Partitionable multi-process high and low temperature test box

Abstract

The utility model relates to the technical field of test boxes, and discloses a divisible multi-process high-low temperature test box, which comprises a test box main body, a test chamber is arranged in the test box main body, a heat conduction assembly is arranged at the top end in the test chamber, a heating assembly is arranged on one side of the top end of the test box main body, and the heating assembly is arranged on the other side of the top end of the test box main body. A cooling assembly is mounted on the other side of the top end of the test box main body, a controller is mounted on one side of the front end of the test box main body, a partition plate is fixedly connected between the test chambers, and a supporting plate is mounted at the bottom end in each test chamber. According to the divisible multi-process high and low temperature test box, multiple processes can be carried out simultaneously through the test chambers, the partition plates between the test chambers can improve the isolation effect, the heat insulation pads on the partition plates can improve the heat insulation effect, and the thickness of the heat insulation pads can be changed according to requirements; and then the connecting clamping blocks on the heat insulation pad are moved out of the connecting clamping grooves, so that the problem of low test efficiency is solved.

Description

Technical Field

[0001] The utility model relates to the technical field of test chambers, in particular to a partitionable multi-process high and low temperature test chamber. Background Art

[0002] High and low temperature test chambers are suitable for high and low temperature reliability tests of industrial products. The difference between high and low temperature test chambers and high and low temperature alternating test chambers lies mainly in the control part and the refrigeration part. The control part of the high and low temperature test chamber is mainly controlled by a digital display instrument, while the high and low temperature alternating test chamber is controlled by a programmable controller.

[0003] After searching, it was found that it is difficult to conduct multiple experiments simultaneously when using high and low temperature test chambers. For example, the common high and low temperature test chamber has a single structure and cannot hold multiple test objects at the same time for multi-process processing, thus affecting the efficiency of the test processing.

[0004] There is an urgent need for a partitionable multi-process high and low temperature test chamber to solve the technical defects raised in the above-mentioned technology. Utility Model Content

[0005] The utility model aims to provide a partitionable multi-process high and low temperature test box to solve the problem of low test efficiency in the above background technology.

[0006] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a partitionable multi-process high and low temperature test chamber, comprising a test chamber body, a test chamber is arranged inside the test chamber body, a heat conduction component is installed at the top of the test chamber, a heating component is installed on one side of the top of the test chamber body, a cooling component is installed on the other side of the top of the test chamber body, a controller is installed on one side of the front end of the test chamber body, a partition is fixedly connected between the test chambers, a support plate is installed at the bottom end of the test chamber, a placement plate is arranged at the top of the support plate, a sealing door is installed on one side of the front end of the test chamber body, thermal insulation pads are installed on both sides of the partition, the top and bottom ends of the thermal insulation pads are fixedly connected with connecting blocks, connecting slots are arranged on both sides of the partition, and fixing bolts are arranged on one side of the connecting slots.

[0007] Preferably, the connecting block is embedded in the connecting slot, and the fixing bolt is embedded in the partition.

[0008] Preferably, the test chamber is provided with six groups, and the thermal insulation pads are arranged on both sides of the inside of the test chamber.

[0009] Preferably, mounting bolts are installed at the four corners of the top end of the support plate, and the mounting bolts are installed inside the test box body.

[0010] Preferably, mounting slide blocks are fixedly connected to both sides of the placement plate, a ball bearing is movably connected to one side of the mounting slide block, and mounting slide rails are fixedly connected to both sides of the top end of the support plate.

[0011] Preferably, one side of the mounting slide block is embedded in the interior of the mounting slideway in a sliding connection, and one side of the ball bearing is in contact with the inner wall of the mounting slideway.

[0012] Preferably, a sealing buckle is fixedly connected to one side of the sealing door, a sealing slot is installed on one side of one end of the test box body, a locking rod is movably connected to the top and bottom of the front end of the sealing slot, and a visual window is provided at the front end of the sealing door.

[0013] Preferably, the sealing buckle is embedded in the sealing slot, and the locking rod is arranged at one end of the sealing buckle.

[0014] Compared with the prior art, the utility model has the following beneficial effects: the partitionable multi-process high and low temperature test box not only realizes the function of improving efficiency by multi-process, realizes the function of facilitating material discharge, but also realizes the function of enhancing the protective effect;

[0015] (1) By providing the test chamber, partition, thermal insulation pad, connection card slot, connection card block and fixing bolt, the six groups of test chambers inside the test box body can carry out multiple processes simultaneously. The partition between the test chambers can improve the isolation effect, and the thermal insulation pad on the partition can improve the thermal insulation effect. The thickness of the thermal insulation pad can be changed according to the demand. When changing, first unscrew the fixing bolt, and then remove the connection card block on the thermal insulation pad from the connection card slot. This structure facilitates multi-process testing and improves the efficiency of the test;

[0016] (2) The placement plate, the support plate, the mounting slide, the mounting slider and the ball bearing are provided, and the placement plate can be used to place the experimental items. When placing the items, the sealing door needs to be opened first, and then the front end of the placement plate is held and pulled outward, and then the items are placed on the placement plate, and then the placement plate is pushed into the interior of the test chamber. During the movement of the placement plate, the mounting sliders on both sides of the placement plate can slide inside the mounting slide, and this structure realizes the function of facilitating the discharge of materials;

[0017] (3) By providing a sealing card slot, a sealing door, a visual window, a locking rod and a sealing buckle, the sealing door needs to be closed before the test. After the sealing door is closed, the sealing buckle on the sealing door can be buckled into the inside of the sealing card slot. The sealing buckle is buckled into the inside of the sealing card slot to improve the sealing effect. Then, the locking rod can be rotated to press it into the inside of the sealing buckle. This structure realizes the function of enhancing the protection effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a front view cross-sectional structural schematic diagram of the utility model;

[0019] Figure 2 This is a front view structural schematic diagram of the utility model;

[0020] Figure 3 For the utility model Figure 1 The enlarged structural diagram at A in the middle;

[0021] Figure 4 It is a schematic diagram of the side structure of the partition of the utility model.

[0022] In the figure: 1. Test box body; 2. Test chamber; 3. Heat conduction component; 4. Placement plate; 5. Support plate; 6. Partition; 7. Heating component; 8. Cooling component; 9. Mounting slide; 10. Mounting slider; 11. Controller; 12. Sealing slot; 13. Sealing door; 14. Visual window; 15. Locking rod; 16. Sealing buckle; 17. Ball bearing; 18. Mounting bolt; 19. Thermal insulation pad; 20. Connecting slot; 21. Connecting block; 22. Fixing bolt. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0024] Example 1: Please refer to Figure 1-4 A partitionable multi-process high and low temperature test box comprises a test box body 1, a test chamber 2 is arranged inside the test box body 1, a heat conduction component 3 is installed at the top of the test chamber 2, a heating component 7 is installed on one side of the top of the test box body 1, a cooling component 8 is installed on the other side of the top of the test box body 1, a controller 11 is installed on one side of the front end of the test box body 1, a partition 6 is fixedly connected between the test chambers 2, a support plate 5 is installed at the bottom end of the test chamber 2, a placement plate 4 is arranged at the top of the support plate 5, a sealing door 13 is installed on one side of the front end of the test box body 1, thermal insulation pads 19 are installed on both sides of the partition 6, the top and bottom of the thermal insulation pad 19 are fixedly connected with a connecting block 21, connecting card slots 20 are arranged on both sides of the partition 6, and a fixing bolt 22 is arranged on one side of the connecting card slot 20;

[0025] The connection block 21 is embedded in the connection slot 20, the fixing bolt 22 is embedded in the partition 6, the test chamber 2 is provided with six groups, and the heat insulation pad 19 is provided on both sides of the test chamber 2;

[0026] Specifically, Figure 1 and Figure 2 As shown, the six groups of test chambers 2 inside the test box body 1 can carry out multiple processes simultaneously, the partitions 6 between the test chambers 2 can improve the isolation effect, the thermal insulation pads 19 on the partitions 6 can improve the thermal insulation effect, and the thickness of the thermal insulation pads 19 can be replaced as needed. When replacing, first unscrew the fixing bolts 22, and then move the connecting block 21 on the thermal insulation pad 19 out of the connecting slot 20.

[0027] Embodiment 2: Mounting bolts 18 are installed at the four corners of the top of the support plate 5, and the mounting bolts 18 are installed inside the test box body 1. The two sides of the placement plate 4 are fixedly connected with mounting sliders 10, and one side of the mounting slider 10 is movably connected with a ball 17. The two sides of the top of the support plate 5 are fixedly connected with mounting slideways 9, and one side of the mounting slider 10 is embedded in the inside of the mounting slideway 9 in a sliding connection, and one side of the ball 17 is in contact with the inner wall of the mounting slideway 9;

[0028] Specifically, Figure 1 and Figure 3 As shown, when placing an object, it is necessary to first open the sealed door 13, then hold the front end of the placement plate 4 and pull it outward, then place the object on the placement plate 4, and then push the placement plate 4 into the interior of the test chamber 2. During the movement of the placement plate 4, the mounting slides 10 on both sides of the placement plate 4 can slide inside the mounting slide 9.

[0029] Embodiment 3: A sealing buckle 16 is fixedly connected to one side of the sealing door 13, a sealing slot 12 is installed on one side of one end of the test box body 1, a locking rod 15 is movably connected to the top and bottom of the front end of the sealing slot 12, a visual window 14 is provided at the front end of the sealing door 13, the sealing buckle 16 is embedded in the sealing slot 12, and the locking rod 15 is provided at one end of the sealing buckle 16;

[0030] Specifically, Figure 1 and Figure 4 As shown, the sealing door 13 needs to be closed before the test. After the sealing door 13 is closed, the sealing buckle 16 on the sealing door 13 can be buckled into the inside of the sealing slot 12. The sealing buckle 16 is tightly buckled into the inside of the sealing slot 12 to improve the sealing effect. Then, the locking rod 15 is rotated to press it into the inside of the sealing buckle 16.

[0031] Working principle: When the utility model is used, when placing an object, it is necessary to first open the sealing door 13, then hold the front end of the placement plate 4 and pull it outward, then place the object on the placement plate 4, and then push the placement plate 4 into the interior of the test chamber 2. During the movement of the placement plate 4, the mounting slide blocks 10 on both sides of the placement plate 4 can slide inside the mounting slideway 9. Before the test, the sealing door 13 needs to be closed. After the sealing door 13 is closed, the sealing buckle 16 on the sealing door 13 can be buckled inside the sealing card slot 12, and the sealing buckle 16 is tightly buckled in the sealing card slot 1 2 can improve the sealing effect, and then rotate the locking card rod 15 to press it inside the sealing buckle 16. The six groups of test chambers 2 inside the test box body 1 can be carried out in multiple processes at the same time. The partition 6 between the test chambers 2 can improve the isolation effect. The insulation pad 19 on the partition 6 can improve the insulation effect. The thickness of the insulation pad 19 can be replaced according to needs. When replacing, first unscrew the fixing bolt 22, and then move the connecting card block 21 on the insulation pad 19 out of the connecting card slot 20. This structure facilitates multi-process testing and improves the efficiency of the test.

[0032] It is obvious to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be regarded as exemplary and non-restrictive from any point of view, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention. Any reference numeral in a claim should not be regarded as limiting the claim to which it relates.

Claims

1. A partitionable multi-process high and low temperature test chamber, comprising a test chamber body (1), characterized in that: A test chamber (2) is arranged inside the test box body (1), a heat conduction component (3) is installed at the top of the test chamber (2), a heating component (7) is installed on one side of the top of the test box body (1), a cooling component (8) is installed on the other side of the top of the test box body (1), a controller (11) is installed on one side of the front end of the test box body (1), a partition (6) is fixedly connected between the test chambers (2), a support plate (5) is installed at the bottom of the test chamber (2), a placement plate (4) is arranged at the top of the support plate (5), a sealing door (13) is installed on one side of the front end of the test box body (1), thermal insulation pads (19) are installed on both sides of the partition (6), the top and bottom of the thermal insulation pad (19) are fixedly connected with a connecting block (21), connecting slots (20) are arranged on both sides of the partition (6), and a fixing bolt (22) is arranged on one side of the connecting slot (20).

2. The partitionable multi-process high and low temperature test chamber according to claim 1, characterized in that: The connecting block (21) is embedded in the connecting slot (20), and the fixing bolt (22) is embedded in the partition (6).

3. The partitionable multi-process high and low temperature test chamber according to claim 1, characterized in that: The test chamber (2) is provided with six groups, and the heat insulation pads (19) are arranged on both sides inside the test chamber (2).

4. The partitionable multi-process high and low temperature test chamber according to claim 1, characterized in that: Mounting bolts (18) are installed at the four corners of the top of the support plate (5), and the mounting bolts (18) are installed inside the test box body (1).

5. The partitionable multi-process high and low temperature test chamber according to claim 1, characterized in that: The two sides of the placement plate (4) are fixedly connected with mounting slide blocks (10), one side of the mounting slide block (10) is movably connected with a ball (17), and the two sides of the top end of the support plate (5) are fixedly connected with mounting slide rails (9).

6. The partitionable multi-process high and low temperature test chamber according to claim 5, characterized in that: One side of the mounting slide block (10) is embedded in the interior of the mounting slideway (9) in a sliding connection, and one side of the ball bearing (17) is in contact with the inner wall of the mounting slideway (9).

7. The partitionable multi-process high and low temperature test chamber according to claim 1, characterized in that: A sealing buckle (16) is fixedly connected to one side of the sealing door (13); a sealing slot (12) is installed on one side of one end of the test box body (1); a locking rod (15) is movably connected to the top and bottom of the front end of the sealing slot (12); and a visual window (14) is provided at the front end of the sealing door (13).

8. The partitionable multi-process high and low temperature test chamber according to claim 7, characterized in that: The sealing buckle (16) is embedded in the sealing buckle groove (12), and the locking clamp rod (15) is arranged at one end of the sealing buckle (16).

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