Test machine clamping and testing jig for semiconductor packaging

Abstract

The utility model relates to the related technical field of graphite electrodes, and discloses a test machine clamping and testing jig for semiconductor packaging, which is matched with a golden finger and a test piece for use and comprises a pressing block, a positioning block, two clamping blocks, a placement table and a bottom support, the two clamping blocks are respectively arranged on two sides of the bottom support and clamp the test piece to be fixed relative to the bottom support, and the positioning block is arranged on the placement table. The positioning block is arranged on the bottom support, a golden finger is arranged at the top of the positioning block, the placing table is arranged on the clamping block and the bottom support and is relatively fixed with the clamping block and the bottom support, and the pressing block is arranged on the placing table and is clamped and fixed with the placing table. The equipment capacity is improved, the accuracy of product parameters is improved, the equipment stability is enhanced, and therefore the maintenance cost is saved.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor device packaging, in particular to a test machine clamping fixture used for semiconductor packaging. Background Art

[0002] In the semiconductor discrete device and IC packaging industry, after the chip package is cured and the ribs are cut and formed, it is necessary to perform parameter testing on the internal performance of the chip. This kind of test requires the use of a parameter testing machine. Before the test, the product to be tested must be fixed in the specified position of the equipment, and a certain stability is required to support the entire test process. The existing test machine gold finger fixture generally matches the pins of the product to be tested one by one, that is, one gold finger matches one corresponding pin of the product test. If this fixture is deformed after leaving the factory, it is impossible to ensure that all pins are at the same height, resulting in the inability to measure accurate parameters during the test, resulting in mismeasurement, reducing the UPH of the equipment, affecting the equipment parameters, and causing equipment damage if there is a virtual connection. Therefore, a fixture design that can meet the fixed conditions for product parameter testing is particularly important. Utility Model Content

[0003] The purpose of the utility model is to provide a test fixture for a semiconductor package tester to solve the above problems.

[0004] In order to achieve the above objectives, the following technical solutions are provided:

[0005] A test fixture for a semiconductor package tester, used in conjunction with a gold finger and a test piece, comprises: a pressure block, a positioning block, a clamping block, a placement table and a base, wherein there are two clamping blocks, which are respectively arranged on both sides of the base and clamp the test piece and fix it relatively thereto, the positioning block is arranged on the base and a gold finger is arranged on the top of the positioning block, the placement table is arranged on the clamping block and the base and fixed relatively thereto, and the pressure block is arranged on the placement table and clamped and fixed thereto.

[0006] Preferably, the two ends of the two side walls of the base are provided with fixing holes that cooperate with the clamping block, the middle of the two side walls are also provided with a recess, the top is provided with a positioning hole that cooperates with the placement table, and the middle of the top surface is also provided with a plug that cooperates with the positioning block.

[0007] Preferably, there are two clamping blocks, the top of which is provided with two positioning holes for engaging with the placement table, and the middle of one side wall is provided with a second recess, and both sides of the second recess are provided with fixing bolts for engaging with the bottom bracket.

[0008] Preferably, a positioning hole three is provided in the middle of the positioning block, which is used to engage with the base and the gold finger. Positioning pins for cooperating with the gold finger are also provided on both sides of the positioning hole three. A positioning column is also provided at the bottom of the positioning block to be engaged and fixed with the testing machine.

[0009] Preferably, the placement table is a "mouth"-shaped structure, with a fixing pin at the bottom thereof that is engaged with the clamping block and the bottom bracket, and blocks at the top of both sides that are engaged with the pressure block for positioning, a positioning hole four that is engaged with the pressure block for positioning, and a slot that is engaged with the pressure block for clamping is also provided in the middle of the outer side of the block.

[0010] Preferably, both side walls of the pressing block are respectively provided with fixing pins which are engaged with the card slots on the placing table, the top of the fixing pin is provided with a hand buckle, and the bottom is also provided with a hook facing inward, and the four corners of the bottom of the pressing block are respectively provided with positioning pins which are engaged with the four positioning holes for positioning, and the two ends of the bottom of the pressing block without fixing pins are provided with clamping blocks which are engaged with the gold fingers and the test piece for clamping.

[0011] The beneficial effects of the utility model are:

[0012] The utility model can meet the test of SOP patch type semiconductor packaging form, has reliable stability and convenient operation, improves equipment production capacity, increases the accuracy of product parameters, enhances equipment stability, and thus eliminates maintenance costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a structural schematic diagram of an embodiment of the utility model;

[0014] Figure 2 It is a schematic diagram of the structure of the briquette;

[0015] Figure 3 It is a structural schematic diagram of the placement table;

[0016] Figure 4 It is a schematic diagram of the structure of the clamping block;

[0017] Figure 5 It is a structural diagram of the positioning block;

[0018] Figure 6 It is a structural schematic diagram of the bottom bracket;

[0019] Figure 7 It is a schematic diagram of the structure of the base, clamping block, positioning block, test piece and gold finger;

[0020] In the figure:

[0021] 1-pressing block, 11-hand buckle, 12-hook, 13-positioning pin, 14-pressing block;

[0022] 2-positioning block, 21-positioning hole three, 22-positioning pin;

[0023] 3-clamping block, 31-positioning hole 2, 32-fixing bolt, 33-recess 2;

[0024] 4-placing table, 41-fixing pin, 42-block, 43-slot, 44-positioning hole four;

[0025] 5- bottom bracket, 51- fixing hole, 52- recess 1, 53- plug, 54- positioning column;

[0026] 6-test piece;

[0027] 7-Golden Finger; DETAILED DESCRIPTION

[0028] The following will combine the embodiments of the present invention to clearly and completely describe the technical solutions of the schematic diagrams in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0029] like Figure 1-7 As shown, a test machine clamping fixture for semiconductor packaging is used in conjunction with a gold finger 7 and a test piece 6, comprising: a pressure block 1, a positioning block 2, a clamping block 3, a placement table 4 and a base 5, wherein there are two clamping blocks 3, which are respectively arranged on both sides of the base 5 and clamp the test piece 6 and fix it relatively thereto, the positioning block 2 is arranged on the base 5, and a gold finger 7 is arranged on the top of the positioning block 2, the placement table 4 is arranged on the clamping block 3 and the base 5, and is fixed relatively thereto, and the pressure block 1 is arranged on the placement table 4 and is clamped and fixed thereto.

[0030] In some embodiments, a recess 52 is provided in the middle of both side walls of the base 5, and fixing holes 51 are provided on both sides of the recess 52 to cooperate with the clamping block 3, a plug 53 is provided in the middle of the top surface to cooperate with the positioning block 2, and positioning holes 1 are provided on both sides of the top to cooperate with the placement table 4.

[0031] In some embodiments, there are two clamping blocks 3, which are respectively arranged on both sides of the base 5. A second positioning hole 31 is provided on the top of the clamping block 3 to cooperate with the placement table 4, and a second recess 33 is also provided in the middle of one side wall. The gap formed by the cooperation between the second recess 33 and the first recess 52 on the two side walls of the base 5 can just clamp the two test pieces 6 relatively. Fixed bolts 32 that cooperate with the base 5 are also provided on both sides of the second recess 33. The fixing bolts 32 are respectively inserted into the fixing holes 51 on both sides of the first recess 52 and are relatively fixed to the base 5.

[0032] In some embodiments, a positioning hole three 21 is provided in the middle of the positioning block 2, which is passed through from top to bottom and is used to engage with the base 5 and the gold finger 7. Positioning pins 22 for cooperating with the gold finger 7 for positioning are also provided on both sides of the positioning hole three 21. The bottom of the gold finger 7 is inserted into the positioning hole three 21, and the contour structure on both sides is the same as the outer contour of the positioning pin 22, which can be just embedded in the positioning block 2. After the gold finger 7 is fixed in position, the test position just overlaps with the two test pieces 6 after clamping. A positioning column 54 is also provided at the bottom of the positioning block 2 for engaging and fixing with the testing machine.

[0033] In some embodiments, the placement table 4 is a "mouth"-shaped structure, and its bottom is provided with fixing pins 41 that cooperate with the clamping block 3 and the base 5. A certain number of fixing pins 41 are simultaneously inserted into the positioning hole 2 31 on the clamping block 3 and the positioning hole 1 on the base 5, so that the two clamping blocks 3 and the base 5 are fixed into a whole, and the position of the test piece 6 is further fixed. The top of both sides of the placement table 4 is also provided with a clamping block 42 that is clamped and positioned with the pressure block 1, and the top of the clamping block 42 is provided with a positioning hole 44 that cooperates with the pressure block 1 for positioning, and the middle part of the outer side of the clamping block 42 is also provided with a clamping groove 43 that cooperates with the pressure block 1 for clamping.

[0034] In some embodiments, the two side walls of the pressing block 1 are respectively provided with fixing pins that cooperate with the card slots 43 on the placement table 4, the top of the fixing pin is provided with a hand buckle 11, and the bottom is also provided with a hook 12 facing inward. The pressing block 1 is pressed downward to make the hook 12 deform outward and be stuck in the card slot 43 on the card block 42, so as to achieve relative fixation of the pressing block 1 and the placement table 4. When separation is required after the test is completed, the hand buckle 11 is pressed inward to cause the hook 12 to deform outward, and the hook 12 is disengaged from the card slot 43 on the card block 42, and the pressing block 1 can be pulled out upward. The four corners of the bottom of the pressing block 1 are respectively provided with positioning pins 13 that cooperate with the positioning holes 44 on the card block 42 for positioning, so that the clamping block 14 can be more accurately aligned with the gold finger 7 and the test pressing block 1, and the two ends of the bottom of the pressing block 1 without fixing pins are provided with clamping blocks 14 that cooperate with the gold finger 7 and the test piece 6 for clamping, and the bottom of the clamping block 14 is a slope structure, and its inclination angle is just enough to make the gold finger 7 and the test piece 6 cooperate and be clamped.

Claims

1. A test fixture for semiconductor packaging, used in conjunction with a gold finger and a test piece, characterized in that: include: A pressure block, a positioning block, a clamping block, a placement table and a base. There are two clamping blocks, which are respectively arranged on both sides of the base and clamp the test piece to fix it relatively. The positioning block is arranged on the base, and a gold finger is arranged on the top of the base. The placement table is arranged on the clamping block and the base and fixed relatively thereto. The pressure block is arranged on the placement table and clamped and fixed thereto.

2. The test fixture for semiconductor packaging according to claim 1, characterized in that: The two ends of the two side walls of the base are provided with fixing holes that cooperate with the clamping block, the middle of the two side walls are respectively provided with a recess, the top is provided with a positioning hole that cooperates with the placement table, and the middle of the top surface is also provided with a plug that cooperates with the positioning block.

3. The test fixture for semiconductor packaging according to claim 1, characterized in that: There are two clamping blocks, the top of which is provided with two positioning holes for engaging with the placing table, and the middle of one side wall is provided with two recesses, and both sides of the two recesses are provided with fixing bolts for engaging with the bottom bracket.

4. The test fixture for semiconductor packaging according to claim 1, characterized in that: The middle of the positioning block is provided with a positioning hole three which runs through from top to bottom and is used for engaging with the base and the gold finger. Both sides of the positioning hole three are also provided with positioning pins which cooperate with the gold finger for positioning. The bottom of the positioning block is also provided with a positioning column which is engaged and fixed with the testing machine.

5. The test fixture for semiconductor packaging according to claim 1, characterized in that: The placement platform is of a "mouth"-shaped structure, with a fixing pin at the bottom thereof that cooperates with the clamping block and the bottom bracket, and clamping blocks at the tops of both sides that are respectively engaged with the pressure block for positioning, a positioning hole four that cooperates with the pressure block for positioning is provided on the top of the clamping block, and a clamping groove that cooperates with the pressure block for clamping is also provided in the middle of the outer side of the clamping block.

6. The test fixture for semiconductor packaging according to claim 1, characterized in that: The two side walls of the pressing block are respectively provided with fixing pins that are engaged with the card slots on the placement table, the top of the fixing pin is provided with a hand buckle, and the bottom is also provided with a hook facing inward, and the four corners of the bottom of the pressing block are respectively provided with positioning pins that cooperate with the four positioning holes for positioning, and the two ends of the bottom of the pressing block without fixing pins are provided with clamping blocks that cooperate with the gold fingers and the test piece for clamping.

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