Semiconductor static test system

Abstract

The utility model provides a semiconductor static test system, which comprises a body provided with an accommodating cavity; the jig module is detachably arranged on the body, the jig module can be electrically connected with a to-be-tested product when the to-be-tested product is fixed, and the jig module further comprises a handle so that the jig module can be disassembled and assembled conveniently; the display module is arranged on the body and is used for displaying parameter information of a to-be-tested product; and the control main board is arranged in the accommodating cavity and is electrically connected with the jig module and the display module. All electrical devices are concentrated on the body, and different electrical devices are called through the control module, so that all performance parameters can be detected only by fixing the product to be detected once. By implementing the semiconductor static test system provided by the embodiment of the invention, the purposes of integrating electrical equipment for testing an electronic product and improving the detection efficiency can be achieved.

Description

Technical Field

[0001] The utility model relates to the field of electronic product testing, in particular to a semiconductor static testing system. Background Art

[0002] In the prior art, some electronic products must be tested to determine whether they are qualified. The process of electronic product testing usually involves high voltage and high current. Electrical equipment that generates high voltage and high current is usually large in size / occupies a large space, and is generally inconvenient / difficult to carry. Testers usually need to measure each electronic product to be tested separately, or use an assembly line measurement method. When testing electronic products of different specifications, measurement personnel often need to re-clarify the line connection. This seriously leads to low measurement efficiency and a high error rate. Utility Model Content

[0003] In view of the deficiencies of the prior art, the utility model provides a semiconductor static test system to achieve the purpose of integrating electrical equipment for testing electronic products and improving detection efficiency.

[0004] To this end, an embodiment provides a semiconductor static test system, including:

[0005] A body having a receiving cavity;

[0006] A fixture module, wherein the fixture module is detachably disposed on the body, the fixture module is used to be electrically connected to the product to be tested when fixing the product to be tested, and the fixture module further comprises a handle to facilitate the disassembly and assembly of the fixture module;

[0007] A display module, which is arranged on the body and is used to display parameter information of the product to be tested;

[0008] A control mainboard is disposed in the accommodating cavity and is electrically connected to the fixture module and the display module.

[0009] As a further optional solution of the semiconductor static testing system, a cover body is further included, and the cover body can cover the fixture module.

[0010] As a further optional solution of the semiconductor static testing system, the cover body is further provided with an observation area, and the observation area is made of a transparent material.

[0011] As a further optional solution of the semiconductor static test system, it also includes a plurality of support columns and support plates, wherein the support columns are fixed inside the accommodating cavity, and the support plates are fixed on the support columns and used to support external electrical equipment.

[0012] As a further optional solution of the semiconductor static test system, a plurality of mounting holes are provided on the support column along the length direction of the support column, and fixing members corresponding to the mounting holes are provided on the support plate.

[0013] As a further optional solution of the semiconductor static test system, a sliding member is further provided, and the sliding member is arranged below the main body.

[0014] As a further optional solution of the semiconductor static test system, the main body is provided with a door body, and opening the door body can connect the accommodating cavity with the outside.

[0015] As a further optional solution for the semiconductor static test system, the fixture module is provided with an interface, the control main board includes a cable, one end of the cable is provided with a connector, and the interface is inserted into the interface to achieve electrical connection between the fixture module and the control main board.

[0016] As a further optional solution of the semiconductor static test system, the fixture module includes a fixing mechanism, and the fixing mechanism is used to fix the product to be tested.

[0017] As a further optional solution of the semiconductor static test system, the fixture module is further provided with a guiding mechanism, and the guiding mechanism is used to guide the product to be tested to be electrically connected to the fixture module.

[0018] Implementing the embodiments of the present utility model will have the following beneficial effects:

[0019] According to the semiconductor static test system in the above embodiment, the fixture module is arranged on the main body, and the product to be tested is placed on the fixture module, so that the product to be tested is fixed and electrically connected to the fixture module. The control mainboard is placed in the accommodating cavity of the main body, and some auxiliary electrical equipment is also placed in the accommodating cavity and electrically connected to the control mainboard. The control mainboard provides different currents and voltages to the product to be tested according to the test process through a preset program and obtains the parameter information of the product to be tested, and finally displays the feedback parameter information on the display module. Since all electrical equipment are concentrated on the main body, different electrical equipment are called by the control module, so that all performance parameters can be detected only by fixing the product to be tested once. The tester can lift the handle to complete the disassembly and assembly of the fixture module and the main body, and replace the fixture module matching other products to be tested according to the actual test requirements. The implementation of the semiconductor static test system in this embodiment can integrate the electrical equipment for electronic product testing and improve the detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0021] in:

[0022] Figure 1 The overall structure diagram of a semiconductor static test system provided according to an embodiment of the utility model is shown;

[0023] Figure 2 A schematic diagram of the overall structure of a semiconductor static test system from another perspective provided by an embodiment of the utility model is shown;

[0024] Figure 3 Shows Figure 2 A partial enlarged view of the middle A;

[0025] Figure 4 The figure shows an overall structural diagram of a fixing device provided according to an embodiment of the utility model.

[0026] Description of main component symbols:

[0027] Main body-10; accommodating cavity-110; fixture module-20; product to be tested-100; display module-30; control main board-40; cover body-50; observation area-510; support column-60; mounting hole-610; support plate-70; sliding member-80; door body-120; fixing mechanism-210; handle-220; interface-230; dust cover-240. DETAILED DESCRIPTION

[0028] In order to facilitate the understanding of the present invention, the present invention will be described more comprehensively with reference to the accompanying drawings. The accompanying drawings provide preferred embodiments of the present invention. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0029] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only.

[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art in the technical field of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0031] In the embodiment of the present utility model, a semiconductor static test system is provided. Please refer to Figure 1-Figure 4 The semiconductor static test system includes a main body 10, a fixture module 20, a display module 30 and a control main board 40. The main body 10 has a housing cavity 110. The fixture module 20 is detachably arranged on the main body 10. The fixture module 20 can be electrically connected to the product to be tested 100 when the product to be tested 100 is fixed. The fixture module 20 also includes a handle 220 to facilitate the disassembly and assembly of the fixture module 20. The display module 30 is arranged on the main body 10 and is used to display parameter information of the product to be tested 100. The control main board 40 is arranged in the housing cavity 110 and is electrically connected to the fixture module 20 and the display module 30.

[0032] According to the semiconductor static test system in the above embodiment, the fixture module 20 is arranged on the body 10, and the product to be tested 100 is placed on the fixture module 20, so that the product to be tested 100 is fixed and electrically connected to the fixture module 20. The control mainboard 40 is placed in the accommodating cavity 110 of the body 10, and some auxiliary electrical equipment is also placed in the accommodating cavity 110 and electrically connected to the control mainboard 40. The control mainboard 40 provides different currents and voltages to the product to be tested 100 according to the test process through a preset program and obtains the parameter information of the product to be tested 100 feedback, and finally displays the feedback parameter information on the display module 30. Since all electrical equipment is concentrated on the body 10, different electrical equipment is called by the control module, so that all performance parameters can be detected only by fixing the product to be tested 100 once. The tester can lift the handle 220 to complete the disassembly and assembly of the fixture module 20 and the body 10, and replace the fixture module 20 matching other products to be tested according to the actual test requirements. The semiconductor static test system of this embodiment can integrate the electrical equipment for testing electronic products and improve the detection efficiency.

[0033] The fixture module 20 is generally preset with pins that match the product 100 to be tested. When the product 100 to be tested is fixed on the fixture module 20, the pins are just electrically connected to the electrical contacts of the product 100 to simulate the various environments of the product 100 in actual use. It can be seen that the fixture module 20 is generally matched with a certain electronic product or a series of electronic products. When replacing other electronic products for testing, it is generally necessary to replace the fixture module 20 together, and then connect the fixture module 20 to the control mainboard 40 to complete the electrical connection.

[0034] The electrical equipment generally includes a bridge, an electrical fire-proof current-limiting protector, a voltage source, a current source, etc., so as to simulate parameter information of the product under test 100 under high load, high voltage, high current and other working conditions encountered in actual work.

[0035] A bridge is an instrument used to measure resistance, inductance, and capacitance. It mainly uses physical principles to perform measurements. The principle of the bridge is based on the basic principle that "the potential of two points where current does not flow is equal." By measuring the voltage between the four nodes of the bridge, the value of the physical quantity to be measured, such as resistance, inductance, or capacitance, can be obtained.

[0036] The electrical fire-proof current-limiting protector can accurately detect the current of the power circuit, quickly limit the short-circuit current at a speed of microseconds to achieve arc extinguishing protection, and integrates multiple functions such as voltage, current, frequency, leakage, temperature, and fault arc detection, and is a new type of power safety monitoring device with intelligent analysis capabilities. When an electrical accident occurs in the power supply equipment, the detector can send out an audible and visual alarm signal or upload it to the cloud background to promptly remind the user to check the fault, eliminate possible electrical hazards, and prevent accidents.

[0037] The current source, or ideal current source, is a model abstracted from the actual power supply. Its terminals can always provide a certain current to the outside regardless of the voltage at both ends. The current source has two basic properties: first, the current it provides is a constant value I or a certain time function I(t) and has nothing to do with the voltage at both ends. Second, the current source itself is fixed, while the voltage at both ends is arbitrary.

[0038] Since the current of the current source is fixed, the current source cannot be disconnected. When the current source is connected in series with a resistor, its effect on the external circuit is the same as that of a single current source. In addition, the current source and the voltage source can be equivalently converted. A current source in parallel with a resistor can be equivalent to a voltage source in series with a resistor.

[0039] High voltage is usually achieved by transformers. This is mainly because some electronic products need to meet 240V or 380V tests, while the mains voltage is usually 220V, so a transformer is needed to achieve voltage transformation to meet the test conditions.

[0040] It should be noted that the above electrical equipment can be replaced according to actual test requirements to match different test requirements. In most cases, a set of electrical equipment can basically meet all test states of electronic products through the control of the control mainboard 40.

[0041] In some specific embodiments, a cover 50 is further included, and the cover 50 can cover the fixture module 20 .

[0042] The main function of the cover 50 is to cover the fixture module 20. On the one hand, it is to prevent the risk of fire and explosion during the test process. On the other hand, the cover 50 is usually made of metal material and can play an electromagnetic shielding role.

[0043] In some specific embodiments, the cover 50 is further provided with an observation area 510 , and the observation area 510 is made of a transparent material.

[0044] The transparent material can be acrylic plastic, explosion-proof glass, etc.

[0045] In some specific embodiments, please refer to Figure 2 and Figure 3 , and further includes a plurality of support columns 60 and a support plate 70. The support columns 60 are fixed inside the accommodating cavity 110, and the support plates 70 are fixed on the support columns 60 and are used to support external electrical equipment.

[0046] In order to make full use of the space in the accommodating cavity 110, more small spaces are isolated in the accommodating cavity 110 through the cooperation of the support column 60 and the support plate 70, so as to be used to place different electrical devices. Moreover, the support column 60 and the support plate 70 are generally made of metal materials, and the body 10 is generally made of metal materials and fixed. The support column 60, the support plate 70 and the body 10 cooperate with each other and can also play a certain electromagnetic shielding role.

[0047] In some specific embodiments, a plurality of mounting holes 610 are provided on the support column 60 along the length direction of the support column 60 , and fixing members (not shown) corresponding to the mounting holes 610 are provided on the support plate 70 .

[0048] In this embodiment, a plurality of mounting holes 610 are provided on the support column 60, so the position of the support plate 70 on the support column 60 can be reasonably adjusted according to the height of the electrical equipment, thereby more efficiently and reasonably utilizing the space in the accommodating cavity 110.

[0049] In some specific embodiments, a sliding member 80 is further provided, and the sliding member 80 is disposed below the body 10 .

[0050] The function of the slide 80 is to facilitate the movement of the semiconductor static test system in the utility model. Generally speaking, a power connection interface is provided on the surface of the body 10 for connecting to the mains. The setting of the slide 80 can facilitate the position of the semiconductor static test system to be changed at any time.

[0051] In some specific embodiments, the main body 10 is provided with a door body 120 , and opening the door body 120 can allow the accommodating cavity 110 to communicate with the outside.

[0052] In this embodiment, the accommodating chamber 110 can be connected to the outside by opening the door 120, so as to facilitate taking out the electrical device. The door 120 is usually provided with heat dissipation holes to facilitate heat dissipation of the electrical device.

[0053] In some specific embodiments, an interface 230 is provided on the fixture module 20, and the control main board 40 includes a cable (not shown in the figure), one end of the cable is provided with a connector (not shown in the figure), and the interface 230 is inserted into the interface to realize the electrical connection between the fixture module 20 and the control main board 40.

[0054] The fixture module 20 needs to be electrically connected to the control mainboard 40, and the adaption of the connector and the interface 230 can quickly achieve electrical connection. For unused fixture modules 20, the internal circuits are pre-connected to the interface 230, and when a different fixture module 20 needs to be replaced, the test work can also be quickly completed.

[0055] Generally speaking, a dust cover 240 is generally provided at the interface 230 to prevent excessive dust from falling on the interface 230 when the fixture module 20 is not used for a long time.

[0056] In some specific embodiments, the fixture module 20 includes a fixing mechanism 210 , and the fixing mechanism 210 is used to fix the product 100 to be tested.

[0057] The fixing mechanism 210 has various styles, and mainly plays a role of fixing the product 100 to be tested, so as to prevent the product 100 to be tested from bouncing up during the test.

[0058] In some specific embodiments, the fixture module 20 is further provided with a guide mechanism (not shown in the figure), and the guide mechanism (not shown in the figure) is used to guide the product to be tested 100 to be electrically connected to the fixture module 20.

[0059] The guide mechanism (not shown) is generally a guide column, and a guide hole or a guide groove is reserved on the product to be tested 100 so that the product to be tested 100 can be stably electrically connected when combined with the fixture module 20 .

[0060] Finally, it should be noted that the display module 30 can also be matched with an input module to facilitate technicians to adjust the test environment.

[0061] Specifically, the input module may be a touch screen directly, or a keyboard connected to the display module 30 , and so on.

[0062] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0063] The above-mentioned embodiments only express several implementation methods of the utility model, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the patent application. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the utility model, which all belong to the protection scope of the utility model. Therefore, the protection scope of the utility model patent shall be based on the attached claims.

Claims

1. A semiconductor static test system, characterized in that: include: A body having a receiving cavity; A fixture module, wherein the fixture module is detachably disposed on the body, the fixture module is used to be electrically connected to the product to be tested when fixing the product to be tested, and the fixture module further comprises a handle to facilitate the disassembly and assembly of the fixture module; A display module, which is arranged on the body and is used to display parameter information of the product to be tested; A control mainboard is disposed in the accommodating cavity and is electrically connected to the fixture module and the display module.

2. The semiconductor static test system according to claim 1, characterized in that: It also includes a cover body, which can cover the fixture module.

3. The semiconductor static test system according to claim 2, characterized in that: The cover body is also provided with an observation area, and the observation area is made of transparent material.

4. The semiconductor static test system according to claim 1, characterized in that: It also includes a plurality of support columns and support plates. The support columns are fixed inside the accommodating cavity, and the support plates are fixed on the support columns and are used to support external electrical equipment.

5. The semiconductor static test system according to claim 4, characterized in that: A plurality of mounting holes are arranged on the support column along the length direction of the support column, and fixing pieces corresponding to the mounting holes are arranged on the support plate.

6. The semiconductor static test system according to claim 1, characterized in that: A sliding member is also provided, and the sliding member is arranged below the main body.

7. The semiconductor static test system according to claim 1, characterized in that: The main body is provided with a door body, and opening the door body enables the accommodating cavity to communicate with the outside.

8. The semiconductor static test system according to claim 1, characterized in that: The fixture module is provided with an interface, the control mainboard includes a cable, one end of the cable is provided with a connector, and the interface is inserted into the interface to achieve electrical connection between the fixture module and the control mainboard.

9. The semiconductor static test system according to claim 1, characterized in that: The fixture module includes a fixing mechanism, and the fixing mechanism is used to fix the product to be tested.

10. The semiconductor static test system according to claim 1, characterized in that: The fixture module is also provided with a guiding mechanism, and the guiding mechanism is used to guide the product to be tested to be electrically connected to the fixture module.

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