Low-temperature testing and sorting equipment for electronic components

Abstract

The utility model discloses low-temperature testing and sorting equipment for electronic components, which is characterized in that a preheating feeding mechanism is arranged on one side in a testing box body through a feeding box, a low-temperature detection box is arranged in the testing box body on the inner side of the feeding box, a material inlet and a material outlet are symmetrically arranged on two sides of the low-temperature detection box, and a conveying belt is arranged in the low-temperature detection box. A hinged discharging plate is arranged on the lower side of the low-temperature detection box, a material collecting box is arranged in the test box body on the lower side of the hinged discharging plate, and a stepped temperature returning mechanism is arranged in the test box body on the inner side of the low-temperature detection box; electronic elements are cooled through the pre-temperature feeding mechanism, the electronic elements are prevented from directly entering an ultralow-temperature environment to be damaged, meanwhile, an internal discharging air cylinder is matched with a hinged discharging plate, discharging and removing can be carried out immediately when the electronic elements are detected to be unqualified, removing after discharging temperature returning is not needed, and meanwhile, by arranging a step temperature returning mechanism, the working efficiency is improved. The multiple sets of temperature returning covers are matched with the heater to achieve adjustment of different temperatures, the temperature is controlled to rise gradually, and stepped temperature returning treatment is achieved.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic component testing, in particular to low-temperature testing and sorting equipment for electronic components. Background Art

[0002] Electronic components refer to various devices and components used in electronic technology, such as transistors, diodes, integrated circuits, capacitors, inductors, transformers, etc. Since electronic components need to go through multiple precise manufacturing processes during the production process, and the performance of electronic component materials will be affected by temperature changes, low-temperature testing is required after the production of electronic components to test their working performance at low temperatures.

[0003] At present, in the process of low-temperature testing of electronic components, it is impossible to directly sort and reject them after the test. For example, a low-temperature testing device and a sorting machine disclosed in announcement number CN220552949U disclose a phenomenon of preventing external air from entering the testing device and causing internal frost by using an anti-frost component. However, after the electronic component inspection is completed, this device needs to be left to stand at room temperature and then discharge the material before it can enter the sorting machine to reject defective products. It is impossible to achieve integrated processing, which is relatively troublesome. At the same time, the low-temperature testing structure and the discharge chamber are integrated in the test box, resulting in the inability of the discharge chamber to quickly and timely return the temperature of the electronic components after inspection, and the return temperature efficiency is low. Therefore, the utility model proposes an electronic component low-temperature testing and sorting equipment to solve the problems existing in the prior art. Utility Model Content

[0004] In view of the above problems, the purpose of the utility model is to propose a low-temperature testing and sorting equipment for electronic components. The low-temperature testing and sorting equipment for electronic components can cool down the electronic components through a pre-heating feeding mechanism, thereby avoiding damage to the electronic components caused by directly entering an ultra-low temperature environment. At the same time, the internal unloading cylinder cooperates with the articulated unloading plate to immediately unload and reject the unqualified materials in the inspection, without waiting for the discharged materials to return to temperature before rejection. At the same time, a step temperature return mechanism is set up, and multiple groups of temperature return hoods cooperate with heaters to achieve adjustment of different temperatures, control the temperature to gradually increase, and realize step-by-step temperature return treatment.

[0005] To achieve the purpose of the utility model, the utility model is implemented through the following technical solutions: a low-temperature testing and sorting equipment for electronic components, including a test box, a feed box, a pre-temperature feeding mechanism, a low-temperature detection box, an inlet and outlet, a conveyor belt, a hinged blanking plate, a collection box and a step-temperature return mechanism. A pre-temperature feeding mechanism is arranged on one side of the test box through the feed box, a low-temperature detection box is arranged in the test box inside the feed box, inlet and outlet are symmetrically arranged on both sides of the low-temperature detection box, a conveyor belt is arranged in the low-temperature detection box, and an extended plane structure is formed between the inner side wall of the inlet and outlet and the conveyor belt, a hinged blanking plate is arranged on the lower side of the low-temperature detection box, and an insulation layer is arranged on the inner side wall of the low-temperature detection box and the inner side of the hinged blanking plate, a cooling device is also arranged in the low-temperature detection box, a collection box is arranged in the test box under the hinged blanking plate, and a step-temperature return mechanism is arranged in the test box inside the low-temperature detection box.

[0006] Further improvements are: the pre-temperature feeding mechanism includes a feeding gate, an electric rod, a closed gate, a hinged lifting plate, a precooler and an air inlet, a feeding gate is arranged on the side wall of the test box body on the side of the feeding box, a closed gate is arranged on the feeding gate through the electric rod, a hinged lifting plate is arranged on the bottom surface of the feeding box, a precooler is arranged on the test box body, and an air inlet is arranged on the top of the feeding box, and the air inlet is connected to the precooler pipeline.

[0007] Further improvements are: telescopic rods are symmetrically arranged on both sides above the low-temperature detection box, a sealing rubber plate is arranged between the side of the telescopic rod and the telescopic end, the sealing rubber plate is inserted into the inlet and outlet for sealing, and the front and rear sides of the low-temperature detection box are symmetrically provided with detection chucks through detection cylinders.

[0008] A further improvement is that a blanking plate is arranged in the middle of the upper part of the low-temperature detection box through a blanking cylinder, the blanking cylinder is fixedly arranged on the top of the low-temperature detection box, the blanking plate is arranged at the telescopic end of the blanking cylinder, and an articulated cylinder is arranged between the lower side of the hinged blanking plate and the side wall of the low-temperature detection box.

[0009] Further improvements are: the stepped temperature recovery mechanism includes a conveyor belt, a lifting cylinder, a temperature recovery hood, a heater, an air outlet and a discharge gate; a conveyor belt is provided on one side of the test box; a temperature recovery hood is provided in the test box above the conveyor belt through a lifting cylinder; the lifting cylinder is fixed at the top of the test box; a temperature recovery hood is provided downward at the telescopic end of the lifting cylinder; multiple groups of temperature recovery hoods are provided; a heater is provided above the test box; the heater corresponds to the multiple groups of temperature recovery hoods; air outlets are distributed in the temperature recovery hood; the heater is connected to the air outlet pipe; and a discharge gate is provided on the other side of the test box.

[0010] A further improvement is that a hinged lifting plate is also arranged between the conveyor belts on the side of the low-temperature detection box, material boxes are distributed on the conveyor belts, and drive motors are symmetrically arranged on the front side of the test box body, and the output end of the drive motor is connected to the conveyor belt and the conveyor belt for transmission.

[0011] The beneficial effects of the utility model are as follows: the utility model uses a pre-heating feeding mechanism to cool down the electronic components, thereby avoiding damage to the electronic components caused by directly entering an ultra-low temperature environment; at the same time, the internal unloading cylinder cooperates with the hinged unloading plate to immediately unload and reject unqualified materials when they are detected, without waiting for the unloaded materials to return to temperature before rejection, effectively solving the problem that the existing detection equipment needs to reject unqualified products separately; at the same time, a stepped temperature return mechanism is set up, and multiple groups of temperature return hoods cooperate with heaters to achieve adjustment of different temperatures, control the temperature to gradually increase, and realize stepped temperature return processing, effectively solving the defect that the traditional device needs to stand still for temperature return before discharging, and the practicality is greatly improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is the main sectional structural diagram of the utility model.

[0013] Figure 2 It is the front view of the utility model.

[0014] Figure 3 It is a side sectional structural diagram of the utility model.

[0015] Among them: 1. Test box; 2. Feed box; 3. Low temperature test box; 4. Feed inlet and outlet; 5. Conveyor belt; 6. Articulated unloading plate; 7. Collecting box; 8. Feed gate; 9. Electric rod; 10. Closed gate; 11. Articulated lifting plate; 12. Precooler; 13. Air inlet; 14. Telescopic rod; 15. Closed rubber plate; 16. Detection cylinder; 17. Detection chuck; 18. Unloading cylinder; 19. Unloading plate; 20. Articulated cylinder; 21. Conveyor belt; 22. Lifting cylinder; 23. Rewarming hood; 24. Heater; 25. Air outlet; 26. Unloading gate; 27. Material box; 28. Drive motor. DETAILED DESCRIPTION

[0016] In order to deepen the understanding of the present invention, the present invention will be further described in detail below in conjunction with an embodiment. The embodiment is only used to explain the present invention and does not constitute a limitation on the protection scope of the present invention.

[0017] according to Figure 1 , Figure 2 and Figure 3As shown, this embodiment provides a low-temperature testing and sorting device for electronic components, including a test box 1, a feed box 2, a pre-temperature feeding mechanism, a low-temperature detection box 3, an inlet and outlet 4, a conveyor belt 5, a hinged unloading plate 6, a collection box 7 and a step temperature return mechanism. A pre-temperature feeding mechanism is provided on one side of the test box 1 through the feed box 2, a low-temperature detection box 3 is provided in the test box 1 inside the feed box 2, and inlet and outlet 4 are symmetrically provided on both sides of the low-temperature detection box 3. The side wall of the feed box at the same height as the inlet and outlet is penetrated by a A pushing structure is provided, which is realized by a cylinder and is not shown in the accompanying drawings. A conveyor belt 5 is provided in the low-temperature detection box 3, and an extended plane structure is provided between the inner wall of the inlet and outlet and the conveyor belt. A hinged blanking plate 6 is provided on the lower side of the low-temperature detection box 3, and an insulation layer is provided on the inner side wall of the low-temperature detection box and the inner side of the hinged blanking plate. A cooling device is also provided in the low-temperature detection box, and a collection box 7 is provided in the test box body 1 on the lower side of the hinged blanking plate 6, and a step temperature return mechanism is provided in the test box body 1 inside the low-temperature detection box 3.

[0018] The pre-temperature feeding mechanism includes a feeding gate 8, an electric rod 9, a closed gate 10, a hinged lifting plate 11, a pre-cooler 12 and an air inlet 13. A feeding gate 8 is arranged on the side wall of the test box 1 on the side of the feeding box 2, a closed gate 10 is arranged on the feeding gate 8 through the electric rod 9, a hinged lifting plate 11 is arranged on the bottom surface of the feeding box 2, a pre-cooler 12 is arranged on the test box 1, and an air inlet 13 is arranged on the top of the feeding box 2. The air inlet 13 is connected to the pre-cooler 12 pipeline for pre-cooling the electronic components to be tested in the feeding box.

[0019] Telescopic rods 14 are symmetrically arranged on both sides above the low-temperature detection box 3, and a sealing rubber plate 15 is arranged between the side of the telescopic rod 14 and the telescopic end. The sealing rubber plate 15 is inserted into the inlet and outlet 4 for sealing. The front and rear sides of the low-temperature detection box 3 are symmetrically provided with detection chucks 17 through detection cylinders 16 for detecting electronic components.

[0020] A blanking plate 19 is arranged in the middle part above the low-temperature detection box 3 through a blanking cylinder 18. The blanking cylinder is fixedly arranged on the top of the low-temperature detection box, and the blanking plate is arranged at the telescopic end of the blanking cylinder. A hinged cylinder 20 is arranged between the lower side of the hinged blanking plate 6 and the side wall of the low-temperature detection box 3, and the opening and closing of the hinged blanking plate is controlled by the hinged cylinder.

[0021] The stepped temperature recovery mechanism includes a conveyor belt 21, a lifting cylinder 22, a temperature recovery hood 23, a heater 24, an air outlet 25 and a discharge gate 26. A conveyor belt 21 is arranged on one side of the test box 1. A temperature recovery hood 23 is arranged in the test box 1 above the conveyor belt 21 through a lifting cylinder 22. The lifting cylinder is fixed at the top of the test box. A temperature recovery hood is arranged downward at the telescopic end of the lifting cylinder. There are multiple groups of temperature recovery hoods. A heater 24 is arranged above the test box 1. The heater corresponds to the multiple groups of temperature recovery hoods. Air outlets 25 are distributed in the temperature recovery hood 23. The heater 24 is connected to the air outlet 25 through a pipe. A discharge gate 26 is arranged on the other side of the test box 1.

[0022] A hinged lifting plate 11 is also arranged between the conveyor belts 21 on the side of the low-temperature detection box 3, and material boxes 27 are distributed on the conveyor belts 21. A driving motor 28 is symmetrically arranged on the front side of the test box body 1, and the output end of the driving motor 28 is connected to the conveyor belt 5 and the conveyor belt 21 for transmission.

[0023] When the electronic component low-temperature testing and sorting equipment is used, the electronic components are first placed in a material box, and then the material box is placed in a feed box, the electronic components are pre-cooled by a pre-cooler, and then the material box is sent up by a hinged lifting plate, the inlet and outlet are opened, and the electronic components are pushed into a low-temperature testing box, and are transported to the middle by a conveyor belt, and tested by a testing chuck, and qualified ones are pushed out from the other side of the inlet and outlet into a material box on the hinged lifting plate above the conveyor belt for collection; when unqualified electronic components are detected, the hinged unloading plate is first opened, and then the unqualified electronic components are pushed down by the unloading cylinder to the collection box below the hinged unloading plate, and then the hinged unloading plate is closed;

[0024] After unloading, the conveyor belt drives multiple groups of material boxes to move, and the stepped temperature recovery mechanism performs a stepped temperature recovery treatment. The temperature in the temperature recovery hood increases successively, which improves the temperature recovery speed and avoids damage to electronic components caused by direct high-temperature temperature recovery.

[0025] The above shows and describes the basic principles, main features and advantages of the utility model. Those skilled in the art should understand that the utility model is not limited by the above embodiments. The above embodiments and descriptions are only for explaining the principles of the utility model. Without departing from the spirit and scope of the utility model, the utility model may have various changes and improvements, which fall within the scope of the utility model to be protected. The scope of protection claimed by the utility model is defined by the attached claims and their equivalents.

Claims

1. A low temperature testing and sorting equipment for electronic components, characterized in that: The invention comprises a test box (1), a feed box (2), a pre-heating feed mechanism, a low-temperature detection box (3), a material inlet and outlet (4), a conveyor belt (5), a hinged material discharge plate (6), a material collection box (7) and a step temperature recovery mechanism. A pre-heating feed mechanism is arranged on one side of the test box (1) through the feed box (2). A low-temperature detection box (3) is arranged in the test box (1) inside the feed box (2). The material inlet and outlet (4) are symmetrically arranged on both sides of the low-temperature detection box (3). A conveyor belt (5) is arranged in the low-temperature detection box (3). A hinged material discharge plate (6) is arranged on the lower side of the low-temperature detection box (3). A material collection box (7) is arranged in the test box (1) below the hinged material discharge plate (6). A step temperature recovery mechanism is arranged in the test box (1) inside the low-temperature detection box (3).

2. The electronic component low temperature testing and sorting equipment according to claim 1, characterized in that: The pre-heating feeding mechanism comprises a feeding gate (8), an electric rod (9), a closed gate plate (10), a hinged lifting plate (11), a pre-cooler (12) and an air inlet (13); a feeding gate (8) is provided on the side wall of the test box (1) on the side of the feeding box (2); a closed gate plate (10) is provided on the feeding gate (8) through the electric rod (9); a hinged lifting plate (11) is provided on the inner bottom surface of the feeding box (2); a pre-cooler (12) is provided on the test box (1); an air inlet (13) is provided on the inner top of the feeding box (2); and the air inlet (13) is connected to a pipeline of the pre-cooler (12).

3. The electronic component low temperature testing and sorting equipment according to claim 1, characterized in that: Telescopic rods (14) are symmetrically arranged on both sides above the low-temperature detection box (3); a sealing rubber plate (15) is arranged between the side surface and the telescopic end of the telescopic rod (14); the sealing rubber plate (15) is inserted into the inlet and outlet ports (4) for blocking; and a detection chuck (17) is symmetrically arranged on the front and rear sides of the low-temperature detection box (3) through a detection cylinder (16).

4. The electronic component low temperature testing and sorting equipment according to claim 1, characterized in that: A material discharge plate (19) is provided in the middle of the upper part of the low-temperature detection box (3) through a material discharge cylinder (18), and a hinged cylinder (20) is provided between the lower side of the hinged material discharge plate (6) and the side wall of the low-temperature detection box (3).

5. The electronic component low temperature testing and sorting equipment according to claim 1, characterized in that: The step temperature recovery mechanism comprises a conveyor belt (21), a lifting cylinder (22), a temperature recovery cover (23), a heater (24), an air outlet (25) and a discharge gate (26); a conveyor belt (21) is provided on one side of the test box (1); a temperature recovery cover (23) is provided in the test box (1) above the conveyor belt (21) via a lifting cylinder (22); a heater (24) is provided above the test box (1); air outlets (25) are distributed in the temperature recovery cover (23); the heater (24) is connected to the air outlet (25) by a pipeline; and a discharge gate (26) is provided on the other side of the test box (1).

6. The electronic component low temperature testing and sorting equipment according to claim 5, characterized in that: A hinged lifting plate (11) is also provided between the conveyor belts (21) on the side of the low-temperature detection box (3), and material boxes (27) are distributed on the conveyor belts (21). A driving motor (28) is symmetrically provided on the front side of the test box body (1), and the output end of the driving motor (28) is connected to the conveyor belt (5) and the conveyor belt (21) for transmission.

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