Electronic equipment sensor performance test device

Abstract

The utility model provides an electronic device sensor performance test device, which relates to the field of sensor testing technology, including: a light source, a test card, a first bracket, a second bracket, a sample stage and a moving mechanism, wherein the light source and the test card are arranged on the first bracket, the first bracket is connected to the second bracket, the sample stage is connected to the second bracket, and the moving mechanism can drive the sample stage to approach or move away from the first bracket. Thus, when it is necessary to test an electronic device equipped with a light sensor and a TOF sensor, the light source and the test card can be used to test the light sensor and the TOF sensor of the electronic device respectively, without placing the electronic device on different test devices for testing, and without repeatedly building the test environment, so that the test steps can be simplified and the test efficiency can be improved.

Description

Technical Field

[0001] The utility model relates to the technical field of sensor testing, in particular to a device for testing the performance of an electronic equipment sensor. Background Art

[0002] With the development of science and technology, users have higher and higher demands for the use of electronic devices. In order to meet the different usage experiences of users, the functions of electronic devices have become more diversified. These electronic devices are usually equipped with a variety of different types of sensors that can obtain surrounding environment data, such as light sensors, TOF sensors, gyroscopes and other sensors.

[0003] During the research and development stage of electronic equipment, testers will conduct effect tests and debug and optimize the various types of sensors installed on the electronic equipment in order to meet the actual application needs of customers to the greatest extent.

[0004] However, in the prior art, when performing performance tests on multiple sensors in an electronic device, testers will place the electronic devices on different test devices for testing different sensors, and use the multiple different test devices to perform tests separately, which results in the need to repeatedly set up the test environment and frequently install and disassemble the electronic equipment. The steps are cumbersome and the operations are complicated, which affects the test efficiency. Moreover, the multiple different test devices will take up too much space. Utility Model Content

[0005] The utility model provides an electronic device sensor performance testing device, which is used to solve the defects in the prior art that when performing performance tests on multiple sensors on an electronic device, a tester needs to place the electronic devices on different test devices for testing, resulting in the need to repeatedly build a test environment, frequently install and disassemble the electronic devices, and the steps are cumbersome and the operation is complicated, which affects the test efficiency.

[0006] The utility model provides an electronic equipment sensor performance test device, comprising: a light source, a test card, a first bracket, a second bracket, a sample stage and a moving mechanism, wherein:

[0007] The light source and the test card are arranged on the first bracket, the first bracket is connected to the second bracket, the sample stage is connected to the second bracket, and the moving mechanism can drive the sample stage to approach or move away from the first bracket.

[0008] According to the utility model, an electronic equipment sensor performance test device also includes: a third bracket, a first rotating mechanism and a second rotating mechanism, wherein:

[0009] The sample stage is rotatably connected to the third bracket, and the first rotating mechanism can drive the sample stage to rotate around a first direction;

[0010] The third bracket is rotatably connected to the second bracket, and the second rotating mechanism can drive the third bracket to rotate around a second direction;

[0011] The first direction is perpendicular to the second direction.

[0012] According to the utility model, an electronic equipment sensor performance test device further includes: a turntable, a base and a third rotating mechanism, wherein the second bracket is fixedly connected to the turntable, the turntable is rotatably connected to the base, and the third rotating mechanism can drive the turntable to rotate around a third direction.

[0013] The third direction is perpendicular to the first direction and the second direction respectively.

[0014] According to an electronic device sensor performance testing device provided by the utility model, the number of the second brackets is two, the two second brackets are arranged in parallel and spaced apart, the sample table is arranged between the two second brackets, and the opposite sides of the third bracket are respectively connected to the two second brackets.

[0015] According to an electronic device sensor performance testing device provided by the utility model, the third bracket is constructed as a rectangular frame structure, the middle part of the third bracket has a flipping space, the sample stage is arranged in the flipping space, and the opposite sides of the sample stage are respectively rotatably connected to the third bracket.

[0016] According to an electronic equipment sensor performance test device provided by the utility model, the moving mechanism includes: a motor, a threaded rod, a fixed seat and a sliding seat, wherein:

[0017] The motor and the fixing seat are respectively arranged at two ends of the second bracket, one end of the threaded rod is fixedly connected to the motor, and the other end is rotatably arranged on the fixing seat, the sliding seat is threadedly connected to the threaded rod, and the third bracket is connected to the sliding seat.

[0018] According to an electronic device sensor performance testing device provided by the utility model, it also includes: a light box, the light box has a storage space, the storage space is formed as a dark environment, the light source, the test card, the first bracket, the second bracket, the sample stage and the moving mechanism are all arranged in the storage space.

[0019] According to an electronic equipment sensor performance testing device provided by the utility model, the first bracket is provided with a slide rail, and the light source and the test card can be movably arranged on the slide rail.

[0020] According to an electronic device sensor performance testing device provided by the utility model, the sample stage is provided with a receiving groove, and the receiving groove is used to place the electronic device whose sensor performance is to be tested.

[0021] According to an electronic device sensor performance testing device provided by the utility model, it also includes: a host computer, the light source, the moving mechanism, the first rotating mechanism, the second rotating mechanism and the third rotating mechanism are all electrically connected to the host computer, and the host computer is also used to electrically connect the electronic device to be tested placed on the sample table.

[0022] The electronic device sensor performance testing device provided by the utility model can perform light sensor testing and TOF sensor testing on the electronic device respectively through a light source and a test card when it is necessary to test the electronic device equipped with a light sensor and a TOF sensor. There is no need to place the electronic device on different test devices for testing, nor is there a need to repeatedly build a test environment. The test steps can be simplified and the test efficiency can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the present invention or the prior art, a brief introduction will be given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0024] Figure 1 It is a structural schematic diagram of an electronic equipment sensor performance testing device according to one embodiment of the utility model.

[0025] Figure 2 It is a test flow chart of an electronic equipment sensor performance test device according to one embodiment of the utility model.

[0026] Reference numerals:

[0027] 1. Light source; 2. Test card; 3. First bracket; 4. Second bracket; 5. Sample stage; 6. Moving mechanism; 7. Host computer; 8. Third bracket; 9. First rotating mechanism; 10. Second rotating mechanism; 11. Turntable; 12. Base; 13. Third rotating mechanism; 14. Light box; 15. First moving motor; 16. Second moving motor. DETAILED DESCRIPTION

[0028] In order to make the purpose, technical solution and advantages of the utility model clearer, the technical solution of the utility model will be described clearly and completely in conjunction with the drawings in the utility model. Obviously, the described embodiments are part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0029] The term "first" or "second" in the specification and claims of the utility model may explicitly or implicitly include one or more of the features. In the description of the utility model, unless otherwise specified, "multiple" means two or more. In addition, "and / or" in the specification and claims means at least one of the connected objects, and the character " / " generally means that the related objects are in an "or" relationship.

[0030] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0031] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0032] In one embodiment of the present invention, a device for testing the performance of electronic device sensors is provided, which includes a light source, a test card, a sample stage, and a moving mechanism. The electronic device to be tested can be placed on the sample stage, and the moving mechanism can drive the sample stage to approach or move away from the test card. Thus, the device can test the optical sensor and TOF sensor on the electronic device. Figure 1 and Figure 2 As shown, the electronic device sensor performance testing device in this embodiment is further described.

[0033] Specifically, if Figure 1 As shown, the electronic device sensor performance testing device in this embodiment includes: a light source 1, a test card 2, a first bracket 3, a second bracket 4, a sample stage 5 and a moving mechanism 6.

[0034] The light source 1 and the test card 2 are arranged on the first bracket 3 , the first bracket 3 is connected to the second bracket 4 , the sample stage 5 is connected to the second bracket 4 , and the moving mechanism 6 can drive the sample stage 5 to approach or move away from the first bracket 3 .

[0035] Exemplarily, the light source 1 is used to perform a light test on a light sensor on an electronic device. The light source 1 may be a standard light source that can emit test light in a predetermined direction to facilitate the light test. For example, the light source 1 may emit test light toward the sample stage 5 to facilitate testing the light sensor in the electronic device after the electronic device is placed on the sample stage 5.

[0036] Exemplarily, the test card 2 is used to perform a distance test on the TOF sensor. The test card 2 can be a gray card, which can be spaced a certain distance from the sample stage 5 and can be arranged in parallel with the sample stage 5. When the electronic device equipped with the TOF sensor is placed on the sample stage 5, the TOF sensor can emit pulse light, laser or other forms of radiation signals to the test card 2. After encountering the test card 2, the radiation signal will emit a reflection signal toward the TOF sensor. Thereafter, the TOF sensor obtains the reflection signal and obtains the distance between it and the test card 2, thereby realizing the test of the TOF sensor in the electronic device.

[0037] Exemplarily, the first bracket 3 can be made of a metal or non-metal material with a certain structural strength. The first bracket 3 serves as a supporting structure for the light source 1 and the test card 2. The light source 1 and the test card 2 can be fixedly or movably arranged on the first bracket 3. For example, when there is no need to adjust the position of the light source 1 and the test card 2, the light source 1 and the test card 2 can be fixedly arranged on the first bracket 3 with the aid of bolts and other structures. When it is necessary to adjust the position of the light source 1 and the test card 2 relative to the sample stage 5, the light source 1 and the test card 2 can be movably arranged on the first bracket 3 with the aid of a slide rail structure and the like.

[0038] Exemplarily, the second bracket 4 can also be made of metal or non-metallic material with a certain structural strength. The second bracket 4 is mainly used to support the first bracket 3 and the sample stage 5 to ensure that the first bracket 3 and the sample stage 5 can be in a relatively stable position during the test.

[0039] Exemplarily, the moving mechanism 6 can adjust the position of the sample stage 5 on the second bracket 4, so as to adjust the distance between the sample stage 5 and the test card 2 on the first bracket 3. Exemplarily, in order to achieve effective movement, the moving mechanism 6 can be a ball screw structure, a slide structure, a hydraulic cylinder, etc.

[0040] In this embodiment, if Figure 1 As shown, as a preferred embodiment, the first bracket 3 and the sample stage 5 are spaced apart in the vertical direction, and the first bracket 3 is arranged above the sample stage 5. The moving mechanism 6 can drive the sample stage 5 to move up and down, thereby adjusting the distance between the sample stage 5 and the test card 2.

[0041] In other embodiments, according to installation and test requirements, the first bracket 3 and the sample stage 5 can be spaced apart in the vertical direction, and the first bracket 3 can be arranged below the sample stage 5. Alternatively, the first bracket 3 and the sample stage 5 can be spaced apart in the horizontal direction. In this case, the moving mechanism 6 can drive the sample stage 5 to move toward the first bracket 3 in the horizontal direction, thereby adjusting the distance between the sample stage 5 and the test card 2.

[0042] It can be understood that the first bracket 3 and the sample stage 5 can also be spaced apart in other directions, and the moving mechanism 6 only needs to drive the sample stage 5 to move closer to or away from the first bracket 3 .

[0043] In actual use, Figure 1 As shown, when it is necessary to perform a performance test on an electronic device equipped with a light sensor and a TOF sensor, the electronic device to be tested can be placed on a sample stage 5 with the light sensor and the TOF sensor of the electronic device facing the first bracket 3 .

[0044] When testing the light sensor in the electronic device, an illuminance meter can be placed on the sample table 5 close to the electronic device, and the distance between the illuminance meter and the electronic device and the light source is made the same. The light source emits test light to the illuminance meter and the electronic device at the same time with different light intensities. The measurement result of the illuminance meter is compared with the illuminance value read by the light sensor in the electronic device, and the measurement accuracy of the light sensor in the electronic device is determined.

[0045] When testing the TOF sensor in the electronic device, the moving mechanism 6 can be used to change the distance between the sample stage 5 and the first bracket 3, and adjust the distance between the electronic device and the test card 2. At the same time, the actual distance between the electronic device and the test card 2 can be obtained using a ruler or according to the distance moved by the moving mechanism 6. The actual distance is compared with the distance value read by the TOF sensor in the electronic device, and the measurement accuracy of the optical sensor in the electronic device is determined.

[0046] It can be seen that when it is necessary to test an electronic device equipped with a light sensor and a TOF sensor, with the help of the electronic device sensor performance testing device in this embodiment, the light sensor test and the TOF sensor test of the electronic device can be performed respectively through the light source 1 and the test card 2. There is no need to place the electronic device on different test devices for testing, nor is there a need to repeatedly build a test environment. This can simplify the test steps and improve test efficiency.

[0047] Further, in one embodiment, if Figure 1 As shown, the electronic device sensor performance testing device also includes: a host computer 7, which is electrically connected to the light source 1 and the moving mechanism 6.

[0048] Exemplarily, the host computer 7 can be a control device such as a computer that can directly issue instructions. The host computer 7 has an operation module and a display module. For example, the operation module can be various control buttons, and the display module can be a display screen. The tester can issue control instructions to the light source 1 and the mobile mechanism 6 through the control module, so that the light source 1 and the mobile mechanism 6 can perform related tasks according to the control instructions, and the display module can display real-time data of the light source 1 and the mobile mechanism 6.

[0049] When testing the light sensor in the electronic device, an illuminance meter is placed near the electronic device on the sample stage 5, so that the electronic device and the illuminance meter can be electrically connected to the host computer 7 at the same time, and the display module of the host computer 7 can display the light intensity of the light source 1, the illuminance value read by the light sensor in the electronic device, and the measurement result of the illuminance meter. During the test, the tester can adjust the light intensity of the light source 1 through the operation module, and at this time, the real-time changes of the light intensity of the light source 1, the illuminance value read by the light sensor in the electronic device, and the measurement result of the illuminance meter can all be displayed on the display module.

[0050] When testing the TOF sensor in the electronic device, the electronic device can be electrically connected to the host computer 7, and the display module of the host computer 7 can display the actual distance between the electronic device and the test card 2, the distance value read by the TOF sensor in the electronic device, and the moving distance of the moving mechanism 6. During the test, the tester can adjust the moving mechanism 6 through the operating module to change the distance between the electronic device and the test card 2. At this time, the actual distance between the electronic device and the test card 2, the distance value read by the TOF sensor in the electronic device, and the real-time changes of the moving distance of the moving mechanism 6 can all be displayed on the display module.

[0051] Therefore, through the host computer 7, the test personnel can conveniently obtain relevant test data without manually reading the data, which can ensure the test accuracy and improve the test efficiency.

[0052] In one embodiment, Figure 1 As shown, the electronic equipment sensor performance testing device also includes: a third bracket 8, a first rotating mechanism 9 and a second rotating mechanism 10.

[0053] Among them, the sample stage 5 is rotatably connected to the third bracket 8, and the first rotating mechanism 9 can drive the sample stage 5 to rotate around the first direction; the third bracket 8 is rotatably connected to the second bracket 4, and the second rotating mechanism 10 can drive the third bracket 8 to rotate around the second direction; the first direction is perpendicular to the second direction.

[0054] Exemplarily, the third bracket 8 can also be made of metal or non-metallic material with a certain structural strength. The third bracket 8 is connected between the sample stage 5 and the second bracket 4. By setting the third bracket 8, the sample stage 5 can be rotated in the first direction and the second direction.

[0055] Specifically, if Figure 1 As shown, the first direction is the X direction, and the second direction is the Y direction. When the third bracket 8 remains stationary, the first rotating mechanism 9 can drive the sample stage 5 to rotate around the X direction. Correspondingly, when the second bracket 4 remains stationary, the second rotating mechanism 10 can drive the third bracket 8 to rotate around the Y direction.

[0056] Exemplarily, the first rotating mechanism 9 and the second rotating mechanism 10 can be rotating motors respectively. The rotating motors have a rotatable output shaft. By being fixedly connected to the output shaft, the rotational movement of the sample stage 5 and the third bracket 8 can be achieved.

[0057] In actual use, during the process of testing the light sensor in the electronic device, when it is necessary to simulate the use scenario in which light is obliquely incident on the electronic device, the first rotating mechanism 9 and the second rotating mechanism 10 can be used to adjust the inclination angle of the electronic device respectively according to the test requirements, so that the light sensor can simultaneously emit test light to the illuminance meter and the electronic device from different irradiation angles, and then compare the measurement result of the illuminance meter with the illuminance value read by the light sensor in the electronic device to determine the measurement accuracy of the light sensor in the electronic device.

[0058] In actual use, some electronic devices are equipped with gyroscopes. In order to enable the electronic device sensor performance testing device in this embodiment to also test the gyroscope of the electronic device, in one embodiment, Figure 1 As shown, the electronic equipment sensor performance testing device further includes: a turntable 11 , a base 12 and a third rotating mechanism 13 .

[0059] The second bracket 4 is fixedly connected to the turntable 11 , the turntable 11 is rotatably connected to the base 12 , and the third rotating mechanism 13 can drive the turntable 11 to rotate around a third direction, which is perpendicular to the first direction and the second direction.

[0060] In this embodiment, the first bracket 3 and the sample stage 5 are arranged at intervals in the vertical direction, and the turntable 11 is connected to the bottom of the second bracket 4. At the same time, a base 12 is provided at the bottom of the turntable 11, and the turntable 11 can rotate relative to the base 12 around a third direction by means of a rotating axis, such as Figure 1 As shown, the third direction is the Z direction, and the third direction is perpendicular to the first direction and the second direction, that is, the Z direction is perpendicular to the X direction and the Y direction, respectively.

[0061] Furthermore, the third rotating mechanism 13 can drive the turntable 11 to rotate relative to the base 12 , thereby driving the first bracket 3 , the third bracket 8 and the sample stage 5 to rotate.

[0062] Similarly, the third rotating mechanism 13 may be a rotating motor having a rotatable output shaft, and the rotating movement of the turntable 11 may be achieved by being fixedly connected to the output shaft.

[0063] In the process of testing the gyroscope in the electronic device, the electronic device can be fixed to the sample stage 5, and the first rotating mechanism 9, the second rotating mechanism 10 and the third rotating mechanism 13 and the electronic device are electrically connected to the host computer 7. At this time, the rotation angles of the first rotating mechanism 9, the second rotating mechanism 10 and the third rotating mechanism 13, and the position data read by the gyroscope in the electronic device can be displayed on the display module of the host computer 7. During the test, the tester can adjust through the operation module. At this time, the rotation angles of the first rotating mechanism 9, the second rotating mechanism 10 and the third rotating mechanism 13, and the real-time changes of the position data read by the gyroscope in the electronic device can be displayed on the display module.

[0064] Since all data can be accurately displayed on the display module, the tester can easily compare the rotation angles of the first rotating mechanism 9, the second rotating mechanism 10 and the third rotating mechanism 13 with the rotation angle values ​​read by the gyroscope in the electronic device, and then determine the measurement accuracy of the gyroscope in the electronic device.

[0065] Optionally, the sample stage 5 can be set at the axis center position of the rotating axis connecting the turntable 11 and the base 12. After the electronic device is placed on the sample stage 5, the electronic device can be located at the axis center position of the rotating axis to further improve the accuracy of detection.

[0066] Further, in this embodiment, if Figure 1As shown, there are two second brackets 4 , which are arranged in parallel and spaced apart, the sample stage 5 is arranged between the two second brackets 4 , and opposite sides of the third bracket 8 are connected to the two second brackets 4 respectively.

[0067] Exemplarily, the two second brackets 4 are respectively extended in the vertical direction, and the relative inner sides of the two second brackets 4 can be respectively provided with slide rail structures, the slide rail structure has a slide groove extending along the height direction of the second bracket 4, and the third bracket 8 has extension rods on the opposite sides along the second direction, and the two extension rods extend to the slide groove of the slide rail structure. Under the drive of the moving mechanism 6, the extension rods on both sides of the third bracket 8 can move along the slide rail structure, so that the sample stage 5 connected to the third bracket 8 can be close to or away from the first bracket 3.

[0068] Furthermore, in order to drive the third bracket 8 to rotate, the output shaft of the second rotating mechanism 10 can be coaxially connected to the extension rod on one side of the third bracket 8 .

[0069] It can be understood that by providing two second brackets 4, the third bracket 8 can maintain structural stability during rotation or lifting and lowering, thereby avoiding position deviation and ensuring the accuracy of the test results.

[0070] In one embodiment, the third bracket 8 is constructed as a rectangular frame structure, the middle of the third bracket 8 has a turning space, the sample stage 5 is disposed in the turning space, and opposite sides of the sample stage 5 are rotatably connected to the third bracket 8 .

[0071] Specifically, Figure 1 As shown, the third bracket 8 can be roughly constructed as a rectangular frame structure of a rectangular frame, and a rectangular through slot is provided inside the third bracket 8, and the rectangular through slot is the flipping space. The sample stage 5 is roughly constructed as a rectangular plate-like structure, which is roughly formed into a plate-like structure with a certain thickness. The size of the sample stage 5 is smaller than the size of the rectangular through slot. The sample stage 5 is arranged in the rectangular through slot. The two ends of the sample stage 5 along the first direction are respectively provided with extension rods, and the extension rods are rotatably connected to the inner wall of the rectangular through slot, so that the sample stage 5 can be rotatably arranged in the flipping space around the first direction.

[0072] Furthermore, in order to be able to drive the sample stage 5 to rotate, the output shaft of the first rotating mechanism 9 can be coaxially connected to the extension rod of the sample stage 5 .

[0073] The moving mechanism 6 is used to drive the third bracket 8 and the sample stage 5 to move toward the first bracket 3. As an implementation method, the moving mechanism 6 includes: a motor, a threaded rod, a fixed seat and a sliding seat.

[0074] The motor and the fixed seat are respectively arranged at both ends of the second bracket 4, one end of the threaded rod is fixedly connected to the motor, and the other end is rotatably arranged on the fixed seat, the sliding seat is threadedly connected to the threaded rod, and the third bracket 8 is connected to the sliding seat.

[0075] Therefore, when the motor drives the threaded rod to rotate, the sliding seat can move along the length direction of the threaded rod, thereby driving the third bracket 8 to move along the extension direction of the second bracket 4, so that the third bracket 8 and the sample stage 5 can move closer to or away from the first bracket 3.

[0076] For example, Figure 1 As shown, the third bracket 8 is provided with second brackets 4 on both sides of the second direction, then a moving mechanism 6 can be provided on the inner side of one of the second brackets 4, and a slide rail structure can be provided on the inner side of the other second bracket 4, and the extension rod on one side of the third bracket 8 can be connected to the moving mechanism 6, and the extension rod on the other side of the third bracket 8 is slidably connected to the slide groove of the slide rail structure. Therefore, when the moving mechanism 6 drives the third bracket 8 to perform lifting and lowering movements, the structural stability of the third bracket 8 can be ensured.

[0077] In one embodiment, there can be two movable mechanisms 6 , which can be respectively connected to both sides of the third bracket 8 in the second direction, and can be respectively arranged on the inner side of the two second brackets 4 facing the third bracket 8 .

[0078] In one embodiment, Figure 1 As shown, the electronic device sensor performance testing device also includes: a light box 14, the light box 14 has a receiving space, the receiving space is formed as a dark environment, and the light source 1, the test card 2, the first bracket 3, the second bracket 4, the sample table 5 and the moving mechanism 6 are all arranged in the receiving space.

[0079] It can be understood that the light box 14 can be made of opaque material, and the light box 14 has a receiving space formed into a dark environment, and relevant functional elements for testing are arranged in the receiving space.

[0080] In actual use, when testing the optical sensor of an electronic device, interference from external light and debris can be effectively avoided, thereby improving the accuracy of the test.

[0081] Moreover, a door may be provided on the side of the light box 14, and the tester may place the electronic equipment on the sample table 5 or debug various components by opening the door. Afterwards, during the test, it is only necessary to ensure that the door is closed to make the accommodation space a dark environment.

[0082] In one embodiment, the first bracket 3 is provided with a slide rail, and the light source 1 and the test card 2 are both movably arranged on the slide rail.

[0083] It can be understood that the slide rail can be set at the bottom of the first bracket 3, and the light source 1 and the test card 2 can be respectively set in the slide rail with the help of the connecting structure. When the light source 1 needs to be used to test the light sensor in the electronic device, the slide rail can be used to move the light source 1 to the top of the electronic device, thereby ensuring that the test light emitted by the light source 1 can be vertically directed to the electronic device.

[0084] Accordingly, when the test card 2 is needed to test the TOF sensor in the electronic device, the slide rail can be used to move the test card 2 to the top of the electronic device, thereby ensuring that the radiation signal emitted by the TOF sensor in the electronic device can be accurately directed to the test card 2 to ensure the test distance.

[0085] In order to achieve accurate movement, in a specific embodiment, the light source 1 can be arranged on the slide rail by means of a first moving motor 15 , and the test card 2 can be arranged on the slide rail by means of a second moving motor 16 .

[0086] For example, the first movable motor 15 and the second movable motor 16 both have rollers, and the rollers can roll in the slide rail. By driving the first movable motor 15 and the second movable motor 16, the positions of the light source 1 and the test card 2 on the slide rail can be adjusted.

[0087] During the actual test, the first mobile motor 15 and the second mobile motor 16 can be electrically connected to the host computer 7. When the light sensor of the electronic device needs to be tested, the tester can send a signal to the first mobile motor 15 to move the light source 1 to the top of the electronic device. When the TOF sensor of the electronic device needs to be tested, the tester can send a signal to the second mobile motor 16 to move the test card 2 to the top of the electronic device.

[0088] Through the above method, when testing the optical sensor and TOF sensor of the electronic device respectively, the tester does not need to open the light box 14 or make manual adjustments, and the test environment switching can be completed with a high degree of automation.

[0089] In one embodiment, the sample stage 5 is provided with a receiving groove, and the receiving groove is used to place the electronic device whose sensor performance is to be tested.

[0090] It can be understood that by setting a receiving groove on the sample stage 5, the electronic device can be fixed and positioned using the receiving groove, thereby ensuring the reference position of the electronic device. When the optical sensor, TOF sensor and gyroscope are subsequently tested, the moving distance and rotation angle of the electronic device can be ensured.

[0091] In addition, this embodiment also provides a test process for an electronic device sensor performance test device.

[0092] Specifically, Figure 2 As shown, the test process includes:

[0093] Open the light box 14, fix the electronic equipment and the illuminometer on the sample stage 5, and fix them by a clamp, and start the detection system through the host computer 7;

[0094] The host computer 7 sends a command to the light source 1, turns on the light source 1, and moves the light source 1 to the top of the sample stage 5 to start the light sensor test;

[0095] The host computer 7 sends a command to the light source 1 to adjust the intensity of the light source 1. The host computer 7 reads the data of the light sensor and the data of the illuminometer in the electronic device to perform a vertical light intensity test;

[0096] The host computer 7 sends a rotation instruction to the first rotating mechanism 9 and the second rotating mechanism 10 to adjust the angle of the sample stage 5. The host computer 7 sends an instruction to the light source 1 to adjust the intensity of the light source 1. The host computer 7 reads the data of the light sensor and the data of the illuminometer in the electronic device, performs an inclined light intensity test, obtains a set of test curves, completes the light sensor test and outputs a test report;

[0097] The host computer 7 issues a command to move the light source 1 to one side, move the test card 2 to just above the sample stage 5, and start the TOF sensor test;

[0098] The host computer 7 issues a command to move the sample stage 5 to different heights, change the distance between the electronic device and the test card 2, obtain a set of test curves, complete the TOF sensor test and output a test report;

[0099] The host computer 7 issues a command to adjust the rotation angles of the first rotating mechanism 9, the second rotating mechanism 10 and the third rotating mechanism 13, obtain a set of test curves, complete the gyroscope test and output a test report;

[0100] The host computer 7 issues a command to return the sample stage 5 to the initial position, turn off the light source 1, and end the test.

[0101] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the utility model, rather than to limit it. Although the utility model has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the utility model.

Claims

1. An electronic equipment sensor performance testing device, characterized in that: include: A light source, a test card, a first bracket, a second bracket, a sample stage and a moving mechanism, wherein: The light source and the test card are arranged on the first bracket, the first bracket is connected to the second bracket, the sample stage is connected to the second bracket, and the moving mechanism can drive the sample stage to approach or move away from the first bracket.

2. The electronic equipment sensor performance testing device according to claim 1, characterized in that: Also includes: The third bracket, the first rotating mechanism and the second rotating mechanism, wherein: The sample stage is rotatably connected to the third bracket, and the first rotating mechanism can drive the sample stage to rotate around a first direction; The third bracket is rotatably connected to the second bracket, and the second rotating mechanism can drive the third bracket to rotate around a second direction; The first direction is perpendicular to the second direction.

3. The electronic equipment sensor performance testing device according to claim 2, characterized in that: Also includes: A turntable, a base and a third rotating mechanism, wherein the second bracket is fixedly connected to the turntable, the turntable is rotatably connected to the base, and the third rotating mechanism can drive the turntable to rotate around a third direction. The third direction is perpendicular to the first direction and the second direction respectively.

4. The electronic equipment sensor performance testing device according to claim 2, characterized in that: There are two second brackets, the two second brackets are arranged in parallel and spaced apart, the sample stage is arranged between the two second brackets, and the opposite two sides of the third bracket are respectively connected to the two second brackets.

5. The electronic equipment sensor performance testing device according to claim 2, characterized in that: The third bracket is constructed as a rectangular frame structure. A turning space is provided in the middle of the third bracket. The sample stage is arranged in the turning space. Two opposite sides of the sample stage are rotatably connected to the third bracket respectively.

6. The electronic equipment sensor performance testing device according to claim 2, characterized in that: The moving mechanism comprises: a motor, a threaded rod, a fixed seat and a sliding seat, wherein: The motor and the fixing seat are respectively arranged at two ends of the second bracket, one end of the threaded rod is fixedly connected to the motor, and the other end is rotatably arranged on the fixing seat, the sliding seat is threadedly connected to the threaded rod, and the third bracket is connected to the sliding seat.

7. The electronic equipment sensor performance testing device according to claim 1, characterized in that: Also includes: A light box, wherein the light box has a containing space, the containing space is formed into a dark environment, and the light source, the test card, the first bracket, the second bracket, the sample stage and the moving mechanism are all arranged in the containing space.

8. The electronic equipment sensor performance testing device according to claim 1, characterized in that: The first bracket is provided with a slide rail, and the light source and the test card are both movably arranged on the slide rail.

9. The electronic equipment sensor performance testing device according to claim 1, characterized in that: The sample stage is provided with a receiving groove, and the receiving groove is used to place the electronic device whose sensor performance is to be tested.

10. The electronic equipment sensor performance testing device according to claim 3, characterized in that: Also includes: A host computer, the light source, the moving mechanism, the first rotating mechanism, the second rotating mechanism and the third rotating mechanism are all electrically connected to the host computer, and the host computer is also used to electrically connect the electronic device to be tested placed on the sample stage.

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