Expansion system suitable for flash memory test

Abstract

The utility model relates to the technical field of flash memory testing, in particular to an expansion system suitable for flash memory testing, which comprises a memory connector, a first HUB concentrator, a second HUB concentrator, a first main control group and a second main control group, the memory connector is provided with a plurality of input pins and a plurality of output pins. According to the utility model, the plurality of master control test chips are integrated together, so that a plurality of flash memories to be tested can be tested at one time, and the test efficiency can be effectively improved; in addition, the memory connector is provided with a large number of input pins and output pins, the master control test chip is connected with the to-be-tested flash memories after passing through the memory connector, the test output end of the master control test chip can be fully utilized, and therefore a plurality of to-be-tested flash memories can be tested at a time.

Description

Technical Field

[0001] The utility model relates to the technical field of flash memory testing, and particularly relates to an expansion system suitable for flash memory testing. Background Art

[0002] As a storage device widely used in electronic devices, the quality inspection of flash memory chips is a key link to ensure the performance and reliability of products. During the production process of flash memory chips, it is usually necessary to strictly test each chip to screen out defective products and ensure that the chips leaving the factory meet the design specifications and quality standards.

[0003] Currently, the common method for testing flash memory chips is to individually place each chip into a single test socket for testing, which has the problem of low testing efficiency. Summary of the Utility Model

[0004] The purpose of the utility model is to provide an expansion system suitable for flash memory testing in view of the above deficiencies in the prior art.

[0005] The purpose of the utility model is achieved through the following technical solutions: An expansion system suitable for flash memory testing includes a memory connector, a first HUB hub, a second HUB hub, a first main control group, and a second main control group; the memory connector is provided with a plurality of input pins and a plurality of output pins;

[0006] The first main control group and the second main control group are respectively connected to the first HUB hub and the second HUB hub; the input pins of the memory connector are used to connect to the first main control group and the second main control group; the output pins of the memory connector are used to connect to the flash memory to be tested.

[0007] The utility model is further set as follows: both the first main control group and the second main control group include four main control test chips; the input ends of the four main control test chips in the first main control group are respectively connected to the output end of the first HUB hub; the input ends of the four main control test chips in the second main control group are respectively connected to the output end of the second HUB hub.

[0008] The utility model is further set as follows: the memory connector is provided with thirty-two input pins; each main control test chip is provided with four output ends; the thirty-two input pins of the memory connector are respectively connected to the output ends of the four main control test chips in the first main control group and the output ends of the four main control test chips in the second main control group.

[0009] The utility model is further set as follows: the memory connector is provided with thirty-two output pins; each output pin of the memory connector is connected to a flash memory to be tested;

[0010] The output terminals of the four flash memories to be tested corresponding to each main control test chip are connected together;

[0011] The power supply terminals of the four flash memories to be tested corresponding to each main control test chip are connected together;

[0012] The grounding terminals of the four flash memories to be tested corresponding to each main control test chip are connected together.

[0013] The present utility model is further configured such that the expansion system suitable for flash memory testing further includes a main HUB hub; the input ends of the first HUB hub and the second HUB hub are respectively connected to the output end of the main HUB hub.

[0014] The present utility model is further configured such that the expansion system suitable for flash memory testing further includes a USB connector; the output end of the USB connector is connected to the input end of the main HUB hub.

[0015] The present utility model is further configured such that the model of the memory connector is DDR4.

[0016] The present utility model is further configured such that the expansion system suitable for flash memory testing further includes a PCB board and a PCB test card board; the memory connector is arranged on the front side of the PCB board, and the flash memories to be tested are arranged on the back side of the PCB board; the USB connector, the main HUB hub, the first HUB hub, the second HUB hub, the first main control group, and the second main control group are all arranged on the PCB test card board; the PCB test card board is used to connect to the memory connector.

[0017] The present utility model is further configured such that the expansion system suitable for flash memory testing further includes a power supply module; the power supply module is used to supply power to the USB connector, the main HUB hub, the first HUB hub, the second HUB hub, the first main control group, the second main control group, and the memory connector.

[0018] The present utility model is further configured such that the input pins of the memory connector are respectively connected to the first main control group and the second main control group through copper foil traces.

[0019] The beneficial effects of the present utility model: By integrating multiple main control test chips together, the present utility model can test multiple flash memories to be tested at one time, effectively improving the test efficiency; in addition, the memory connector has a relatively large number of input pins and output pins, and after passing through the memory connector, the main control test chip is connected to the flash memories to be tested, which can make full use of the test output terminals of the main control test chip, so as to be able to test multiple flash memories to be tested at one time. Description of the Drawings

[0020] The utility model will be further described with reference to the accompanying drawings. However, the embodiments shown in the drawings do not constitute any limitation to the utility model. For those of ordinary skill in the art, other drawings can be obtained according to the following drawings without creative efforts.

[0021] Figure 1 is the system schematic diagram of the utility model;

[0022] Figure 2 is the circuit schematic diagram of the main hub of the utility model;

[0023] Figure 3 is the circuit schematic diagram of the main control test chip of the utility model;

[0024] Figure 4 is the circuit schematic diagram of the memory connector part of the utility model;

[0025] Figure 5 is the circuit schematic diagram of another part of the memory connector of the utility model;

[0026] Wherein: 1. Memory connector; 2. Main hub; 21. First HUB hub; 22. Second HUB hub; 3. First main control group; 4. Second main control group; 5. Flash memory to be tested; 6. Main control test chip. Specific embodiments

[0027] The utility model will be further described in conjunction with the following embodiments.

[0028] As Figures 1 to 5 can be seen, an expansion system suitable for flash memory testing described in this embodiment includes a memory connector 1, a first HUB hub 21, a second HUB hub 22, a first main control group 3, and a second main control group 4; the memory connector 1 is provided with a plurality of input pins and a plurality of output pins;

[0029] The first main control group 3 and the second main control group 4 are respectively connected to the first HUB hub 21 and the second HUB hub 22; the input pins of the memory connector 1 are used to connect to the first main control group 3 and the second main control group 4; the output pins of the memory connector 1 are used to connect to the flash memory 5 to be tested.

[0030] Specifically, the expansion system suitable for flash memory testing described in this embodiment can test a plurality of flash memories 5 to be tested at one time by integrating a plurality of main control test chips 6 together, which can effectively improve the test efficiency; in addition, the memory connector 1 has a relatively large number of input pins and output pins. The main control test chip 6 is connected to the flash memory 5 to be tested through the memory connector 1, which can make full use of the test output terminals of the main control test chip 6, so as to test a plurality of flash memories 5 to be tested at one time.

[0031] An expansion system suitable for flash memory testing according to this embodiment. Both the first master control group 3 and the second master control group 4 include four master test chips 6. The input ends of the four master test chips 6 in the first master control group 3 are respectively connected to the output end of the first HUB hub 21. The input ends of the four master test chips 6 in the second master control group 4 are respectively connected to the output end of the second HUB hub 22. An expansion system suitable for flash memory testing according to this embodiment. The memory connector 1 is provided with thirty-two input pins. Each master test chip 6 is provided with four output ends. The thirty-two input pins of the memory connector 1 are respectively connected to the output ends of the four master test chips 6 in the first master control group 3 and the output ends of the four master test chips 6 in the second master control group 4.

[0032] Specifically, for the expansion system suitable for flash memory testing according to this embodiment, through the above settings, the four output ends of each master test chip 6 can be fully utilized, so that thirty-two flash memories 5 to be tested can be tested at one time.

[0033] An expansion system suitable for flash memory testing according to this embodiment. The memory connector 1 is provided with thirty-two output pins. Each output pin of the memory connector 1 is connected to a flash memory 5 to be tested.

[0034] The output ends of the four flash memories 5 corresponding to each master test chip 6 are connected together.

[0035] The power supply ends of the four flash memories 5 corresponding to each master test chip 6 are connected together.

[0036] The grounding ends of the four flash memories 5 corresponding to each master test chip 6 are connected together.

[0037] Specifically, through the above settings in this embodiment, an expansion network for a master test chip 6 to test four flash memories 5 to be tested can be realized.

[0038] An expansion system suitable for flash memory testing according to this embodiment. The expansion system suitable for flash memory testing further includes a main HUB hub. The input ends of the first HUB hub 21 and the input ends of the second HUB hub 22 are respectively connected to the output end of the main HUB hub. Specifically, through the above settings, the ports of the HUB hub can be expanded.

[0039] An expansion system suitable for flash memory testing according to this embodiment. The expansion system suitable for flash memory testing further includes a USB connector. The output end of the USB connector is connected to the input end of the main HUB hub. Specifically, through the above settings, the expansion system suitable for flash memory testing can be connected to external devices through the USB connector.

[0040] An expansion system suitable for flash memory testing described in this embodiment, the model of the memory connector 1 is DDR4.

[0041] The expansion system suitable for flash memory testing described in this embodiment further includes a PCB board and a PCB test card board; the memory connector 1 is arranged on the front side of the PCB board, and the flash memory 5 to be tested is arranged on the back side of the PCB board; the USB connector, the main HUB hub, the first HUB hub 21, the second HUB hub 22, the first main control group 3, and the second main control group 4 are all arranged on the PCB test card board; the PCB test card board is used to connect with the memory connector 1. Specifically, through the above settings, the overall structure is convenient and simple to assemble, and convenient for maintenance and replacement.

[0042] An expansion system suitable for flash memory testing described in this embodiment, the expansion system suitable for flash memory testing further includes a power module; the power module is used to supply power to the USB connector, the main HUB hub, the first HUB hub 21, the second HUB hub 22, the first main control group 3, the second main control group 4, and the memory connector 1. Specifically, through the above settings, it is convenient to supply power.

[0043] An expansion system suitable for flash memory testing described in this embodiment, the input pins of the memory connector 1 are respectively connected to the first main control group 3 and the second main control group 4 through copper foil traces. Specifically, through the above settings, the connection between the first main control group 3, the second main control group 4, and the memory connector 1 is stable and reliable.

[0044] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the protection scope of the present invention. Although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present invention can be modified or equivalently replaced without departing from the essence and scope of the technical solutions of the present invention.

Claims

1. An expansion system suitable for flash memory testing, characterized in that: It comprises a memory connector (1), a first HUB hub (21), a second HUB hub (22), a first main control group (3) and a second main control group (4); the memory connector (1) is provided with a plurality of input pins and a plurality of output pins; The first main control group (3) and the second main control group (4) are connected to a first HUB hub (21) and a second HUB hub (22) respectively; the input pins of the memory connector (1) are used to connect to the first main control group (3) and the second main control group (4); and the output pins of the memory connector (1) are used to connect to a flash memory (5) to be tested.

2. The expansion system suitable for flash memory testing according to claim 1, characterized in that: The first main control group (3) and the second main control group (4) both comprise four main control test chips (6); the input ends of the four main control test chips (6) of the first main control group (3) are respectively connected to the output ends of the first HUB (21); the input ends of the four main control test chips (6) of the second main control group (4) are respectively connected to the output ends of the second HUB (22).

3. The expansion system suitable for flash memory testing according to claim 2, characterized in that: The memory connector (1) is provided with thirty-two input pins; each master control test chip (6) is provided with four output ends; the thirty-two input pins of the memory connector (1) are respectively connected to the output ends of the four master control test chips (6) of the first master control group (3) and the output ends of the four master control test chips (6) of the second master control group (4).

4. The expansion system suitable for flash memory testing according to claim 3, characterized in that: The memory connector (1) is provided with thirty-two output pins; each output pin of the memory connector (1) is connected to a flash memory (5) to be tested; The output ends of the four flash memories (5) to be tested corresponding to each main control test chip (6) are connected together; The power supply ends of the four flash memories (5) to be tested corresponding to each main control test chip (6) are connected together; The grounding terminals of four to-be-tested flash memories (5) corresponding to each master control test chip (6) are connected together.

5. The expansion system suitable for flash memory testing according to claim 1, characterized in that: The expansion system suitable for flash memory testing also includes a main HUB hub; the input end of the first HUB hub (21) and the input end of the second HUB hub (22) are respectively connected to the output end of the main HUB hub.

6. The expansion system suitable for flash memory testing according to claim 1, characterized in that: The expansion system suitable for flash memory testing also includes a USB connector; the output end of the USB connector is connected to the input end of the main HUB hub.

7. The expansion system suitable for flash memory testing according to claim 1, characterized in that: The model of the memory connector (1) is DDR4.

8. The expansion system suitable for flash memory testing according to claim 6, characterized in that: The expansion system suitable for flash memory testing also comprises a PCB board and a PCB test card board; the memory connector (1) is arranged on the front side of the PCB board, and the flash memory to be tested (5) is arranged on the back side of the PCB board; the USB connector, the main HUB hub, the first HUB hub (21), the second HUB hub (22), the first main control group (3) and the second main control group (4) are all arranged on the PCB test card board; the PCB test card board is used to connect with the memory connector (1).

9. The expansion system suitable for flash memory testing according to claim 6, characterized in that: The expansion system suitable for flash memory testing also includes a power module; the power module is used to supply power to the USB connector, the main HUB hub, the first HUB hub (21), the second HUB hub (22), the first main control group (3), the second main control group (4) and the memory connector (1).

10. The expansion system suitable for flash memory testing according to claim 1, characterized in that: The input pins of the memory connector (1) are respectively connected to the first main control group (3) and the second main control group (4) through copper foil wiring.

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