Foreign matter cleaning device for testing probe

By designing a test stylus foreign body cleaning device including a cleaning brush and a foreign body collection box, the problem of foreign matter cannot be efficiently cleaned in the probe surface in the prior art, and efficient cleaning of the probe and unified collection of foreign matters are achieved.

CN222956991UActive Publication Date: 2025-06-10SHANDONG QIXIN MEMS
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
CN202421917100.6
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-08-08
Publication Date
2025-06-10
Estimated Expiration
2034-08-08

AI Technical Summary

Technical Problem

Existing foreign body cleaning devices of stylus are unable to efficiently clean the sticky foreign matter on the surface of the probe, resulting in the inability to use the probe normally.

Method used

A test stylus foreign body cleaning device is designed, including a base plate, a placement plate, a hollow plate, a groove, a limiting column, a connecting plate, a pull ring, a special-shaped plate, annular plate, a hollow column, a sliding rod and a cleaning brush. By pulling the pull ring, the connecting plate and a special-shaped plate are driven to shift, the cleaning brush cleans the surface of the probe, and the foreign matter is collected uniformly through the foreign matter collection box.

Benefits of technology

It realizes efficient cleaning of the surface of the probe, is simple and convenient to operate, can effectively remove foreign objects, and ensures the normal use of the probe.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN222956991U_ABST
    Figure CN222956991U_ABST
Patent Text Reader

Abstract

The utility model relates to the technical field of test probes, and discloses a test probe foreign matter cleaning device which comprises a bottom plate, the top end of the bottom plate is fixedly connected with a placing plate, a probe body is installed in the placing plate, the top end of the bottom plate is fixedly connected with a hollow plate, the surface of the hollow plate is provided with a through groove, and the hollow plate is provided with a through hole. A limiting column is fixedly connected to an inner cavity of the through groove, a connecting plate is slidably connected to the surface of the limiting column, a first pull ring is fixedly connected to one end of the connecting plate, and a special-shaped plate is fixedly connected to the other end of the connecting plate. A worker pulls a first pull ring, so that the first pull ring drives a connecting plate to displace and drives a special-shaped plate and an annular plate to displace at the same time, and the worker repeatedly pulls the first pull ring up and down, so that a cleaning brush cleans the surface of a probe body; and the probe body can be efficiently cleaned by a worker, and the operation is simple and convenient.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] The utility model relates to the technical field of test probes, in particular to a foreign object cleaning device for test probes. Background Art

[0002] A test probe, also known as a probe, is a precision measurement tool mainly used in the fields of electronic testing and industrial measurement. In electronic testing, test probes are used to connect electronic components, such as circuit boards and integrated circuits, for current and signal transmission testing. The design and manufacture of test probes require extremely high precision and durability to ensure the accuracy and repeatability of testing.

[0003] Regarding the existing related technologies, the inventor believes that there are often the following defects: Since foreign objects may adhere to the surface of the probe after use, the probe may not be able to be used normally, and the existing foreign object cleaning device for test probes may not be able to efficiently clean the foreign objects adhered to the surface of the probe. In view of the above existing defects, the foreign object cleaning device for test probes is improved to facilitate the efficient cleaning of the probe body and is simple and convenient to operate. Summary of the Utility Model

[0004] The technical problem to be solved by the utility model is that there is a disadvantage in the existing technology that it may not be possible to clean the foreign objects adhered to the surface of the probe. For this reason, we propose a foreign object cleaning device for test probes.

[0005] To achieve the above object, the present application adopts the following technical solution: A foreign object cleaning device for test probes, including a bottom plate, a placement plate is fixedly connected to the top end of the bottom plate, a probe body is installed inside the placement plate, a hollow plate is fixedly connected to the top end of the bottom plate, a through groove is formed on the surface of the hollow plate, a limiting column is fixedly connected to the inner cavity of the through groove, a connecting plate is slidably connected to the surface of the limiting column, a first pull ring is fixedly connected to one end of the connecting plate, a special-shaped plate is fixedly connected to the other end of the connecting plate, an annular plate is fixedly connected to the surface of the special-shaped plate, a hollow column is fixedly connected to the surface of the special-shaped plate, a sliding rod is slidably connected to the inner cavity of the hollow column, and a cleaning brush is fixedly connected to one end of the sliding rod.

[0006] Preferably, a first sliding groove is formed inside the hollow plate, a first sliding block is slidably connected to the inner cavity of the first sliding groove, and one end of the first sliding block close to the connecting plate is fixedly connected to the connecting plate.

[0007] Preferably, a first spring is fixedly connected to the inner cavity of the hollow plate, and the top end of the first spring is fixedly connected to the connecting plate.

[0008] Preferably, a second slide groove is provided inside the hollow column, a second slide groove is slidably connected to an inner cavity of the second slide groove, and one end of the second slide groove close to the slide rod is fixedly connected to the slide rod.

[0009] Preferably, a second spring is fixedly connected to the inner cavity of the hollow column, and one end of the second spring close to the sliding rod is fixedly connected to the sliding rod.

[0010] Preferably, an open groove is provided at the top of the bottom plate, a foreign matter collection box is slidably connected to the inner cavity of the bottom plate, and a second pull ring is fixedly connected to the surface of the foreign matter collection box.

[0011] Preferably, an arc-shaped groove is provided inside the bottom plate, an arc-shaped block is slidably connected to the inner cavity of the arc-shaped groove, and one end of the arc-shaped block close to the foreign matter collection box is fixedly connected to the foreign matter collection box.

[0012] Technical effects and advantages of the utility model:

[0013] In the utility model, a worker pulls the first pull ring, so that the first pull ring drives the connecting plate to move, and drives the special-shaped plate and the annular plate to move at the same time. As the worker repeatedly pulls the first pull ring up and down, the cleaning brush cleans the surface of the probe body. Through the arrangement of the above structure, the worker can easily clean the probe body efficiently, and the operation is simple and convenient.

[0014] In the utility model, after the staff cleans the probe body, the foreign matter falls due to gravity and enters the inner cavity of the foreign matter collection box along the opening groove. At this time, the staff pulls the second pull ring outward to drive the surface of the foreign matter collection box to separate from the inner cavity of the bottom plate. Through the arrangement of the above structure, it is convenient for the staff to uniformly collect and process the foreign matter. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a schematic diagram of the main structure of the utility model;

[0016] Figure 2 This is a cross-sectional view of the internal structure of the utility model;

[0017] Figure 3 For this utility model Figure 2 A partial enlarged view of the middle part;

[0018] Figure 4 It is a top view of the structure of the utility model;

[0019] Figure 5 For this utility model Figure 4 A partial enlarged view of point B in the middle;

[0020] Figure 6 For this utility model Figure 4Partial enlarged view at position C in the figure.

[0021] Legend: 1. Bottom plate; 2. Placing plate; 3. Probe body; 4. Hollow plate; 5. Through groove; 6. Limit post; 7. Connecting plate; 8. First pull ring; 9. Special-shaped plate; 10. Ring plate; 11. Hollow column; 12. Slide bar; 13. Cleaning brush; 14. First chute; 15. First slider; 16. First spring; 17. Second chute; 18. Second slider; 19. Second spring; 20. Opening groove; 21. Foreign object collection box; 22. Second pull ring; 23. Arc groove; 24. Arc block. Specific implementation mode

[0022] Now, in combination with the attached drawings and preferred embodiments, the present utility model will be further described in detail. These drawings are all simplified schematic diagrams, only illustrating the basic structure of the present utility model in a schematic manner, so they only show the components related to the present utility model.

[0023] Refer to Figure 1 - Figure 5 As shown, the present utility model provides a technical solution: a foreign object cleaning device for a test probe, including a bottom plate 1. A placing plate 2 is fixedly connected to the top end of the bottom plate 1. A probe body 3 is installed inside the placing plate 2. A hollow plate 4 is fixedly connected to the top end of the bottom plate 1. A through groove 5 is formed on the surface of the hollow plate 4. A limit post 6 is fixedly connected to the inner cavity of the through groove 5. A connecting plate 7 is slidably connected to the surface of the limit post 6. A first pull ring 8 is fixedly connected to one end of the connecting plate 7. A special-shaped plate 9 is fixedly connected to the other end of the connecting plate 7. A ring plate 10 is fixedly connected to the surface of the special-shaped plate 9. A hollow column 11 is fixedly connected to the surface of the special-shaped plate 9. A slide bar 12 is slidably connected to the inner cavity of the hollow column 11. A cleaning brush 13 is fixedly connected to one end of the slide bar 12. When the staff needs to clean the probe body 3, the staff pulls the first pull ring 8, so that the first pull ring 8 drives the connecting plate 7 to displace, and the inner cavity of the connecting plate 7 slides on the surface of the limit post 6. The connecting plate 7 drives the surface of the first slider 15 to slide in the inner cavity of the first chute 14. At the same time, the connecting plate 7 compresses the first spring 16 to store energy. As the connecting plate 7 displaces, the connecting plate 7 drives the special-shaped plate 9 and the ring plate 10 to displace. As the staff repeatedly pulls the first pull ring 8 up and down, the special-shaped plate 9 drives the hollow column 11 and the slide bar 12 to displace, and the slide bar 12 drives the cleaning brush 13 to clean the surface of the probe body 3. Through the setting of the above structure, it is convenient for the staff to clean the probe body 3 efficiently, and the operation is simple and convenient.

[0024] Refer to Figure 3As shown in the figure, in this implementation: a first sliding groove 14 is provided inside the hollow plate 4, and a first sliding block 15 is slidably connected to the inner cavity of the first sliding groove 14. One end of the first sliding block 15 close to the connecting plate 7 is fixedly connected to the connecting plate 7. The staff pulls the first pull ring 8 to drive the connecting plate 7 to displace, so that the connecting plate 7 drives the surface of the first sliding block 15 to slide in the inner cavity of the first sliding groove 14. Through the setting of the above structure, the connecting plate 7 maintains a directional displacement when displacing, further improving the stability of the structure.

[0025] Referring to Figure 3 As shown in the figure, in this implementation: a first spring 16 is fixedly connected to the inner cavity of the hollow plate 4, and the top end of the first spring 16 is fixedly connected to the connecting plate 7. The staff pulls the first pull ring 8 to drive the connecting plate 7 to displace, and at the same time, the connecting plate 7 compresses the first spring 16 to store energy. Through the setting of the first spring 16, the rebounding force of the first spring 16 continuously pushes the connecting plate 7 to reset, facilitating the next operation of the staff.

[0026] Referring to Figure 5 As shown in the figure, in this implementation: a second sliding groove 17 is provided inside the hollow column 11, and a second sliding block 18 is slidably connected to the inner cavity of the second sliding groove 17. One end of the second sliding block 18 close to the sliding rod 12 is fixedly connected to the sliding rod 12. Through the rebounding force of the second spring 19, the sliding rod 12 is continuously pushed to displace outward, so that the sliding rod 12 drives the surface of the second sliding block 18 to slide in the inner cavity of the second sliding groove 17. Through the setting of the above structure, the cleaning brush 13 maintains a directional displacement when displacing, preventing the sliding rod 12 from shaking and affecting the cleaning of the probe body 3 by the cleaning brush 13.

[0027] Referring to Figure 5 As shown in the figure, in this implementation: a second spring 19 is fixedly connected to the inner cavity of the hollow column 11, and one end of the second spring 19 close to the sliding rod 12 is fixedly connected to the sliding rod 12. Through the setting of the second spring 19, the rebounding force of the second spring 19 continuously pushes the sliding rod 12 to displace outward, so that the sliding rod 12 drives the cleaning brush 13 to displace outward, making the surface of the cleaning brush 13 more closely attached to the surface of the probe body 3, thereby improving the cleaning effect.

[0028] Referring to Figure 1 、 Figure 2 、 Figure 4 and Figure 6As shown, in this embodiment: an open groove 20 is provided at the top of the base plate 1, and a foreign matter collection box 21 is slidably connected to the inner cavity of the base plate 1, and a second pull ring 22 is fixedly connected to the surface of the foreign matter collection box 21. When the staff needs to collect and process the foreign matter in a unified manner, after the staff cleans the probe body 3, the foreign matter falls under the influence of gravity and enters the inner cavity of the foreign matter collection box 21 with the open groove 20. At this time, the staff pulls the second pull ring 22 outward to drive the surface of the foreign matter collection box 21 to separate from the inner cavity of the base plate 1. With the displacement of the foreign matter collection box 21, the foreign matter collection box 21 drives the surface of the arc block 24 to slide in the inner cavity of the arc groove 23. Through the arrangement of the above-mentioned structure, it is convenient for the staff to collect and process the foreign matter in a unified manner.

[0029] Reference Figure 6 As shown, in this embodiment: an arc groove 23 is opened inside the base plate 1, and the inner cavity of the arc groove 23 is slidably connected with an arc block 24, and the end of the arc block 24 close to the foreign object collection box 21 is fixedly connected to the foreign object collection box 21. The staff pulls the second pull ring 22 to drive the surface of the foreign object collection box 21 to gradually separate from the inner cavity of the base plate 1. As the foreign object collection box 21 moves, the foreign object collection box 21 drives the surface of the arc block 24 to slide in the inner cavity of the arc groove 23. Through the arrangement of the above-mentioned structure, the foreign object collection box 21 maintains directional displacement during the movement.

[0030] Working principle: when the staff needs to clean the probe body 3, the staff pulls the first pull ring 8, so that the first pull ring 8 drives the connecting plate 7 to move, so that the inner cavity of the connecting plate 7 slides on the surface of the limiting column 6, and the connecting plate 7 drives the surface of the first sliding block 15 to slide in the inner cavity of the first sliding groove 14. At the same time, the connecting plate 7 squeezes the first spring 16 to store force. With the displacement of the connecting plate 7, the connecting plate 7 drives the special-shaped plate 9 and the annular plate 10 to move. As the staff repeatedly pulls the first pull ring 8 up and down, the special-shaped plate 9 drives the hollow column 11 and the sliding rod 12 to move, and the sliding rod 12 drives the cleaning brush 13 to clean the surface of the probe body 3. Clean, through the setting of the above-mentioned structure, it is convenient for the staff to clean the probe body 3 efficiently, and the operation is simple and convenient. When the staff needs to collect and process foreign objects in a unified manner, after the staff cleans the probe body 3, the foreign objects fall under the influence of gravity and enter the inner cavity of the foreign object collection box 21 along the opening groove 20. At this time, the staff pulls the second pull ring 22 outward to drive the surface of the foreign object collection box 21 to separate from the inner cavity of the base plate 1. With the displacement of the foreign object collection box 21, the foreign object collection box 21 drives the surface of the arc block 24 to slide in the inner cavity of the arc groove 23. Through the setting of the above-mentioned structure, it is convenient for the staff to collect and process foreign objects in a unified manner.

[0031] Finally, it should be noted that the above are only the preferred embodiments of the present invention and are not used to limit the present invention. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

Claims

1. A test probe foreign body cleaning device, comprising a base plate (1), characterized in that: The top of the base plate (1) is fixedly connected to a placement plate (2), a probe body (3) is installed inside the placement plate (2), the top of the base plate (1) is fixedly connected to a hollow plate (4), a through groove (5) is provided on the surface of the hollow plate (4), the inner cavity of the through groove (5) is fixedly connected to a limiting column (6), the surface of the limiting column (6) is slidably connected to a connecting plate (7), one end of the connecting plate (7) is fixedly connected to a first pull ring (8), the other end of the connecting plate (7) is fixedly connected to a special-shaped plate (9), the surface of the special-shaped plate (9) is fixedly connected to a ring plate (10), the surface of the special-shaped plate (9) is fixedly connected to a hollow column (11), the inner cavity of the hollow column (11) is slidably connected to a sliding rod (12), and one end of the sliding rod (12) is fixedly connected to a cleaning brush (13).

2. The test probe foreign matter cleaning device according to claim 1, characterized in that: A first slide groove (14) is provided inside the hollow plate (4), and a first slider (15) is slidably connected to the inner cavity of the first slide groove (14), and one end of the first slider (15) close to the connecting plate (7) is fixedly connected to the connecting plate (7).

3. The test probe foreign matter cleaning device according to claim 1, characterized in that: A first spring (16) is fixedly connected to the inner cavity of the hollow plate (4), and the top end of the first spring (16) is fixedly connected to the connecting plate (7).

4. The test probe foreign matter cleaning device according to claim 1, characterized in that: A second slide groove (17) is provided inside the hollow column (11), and a second slider (18) is slidably connected to the inner cavity of the second slide groove (17), and one end of the second slider (18) close to the slider (12) is fixedly connected to the slider (12).

5. The test probe foreign matter cleaning device according to claim 1, characterized in that: A second spring (19) is fixedly connected to the inner cavity of the hollow column (11), and one end of the second spring (19) close to the slide rod (12) is fixedly connected to the slide rod (12).

6. The test probe foreign matter cleaning device according to claim 1, characterized in that: An open groove (20) is provided at the top of the bottom plate (1), a foreign matter collection box (21) is slidably connected to the inner cavity of the bottom plate (1), and a second pull ring (22) is fixedly connected to the surface of the foreign matter collection box (21).

7. The test probe foreign matter cleaning device according to claim 1, characterized in that: An arc-shaped groove (23) is provided inside the bottom plate (1), and an arc-shaped block (24) is slidably connected to the inner cavity of the arc-shaped groove (23), and one end of the arc-shaped block (24) close to the foreign matter collection box (21) is fixedly connected to the foreign matter collection box (21).