Electrode structure of back contact battery, back contact battery and back contact battery assembly

Abstract

The utility model is applicable to the field of photovoltaic technology, and provides an electrode structure of a back contact battery, the back contact battery and a back contact battery assembly, the electrode structure comprises a first conductive base point and a second conductive base point, in the second direction, the first conductive base point is in electric contact with one of a plurality of first fine grids, and the second conductive base point is in electric contact with the other of the plurality of second fine grids. The first conductive base point is in electric contact with two adjacent first fine grids, the second conductive base point is in electric contact with two adjacent second fine grids, and the first conductive base point and the second conductive base point are arranged, so that the area of the first conductive base point and the area of the second conductive base point are larger than that of a single first fine grid and that of a single second fine grid; when hot spot tests, EL tests and the like are carried out on the main-grid-free back contact solar cell, stable contact can be formed between the positive probe and the negative probe of test equipment and the first conductive contact structure and the second conductive contact structure, the test difficulty is reduced, and the test reliability and stability are improved.

Description

Technical Field

[0001] The present application belongs to the field of photovoltaic technology, and in particular relates to an electrode structure of a back-contact cell, a back-contact cell and a back-contact cell assembly. Background Art

[0002] In back-contact solar cells, in order to reduce the use of slurry, the back-contact solar cell adopts a busbar-less design. However, on the one hand, in such a technical solution, due to the busbar-less design on the back side, the difficulty of performing hot spot, EL and other performance tests on the back-contact solar cell is greatly increased. The back-contact solar cell cannot be in stable contact with the test probe, making the test more difficult and the reliability and stability poor.

[0003] In the related art, performance testing is performed by setting pad points on the fine grid. However, the contact area of ​​the pad point is large, which can easily cause changes in the tension of the fine grid connected to the pad point, resulting in misalignment and deformation of the fine grid. In addition, the larger pad point contact area will cause stress concentration points on the battery surface, posing the risk of cracks and fractures caused by stress concentration. Utility Model Content

[0004] The present application provides an electrode structure for a back-contact battery, aiming to solve the problem that the contact area of ​​a pad point is large, which easily causes changes in the tension of a fine grid connected to the pad point, resulting in misalignment and deformation of the fine grid and stress concentration points on the surface of the battery, with the risk of cracks and breakage caused by stress concentration.

[0005] The present application is implemented as follows: an electrode structure of a back-contact battery includes a plurality of first fine grids and a plurality of second fine grids, wherein the plurality of first fine grids and the plurality of second fine grids extend along a first direction and are alternately distributed along a second direction, the first direction intersects with the second direction, and the first fine grids and the second fine grids have different gate properties; a first conductive base point and a second conductive base point, wherein along the second direction, the first conductive base point is electrically in contact with one of the plurality of first fine grids, and the second conductive base point is electrically in contact with two adjacent ones of the plurality of second fine grids; or, the first conductive base point is electrically in contact with two adjacent ones of the plurality of first fine grids, and the second conductive base point is electrically in contact with one of the plurality of second fine grids, and the center line of the first conductive base point and the center line of the second conductive base point are collinearly arranged in the first direction.

[0006] Optionally, it further includes a first conductive lead wire, one end of which is connected to the first conductive base point, the other end of which extends along the second direction, and the first conductive lead wire is in electrical contact with a plurality of the first fine grids.

[0007] Optionally, it further includes a second conductive lead-out line, one end of which is connected to the second conductive base point, the other end of which extends along the second direction, and the second conductive lead-out line is in electrical contact with a plurality of the second fine grids.

[0008] Optionally, the number of the first fine grids connected to the first conductive lead-out line is different from the number of the second fine grids connected to the second conductive lead-out line.

[0009] Optionally, the width of the first conductive lead-out line is greater than the width of the first fine grid, and the width of the second conductive lead-out line is greater than the width of the second fine grid.

[0010] Optionally, the first conductive base point and the second conductive base point are arranged on the same plane, the projection area of ​​the first conductive base point on the plane is a first area, the projection area of ​​the second conductive base point on the plane is a second area, and the first area and the second area are equal.

[0011] Optionally, the first area or the second area is in the range of 5-60 mm 2 .

[0012] Optionally, a plurality of first fine grids are arranged at equal intervals along the second direction at a first preset distance, and a plurality of second fine grids are arranged at equal intervals along the second direction at a second preset distance.

[0013] Optionally, the first preset distance ranges from 60 to 80 um.

[0014] The present application sets a first conductive base point and a second conductive base point, and the first conductive base point and the second conductive base point have a larger area than a single first fine grid and a second fine grid. When performing hot spot, EL and other tests on a solar cell without a main grid back contact, the positive and negative electrode probes of the test equipment can form a stable contact with the first conductive contact structure and the second conductive contact structure, thereby reducing the difficulty of the test and improving the reliability and stability of the test. In addition, by optimizing the number of fine grids connected to the conductive base points and reducing the pulling force on the fine grids, the amount of precious metals such as silver paste can be reduced while maintaining effective electrical performance testing of the battery cell, thereby reducing production costs. The conductive base points connected to fewer fine grids can also reduce stress concentration points on the battery surface, reducing the risks of cracks and fractures caused by stress concentration, thereby improving the reliability and service life of the battery. At the same time, when welding the welding strip in the subsequent process, the first conductive base point and the second conductive base point can serve as points for welding with the welding strip. When welding, there is no need to set welding points or welding layers on all the fine grids, which can reduce the use of welding slurry.

[0015] A back contact battery comprises the electrode structure of the back contact battery mentioned above.

[0016] A back-contact battery assembly comprises the above-mentioned back-contact battery. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a schematic diagram of the electrode structure of the back contact battery provided in the present application. Figure 1 ;

[0018] Figure 2 This is a schematic diagram of the electrode structure of the back contact battery provided in the present application. Figure 2 ;

[0019] Figure 3 The schematic diagram of the electrode structure of the back contact battery provided in the present application is Figure 1 ;

[0020] Figure 4 The schematic diagram of the electrode structure of the back contact battery provided in the present application is Figure 2 .

[0021] Description of reference numerals:

[0022] 100. Electrode structure of a back contact battery; 10. First fine grid; 20. Second fine grid; 30. First conductive base point; 40. Second conductive base point; 50. First conductive lead wire; 60. Second conductive lead wire. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solutions and advantages of the present application clearer, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements with the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and should not be construed as limiting the present application. In addition, it should be understood that the specific embodiments described herein are only used to explain the present application and are not intended to limit the present application.

[0024] In the description of the present application, it should be understood that the terms "length", "width", "up", "down", "left", "right", "horizontal", "top", "bottom", etc., indicating the orientation or position relationship are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0025] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0026] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection, an electrical connection, or mutual communication; it can be a direct connection, or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0027] In the present application, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0028] The disclosure below provides many different embodiments or examples to realize the different structures of the present application. In order to simplify the disclosure of the present application, the parts and settings of specific examples are described below. Of course, they are only examples, and the purpose is not to limit the present application. In addition, the present application can repeat reference numbers and / or reference letters in different examples, and this repetition is for the purpose of simplification and clarity, which itself does not indicate the relationship between the various embodiments and / or settings discussed. In addition, the various specific processes and material examples provided by the present application, but those of ordinary skill in the art can appreciate the application of other processes and / or the use of other materials.

[0029] like Figure 1 and Figure 2 As shown, an electrode structure 100 of a back-contact battery includes a plurality of first fine grids 10 , a plurality of second fine grids 20 , a first conductive base point 30 , a second conductive base point 40 , a first conductive lead-out line 50 , and a second conductive lead-out line 60 .

[0030] In the embodiments of the present application, a plurality of first fine grids 10 and a plurality of second fine grids 20 extend along a first direction and are alternately arranged at intervals along a second direction. The first direction intersects the second direction, and the first fine grid 10 and the second fine grid 20 have different polarities.

[0031] In the second direction, a first conductive base point 30 is in electrical contact with one of the plurality of first fine grids 10, and a second conductive base point 40 is in electrical contact with two adjacent ones of the plurality of second fine grids 20; alternatively, the first conductive base point 30 is in electrical contact with two adjacent ones of the plurality of first fine grids 10, and the second conductive base point 40 is in electrical contact with one of the plurality of second fine grids 20. The center lines of the first conductive base point 30 and the second conductive base point 40 are collinearly arranged in the first direction.

[0032] In the present application, by providing the first conductive base point 30 and the second conductive base point 40, the areas of the first conductive base point 30 and the second conductive base point 40 are larger than those of a single first fine grid 10 and a single second fine grid 20. When performing tests such as hot spot and EL on a back-contact solar cell without a main grid, the positive and negative probes of the test equipment can form a stable contact between the first conductive contact structure and the second conductive contact structure, reducing the test difficulty and improving the test reliability and stability. And by optimizing the number of fine grids connected to the conductive base points, the tension on the fine grids can be reduced. While maintaining an effective electrical performance detection of the cell, the usage of precious metals such as silver paste can be reduced, thereby reducing the production cost. Connecting fewer fine grids to the conductive base points can also reduce the stress concentration points on the cell surface and reduce the risks of cracks, fractures, etc. caused by stress concentration, thereby improving the reliability and service life of the cell. At the same time, when subsequently welding the bus bar, the first conductive base point 30 and the second conductive base point 40 can serve as the points for welding with the bus bar, and there is no need to set solder joints or welding layers on all the fine grids during welding, which can reduce the usage of welding paste.

[0033] Particularly, the center lines of the first conductive base point 30 and the second conductive base point 40 are collinearly arranged in the first direction, which can ensure that the first conductive base point 30 and the second conductive base point 40 are collinearly arranged. When using the test equipment, the probe can simultaneously contact the first conductive base point 30 and the second conductive base point 40, facilitating the contact detection by the probe.

[0034] In some embodiments, a plurality of first fine grids 10 and a plurality of second fine grids 20 are arranged on the surface of the cell. The plurality of first fine grids 10 and the plurality of second fine grids 20 both extend along the first direction, and the plurality of first fine grids 10 and the plurality of second fine grids 20 are arranged at intervals along the second direction. That is to say, a second fine grid 20 line is arranged on each side of each first fine grid 10 line. The plurality of first fine grid lines 10 and the plurality of second fine grids 20 are used to collect the current generated by the cell.

[0035] In the embodiments of the present application, the second direction intersects the first direction. Specifically, the second direction may be perpendicular to the first direction. Exemplarily, the first direction may be the length direction of the cell, and the second direction may be the width direction of the cell.

[0036] In some embodiments, the first fine grid 10 and the second fine grid 20 may be formed by screen printing, printing a metal paste onto the surface of the cell to form fine grid lines on the surface of the cell. Among them, the metal paste may be silver paste, aluminum paste, etc. Here, there is no limitation on the specific material of the metal paste. In actual use, those skilled in the art can select a suitable material according to requirements.

[0037] Preferably, along the first direction, the length of the first fine grid 10 lines is adapted to the length of the cell. It can also be understood that along the first direction, the length of the first fine grid 10 lines is equal to the length of the cell.

[0038] Preferably, along the first direction, the length of the second fine grid 20 lines is adapted to the length of the cell. It can also be understood that along the first direction, the length of the second fine grid 20 lines is equal to the length of the cell.

[0039] In some embodiments, the first conductive base points 30 and the second conductive base points 40 may be sprayed with silver paste; generally including the following steps: cleaning the surface of the back of the cell to ensure it is clean and dust-free; coating a layer of silver paste at the positions of the first conductive base points 30 and the second conductive base points 40; uniformly adsorbing the silver paste on the surface of the back of the cell by methods such as vacuum evaporation plating; fixing the cell in a battery panel or a battery module to complete the entire process. Through this process, the conductivity of the cell and the ability to prevent short circuits can be improved, thereby improving the safety and service life of the battery.

[0040] In the embodiments of the present application, the number of the first conductive base points 30 and the second conductive base points 40 may be an even number such as 2, 4, 6, 8, etc. The first conductive base points 30 and the second conductive base points 40 cooperate with the positive and negative probes of the detection device to make contact conduction and apply a reverse voltage, thereby detecting various electrical properties of the cell.

[0041] Further, as Figure 3 and Figure 4 shown, multiple first conductive base points 30 and multiple second conductive base points 40 may be arranged in a common line or in two common lines. Exemplarily, the number of the first conductive base points 30 and the second conductive base points 40 is four. Two first conductive base points 30 and second conductive base points 40 are arranged in a common line, and the other two first conductive base points 30 and second conductive base points 40 are arranged in another common line. The two common lines are parallel to each other on the surface of the cell. In this way, the probes contacting the conductive base points on different common lines can measure the electrical conditions of different regions of the cell.

[0042] Understandably, while the first conductive base point 30 is in electrical contact with the first fine grid 10, the first conductive base point 30 is insulated from the second fine grid 20. While the second conductive base point 40 is in electrical contact with the second fine grid 20, the second conductive base point 40 is insulated from the first fine grid 10. Specifically, the form of the insulation between the first conductive base point 30 and the second fine grid 20 can be that the second fine grid 20 forms a disconnection structure at the first conductive base point 30, and the second fine grid 20 is physically isolated from and does not contact the first conductive base point 30, or an insulating adhesive is provided between the first conductive base point 30 and the second fine grid 20. The form of the insulation between the second conductive base point 40 and the first fine grid 10 can be that the first fine grid 10 forms a disconnection structure at the second conductive base point 40, and the first fine grid 10 is physically isolated from and does not contact the second conductive base point 40, or an insulating adhesive is provided between the second conductive base point 40 and the first fine grid 10.

[0043] In the embodiment of the present application, along the second direction, the first conductive base point 30 is in electrical contact with one of the plurality of first fine grids 10, and the second conductive base point 40 is in electrical contact with two adjacent ones of the plurality of second fine grids 20; or, the first conductive base point 30 is in electrical contact with two adjacent ones of the plurality of first fine grids 10, and the second conductive base point 40 is in electrical contact with one of the plurality of second fine grids 20. Since the conductive base point only needs to be in contact with one or two fine grids, it can be seen that a smaller contact area can be set for the conductive base point, that is, the first conductive base point 30 and the second conductive base point 40 have a smaller projected area on the battery chip. Through such a structural design, the pulling force on more fine grids is avoided. While maintaining an effective electrical performance detection of the battery chip, the usage amount of precious metals such as silver paste is reduced, thereby reducing the production cost. The setting of the smaller conductive base point can also reduce the stress concentration points of the conductive base point on the battery surface and reduce the risks such as cracks and fractures caused by stress concentration.

[0044] Preferably, the first conductive base point 30 and the second conductive base point 40 are arranged on the same plane. The projected area of the first conductive base point 30 on the plane is the first area, and the projected area of the second conductive base point 40 on the plane is the second area. The first area and the second area are equal. The same plane can be the surface of the battery chip. The first conductive base point 30 and the second conductive base point 40 have the same projected area on the same plane, that is, the first conductive base point 30 and the second conductive base point 40 have the same contact area. On the one hand, the stability of the probe contact can be ensured, and on the other hand, it is convenient to set multiple conductive base points synchronously at one time, optimizing the process flow of setting the conductive base points.

[0045] Further, the projections of the first conductive base point 30 and the second conductive base point 40 on the same plane can be at least one of a square structure, a rectangular structure, and an elliptical structure. In the embodiments of the present application, there are no excessive restrictions on the specific structure of the conductive base points. In actual use, those skilled in the art can set it according to needs.

[0046] The range of the first area or the second area is 5 - 60 mm 2 . Specifically, in such an embodiment, the first area or the second area can be 5 mm 2 , 6 mm 2 , 7 mm 2 , 8 mm 2 , 8.2 mm 2 , 10 mm 2 , 15 mm 2 , 20 mm 2 , 60 mm 2 or any value between 5 - 60 mm 2 , and specific values are not limited here.

[0047] In some embodiments, along the direction perpendicular to the plane where the cell 10 is located, the heights of both the first conductive base point 30 and the second conductive base point 40 are greater than the thickness of the fine grid, so that the conductive base points protrude from the surface of the cell, facilitating the contact of the probe.

[0048] In some embodiments, one end of the first conductive lead 50 is connected to the first conductive base point 30, the other end of the first conductive lead 50 extends along the second direction, and the first conductive lead 50 is in electrical contact with a plurality of first fine grids 10.

[0049] One end of the second conductive lead 60 is connected to the second conductive base point 40, the other end of the second conductive lead 60 extends along the second direction, and the second conductive lead 60 is in electrical contact with a plurality of second fine grids 20.

[0050] Accordingly, during the extension of the first conductive lead 50 in the second direction, the first conductive lead 50 is insulated from a plurality of second fine grids 20. During the extension of the second conductive lead 60 in the second direction, the second conductive lead 60 is insulated from a plurality of first fine grids 10. The form of the insulation between the first conductive lead 50 and the second fine grids 20 and the insulation between the second conductive lead 60 and the first fine grids 10 is the same as that described above, and will not be elaborated here. In the embodiment of the present application, by providing the first conductive lead 50 and the second conductive lead 60, when the probe contacts the conductive base point, it can conduct with more fine grids, thereby expanding the detection area range of the battery cell. Specifically, the number of first fine grids 10 connected by the first conductive lead 50 and the number of second fine grids 20 connected by the second conductive lead 60 can be flexibly set according to actual detection needs, and the present application does not limit this.

[0051] In the embodiment of the present application, the number of the first conductive leads 50 is two. The two first conductive leads 50 are arranged at opposite ends of the first conductive base point 30 in the second direction. The two first conductive leads 50 extend along the second direction respectively and are in electrical contact with the first fine grids 10. Accordingly, the number of the second conductive leads 60 is two. The two second conductive leads 60 are arranged at opposite ends of the second conductive base point 40 in the second direction. The two second conductive leads 60 extend along the second direction respectively and are in electrical contact with the second fine grids 20, further expanding the detection area range when the probe contacts the conductive base point.

[0052] Of course, in other embodiments, the number of the first conductive leads 50 and the second conductive leads 60 can also be three, four, etc. The number of the first conductive leads 50 and the second conductive leads 60 is set according to needs, and the present application does not limit this.

[0053] In some embodiments, the number of the first fine grids 10 connected by the first conductive lead and the number of the second fine grids 20 connected by the second conductive lead are different. When the probe contacts the first conductive base point 30, a first detection area is formed through conduction by the first conductive lead. When the probe contacts the second conductive base point 40, a second detection area is formed through conduction by the second conductive lead. The ranges of the first detection area and the second detection area are different. When the positive and negative probes respectively contact the first conductive base point 30 and the second conductive base point 40 for conduction, a dislocation is formed between the first detection area and the second detection area, and a larger detection range can be achieved during the lateral transmission between the two.

[0054] Further, the width of the first conductive lead-out line 50 is greater than the width of the first fine grid 10, and the width of the second conductive lead-out line 60 is greater than the width of the second fine grid 20. Thus, when the first conductive lead-out line 50 is connected to the first fine grid 10, there is a more stable conductive contact, and when the second conductive lead-out line 60 is connected to the second fine grid 20, there is a more stable conductive contact.

[0055] In some embodiments of the present application, the width of the first conductive lead-out line 50 is 0.02 - 0.03 mm; the width of the second conductive lead-out line 60 is 0.02 - 0.03 mm. As an example, the width of the first conductive lead-out line 50 can be 0.02 mm, 0.022 mm, 0.025 mm, 0.027 mm, 0.03 mm. As an example, the width of the second conductive lead-out line 60 can be 0.02 mm, 0.022 mm, 0.025 mm, 0.027 mm, 0.03 mm, and the present application does not limit this.

[0056] In some embodiments, a plurality of first fine grids 10 are equidistantly spaced along the second direction at a first preset distance, and a plurality of second fine grids 20 are equidistantly spaced along the second direction at a second preset distance.

[0057] The range of the first preset distance is 60 - 80 μm. Specifically, in such an embodiment, the first preset distance can be 60 μm, 65 μm, 70 μm, 75 μm, 80 μm or any value between 60 - 80 μm, and specifically, this is not limited here.

[0058] The range of the second preset distance is 60 - 80 μm. Specifically, in such an embodiment, specifically, in such an embodiment, the second preset distance can be 60 μm, 65 μm, 70 μm, 75 μm, 80 μm or any value between 60 - 80 μm, and specifically, this is not limited here.

[0059] In the embodiments of the present application, a plurality of first fine grids 10 are equidistantly spaced along the second direction at a first preset distance, and a plurality of second fine grids 20 are equidistantly spaced along the second direction at a second preset distance, which can make the distribution of the fine grid lines more uniform and enable the overall circuit to work more stably.

[0060] In other embodiments, the first preset distance and the second preset distance can be equal or unequal, and those skilled in the art can arrange them flexibly according to needs, and the present application does not limit this.

[0061] Based on the above-described electrode structure of the back-contact battery, those skilled in the art know that a corresponding back-contact battery can be obtained by setting the above electrode structure on the existing back-contact battery, and a corresponding back-contact battery assembly can be obtained by using a plurality of such back-contact batteries and / or other corresponding existing accessories.

[0062] In the description of this specification, the description referring to terms such as "some embodiments", "schematic embodiments", "examples", "specific examples", or "some examples", etc. means that the specific features, structures, materials, or characteristics described in connection with the embodiments or examples are included in at least one embodiment or example of the present application. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiments or examples. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples.

[0063] The above are only the preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application shall be included within the protection scope of the present application.

Claims

1. An electrode structure of a back contact battery, characterized in that: It includes a plurality of first fine grids and a plurality of second fine grids, which extend along a first direction and are alternately distributed along a second direction, the first direction intersects with the second direction, and the first fine grids and the second fine grids have different gate properties; a first conductive base point and a second conductive base point, along the second direction, the first conductive base point is electrically in contact with one of the plurality of first fine grids, and the second conductive base point is electrically in contact with two adjacent ones of the plurality of second fine grids; or, the first conductive base point is electrically in contact with two adjacent ones of the plurality of first fine grids, and the second conductive base point is electrically in contact with one of the plurality of second fine grids, and the center line of the first conductive base point and the center line of the second conductive base point are collinearly arranged in the first direction.

2. The electrode structure of the back contact battery according to claim 1, characterized in that: It also includes a first conductive lead-out line, one end of which is connected to the first conductive base point, the other end of which extends along the second direction, and the first conductive lead-out line is in electrical contact with a plurality of the first fine grids.

3. The electrode structure of the back contact battery according to claim 2, characterized in that: It also includes a second conductive lead-out line, one end of which is connected to the second conductive base point, the other end of which extends along the second direction, and the second conductive lead-out line is in electrical contact with a plurality of the second fine grids.

4. The electrode structure of the back contact battery according to claim 3, characterized in that: The number of the first fine grids connected to the first conductive lead-out line is different from the number of the second fine grids connected to the second conductive lead-out line.

5. The electrode structure of the back contact battery according to claim 3, characterized in that: The width of the first conductive lead-out line is greater than the width of the first fine grid, and the width of the second conductive lead-out line is greater than the width of the second fine grid.

6. The electrode structure of the back contact battery according to claim 1, characterized in that: The first conductive base point and the second conductive base point are arranged on the same plane, the projection area of ​​the first conductive base point on the plane is a first area, the projection area of ​​the second conductive base point on the plane is a second area, and the first area is equal to the second area.

7. The electrode structure of the back contact battery according to claim 6, characterized in that: The first area or the second area is in the range of 5-60 mm 2 .

8. The electrode structure of the back contact battery according to claim 1, characterized in that: A plurality of first fine grids are arranged at equal intervals along the second direction at a first preset distance, and a plurality of second fine grids are arranged at equal intervals along the second direction at a second preset distance.

9. The electrode structure of the back contact battery according to claim 8, characterized in that: The first preset distance ranges from 60 to 80 um.

10. The electrode structure of the back contact battery according to claim 8, characterized in that: The second preset distance ranges from 60 to 80 um.

11. A back contact battery, characterized in that: An electrode structure comprising a back contact battery as claimed in any one of claims 1 to 10.

12. A back contact battery assembly, characterized in that: The back contact cell assembly comprises the back contact cell of claim 11.

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