Testing device for chip capacitor production
By adjusting the position of the disc and telescopic rod, and controlling the contact between the inductive contacts and the sheet capacitors, the problem that existing testing devices cannot effectively detect capacitors of different shapes is solved, achieving a more flexible and efficient detection effect.
Patent Information
- Application Number
- CN202421797068.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-29
- Publication Date
- 2025-06-13
- Estimated Expiration
- 2034-07-29
AI Technical Summary
The existing testing devices for the production of chip capacitors cannot effectively detect chip capacitors of different shapes, resulting in poor detection results.
By adjusting the angle of the disc and the position of the telescopic rod, the contact between the inductive contact and the sheet capacitor is controlled, thereby achieving clamping and detection of capacitors of different shapes.
It improves flexibility and convenience during testing, ensuring effective detection of chip capacitors of different shapes.
Smart Images
Figure CN222979708U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of chip capacitors, in particular to a testing device for chip capacitor production. Background Technique
[0002] Two conductors close to each other with a layer of non-conductive insulating medium in between form a capacitor. When a voltage is applied between the two plates of the capacitor, the capacitor will store charge. During the production process of chip capacitors, it is necessary to detect the chip capacitors. The detection device is used to detect whether the chip capacitors are damaged. At the same time, the detection device drives the chip capacitor to form a circuit, and then the detection instrument is used to detect the capacitor state. Specifically, when detecting the chip capacitor, it usually uses the power-on connector installed outside the chip capacitor to contact the detection device, so that a circuit is formed between the detection devices, and then the capacitor state can be detected. However, due to the different shapes of the chip capacitors, this will cause the position of the capacitor power-on connector to appear. As a result, when the chip capacitor is placed inside the detection device, the detection device cannot contact the power-on connector, which affects the detection effect. For this reason, we propose a testing device for chip capacitor production. Content of the Utility Model
[0003] Aiming at the deficiencies of the existing testing device for chip capacitor production, the utility model provides a testing device for chip capacitor production, which has the advantages of improving the convenience during testing by adjusting the angle of the disc, installing a spring at the rear end of the mounting seat, the spring pushing the movable sleeve forward, and adjusting the position of the telescopic rod inside the movable sleeve to control the induction contact to contact the chip capacitor, and solves the problems raised in the above background technique.
[0004] The utility model provides the following technical scheme: A testing device for chip capacitor production, including a bracket, the upper part of one side of the bracket is fixedly connected with a display, the front end of the upper part of the bracket is fixedly connected with a sliding rod, both sides of the bracket are fixedly connected with limit sleeves, a rotating disc is movably sleeved inside the limit sleeves, a positioning sleeve is fixedly connected to the inner side of the rotating disc, a disc is movably sleeved inside the sliding rod, a mounting seat is fixedly connected to the upper part of the disc, a hinge is fixedly connected to the front end of the mounting seat, a movable sleeve is installed on the upper part of the hinge, a control handle is installed at one end of the movable sleeve, a front limit baffle is fixedly connected to the upper part of the front end of the mounting seat, a spring is installed at the lower part of the rear end of the movable sleeve, a telescopic rod is movably sleeved inside the movable sleeve, an induction contact is fixedly connected to the lower part of the front end of the telescopic rod, a connecting sleeve is movably sleeved in the middle of the rotating disc, a threaded rod is threadedly connected inside the connecting sleeve, and a clamping plate is movably sleeved at the front end of the threaded rod.
[0005] Preferably, the end of the telescopic rod is in communication with the display, and the bracket and the display are in a vertical state.
[0006] Preferably, the disc is circular and is installed inside both sides of the sliding rod.
[0007] Preferably, the front limit baffle is located at the lower part of the front end of the movable sleeve, and the front limit baffle is arranged in an inclined direction. The spring is installed between the mounting seat and the movable sleeve.
[0008] Preferably, an induction joint is installed at the lower end of the induction contact, and a sliding groove is installed inside the movable sleeve.
[0009] Preferably, the rotating disc is circular, and the positioning sleeve is kept parallel to the upper part of the bracket.
[0010] Preferably, a limit post is installed outside the connecting sleeve, and the limit post is movably sleeved inside the positioning sleeve. The end face of the clamping plate is arc-shaped.
[0011] Compared with the existing test device for manufacturing sheet capacitors, the present utility model has the following beneficial effects:
[0012] 1. For the test device for manufacturing sheet capacitors, after placing the capacitor inside the positioning sleeve, according to the different shapes of the capacitors, adjust the angle of the connecting sleeve inside the positioning sleeve, rotate the threaded rod, and the threaded rod pushes the clamping plate to move inward, thereby controlling the clamping plate to contact the outside of the capacitor, so as to clamp and limit capacitors with different shapes.
[0013] 2. For the test device for manufacturing sheet capacitors, the angle of the disc inside the sliding rod can be adjusted. Adjust the angle of the disc, and then the disc drives the test angle of the induction contact to be adjusted. Also, adjust the position of the telescopic rod inside the movable sleeve. According to the different positions of the induction joints installed outside the capacitor, the contact between the induction contact and the induction joint can be controlled, improving the flexibility during detection. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 is a schematic diagram of the main structure of the present utility model;
[0015] Figure 2 is a schematic cross-sectional view of the main structure of the present utility model;
[0016] Figure 3 is a schematic top cross-sectional view of the present utility model;
[0017] Figure 4 is a schematic enlarged view of a partial structure of the detection device of the present utility model;
[0018] Figure 5 is a schematic enlarged view of part A of the present utility model;
[0019] Figure 6This is the enlarged structural schematic diagram of part B of the utility model.
[0020] In the figure: 1, support; 2, display; 3, sliding rod; 4, disc; 5, mounting seat; 6, hinge; 7, movable sleeve; 8, control handle; 9, front limit baffle; 10, spring; 11, telescopic rod; 12, induction contact; 13, limit sleeve; 14, rotating disc; 15, positioning sleeve; 16, connecting sleeve; 17, threaded rod; 18, clamping plate. Specific implementation manner
[0021] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.
[0022] Please refer to Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5 and Figure 6 , a test device for sheet capacitor production, including a support 1. The upper part on one side of the support 1 is fixedly connected with a display 2, and the display 2 defines the detection result. The front end of the upper part of the support 1 is fixedly connected with a sliding rod 3, and the sliding rod 3 limits the position of the disc 4. The two sides of the support 1 are fixedly connected with limit sleeves 13, and a rotating disc 14 is movably sleeved inside the limit sleeves 13, and the angle of the rotating disc 14 inside the limit sleeves 13 is adjusted. The inner side of the rotating disc 14 is fixedly connected with a positioning sleeve 15, and the positioning sleeve 15 drives the capacitor to flip. A disc 4 is movably sleeved inside the sliding rod 3, and the upper part of the disc 4 is fixedly connected with a mounting seat 5. The front end of the mounting seat 5 is fixedly connected with a hinge 6, and a movable sleeve 7 is installed on the upper part of the hinge 6. One end of the movable sleeve 7 is installed with a control handle 8. The upper part of the front end of the mounting seat 5 is fixedly connected with a front limit baffle 9. A spring 10 is installed at the lower part of the rear end of the movable sleeve 7, and the spring 10 pushes the front end of the movable sleeve 7 to move downward, and then drives the induction contact 12 to contact the induction joint. An telescopic rod 11 is movably sleeved inside the movable sleeve 7, and the lower part of the front end of the telescopic rod 11 is fixedly connected with an induction contact 12. After the induction contact 12 contacts the induction joint, a circuit is formed, and then the state of the capacitor can be detected. A connecting sleeve 16 is movably sleeved in the middle of the rotating disc 14. The angle of the connecting sleeve 16 is adjusted. A threaded rod 17 is threadedly connected inside the connecting sleeve 16. The front end of the threaded rod 17 is movably sleeved with a clamping plate 18. By rotating the threaded rod 17, the threaded rod 17 pushes the clamping plate 18 to move inward, and then the clamping plate 18 can contact and limit the outside of the capacitor.
[0023] Please refer toFigure 1 , the end of the telescopic rod 11 is in communication with the display 2, the bracket 1 and the display 2 are in a vertical state. Through the communication between the end of the telescopic rod 11 and the display 2, when the telescopic rod 11 contacts the chip capacitor, the chip capacitor can be detected, and the display 2 displays the detection result.
[0024] Please refer to Figure 1 , the disc 4 is circular, and the disc 4 is installed inside both sides of the slide rod 3. It is installed at the front end of the bracket 1 through the slide rod 3. At the same time, the disc 4 is circular. Rotating the disc 4 can drive the angle of the telescopic rod 11 to be adjusted. And two sets of telescopic rods 11 are installed, which drive the two sets of telescopic rods 11 to contact the chip capacitor in turn, and then drive the detection device to form a circuit, and then the chip capacitor can be detected.
[0025] Please refer to Figure 4 , the front limit baffle 9 is located at the lower part of the front end of the movable sleeve 7. At the same time, the front limit baffle 9 is arranged in an inclined direction. The spring 10 is installed between the mounting seat 5 and the movable sleeve 7. Through the spring 10 installed between the mounting seat 5 and the movable sleeve 7, the spring 10 pushes the rear end of the movable sleeve 7 to move upward, and then can drive the front end of the telescopic rod 11 to provide pressure for the forward movement, and at the same time can drive the induction contact 12 to contact the chip capacitor. And according to the different thicknesses of the chip capacitor, the elasticity of the spring 10 is adjusted, and then the induction contact 12 can be driven to contact the chip capacitor. At the same time, a front limit baffle 9 is installed at the front end of the mounting seat 5, and the front limit baffle 9 limits the maximum downward movement angle of the movable sleeve 7.
[0026] Please refer to Figure 4 , an induction joint is installed at the lower end of the induction contact 12, and a chute is installed inside the movable sleeve 7. The telescopic rod 11 is movably sleeved inside the movable sleeve 7, and then the telescopic rod 11 can move back and forth inside the movable sleeve 7. At the same time, according to the different placement positions and detection areas of the chip capacitor, the induction contact 12 can be driven to contact the detection area.
[0027] Please refer to Figure 5 , the rotating disc 14 is circular, and at the same time, the positioning sleeve 15 is kept parallel to the upper part of the bracket 1. The rotating disc 14 is movably sleeved inside the limit sleeve 13. Rotating the rotating disc 14 drives the positioning sleeve 15 to rotate as a whole, and then the chip capacitor clamped inside the positioning sleeve 15 can be flipped.
[0028] Please refer to Figure 5, a limiting post is externally installed on the connecting sleeve 16. The limiting post is movably sleeved inside the positioning sleeve 15. The end face of the clamping plate 18 is arc-shaped. By adjusting the angle of the connecting sleeve 16, and then according to the different shapes of the chip capacitors, the clamping plate 18 is driven towards different positions, and the threaded rod 17 is rotated. Then the threaded rod 17 drives the clamping plate 18 to contact the outside of the chip capacitor, improving the contact surface between the clamping plate 18 and the chip capacitor. Moreover, the outside of the clamping plate 18 is arc-shaped, and then the clamping plate 18 is driven to squeeze and limit the chip capacitor, improving the convenience when clamping the position of the chip capacitor.
[0029] Working principle: During use, place the chip capacitor inside the positioning sleeve 15. And according to the different clamping orientations of the chip capacitor, adjust the angle of the connecting sleeve 16, and control the clamping plate 18 to squeeze and limit the chip capacitor. At the same time, adjust the angle and length of the telescopic rod 11, and the induction contact 12 can be controlled to contact the induction joint externally installed on the chip capacitor, and the chip capacitor can be detected and processed at the same time.
[0030] Although the embodiments of the present invention have been shown and described, for those of ordinary skill in the art, it can be understood that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principle and spirit of the present invention. The scope of the present invention is defined by the appended claims and their equivalents.
Claims
1. A testing device for producing chip capacitors, comprising a bracket (1), a display (2) is fixedly connected to the upper part of one side of the bracket (1), a slide bar (3) is fixedly connected to the front end of the upper part of the bracket (1), a limiting sleeve (13) is fixedly connected to both sides of the bracket (1), a rotating disk (14) is movably sleeved inside the limiting sleeve (13), and a positioning sleeve (15) is fixedly connected to the inner side of the rotating disk (14), characterized in that: The sliding rod (3) is movably sleeved with a disc (4) inside, the disc (4) is fixedly connected with a mounting seat (5) on its upper part, the mounting seat (5) is fixedly connected with a hinge (6) at its front end, a movable sleeve (7) is installed on the upper part of the hinge (6), a control handle (8) is installed on one end of the movable sleeve (7), the upper part of the front end of the mounting seat (5) is fixedly connected with a front limit baffle (9), the lower part of the rear end of the movable sleeve (7) is installed with a spring (10), the inner part of the movable sleeve (7) is movably sleeved with a telescopic rod (11), the lower part of the front end of the telescopic rod (11) is fixedly connected with an induction contact (12), the middle part of the rotating disk (14) is movably sleeved with a connecting sleeve (16), the inner thread of the connecting sleeve (16) is connected with a threaded rod (17), and the front end of the threaded rod (17) is movably sleeved with a clamping plate (18).
2. A chip capacitor production testing device according to claim 1, characterized in that: The end of the telescopic rod (11) is connected to the display (2), and the bracket (1) and the display (2) are in a vertical state.
3. A chip capacitor production testing device according to claim 1, characterized in that: The disc (4) is circular and is installed inside both sides of the slide bar (3).
4. A chip capacitor production testing device according to claim 1, characterized in that: The front limit baffle (9) is located at the lower part of the front end of the movable sleeve (7), and the front limit baffle (9) is arranged in an inclined direction. The spring (10) is installed between the mounting seat (5) and the movable sleeve (7).
5. The chip capacitor production testing device according to claim 1, characterized in that: The lower end of the induction contact (12) is provided with an induction joint, and the interior of the movable sleeve (7) is provided with a sliding groove.
6. A chip capacitor production testing device according to claim 1, characterized in that: The rotating disk (14) is circular, and the positioning sleeve (15) is kept parallel to the upper part of the bracket (1).
7. A chip capacitor production testing device according to claim 1, characterized in that: A limiting column is installed on the outside of the connecting sleeve (16), and the limiting column is movably sleeved inside the positioning sleeve (15). The end surface of the clamping plate (18) is arc-shaped.