include a control unit electrically connected to the various components of the testing equipment. For example, the control unit may be a processor including, for example, a chip, such as a processor of a CNC machine tool. The control unit may be connected to and control the aforementioned vibrator, the aforementioned optical component, the manipulator 12, the testing unit 13, the clamping unit 14, the aforementioned probe driving unit, the bin driving unit 17 or the aforementioned driving component. The controller coordinates the actions of the various components through electrical signals to realize automatic testing and automatic binning of the capacitor. Regarding the electrical connection between the controller and the various components and the transmission of the corresponding electrical signals, reference may be made to the relevant technology, which will not be described one by one here.
[0103] In the embodiment of the present application, the various components of the testing device can be arranged on a platform, thereby making it easy to transfer the entire testing device.
[0104] It is worth noting that the above Figures 1 to 6 The test equipment of the embodiment of the present application is only schematically described, but the present application is not limited thereto. The specific contents of each structure or component can also refer to the relevant technology; in addition, Figures 1 to 6 Structures or components not shown, or reduced Figures 1 to 6 One or more structures or components. Figures 1 to 6 For components or elements not specifically specified, reference may be made to the relevant technology, and this application does not limit this.
[0105] Through the testing equipment provided by the utility model, the testing unit utilizes a clamping claw portion including a first probe and a second probe to clamp a tiny ring-shaped capacitor for testing, and the testing unit is arranged on a movable manipulator, thereby enabling automated testing of the tiny ring-shaped capacitor, ensuring test accuracy, and improving the factory efficiency and quality of the tiny ring-shaped capacitor.
[0106] The present application is described above in conjunction with specific implementation methods, but it should be clear to those skilled in the art that these descriptions are exemplary and are not intended to limit the scope of protection of the present application. Those skilled in the art can make various modifications and variations to the present application based on the spirit and principles of the present application, and these modifications and variations are also within the scope of the present application.
Claims
1. A testing device for a tiny ring capacitor, characterized in that: The test equipment includes: A feeding portion, which is used to load the capacitor to be tested, wherein the capacitor is arranged in the feeding portion with the through holes facing the first direction; a manipulator capable of moving to move the capacitor; and At least one testing unit, each testing unit tests different parameters of the capacitor, and the testing unit is arranged at the end of the manipulator and moves with the manipulator. The testing part includes a clamping claw part, which includes a first probe and a second probe for clamping a capacitor for testing, the first probe extends along the first direction, the outer diameter of the first probe is not greater than the inner diameter of the capacitor, and the second probe can move away from or close to the first probe.
2. The test device according to claim 1, characterized in that The first probe includes a contact portion and a terminal portion disposed at an end of the contact portion. The contact portion contacts the inner peripheral surface of the capacitor when the first probe is inserted into the capacitor. A radial dimension of a portion of the terminal portion away from the contact portion is smaller than a radial dimension of a portion of the terminal portion close to the contact portion.
3. The testing device according to claim 2, characterized in that The terminal end is in a conical shape.
4. The testing device according to claim 2, characterized in that On the axial cross section of the contact portion, a portion of the contact portion for contacting the inner circumferential surface of the capacitor is a straight line or an arc protruding toward the capacitor.
5. The testing device according to claim 2, characterized in that The portion of the second probe that contacts the outer peripheral surface of the capacitor is a curved surface.
6. The testing device according to claim 5, characterized in that The second probe comprises a bending portion, and an outer side surface of a bending corner portion of the bending portion is the curved surface.
7. The testing device according to any one of claims 1 to 6, characterized in that: The feeding part comprises: a vibration bowl, comprising an annular guide groove, wherein the capacitor moves along the annular guide groove as the vibration bowl vibrates; and A feeding platform is connected to the end of the annular guide groove, and the capacitors are arranged on the feeding platform in a manner that the through holes face the first direction.
8. The testing device according to any one of claims 1 to 6, characterized in that: The testing equipment also includes: At least one bin for storing tested capacitors, a bin driving unit, which drives the at least one bin along a predetermined track; and A control unit is provided, wherein the control unit is connected to the testing unit and the bin driving unit, wherein the control unit determines the bin division result of the tested capacitor according to the testing result of the testing unit and sends a corresponding driving signal to the bin driving unit, wherein the bin driving unit drives at least one bin according to the driving signal and moves the bin corresponding to the bin division result to the lower part of the clamping claw that clamps the capacitor to be binned.
9. The testing device according to any one of claims 1 to 6, characterized in that: The testing device further includes a transfer table, which is disposed between the feeding part and the bin position corresponding to the bin division result, and the number of the transfer tables is one less than the number of the testing parts.
10. The testing device according to claim 9, characterized in that The at least one testing section includes a first testing section and a second testing section for testing different parameters of the resistor, The manipulator comprises a swing arm and a driving mechanism for driving the swing arm, the first test section and the second test section are arranged at different positions of the swing arm, The feeding part, the transfer table, and the bins corresponding to the bin division results are arranged in a straight line with the same intervals between them. Driven by the driving mechanism, the swing arm moves between a first position and a second position. In the first position, the first test section and the second test section are respectively aligned with the feeding section and the transfer table; in the second position, the first test section and the second test section are respectively aligned with the transfer table and the bin position of the corresponding bin division result.