Photoelectric device test fixture

Abstract

The utility model relates to the technical field of photoelectric device testing, in particular to a photoelectric device testing clamp. The device comprises a fixing frame, an adjusting structure is arranged on the inner wall of the fixing frame, the adjusting structure comprises a screw rod, the screw rod is rotationally connected with the fixing frame, the arc surface of the screw rod is in threaded connection with two connecting blocks, the upper surfaces of the two connecting blocks are fixedly connected with positioning blocks, and the positioning blocks are fixedly connected with the fixing frame. Two reverse threads are formed in the arc surface of the screw rod, fixing blocks are fixedly connected to the two sides of the connecting block, two limiting rods are fixedly connected to the inner wall of the fixing frame, the two limiting rods are slidably connected with the fixing blocks, a plurality of telescopic rods are fixedly connected to one side of the positioning block, and the telescopic rods are fixedly connected to the other side of the positioning block. One end of each telescopic rod is fixedly connected with a round block, the arc face of each telescopic rod is sleeved with a spring, and the two ends of each spring are fixedly connected with the corresponding positioning block and the corresponding round block respectively. The problem that the photocell clamping test efficiency is reduced is solved.

Description

Technical Field

[0001] The utility model relates to the technical field of photoelectric device testing, in particular to a photoelectric device testing fixture. Background Art

[0002] Photoelectric devices include phototubes, photomultiplier tubes, photodiodes, phototransistors and photocells, etc. They are mainly photoconductive devices made using the photoelectric effect and have a wide range of applications in various fields, such as optics, modern communications, computers, etc.

[0003] With the development of science and technology, optoelectronic devices are widely used in all walks of life, including photovoltaic cells. Photovoltaic cells use the photovoltaic effect to directly convert the radiation energy of sunlight or other light sources into electrical energy. They are the basic components in solar power generation systems and supply energy for some spacecraft. Therefore, photovoltaic cells need to be tested before use. In most cases, personnel use alligator clips to clamp and limit the photocells, and then test them after clamping. However, the clamping force of the alligator clips is large and cannot be controlled, and the photocells are small in size and thin in thickness. The large clamping force of the alligator clips usually damages the photocells, causing the photocells to be damaged and unable to be tested. New photocells can only be used for re-clamping and testing, which greatly reduces the efficiency of clamping tests on photocells. Utility Model Content

[0004] The utility model aims to solve the shortcoming of reduced efficiency of photocell clamping test in the prior art and proposes a photoelectric device test fixture.

[0005] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme: a photoelectric device testing fixture, comprising a fixed frame, the inner wall of the fixed frame is provided with an adjustment structure, the adjustment structure comprises a screw, the screw is rotatably connected to the fixed frame, the arc surface of the screw is threadedly connected to two connecting blocks, the upper surfaces of the two connecting blocks are fixedly connected with positioning blocks, the arc surface of the screw is provided with two reverse threads, both sides of the connecting block are fixedly connected with fixed blocks, the inner wall of the fixed frame is fixedly connected with two limit rods, the two limit rods are slidably connected to the fixed block, one side of the positioning block is fixedly connected with a plurality of telescopic rods, one end of the plurality of telescopic rods is fixedly connected with a round block, the arc surface of the telescopic rod is sleeved with a spring, the two ends of the spring are respectively fixedly connected with the positioning block and the round block, and one end of the screw is fixedly connected with a turntable.

[0006] The effect achieved by the above components is: by setting the adjustment structure, personnel can clamp and fix the photoelectric device conveniently and quickly, making it convenient for personnel to test it, and the clamping force can be controlled during the clamping process to avoid damage to the photoelectric device, thereby improving the efficiency of clamping and testing the photoelectric device.

[0007] Preferably, the arc surface of the turntable is fixedly connected with an anti-slip sleeve, and the anti-slip sleeve is a rubber sleeve.

[0008] The effect achieved by the above components is that the anti-slip sleeve can increase the friction of the arc surface of the turntable, thereby preventing the hands of people from slipping when turning the turntable.

[0009] Preferably, an anti-skid pad is fixedly connected to one side of the round block, and the cross-section of the anti-skid pad is circular.

[0010] The effects achieved by the above components are: the anti-skid pad can increase the friction of the round block, so that the round block can clamp the photoelectric device more stably.

[0011] Preferably, cleaning cotton is fixedly connected to both sides of the connection block, and the cleaning cotton abuts against the screw.

[0012] The effect achieved by the above components is that the cleaning cotton can clean the screw rod, thereby achieving the effect of making the connecting block move more smoothly on the screw rod.

[0013] Preferably, an auxiliary structure is provided on the lower surface of the fixed frame, and the auxiliary structure includes a support plate, the support plate is fixedly connected to the fixed frame, the inner wall of the support plate is fixedly connected with a connecting column, the arc surface of the connecting column is rotatably connected with the positioning frame, the lower surface of the positioning frame is fixedly connected with two connecting blocks, the inner walls of the two connecting blocks are fixedly connected to the same rotating column, the arc surface of the connecting column is slidably connected with two positioning rings, the arc surfaces of the two positioning rings are fixedly connected with the moving block, a plurality of positioning grooves are provided on both sides of the positioning frame, the size of the positioning grooves is adapted to the size of the moving block, the arc surface of the rotating column is rotatably connected with two auxiliary blocks, the lower surfaces of the two auxiliary blocks are fixedly connected with the same fixed plate, the arc surface of the rotating column is slidably connected with two limiting rings, the arc surfaces of the two limiting rings are fixedly connected with the limiting block, and a plurality of connecting grooves are provided on one side of the auxiliary block, and the size of the connecting grooves is adapted to the size of the limiting block.

[0014] The effect achieved by the above components is: by setting the auxiliary structure, personnel can adjust the position of the fixed frame at multiple angles, thereby facilitating personnel to observe the optoelectronic device from multiple angles and facilitating personnel to more intuitively feel the effect of testing the optoelectronic device.

[0015] Preferably, the arc surface of the positioning ring is provided with anti-slip grooves, and the anti-slip grooves are evenly distributed on the positioning ring.

[0016] The effect achieved by the above components is that the anti-slip pattern can increase the friction of the positioning ring, thereby achieving the effect of making it convenient for personnel to move the positioning ring.

[0017] Preferably, two finger sleeves are fixedly connected to the arc surface of the limiting ring, and the cross-section of the finger sleeves is circular.

[0018] The effect achieved by the above components is that the finger sleeve can drive the limit ring to move, thereby achieving the effect of making it convenient for personnel to control the limit ring.

[0019] In summary, the beneficial effects of the utility model are:

[0020] In the present invention, when it is necessary to clamp and test the photoelectric device, a clamp is usually used to clamp the photoelectric device directly, and the photoelectric device is clamped on a workbench. Then, the corresponding equipment is used to test the performance and quality of the photoelectric device. However, this operation will cause the following problems. Since the strength of the clamp is not well controlled, the photoelectric device is often damaged. At this time, this problem can be well solved by setting an adjustment structure. First, the turntable is rotated with the help of an anti-slip sleeve. The anti-slip sleeve can increase the friction of the arc surface of the turntable, so as to avoid the hand slipping when the person rotates the turntable. The turntable drives the screw to rotate on the inner wall of the fixed frame. During the rotation, the screw drives the two connecting blocks to move in the same or opposite directions. During the movement, the connecting block drives the fixed block It moves on the limit rod, and the positioning block also moves with the connecting block. The positioning block drives the telescopic rod and the spring to move during the movement. When the anti-skid pad contacts the photoelectric device, the anti-skid pad can increase the friction of the round block, so that the round block can clamp the photoelectric device more stably. The anti-skid pad can drive the round block to move, causing the telescopic rod and the spring to contract, and perform a clamping test on the photoelectric device. The cleaning cotton can clean the screw rod, thereby achieving the effect of making the connecting block move more smoothly on the screw rod. By setting the adjustment structure, personnel can clamp and fix the photoelectric device conveniently and quickly, which is convenient for personnel to test it. In addition, the clamping force can be controlled during the clamping process to avoid damage to the photoelectric device, thereby improving the efficiency of clamping and testing the photoelectric device.

[0021] In the utility model, after the photoelectric device is clamped and tested, the personnel need to twist and move their bodies to observe the photoelectric device, which is a time-consuming and laborious process. At this time, this problem can be well solved by setting an auxiliary structure. By setting the auxiliary structure, the personnel first use the finger sleeve to pull the limit ring to move, and the finger sleeve can drive the limit ring to move, so that the personnel can easily control the limit ring, so that the limit ring drives the limit block to disengage from the connecting groove. At this time, the rotating columns on the inner walls of the two auxiliary blocks on the fixed plate can be rotated, and the rotating columns drive the connecting blocks to rotate during the rotation process, and the connecting blocks drive the positioning frame to rotate, the positioning frame drives the connecting columns to rotate, and the connecting columns drive the support plate to rotate. When it rotates to a suitable position, the limit ring is moved to clamp the limit block into the connecting groove for Fixed. When it is necessary to change the angle to observe the photoelectric device, first use the anti-slip pattern to move the positioning ring. The anti-slip pattern can increase the friction of the positioning ring, so that it is convenient for personnel to move the positioning ring. The positioning ring drives the moving block to disengage from the positioning groove. At this time, the connecting column in the positioning frame can be rotated. The connecting column drives the supporting plate to rotate during the rotation process. The supporting plate drives the fixed frame to rotate together during the rotation process. When it is rotated to the appropriate position, the moving positioning ring will clip the moving block into the positioning groove for fixation. At this time, the fixation is completed. By setting the auxiliary structure, personnel can adjust the position of the fixed frame from multiple angles, so as to facilitate personnel to observe the photoelectric devices from all angles, so that personnel can more intuitively feel the effect of testing the photoelectric devices. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is a three-dimensional structural schematic diagram of the utility model;

[0023] Figure 2 It is a structural schematic diagram of the regulating structure of the utility model;

[0024] Figure 3 This is a schematic diagram of the disassembled structure of the adjustment structure of the utility model;

[0025] Figure 4 It is a structural schematic diagram of the auxiliary structure of the utility model;

[0026] Figure 5 For this utility model Figure 4 A magnified image of point A;

[0027] Figure 6 It is a partial structural schematic diagram of the auxiliary structure of the utility model.

[0028] Legend: 1. Fixed frame; 2. Adjustment structure; 201. Screw; 202. Connecting block; 203. Positioning block; 204. Fixed block; 205. Limit rod; 206. Spring; 207. Telescopic rod; 208. Turntable; 209. Anti-skid sleeve; 210. Anti-skid pad; 211. Cleaning cotton; 212. Round block; 3. Auxiliary structure; 301. Fixed plate; 302. Auxiliary block; 303. Rotating column; 304. Limiting ring; 305. Limiting block; 306. Connecting groove; 307. Connecting block; 308. Positioning frame; 309. Connecting column; 310. Support plate; 311. Positioning ring; 312. Moving block; 313. Positioning groove; 314. Anti-skid pattern; 315. Finger sleeve. DETAILED DESCRIPTION

[0029] Reference Figure 1 As shown, the utility model provides a technical solution: a photoelectric device test fixture, comprising a fixed frame 1, an inner wall of the fixed frame 1 is provided with an adjustment structure 2, and a lower surface of the fixed frame 1 is provided with an auxiliary structure 3.

[0030] The specific settings and functions of the adjustment structure 2 and the auxiliary structure 3 are described in detail below.

[0031] Reference Figure 2 and Figure 3As shown, in this embodiment: the adjustment structure 2 includes a screw 201, the screw 201 is rotatably connected to the fixed frame 1, the arc surface of the screw 201 is threadedly connected to two connecting blocks 202, the upper surfaces of the two connecting blocks 202 are fixedly connected with positioning blocks 203, the arc surface of the screw 201 is provided with two reverse threads, both sides of the connecting block 202 are fixedly connected with fixed blocks 204, the inner wall of the fixed frame 1 is fixedly connected with two limiting rods 205, the two limiting rods 205 are slidably connected with the fixed blocks 204, one side of the positioning block 203 is fixedly connected with a plurality of telescopic rods 207, one end of the plurality of telescopic rods 207 is fixedly connected with a round block 212, the arc surface of the telescopic rod 207 is sleeved with a spring 206, the two ends of the spring 206 are respectively fixedly connected with the positioning block 203 and the round block 212, and one end of the screw 201 is fixedly connected with a turntable 208. By setting the adjustment structure 2, personnel can quickly and easily adjust the photoelectric device The anti-skid pad 210 is fixedly connected to one side of the round block 212, and the cross-section of the anti-skid pad 210 is circular. The anti-skid pad 210 can increase the friction of the round block 212, so that the round block 212 can clamp the photoelectric device more stably. Cleaning cotton 211 is fixedly connected to both sides of the connecting block 202, and the cleaning cotton 211 abuts against the screw 201. The cleaning cotton 211 can clean the screw 201, so that the connecting block 202 moves more smoothly on the screw 201.

[0032] Reference Figure 4 , Figure 5 and Figure 6As shown, in this embodiment: the auxiliary structure 3 includes a support plate 310, the support plate 310 is fixedly connected to the fixed frame 1, the inner wall of the support plate 310 is fixedly connected with a connecting column 309, the arc surface of the connecting column 309 is rotatably connected with a positioning frame 308, the lower surface of the positioning frame 308 is fixedly connected with two connecting blocks 307, the inner walls of the two connecting blocks 307 are fixedly connected with the same rotating column 303, the arc surface of the connecting column 309 is slidably connected with two positioning rings 311, the arc surfaces of the two positioning rings 311 are fixedly connected with moving blocks 312, a plurality of positioning grooves 313 are provided on both sides of the positioning frame 308, the size of the positioning grooves 313 is adapted to the size of the moving block 312, the arc surface of the rotating column 303 is rotatably connected with two auxiliary blocks 302, the lower surfaces of the two auxiliary blocks 302 are fixedly connected with the same fixed plate 301, and the arc surface of the rotating column 303 is slidably connected with two limit rings 3 04, the arc surfaces of the two limit rings 304 are fixedly connected to the limit block 305, and a plurality of connection grooves 306 are provided on one side of the auxiliary block 302. The size of the connection groove 306 is matched with the size of the limit block 305. By setting the auxiliary structure 3, personnel can adjust the position of the fixed frame 1 at multiple angles, so as to facilitate personnel to observe the optoelectronic device from multiple angles, and facilitate personnel to more intuitively feel the effect of testing the optoelectronic device. The arc surface of the positioning ring 311 is provided with anti-slip grooves 314, and the anti-slip grooves 314 are evenly distributed on the positioning ring 311. The anti-slip grooves 314 can increase the friction of the positioning ring 311, so as to achieve the effect of facilitating personnel to move the positioning ring 311. The arc surface of the limit ring 304 is fixedly connected with two finger sleeves 315. The cross-section of the finger sleeves 315 is circular. The finger sleeves 315 can drive the limit ring 304 to move, so as to achieve the effect of making it convenient for personnel to control the limit ring 304.

[0033] Working principle: when it is necessary to clamp and test the optoelectronic device, a clamp is usually used to clamp the optoelectronic device directly, and the optoelectronic device is clamped on a workbench. Then, the corresponding equipment is used to test the performance and quality of the optoelectronic device. However, this operation will cause the following problems: since the strength of the clamp is not well controlled, the optoelectronic device is often damaged. At this time, the adjustment structure 2 can solve this problem well. First, the turntable 208 is rotated with the help of the anti-slip sleeve 209. The anti-slip sleeve 209 can increase the friction of the arc surface of the turntable 208, so as to avoid the hand slipping when the turntable 208 is rotated. The turntable 208 drives the screw 201 to rotate on the inner wall of the fixed frame 1. During the rotation, the screw 201 drives the two connecting blocks 202 to move in the same or opposite directions. During the movement, the connecting block 202 drives the fixed block 204 to move on the limit rod 205. At the same time, the positioning block 203 also moves with the connecting block 202. The positioning block 203 drives the telescopic rod 207 and the spring 206 to move during the movement. When the anti-skid pad 210 contacts the photoelectric device, the anti-skid pad 210 can increase the friction of the round block 212, so that the round block 212 can clamp the photoelectric device more stably. The anti-skid pad 210 can drive the round block 212 to move, so that the telescopic rod 207 and the spring 206 can be contracted, and the photoelectric device can be clamped and tested. Among them, the cleaning cotton 211 can clean the screw rod 201, so as to achieve the effect of making the connecting block 202 move more smoothly on the screw rod 201. By setting the adjustment structure 2, personnel can clamp and fix the photoelectric device conveniently and quickly, which is convenient for personnel to test it. In addition, the clamping force can be controlled during the clamping process to avoid damage to the photoelectric device, thereby improving the efficiency of the clamping test of the photoelectric device.

[0034] After the photoelectric device is clamped and tested, the personnel need to twist and move their bodies to observe the photoelectric device, which is a time-consuming and laborious process. At this time, the auxiliary structure 3 can be set to solve this problem. By setting the auxiliary structure 3, the personnel first use the finger sleeve 315 to pull the limit ring 304 to move, and the finger sleeve 315 can drive the limit ring 304 to move, so that the personnel can easily control the limit ring 304, so that the limit ring 304 drives the limit block 305 to disengage from the connecting groove 306. At this time, the rotating column 303 on the inner wall of the two auxiliary blocks 302 on the fixed plate 301 can be rotated. The rotating column 303 drives the connecting block 307 to rotate during the rotation process, and the connecting block 307 drives the positioning frame 308 to rotate, and the positioning frame 308 drives the connecting column 309 to rotate, and the connecting column 309 drives the support plate 310 to rotate. When it rotates to a suitable position, the limit ring 304 is moved to clamp the limit block 305 into the connecting groove 3 06 for fixation. When it is necessary to change the angle to observe the photoelectric device, first use the anti-slip pattern 314 to move the positioning ring 311. The anti-slip pattern 314 can increase the friction of the positioning ring 311, so as to facilitate personnel to move the positioning ring 311. The positioning ring 311 drives the moving block 312 to disengage from the positioning groove 313. At this time, the connecting column 309 in the positioning frame 308 can be rotated. The connecting column 309 drives the supporting plate 310 to rotate during the rotation. The supporting plate 310 drives the fixed frame 1 to rotate together during the rotation. When it is rotated to a suitable position, the moving positioning ring 311 snaps the moving block 312 into the positioning groove 313 for fixation. At this time, the fixation is completed. By setting the auxiliary structure 3, personnel can adjust the position of the fixed frame 1 from multiple angles, so as to facilitate personnel to observe the photoelectric device from multiple angles, and facilitate personnel to more intuitively feel the effect of testing the photoelectric device.

[0035] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood by specific circumstances.

Claims

1. A photoelectric device testing fixture, comprising a fixing frame (1), characterized in that: The inner wall of the fixed frame (1) is provided with an adjustment structure (2), the adjustment structure (2) comprising a screw (201), the screw (201) being rotatably connected to the fixed frame (1), the arc surface of the screw (201) being threadedly connected to two connection blocks (202), the upper surfaces of the two connection blocks (202) being fixedly connected to positioning blocks (203), the arc surface of the screw (201) being provided with two reverse threads, both sides of the connection blocks (202) being fixedly connected to fixing blocks (204), the inner wall of the fixed frame (1) being fixedly connected to the fixing frame (1) Two limit rods (205) are connected, and the two limit rods (205) are slidably connected to the fixed block (204); one side of the positioning block (203) is fixedly connected to a plurality of telescopic rods (207); one end of each of the telescopic rods (207) is fixedly connected to a round block (212); the arc surface of the telescopic rod (207) is sleeved with a spring (206); the two ends of the spring (206) are respectively fixedly connected to the positioning block (203) and the round block (212); and one end of the screw rod (201) is fixedly connected to a rotating disk (208).

2. The optoelectronic device testing fixture according to claim 1, characterized in that: The arc surface of the rotating disk (208) is fixedly connected with an anti-slip sleeve (209), and the anti-slip sleeve (209) is a rubber sleeve.

3. The optoelectronic device testing fixture according to claim 1, characterized in that: An anti-skid pad (210) is fixedly connected to one side of the round block (212), and the cross section of the anti-skid pad (210) is circular.

4. The optoelectronic device testing fixture according to claim 1, characterized in that: Cleaning cotton (211) is fixedly connected to both sides of the connection block (202), and the cleaning cotton (211) is in abutment with the screw rod (201).

5. The optoelectronic device testing fixture according to claim 1, characterized in that: The lower surface of the fixed frame (1) is provided with an auxiliary structure (3), the auxiliary structure (3) comprising a support plate (310), the support plate (310) being fixedly connected to the fixed frame (1), the inner wall of the support plate (310) being fixedly connected with a connecting column (309), the arc surface of the connecting column (309) being rotatably connected with a positioning frame (308), the lower surface of the positioning frame (308) being fixedly connected with two connecting blocks (307), the inner walls of the two connecting blocks (307) being fixedly connected with the same rotating column (303), the arc surface of the connecting column (309) being slidably connected with two positioning rings (311), the arc surfaces of the two positioning rings (311) being fixedly connected with a moving block (312) ), a plurality of positioning grooves (313) are provided on both sides of the positioning frame (308), the size of the positioning grooves (313) is matched with the size of the moving block (312), the arc surface of the rotating column (303) is rotatably connected to two auxiliary blocks (302), the lower surfaces of the two auxiliary blocks (302) are fixedly connected to the same fixed plate (301), the arc surface of the rotating column (303) is slidably connected to two limit rings (304), the arc surfaces of the two limit rings (304) are fixedly connected to the limit block (305), and a plurality of connecting grooves (306) are provided on one side of the auxiliary block (302), the size of the connecting grooves (306) is matched with the size of the limit block (305).

6. The optoelectronic device testing fixture according to claim 5, characterized in that: The arc surface of the positioning ring (311) is provided with anti-skid patterns (314), and the anti-skid patterns (314) are evenly distributed on the positioning ring (311).

7. The optoelectronic device testing fixture according to claim 5, characterized in that: The arc surface of the limiting ring (304) is fixedly connected to two finger sleeves (315), and the cross-section of the finger sleeves (315) is circular.

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